A mother-daughter test fixture and test fixture

Abstract

The utility model belongs to circuit board test technical field especially relates to a daughter -mother carrier plate test fixture and test fixture. Including mother carrier board, be equipped with first test site on the mother carrier board, be used for placing the circuit board body of the circuit board under test, be equipped with a plurality of guide column at first test site edge, be equipped with probe hole in first test site, probe hole is used to accommodate probe to carry out test to circuit board body, be close to first test site and be provided with daughter carrier board subassembly, daughter carrier board subassembly includes fixed base and rotatablely set up on the cover of fixed base, be equipped with second test site on fixed base, second test site is used for placing the soft row connector of the circuit board under test, the rotating end of daughter carrier board subassembly away from the cover is equipped with buckle assembly, the cover carries out the down pressure fixed to soft row connector to carry out test to soft row connector. The utility model can realize accommodating and testing circuit board body and its associated soft row connector simultaneously, has simplified the test procedure, has promoted test efficiency.

Description

Technical Field

[0001] This utility model belongs to the field of circuit board testing technology, and in particular relates to a mother-daughter carrier board testing fixture and testing jig. Background Technology

[0002] In the precision manufacturing process of electronic products, electrical performance testing of circuit boards is a crucial step in ensuring the reliability of the final product. As electronic product designs become increasingly complex, many circuit boards integrate or connect various types of interface components, among which flexible connectors are widely used due to their advantages of flexible connection and space saving. These circuit boards with flexible connectors present unique challenges during testing.

[0003] Traditional testing methods typically require separating the circuit board under test (PCB) from its connected flexible connector. Specifically, the PCB is placed on a dedicated test fixture for probe contact testing, while the connected flexible connector is tested for continuity, signal integrity, or other electrical performance characteristics on a separate fixture. This separate testing process is cumbersome, reduces overall testing efficiency, and increases the risk of damage to the PCB due to improper handling.

[0004] Therefore, there is an urgent need for a motherboard test fixture and test jig that can simultaneously test circuit boards with integrated flexible connectors. Utility Model Content

[0005] The purpose of this invention is to address the shortcomings of existing technologies by providing a mother-daughter carrier board test fixture and test jig, which can simultaneously accommodate and test the circuit board body and its associated flexible connectors, simplifying the testing steps, improving testing efficiency, and reducing the risk of damaging the circuit board under test.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: A mother-daughter carrier plate test fixture includes: The motherboard has a first test position for placing the circuit board body of the circuit board to be tested. Multiple guide posts are provided at the edge of the first test position, and probe holes are provided in the first test position for accommodating probes to test the circuit board body. A subcarrier board assembly is positioned near the first test position. The subcarrier board assembly includes a fixed base and a flip cover rotatably disposed on the fixed base. The fixed base is provided with a second test position for placing the flexible connector of the circuit board under test. The subcarrier board assembly is provided with a snap-fit ​​assembly at the rotating end away from the flip cover. The flip cover presses down and fixes the flexible connector to test the flexible connector.

[0007] Furthermore, a test window is provided through the flip cover corresponding to the second test position, and the connector of the flexible connector faces upward toward the test window. The test window is used to install a micro-needle module to test the connector.

[0008] Furthermore, the second test position has a raised edge and a notch at its edge to partially surround the second test position, and the flexible flat cable of the flexible flat cable connector is placed into the second test position through the notch.

[0009] Furthermore, a first pressure block is provided at the lower end of the flip cover near the test window. The first pressure block corresponds to the location of the notch and is used to press the flexible ribbon cable.

[0010] Furthermore, a second pressure block and a third pressure block are symmetrically provided at the lower end of the flip cover near the test window. The second pressure block and the third pressure block are used to press the flexible flat cable on both sides of the connector.

[0011] Furthermore, the mounting base is provided with two second test positions.

[0012] Furthermore, the buckle assembly includes a first rotating shaft disposed on the side of the fixed base and a buckle mounted on the first rotating shaft. The buckle is connected to a return spring, and a locking block that cooperates with the buckle is provided on one side of the flip cover.

[0013] Furthermore, the flip cover and the fixed base are rotatably connected by a second rotating shaft, and a torsion spring is sleeved on the second rotating shaft.

[0014] This utility model also provides a mother-daughter carrier board test fixture, including a download board, a functional circuit board is provided below the download board, and the mother-daughter carrier board test fixture is provided on the download board. The functional circuit board is connected to the circuit board body through probes.

[0015] Furthermore, the download board is equipped with multiple mother-daughter carrier board test fixtures.

[0016] The beneficial effects of this utility model are: This invention achieves synchronous positioning, fixing, and testing of the circuit board body and the flexible connector by setting up an integrated motherboard and daughterboard assembly; by opening a test window on the flip cover and exposing the interface direction of the flexible connector, it facilitates the vertical installation of the micro-needle module contact connector pins; by forming a semi-enclosed second test position through the raised edge and notch, it achieves rapid positioning and limiting of the flexible connector; by having the first pressure block correspond to the position of the notch, it ensures precise clamping of the root of the flexible cable when the flip cover is closed; by setting up a reset spring and a torsion spring, it achieves the functions of rapid locking and automatic opening of the flip cover; this invention can simultaneously accommodate and test the circuit board body and its associated flexible connector, simplifying the testing steps, improving testing efficiency, and reducing the risk of damaging the circuit board under test. Attached Figure Description

[0017] Appendix Figure 1 This is a schematic diagram of the structure of the mother-daughter carrier plate test fixture of this utility model; Appendix Figure 2 This is an exploded structural diagram of the mother-daughter carrier plate test fixture of this utility model; Appendix Figure 3 This is a schematic diagram of the circuit board under test of this utility model; Appendix Figure 4 This is an exploded structural diagram of the subcarrier plate assembly of this utility model; Appendix Figure 5 This is a schematic diagram of the structure of the mother-daughter carrier plate test fixture of this utility model; The diagram is labeled as follows: 1-Main carrier board, 110-First test position, 111-Probe hole, 120-Guide post; 2-Subcarrier board assembly, 210-Fixing base, 211-Second test position, 212-Raised edge, 213-Notch, 220-Flip cover, 221-Test window, 222-First pressure block, 223-Second pressure block, 224-Third pressure block, 225-Clamping block, 230-Snap-on assembly, 231-First rotating shaft, 232-Snap-on, 233-Reset spring, 240-Second rotating shaft, 250-Torsion spring; 3-Download board; 4-Functional circuit board; 5-Circuit board under test, 510-Circuit board body, 520-Flexible connector, 521-Connector, 522-Flexible cable. Detailed Implementation

[0018] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.

[0019] In the description of this utility model, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0020] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0021] In the embodiments of this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in this utility model can be understood according to the specific circumstances.

[0022] See appendix Figure 1 To be continued Figure 5 The figure shows a specific embodiment of the mother-daughter carrier plate test fixture and test jig provided by this utility model.

[0023] See appendix Figure 1 The mother-daughter carrier plate test fixture includes: The motherboard 1 has a first test position 110 for placing the circuit board body 510 of the circuit board 5 to be tested. Multiple guide posts 120 are provided at the edge of the first test position 110. The first test position 110 has a probe hole 111 for accommodating probes to test the circuit board body 510. The subcarrier board assembly 2 is located near the first test position 110. The subcarrier board assembly 2 includes a fixed base 210 and a flip cover 220 rotatably disposed on the fixed base 210. The fixed base 210 is provided with a second test position 211, which is used to place the flexible connector 520 of the circuit board 5 under test. The subcarrier board assembly 2 is provided with a snap-fit ​​assembly 230 at the rotating end away from the flip cover 220. The flip cover 220 presses down and fixes the flexible connector 520 to test the flexible connector 520.

[0024] See appendix Figure 2 and attached Figure 3 In the above embodiment, the circuit board under test 5 includes a circuit board body 510 and a flexible flatbed connector 520 connected thereto. The flexible flatbed connector 520 includes a flexible flatbed cable 522 and a connector 521 fixed to one end of the flexible flatbed cable 522. Multiple guide posts 120 at the edge of the first test position 110 serve a positioning and fixing function, facilitating the tester or robot to quickly place the circuit board body 510 of the circuit board under test 5 onto the first test position 110. In some optional embodiments, a portion of the guide post 120 can extend into the first test position 110 to achieve a fixing effect on the circuit board body 510. In some other embodiments, additional fasteners such as screws can be added to fix the circuit board body 510. In this embodiment, during the test, the probe will abut against the test point on the circuit board body 510 from the probe hole 111 for testing. In this embodiment, the sub-carrier assembly 2 is mounted on the mother carrier 1 and close to the first test position 110. The sub-carrier assembly 2 is a flip-top connector test fixture. During testing, the flip-top 220 is opened, and the flexible connector 520 connected to the circuit board body 510 is placed on the second test position 211 of the fixing base 210. The flip-top 220 is rotated to press down on the flexible connector 520, thereby fixing and testing the flexible connector 520. In some embodiments, a micro-needle module for testing the connector 521 can be installed at the lower end of the flip-top 220 or at the location of the second test position 211 of the fixing base 210. As long as the connector can be tested, the installation position of the micro-needle module is not limited. This embodiment achieves synchronous positioning, fixing, and testing of the circuit board body and the flexible connector by setting an integrated mother carrier and sub-carrier assembly, avoiding the cumbersome operation and damage risk of step-by-step testing.

[0025] See appendix Figure 2 and attached Figure 4 In this embodiment, a test window 221 is provided through the flip cover 220 corresponding to the second test position 211. The connector 521 of the flexible connector 520 faces upward toward the test window 221. The test window 221 is used to install a microneedle module for testing the connector 521. In this embodiment, the through test window 221 is mainly used to install and fix the microneedle module at the test window 221 so that the test action is performed when the flip cover 220 is pressed down, or to cooperate with an external fixture with a microneedle module to achieve testing. In some embodiments, the upper mold assembly of the external fixture is pressed down, and the microneedle module fixed on the upper mold assembly passes through the test window 221 and abuts against the connector 521 for testing. The test window 221 of this embodiment provides a variety of testing methods.

[0026] See appendix Figure 4In the above embodiment, the second test position 211 has a raised edge 212 and a notch 213 at its edge to partially surround the second test position 211. The flexible flat cable 522 of the flexible flat cable connector 520 is placed into the second test position 211 through the notch 213. In this embodiment, the raised edge 212 is close to a C-shape, and the second test position 211 is partially surrounded by the raised edge 212 to achieve rapid positioning of the flexible flat cable connector 520. The notch 213 is used to achieve placement of the flexible flat cable 522 without bending, reducing cable damage.

[0027] See appendix Figure 4 In the above embodiment, a first pressing block 222 is provided at the lower end of the flip cover 220 near the test window 221. The first pressing block 222 corresponds to the position of the notch 213 and is used to press the flexible flat cable 522. In the embodiment, when the flip cover 220 is closed, the first pressing block 222 corresponds to the position of the notch 213, and the position of the notch 213 is used to place the flexible flat cable 522. Therefore, the first pressing block 222 can accurately press the root of the flexible flat cable 522, thereby preventing the flexible flat cable 522 from shifting or lifting during the test, which would cause poor contact.

[0028] See appendix Figure 4 In the above embodiment, a second pressing block 223 and a third pressing block 224 are symmetrically arranged at the lower end of the flip cover 220 near the test window 221. The second pressing block 223 and the third pressing block 224 are used to press the flexible flat cable 522 on both sides of the connector 521. In the embodiment, the first pressing block 222, the second pressing block 223 and the third pressing block 224 work together to press the root and both sides of the flexible flat cable 522, so as to achieve balanced force on the flexible flat cable 522 and avoid stress concentration on one side.

[0029] See appendix Figure 4 In the above embodiment, the mounting base 210 is provided with two second test positions 211. In the embodiment, the two second test positions 211 are used to perform synchronous testing on two flexible connectors 520 on the same circuit board under test 5. One of the second test positions 211 has only a first pressure block 222 under the flip cover 220, while the other second test position 211 has a first pressure block 222, a second pressure block 223, and a third pressure block 224 under the flip cover 220.

[0030] See appendix Figure 4In the above embodiment, the latching assembly 230 includes a first rotating shaft 231 disposed on the side of the fixing base 210 and a latch 232 mounted on the first rotating shaft 231. The latch 232 is connected to a return spring 233, and a locking block 225 cooperating with the latch 232 is provided on one side of the flip cover 220. The flip cover 220 and the fixing base 210 are rotatably connected by a second rotating shaft 240, and a torsion spring 250 is sleeved on the second rotating shaft 240. In this embodiment, the latching assembly 230 realizes the quick locking and releasing of the flip cover 220, while the torsion spring 250 enables the flip cover 220 to have an automatic pop-open function. In use, place the flexible connector 520 on the second test position 211, and then rotate the flip cover 220 to close it against the spring force of the torsion spring 250. During the rotation to close the flip cover 220, the locking block 225 abuts against the latch 232 and pushes the return spring 233 to compress. When the flip cover 220 is fully closed, the return spring 233 causes the latch 232 to engage with the locking block 225, at which point the flip cover 220 is locked, and the testing action of the flexible connector 520 can be performed. After the test is completed, press the latch 232 to disengage it from the locking block 225, the return spring 233 is compressed, and the flip cover 220 pops open under the torque of the torsion spring 250. After releasing the force applied to the latch 232, the latch 232 returns to its original position under the spring force of the return spring 233.

[0031] See appendix Figure 5 This embodiment also provides a mother-daughter carrier board test fixture, including a download board 3, a functional circuit board 4 below the download board 3, and mother-daughter carrier board test fixtures on the download board 3. The functional circuit board 4 is electrically connected to the circuit board body 510 through probes, and the download board 3 has multiple mother-daughter carrier board test fixtures. In this embodiment, the functional circuit board 4 is used to realize the synchronous electrical testing function of the circuit board body 510 under test and the flexible connector 520, while multiple test fixtures are beneficial to realize the parallel testing of multiple sets of circuit boards 5 under test, which greatly improves the testing efficiency of the fixture.

[0032] In summary, this embodiment provides a mother-daughter carrier board test fixture and test jig. By setting an integrated mother carrier board 1 and daughter carrier board assembly 2, synchronous positioning, fixing, and testing of the circuit board body 510 and the flexible connector 520 are achieved. By opening a test window 221 on the flip cover 220 and exposing the interface direction of the flexible connector 520, it is convenient to vertically install the pins of the micro-needle module contact connector 521. By forming a semi-enclosed second test position 211 through the protruding edge 212 and the notch 213, the flexible connector 520 can be quickly positioned and limited. By the first pressure block 222 corresponding to the notch 213, the flip cover 220 can accurately press the root of the flexible cable 522 when closed. By setting a reset spring 233 and a torsion spring 250, the flip cover 220 can be quickly locked and automatically opened. This embodiment can simultaneously accommodate and test the circuit board body 510 and its associated flexible connector 520, simplifying the testing steps, improving testing efficiency, and reducing the risk of damaging the circuit board 5 under test.

[0033] The embodiments described above are merely one of the preferred embodiments of this utility model. Ordinary variations and substitutions made by those skilled in the art within the scope of the technical solution of this utility model should be included within the protection scope of this utility model.

Claims

1. A mother-daughter carrier plate test fixture, characterized in that, include: A motherboard (1) is provided with a first test position (110) for placing the circuit board body (510) of the circuit board to be tested (5). Multiple guide posts (120) are provided at the edge of the first test position (110). A probe hole (111) is provided in the first test position (110). The probe hole (111) is used to accommodate probes to test the circuit board body (510). A subcarrier board assembly (2) is set near the first test position (110). The subcarrier board assembly (2) includes a fixed base (210) and a flip cover (220) rotatably disposed on the fixed base (210). The fixed base (210) is provided with a second test position (211). The second test position (211) is used to place the flexible connector (520) of the circuit board under test (5). The subcarrier board assembly (2) is provided with a snap-fit ​​assembly (230) at the rotating end away from the flip cover (220). The flip cover (220) presses down and fixes the flexible connector (520) to test the flexible connector (520).

2. The mother-daughter carrier plate test fixture according to claim 1, characterized in that, The flip cover (220) has a test window (221) through it corresponding to the second test position (211). The connector (521) of the flexible connector (520) faces upward toward the test window (221). The test window (221) is used to install a micro-needle module to test the connector (521).

3. The mother-daughter carrier plate test fixture according to claim 2, characterized in that, The second test position (211) has a raised edge (212) and a notch (213) at its edge to partially surround the second test position (211), and the flexible flat cable (522) of the flexible flat connector (520) is placed into the second test position (211) through the notch (213).

4. A mother-daughter carrier plate test fixture according to claim 3, characterized in that, The lower end of the flip cover (220) near the test window (221) is provided with a first pressure block (222), which corresponds to the location of the notch (213) and is used to press the flexible flat cable (522).

5. A mother-daughter carrier plate test fixture according to claim 4, characterized in that, The lower end of the flip cover (220) is symmetrically provided with a second pressure block (223) and a third pressure block (224) near the test window (221). The second pressure block (223) and the third pressure block (224) are used to press the flexible flat cable (522) on both sides of the connector (521).

6. A mother-daughter carrier plate test fixture according to claim 1, characterized in that, The mounting base (210) is provided with two second test positions (211).

7. A mother-daughter carrier plate test fixture according to any one of claims 1-6, characterized in that, The buckle assembly (230) includes a first rotating shaft (231) disposed on the side of the fixed base (210) and a buckle (232) mounted on the first rotating shaft (231). The buckle (232) is connected to a return spring (233). A locking block (225) that cooperates with the buckle (232) is provided on one side of the flip cover (220).

8. A mother-daughter carrier plate test fixture according to any one of claims 1-6, characterized in that, The flip cover (220) and the fixed base (210) are rotatably connected by a second rotating shaft (240), and a torsion spring (250) is sleeved on the second rotating shaft (240).

9. A mother-daughter carrier plate testing fixture, characterized in that, The device includes a download board (3), a functional circuit board (4) is provided below the download board (3), and a mother-daughter carrier board test fixture as described in any one of claims 1-8 is provided on the download board (3). The functional circuit board (4) is connected to the circuit board body (510) through a probe.

10. A mother-daughter carrier plate testing fixture according to claim 9, characterized in that, The download board (3) is equipped with multiple mother and daughter carrier board test fixtures.

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