Multifunctional Transistor Tester

CN310012691SActive Publication Date: 2026-06-02廖文丹
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
廖文丹
Filing Date
2025-11-24
Publication Date
2026-06-02

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Abstract

1. Name of the product in this design: Multifunctional Transistor Tester. 2. Application of this design: to measure parameters of transistors, diodes, triodes, resistors, etc. 3. The key design features of this product are the combination of shape and pattern. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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