High and low temperature and damp heat environment test chamber
CN309630637SActive Publication Date: 2025-11-25READ MICROELECTRONICS TECH (SHANDONG) CO LTD
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Patent Information
- Application Number
- CN202530235187.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-27
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2040-04-27
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Figure 000007_ABST
Abstract
1. The name of the design product: high and low temperature and humidity environmental test chamber. 2. The use of the design product: the high and low temperature and humidity environmental test chamber of the design is mainly used to simulate extreme temperature and humidity conditions in the natural environment to evaluate the performance and durability of the tested products or materials under extreme environment. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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