Test system for solid state drives

Abstract

The application discloses a testing system of a solid state disk, which comprises a total control device, at least one intermediate control device and a corresponding adapter board of each intermediate control device; the total control device is connected with each intermediate control device and each adapter board; each intermediate control device is connected with the corresponding adapter board; each adapter board is used for connecting a disk to be tested; the total control device is used for obtaining testing data of the corresponding disk to be tested through each adapter board, switching the USB protocol configuration of the adapter board according to the testing data, generating a testing command and sending the testing command to each intermediate control device; the testing data comprises configuration information of the disk to be tested in the next testing stage; the intermediate control device is used for testing the disk to be tested connected by the corresponding adapter board according to the testing command. The application can improve the testing efficiency of the solid state disk.

Description

Technical Field

[0001] This application relates to the field of testing technology, specifically to a testing system for solid-state drives. Background Technology

[0002] In some SSD (Solid State Drive) testing scenarios, PCIe to USB adapters are used to switch between PCIe and USB protocols. However, SSD testing typically involves multiple testing phases, each with different bandwidth requirements. For example, some phases have lower bandwidth requirements, needing only a few PCIe lanes, while others have higher bandwidth requirements, necessitating the use of more PCIe lanes. Therefore, the number of PCIe lanes required during SSD testing varies with the phases, and different numbers of PCIe lanes require different USB protocols (e.g., PCIe x2 requires USB 3.0, PCIe x4 requires USB 4.0, etc.).

[0003] However, the USB protocol configuration of adapters like PCIe to USB adapters is usually pre-defined. This easily leads to a situation where, when one test phase is completed and it's necessary to switch to the next phase with different channel requirements, the SSD needs to be unplugged and plugged back into a PCIe to USB adapter configured with the USB protocol to match the new channel requirements. This repeated plugging and unplugging significantly reduces testing efficiency. Utility Model Content

[0004] Therefore, this application provides a solid-state drive (SSD) testing system to improve SSD testing efficiency.

[0005] This application provides a solid-state drive (SSD) testing system, including a central control device, at least one intermediate control device, and adapter boards corresponding to each of the intermediate control devices; the central control device is connected to each of the intermediate control devices and to each of the adapter boards; each of the intermediate control devices is connected to its corresponding adapter board.

[0006] Each of the aforementioned adapter boards is used to connect to one hard drive under test;

[0007] The central control device is used to acquire the test data of the corresponding hard drive under test through each of the adapter boards, switch the USB protocol configuration of the adapter board according to the test data, generate test commands, and send test commands to each of the central control devices; the test data includes the configuration information of the hard drive under test in the next test stage;

[0008] The central control device is used to test the hard drive to be tested connected to the corresponding adapter board according to the test command.

[0009] Optionally, the hard drive under test is used to write test data into a designated flash memory after the test is completed; the adapter board is also used to read the test data of the connected hard drive under test, translate the test data, and upload the translated test data to the central control device.

[0010] Optionally, the central control device is further configured to generate a switching command and / or a test command based on the configuration information of the hard drive under test in the next test phase; the switching command is used to instruct the adapter board to switch from the current USB protocol to the USB protocol corresponding to the next test phase, so as to realize the USB protocol configuration switching; the test command is used to instruct the central control device to test the corresponding hard drive under test.

[0011] Optionally, the adapter board includes a first interface, a second interface, a bridging module, and a slot; the first interface is used to connect to the corresponding central control device; the second interface is used to connect to the main control device; the slot is used to connect to the hard drive under test; and the bridging module is used to connect the first interface and the slot.

[0012] Optionally, the adapter board further includes a switching module; the switching module is connected to the second interface to obtain a switching command received by the second interface, and switches the USB protocol configuration of the bridge module according to the switching command.

[0013] Optionally, the adapter board is also used to switch the USB protocol with the corresponding central control device according to the switching command.

[0014] Optionally, the adapter board is further configured to send connection confirmation information of the USB protocol to the central control device; the central control device is further configured to update the corresponding USB protocol according to the connection confirmation information.

[0015] Optionally, the adapter board further includes a power input interface and a voltage drop circuit; the input terminal of the power input interface is used to connect to the input voltage, and the output terminal is connected to the input terminal of the voltage drop circuit; the output terminal of the voltage drop circuit is respectively connected to each module in the adapter board to reduce the input voltage to a preset operating voltage and input the operating voltage to each module in the adapter board.

[0016] Optionally, the adapter board further includes a current amplifier and an analog-to-digital converter; the input terminal of the current amplifier is connected to the first interface, and the output terminal is connected to the input terminal of the analog-to-digital converter, for detecting the current signal corresponding to the first interface and transmitting the current signal to the analog-to-digital converter; the output terminal of the analog-to-digital converter is connected to the input terminal of the switching module, for converting the current signal into a corresponding digital signal and transmitting the digital signal to the switching module; the switching module is used to detect the digital signal and perform overcurrent protection based on the digital signal.

[0017] Optionally, the solid-state drive testing system further includes an intermediate connection device; the first end of the intermediate connection device is connected to the central control device, and the second end is connected to each of the adapter boards, so that the central control device can be connected to multiple adapter boards simultaneously.

[0018] In the solid-state drive testing system described in this application, the central control device can acquire test data including the configuration information of the hard drive under test in the next test stage. Based on the test data, it can switch the USB protocol configuration of the adapter board to automatically switch the USB protocol of the adapter board to the USB protocol corresponding to the next test stage, avoiding the repeated plugging and unplugging operations of unplugging the hard drive under test and plugging it into the matching adapter board. It can also generate test commands for the next test stage and send test commands to each central control device, so that the central control device can automatically execute the corresponding test work in the next test stage according to the test commands. In this way, multiple hard drives under test can be automatically tested in multiple test stages at the same time, which can improve the testing efficiency of the hard drives under test. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the test system structure of a solid-state drive according to an embodiment of this application;

[0021] Figure 2 This is a schematic diagram of an adapter board structure according to an embodiment of this application;

[0022] Figure 3 This is a schematic diagram of the adapter board structure according to another embodiment of this application;

[0023] Figure 4 This is a schematic diagram of a test system structure for a solid-state drive according to another embodiment of this application;

[0024] Figure 5This is a schematic diagram of a test system structure for a solid-state drive according to another embodiment of this application;

[0025] Figure 6 This is a schematic diagram of a voltage drop circuit structure according to an embodiment of this application;

[0026] Figure 7 This is a schematic diagram of a current amplifier structure according to an embodiment of this application;

[0027] Figure 8 This is a schematic diagram of a test system structure for a solid-state drive according to another embodiment of this application. Detailed Implementation

[0028] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. In the absence of conflict, the following embodiments and their technical features can be combined with each other.

[0029] The first aspect of this application provides a testing system for solid-state drives (SSDs), with reference to... Figure 1 As shown, the solid-state drive (SSD) testing system includes a central control device 100, at least one intermediate control device 200, and adapter boards 300 corresponding to each of the intermediate control devices 200. The central control device 100 includes a control device that performs overall control over the testing of multiple SSDs under test (also called hard drives under test). The intermediate control devices 200 include a control device that, under the control of the central control device 100, tests the hard drives under test connected to the corresponding adapter boards 300. The adapter board 300 is a PCIe to USB adapter board, capable of converting between PCIe data and USB data.

[0030] The central control device 100 is connected to each of the intermediate control devices 200, and the central control device 100 is also connected to each of the adapter boards 300. Each intermediate control device 200 is connected to its corresponding adapter board 300.

[0031] Each adapter board 300 is used to connect one hard drive to be tested.

[0032] The central control device 100 is used to acquire test data of the corresponding hard drive under test through each adapter board 300, switch the USB protocol configuration of the adapter board 300 according to the test data, generate test commands, and send the test commands to each central control device 200. Optionally, the test data includes the configuration information of the hard drive under test in the next test stage, so that the central control device 100 can determine the USB protocol to be used in the next test stage based on the test data, thereby configuring the USB protocol of the adapter board 300 in real time. The central control device 100 can also determine the test command for the next test stage based on the test data, so that the central control device 200 performs the corresponding test work in the next test stage according to the test command.

[0033] The central control device 200 is used to test the hard drive under test connected to the corresponding adapter board 300 according to the test command. After switching the USB protocol configuration of the adapter board 300, it can automatically test multiple test stages of the hard drive under test, which can avoid the repeated plugging and unplugging operations of unplugging the hard drive under test and plugging it into the matching adapter board, thereby improving the testing efficiency.

[0034] In the aforementioned solid-state drive (SSD) testing system, the central control device 100 can acquire test data, including configuration information of the SSD under test for the next testing phase. Based on this test data, it switches the USB protocol configuration of the adapter board 300, automatically changing the USB protocol of the adapter board 300 to the corresponding USB protocol for the next testing phase. This avoids the repeated plugging and unplugging operations of removing and re-plugging the SSD into a matching adapter board. Furthermore, it can generate test commands for the next testing phase and send these commands to each central control device 200, enabling the central control device 200 to automatically execute the corresponding tests in the next testing phase. Therefore, the aforementioned SSD testing system demonstrates high testing efficiency.

[0035] In some embodiments, the hard drive under test can write test data to a configuration flash memory after the test is completed. This test data includes configuration information of the hard drive under test for the next test phase, which can be used to characterize the USB protocol and related test information corresponding to the next test phase. Optionally, the configuration flash memory includes a specified location of the flash memory (e.g., an info block, etc.).

[0036] The adapter board 300 is also used to read test data from the connected hard drive under test (e.g., read test data from a designated flash memory of the hard drive under test), translate the test data, and upload the translated test data to the central control device 100. The test data generated by the hard drive under test can be PCIe data. In this case, the adapter board 300 can translate the PCIe data into USB data that can be directly read by the central control device 100, so that the central control device 100 can accurately read the aforementioned test data.

[0037] In some embodiments, the central control device 100 is further configured to generate a switching command and / or a test command based on the configuration information of the hard drive under test in the next test phase. The switching command instructs the adapter board 300 to switch from the current USB protocol to the USB protocol corresponding to the next test phase, thereby achieving USB protocol configuration switching. The test command instructs the central control device 200 to test the corresponding hard drive under test, so as to reliably perform automatic testing of the hard drive under test in each test phase.

[0038] In some examples, reference Figures 2 to 4 As shown, the adapter board includes a first interface 310, a second interface 320, a bridge module (Bridge IC) 330, and a slot 340. The first interface 310 can be a USB Type-C interface for connecting to the corresponding central control device 200. The second interface 320 can be a USB Type-A interface for connecting to the central control device 100 or its corresponding intermediate connection device. The slot 340 can be an M.2 slot for connecting the hard drive under test. The bridge module 330 connects the first interface 310 and the slot 340, and performs mutual conversion between the data corresponding to the first interface 310 and the data corresponding to the slot 340. For example, if the data corresponding to the first interface 310 is USB data and the data corresponding to the slot 340 is PCIe data, the bridge module 330 can convert the PCIe data corresponding to the slot 340 to USB data and then transmit the converted data to the first interface 310, so that the first interface 310 can transmit the converted data.

[0039] Optionally, the bridging module 330 can also convert the USB data corresponding to the first interface 310 into PCIe data and then transmit the converted data to the slot 340; for example, the PCIe Gen4*4 output of the bridging module 330 can be connected to the PCIe of the slot 340 to transmit the PCIe signal converted from USB4.0 to the M.2 storage device corresponding to the slot 340.

[0040] In some examples, such as Figure 3 As shown, the adapter board 300 also includes a switching module 350. The switching module 350 is connected to the second interface 320 to obtain the switching command received by the second interface 320, and switches the USB protocol configuration of the bridging module 330 according to the switching command. Specifically, it can switch the currently used USB protocol to the USB protocol corresponding to the next test stage to automatically switch the USB protocol configuration.

[0041] Specifically, the central control device 100 reads the test data of the hard drive under test to obtain the USB protocol corresponding to the next test stage, and sends a switching command to the corresponding adapter board 300. The switching module 350 in the adapter board 300 can switch the USB Type-C interface (i.e., the first interface 310) to the USB protocol corresponding to the next test stage. For example, the test of the hard drive under test includes three stages: K1, K2, and K3. The USB modes corresponding to stages K1 and K2 are USB 3.0, and the USB mode corresponding to stage K3 is USB 4.0. When the hard drive under test completes the test of stage K2, the central control device 100 reads the corresponding test data and obtains that the next test stage for the hard drive under test is K3. It then sends a switching command (from USB 3.0 to USB 4.0) to the USB Type-A interface (i.e., the first interface 320) of the adapter board 300. The USB Type-A interface sends the switching command to the switching module 350, and the switching module 350 switches the mode of the USB Type-C interface to USB 4.0.

[0042] In some examples, the switching module 350 described above can be implemented using an MCU (Microcontroller Unit). Optionally, the MCU is connected to components such as the first interface 310, the second interface 320, and the switching module 350, and is used to obtain the switching command and control the switching USB protocol configuration of the bridging module 330. Optionally, the MCU can also be used to perform other signal transmission and / or processing work of the adapter board 300.

[0043] In some embodiments, the adapter board 300 is further configured to switch the USB protocol with the corresponding central control device 200 according to the switching command, so that the central control device 200 uses the matching USB protocol to test the corresponding hard drive under test, which can further improve the reliability of the hard drive testing process.

[0044] In some examples, the adapter board 300 is also used to send connection confirmation information of the USB protocol to the central control device 200. The central control device 200 is also used to update the corresponding USB protocol according to the connection confirmation information, so as to automatically switch the USB protocol configuration corresponding to the central control device 200.

[0045] Optionally, in the adapter board 300, the switching module 350 can send connection confirmation information to the bridging module 330 to adjust the USB4 / 3 / 2 switching USB protocol. The central control device 200 and the bridging module 330 can confirm the USB protocol connection through a specific connection method. For example, the connection confirmation sent by the bridging module 330 to the central control device 200 can switch USB4 / 3 / 2. The central control device 200 can also confirm the USB protocol connection based on the signal sent by the connected USB device.

[0046] Optionally, such as Figure 5 As shown, the adapter board 300 may also include a hot-plug controller (PCIE Hot-plug controller) 360, which can be connected between the bridge module 330 and the slot 340 to manage the hot-plugging of PCIE devices such as hard drives under test, so as to avoid damage to the corresponding devices during plugging and unplugging.

[0047] In some embodiments, the adapter board 300 further includes a power input interface 371 and a voltage drop circuit 372.

[0048] The input terminal of the power input interface 371 is used to connect the input voltage, and the output terminal of the power input interface 371 is connected to the input terminal of the voltage drop circuit 372. Optionally, the input voltage includes a DC input voltage of 12V.

[0049] The output of the voltage drop circuit 372 is connected to various modules in the adapter board 300 (e.g., bridge module, switching module, PCIe Hot-plug controller, current amplifier, analog-to-digital converter, etc.) to step down the input voltage to a preset operating voltage. This operating voltage is then supplied to each module within the adapter board 300 to ensure stable operation. The preset operating voltage includes the voltage required for normal operation of each module within the adapter board 300. The output of the voltage drop circuit can provide operating voltages such as 5V and / or 3.3V to the power supply pins of modules such as the bridge module, switching module, PCIe Hot-plug controller, M.2 slot, current amplifier, and analog-to-digital converter.

[0050] In some examples, the voltage drop circuit 372 described above can be referenced. Figure 6 As shown, it includes a MOSFET M1, a diode D1, an inductor L1, a first capacitor C1, a first resistor R1, and an input power supply Vin. The MOSFET M1 is controlled to be turned on / off by a PWM signal.

[0051] Specifically, the gate of MOSFET M1 is connected to the PWM signal, and the drain of MOSFET M1 is connected to the positive terminal of the input power supply Vin to receive the input voltage. The source of MOSFET M1 is connected to the first terminal of inductor L and the negative terminal of diode D1. The negative terminal of the input power supply Vin is connected to the positive terminal of the diode, the first terminal of the first capacitor C1, the first terminal of the first resistor R1, and ground. The second terminal of inductor L is connected to the second terminal of the first capacitor C1, the second terminal of the first resistor R1, and the output terminal. The output terminal is used to output the corresponding output voltage Vout. The first capacitor C1 acts as the output capacitor, used to smooth the output voltage and reduce ripple, thereby achieving a filtering function. The first resistor R1 acts as the load resistor, placed between the output voltage Vout and ground.

[0052] In some embodiments, such as Figure 5As shown, the adapter board 300 also includes a current amplifier 381 and an analog-to-digital converter (ADC) 382.

[0053] The input terminal of the current amplifier 381 is connected to the first interface, and the output terminal is connected to the input terminal of the analog-to-digital converter 382. It is used to detect the current signal corresponding to the first interface and transmit the current signal to the analog-to-digital converter 382.

[0054] The output of the analog-to-digital converter 382 is connected to the input of the switching module 350 to convert the current signal into a corresponding digital signal and transmit the digital signal to the switching module 350.

[0055] The switching module 350 is used to detect digital signals to monitor the current signal corresponding to the first interface 310, and to perform overcurrent protection based on the digital signals to ensure the safety and reliability of the corresponding test work.

[0056] In some examples, the aforementioned current amplifier 381 can be referenced. Figure 7 As shown, the system includes a second capacitor C2, a third capacitor C3, a second resistor R3, a third resistor R3, a fourth resistor R4, a fifth resistor R5, and an NPN transistor. The first terminal of the second capacitor C2 is used to receive the corresponding current signal (such as an AC input signal), and its second terminal is connected to the first terminals of the second and third resistors R3 and the base of the NPN transistor. The collector of the NPN transistor is connected to the second terminal of the second resistor R3 and the power supply Vcc; the emitter of the NPN transistor is connected to the first terminals of the fourth resistor R4 and the third capacitor C3. The second terminal of the fourth resistor R4 is connected to the second terminal of the third resistor R3 and ground. The second terminal of the third capacitor C3 is connected to the first terminal of the fifth resistor R5 and the output terminal; this output terminal is used to output the corresponding current signal.

[0057] The second terminal of the fifth resistor R5 is grounded.

[0058] In this configuration, the second capacitor C2 serves as the input coupling capacitor, used to receive the corresponding current signal. The second and third resistors R3 act as voltage divider bias resistors, connected to the power supply Vcc and ground, respectively. The third capacitor C3 serves as the output voltage. The fifth resistor R5 serves as the load resistor.

[0059] In some embodiments, reference Figure 8 As shown, the solid-state drive testing system also includes an intermediate connection device 400; the first end of the intermediate connection device 400 is connected to the central control device 100, and the second end of the intermediate connection device 400 is connected to each of the adapter boards 300 respectively. The intermediate connection device 400 is used to enable the central control device 100 to connect to multiple adapter boards 300 simultaneously. Optionally, the intermediate connection device 400 can be implemented using a structure such as an MCU and / or a hub.

[0060] In the above solid-state drive testing system, the central control device 100 can acquire test data including the configuration information of the hard drive under test in the next test stage. Based on the test data, it can switch the USB protocol configuration of the adapter board 300 to automatically switch the USB protocol of the adapter board 300 to the USB protocol corresponding to the next test stage. This avoids the repeated plugging and unplugging operations of unplugging the hard drive under test and then plugging it into the matching adapter board. It can also generate test commands for the next test stage and send the test commands to each central control device 200, so that the central control device 200 can automatically execute the corresponding test work in the next test stage according to the test commands. This allows for simultaneous automatic testing of multiple hard drives under test in multiple test stages, which can improve the testing efficiency of the hard drives under test.

[0061] Although this application has been shown and described with respect to one or more implementations, equivalent variations and modifications will occur to those skilled in the art based on a reading and understanding of this specification and drawings. This application includes all such modifications and variations and is limited only by the scope of the appended claims. In particular, with respect to the various functions performed by the aforementioned components, the terminology used to describe such components is intended to correspond to any component (unless otherwise indicated) that performs the specified function of said component (e.g., is functionally equivalent to it), even if structurally not equivalent to the disclosed structure performing the functions in the exemplary implementations of this specification shown herein.

[0062] That is, the above description is only an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural changes made using the content of this application’s specification and drawings, such as the combination of technical features between different embodiments, or direct or indirect application in other related technical fields, are similarly included within the patent protection scope of this application.

[0063] Furthermore, it should be understood that in the description of this application, the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Additionally, for structural elements with the same or similar characteristics, this application may use the same or different reference numerals for identification. Moreover, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0064] In this application, the term "exemplary" is used to mean "serving as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as more preferred or advantageous than other embodiments. This application has been provided above to enable any person skilled in the art to implement and use it. Various details have been set forth in the above description for purposes of explanation. It should be understood that those skilled in the art will recognize that this application can be implemented without using these specific details. In other embodiments, well-known structures and processes will not be described in detail to avoid obscuring the description of this application with unnecessary detail. Therefore, this application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed herein.

Claims

1. A test system of a solid state drive, characterized by, The solid-state drive testing system includes a central control device, at least one intermediate control device, and adapter boards corresponding to each of the intermediate control devices. The central control device is connected to each of the central control devices and to each of the adapter boards; each of the central control devices is connected to its corresponding adapter board. Each of the aforementioned adapter boards is used to connect to one hard drive under test; The central control device is used to acquire the test data of the corresponding hard drive under test through each of the adapter boards, switch the USB protocol configuration of the adapter board according to the test data, generate test commands, and send test commands to each of the central control devices; the test data includes the configuration information of the hard drive under test in the next test stage; The central control device is used to test the hard drive to be tested connected to the corresponding adapter board according to the test command.

2. The test system of a solid state drive according to claim 1, wherein, The hard drive under test is used to write test data into a designated flash memory after the test is completed; The adapter board is also used to read the test data of the connected hard drive under test, translate the test data, and upload the translated test data to the central control device.

3. The test system of a solid state drive according to claim 2, wherein, The central control device is also used to generate switching commands and / or test commands based on the configuration information of the hard disk under test in the next test phase; The switching command is used to instruct the adapter board to switch from the current USB protocol to the USB protocol corresponding to the next test phase, so as to realize the USB protocol configuration switching; The test command is used to instruct the central control device to test the corresponding hard drive under test.

4. The test system of a solid state drive according to claim 3, wherein, The adapter board includes a first interface, a second interface, a bridging module, and a slot; The first interface is used to connect to the corresponding central control device; the second interface is used to connect to the main control device; the slot is used to connect the hard drive to be tested; and the bridging module is used to connect the first interface and the slot.

5. The test system of a solid state drive according to claim 4, wherein, The adapter board also includes a switching module; The switching module is connected to the second interface to obtain the switching command received by the second interface, and switches the USB protocol configuration of the bridging module according to the switching command.

6. The test system of a solid state drive according to claim 4, wherein, The adapter board is also used to switch the USB protocol with the corresponding central control device according to the switching command.

7. The test system of a solid state drive according to claim 6, wherein, The adapter board is also used to send connection confirmation information of the USB protocol to the central control device; The central control device is also used to update the corresponding USB protocol based on the connection confirmation information.

8. The test system of a solid state drive according to claim 4, wherein, The adapter board also includes a power input interface and a voltage drop circuit; The input terminal of the power input interface is used to connect the input voltage, and the output terminal is connected to the input terminal of the voltage drop circuit. The output terminal of the voltage drop circuit is connected to each module in the adapter board to reduce the input voltage to a preset operating voltage and input the operating voltage to each module in the adapter board.

9. The test system of a solid state drive according to claim 5, wherein, The adapter board also includes a current amplifier and an analog-to-digital converter; The input terminal of the current amplifier is connected to the first interface, and the output terminal is connected to the input terminal of the analog-to-digital converter. It is used to detect the current signal corresponding to the first interface and transmit the current signal to the analog-to-digital converter. An output end of the analog-digital converter is connected to an input end of the switching module, for converting the current signal into a corresponding digital signal, and transmitting the digital signal to the switching module; The switching module is used for detecting the digital signal, and performing over-current protection according to the digital signal.

10. The test system of a solid state drive according to claim 1, wherein, The test system of the solid state disk further comprises an intermediate connection device; A first end of the intermediate connection device is connected to the general control device, and a second end of the intermediate connection device is connected to each of the adapter boards, for simultaneously connecting the general control device to multiple adapter boards.

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