Graphical user interface for probe station wafer test run management of electronic devices
CN309909093SActive Publication Date: 2026-04-10佛山市芯测科技有限公司
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- 佛山市芯测科技有限公司
- Filing Date
- 2025-01-26
- Publication Date
- 2026-04-10
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Figure 000001_ABST
Abstract
1. The name of the design product: the graphical user interface of the probe station wafer test operation management of electronic equipment. 2. The use of the design product: an electronic device. 3. The design points of the design product: the graphical user interface. 4. The picture or photo that best shows the design points: front view. 5. The use of the graphical user interface: for displaying relevant information of the probe station wafer test equipment operation management. 6. The human-computer interaction mode of the graphical user interface: the front view is the main interface view, clicking the "start" button in the front view page can enter interface change state diagram 1; clicking the "process parameter setting" button in the interface change state diagram 1 page can enter interface change state diagram 2; clicking the "setting end" in the lower right corner of the interface change state diagram 2 page can enter interface change state diagram 3; clicking the "START" button in the lower right corner of the interface change state diagram 3 page can enter interface change state diagram 4; clicking the "switch CHG" button in the upper right corner of the interface change state diagram 4 page can enter interface change state diagram 5. 7. Other circumstances that need to be explained: the gray block in the interface change state diagram 2 page is the picture content.
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