Semiconductor yield control graphical user interface for electronic devices
CN309849663SActive Publication Date: 2026-03-17DONGFANG JINGYUAN ELECTRON LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-07
- Publication Date
- 2026-03-17
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Figure 000001_ABST
Abstract
1. The name of the design product: the semiconductor yield control graphical user interface of electronic equipment. 2. The use of the design product: an electronic device. 3. The design points of the design product: the graphical user interface in the electronic equipment. 4. The picture or photo that best shows the design points: front view. 5. The use of the graphical user interface: the graphical user interface is the interface of the yield control process such as semiconductor measurement and detection, and is used for interaction and display of semiconductor detection. 6. Other circumstances that need to be explained: the front view is the main interface of semiconductor yield control; continue to click the "DataView" button below to display the interface change state diagram. The cross in each interface represents text and / or numbers; the diagonal area represents the content screen, such as pictures, avatars, or videos.
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