Burn-in test connection board
CN309498842SActive Publication Date: 2025-09-16CHANGMAI SEMICONDUCTOR (CHENGDU) CO LTD
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Patent Information
- Application Number
- CN202430812164.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2025-09-16
- Estimated Expiration
- 2039-12-20
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: connection board for aging test. 2. Purpose of this design product: Used to place semiconductor devices and connect them to the aging tester when performing aging tests on semiconductor devices. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the design points: Stereoscopic drawing 1.
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