A sensor coil testing device

Abstract

The utility model provides a kind of sensor coil testing device, including base, the middle part of base top surface is equipped with positioning slot and the mounting hole being communicated with positioning slot, positioning slot is used to position and place coil to be tested;Probe assembly, it is fixed in mounting hole, for with multiple pin on coil to be tested simultaneously electrically connected;Cover, the side of cover length direction is rotatably connected with the side of base length direction by rotating member, cover is equipped with limiting slot and the connecting hole being communicated with limiting slot, connecting hole is equipped with the connecting piece for with probe assembly electrically connected;When cover is covered on base, positioning slot and limiting slot form fixed space adapted with coil to be tested by surrounding, and probe assembly and the pin of coil keep electrically connected.The utility model can realize reliable anti-misoperation function when coil is placed, can realize with all pin of coil simultaneously electrically connected when testing, can complete all electrical parameter test at a time, improve test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of sensor technology, and in particular to a sensor coil testing device. Background Technology

[0002] As the core component of electromagnetic induction sensors, sensor coils convert large current signals into smaller current or voltage signals based on the principle of electromagnetic induction. They are widely used in industrial automation, automotive electronics, medical equipment, and other fields. Their electrical performance parameters directly determine the measurement accuracy and reliability of the sensor. Therefore, the performance testing of coils is crucial in the production process.

[0003] Currently, conventional testing methods typically use equipment such as resistance testers, inductance testers, and turns testers to independently measure various performance parameters of the coil. For coils with two or more independent windings, manual wiring, testing, and disconnection of each winding is required repeatedly, a cumbersome and time-consuming process that results in low testing efficiency. Furthermore, existing testing equipment generally lacks anti-misoperation mechanisms. In actual testing, errors in manual wiring sequence or unclear winding direction identification can easily lead to distorted test results, making it impossible to accurately identify defective products and creating potential product quality risks. Utility Model Content

[0004] Based on this, the purpose of this utility model is to provide a sensor coil testing device, which aims to solve the technical problems of existing testing methods that typically use equipment such as resistance testers, inductance testers, and turns testers to independently measure various performance parameters of the coil. For coils with two or more independent windings, manual wiring, testing, and disconnection operations are required for each winding, resulting in low testing efficiency. Furthermore, existing testing equipment generally lacks anti-misoperation structures, which can easily lead to distorted test results, inaccurate identification of defective products, and potential product quality risks.

[0005] The purpose of this utility model is to provide a sensor coil testing device, comprising: The base has a positioning groove and a mounting hole communicating with the positioning groove in the middle of the top surface. The positioning groove is used to position and place the coil to be tested. The probe assembly is fixed in the mounting hole and is used to electrically connect simultaneously with multiple pins on the coil to be tested; The cover body has one side along its length that is rotatably connected to one side along its length of the base via a rotating component. The cover body is provided with a limiting groove and a connecting hole communicating with the limiting groove. The connecting hole is provided with a connector for electrical connection with the probe assembly. When the cover is placed on the base, the positioning groove and the limiting groove together form a fixed space that is compatible with the coil to be tested, and the probe assembly is electrically connected to the pins of the coil to be tested.

[0006] In addition, the sensor coil testing device according to the present invention may also have the following additional technical features: Furthermore, the positioning groove includes a first slot, two second slots spaced apart along the length of the base on one side of the first slot, and two third slots spaced apart along the length of the base on the other side of the first slot. The distance between the centers of the two third slots is greater than the distance between the centers of the two second slots. The first slot, the two second slots, and the two third slots are connected to form an opening structure that adapts to the circumferential outer contour of the coil to be tested.

[0007] Furthermore, the mounting holes include a first mounting hole, two second mounting holes, and two third mounting holes that are disposed along the thickness direction of the base and penetrate the base. The axis of the first mounting hole coincides with the axis of the first slot, the axis of the second mounting hole coincides with the axis of the second slot, and the axis of the third mounting hole coincides with the axis of the third slot.

[0008] Furthermore, the first mounting hole, the second mounting hole, and the third mounting hole are all stepped through-hole structures.

[0009] Furthermore, the probe assembly includes a first probe, two second probes and two third probes. The first probe is fixed in the first mounting hole, and the top end of the first probe protrudes from the top surface of the base to penetrate the middle of the coil to be tested and contact the connector. The second probe is fixed in the second mounting hole, and the third probe is fixed in the third mounting hole. The tops of the second probe and the third probe are lower than the bottom of the first slot, so that the second probe and the third probe contact the corresponding pins on the coil to be tested when the cover is closed.

[0010] Furthermore, the bottom of the base is provided with a receiving groove and a wire harness through hole communicating with the receiving groove. The receiving groove is used to receive the bottom end of the probe assembly, and the wire harness through hole is used to allow the wire harness to pass through to connect the probe assembly and the tester.

[0011] Furthermore, the top surface of the base is also provided with an operation port communicating with the positioning groove. The operation port includes two first operation ports and two second operation ports. The two first operation ports are symmetrically arranged on both sides of the first slot along the length direction of the base and communicate with the first slot. The two second operation ports are symmetrically arranged on both sides of the first slot along the width direction of the base and communicate with the first slot.

[0012] Furthermore, the rotating component is a hinge structure, and the hinge structure's plates are fixedly connected to the cover and the base by bolts.

[0013] Furthermore, a mounting groove is provided on the side of the cover opposite to the limiting groove, and a counterweight is provided in the mounting groove to provide pressure when the cover is closed to ensure reliable contact between the probe assembly and the pin of the coil to be tested.

[0014] Furthermore, the cover includes a cover plate portion and an extension plate portion extending horizontally outward from one side of the cover plate portion along its length direction. The top surface of the cover plate portion is flush with the top surface of the extension plate portion, the bottom surface of the cover plate portion is lower than the bottom surface of the extension plate portion, and the top surface of the cover plate portion near the extension plate portion is provided with the mounting groove, and the bottom surface of the cover plate portion is provided with the limiting groove.

[0015] Compared with existing technologies, the advantages of the sensor coil testing device of this utility model are as follows: by setting a positioning groove on the base, the placement direction and angle of the coil are restricted, and a reliable anti-misoperation function is achieved. Combined with the setting of mounting holes and probe components, simultaneous electrical connection with all pins of the coil is achieved, replacing the traditional manual connection method of wiring one by one. All electrical parameters can be tested at one time, greatly shortening the testing time and significantly improving the testing efficiency. Attached Figure Description

[0016] Figure 1 This is a three-dimensional structural diagram of the sensor coil testing device of this utility model from a first-view perspective; Figure 2 This is a three-dimensional structural diagram of the sensor coil testing device of this utility model from a second perspective. Figure 3 This is a top view of the base in the sensor coil testing device of this utility model; Figure 4 This is a structural diagram of the cover in the sensor coil testing device of this utility model from a first-view perspective; Figure 5 This is a structural diagram of the cover in the sensor coil testing device of this utility model from a second perspective. Figure 6 This is a diagram showing one usage state of the sensor coil testing device of this utility model; Figure 7 This is a top view of the sensor coil testing device of this utility model with the coil placed on the base; Figure 8 for Figure 7 A cross-sectional view at point AA.

[0017] The above-mentioned figures include the following reference numerals: 10-base; 11-positioning groove; 111-first slot; 112-second slot; 113-third slot; 121-first mounting hole; 122-second mounting hole; 123-third mounting hole; 131-first operating port; 132-second operating port; 14-accommodating groove; 15-wire harness through hole; 20-cover; 21-cover plate portion; 22-extension plate portion; 23-counterweight block; 201-limiting groove; 202-connecting hole; 203-mounting groove; 30-connector; 40-probe assembly; 41-first probe; 42-second probe; 43-third probe; 50-rotating component; 60-coil.

[0018] The following detailed description, in conjunction with the accompanying drawings, will further illustrate this utility model. Detailed Implementation

[0019] To facilitate understanding of this utility model, a more complete description will be given below with reference to the accompanying drawings. Several embodiments of this utility model are shown in the drawings. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this utility model will be more thorough and complete.

[0020] It should be noted that when a component is said to be "fixed to" another component, it can be directly on the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0022] Please see Figures 1 to 8The image shows a sensor coil testing device according to this utility model, including a base 10, a probe assembly 40, and a cover 20. The base 10 has a positioning groove 11 at the center of its top surface for positioning a coil 60 to be tested. The structure of the positioning groove 11 is designed according to the asymmetrical shape of the coil 60. Specifically, the positioning groove 11 is formed by connecting a first slot 111, two second slots 112, and two third slots 113. The first slot 111 is a circular blind slot, and its diameter forms a small gap with the outer diameter of the circular main body of the coil 60. The base 10 is fitted together to radially position the main body of the coil 60; two second slots 112 are spaced apart along the length of the base 10 on one side of the first slot 111, and the shape of the second slots 112 is adapted to the pins on one side of the coil 60; two third slots 113 are spaced apart along the length of the base 10 on the other side of the first slot 111, and the shape of the third slots 113 is adapted to the pins on the other side of the coil 60. The first slot 111, the two second slots 112 and the two third slots 113 are connected to form an opening structure that is adapted to the circumferential outer contour of the coil 60 to be tested. Furthermore, the distance between the centers of the two third slots 113 is greater than the distance between the centers of the two second slots 112. This asymmetrical spacing design makes the shape of the entire positioning slot 11 uniquely match the asymmetrical outer contour of the coil 60, thus forming a physical error prevention mechanism. In the actual assembly process, the operator can only place the coil 60 into the positioning slot 11 with the only correct orientation. If the placement direction is incorrect, the pins of the coil 60 will not fall into the corresponding slot, thus achieving an effective anti-misoperation function.

[0023] The base 10 is also provided with mounting holes communicating with the positioning groove 11 for fixing the probe assembly 40. Specifically, the mounting holes include a first mounting hole 121, two second mounting holes 122, and two third mounting holes 123, which are arranged along the thickness direction of the base 10 and penetrate through the base 10. The axis of the first mounting hole 121 coincides with the axis of the first slot 111, the axis of the second mounting hole 122 coincides with the axis of the second slot 112, and the axis of the third mounting hole 123 coincides with the axis of the third slot 113. Furthermore, the first mounting hole 121, the second mounting hole 122, and the third mounting hole 123 are all stepped through-hole structures. This structure not only facilitates the press-in installation of the probe, but its stepped surface also provides precise axial positioning for the installation of the probe, ensuring that the height dimension of the tip of all probes meets the design requirements.

[0024] Furthermore, the bottom of the base 10 is also provided with a receiving groove 14 and a wire harness through hole 15 communicating with the receiving groove 14. The receiving groove 14 is connected to the mounting hole. The bottom end of the probe assembly 40, i.e. the terminal, is housed and hidden in the receiving groove 14 so that the internal wiring is neat and orderly. The wire harness through hole 15 is provided on one side of the receiving groove 14 in the length direction. The wire harness through hole 15 is used for the wire harness to pass through to connect the terminal of the probe assembly 40 to the external integrated electrical parameter tester (not shown).

[0025] Furthermore, the top surface of the base 10 is also provided with an operation port, which includes two first operation ports 131 and two second operation ports 132. The two first operation ports 131 are symmetrically arranged on both sides of the first slot 111 along the length direction of the base 10 and are connected to the first slot 111. The two second operation ports 132 are symmetrically arranged on both sides of the first slot 111 along the width direction of the base 10 and are connected to the first slot 111. In this embodiment, both the first operation ports 131 and the second operation ports 132 are circular openings, and the diameter of the first operation port 131 is larger than the diameter of the second operation port 132. In practical applications, these operation ports can be designed as channels for inserting tools (such as the tip of tweezers) or fingers, providing a point of force to easily remove the coil 60 from the positioning slot 11, thus improving operational convenience.

[0026] The probe assembly 40 is used to simultaneously electrically connect with multiple pins on the coil 60 under test. Specifically, the probe assembly 40 includes a first probe 41, two second probes 42, and two third probes 43. The first probe 41 is fixed in the first mounting hole 121, and the top end of the first probe 41 protrudes from the top surface of the base 10, so that it can penetrate through the central hole of the coil 60 under test and contact the bottom end of the connector 30 during testing. The second probes 42 are fixed in the second mounting hole 122, and the third probes 43 are fixed in the third mounting hole 123, and the top ends of the second probes 42 and the third probes 43 are lower than the bottom of the first slot 111, so that the second probes 42 and the third probes 43 contact the corresponding pins on the coil 60 under test when the cover 20 is closed. In this embodiment, the top ends of the first probe 41, the second probe 42, and the third probe 43 are all planar structures. It should be noted that the first probe, the second probe, and the third probe in this embodiment are all standard probe elements commonly used in the art, and their general structure is existing mature technology, which will not be described in detail here.

[0027] One side of the cover 20 along its length is rotatably connected to one side of the base 10 along its length via a rotating member 50. In this embodiment, the rotating member 50 is a standard hinge structure, and the hinge plates are fixedly connected to the sides of the cover 20 and the base 10 by multiple bolts. The cover 20 is provided with a limiting groove 201 and a connecting hole 202 communicating with the limiting groove 201. A connector 30 for electrical connection with the probe assembly 40 is provided in the connecting hole 202. In this embodiment, the connector 30 is a copper rod. It should be noted that the hinge structure used in the above embodiment is a mature and conventional connection structure in the art, and its specific structure will not be described in detail.

[0028] Furthermore, a mounting groove 203 is provided on the side of the cover 20 opposite to the limiting groove 201, and a counterweight 23 is provided in the mounting groove 203 to provide pressure when the cover 20 is closed to ensure reliable contact between the probe assembly 40 and the pin of the coil 60 to be tested. In this embodiment, the counterweight 23 is an iron block.

[0029] Furthermore, the cover 20 includes a cover plate portion 21 and an extension plate portion 22 extending horizontally outward from one side of the cover plate portion 21 along its length. The top surface of the cover plate portion 21 is flush with the top surface of the extension plate portion 22, and the bottom surface of the cover plate portion 21 is lower than the bottom surface of the extension plate portion 22. In this way, the operator can easily open and close the cover 20 by holding the extension plate portion 22. The cover plate portion 21 has the aforementioned mounting groove on its top surface near the extension plate portion 22, and a limiting groove 201 is provided in the middle of its bottom surface. When the cover 20 is closed on the base 10, the positioning groove 11 on the base 10 and the limiting groove 201 on the cover 20 together form a fixed space that is adapted to the coil 60 to be tested, and the probe assembly 40 maintains an electrical connection with the pins of the coil 60 to be tested and the connector 30.

[0030] In practical applications, the working principle of the sensor coil testing device of this application is as follows: The operator places the coil 60 in the positioning groove 11 of the base 10 according to its only correct orientation, and then flips the cover 20 downward so that the cover 20 completely covers the base 10. At this time, the pins on both sides of the coil 60 contact the corresponding second probe 42 and third probe 43 respectively, and the first probe 41 contacts the connector 30, forming a single-turn through-core induction circuit. The external testing instrument can simultaneously measure multiple electrical parameters such as resistance, inductance, and number of turns of the two windings in the coil 60 in parallel through the wiring harness connected to the probe assembly 40. After the test is completed, the operator can conveniently remove the coil 60 using the first operating port 131 or the second operating port 132. The entire process does not require any manual wiring operation, completely avoids direction identification and wiring errors, and significantly improves efficiency. It should be noted that the external testing instrument used in this embodiment is a mature comprehensive electrical parameter testing instrument in the prior art.

[0031] Compared with existing technologies, the advantages of the sensor coil testing device of this utility model are as follows: by setting a positioning groove on the base, the placement direction and angle of the coil are restricted, and a reliable anti-misoperation function is achieved. Combined with the setting of mounting holes and probe components, simultaneous electrical connection with all pins of the coil is achieved, replacing the traditional manual connection method of wiring one by one. All electrical parameters can be tested at one time, greatly shortening the testing time and significantly improving the testing efficiency.

[0032] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0033] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this utility model application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model application should be determined by the appended claims.

Claims

1. A sensor coil testing device, characterized in that, include: The base has a positioning groove and a mounting hole communicating with the positioning groove in the center of its top surface. The positioning groove is used to position and place the coil to be tested. The probe assembly is fixed in the mounting hole and is used to electrically connect with multiple pins on the coil to be tested simultaneously. The cover body has one side along its length that is rotatably connected to one side along its length of the base via a rotating component. The cover body is provided with a limiting groove and a connecting hole communicating with the limiting groove. The connecting hole is provided with a connector for electrical connection with the probe assembly. When the cover is placed on the base, the positioning groove and the limiting groove together form a fixed space that is compatible with the coil to be tested, and the probe assembly is electrically connected to the pins of the coil to be tested.

2. The sensor coil testing device according to claim 1, characterized in that, The positioning groove includes a first groove, two second grooves spaced apart along the length of the base on one side of the first groove, and two third grooves spaced apart along the length of the base on the other side of the first groove. The distance between the centers of the two third grooves is greater than the distance between the centers of the two second grooves. The first groove, the two second grooves, and the two third grooves are connected to form an opening structure that matches the circumferential outer contour of the coil to be tested.

3. The sensor coil testing device according to claim 2, characterized in that, The mounting holes include a first mounting hole, two second mounting holes, and two third mounting holes that are disposed along the thickness direction of the base and penetrate the base. The axis of the first mounting hole coincides with the axis of the first slot, the axis of the second mounting hole coincides with the axis of the second slot, and the axis of the third mounting hole coincides with the axis of the third slot.

4. The sensor coil testing device according to claim 3, characterized in that, The first mounting hole, the second mounting hole, and the third mounting hole are all stepped through-hole structures.

5. The sensor coil testing device according to claim 3, characterized in that, The probe assembly includes a first probe, two second probes and two third probes. The first probe is fixed in the first mounting hole, and the top end of the first probe protrudes from the top surface of the base to penetrate the middle of the coil to be tested and contact the connector. The second probe is fixed in the second mounting hole, and the third probe is fixed in the third mounting hole. The tops of the second probe and the third probe are lower than the bottom of the first slot, so that the second probe and the third probe contact the corresponding pins on the coil to be tested when the cover is closed.

6. The sensor coil testing device according to claim 1, characterized in that, The base has a receiving groove at its bottom and a wire harness through hole communicating with the receiving groove. The receiving groove is used to receive the bottom end of the probe assembly, and the wire harness through hole is used to allow the wire harness to pass through to connect the probe assembly and the tester.

7. The sensor coil testing device according to claim 2, characterized in that, The top surface of the base is also provided with an operation port that communicates with the positioning groove. The operation port includes two first operation ports and two second operation ports. The two first operation ports are symmetrically arranged on both sides of the first slot along the length direction of the base and communicate with the first slot. The two second operation ports are symmetrically arranged on both sides of the first slot along the width direction of the base and communicate with the first slot.

8. The sensor coil testing device according to claim 1, characterized in that, The rotating component is a hinge structure, and the flaps of the hinge structure are fixedly connected to the cover and the base by bolts.

9. The sensor coil testing device according to claim 1, characterized in that, The cover has a mounting groove on the side opposite to the limiting groove, and a counterweight is provided in the mounting groove to provide pressure when the cover is closed to ensure reliable contact between the probe assembly and the pin of the coil to be tested.

10. The sensor coil testing device according to claim 9, characterized in that, The cover includes a cover plate portion and an extension plate portion extending horizontally outward from one side of the cover plate portion along its length direction. The top surface of the cover plate portion is flush with the top surface of the extension plate portion, the bottom surface of the cover plate portion is lower than the bottom surface of the extension plate portion, and the top surface of the cover plate portion near the extension plate portion is provided with the mounting groove, and the bottom surface of the cover plate portion is provided with the limiting groove.

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