Wafer inspection apparatus

CN309866291SActive Publication Date: 2026-03-24QINGSOFT MICROVISION (HANGZHOU) TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-07-15
Publication Date
2026-03-24

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Abstract

1. Name of the design product: wafer detection equipment. 2. Use of the design product: equipment for wafer detection in the semiconductor industry. 3. Design points of the design product: in shape. 4. Picture or photo that best shows the design points: design 1 perspective view 1. 5. Design 1 is designated as the basic design.
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