High and low temperature and damp heat environment test chamber

CN309630637SActive Publication Date: 2025-11-25READ MICROELECTRONICS TECH (SHANDONG) CO LTD
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Patent Information

Application Number
CN202530235187.2
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-04-27
Publication Date
2025-11-25
Estimated Expiration
2040-04-27

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Abstract

1. The name of the design product: high and low temperature and humidity environmental test chamber. 2. The use of the design product: the high and low temperature and humidity environmental test chamber of the design is mainly used to simulate extreme temperature and humidity conditions in the natural environment to evaluate the performance and durability of the tested products or materials under extreme environment. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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