A high power test microwave anechoic chamber

Abstract

The application relates to a high-power test microwave darkroom, which comprises a shell, the outer periphery of the shell is provided with a frame, the inner side of the shell is concavely provided with a cavity, the inner wall of the cavity of the shell is provided with a wave-absorbing assembly, one side of the cavity of the shell is provided with a monitoring assembly, and the outer side of the top of the shell is provided with an illumination assembly. The shielding body selects a darkroom test environment with high shielding efficiency index, and can meet the electromagnetic environment standard limit value requirement; the high-power wave-absorbing material adopts non-woven fabric, silicon carbide, ceramic or honeycomb material, so that the wave-absorbing material can withstand the high-power test state; and the auxiliary facilities include monitoring, illumination, fire fighting and ventilation in the darkroom, so that the equipment is not disturbed and normally operates in the high-power test state.

Description

Technical Field

[0001] This invention belongs to the field of high-power test microwave anechoic chambers, specifically a high-power test microwave anechoic chamber. Background Technology

[0002] During high-power microwave anechoic chamber testing, the environment must be able to withstand the high-power tests without damage, and maintain stable electrical performance unaffected by the high-power testing conditions. This necessitates that the high-power application within the microwave anechoic chamber be considered from the initial design stage. A typical high-power microwave anechoic chamber consists of three main parts: the shielding effectiveness design must meet standard specifications; auxiliary facilities, such as monitoring and lighting, must meet high-power requirements and operate normally under high-power testing conditions without affecting the internal electromagnetic environment; and a high-power microwave anechoic chamber design is proposed. Summary of the Invention

[0003] The purpose of this section is to outline some aspects of embodiments of the present invention and to briefly describe some preferred embodiments. Simplifications or omissions may be made in this section, as well as in the abstract and title of this application, to avoid obscuring the purpose of these documents; however, such simplifications or omissions should not be construed as limiting the scope of the invention.

[0004] Given the following technical problems in the existing technology: how to solve the problem that monitoring and lighting facilities can be used normally under high power test conditions without affecting the electromagnetic environment inside the dark room.

[0005] To solve the above-mentioned technical problems, the present invention provides the following technical solution: a high-power test microwave anechoic chamber includes an outer shell, a frame is provided on the outer periphery of the outer shell, a cavity is recessed on the inner side of the outer shell, a wave-absorbing component is provided on the inner wall of the cavity of the outer shell, a monitoring component is provided on one side of the cavity of the outer shell, and an illumination component is provided on the outer side of the top of the outer shell.

[0006] As a preferred technical solution for a high-power test microwave anechoic chamber, the lighting assembly includes a lamp pole, a bracket, an LED lamp, a chain, a waveguide window, an exhaust fan, and a filter. The lamp pole is fixedly connected to the outer shell via the bracket, and an exhaust fan is provided on the lamp pole. A waveguide window is provided at the bottom of the exhaust fan. The lower side of the light carrier pole is connected to an LED light via a chain. The light carrier pole is equipped with a filter, which is electrically connected to the LED light.

[0007] As a preferred technical solution for a high-power test microwave anechoic chamber, the absorbing assembly includes absorbing elements and a base plate. Multiple absorbing elements are disposed on the base plate. The absorbing elements are conical, and both the absorbing elements and the base plate are made of absorbing material.

[0008] As a preferred technical solution for a high-power test microwave anechoic chamber, the monitoring component includes a monitor and a support rod, wherein the monitor is fixedly connected to the base plate via the support rod.

[0009] As a preferred technical solution for a high-power test microwave anechoic chamber, the monitor is covered with microwave absorbing material, and the monitor is connected to the support rod via a flange.

[0010] As a preferred technical solution for a high-power testing microwave anechoic chamber, a high-power testing microwave anechoic chamber mainly comprises three parts: 1. The shielding effectiveness design of the anechoic chamber should meet the requirements of the standards and specifications; 2. The absorbing material for the anechoic chamber should be able to withstand high power requirements and provide high-power test data and test reports; 3. Auxiliary facilities should meet the requirements for high power, be able to be used normally under high power test conditions, and not affect the electromagnetic environment inside the darkroom. The auxiliary facilities include monitoring and lighting facilities.

[0011] As a preferred technical solution for a high-power testing microwave anechoic chamber, the shielding body is selected from an anechoic chamber testing environment with high shielding effectiveness, which can meet the electromagnetic environment standard limit requirements; the high-power absorbing material is made of non-woven fabric, silicon carbide, ceramic or honeycomb material to ensure that the absorbing material can withstand high-power testing conditions; the auxiliary facilities include monitoring, lighting, fire protection and ventilation in the anechoic chamber to ensure that the equipment is not interfered with and operates normally under high-power testing conditions.

[0012] As a preferred technical solution for high-power testing microwave anechoic chambers, the power of the device under test is verified inside the anechoic chamber, and the equivalent radiated power density is as follows: Power density formula:

[0013] In the formula: S is the power density; P t This refers to the transmission power. G t This refers to the gain of the transmitting antenna; R is the distance between the launch point and the measurement point; The design of the absorbing materials and auxiliary facilities in the anechoic chamber should be able to withstand high power.

[0014] The beneficial effects of a high-power test microwave anechoic chamber of the present invention are as follows: A high-power test microwave anechoic chamber mainly comprises three parts: the shielding effectiveness design of the anechoic chamber should meet the requirements of the standard specifications; the absorbing material of the anechoic chamber should be able to withstand high power requirements and provide high-power test experimental data and test reports; the auxiliary facilities of the anechoic chamber, such as monitoring and lighting facilities, should meet the requirements of high power requirements, be able to be used normally under high power test conditions, and not affect the electromagnetic environment inside the anechoic chamber. This solution addresses the application scenario of high-power emission testing of the device under test in a microwave anechoic chamber environment. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. Wherein: Figure 1 This is a schematic diagram of the overall structure of the present invention; Figure 2 This is a schematic diagram of the structure of the lighting component of the present invention; Figure 3 This is a top view of the lighting assembly of the present invention. Figure 4 This is a schematic diagram of the structure of the wave-absorbing element of the present invention; Figure 5 This is a schematic diagram of the test setup; Figure 6 This is a schematic diagram illustrating the calculation of electromagnetic peak power density at any point in this invention.

[0016] Reference numerals: Housing-1, Frame-2, Lighting assembly-3, Monitoring assembly-4, Wave-absorbing assembly-5, Light pole-31, Bracket-32, LED light-33, Chain-34, Waveguide window-35, Exhaust fan-36, Filter-37, Monitor-41, Support rod-42, Wave-absorbing component-51, Base plate-52. Detailed Implementation

[0017] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0018] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0019] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places in this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that is mutually exclusive with other embodiments.

[0020] Secondly, the present invention is described in detail with reference to the schematic diagrams. When detailing the embodiments of the present invention, for ease of explanation, the cross-sectional views illustrating the device structure may be partially enlarged, not according to the usual scale. Furthermore, the schematic diagrams are merely examples and should not limit the scope of protection of the present invention. In addition, actual fabrication should include three-dimensional spatial dimensions of length, width, and depth.

[0021] like Figures 1-6 As shown, the present invention proposes a high-power test microwave anechoic chamber including an outer shell 1, a frame 2 arranged on the outer periphery of the outer shell 1, a cavity recessed on the inner side of the outer shell 1, a wave-absorbing component 5 arranged on the inner wall of the cavity of the outer shell 1, a monitoring component 4 arranged on one side of the cavity of the outer shell 1, and an illumination component 3 arranged on the outer side of the top of the outer shell 1.

[0022] The lighting assembly 3 includes a lamp post 31, a bracket 32, an LED lamp 33, a chain 34, a waveguide window 35, an exhaust fan 36, and a filter 37. The lamp post 31 is fixedly connected to the housing 1 through the bracket 32. An exhaust fan 36 is provided on the lamp post 31, and a waveguide window 35 is provided at the bottom of the exhaust fan 36. The lower side of the lamp carrier pole 31 is connected to the LED lamp 33 via a chain 34. The lamp carrier pole 31 is equipped with a filter 37, which is electrically connected to the LED lamp 33.

[0023] The wave-absorbing assembly 5 includes wave-absorbing elements 51 and a base plate 52. Multiple wave-absorbing elements 51 are provided on the base plate 52. The wave-absorbing elements 51 are conical. Both the wave-absorbing elements 51 and the base plate 52 are made of wave-absorbing material.

[0024] The monitoring component 4 includes a monitor 41 and a support rod 42, wherein the monitor 41 is fixedly connected to the base plate 52 via the support rod 42.

[0025] The monitor 41 is covered with a wave-absorbing material, and the monitor 41 is connected to the support rod 42 by a flange.

[0026] A high-power testing microwave anechoic chamber mainly consists of three parts: 1. The shielding effectiveness design of the anechoic chamber should meet the requirements of the standards and specifications; 2. The absorbing material for the anechoic chamber should be able to withstand high power requirements and provide high-power test data and test reports; 3. Auxiliary facilities should meet the requirements for high power, be able to be used normally under high power test conditions, and not affect the electromagnetic environment inside the darkroom. The auxiliary facilities include monitoring and lighting facilities.

[0027] The shielding body is selected from an anechoic chamber testing environment with high shielding effectiveness, which can meet the electromagnetic environment standard limit requirements; the high-power absorbing material is made of non-woven fabric, silicon carbide, ceramic or honeycomb material to ensure that the absorbing material can withstand high-power testing conditions; the auxiliary facilities include monitoring, lighting, fire protection and ventilation in the anechoic chamber to ensure that the equipment is not interfered with and operates normally under high-power testing conditions.

[0028] The power of the test specimen was verified in an anechoic chamber, and the equivalent radiated power density is as follows: Power density formula:

[0029] In the formula: S is the power density; P t This refers to the transmission power. G t This refers to the gain of the transmitting antenna; R is the distance between the launch point and the measurement point; The design of the absorbing materials and auxiliary facilities in the anechoic chamber should be able to withstand high power.

[0030] The specific implementation method is as follows: Calculate the shielding effectiveness of the shielded room according to the following formula: SE = (P1-P2) dB In the formula: P1 is the receiver indication value (dBm) during calibration; P2 is the receiver indication value (dBm) during testing.

[0031] The shielding effectiveness in an anechoic chamber should meet the requirements of GB 8702-2014 Electromagnetic Environment Control Limits and GJB 5313A-2017 Electromagnetic Radiation Exposure Limits and Measurement Methods.

[0032] Selection of absorbing materials and auxiliary facilities: The peak power density of electromagnetic waves at any point in space is:

[0033] In the formula: S is the power density; P t This refers to the transmission power. G t This refers to the gain of the transmitting antenna; R is the distance between the launch point and the measurement point. Required shielding effectiveness: The power density is calculated using the above formula. The exposure limit S1 is calculated according to the most stringent condition in GJB 5313A-2017 "Electromagnetic Radiation Exposure Limits and Measurement Methods"—"long-term exposure in the work area ≥ 1 hour"—and the required shielding effectiveness is calculated using the following formula:

[0034] In the formula: SE -- Required shielding effectiveness (dB); S -- Peak power density (W / m³) 2 ); S1 -- Electromagnetic exposure limit calculated according to standard documents (W / m²) 2 ).

[0035] The selection of absorbing materials and auxiliary facilities in an anechoic chamber should be able to withstand the peak power density energy of electromagnetic waves.

[0036] In addition, facilities in darkrooms, especially exposed lighting and monitoring equipment, must be designed to withstand high power consumption.

[0037] Example: The monitor 41 and support rod 42 are installed inside the base plate 52. The lighting assembly 3 is assembled and installed through the housing 1. A special shielded light box is installed outside the lighting equipment. The shielded light box is made of electromagnetic shielding material, including copper. The lighting light box is equipped with a special power filter and ventilation and heat dissipation waveguide window (exhaust fan). By forcibly exhausting air to the outside, the heat emitted by the lamp is reduced. The outer skin of the lamp rod 31 can be used to make a shielded light box.

[0038] It should be understood that numerous specific implementation decisions can be made during the development of any practical implementation, such as in any engineering or design project. Such development efforts may be complex and time-consuming, but for those skilled in the art who benefit from this disclosure, the development effort will be a routine work of design, manufacturing, and production without requiring much experimentation.

[0039] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all such modifications or substitutions should be covered within the scope of the claims of the present invention.

Claims

1. A high-power test microwave anechoic chamber, characterized in that: Includes an outer shell (1), a frame (2) is provided on the outer periphery of the outer shell (1), a cavity is recessed on the inner side of the outer shell (1), a wave-absorbing component (5) is provided on the inner wall of the cavity of the outer shell (1), a monitoring component (4) is provided on one side of the cavity of the outer shell (1), and a lighting component (3) is provided on the outer side of the top of the outer shell (1). The lighting assembly (3) includes a lamp post (31), a bracket (32), an LED lamp (33), a chain (34), a waveguide window (35), an exhaust fan (36), and a filter (37). The lamp post (31) is fixedly connected to the housing (1) through the bracket (32). An exhaust fan (36) is provided on the lamp post (31), and a waveguide window (35) is provided at the bottom of the exhaust fan (36). The lower side of the lamp post (31) is connected to the LED lamp (33) via a chain (34). The lamp post (31) is equipped with a filter (37), which is electrically connected to the LED lamp (33). The absorbing component (5) includes an absorbing element (51) and a base plate (52). Multiple absorbing elements (51) are provided on the base plate (52). The absorbing element (51) is conical. Both the absorbing element (51) and the base plate (52) are made of absorbing material. The monitoring component (4) includes a monitor (41) and a support rod (42), wherein the monitor (41) is fixedly connected to the base plate (52) via the support rod (42).

2. The high-power test microwave anechoic chamber according to claim 1, characterized in that: The monitor (41) is covered with a wave-absorbing material, and the monitor (41) is connected to the support rod (42) by a flange.

3. The high-power test microwave anechoic chamber according to claim 2, characterized in that: The power of the test specimen was verified in an anechoic chamber, and the equivalent radiated power density is as follows: Power density formula: ; In the formula: S is the power density; P t This refers to the transmission power. G t This refers to the gain of the transmitting antenna; R is the distance between the emission point and the measurement point; the design of the absorbing materials and auxiliary facilities in the anechoic chamber is selected to withstand high power.

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