Automatic testing circuit, device and equipment for infrared remote control signal

Abstract

The application relates to the technical field of test circuits, and provides an automatic test circuit, device and equipment for infrared remote control signals, which comprises a control signal generation module and a first infrared control module; a first signal output end of the control signal generation module is connected with a signal input end of the first infrared control module; and a signal output end of the first infrared control module is connected with a test port of a remote controller to be tested. Therefore, the test port of the remote controller to be tested can be controlled by the control signal output from the signal output port of the infrared control module, automatic test is carried out, and the efficiency during the test of the remote controller is improved.

Description

Technical Field

[0001] This application relates to the field of test circuit technology, specifically to an automated test circuit, device, and equipment for infrared remote control signals. Background Technology

[0002] In existing technologies, testing infrared remote control signals typically requires manual operation of the remote control buttons. For example, when testing the success rate of 100 presses, the tester must press the remote control one by one, resulting in low testing efficiency. Summary of the Invention

[0003] This application provides an automated testing circuit, device, and equipment for infrared remote control signals. It can control the test port of the remote control under test through the control signal output port of the infrared control module, thereby performing automated testing and improving the efficiency of testing the remote control.

[0004] The first aspect of this application provides an automated testing circuit for infrared remote control signals. The automated testing circuit for infrared remote control signals includes a control signal generation module and a first infrared control module. The first signal output terminal of the control signal generation module is connected to the signal input terminal of the first infrared control module, and the signal output terminal of the first infrared control module is connected to the test port of the remote control to be tested.

[0005] The first infrared control module includes a twelfth resistor, a thirteenth resistor, a thirtieth resistor, and a control transistor Q1. The signal output terminal of the control signal generation module is connected to the first terminal of the twelfth resistor. The first terminal of the thirteenth resistor and the first terminal of the control transistor Q1 are connected in parallel and then connected to the second terminal of the twelfth resistor. The second terminal of the control transistor Q1 is connected in parallel with the second terminal of the thirteenth resistor and then grounded. The third terminal of the control transistor Q1 is connected to the first driving power supply through the thirtieth resistor. The third terminal of the control transistor Q1 and the thirtieth resistor are connected in parallel to the test port of the remote control under test.

[0006] In one possible implementation, the control signal generation module includes a first microprocessor and a third capacitor. The power supply port of the first microprocessor is connected in parallel with the first terminal of the third capacitor and then connected to a second driving power supply. The second terminal of the third capacitor is grounded. The first terminal of the first microprocessor is the signal output terminal of the control signal generation module.

[0007] In one possible implementation, the control signal generation module further includes a programming connector, the first end of which is connected to a fourth driving power supply, the second end of which is grounded, and the programming connector is connected to the first microprocessor through a programming port. The first microprocessor receives control signal generation information from the programming connector when testing the remote control under test through the programming port.

[0008] In one possible implementation, the control signal generation module further includes an instruction control chip and a second capacitor. The first port of the instruction control chip is connected in parallel with the first terminal of the second capacitor and then connected to a third driving power supply. The second terminal of the second capacitor is grounded. The second port of the instruction control chip is grounded. The data transmission port of the instruction control chip is connected to the data transmission port of the first microprocessor. The first microprocessor receives control signal generation information of the remote control under test from the instruction control chip through the data transmission port.

[0009] In one possible implementation, the data transmission port includes a serial port.

[0010] In one possible implementation, the first infrared control module further includes a first capacitor, which is connected in parallel with a thirteenth resistor and then grounded.

[0011] In one possible implementation, the automated testing circuit for the infrared remote control signal further includes multiple first infrared control modules, each of which is connected to a corresponding second signal output terminal in the control signal generation module.

[0012] In one possible implementation, the remote control to be tested includes a test button, the first end of which is a test port of the remote control to be tested, and the second port of which is grounded.

[0013] A second aspect of this application provides an automated testing device for infrared remote control signals. The automated testing device for infrared remote control signals includes a circuit board and an automated testing circuit for infrared remote control signals as described in any one of the first aspects, wherein the automated testing circuit for infrared remote control signals is disposed on the circuit board.

[0014] A third aspect of this application provides an automated testing device for infrared remote control signals. The automated testing device for infrared remote control signals includes a housing and an automated testing apparatus for infrared remote control signals as described in the second aspect, wherein the automated testing apparatus for infrared remote control signals is disposed within the housing.

[0015] Implementing the embodiments of this application has the following beneficial effects:

[0016] An automated testing circuit for infrared remote control signals includes a control signal generation module and a first infrared control module. The first signal output terminal of the control signal generation module is connected to the signal input terminal of the first infrared control module. The signal output terminal of the first infrared control module is connected to the test port of the remote control under test. The first infrared control module includes a twelfth resistor, a thirteenth resistor, a thirtieth resistor, and a control transistor Q1. The signal output terminal of the control signal generation module is connected to the first terminal of the twelfth resistor. The first terminal of the thirteenth resistor and the first terminal of the control transistor Q1 are connected in parallel to the second terminal of the twelfth resistor. The second terminal of the control transistor Q1 is connected to... The second end of the thirteenth resistor is connected in parallel to ground. The third end of the control transistor Q1 is connected to the first driving power supply through the thirtieth resistor. The third end of the control transistor Q1 and the thirtieth resistor are connected in parallel to the test port of the remote control under test. Therefore, the control transistor Q1 can be turned on and off by the control signal issued by the control signal generation module, so that the first driving power supply can provide intermittent power to the test port of the remote control under test. This allows the test port of the remote control under test to drive the remote control under test to emit infrared light after receiving the power signal, thereby completing the automated test control of the remote control under test without manual operation and improving the efficiency of the test. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 A schematic diagram of an automated testing circuit for infrared remote control signals is provided for an embodiment of this application;

[0019] Figure 2 A schematic diagram of a first infrared control module is provided for an embodiment of this application;

[0020] Figure 3 This application provides a schematic diagram of a control signal generation module;

[0021] Figure 4 A schematic diagram of another programming connector is provided for embodiments of this application.

[0022] Figure 5 A schematic diagram of another automated testing circuit for infrared remote control signals is provided for embodiments of this application;

[0023] Figure 6A schematic diagram of another automated testing circuit for infrared remote control signals is provided for embodiments of this application;

[0024] Figure 7 This application provides a schematic diagram of another automated testing circuit for infrared remote control signals. Detailed Implementation

[0025] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0026] The terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0027] In this application, the reference to "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a mutually exclusive, independent, or alternative embodiment. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described in this application can be combined with other embodiments.

[0028] To better understand the automated testing circuit for infrared remote control signals provided in this application, a brief introduction to existing automated testing circuits for infrared remote control signals is given below. In existing solutions, such as CN114257807A, relays are used for automated testing. However, relays are inherently expensive and bulky, causing numerous inconveniences in actual testing, leading to increased testing costs and decreased testing efficiency.

[0029] To address the aforementioned issues, this application provides an automated testing circuit for infrared remote control signals. The circuit can control the control transistor Q1 to turn on and off via a control signal generated by a control signal generation module. This allows the first driving power supply to intermittently power the test port of the remote control under test. Upon receiving the power signal, the test port of the remote control under test can then drive the remote control to emit infrared light, thus automating the testing and control of the remote control without requiring manual intervention and improving testing efficiency.

[0030] Please see Figure 1 and Figure 2 , Figure 1 This application provides a schematic diagram of an automated testing circuit for infrared remote control signals. Figure 2 This document provides a schematic diagram of a first infrared control module according to an embodiment of this application. Figure 1 , Figure 2 As shown, the automated test circuit for the infrared remote control signal includes a control signal generation module 1 and a first infrared control module 2. The first signal output terminal of the control signal generation module 1 is connected to the signal input terminal of the first infrared control module 2, and the signal output terminal of the first infrared control module 2 is connected to the test port of the remote control 3 to be tested.

[0031] The first infrared control module 2 includes a twelfth resistor R12, a thirteenth resistor R13, a thirtieth resistor R30, and a control transistor Q1. The signal output terminal of the control signal generation module 1 is connected to the first terminal of the twelfth resistor R12. The first terminal of the thirteenth resistor R13 and the first terminal of the control transistor Q1 are connected in parallel to the second terminal of the twelfth resistor R12. The second terminal of the control transistor Q1 is connected in parallel with the second terminal of the thirteenth resistor R13 and then grounded. The third terminal of the control transistor Q1 is connected to the first driving power supply through the thirtieth resistor R30. The third terminal of the control transistor Q1 and the thirtieth resistor R30 are connected in parallel to the test port of the remote control to be tested.

[0032] Among them, such as Figure 2 As shown, the remote control to be tested includes a test button J3. The first end of the test button J3 is the test port of the remote control to be tested, and the second port of the test button J3 is grounded.

[0033] In this example, the control transistor Q1 can be turned on and off by the control signal generated by the control signal generation module. This allows the first driving power supply to intermittently power the test port of the remote control under test. After receiving the power signal, the test port of the remote control under test can drive the remote control under test to emit infrared light, thereby completing the automated test control of the remote control under test without manual operation and improving the efficiency of the test.

[0034] In one possible implementation, such as Figure 3 As shown, the control signal generation module 1 includes a first microprocessor U1 and a third capacitor C3. The power supply port of the first microprocessor U1 is connected in parallel with the first terminal of the third capacitor C3 and then connected to a second driving power supply. The second terminal of the third capacitor C3 is grounded. The first terminal of the first microprocessor U1 is the signal output terminal of the control signal generation module. The first microprocessor U1 can be a microcontroller.

[0035] In one possible implementation, specifically, the automated testing circuit for the infrared remote control signal includes a control signal generation module 1 and a first infrared control module 2. The control signal generation module 1 further includes a programming connector J2, and the remote control under test 3 includes a test button J3. Specifically, as shown... Figure 4 As shown, the control signal generation module also includes a programming connector J2. The first end of the programming connector J2 is connected to the fourth driving power supply, and the second end of the programming connector J2 is grounded. The programming connector J2 is connected to the first microprocessor U1 through a programming port. The first microprocessor U1 receives control signal generation information from the programming connector J2 when testing the remote control under test through the programming port. The control signal generation information may include PWM functions or operating parameters (including operating parameters for infrared signal testing, such as frequency and interval). When receiving the control signal generation information when testing the remote control under test through the programming port, the control signal generation information, PWM functions, or operating parameters can be written into software code, for example, a compiled binary file, and written into the storage area of ​​the first microprocessor U1 through the programming port (PGD0 / PGC0, where PGD0 / PGC0 have input / output functions respectively).

[0036] Specifically, there are two ways to write PWM functionality into software code. The first is hardware PWM (using the microcontroller's built-in PWM module), which is initialized by burning code. The second is to simulate PWM in software (by cyclically switching high and low levels through GPIO pins and controlling the duty cycle with a delay function), which is achieved by burning loop control code.

[0037] Specifically, the work method is as follows:

[0038] The first microprocessor U1 is connected to the first infrared control module 2 through port K1. When the first microprocessor U1 controls the PWM signal or IO (directly using the working parameters output) to output a high level through K1, it controls Q1 (NPN) to be turned on, and the test port (button J3) of the remote control 3 under test is turned on, and an infrared signal is emitted once. When the first microprocessor U1 controls the PWM signal or IO (directly using the working parameters output) to output a low level through K1, it controls Q1 to be turned off, and the test port (button J3) of the remote control 3 under test is not turned on (J3 is a 2-pin terminal).

[0039] In one possible implementation, the automated testing circuit for infrared remote control signals includes a control signal generation module 1 and a first infrared control module 2. The control signal generation module 1 further includes an instruction control chip J1 and a second capacitor C2. The remote control 3 under test includes a test button J3. Specifically, as shown... Figure 5 As shown, the control signal generation module further includes an instruction control chip J1 and a second capacitor C2. The first port of the instruction control chip J1 is connected in parallel with the first terminal of the second capacitor and then connected to the third driving power supply. The second terminal of the second capacitor is grounded. The second port of the instruction control chip J1 is grounded. The data transmission port of the instruction control chip J1 is connected to the data transmission port of the first microprocessor U1. The first microprocessor U1 receives control signal generation information from the instruction control chip J1 during the testing of the remote control under test through the data transmission port. The data transmission port includes a serial port.

[0040] Specifically, the control program (including working parameters for infrared signal testing, such as frequency and interval) is written into the instruction control chip J1. J1 communicates via UART-TX-KEY / UART-RX-KEY serial port, controlling the first microprocessor U1 to connect to the first infrared control module 2 through port K1. When the first microprocessor U1 controls the PWM signal or IO (direct output) to output a high level through port K1, the base B of Q1 (NPN) is high, Q1 is turned on, and the test port (button J3) of the remote control 3 under test is connected, thus transmitting an infrared signal once. When the first microprocessor U1 controls the PWM signal or IO (direct output) to output a low level through K1, thereby controlling Q1 to turn off, the test port (button J3) of the remote control 3 under test is not connected.

[0041] In one possible implementation, the first infrared control module further includes a first capacitor, which is connected in parallel with the thirteenth resistor R13 and then grounded. Specifically, the first capacitor can be used together with the thirteenth capacitor to form a filter circuit, improving the stability of the circuit.

[0042] In one possible implementation, such as Figure 6 and Figure 7 As shown, the automated testing circuit for the infrared remote control signal also includes multiple first infrared control modules 2, each of which is connected to a corresponding second signal output terminal in the control signal generation module 1. Specifically, in Figure 5 In this example, the second signal output terminals are ports K2-K6. This example only uses five second signal output ports for illustration and is not specifically limited. Figure 6 J4 in the design is a three-stage high-voltage tube (with a 10-pin terminal, which can be changed according to requirements), which allows for the design of multiple control modules. This enables simultaneous testing of multiple remote controls that need to be tested, thereby greatly improving testing efficiency.

[0043] In one specific implementation, the number of multiple first infrared control modules is assumed to be n. These n first infrared control modules are respectively connected to the second signal output terminals k2, k3, ..., kn+1. The control can be performed in the following manner during testing:

[0044] First time: K1 port high (Q1), K2 port low (Q2), K3 port low (Q3), K4 port low (Q4)... etc. (set according to requirements);

[0045] Second time: K1 port low (Q1), K2 port high (Q2), K3 port low (Q3), K4 port low (Q4)... etc. (set according to requirements);

[0046] Third time: K1 port low (Q1), K2 port low (Q2), K3 port high (Q3), K4 port low (Q4)... etc. (set according to requirements).

[0047] This solution effectively improves the testing efficiency of the remote control and saves the purchase cost of the receiver. Q2, Q3, Q4, etc. are the corresponding control transistors.

[0048] In one specific embodiment, an automated testing device for infrared remote control signals is also provided. The automated testing device for infrared remote control signals includes a circuit board and an automated testing circuit for infrared remote control signals as described in any of the foregoing embodiments. The automated testing circuit for infrared remote control signals is disposed on the circuit board.

[0049] In one specific embodiment, an automated testing device for infrared remote control signals is also provided. The automated testing device for infrared remote control signals includes a housing and an automated testing apparatus for infrared remote control signals as described in the foregoing embodiments, wherein the automated testing apparatus for infrared remote control signals is disposed within the housing.

[0050] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0051] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0052] In the several embodiments provided in this application, it should be understood that the disclosed apparatus can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical or other forms.

[0053] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0054] The embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. An automated testing circuit for infrared remote control signals, characterized in that, The automated testing circuit for the infrared remote control signal includes a control signal generation module and a first infrared control module. The first signal output terminal of the control signal generation module is connected to the signal input terminal of the first infrared control module, and the signal output terminal of the first infrared control module is connected to the test port of the remote control to be tested. The first infrared control module includes a twelfth resistor, a thirteenth resistor, a thirtieth resistor, and a control transistor Q1. The signal output terminal of the control signal generation module is connected to the first terminal of the twelfth resistor. The first terminal of the thirteenth resistor and the first terminal of the control transistor Q1 are connected in parallel and then connected to the second terminal of the twelfth resistor. The second terminal of the control transistor Q1 is connected in parallel with the second terminal of the thirteenth resistor and then grounded. The third terminal of the control transistor Q1 is connected to the first driving power supply through the thirtieth resistor. The third terminal of the control transistor Q1 and the thirtieth resistor are connected in parallel to the test port of the remote control under test.

2. The automated testing circuit for infrared remote control signals according to claim 1, characterized in that, The control signal generation module includes a first microprocessor and a third capacitor. The power port of the first microprocessor is connected in parallel with the first terminal of the third capacitor and then connected to the second driving power supply. The second terminal of the third capacitor is grounded. The first terminal of the first microprocessor is the signal output terminal of the control signal generation module.

3. The automated testing circuit for infrared remote control signals according to claim 2, characterized in that, The control signal generation module also includes a programming connector. The first end of the programming connector is connected to the fourth driving power supply, and the second end of the programming connector is grounded. The programming connector is connected to the first microprocessor through a programming port. The first microprocessor receives the control signal generation information of the remote control under test through the programming connector when it is being tested.

4. The automated testing circuit for infrared remote control signals according to claim 2, characterized in that, The control signal generation module further includes an instruction control chip and a second capacitor. The first port of the instruction control chip is connected in parallel with the first terminal of the second capacitor and then connected to the third driving power supply. The second terminal of the second capacitor is grounded. The second port of the instruction control chip is grounded. The data transmission port of the instruction control chip is connected to the data transmission port of the first microprocessor. The first microprocessor receives the control signal generation information of the remote control under test from the instruction control chip through the data transmission port.

5. The automated testing circuit for infrared remote control signals according to claim 4, characterized in that, The data transmission port includes a serial port.

6. The automated testing circuit for infrared remote control signals according to any one of claims 1-5, characterized in that, The first infrared control module also includes a first capacitor, which is connected in parallel with the thirteenth resistor and then grounded.

7. The automated testing circuit for infrared remote control signals according to claim 6, characterized in that, The automated testing circuit for the infrared remote control signal also includes multiple first infrared control modules, each of which is connected to a corresponding second signal output terminal in the control signal generation module.

8. The automated testing circuit for infrared remote control signals according to claim 1, characterized in that, The remote control to be tested includes a test button, the first end of which is a test port of the remote control to be tested, and the second port of which is grounded.

9. An automated testing device for infrared remote control signals, characterized in that, The automated testing device for infrared remote control signals includes a circuit board and an automated testing circuit for infrared remote control signals as described in any one of claims 1-8, wherein the automated testing circuit for infrared remote control signals is disposed on the circuit board.

10. An automated testing device for infrared remote control signals, characterized in that, The automated testing equipment for infrared remote control signals includes a housing and an automated testing device for infrared remote control signals as described in claim 9, wherein the automated testing device for infrared remote control signals is disposed within the housing.

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