Method for processing a wafer and layer stack
The method of forming a sacrificial area and channels in a layer stack addresses the mechanical barrier issue of support rings, enabling efficient and stable wafer processing with reduced damage and increased process flexibility.
Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- INFINEON TECHNOLOGIES AG
- Filing Date
- 2016-07-14
- Publication Date
- 2026-06-18
AI Technical Summary
Processing thin wafers with a support ring poses challenges due to the ring acting as a mechanical barrier for liquids, leading to inhomogeneous material removal and increased risk of component damage during processing, limiting process variation and requiring additional protective measures.
A method involving a layer stack with a sacrificial area of lower mechanical and chemical resistance, where a depression is formed in the support layer to expose the sacrificial area, and channels are created using a processing fluid to reduce the barrier effect without compromising stiffening.
This approach facilitates easier processing with liquids, reduces the risk of component damage, and provides greater process freedom, allowing for more efficient and stable wafer processing without additional protective measures.
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