Crimping device and testing apparatus
Patent Information
- Application Number
- CN202522524657.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-27
- Publication Date
- 2026-11-03
- Estimated Expiration
- 2035-11-27
AI Technical Summary
The existing crimping device has a complex dual-camera module layout, which is prone to crimping interference risk and increases the design difficulty.
A single camera module is used in combination with a calibration module and a probe module. The calibration module calibrates the relative position between the camera module and the alignment platform, establishes the coordinate relationship between the camera module and the alignment platform, ensures the alignment accuracy between the probe module and the product under test, simplifies the camera module layout, and reduces the risk of crimping interference.
It improves the accuracy and reliability of the crimping position, simplifies the layout of the camera module, and reduces the risk of crimping interference.
Smart Images
Figure CN224934117U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of crimping testing technology, and in particular to a crimping device and testing equipment. Background Technology
[0002] In the fields of electronic components, semiconductor chips, and digital products, products need to be tested before packaging to check whether their functions are normal. For example, when testing chips, probe modules need to be precisely aligned and pressed onto the chip to achieve electrical connection between the chip and the testing machine without damage, thus completing the power-on and signal function testing of the chip.
[0003] Currently, in the chip crimping test process, camera modules are usually set on both sides of the probe module. The probe module and the chip are set up with dual camera modules at the top and bottom for visual guidance. However, the layout of dual camera modules greatly increases the structural complexity of the crimping device and is prone to crimping interference risk, which increases the design difficulty of the crimping device. Utility Model Content
[0004] Therefore, it is necessary to provide a crimping device and testing equipment to address the problem that the dual-camera module layout in existing crimping devices is complex and prone to crimping interference risks.
[0005] A crimping device, the crimping device comprising:
[0006] Machine tool;
[0007] A load-bearing module is disposed on the machine tool and has a load-bearing position for bearing the product to be tested;
[0008] The crimping module and the alignment platform are both movably mounted on the machine tool and are located on opposite sides of the bearing module. The crimping module is used to crimp the product to be tested and can move toward or away from the bearing position.
[0009] The system includes a camera module, a calibration module, and a probe module. The camera module is used to acquire the position information of the calibration module and the probe module. The calibration module is used to calibrate the relative position between the camera module and the alignment platform. Either the calibration module or the probe module is detachably mounted on the alignment platform. When the probe module is mounted on the alignment platform, it can be electrically connected to the product under test.
[0010] In one embodiment, the probe module has at least one first reference point on the side facing the camera module. The first reference point is located in the contact area between the probe module and the product under test, and the camera module is able to acquire the position information of the first reference point.
[0011] In one embodiment, the probe module includes a carrier plate having at least one first window notch that extends through the carrier plate, and at least one first reference protrusion is provided on the sidewall forming the first window notch. The camera module is capable of acquiring the relative position between the first reference protrusion and the conductive part of the product under test.
[0012] In one embodiment, the carrier plate further has at least one second window notch that extends through the carrier plate. The second window notch and the first window notch are spaced apart along the circumferential direction of the conductive part of the product under test. At least one second reference protrusion is provided on the sidewall forming the second window notch. The camera module is able to acquire the relative position between the second reference protrusion and the conductive part of the product under test.
[0013] In one embodiment, the calibration module has at least one second reference point, and the camera module is capable of acquiring the position information of the second reference point.
[0014] In one embodiment, the probe module further includes a probe portion that can be electrically connected to a conductive portion of the product under test.
[0015] In one embodiment, the crimping module includes a first drive source and a crimping head, wherein the first drive source is drively connected to the crimping head and is used to drive the crimping head to move toward or away from the bearing position.
[0016] In one embodiment, the crimping device further includes a second drive source, which is connected to the alignment platform for adjusting the position of the alignment platform.
[0017] In one embodiment, the crimping device further includes a light source module for providing light towards the camera module.
[0018] A testing device, the testing device comprising:
[0019] The crimping device as described in any of the above technical solutions.
[0020] The aforementioned crimping device and testing equipment selectively place a calibration module on the alignment platform. A camera module acquires the position information of the calibration module to calibrate the relative position between the camera module and the alignment platform. Then, a probe module is selectively placed on the alignment platform, and the camera module acquires the position information of the probe module. The camera module ensures the relative positional accuracy between the probe module and the product under test (DUT). Simultaneously, the crimping module moves towards the bearing position and crimps onto the DUT, and the probe module is electrically connected to the DUT to perform an electrical crimping test. The crimping device provided in this application calibrates the relative position between the camera module and the alignment platform using the calibration module, establishing a coordinate relationship between the camera module and the alignment platform. The camera module ensures the alignment accuracy between the probe module and the DUT, improving the subsequent crimping positional accuracy and reliability of the DUT. A single camera module can complete the alignment operation between the probe module and the DUT, simplifying the layout of the camera module and reducing the risk of crimping interference. Attached Figure Description
[0021] Figure 1 This is a schematic diagram of the crimping device provided in some embodiments.
[0022] Figure 2 This is an exploded view of the structure of the crimping device provided in some embodiments.
[0023] Figure 3 for Figure 2 A magnified view of a portion of region A in the middle.
[0024] Figure 4 This is a schematic diagram of the calibration module provided in some embodiments.
[0025] Figure 5 This is a schematic diagram of the structure of the carrier module and probe module provided in some embodiments.
[0026] Figure 6 for Figure 5 A magnified view of a portion of region B in the middle.
[0027] Figure label:
[0028] 100. Crimping device;
[0029] 110. Machine base; 120. Bearing module; 121. Bearing position; 130. Crimping module; 131. First drive source; 132. Press head; 140. Alignment platform; 150. Camera module; 160. Calibration module; 161. Second reference point; 170. Probe module; 171. First reference point; 172. Carrier plate; 173. First viewing window notch; 174. First reference protrusion; 175. Second viewing window notch; 176. Second reference protrusion; 177. Probe section; 180. Second drive source; 190. Light source module;
[0030] 200. Product to be tested; 210. Conductive part. Detailed Implementation
[0031] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0032] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0033] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0034] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0035] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0036] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.
[0037] The technical solutions provided by the embodiments of this application are described below with reference to the accompanying drawings.
[0038] See Figures 1-4 As shown, this application provides a crimping device 100, which includes a machine base 110, a carrier module 120, a crimping module 130, an alignment platform 140, a camera module 150, a calibration module 160, and a probe module 170. The crimping device 100 is used to perform electrical crimping tests on a product under test 200, such as a chip, digital product, etc. This application does not limit the specific component type of the product under test 200.
[0039] The support module 120 is disposed on the machine base 110, and the support module 120 has a support position 121 for supporting the product under test 200. Preferably, the support position 121 is a contoured cavity disposed in the support module 120 to accommodate the support placement of the product under test 200 and to ensure the stability of the product under test 200 in the support module 120.
[0040] Both the crimping module 130 and the alignment platform 140 are movably mounted on the machine base 110, and the crimping module 130 and the alignment platform 140 are located on opposite sides of the bearing module 120, such as the crimping module 130 and the alignment platform 140 being located along the bearing module 120. Figure 1 The two sides of the paper shown are vertically opposite. The crimping module 130 is used to crimp the product under test 200, and the crimping module 130 can move towards or away from the bearing position 121. For example, when the crimping module 130 moves towards the bearing position 121, the crimping module 130 can crimp the product under test 200 and perform an electrical crimp test on the product under test 200; or when the crimping module 130 moves away from the bearing position 121, the crimping module 130 separates from the product under test 200, making it convenient to pick up, put down, or replace the product under test 200.
[0041] The camera module 150 is used to acquire the position information of the calibration module 160 and the probe module 170. The calibration module 160 is used to calibrate the relative position between the camera module 150 and the alignment platform 140. Either the calibration module 160 or the probe module 170 is detachably mounted on the alignment platform 140; that is, if the calibration module 160 is mounted on the alignment platform 140, the probe module 170 is detached from the alignment platform 140, and vice versa. When the probe module 170 is mounted on the alignment platform 140, the probe module 170 can be electrically connected to the product under test 200 to perform an electrical crimp test on the product under test 200. Specifically, firstly, the calibration module 160 is selectively placed on the alignment platform 140, and the camera module 150 acquires the position information of the calibration module 160 to calibrate the relative position between the camera module 150 and the alignment platform 140. Then, the calibration module 160 is detached from the alignment platform 140, and the probe module 170 is selectively placed on the alignment platform 140. The camera module 150 acquires the position information of the probe module 170, and when the alignment position of the probe module 170 deviates from that of the product under test 200, the position of the probe module 170 is corrected in time. The camera module 150 ensures the relative position accuracy between the probe module 170 and the product under test 200. Finally, the crimping module 130 moves toward the bearing position 121 and crimps onto the product under test 200, and the probe module 170 is electrically connected to the product under test 200 to perform an electrical crimping test on the product under test 200.
[0042] The aforementioned crimping device 100 calibrates the relative position between the camera module 150 and the alignment platform 140 through the calibration module 160, establishing a coordinate association between the camera module 150 and the alignment platform 140. The camera module 150 ensures the alignment accuracy between the probe module 170 and the product under test 200, thereby improving the crimping position accuracy and reliability of the product under test 200. The alignment operation between the camera module 150 and the product under test 200 can be completed with a single camera module 150, simplifying the layout difficulty of the camera module 150, and the camera module 150 is less prone to crimping interference risks.
[0043] In one embodiment, see Figures 1-6As shown, the probe module 170 has at least one first reference point 171 on the side facing the camera module 150. The first reference point 171 is disposed in the contact area between the probe module 170 and the product under test 200. For example, the first reference point 171 may be a reference protrusion or reference hole disposed on the probe module 170. The camera module 150 can acquire the position information of the first reference point 171. In this way, by acquiring the position information of the first reference point 171 through the camera module 150, the theoretical target position of the probe module 170 is defined, so as to adjust the probe module 170 to the theoretical target position and improve the alignment accuracy between the probe module 170 and the product under test 200.
[0044] In practice, due to factors such as mechanical assembly errors, manufacturing errors of the first reference point 171, and errors in the crimping and imaging processes, adjusting the probe module 170 according to its theoretical target position often results in a slight deviation between the actual crimping position of the probe module 170 and the product under test 200. Therefore, refer to... Figures 1-6 As shown, the probe module 170 includes a carrier plate 172. The carrier plate 172 has at least one first viewing notch 173, which extends through the carrier plate 172. At least one first reference protrusion 174 protrudes from the sidewall forming the first viewing notch 173. The camera module 150 can acquire the relative position between the first reference protrusion 174 and the conductive portion 210 of the product under test 200. For example, the conductive portion 210 may be a plurality of gold fingers arrayed on the surface of the product under test 200, with a gap between adjacent gold fingers. The first viewing window notch 173 penetrates the carrier plate 172. The first viewing window notch 173 allows the image field of view of the camera module 150 to pass through the carrier plate 172 and capture the position of the first reference protrusion 174. That is, the camera module 150 obtains the relative position between the first reference protrusion 174 and the conductive part 210 of the product under test 200 to compensate for the positional deviation between the probe module 170 and the product under test 200 and correct the positional deviation between the probe module 170 and the product under test 200.
[0045] For example, when the product under test 200 is located in the bearing position 121, the camera module 150 observes the position information of the conductive part 210 of the product under test 200 placed in the bearing position 121 through the first viewing window notch 173, and feeds back the position information of the conductive part 210 of the product under test 200 to the terminal. When the position of the conductive part 210 deviates from the position of the probe module 170, such as one or more gold fingers in the conductive part 210 not coinciding with the first reference protrusion 174, it is determined that the position of the product under test 200 in the bearing position 121 deviates from the preset position. The position of the product under test 200 is adjusted manually or by other adjustment modules so that the position of the product under test 200 corresponds to the position of the probe module 170, thereby improving the crimping position accuracy between the probe module 170 and the product under test 200.
[0046] Further, see Figures 1-6 As shown, the carrier plate 172 also has at least one second viewing window notch 175. The second viewing window notch 175 penetrates the carrier plate 172, and the second viewing window notch 175 and the first viewing window notch 173 are spaced apart along the circumferential direction of the conductive portion 210 of the product under test 200. At least one second reference protrusion 176 protrudes from the sidewall forming the second viewing window notch 175, and the camera module 150 can acquire the relative position between the second reference protrusion 176 and the conductive portion 210 of the product under test 200. Since the second viewing notch 175 penetrates the carrier plate 172, it allows the image field of view of the camera module 150 to pass through the carrier plate 172 and capture the position of the second reference protrusion 176. That is, the camera module 150 obtains the relative position between the second reference protrusion 176 and the conductive portion 210 of the product under test 200 to compensate for the positional deviation between the probe module 170 and the product under test 200, correcting the positional deviation between them. Thus, by obtaining the relative positions between the first reference protrusion 174 and the conductive portion 210 of the product under test 200, and the relative positions between the second reference protrusion 176 and the conductive portion 210 of the product under test 200, multi-point alignment of the probe module 170 and the product under test 200 is performed, thereby improving the alignment accuracy between the probe module 170 and the product under test 200.
[0047] For example, when the product under test 200 is located in the bearing position 121, the camera module 150 observes the position information of the conductive part 210 of the product under test 200 placed in the bearing position 121 through the second viewing window notch 175, and feeds back the position information of the conductive part 210 of the product under test 200 to the terminal. When the position of the conductive part 210 deviates from the position of the probe module 170, such as one or more gold fingers in the conductive part 210 not coinciding with the second reference protrusion 176, it is determined that the position of the product under test 200 in the bearing position 121 deviates from the preset position. The position of the product under test 200 is adjusted manually or by other adjustment modules so that the position of the product under test 200 corresponds to the position of the probe module 170, thereby improving the crimping position accuracy between the probe module 170 and the product under test 200.
[0048] In one embodiment, see Figures 1-4As shown, the calibration module 160 has at least one second reference point 161, such as a reference protrusion or reference hole provided on the calibration module 160. The camera module 150 can acquire the position information of the second reference point 161. Thus, by acquiring the position information of the second reference point 161 through the camera module 150, the position of the calibration module 160 is defined. Since the calibration module 160 is located on the alignment platform 140, by calibrating the relative position between the camera module 150 and the alignment platform 140 through the calibration module 160, a coordinate association between the camera module 150 and the alignment platform 140 can be established, thereby calibrating and adjusting the position between the camera module 150 and the alignment platform 140.
[0049] In one embodiment, see Figures 1-3 As shown, the probe module 170 also includes a probe portion 177, which protrudes from the carrier plate 172 and can be electrically connected to the conductive portion 210 of the product under test 200. For example, when an electrical crimp test is required on the product under test 200, the probe module 170 is placed on the alignment platform 140, and the probe portion 177 is electrically connected to the conductive portion 210 of the product under test 200, thereby achieving an electrical connection between the probe module 170 and the product under test 200.
[0050] Further, see Figures 1-3 As shown, the crimping module 130 includes a first drive source 131 and a crimping head 132. The first drive source 131 is driveably connected to the crimping head 132, and the first drive source 131 is used to drive the crimping head 132 to move toward or away from the bearing position 121. For example, when performing a crimp test on the product under test 200, the first drive source 131 outputs power to the crimping head 132, and the crimping head 132 moves toward the bearing position 121. When the crimping head 132 contacts and crimps the product under test 200, the crimping head 132 and the probe module 170 are electrically crimped to opposite sides of the product under test 200 to perform an electrical crimp test on the product under test 200. Furthermore, after the crimping test of the product under test 200 is completed, the first drive source 131 outputs power in the reverse direction to the pressure head 132, and the pressure head 132 moves away from the bearing position 121. When the pressure head 132 separates from the product under test 200, operations such as picking up, placing, and replacing the product under test 200 can be performed.
[0051] In this embodiment, the first driving source 131 can be a power component such as a drive motor or a drive cylinder. This application does not limit the specific component type of the first driving source 131.
[0052] Furthermore, see Figures 1-3As shown, the crimping device 100 also includes a second drive source 180, which is connected to the alignment platform 140. The second drive source 180 is used to adjust the position of the alignment platform 140. For example, if there is an alignment error between the calibration module 160 calibrating the camera module 150 and the alignment platform 140, the second drive source 180 outputs power to the alignment platform 140 to adjust its position, calibrate the relative position between the camera module 150 and the alignment platform 140, ensure that the alignment platform 140 is in a preset position, and improve the alignment crimping accuracy between the subsequent probe module 170 and the product under test 200.
[0053] In this embodiment, the second drive source 180 can be a drive motor, drive cylinder or other power components. This application does not limit the specific component type of the second drive source 180.
[0054] In one embodiment, see Figures 1-3 As shown, the crimping device 100 also includes a light source module 190, which provides light to the camera module 150. Exemplarily, the light source module 190 may include, but is not limited to, supplementary lighting elements such as lamp sources and light sources. During the alignment process between the probe module 170 and the product under test 200, the light source module 190 can supplement the lighting to the camera module 150, enabling the camera module 150 to acquire high-quality, high-contrast, and highly stable images, thereby ensuring the alignment accuracy and reliability between the probe module 170 and the product under test 200.
[0055] Additionally, see Figures 1-4 As shown, this application also provides a testing device, which includes a crimping device 100 as described above. Thus, the relative position between the camera module 150 and the alignment platform 140 is calibrated by the calibration module 160, establishing a coordinate association between the camera module 150 and the alignment platform 140. The camera module 150 ensures the alignment accuracy between the probe module 170 and the product under test 200, thereby improving the crimping position accuracy and reliability of the product under test 200. The alignment operation between the camera module 150 and the product under test 200 can be completed with a single camera module 150, simplifying the layout of the camera module 150 and reducing the risk of crimping interference.
[0056] Combination Figures 1-6 The crimping test process of the product under test 200 in this application is described in detail.
[0057] (1) The calibration module 160 calibrates the relative position between the camera module 150 and the alignment platform 140.
[0058] Step S110: Selectively set the calibration module 160 on the alignment platform 140 and remove the probe module 170 on the alignment platform 140 to avoid interference from the probe module 170 on the installation and image acquisition position of the calibration module 160.
[0059] Step S120: The alignment platform 140 moves relative to the machine tool 110 until the second reference point 161 of the calibration module 160 is inside the imaging screen of the camera module 150, and after the second reference point 161 is imaged at the preset imaging position of the camera module 150, the alignment platform 140 is locked to the machine tool 110.
[0060] Step S130: Control the alignment platform 140 to move the second reference point 161 sequentially to multiple preset points (e.g., the second reference point 161 moves sequentially to 14 preset points, which cover the main working range of the alignment platform 140). When the second reference point 161 moves to each preset point, the camera module 150 takes an image of the calibration module 160. The system automatically identifies the coordinates of the second reference point 161 in the image and matches and calculates them with the actual movement coordinates of the alignment platform 140.
[0061] Step S140: After completing the acquisition and calculation of multiple preset points, the system generates a coordinate transformation matrix between the camera module 150 and the alignment platform 140, and establishes a coordinate association between the camera module 150 and the alignment platform 140 to calibrate and adjust the position between the camera module 150 and the alignment platform 140.
[0062] (2) Define the theoretical target position of probe module 170.
[0063] Step S210: Manually remove the calibration module 160 from the alignment platform 140 and install the probe module 170 on the alignment platform 140.
[0064] Step S220: The alignment platform 140 moves relative to the machine tool 110 until the first reference point 171 of the probe module 170 is in the imaging screen of the camera module 150, and after the first reference point 171 is imaged at the preset imaging position of the camera module 150, the alignment platform 140 is locked to the machine tool 110.
[0065] Step S230: The system processes the first reference point 171 acquired by the camera module 150, and accurately extracts the coordinates and angles of the probe module 170 through the image recognition algorithm, and records them as P0 (X0, Y0, θ0).
[0066] (3) Correct the positional deviation between probe module 170 and product under test 200.
[0067] Step S310: Place the product to be tested 200 in the bearing position 121 of the bearing module 120.
[0068] Step S320: The camera module 150 acquires the relative position between the first reference protrusion 174 and the conductive part 210 of the product under test 200, and the relative position between the second reference protrusion 176 and the conductive part 210 of the product under test 200.
[0069] Step S330: The system retrieves the ideal crimping state image, compares the images to obtain the deviation between the actual crimping state and the ideal crimping state of the probe module 170, and obtains a fixed compensation value δ0 (ΔX0, ΔY0, ΔT0).
[0070] (4) Crimping test of product 200.
[0071] Step S410: The product under test 200 is placed in the bearing position 121 of the bearing module 120.
[0072] Step S420: The camera module 150 acquires the position coordinates P1 (X1, Y1, θ1) of the product under test 200. The system calculates the relative displacement δ1 (ΔX1, ΔY1, ΔT1) between the coordinates P1 (X1, Y1, θ1) of the product under test 200 and the coordinates P0 (X0, Y0, θ0) of the probe module 170. The position deviation of the probe module 170 is adjusted manually or by other adjustment modules, and the position deviation to be adjusted is δ = δ0 (ΔX0, ΔY0, ΔT0) + δ1 (ΔX1, ΔY1, ΔT1).
[0073] Step S430: After the probe module 170 is adjusted to the preset position, the pressure head 132 module and the probe module 170 are electrically pressed onto the opposite sides of the product under test 200 to realize the electrical pressing test of the product under test 200.
[0074] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0075] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A crimping device, characterized in that, The crimping device includes: Machine tool; A load-bearing module is disposed on the machine tool and has a load-bearing position for bearing the product to be tested; The crimping module and the alignment platform are both movably mounted on the machine tool and are located on opposite sides of the bearing module. The crimping module is used to crimp the product to be tested and can move toward or away from the bearing position. The system includes a camera module, a calibration module, and a probe module. The camera module is used to acquire the position information of the calibration module and the probe module. The calibration module is used to calibrate the relative position between the camera module and the alignment platform. Either the calibration module or the probe module is detachably mounted on the alignment platform. When the probe module is mounted on the alignment platform, it can be electrically connected to the product under test.
2. The crimping device according to claim 1, characterized in that, The probe module has at least one first reference point on the side facing the camera module. The first reference point is located in the contact area between the probe module and the product under test. The camera module can acquire the position information of the first reference point.
3. The crimping device according to any one of claims 1 or 2, characterized in that, The probe module includes a carrier plate with at least one first window notch that extends through the carrier plate. At least one first reference protrusion is provided on the sidewall forming the first window notch. The camera module is capable of acquiring the relative position between the first reference protrusion and the conductive part of the product under test.
4. The crimping device according to claim 3, characterized in that, The carrier plate also has at least one second viewing window notch that extends through the carrier plate. The second viewing window notch and the first viewing window notch are spaced apart along the circumferential direction of the conductive part of the product under test. At least one second reference protrusion is provided on the sidewall forming the second viewing window notch. The camera module is able to acquire the relative position between the second reference protrusion and the conductive part of the product under test.
5. The crimping device according to claim 1, characterized in that, The calibration module has at least one second reference point, and the camera module is able to acquire the position information of the second reference point.
6. The crimping device according to claim 3, characterized in that, The probe module also includes a probe section, which can be electrically connected to the conductive part of the product under test.
7. The crimping device according to claim 1, characterized in that, The crimping module includes a first drive source and a crimping head. The first drive source is connected to the crimping head for driving the crimping head to move toward or away from the bearing position.
8. The crimping device according to claim 1, characterized in that, The crimping device further includes a second drive source, which is connected to the alignment platform for adjusting the position of the alignment platform.
9. The crimping device according to claim 1, characterized in that, The crimping device also includes a light source module, which is used to provide light to the camera module.
10. A testing device, characterized in that, The testing equipment includes: The crimping device as described in any one of claims 1-9.