Test load board and test system for chip burn-in and test operating mode switching

Abstract

This application discloses a test load board and test system for switching chip programming and testing modes. The chip under test includes an electronic fuse, a first pin connected to the electronic fuse, a linear regulator, and a second pin connected to the linear regulator. The test load board includes: a first external power supply terminal; a second external power supply terminal, which is powered on in a time-sharing manner with the first external power supply terminal; and an electromagnetic relay, including a normally open contact, a normally closed contact, a common terminal, and a relay power supply terminal. The relay power supply terminal is connected to the first external power supply terminal, the normally closed contact is connected to the second external power supply terminal, the normally open contact is connected to the second pin, and the common terminal is connected to the first pin. When the first external power supply terminal is not supplying power, the common terminal is connected to the normally closed contact; when the first external power supply terminal is supplying power, the common terminal is connected to the normally open contact.

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