Test fixture for thermistors

Abstract

This application provides a testing fixture for a thermistor, relating to the technical field of electrical component testing equipment. The thermistor testing fixture includes a support platform, a conductive heating band, a clamping mechanism, a power supply circuit, a heating band temperature sensor, and a controller. The power supply circuit heats the conductive heating band and places it over the test position on the support platform. Simultaneously, the clamping mechanism presses the test piece placed at the test position against the conductive heating band. The conductive heating band rapidly heats up, transferring the temperature to the test piece for detection. The controller controls the heating power of the conductive heating band based on the temperature detected by the heating band temperature sensor, thereby enabling accurate testing of the test piece. The thermistor testing fixture provided in this application has a fast response speed, is more suitable for practical scenarios, and solves the problem of low detection accuracy in existing thermistor testing fixtures.

Description

Technical Field

[0001] This application relates to the technical field of electrical component testing equipment, specifically to testing fixtures for thermistors. Background Technology

[0002] Thermistors are now widely used in various electronic products, leading to increasingly larger production scales. This places higher demands on the reliability of thermistors, requiring various parameter tests to be performed on them before they leave the factory in order to eliminate defective thermistors as early as possible.

[0003] Therefore, thermistors need to be tested during production, and their resistance values ​​are measured at different temperatures. In related technologies, thermistors are usually placed directly in an oil bath, and the temperature of the oil bath is changed by a temperature control component at the bottom of the oil bath to achieve temperature changes in the thermistor, so that the resistance measuring instrument can measure the resistance value of the thermistor at different temperatures.

[0004] However, the testing fixtures in related technologies have a slow temperature control component heating rate, which makes it difficult to simulate actual usage scenarios for some applications requiring a faster temperature rise. Under such testing conditions, the test data of the thermistors have a large error, resulting in low detection accuracy of the thermistor testing fixtures in related technologies. Utility Model Content

[0005] The purpose of this application is to provide a test fixture for thermistors to improve the problem of low detection accuracy of current thermistor test fixtures.

[0006] This application provides a testing fixture for a thermistor, including: a support platform, a conductive heating band, a clamping mechanism, a power supply circuit, a heating band temperature sensor, and a controller. The support platform has a test position. The conductive heating band has an insulating film covering its outer surface and passes through the test position. The clamping mechanism is connected to the support platform and located above the test position, and is used to clamp the test piece onto the conductive heating band. The power supply circuit is conductively connected to the conductive heating element of the conductive heating band and is used to energize and heat the conductive heating band. The heating band temperature sensor is used to detect the temperature of the conductive heating band. The controller is connected to the heating band temperature sensor to obtain the temperature of the heating band, and the controller is also connected to the power supply circuit to control the heating power of the conductive heating band.

[0007] In one embodiment, the clamping mechanism includes:

[0008] A support column, which is connected to the support platform;

[0009] A movable frame, which is movably mounted on the support column;

[0010] A pressure bar, which passes through the movable frame;

[0011] A pressure block, connected to one end of the pressure rod, is used to press the test piece against the conductive heating band;

[0012] An elastic element, sleeved on the pressure rod, elastically abutting between the pressure block and the movable frame; and

[0013] An adjusting member is provided to adjust the height between the movable frame and the pressure block, so as to press the pressure block and the test piece together or to loosen the pressure block and the test piece.

[0014] In one embodiment, the adjusting member is located above the movable frame, and the adjusting member passes through the support column and is threadedly connected to the support column.

[0015] In one embodiment, the testing fixture for the thermistor further includes a tensioning column, the conductive heating strip passing around the tensioning column, the tensioning column being used to tension the conductive heating strip to the support platform.

[0016] In one embodiment, the conductive heating strip is folded back and forth at the test position at least once, so that the portion of the conductive heating strip at the test position includes at least two heating layers, with adjacent heating layers in thermal contact, and the test piece is pressed onto the top heating layer.

[0017] In one embodiment, a thermally conductive medium is coated between adjacent heating layers.

[0018] In one embodiment, the testing fixture for the thermistor further includes a commutator rod, and the conductive heating strip bends in the opposite direction after passing around the commutator rod.

[0019] In one embodiment, the testing fixture for the thermistor further includes an insulating protective layer, which is detachably disposed on the top heating layer, and the test piece is pressed onto the insulating protective layer.

[0020] In one embodiment, the testing fixture for the thermistor further includes a heat dissipation mechanism, which is disposed on one side of the support platform and is used to dissipate heat from the conductive heating strip.

[0021] In one embodiment, the conductive heating strip is a copper strip.

[0022] According to the thermistor testing fixture in the above embodiments, a conductive heating strip is heated by a power supply circuit and placed on the test position of the support platform. The test position is used to place the test piece, and a clamping mechanism is used to press the test piece and the conductive heating strip together. When the conductive heating strip is energized, it can rapidly heat up and transfer the temperature to the test piece for detection. The controller controls the heating power of the conductive heating strip based on the temperature detected by the heating strip temperature sensor to ensure that the conductive heating strip is within a preset temperature range, thereby enabling accurate detection of the test piece. The thermistor testing fixture provided in this application has a fast response speed and can ensure that the detected temperature is within a preset temperature range, which is more in line with actual scenarios and solves the problem of low detection accuracy of existing thermistor testing fixtures. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the structure of a test fixture for a thermistor provided in an embodiment of this application.

[0024] Figure 2 for Figure 1 Enlarged view of point A in the middle.

[0025] in:

[0026] 1. Testing fixture for thermistors; 10. Support platform; 20. Conductive heating strip; 30. Clamping mechanism; 310. Support column; 320. Movable frame; 330. Pressure rod; 340. Pressure block; 350. Elastic element; 360. Adjusting element; 40. Power supply electrode; 100. Air blowing and heat dissipation mechanism; 200. Fixture; 210. Fixing block; 2. Test piece. Detailed Implementation

[0027] The present application will be further described in detail below with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0028] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments, and the operational steps involved in each embodiment can also be rearranged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the specification and drawings are only for clearly describing a particular embodiment and do not imply that they represent the necessary components and / or order.

[0029] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0030] Please also refer to Figures 1-2 This application provides a test fixture 1 for a thermistor, which includes: a support platform 10, a conductive heating belt 20, a clamping mechanism 30, a power supply circuit, a heating belt temperature sensor (not shown in the figure), and a controller (not shown in the figure).

[0031] The support platform 10 can serve as the mounting base for other components, and the support platform 10 has test positions (not shown in the figure) for placing the test piece 2 so as to facilitate subsequent testing of the test piece 2.

[0032] In some embodiments, the device under test is an NTC thermistor.

[0033] In one embodiment, a clamp 200 may be provided on the support platform 10. The clamp 200 may form an installation space, and the test position is located in the installation space. When the user needs to fix the test piece 2 at the test position, the clamp 200 may be used to limit the horizontal displacement of the test piece 2 on the support platform 10. In other words, the clamp 200 provided in this application embodiment may play a role in fixing the test piece 2.

[0034] Furthermore, when the user needs to test the test piece 2, the test piece 2 can be placed on the test position in the installation space. This can prevent the test piece 2 from shifting during the test, thus helping to ensure the accuracy of the test results.

[0035] Furthermore, the clamp 200 is positioned above the conductive heating band 20 and is used to press down the conductive heating band 20 to fix it in place, preventing the portion of the conductive heating band 20 located at the test position from shaking and affecting the test results.

[0036] In addition, the fixture 200 may also be provided with an opening through which the heating band temperature sensor can pass and contact the conductive heating band. The fixture 200 may also be provided with a fixing block installed at the opening. When the heating band temperature sensor can pass through the opening and contact the conductive heating band, the fixing block can fix the heating band temperature sensor to prevent the heating band temperature sensor from shaking and affecting the test results.

[0037] The conductive heating strip 20 is used to heat the test piece 2. Specifically, the conductive heating strip 20 generates heat after being energized, thereby transferring heat to the test piece 2. In this embodiment, the conductive heating strip 20 can be made of a material that heats up quickly, such as silver, copper, or aluminum. In this embodiment, considering factors such as cost and thermal conductivity, copper strip is used for the conductive heating strip 20. Using copper strip, which heats up quickly, as the conductive heating strip 20 also allows the temperature of the conductive heating strip 20 to rise rapidly after being energized, thereby transferring the heat to the test piece 2 more quickly. This makes the test scenario more similar to the actual scenario, thus improving the accuracy of the test results.

[0038] Furthermore, in this embodiment, the outer surface of the conductive heating band 20 is covered with an insulating film. This prevents the conductive heating band 20 from energizing the test piece 2 after it is energized, thus avoiding damage to the test piece 2. Simultaneously, this ensures that the test piece 2 is only affected by the temperature of the external environment, making the test scenario closer to the real-world scenario and improving the accuracy of the test results.

[0039] When the test piece 2 is being tested, the conductive heating band 20 passes through the test position. The test piece 2 can be placed on the conductive heating band 20 located at the test position, and then the conductive heating band 20 is connected to the power supply circuit for testing.

[0040] Furthermore, in one embodiment, the conductive heating band 20 is bent back and forth at least once at the test position, so that the portion of the conductive heating band 20 at the test position includes at least two heating layers (not shown in the figure), with adjacent heating layers in thermal contact, and the test piece 2 is pressed onto the top heating layer. That is, in this embodiment, the conductive heating band 20 at the test position is stacked. For conductive heating bands 20 of the same length, stacking the conductive heating bands 20 reduces the area of ​​the conductive heating band 20 in contact with the outside air, thereby facilitating heat concentration at the test position and reducing heat loss. This makes the test scenario closer to the actual scenario, thus improving the accuracy of the test results.

[0041] Furthermore, considering that the conductive heating band 20 needs to be reused to test multiple different test pieces 2, and that the assembly process of the conductive heating band 20 is relatively complex, in order to avoid or reduce the possibility of damage to the conductive heating band 20 during the testing of the test piece 2, please also refer to... Figure 2 The thermistor testing fixture 1 provided in this embodiment further includes an insulating protective layer, which is detachably disposed on the top heating layer. The test piece 2 is pressed onto the insulating protective layer. It is understood that in this embodiment, the insulating protective layer can also be made of a high-temperature resistant, high-thermal-conductivity material, such as nitride ceramic or carbide ceramic, etc., depending on the actual situation. This can improve the heat transfer between the conductive heating band 20 and the insulating protective layer, thereby allowing the conductive heating band 20 to transfer heat to the test piece 2 faster, making the test scenario closer to the actual scenario, and thus improving the accuracy of the test results.

[0042] Furthermore, in order to make the insulating protective layer and the test piece 2 fit more tightly, a thermally conductive medium can be applied between the insulating protective layer and the test piece 2. The thermally conductive medium can improve the thermal conductivity of the insulating protective layer and the test piece 2, thereby enabling the insulating protective layer to transfer heat to the test piece 2 more quickly and fully. The embodiments of this application do not limit the specific form of the thermally conductive medium. For example, it can be thermally conductive silicone grease, thermally conductive gel, or thermally conductive oil, etc., and can be set according to the actual situation.

[0043] In one embodiment, a thermally conductive medium may also be applied between adjacent heating layers. The thermally conductive medium can be used to improve the thermal conductivity of the stacked conductive heating strips 20. This application does not limit the specific form of the thermally conductive medium. For details, please refer to the relevant content mentioned above. It will not be repeated here.

[0044] Furthermore, this application embodiment does not limit the specific stacking method of the conductive heating band 20. For example, in this embodiment, the thermistor test fixture 1 also includes a reversing rod (not shown in the figure). The conductive heating band 20 can be bent in a different direction after bypassing the reversing rod to achieve the stacking of the conductive heating band 20.

[0045] It is understandable that the commutator rod can be made of insulating material to prevent damage caused by overheating after contact with the conductive heating strip 20. Specifically, in this embodiment, the commutator rod can be made of high-temperature resistant insulating material, such as high-temperature resistant epoxy resin, quartz glass, or phlogopite. Furthermore, in some embodiments, a high-temperature resistant insulating structure can be provided on the outer surface of the commutator rod to achieve the same effect. This high-temperature resistant insulating structure can also be made of the aforementioned high-temperature resistant epoxy resin, quartz glass, or phlogopite, depending on the specific circumstances.

[0046] The power supply circuit includes power supply electrodes 40. This application embodiment does not limit the setting position and number of power supply electrodes 40. It can be understood that the conductive heating band 20 has two opposite ends, and the middle region of the conductive heating band 20 is located at the test position. Therefore, in this application embodiment, the power supply electrodes 40 can be set as two sets, and the two sets of power supply electrodes 40 can be connected to the ends of the conductive heating band 20 respectively. This allows the conductive heating band 20 to be heated simultaneously under the action of the two sets of power supply electrodes 40. At this time, heat can be transferred from both ends of the conductive heating band 20 to the middle of the conductive heating band 20, which is beneficial to improving the heating rate of the conductive heating band 20 at the test position, thereby improving the heating rate of the test piece 2, making the test scenario closer to the actual scenario, and thus improving the accuracy of the test results.

[0047] Furthermore, in one embodiment, setting the power supply electrode 40 into two sets and connecting the power supply electrode 40 to the two ends of the conductive heating band 20 can also serve to tension the conductive heating band 20. This allows the conductive heating to fit more tightly against the support platform 10, which in turn helps the test piece 2 to fit more tightly against the conductive heating band 20, thereby improving the accuracy of the test results.

[0048] It is understood that in some other embodiments, a tensioning column (not shown in the figure) can also be provided to tension the conductive heating band 20. Specifically, in these embodiments, the thermistor testing fixture 1 may further include: a tensioning column, the conductive heating band 20 passing around the tensioning column, the tensioning column being used to tension the conductive heating band 20 to the support platform 10. This application does not limit the specific structure and material of the tensioning column. For example, in one embodiment, the tensioning column can be made of a high-temperature resistant insulating material, such as high-temperature resistant epoxy resin, quartz glass, or phlogopite. As mentioned above, in one embodiment, the tensioning column and the reversing rod can be configured as the same structure, which makes the overall structure of the thermistor testing fixture 1 simpler.

[0049] Please also refer to Figure 2The clamping mechanism 30 is connected to the support platform 10 and is located above the test position. The clamping mechanism 30 is used to press the test piece 2 against the conductive heating band 20 to avoid gaps between the test piece 2 and the conductive heating band 20. This allows the test piece 2 to be in direct contact with the conductive heating band 20, which in turn facilitates heat conduction between the conductive heating band 20 and the test piece 2.

[0050] Specifically, in this embodiment, the clamping mechanism 30 may include: a support column 310, a movable frame 320, a pressure rod 330, a pressure block 340, an elastic element 350, and an adjusting element 360. The support column 310 is connected to the support platform 10, the movable frame 320 is movably disposed on the support column 310, the pressure rod 330 passes through the movable frame 320, the pressure block 340 is connected to one end of the pressure rod 330, the elastic element 350 is sleeved on the pressure rod 330 and elastically abuts against the pressure block 340 and the movable frame 320, and the adjusting element 360 is used to adjust the height between the movable frame 320 and the pressure block 340, so as to press the pressure block 340 and the test piece 2 together or to loosen the pressure block 340 and the test piece 2.

[0051] Please continue reading. Figure 2 In this embodiment, two support columns 310 can be provided. Since the support columns 310 serve as the basic support part of the entire pressing mechanism 30, this can improve the structural stability of the entire pressing mechanism 30. The movable frame 320 can be inserted through the support column 310 and can move up and down relative to the support column 310. The pressure rod 330 can be inserted through the movable frame 320. In this embodiment, the pressure rod 330 can be located between the two support columns 310. In this embodiment, the elastic element 350 is a spring, and the elastic element 350 is wound around the outer surface of the pressure rod 330. One end of the elastic element 350 abuts against the pressure block 340, and the other end abuts against the movable frame 320. The adjusting element 360 is provided above the movable frame 320 and can be inserted through the support column 310. The user can adjust the position of the movable frame 320 relative to the support column 310 by changing the position of the adjusting element 360 relative to the support column 310, thereby achieving the effect of driving the movable frame 320 to move up and down relative to the support column 310.

[0052] Furthermore, the user can control the movable frame 320 to move downwards on the support column 310 by adjusting the position of the adjusting member 360. Simultaneously, the movable frame 320 drives the pressure rod 330 to move downwards relative to the support column 310. As the pressure rod 330 moves downwards relative to the support column 310, the pressure block 340 presses the test piece 2 against the surface of the conductive heating band 20. At this point, the movable frame 320 can continue to move downwards relative to the support column 310, thereby compressing the elastic member 350 and causing the pressure block 340 to press the test piece 2 firmly against the conductive heating band 20. Similarly, the user can also control the movable frame 320 to move upwards on the support column 310 by adjusting the position of the adjusting member 360 to release the pressure block 340 from the test piece 2, thereby releasing the test piece 2 from the conductive heating band 20.

[0053] It should be noted that the embodiments of this application do not limit the specific structure and form of the adjusting member 360. For example, in one embodiment, the adjusting member 360 can be a nut, and the adjusting member 360 can be threadedly connected to the support column 310. The user can control the position of the movable frame 320 by turning the adjusting member 360. In other embodiments, the adjusting member 360 can also be set as a clamp. In this embodiment, the position of the movable frame 320 can be manually adjusted, and then the adjusting member 360 is placed on the support column 310 to restrict the movement of the movable frame 320. The specific settings can be configured according to the actual situation and are not limited here.

[0054] The heating band temperature sensor is used to detect the temperature of the conductive heating band 20. It is understood that during the detection process, the temperature of the conductive heating band 20 can be used to simulate the ambient temperature in a real-world scenario. Therefore, the heating band temperature sensor can be used to determine whether the temperature of the conductive heating band 20 has reached the specified temperature for simulating a real-world scenario. This application does not limit the specific form of the heating temperature sensor. For example, in one embodiment, a thermocouple can be used as the heating band temperature sensor; in some other embodiments, an infrared point temperature sensor, etc., can also be used. The specific configuration can be determined according to the actual situation.

[0055] The controller is connected to the heating band temperature sensor. The controller is used to acquire the temperature of the heating band temperature sensor and to control the heating power of the conductive heating band 20. That is, in this embodiment, the controller is connected to the power supply circuit of the conductive heating band 20 to control the heating power of the conductive heating band 20 according to the temperature of the heating band temperature sensor, so that the conductive heating band 20 can be maintained within a specified temperature range. This makes the test scenario closer to the actual scenario, thereby improving the accuracy of the test results.

[0056] Furthermore, in one embodiment, the thermistor testing fixture 1 further includes a cooling mechanism 100, which is disposed on one side of the support platform 10 and is used to dissipate heat from the conductive heating band 20. It is understood that the thermistor testing fixture 1 provided in this application embodiment is mainly used to simulate the performance of thermistors at a specified temperature in a real-world scenario. Therefore, in this application embodiment, it is necessary to maintain the test temperature within a specified range. Although controlling the heating power of the conductive heating band 20 according to the temperature of the heating band temperature sensor through a controller can achieve temperature control, when the temperature is too high, it can only be cooled naturally to maintain the temperature within a specified range. Therefore, in this application embodiment, the conductive heating band 20 can be cooled using the cooling mechanism 100.

[0057] This application does not limit the specific structure and form of the air-blowing heat dissipation mechanism 100. For example, in some embodiments, the air-blowing heat dissipation mechanism 100 can be set as a fan, and the air-blowing heat dissipation mechanism 100 can be set on both sides of the support platform 10. By cooling the conductive heating strips 20 located on both sides of the support platform 10, the temperature of the conductive heating strip 20 located at the test position is reduced, thereby maintaining the temperature of the conductive heating strip 20 located at the test position within a specified range. This makes the test scenario closer to the actual scenario, which is beneficial to improving the accuracy of the test results.

[0058] In summary, the thermistor testing fixture 1 provided in this embodiment heats the conductive heating band 20 using a power supply circuit and covers the test position on the support platform 10. The test position is used to place the test piece 2. Simultaneously, a clamping mechanism 30 presses the test piece 2 and the conductive heating band 20 together. When the conductive heating band 20 is energized, it rapidly heats up, transferring the temperature to the test piece 2 for detection. The controller controls the heating power of the conductive heating band 20 based on the temperature detected by the heating band temperature sensor, ensuring that the conductive heating band 20 is within a preset temperature range, thus enabling accurate detection of the test piece 2. The thermistor testing fixture 1 provided in this embodiment has a fast response speed and ensures that the detected temperature is within the preset temperature range, making it more suitable for real-world scenarios and solving the problem of low detection accuracy in existing thermistor testing fixtures.

[0059] The above examples illustrate this application only to aid understanding and are not intended to limit its scope. Those skilled in the art to which this application pertains can make various simple deductions, modifications, or substitutions based on the ideas presented.

Claims

1. A test tool for thermistors, characterized by, include: A support platform, wherein the support platform has test positions; A conductive heating strip, the outer surface of which is covered with an insulating film, passes through the test position; A clamping mechanism is connected to the support platform and located above the test position. The clamping mechanism is used to clamp the test piece onto the conductive heating strip. A power supply circuit is electrically connected to the conductive heating element of the conductive heating strip and is used to energize and heat the conductive heating strip. A heating band temperature sensor is used to detect the temperature of the conductive heating band. as well as A controller is connected to the heating band temperature sensor to obtain the temperature of the heating band temperature sensor. The controller is also connected to the power supply circuit to control the heating power of the conductive heating band.

2. The test tool for thermistors according to claim 1, wherein The clamping mechanism includes: A support column, which is connected to the support platform; A movable frame, which is movably mounted on the support column; A pressure bar, which passes through the movable frame; A pressure block, connected to one end of the pressure rod, is used to press the test piece against the conductive heating band; An elastic element, sleeved on the pressure rod, elastically abutting between the pressure block and the movable frame; and An adjusting member is provided to adjust the height between the movable frame and the pressure block, so as to press the pressure block and the test piece together or to loosen the pressure block and the test piece.

3. The test tooling for thermistors of claim 2, wherein, The adjusting member is located above the movable frame, and the adjusting member passes through the support column and is threadedly connected to the support column.

4. The testing fixture for the thermistor according to claim 1, characterized in that, The testing fixture for the thermistor further includes a tensioning column, around which the conductive heating band passes, and the tensioning column is used to tension the conductive heating band to the support platform.

5. The testing fixture for the thermistor according to any one of claims 1-4, characterized in that, The conductive heating strip is bent back and forth at least once at the test position so that the portion of the conductive heating strip at the test position includes at least two heating layers, with adjacent heating layers in thermal contact, and the test piece is pressed onto the top heating layer.

6. The testing fixture for the thermistor according to claim 5, characterized in that, A thermally conductive medium is coated between adjacent heating layers.

7. The testing fixture for the thermistor according to claim 5, characterized in that, The testing fixture for the thermistor also includes a commutator rod, and the conductive heating strip bends in the opposite direction after passing around the commutator rod.

8. The testing fixture for the thermistor according to claim 5, characterized in that, The testing fixture for the thermistor also includes an insulating protective layer, which is detachably disposed on the heating layer on top, and the test piece is pressed onto the insulating protective layer.

9. The testing fixture for the thermistor according to any one of claims 1-4, characterized in that, The testing fixture for the thermistor further includes a heat dissipation mechanism, which is disposed on one side of the support platform and is used to dissipate heat from the conductive heating strip.

10. The testing fixture for the thermistor according to any one of claims 1-4, characterized in that, The conductive heating strip is a copper strip.

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