Stack hotspot profiling analysis function visual graphical user interface for electronic devices
CN309849795SActive Publication Date: 2026-03-17BEIJING YOUTEJIE INFORMATION TECH
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-24
- Publication Date
- 2026-03-17
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Figure 000004_ABST
Abstract
1. The name of the design product: electronic device stack trace profiling analysis function visualization graphical user interface. 2. The use of the design product: an electronic device. 3. The design points of the design product: in the graphical user interface. 4. The picture or photo that best indicates the design points: front view. 5. The use of the graphical user interface: for collected profile data to support correlation trace / span, support jumping from a trace / span to related profiling. 6. The human-computer interaction mode of the graphical user interface: the front view is the initial interface; after clicking the "stacktraces" icon below the front view, interface change state diagram 1 is entered; after clicking interface change state diagram 1, entering "un" in the search bar below the flame diagram, interface change state diagram 2 is entered; after clicking interface change state diagram 2, sliding the mouse, interface change state diagram 3 is entered. 7. Other circumstances that need to be explained: the display screen panel is used for an electronic device.
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