A probe card that can be assembled and disassembled modularly

Abstract

The utility model relates to the probe card technical field, specifically is a kind of modularization assembly and disassembly's probe card, including pcb substrate, No. 1 protective cover, No. 2 protective cover, No. 1 probe and No. 2 probe, the inside of pcb substrate is installed No. 1 probe by being equipped with mounting groove, the upper end of pcb substrate is located the outside installation of mounting groove and is equipped with No. 2 protective cover;No. 1 protective cover is installed in the outside of No. 2 protective cover, installation disc is equipped between No. 2 protective cover and No. 1 protective cover;The probe card of the new type has the structure of modularization assembly and disassembly, when probe is damaged, need not integral replacement or factory repair, can effectively reduce the time and cost of maintenance, and have the structure of setting two groups of probes on probe card, more information can be obtained in the process of once testing, and then the number of test and time can be reduced long, to effectively improve test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of probe card technology, specifically to a probe card that can be modularly assembled and disassembled. Background Technology

[0002] Probe cards are key testing components in semiconductor manufacturing, used in the wafer testing stage. Their core function is to act as an interface between automated testing equipment and the wafer chip. By contacting the chip pads or bumps with the probes, electrical signals are transmitted to detect the chip's electrical performance, functional characteristics, and potential defects. Probe cards provide fixed mounting positions for the probes. Probes are precision tools or components used to establish temporary or permanent connections with electrical or electronic systems. They are conductive and can transmit electrical signals to or from the test point. Probes need to be precisely arranged and fixed to accurately contact the test points on the device under test. Probe cards have a specific structure and layout that allows probes to be installed at predetermined positions and spacings, ensuring the spatial stability of the probes.

[0003] However, existing probe cards typically adopt an integrated design. If a single probe is damaged, the entire card needs to be replaced or returned to the factory for repair, which affects production efficiency. They also lack a structure that allows for the installation of two sets of probes on the probe card, making it impossible to obtain more information during a single test. This results in a longer number of tests and longer testing time, leading to low testing efficiency. To address this, we propose a modularly assembled and disassembled probe card. Utility Model Content

[0004] To address the problems in the existing technology, this utility model provides a modularly assembled and disassembled probe card. This novel probe card has a modularly assembled and disassembled structure, eliminating the need for complete replacement or factory repair when the probe is damaged, effectively reducing maintenance time and costs. Furthermore, it features a structure with two sets of probes on the probe card, allowing more information to be obtained during a single test, thereby reducing the number of tests and the length of time required, and thus effectively improving testing efficiency.

[0005] The technical solution adopted by this utility model to solve its technical problem is a modularly assembled and disassembled probe card, including a PCB substrate, a first protective cover, a second protective cover, a first probe, and a second probe. The first probe is installed inside the PCB substrate by opening a mounting groove, and the second protective cover is installed on the upper end of the PCB substrate outside the mounting groove.

[0006] The No. 1 protective cover is installed on the outside of the No. 2 protective cover. A mounting plate is provided between the No. 2 protective cover and the No. 1 protective cover. The No. 2 probe is fixed inside the mounting plate. The outside of the No. 2 protective cover is provided with external threads, and the inside of the No. 1 protective cover is provided with internal threads.

[0007] By adopting the above technical solution, this new probe card has a modular assembly and disassembly structure. When the probe is damaged, there is no need to replace the whole card or return it to the factory for repair, which can effectively reduce maintenance time and cost. Moreover, it has a structure with two sets of probes on the probe card, which can obtain more information in a single test, thereby reducing the number of tests and the length of time, and thus effectively improving testing efficiency.

[0008] Specifically, the top of the second protective cover has a first mounting hole evenly spaced, and the lower end of the interior of the second protective cover is provided with a fixing frame, the interior of which has a second mounting hole evenly spaced.

[0009] By adopting the above technical solution, the No. 1 mounting hole facilitates the insertion of the bottom of the No. 2 probe into the interior of the No. 2 protective cover, and the fixing bracket and the No. 2 mounting hole can limit the position of the No. 2 probe to improve its stability.

[0010] Specifically, the mounting groove has three mounting holes evenly spaced inside.

[0011] Specifically, the PCB substrate has L-shaped mounting plates on all four sides of its top, and cable interfaces are installed inside the L-shaped mounting plates.

[0012] By adopting the above technical solution, the L-shaped mounting plate can support and bear the cable interface, making it easy for personnel to perform wiring operations.

[0013] Specifically, a handle is installed on the top of the first protective cover.

[0014] The beneficial effects of this utility model are:

[0015] (1) The probe card described in this utility model can be modularly assembled and disassembled. By using the cooperation of internal and external threads, the operator can tighten the first protective cover by holding the handle tightly. Then the first protective cover can be threadedly connected to the second protective cover, realizing modular assembly and disassembly and improving convenience.

[0016] (2) The modularly assembled and disassembled probe card of this utility model allows the second probe and the first probe to contact different test points of the device under test simultaneously, thereby obtaining more information in one test, without the need to frequently change the probe card or adjust the test method, reducing the number of tests and time, significantly improving test efficiency, and thus being able to adapt to more types of test needs. Attached Figure Description

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0019] Figure 2 This is an exploded view of the present invention;

[0020] Figure 3 This is a schematic diagram of the No. 1 protective cover structure of this utility model.

[0021] In the diagram: 1. PCB substrate; 2. L-shaped mounting plate; 3. Cable interface; 4. Protective cover No. 1; 5. Handle; 6. Mounting plate; 7. Protective cover No. 2; 8. Mounting bracket; 9. Mounting slot; 10. Mounting hole No. 1; 11. Probe No. 1; 12. Mounting hole No. 2; 13. Probe No. 2; 14. Mounting hole No. 3; 15. Internal thread; 16. External thread. Detailed Implementation

[0022] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0023] To enable this new probe card to have a modular assembly and disassembly structure, reducing the number of tests and time, thereby improving testing efficiency, such as... Figure 1-3 As shown, the present invention provides a modularly assembled and disassembled probe card, comprising a PCB substrate 1, a first protective cover 4, a second protective cover 7, a first probe 11, and a second probe 13. The first probe 11 is installed inside the PCB substrate 1 through a mounting groove 9, and the second protective cover 7 is installed on the upper end of the PCB substrate 1 outside the mounting groove 9.

[0024] A first protective cover 4 is installed on the outside of the second protective cover 7. A mounting plate 6 is provided between the second protective cover 7 and the first protective cover 4. A second probe 13 is fixed inside the mounting plate 6. An external thread 16 is provided on the outside of the second protective cover 7, and an internal thread 15 is provided on the inside of the first protective cover 4.

[0025] In use, by using the cooperation of the internal thread 15 and the external thread 16, the operator can tighten the first protective cover 4 by gripping the handle 5. Then the first protective cover 4 can be threadedly connected to the second protective cover 7, realizing modular assembly and disassembly and improving convenience.

[0026] Probe 13 and probe 11 can simultaneously contact different test points of the device under test, thereby obtaining more information in a single test without frequently changing probe cards or adjusting test methods, reducing the number of tests and time, significantly improving test efficiency, and thus adapting to more types of test requirements.

[0027] For example, such as Figure 2As shown, the top of the second protective cover 7 is uniformly provided with a first mounting hole 10, and the lower end of the interior of the second protective cover 7 is provided with a fixing frame 8, and the interior of the fixing frame 8 is uniformly provided with a second mounting hole 12.

[0028] In use, the first mounting hole 10 facilitates the insertion of the bottom of the second probe 13 into the interior of the second protective cover 7. The fixing bracket 8 and the second mounting hole 12 can limit the second probe 13 to improve its stability.

[0029] For example, such as Figure 2 As shown, the mounting groove 9 has three mounting holes 14 evenly spaced inside.

[0030] In use, the third mounting hole 14 allows the sensing end of the first probe 11 to pass through the PCB substrate 1, facilitating detection.

[0031] For example, such as Figure 1 , Figure 2 As shown, L-shaped mounting plates 2 are provided around the top of the PCB substrate 1, and cable interfaces 3 are installed inside the L-shaped mounting plates 2.

[0032] When in use, the L-shaped mounting plate 2 can support and bear the cable interface 3, which makes it easy for personnel to perform wiring operations.

[0033] For example, such as Figure 1 , Figure 2 As shown, a handle 5 is installed on the top of the first protective cover 4.

[0034] When in use, the handle 5 facilitates the operation of personnel to connect the No. 1 protective cover 4 and the No. 2 protective cover 7 via a threaded connection.

[0035] When using this utility model, the operator places the second protective cover 7 on the outside of the mounting groove 9 and the first protective cover 4 on the outside of the second protective cover 7. Through the cooperation of the internal thread 15 and the external thread 16, the operator can tighten the first protective cover 4 by tightly gripping the handle 5. Then the first protective cover 4 can be threadedly connected to the second protective cover 7, realizing modular assembly and disassembly and improving convenience.

[0036] Furthermore, by cooperating with probe 13 and probe 11, different test points of the device under test can be contacted simultaneously, thereby obtaining more information in one test, without the need to frequently change probe cards or adjust test methods, reducing the number of tests and time, significantly improving test efficiency, and thus being able to adapt to more types of test requirements.

[0037] Furthermore, the fixing bracket 8 and the second mounting hole 12 can limit the second probe 13 from the lower end of the second probe 13 to improve the stability of the second probe 13.

[0038] Furthermore, personnel can perform wiring operations through cable interface 3 to facilitate signal transmission.

[0039] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The descriptions of the above embodiments and specifications are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of protection claimed by this utility model. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. A modularly assembleable and detachable probe card, characterized in that, Includes PCB substrate (1), first protective cover (4), second protective cover (7), first probe (11) and second probe (13). The first probe (11) is installed inside the PCB substrate (1) through a mounting groove (9). The second protective cover (7) is installed on the upper end of the PCB substrate (1) outside the mounting groove (9). A first protective cover (4) is installed on the outside of the second protective cover (7). A mounting plate (6) is provided between the second protective cover (7) and the first protective cover (4). A second probe (13) is fixed inside the mounting plate (6). An external thread (16) is provided on the outside of the second protective cover (7), and an internal thread (15) is provided on the inside of the first protective cover (4).

2. The modularly assembled and detachable probe card according to claim 1, characterized in that, The top of the second protective cover (7) is evenly provided with a first mounting hole (10), and the lower end of the interior of the second protective cover (7) is provided with a fixing frame (8), and the interior of the fixing frame (8) is evenly provided with a second mounting hole (12).

3. The modularly assembled and detachable probe card according to claim 1, characterized in that, The mounting groove (9) has three mounting holes (14) evenly spaced inside.

4. The modularly assembled and detachable probe card according to claim 1, characterized in that, The PCB substrate (1) is provided with L-shaped mounting plates (2) on all four sides of the top, and the L-shaped mounting plates (2) are equipped with cable interfaces (3).

5. A modularly assembled and detachable probe card according to claim 1, characterized in that, A handle (5) is installed on the top of the first protective cover (4).

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