Semiconductor test daughter board and motherboard docking structure
Patent Information
- Application Number
- CN202521382306.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-02
- Publication Date
- 2026-09-08
- Estimated Expiration
- 2035-07-02
AI Technical Summary
[0002]目前，在半导体测试中，当将电路板的子板和母板对接时，通常是手拿子板，通过肉眼观察子板和母板的对准位置，然后进行人工对准，但是通过人工的方式对准子板和母板，在对准过程中需要反复对准位置，使得对准效率较低，并且费时费力，并且由于人工对准的过程中，很难控制力度，在对接过程中，很容易损坏子板的PCB板
[0016] The positive effects of the above technical solution compared with the existing technology are:
Smart Images
Figure CN224731977U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of circuit board interconnection, and in particular to a semiconductor testing sub-board and motherboard interconnection structure. Background Technology
[0002] Currently, in semiconductor testing, when aligning the daughter board and mother board of a circuit board, the daughter board is usually held by hand, and the alignment position of the daughter board and mother board is observed by the naked eye. Then, manual alignment is performed. However, aligning the daughter board and mother board manually requires repeated alignment during the alignment process, which results in low alignment efficiency and is time-consuming and labor-intensive. Furthermore, it is difficult to control the force during manual alignment, which can easily damage the PCB board of the daughter board during the docking process. Utility Model Content
[0003] In view of this, and to solve the above problems, the purpose of this utility model is to provide a semiconductor testing sub-board and motherboard docking structure, comprising:
[0004] Mother plate structure, daughter plate structure, locking structure;
[0005] The mother plate structure includes: a mother plate reinforcing rib and a mother plate; the mother plate reinforcing rib is installed on the mother plate, and the locking structure is installed on the mother plate;
[0006] The sub-plate structure includes: a sub-plate reinforcing rib and a sub-plate; the sub-plate reinforcing rib is installed on the sub-plate, and the locking structure is engaged with the outer wall of the sub-plate reinforcing rib, and the locking structure drives the sub-plate to connect with the mother plate.
[0007] In the aforementioned semiconductor testing sub-board and motherboard docking structure, a bearing is installed on the outer wall of the sub-board reinforcing rib.
[0008] In the aforementioned semiconductor testing sub-board and motherboard docking structure, the locking structure includes: a fixing member, a slider, a long connecting rod, a short connecting rod, and a handle assembly; two fixing members are secured to the bearing, two short connecting rods are connected to the two fixing members via two first connecting shafts, two short connecting rods are connected to the two long connecting rods via two second connecting shafts, the two ends of the handle assembly are mounted on the two long connecting rods, guide rails are provided at opposite ends of the two fixing members, and the two sliders are slidably mounted on the two fixing members.
[0009] The above-mentioned semiconductor testing sub-board and motherboard docking structure further includes: a fixing plate, on which the slider is mounted.
[0010] In the above-mentioned semiconductor testing sub-board and motherboard docking structure, each of the two fixing members has an inclined slot at one end, and the slot is engaged with the bearing.
[0011] The above-mentioned semiconductor testing sub-board and motherboard docking structure further includes: two first limiting blocks, the two first limiting blocks are installed on the fixed plate, each of the first limiting blocks is located on the same straight line as the first connecting shaft, and the two first limiting blocks restrict the displacement of the two first connecting shafts.
[0012] In the above-mentioned semiconductor testing sub-board and motherboard docking structure, the handle assembly includes: a handle and two handle connectors; the handle connectors are supported by two bends along the Y-axis and X-axis directions, one end of each of the two handle connectors is installed at both ends of the handle, and the long connecting rod is installed at the other end of each of the two handle connectors.
[0013] The above-mentioned semiconductor testing sub-board and motherboard docking structure further includes: two second limiting blocks; the two second limiting blocks are installed on the fixing plate, and two positioning pins can pass through the two long connecting rods and be fixed to the two second limiting blocks.
[0014] In the above-mentioned semiconductor testing sub-board and motherboard docking structure, each of the two opposite inner walls of the fixing plate is provided with a limiting notch, and the two fixing members are slidably disposed in the two limiting notches.
[0015] In the above-mentioned semiconductor testing sub-board and motherboard docking structure, the fixing plate is equipped with several limiting pins.
[0016] The positive effects of the above technical solution compared with the existing technology are:
[0017] By applying this utility model, a docking structure for a daughter board and a mother board in semiconductor testing is provided. The locking structure is installed on the PCB board of the mother board structure. After the daughter board structure is installed on the mother board structure, the locking structure presses the daughter board structure downward, thereby docking and installing the daughter board structure and the mother board structure together. The docking of the daughter board structure and the mother board structure by the locking structure will not damage the PCB board of the daughter board structure, and can increase the docking efficiency of the daughter board structure and the mother board structure. The docking method is accurate and fast. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the docking structure between the sub-board and the motherboard in a semiconductor testing process according to this utility model.
[0019] Figure 2 This is a perspective view of the locking structure in this utility model.
[0020] Figure 3 This is a side view of the locking structure in this utility model.
[0021] Figure 4This is a partial schematic diagram of the docking structure between the sub-board and the motherboard in a semiconductor testing process according to the present invention.
[0022] 1. Mother plate structure; 2. Daughter plate structure; 3. Locking structure; 4. Mother plate reinforcing rib; 5. Mother plate; 6. Daughter plate reinforcing rib; 7. Daughter plate; 8. Slider; 9. Long connecting rod; 10. Short connecting rod; 11. First connecting shaft; 12. Second connecting shaft; 13. First limiting block; 14. Handle; 15. Handle connector; 16. Second limiting block; 17. Positioning pin; 18. Notch; 19. Fixing plate; 20. Limiting pin; 21. Fixing component. Detailed Implementation
[0023] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the present invention.
[0024] The structures, proportions, and sizes illustrated in the accompanying drawings are merely for illustrative purposes and to aid those skilled in the art. They are not intended to limit the scope of this invention and therefore have no substantial technical significance. Any modifications to the structure, changes in proportions, or adjustments to size, provided they do not affect the effectiveness or purpose of this invention, should still fall within the scope of the technical content disclosed herein. Furthermore, the terms "upper," "lower," "left," "right," "middle," and "one" used in this specification are merely for clarity and not intended to limit the scope of this invention. Changes or adjustments to their relative relationships, without substantially altering the technical content, should also be considered within the scope of this invention.
[0025] like Figures 1 to 4 As shown, a preferred embodiment of a semiconductor testing sub-board and motherboard docking structure is illustrated, which includes: motherboard structure 1, sub-board structure 2, and locking structure 3.
[0026] The mother plate structure 1 includes: mother plate reinforcing rib 4 and mother plate 5; the mother plate reinforcing rib 4 is installed on the mother plate 5, and the locking structure 3 is installed on the mother plate 5; the daughter plate structure 2 includes: daughter plate reinforcing rib 6 and daughter plate 7; the daughter plate reinforcing rib 6 is installed on the daughter plate 7, and the locking structure 3 is clamped on the outer wall of the daughter plate reinforcing rib 6, and the locking structure 3 drives the daughter plate 7 to connect with the mother plate 5.
[0027] In actual use, the locking structure 3 is installed on the PCB board of the motherboard structure 1. After the daughterboard structure 2 is installed on the motherboard structure 1, the locking structure 3 presses the daughterboard structure 2 downward, thereby connecting and installing the daughterboard structure 2 and the motherboard structure 1 together. Connecting the daughterboard structure 2 and the motherboard structure 1 together by the locking structure 3 will not damage the PCB board of the daughterboard structure and can increase the connection efficiency between the daughterboard structure 2 and the motherboard structure 1.
[0028] Specifically, the connection method between sub-board structure 2 and motherboard structure 1 can be European plug or Pogo Pin, etc.
[0029] Based on the above, this utility model also has the following embodiments:
[0030] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, a bearing is installed on the outer wall of the sub-board reinforcing rib.
[0031] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, the locking structure 3 includes: fixing members 21, sliders 8, long connecting rods 9, short connecting rods 10, and a handle assembly. Two fixing members 21 are secured to bearings. Two short connecting rods 10 are connected to the two fixing members 21 via two first connecting shafts 11, and two short connecting rods 10 are connected to the two long connecting rods 9 via two second connecting shafts 12. The handle assembly is mounted on the two long connecting rods 9 at both ends. Guide rails are provided at opposite ends of the two fixing members 21, and two sliders 8 are slidably mounted on the two fixing members 21. Specifically, when the user holds the handle assembly and pulls it in the Z-axis direction, the handle assembly drives the first connecting shafts 11 to move along the X-axis direction via the long connecting rods 9 and short connecting rods 10. The first connecting shafts 11 then drive the fixing members 21 to move along the X-axis direction, thereby moving the sub-board structure 2 towards the Z-axis direction, docking the sub-board structure 2 with the motherboard structure 1. Specifically, the fixing members 21 are secured to the bearings, ensuring that the locking structure 3 does not damage the PCB board of the sub-board structure 2.
[0032] Furthermore, a semiconductor testing sub-board and motherboard docking structure further includes: a fixing plate 19, on which a slider 8 is mounted. Specifically, the locking structure 3 is mounted on the motherboard structure 1 via the fixing plate 19 and is provided with a limit pin 20.
[0033] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, each of the two fixing members 21 has an inclined slot at one end, which is engaged with a bearing. Specifically, because the slots engaged with the bearing are inclined, when the fixing member 21 moves along the X-axis, the inclined slots can press the sub-board structure 2, allowing the sub-board structure 2 to move along the Z-axis. The locking structure 3 can convert the movement in the X-axis direction into movement in the Z-axis direction, thereby docking the sub-board structure 2 and the motherboard structure 1.
[0034] Furthermore, a semiconductor testing sub-board and motherboard docking structure further includes: two first limiting blocks 13, which are mounted on a fixing plate 19. Each first limiting block 13 is located on the same straight line as the first connecting shaft 11, and the two first limiting blocks 13 restrict the displacement of the two first connecting shafts 11. Specifically, the position of the first connecting shaft 11 is restricted by the first limiting blocks 13.
[0035] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, the handle assembly includes: a handle 14 and two handle connectors 15; the handle connectors 15 are supported by two bends along the Y-axis and X-axis directions, and one end of each handle connector 15 is installed at both ends of the handle 14, while a long connecting rod 9 is installed at the other end of each handle connector 15. Specifically, when the user holds the handle and moves it in the Z-axis direction, the handle connectors 15 move in the Z-axis direction. The handle connectors 15 drive the first connecting shaft 11 to move via the long connecting rod 9 and the short connecting rod 10, and ultimately drive the fixing member 21 to move, pressing the sub-board structure 2.
[0036] Furthermore, a semiconductor testing sub-board and motherboard docking structure further includes: two second limiting blocks 16; the two second limiting blocks 16 are mounted on a fixing plate 19, and two positioning pins 17 can pass through two long connecting rods 9 and be fixed to the two second limiting blocks 16. Specifically, when the locking structure 3 is not needed, the locking structure can be limited to the second limiting blocks 16 by the positioning pins 17, and the locking structure 3 will not move.
[0037] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, a limiting notch is provided on each of the two opposing inner walls of the fixing plate 19, and two fixing members 21 are slidably disposed in the two limiting notches. Specifically, a moving position for the fixing members 21 is left on the inner wall of the fixing plate 19, so that the fixing members 21 can press the sub-board structure 2 while not affecting the docking of the sub-board structure 2 and the motherboard structure 1.
[0038] Furthermore, in a semiconductor testing sub-board and motherboard docking structure, a fixing plate 19 is equipped with a plurality of limiting pins 20. Specifically, the limiting pins 20 can be used to position the sub-board structure 2 on the motherboard structure 1.
[0039] The above description is only a preferred embodiment of the present utility model and does not limit the implementation method and protection scope of the present utility model. Those skilled in the art should realize that all solutions obtained by equivalent substitutions and obvious changes made based on the description and illustrations of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A semiconductor testing sub-board and motherboard docking structure, characterized in that, include: Mother plate structure, daughter plate structure, locking structure; The mother plate structure includes: a mother plate reinforcing rib and a mother plate; the mother plate reinforcing rib is installed on the mother plate, and the locking structure is installed on the mother plate; The sub-plate structure includes: a sub-plate reinforcing rib and a sub-plate; the sub-plate reinforcing rib is installed on the sub-plate, and the locking structure is engaged with the outer wall of the sub-plate reinforcing rib, and the locking structure drives the sub-plate to connect with the mother plate.
2. The semiconductor testing sub-board and motherboard docking structure according to claim 1, characterized in that, The outer wall of the reinforcing rib of the sub-plate is fitted with a bearing.
3. The semiconductor testing sub-board and motherboard docking structure according to claim 2, characterized in that, The locking structure includes: a fixing member, a slider, a long connecting rod, a short connecting rod, and a handle assembly; two fixing members are secured to the bearing, two short connecting rods are connected to the two fixing members through two first connecting shafts, two short connecting rods are connected to the two long connecting rods through two second connecting shafts, the two ends of the handle assembly are mounted on the two long connecting rods, the two opposite ends of the two fixing members are provided with guide rails, and the two sliders are slidably mounted on the two fixing members.
4. The semiconductor testing sub-board and motherboard docking structure according to claim 3, characterized in that, Also includes: A fixed plate, on which the slider is mounted.
5. The semiconductor testing sub-board and motherboard docking structure according to claim 3, characterized in that, Both of the aforementioned fasteners have an inclined slot at one end facing each other, and the slot is engaged with the bearing.
6. The semiconductor testing sub-board and motherboard docking structure according to claim 4, characterized in that, Also includes: Two first limiting blocks are installed on the fixed plate. Each first limiting block is located on the same straight line as the first connecting shaft. The two first limiting blocks restrict the displacement of the two first connecting shafts.
7. The semiconductor testing sub-board and motherboard docking structure according to claim 3, characterized in that, The handle assembly includes: a handle and two handle connectors; the handle connectors are supported by two bends along the Y-axis and X-axis directions, and one end of each of the two handle connectors is installed at both ends of the handle, while the long connecting rod is installed at the other end of each of the two handle connectors.
8. The semiconductor testing sub-board and motherboard docking structure according to claim 4, characterized in that, Also includes: Two second limiting blocks; the two second limiting blocks are installed on the fixed plate, and two positioning pins can pass through the two long connecting rods and be fixed to the two second limiting blocks.
9. The semiconductor testing sub-board and motherboard docking structure according to claim 4, characterized in that, The two opposite inner walls of the fixing plate are provided with a limiting notch, and the two fixing members are slidably disposed in the two limiting notches.
10. The semiconductor testing sub-board and motherboard docking structure according to claim 4, characterized in that, The fixing plate is equipped with several limiting pins.