USB cable automatic test system

Abstract

The application provides a USB cable automatic test system, which is characterized in that: a first test fixture is arranged, and a switch matrix is arranged in cooperation with the first test fixture, so that a test path of high-frequency signals from a test instrument, a connection port of the switch matrix, a radio frequency cable, a high-speed fixture to a to-be-tested cable is established, a coupling path between different signal types is isolated from a physical layer, and a crosstalk problem during high-frequency signal testing is eliminated; meanwhile, all to-be-tested pins are connected into the test system at one time through the first test fixture and the switch matrix, and a signal path is changed through a switch of the switch matrix, so that the testing of different pins and different test items is completed, S parameters representing performance indexes of the to-be-tested USB cable are obtained, the testing efficiency is improved, and the large-scale production test demand of Type-C cables is met.

Description

Technical Field

[0001] This utility model belongs to the field of USB cable testing technology, specifically relating to an automatic USB cable testing system. Background Technology

[0002] With its standardization, high compatibility, and plug-and-play convenience, the USB interface has become one of the most widely used interfaces in computers, consumer electronics, and mobile devices. As high-speed data transmission standards such as USB4 and Thunderbolt continue to evolve, newer cables like USB Type-C need to carry increasingly higher signal frequencies, with data rates reaching tens of Gbps. This places extremely stringent requirements on the signal integrity of the cables. To ensure that cable products meet standards and can transmit data stably, they must undergo detailed electrical performance testing, including tests for insertion loss, return loss, crosstalk, DC resistance, and many other parameters.

[0003] In existing technologies, testing such cables typically relies on multiple independent benchtop test instruments, such as vector network analyzers (VNAs) and digital multimeters (DMMs). For cables with a large number of pins (e.g., USB Type-C has 24 pins) and complex test items, completing a full-item test requires a significant amount of manpower and time, which cannot meet the production line's demand for high-efficiency testing.

[0004] Therefore, how to overcome the problems of cumbersome operation, low efficiency and low integration in the existing testing schemes, and achieve one-stop, automated and high-efficiency testing of various performance indicators of USB cables has become a technical problem that urgently needs to be solved in this field. Utility Model Content

[0005] The purpose of this invention is to provide an automatic testing system for USB cables.

[0006] To achieve the above objectives, this utility model provides an automatic USB cable testing system for testing USB cables. The USB cable includes two Type-C ports located at both ends of the cable, and each Type-C port has a first pin pair. The automatic USB cable testing system further includes:

[0007] At least one pair of first test fixtures are respectively used to electrically connect to the Type-C ports at both ends of the USB cable. Each first test fixture is provided with a first socket that matches the Type-C port. The first socket is provided with a first contact terminal that is electrically connected to the pin pair of the Type-C port. The first test fixture is provided with a first radio frequency connector that is electrically connected to the first contact terminal.

[0008] The test instrument includes a first transmitting port and a first receiving port, used to send test signals to the USB cable and receive response signals from the USB cable, and the test instrument measures the response signals;

[0009] The switch matrix includes a first input port, a first output port, and multiple connection ports. The first input port of the switch matrix is ​​electrically connected to the first transmitting port of the test instrument, the first output port of the switch matrix is ​​electrically connected to the first receiving port of the test instrument, and each connection port is electrically connected to the first RF connector of the corresponding first test fixture.

[0010] Specifically, the switch matrix is ​​controlled to connect the first input port to the corresponding connection port and the first output port to the corresponding connection port. This forms a test loop that transmits the test signal from the first transmitting port of the test instrument to the first input port of the switch matrix, routes it within the switch matrix to the corresponding connection port, transmits it to the first test fixture at one end of the USB cable, the test signal passes through the USB cable and generates a response signal, the response signal is transmitted from the first test fixture at the other end to the corresponding connection port, routes it within the switch matrix to the first output port, and the first receiving port of the test instrument receives the response signal, thus performing automated testing on the USB cable.

[0011] In some embodiments, the test instrument further includes a second transmitting port and a second receiving port;

[0012] The switch matrix also includes a second input port and a second output port;

[0013] The second transmitting port of the test instrument is electrically connected to the second input port of the switch matrix, and the second receiving port of the test instrument is electrically connected to the second output port of the switch matrix;

[0014] The switch matrix is ​​controlled to operate so that the second input port is connected to the corresponding connection port, and the second output port is connected to the corresponding connection port.

[0015] In some embodiments, the Type-C port is provided with a second pin pair, and the USB cable automatic testing system further includes at least one pair of second test fixtures for electrical connection to the Type-C ports at both ends of the USB cable. Each second test fixture is provided with a second socket that matches the Type-C port. The second socket is provided with a second contact terminal that connects to the second pin pair of the Type-C port. The second test fixture is provided with a second radio frequency connector that connects to the second contact terminal.

[0016] In some embodiments, the first test fixture further includes a first test plate, the first socket being disposed at the top of the first test plate, and the first test plate including a first test surface and a second test surface spaced apart and opposite to each other.

[0017] The first socket is provided with multiple first contact terminals, which are symmetrically arranged. The first contact terminals on the same side as the first test surface are electrically connected to the first RF connector through PCB traces, and the first contact terminals on the same side as the second test surface are electrically connected to the first RF connector through PCB traces.

[0018] In some embodiments, the second test fixture further includes a second test plate, the second socket being disposed at the top of the second test plate, and the second test plate including a third test surface and a fourth test surface spaced apart from each other;

[0019] The second socket contains multiple second contact terminals, which are symmetrically arranged. The first contact terminal on the same side as the third test surface is electrically connected to the second RF connector via PCB traces, and the second contact terminal on the same side as the fourth test surface is electrically connected to the second RF connector via PCB traces.

[0020] In some embodiments, the connection port is connected to the first RF connector of the first test fixture via an RF cable; the connection port is connected to the second RF connector of the second test fixture via an RF cable.

[0021] In some implementations, the switch matrix includes:

[0022] At least four primary selector switches, each including a first common terminal and multiple first switchable terminals, wherein the first input port, first output port, second input port, and second output port are respectively electrically connected to the first common terminal of the corresponding primary selector switch; and

[0023] Multiple secondary selector switches, each secondary selector switch including a second common terminal and multiple second switching terminals, the second common terminal of each secondary selector switch being electrically connected to the first switching terminal of each primary selector switch, controlling the primary selector switch to switch to the corresponding first switching terminal so that the corresponding secondary selector switch is connected to the signal path; and

[0024] Multiple three-level selector switches, each three-level selector switch including a third common terminal and multiple third switching terminals, the third common terminal of each three-level selector switch being electrically connected to the second switching terminal of the corresponding two-level selector switch, controlling the two-level selector switch to switch the corresponding second switching terminal so that the corresponding three-level selector switch is connected to the signal path;

[0025] Each connection port is electrically connected to the corresponding third switch terminal of the three-level selection switch, controlling the three-level selection switch to switch to the corresponding third switch terminal to access the signal path.

[0026] In some implementations, the first and third terminals to be switched are each electrically connected to a load.

[0027] In some implementations, the number of the first pin pairs is multiple, and the multiple first pin pairs include at least two sets of high-speed differential pin pairs and at least one set of low-speed differential pin pairs;

[0028] The number of the second pin pairs is multiple, and the multiple second pin pairs include at least one set of auxiliary control pin pairs and one set of power supply pin pairs.

[0029] In some implementations, the test instrument is a vector network analyzer.

[0030] This application provides an automatic testing system for USB cables. By setting up a first test fixture and cooperating with the independent connection ports inside the switch matrix, a test path for high-frequency signals is established from the test instrument, the connection port of the switch matrix, the RF cable, the high-speed fixture, to the cable under test. This physically isolates the coupling paths between different signal types, eliminating crosstalk problems during high- and low-frequency signal testing. At the same time, this application uses the first test fixture and the switch matrix to connect all the pins under test to the test system at once. By switching the switches of the switch matrix, the signal path can be changed to complete the testing of different pins and different test items, obtaining S-parameters that characterize the performance indicators of the USB cable under test. This improves testing efficiency and meets the needs of large-scale production testing of Type-C cables. Attached Figure Description

[0031] Figure 1 This is a pin diagram of the USB cable of this application;

[0032] Figure 2 This is a schematic diagram of the system structure provided in an embodiment of this application;

[0033] Figure 3 This is a system block diagram provided in one embodiment of this application;

[0034] Figure 4 This is a schematic diagram of the structure of the first test fixture provided in an embodiment of this application;

[0035] Figure 5 This is a schematic diagram of the structure of the first test fixture provided in one embodiment of this application from another perspective;

[0036] Figure 6 This is a schematic diagram of the structure of the second test fixture provided in one embodiment of this application;

[0037] Figure 7 This is a schematic diagram of the structure of the second test fixture provided in one embodiment of this application from another perspective;

[0038] Figure 8 This is an electrical principle block diagram of a switch matrix provided in one embodiment of this application;

[0039] The image shows: USB cable automatic testing system 100.

[0040] USB cable 20, Type-C port 21;

[0041] First test fixture 30, first socket 31, first contact terminal 311, first RF connector 32, first test board 33, first test surface 33a, second test surface 33b;

[0042] Test instrument 40, first transmitting port 41, first receiving port 42, second transmitting port 43, second receiving port 44;

[0043] Switch matrix 50, first input port 51, first output port 52, connection port 53, second input port 54, second output port 55, first-level selector switch 56, first common terminal 56a, first terminal to be switched 56b, second-level selector switch 57, second common terminal 57a, second terminal to be switched 57b, third-level selector switch 58, third common terminal 58a, third terminal to be switched 58b;

[0044] Second test fixture 60, second socket 61, second contact terminal 611, second RF connector 62, second test board 63, third test surface 63a, and fourth test surface 63b;

[0045] RF cable 70;

[0046] Load 80. Detailed Implementation

[0047] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0048] Due to the cumbersome operation, low efficiency, and low integration of existing testing solutions.

[0049] Figure 1 This is a pin diagram of the USB cable of this application.

[0050] Figure 2This is a schematic diagram of the system structure provided in an embodiment of this application.

[0051] like Figures 1 to 2 As shown, this application further provides an automatic USB cable testing system 100 for testing USB cables 20. The USB cable 20 includes two Type-C ports 21 located at both ends of the cable, and each Type-C port 21 has a first pin pair.

[0052] In some implementations, there are multiple first pin pairs, including at least two sets of high-speed differential pin pairs and at least one set of low-speed differential pin pairs.

[0053] There are multiple second pin pairs, including at least one set of auxiliary control pin pairs, one set of power supply pin pairs, and one set of differential pin pairs.

[0054] Specifically, the internal pin definitions of the Type-C ports at both ends follow the relevant standards published by the USB-IF, and each port includes:

[0055] High-speed differential pin pairs: such as TX1+ / -, RX1+ / -, TX2+ / -, RX2+ / -, for high-speed data transmission and reception in USB 3.x, USB4, or alternative modes.

[0056] Low-speed differential pin pair: D+ / D-, for data transfer compliant with the USB 2.0 standard.

[0057] Auxiliary control pins: CC1 / CC2 are used for connection detection, role definition, and power negotiation; SBU1 / SBU2 are used for auxiliary signal transmission in alternative mode.

[0058] Power supply pins: VBUS is used for power transmission, and GND is the common ground.

[0059] Figure 3 This is a system block diagram provided in one embodiment of this application.

[0060] Figure 4 This is a schematic diagram of the structure of the first test fixture provided in an embodiment of this application.

[0061] Figure 5 This is a structural schematic diagram of the first test fixture provided in one embodiment of this application from another perspective.

[0062] like Figures 1 to 5 As shown, the USB cable automatic testing system 100 includes:

[0063] At least one pair of first test fixtures 30 are respectively used for electrical connection with the Type-C ports 21 at both ends of the USB cable 20. Each first test fixture 30 is provided with a first socket 31 that matches the Type-C port 21. The first socket 31 matches the Type-C port and its mechanical structure is compatible with the standard USB Type-C female connector, enabling stable and reliable connection with the Type-C port of the cable under test. The first socket 31 is provided with a first contact terminal 311 that is electrically connected to the pin pair of the Type-C port 21. The first test fixture 30 is provided with a plurality of first radio frequency connectors 32.

[0064] The test instrument 40 includes a first transmitting port 41 and a first receiving port 42, which are used to send test signals to the USB cable 20 and receive response signals from the USB cable 20. The test instrument 40 measures the response signals.

[0065] The switch matrix 50 includes a first input port 51, a first output port 52 and multiple connection ports 53. The first input port 51 of the switch matrix 50 is electrically connected to the first transmitting port 41 of the test instrument 40, the first output port 52 of the switch matrix 50 is electrically connected to the first receiving port 42 of the test instrument 40, and each connection port 53 is electrically connected to the first radio frequency connector 32 of the corresponding first test fixture 30.

[0066] The control switch matrix 50 operates by connecting the first input port 51 to the corresponding connection port 53 and the first output port 52 to the corresponding connection port 53. This forms a test loop that transmits the test signal from the first transmitting port 41 of the test instrument 40 to the first input port 51 of the switch matrix 50, routes it within the switch matrix 50 to the corresponding connection port 53, and transmits it to the first test fixture 30 at one end of the USB cable 20. The test signal passes through the USB cable 20 and generates a response signal, which is then transmitted from the first test fixture 30 at the other end to the corresponding connection port 53. The response signal is then routed within the switch matrix 50 to the first output port 52, where the first receiving port 42 of the test instrument 40 receives the response signal, thus performing automated testing on the USB cable 20.

[0067] The working process and principle of the USB cable automatic testing system 100 provided in this embodiment will be explained by specific examples below. When performing high-speed signal pass-through testing, the switching matrix 50 is switched so that the first transmitting port 41 of the test instrument 40 is electrically connected to the high-speed differential pin on one of the Type-C ports 21 of the USB cable 20 through the first contact terminal 311 of the first test fixture 30; the first receiving port 42 of the test instrument 40 is electrically connected to the high-speed differential pin on another Type-C port 21 through the first contact terminal 311 of another first test fixture 30. The test instrument 40 transmits a test signal to the USB cable 20 through the first transmitting port 41 and generates a response signal through the USB cable 20. The response signal is transmitted to the test instrument 40 through the first receiving port 42 via the USB cable 20, thus completing the high-speed signal test.

[0068] This application establishes a first test fixture 30, which, in conjunction with the independent connection ports 53 within the switch matrix 50, forms a test loop. The test signal is transmitted from the first transmitting port 41 of the test instrument 40 to the first input port 51 of the switch matrix 50. Within the switch matrix 50, the signal is routed to the corresponding connection port 53 and transmitted to the first test fixture 30 at one end of the USB cable 20. The test signal passes through the USB cable 20 and generates a response signal, which is then transmitted from the other end of the first test fixture 30 to the corresponding connection port 53. Within the switch matrix 50, the signal is routed to the first output port 52, and the response signal is received by the first receiving port 42 of the test instrument 40. This physically isolates the coupling paths between different signal types, eliminating crosstalk during high- and low-frequency signal testing. Simultaneously, this application, through the first test fixture 30 and the switch matrix 50, connects all pins under test to the test system at once. By switching the switch matrix 50, the signal path can be changed to complete tests on different pins and different test items. This avoids manual cable changes, pin replacements, and test item settings during testing, greatly improving testing efficiency and meeting the large-scale production testing needs of Type-C cables.

[0069] In some embodiments, the test instrument 40 further includes a second transmitting port 43 and a second receiving port 44;

[0070] The switch matrix 50 also includes a second input port 54 and a second output port 55;

[0071] The second transmitting port 43 of the test instrument 40 is electrically connected to the second input port 54 of the switch matrix 50, and the second receiving port 44 of the test instrument 40 is electrically connected to the second output port 55 of the switch matrix 50.

[0072] The control switch matrix 50 is activated so that the second input port 54 is connected to the corresponding connection port 53, and the second output port 55 is connected to the corresponding connection port 53.

[0073] In this embodiment, the first transmitting port 41, the first receiving port 42, the second transmitting port 43, and the second receiving port 44 of the test instrument 40, and the first input port 51, the first output port 52, the connection port 53, the second input port 54, and the second output port 55 of the switch matrix 50 work simultaneously to meet the requirement of four ports working simultaneously when performing high-speed radio frequency signal crosstalk testing on the high-speed differential pin pairs and low-speed differential pin pairs in the USB cable 20.

[0074] Figure 6 This is a schematic diagram of the structure of the second test fixture provided in one embodiment of this application.

[0075] Figure 5 This is a structural schematic diagram of the second test fixture provided in one embodiment of this application from another perspective.

[0076] Please refer to the following at the same time Figures 1 to 7 In some embodiments, the Type-C port 21 has a second pin pair. The USB cable automatic testing system 100 also includes at least one pair of second test fixtures 60, each for electrical connection to the Type-C ports 21 at both ends of the USB cable 20. Each second test fixture 60 has a second socket 61 that matches the Type-C port 21. The second socket 61 matches the Type-C port 21 and has the same mechanical structure as the first socket 31. The second socket 61 has a second contact terminal 611 that connects to the second pin pair of the Type-C port 21. The second test fixture 60 has a plurality of second RF connectors 62. Specifically, the internal trace width of the second test fixture 60 is greater than that of the first test fixture 20 to carry a large current and reduce voltage drop.

[0077] In this embodiment, by setting the first test fixture 30 and the second test fixture 60, all the pins under test in the Type-C port 21 under test can be connected to the USB cable automatic test system 100 at one time, avoiding manual cable replacement, test pin replacement and test item setting during the test, which greatly improves the test efficiency and meets the needs of large-scale production test of Type-C cables.

[0078] like Figure 4 and Figure 5 As shown, in some embodiments, the first test fixture 30 further includes a first test plate 33, a first socket 31 is disposed on the top of the first test plate 33, and the first test plate 33 includes a first test surface 33a and a second test surface 33b spaced apart from each other.

[0079] The first socket 31 is provided with a plurality of first contact terminals 311, which are symmetrically arranged. The first contact terminals 311 on the same side as the first test surface 33a are electrically connected to the first RF connector 32 through PCB traces, and the first contact terminals 311 on the same side as the second test surface are electrically connected to the first RF connector 32 through PCB traces.

[0080] In this embodiment, the first test board 33 is a PCB board, which adopts a low-loss and stable dielectric constant radio frequency material. The PCB traces on the first test board 33 are designed with strict 50 ohms (single-ended) or 100 ohms (differential) impedance control.

[0081] In this embodiment, a double-sided design on the first test board 33 is achieved through the first test surface 33a and the second test surface 33b. For example, the traces of two pairs of differential signals, RX1+ / - and TX2+ / -, are arranged on the first test surface 33a, while the traces of three pairs of differential signals, TX1+ / -, RX2+ / - and D+ / -, are arranged on the second test surface 33b. At the same time, the angle between different traces is maximized, increasing the physical distance between high-speed channels and suppressing crosstalk generated inside the first test fixture 30. In addition, the reasonable layout minimizes the PCB trace length of the high-speed differential port and the low-speed differential port from the first socket 31 to the edge of the first test board 33, thereby minimizing the signal loss introduced by the first test fixture 30.

[0082] like Figure 6 and Figure 7 As shown, in some embodiments, the second test fixture 60 further includes a second test plate 63, a second socket 61 is disposed on the top of the second test plate 63, and the second test plate 63 includes a third test surface 63a and a fourth test surface 63b spaced apart from each other.

[0083] The second socket 61 is provided with multiple second contact terminals 611, which are symmetrically arranged. The second contact terminals 611 on the same side as the third test surface 63a are electrically connected to the second RF connector 62 through PCB traces, and the second contact terminals 611 on the same side as the fourth test surface 63b are electrically connected to the second RF connector 62 through PCB traces.

[0084] In some embodiments, the connection port 53 is connected to the first RF connector 32 of the first test fixture 30 via an RF cable 70; the connection port 53 is connected to the second RF connector 62 of the second test fixture 60 via an RF cable 70.

[0085] In this embodiment, the USB cable 20 to be tested is connected to the first test fixture 30 or the second test fixture 60 to perform different test items.

[0086] Figure 8 This is an electrical principle block diagram of a switch matrix provided in one embodiment of this application;

[0087] like Figure 8 As shown, in some embodiments, the switch matrix 50 includes:

[0088] At least four primary selector switches 56, including a first common terminal 56a and multiple first switchable terminals 56b, wherein a first input port 51, a first output port 52, a second input port 54, and a second output port 55 are respectively electrically connected to the first common terminal 56a of the corresponding primary selector switch 56; and

[0089] Multiple secondary selector switches 57, each secondary selector switch 57 including a second common terminal 57a and multiple second switching terminals 57b, the second common terminal 57a of each secondary selector switch 57 being electrically connected to the first switching terminal 56b of each primary selector switch 56, controlling the primary selector switch 56 to switch to the corresponding first switching terminal 56b, thereby connecting the corresponding secondary selector switch 57 into the signal path; and

[0090] Multiple three-level selector switches 58, each three-level selector switch 58 includes a third common terminal 58a and multiple third terminals to be switched 58b. The third common terminal 58a of each three-level selector switch 58 is electrically connected to the terminal to be switched of the corresponding two-level selector switch 57, and the two-level selector switch 57 is controlled to switch the corresponding second terminal to be switched 57b so that the corresponding three-level selector switch 58 is connected to the signal path.

[0091] Each connection port 53 is electrically connected to the corresponding third switchable terminal 58b of the corresponding three-level selector switch 58, controlling the three-level selector switch 58 to switch to the corresponding third switchable terminal 58b to access the signal path.

[0092] This implementation constructs a signal routing network through a multi-level selection switch matrix 50, allowing the system to manage and select a larger number of pins under test (DUTs) using limited test instrument resources 40. This enables connection capabilities from the test instrument 40 ports to any DUT pin, making test configurations more flexible. Whether performing differential testing, single-ended testing, or complex tests requiring multiple pins to be connected to different instrument ports, all can be achieved by controlling the switch matrix 50. Within a test cycle, the system can seamlessly switch from one high-speed S-parameter test item to another via rapid electronic switching, without any manual intervention.

[0093] In some implementations, there are multiple primary selector switches 56, secondary selector switches 57, and tertiary selector switches 58. If it is necessary to support testing of more pins or more complex cables, simply add a corresponding third switchable terminal 58b to the tertiary selector switch 58 without changing the core architecture of the entire switch matrix 50.

[0094] In some implementations, the first switching terminal 56b and the third switching terminal 58b are electrically connected to the load 80, respectively.

[0095] In this embodiment, the load 80 is 50 ohms, used to terminate unused signal paths under specific conditions, reducing reflections and interference.

[0096] In some implementations, the test instrument 40 is a vector network analyzer used for S-parameter measurement to characterize the performance of the USB cable under test.

[0097] The testing process for a USB cable 20 according to this application is as follows:

[0098] Taking a typical USB Type-C cable as an example, which has 12 pairs of pins, the operator sets up a switch matrix 50 with one first input port 51, one first output port 52, one second input port 54, one second output port 55, and 32 connection ports 53. Based on the test items, the operator selects a test instrument 40 with a first transmit port 41, a first receive port 42, a second transmit port 43, and a second receive port 44. The operator first establishes the physical connections between the various parts of the system. Using RF cables 70, the operator connects the first transmit port 41, the first receive port 42, the second transmit port 43, and the second receive port 44 of the test instrument 40 to the corresponding first input port 51, the first output port 52, the second input port 54, and the second output port 55 of the switch matrix 50. The operator then connects several connection ports 53 of the switch matrix 50 to the first RF connector 32 of the first test fixture 30 and to the second RF connector 62 of the second test fixture 60. After the connection is completed, the operator performs coaxial calibration of the test system and removes the test fixture, completing the preparation work for the system before testing.

[0099] When performing high-speed differential signal testing, the Type-C ports 21 at both ends of the USB cable under test 20 are inserted into the first sockets 31 of the two first test fixtures 30, respectively. At this time, the high-speed differential pin pair and the low-speed differential pin pair of the USB cable 20 are connected to the test path of the test system through the first contact terminals 311 in the first test fixture 30.

[0100] Taking the measurement of one set of high-speed differential pin pairs (TX1+ / -, RX1+ / -) as an example, insertion loss and crosstalk are measured. The first-stage selection switch 56, second-stage selection switch 57, and third-stage selection switch 58 within the control switch matrix 50 work together to establish connections between the two first transmitting ports 41 of the vector network analyzer and the TX1+ / - pins of the USB cable 20, and between the two first receiving ports 42 and the RX1+ / - pins of the USB cable 20. This establishes a signal path from the excitation source of the vector network analyzer to the switch matrix 50, the first test fixture 30, the TX1+ / - pins of the USB cable 20, and then to the RX1+ / - pins of the USB cable 20, the first test fixture 30, the switch matrix 50, and the receiving end of the vector network analyzer. The vector network analyzer scans within its set frequency range, measuring and recording the differential insertion loss of this measurement path. When measuring near-end crosstalk, the control switch matrix 50 connects the first transmit port 41 of the vector network analyzer to the TX1+ pin of the USB cable 20 and the first receive port 42 of the vector network analyzer to the TX1- pin of the USB cable 20. Simultaneously, the far-end RX1+ and RX1- pins are connected to the load 80 to eliminate reflections and interference. This process is repeated to complete the S-parameter measurement of the high-speed differential pin pair in the USB cable 20.

[0101] When performing low-speed differential signal testing, insert the Type-C ports at both ends of the USB cable 20 into the second test fixture 60, and measure different test items of different pins through the switching matrix 50 to obtain the S-parameters of the low-speed differential pin pair, auxiliary control pin, and power supply pin.

[0102] The operator can unplug the USB cable 20 to test the next USB cable 20.

[0103] The entire process can automatically complete the S-parameter tests of all 20 pins under test of the USB cable, shortening the test cycle, improving test efficiency, and effectively meeting the high-efficiency production test requirements of the production line.

[0104] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An automatic testing system for USB cables, used for testing USB cables, the USB cable including two Type-C ports located at both ends of the cable, each Type-C port having a first pin pair, characterized in that, The automatic USB cable testing system also includes: At least one pair of first test fixtures are respectively used to electrically connect to the Type-C ports at both ends of the USB cable. Each first test fixture is provided with a first socket that matches the Type-C port. The first socket is provided with a first contact terminal that is electrically connected to the pin pair of the Type-C port. The first test fixture is provided with a first radio frequency connector that is electrically connected to the first contact terminal. The test instrument includes a first transmitting port and a first receiving port, used to send test signals to the USB cable and receive response signals from the USB cable, and the test instrument measures the response signals; The switch matrix includes a first input port, a first output port, and multiple connection ports. The first input port of the switch matrix is ​​electrically connected to the first transmitting port of the test instrument, the first output port of the switch matrix is ​​electrically connected to the first receiving port of the test instrument, and each connection port is electrically connected to the first RF connector of the corresponding first test fixture. Specifically, the switch matrix is ​​controlled to connect the first input port to the corresponding connection port and the first output port to the corresponding connection port. This forms a test loop that transmits the test signal from the first transmitting port of the test instrument to the first input port of the switch matrix, routes it within the switch matrix to the corresponding connection port, transmits it to the first test fixture at one end of the USB cable, the test signal passes through the USB cable and generates a response signal, the response signal is transmitted from the first test fixture at the other end to the corresponding connection port, routes it within the switch matrix to the first output port, and the first receiving port of the test instrument receives the response signal, thus performing automated testing on the USB cable.

2. The automatic testing system for USB cables according to claim 1, characterized in that, The test instrument also includes a second transmitting port and a second receiving port; The switch matrix also includes a second input port and a second output port; The second transmitting port of the test instrument is electrically connected to the second input port of the switch matrix, and the second receiving port of the test instrument is electrically connected to the second output port of the switch matrix; The switch matrix is ​​controlled to operate so that the second input port is connected to the corresponding connection port, and the second output port is connected to the corresponding connection port.

3. The automatic testing system for USB cables according to claim 2, characterized in that, The Type-C port is provided with a second pin pair. The USB cable automatic testing system also includes at least one pair of second test fixtures, which are respectively used to electrically connect to the Type-C ports at both ends of the USB cable. Each second test fixture is provided with a second socket that matches the Type-C port. The second socket is provided with a second contact terminal that connects to the second pin pair of the Type-C port. The second test fixture is provided with a second radio frequency connector that connects to the second contact terminal.

4. The automatic testing system for USB cables according to claim 3, characterized in that, The first test fixture further includes a first test plate, the first socket is disposed at the top of the first test plate, and the first test plate includes a first test surface and a second test surface spaced apart and opposite to each other. The first socket is provided with multiple first contact terminals, which are symmetrically arranged. The first contact terminals on the same side as the first test surface are electrically connected to the first RF connector through PCB traces, and the first contact terminals on the same side as the second test surface are electrically connected to the first RF connector through PCB traces.

5. The automatic testing system for USB cables according to claim 3, characterized in that, The second test fixture also includes a second test plate, the second socket is disposed at the top of the second test plate, and the second test plate includes a third test surface and a fourth test surface spaced apart from each other; The second socket contains multiple second contact terminals, which are symmetrically arranged. The first contact terminal on the same side as the third test surface is electrically connected to the second RF connector via PCB traces, and the second contact terminal on the same side as the fourth test surface is electrically connected to the second RF connector via PCB traces.

6. The automatic testing system for USB cables according to claim 4, characterized in that, The connection port is connected to the first RF connector of the first test fixture via an RF cable; the connection port is connected to the second RF connector of the second test fixture via an RF cable.

7. The automatic testing system for USB cables according to claim 3, characterized in that, The switching matrix includes: At least four primary selector switches, each including a first common terminal and multiple first switchable terminals, wherein the first input port, first output port, second input port, and second output port are respectively electrically connected to the first common terminal of the corresponding primary selector switch; and Multiple secondary selector switches, each secondary selector switch including a second common terminal and multiple second switching terminals, the second common terminal of each secondary selector switch being electrically connected to the first switching terminal of each primary selector switch, controlling the primary selector switch to switch to the corresponding first switching terminal so that the corresponding secondary selector switch is connected to the signal path; and Multiple three-level selector switches, each three-level selector switch including a third common terminal and multiple third switching terminals, the third common terminal of each three-level selector switch being electrically connected to the second switching terminal of the corresponding two-level selector switch, controlling the two-level selector switch to switch the corresponding second switching terminal so that the corresponding three-level selector switch is connected to the signal path; Each connection port is electrically connected to the corresponding third switch terminal of the three-level selection switch, controlling the three-level selection switch to switch to the corresponding third switch terminal to access the signal path.

8. The automatic testing system for USB cables according to claim 7, characterized in that, The first and third terminals to be switched are each electrically connected to a load.

9. The automatic testing system for USB cables according to claim 7, characterized in that, The number of the first pin pairs is multiple, and the multiple first pin pairs include at least two sets of high-speed differential pin pairs and at least one set of low-speed differential pin pairs; The number of the second pin pairs is multiple, and the multiple second pin pairs include at least one set of auxiliary control pin pairs and one set of power supply pin pairs.

10. The automatic testing system for USB cables according to any one of claims 1 to 9, characterized in that, The testing instrument is a vector network analyzer.

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