Photon-counting X-ray detector, medical imaging device and method for generating an X-ray image dataset

Abstract

Photon-counting X-ray detector comprising a converter element (4) designed to convert incoming X-ray radiation (R) into electrical signals depending on an energy deposition in the converter element (4), and an evaluation unit (2) coupled thereto, comprising - a pulse generation unit (6) configured to generate and output an electrical pulse (S) based on an electrical signal fed in by the converter element (4), - a differentiator unit (10) coupled to the pulse generating unit (6) and designed to generate a differentiated signal (dS) of the electrical pulse (S) output by the pulse generating unit (6), and - a first comparator (8), coupled to the differentiator unit (10) and designed to compare the generated, differentiated signal (dS) with a first threshold value (TH1) and, based on the comparison, to output a binary output signal (K1) for a duration during which the threshold value (TH1) is exceeded, wherein the evaluation unit (2) is also designed to determine the duration of an output binary output signal (K1) of the first comparator (8) and the X-ray detector is designed to determine an integral over the durations or an average value of the durations of several successive binary output signals (K1) within a time interval.

Description

[0001] The invention relates to a photon-counting X-ray detector, a medical imaging device comprising a photon-counting X-ray detector and a method for generating an X-ray image data set using a photon-counting X-ray detector.

[0002] Photon-counting X-ray detectors are used in many imaging applications. For example, these X-ray detectors can be used in computed tomography scanners in medical imaging to generate a tomographic X-ray image of a patient's examination area.

[0003] A photon-counting, direct-conversion X-ray detector can be used as a photon-counting X-ray detector. In such X-ray detectors, incoming X-rays or photons can be converted into electrical pulses using a suitable converter material. Examples of converter materials include CdTe, CZT, HgI2, GaAs, or others. The electrical pulses are evaluated by evaluation electronics, such as an integrated circuit (Application Specific Integrated Circuit, ASIC). In counting X-ray detectors, incoming X-rays are then measured by counting the electrical pulses triggered by the absorption of X-ray photons in the converter material and used as an image signal. The height or length of a generated electrical pulse is usually proportional to the energy of the absorbed X-ray photon.This allows spectral information to be extracted by comparing the height or length of the electrical pulse with an energy threshold. Photon-counting X-ray detectors often have multiple adjustable energy thresholds for comparing the generated electrical pulses, enabling energy-resolved measurements across multiple energy ranges defined by the energy thresholds.

[0004] Particularly with high photon fluxes, such as those found in X-ray imaging and especially computed tomography, superposition of generated electrical pulses, the so-called pile-up, can occur. This results in distorted pulse heights or pulse lengths, or even paralysis of the detector, whereby the generated pulses no longer fall below the specified energy thresholds. Pile-up consequently leads to a distorted number of counted photon events and, in energy-resolved measurements, also to a distorted measured energy. At very high photon fluxes, it can even lead to a measurement signal that is unusable for X-ray imaging.

[0005] There are several measures that can be taken to counteract the pile-up effect. One simple approach is to reduce the pixel size and the associated reduction in the photon flux that can be processed by a single pixel element. However, this can have a negative impact, for example, on increased charge sharing, i.e., the distribution of an event across multiple adjacent pixel elements. Other options include implementing circuits that detect pile-up or at least allow an estimation of its effect on the measurement signals.

[0006] For example, the document DE 10 2008 048 306 B4 discloses a method for detecting X-ray radiation from an X-ray source, wherein at least one threshold energy is specified for a comparison of a signal generated in the X-ray detector as a function of the photon energy, which threshold energy is higher than the maximum energy of the X-ray spectrum emitted by the X-ray source, so that events influenced by pile-up can be detected.

[0007] Document DE 10 2009 018 995 B4 discloses a detector having a plurality of direct-converting detector elements, wherein generated signal pulses are fed, on the one hand, to a pulse height discriminator operating continuously with a predetermined energy threshold and, on the other hand, to a pulse height discriminator operating in a clocked manner with a predetermined energy threshold and a predetermined clock frequency, and are then detected in a combination logic, wherein the clocked pulse height discriminator is intended to prevent an excessive underestimation of the counting rate.

[0008] Document US 2019 / 001 209 75 discloses a circuit for counting photons, comprising a digital stage comprising at least one comparator for comparing generated pulse amplitudes with a threshold value, a differentiating circuit for determining periods in which the derivative of the pulse signal has a specific sign, and a logic gate for combining the outputs of the comparator and the differentiating circuit, wherein the pulses present are counted at the output of the combining element.

[0009] In document US 2016 / 0 077 148 A1, a circuit for determining pile-up is disclosed, wherein the circuit generates a difference signal based on a generated current signal which reflects the intensity of incoming radiation, and a logic pulse is generated based on the difference signal.

[0010] In document US 2018 / 0 252 821 A1 an X-ray detector is disclosed with pixel channels having subchannels with different pulse shaping filters.

[0011] Document US 2019 / 0 033 469 A1 discloses a method for processing a pulse generated by a detector for ionising radiation, wherein the length of a pulse generated by a preamplifier above a threshold value can be used as a criterion for the presence of pile-up.

[0012] The invention is based on the consideration that higher-quality imaging and more flexible use of an X-ray detector would be possible if the influence of pile-up on the information detected by the X-ray detector could be reduced even at high X-ray photon rates.

[0013] The object of the invention is therefore to provide an improved photon-counting X-ray detector in order to enable higher-quality imaging and more flexible use of the photon-counting X-ray detector.

[0014] This object is achieved by the features of the independent patent claims. Further advantageous and partly inventive embodiments and developments of the invention are set forth in the subclaims and the following description.

[0015] The invention relates to a photon-counting X-ray detector comprising a converter element designed to convert incoming X-radiation into electrical signals as a function of an energy deposition in the converter element, and an evaluation unit coupled thereto, comprising a pulse generation unit designed to generate and output an electrical pulse based on an electrical signal fed in by the converter element, a differentiator unit coupled to the pulse generation unit and designed to generate a differentiated signal of the electrical pulse output by the pulse generation unit, and a first comparator coupled to the differentiator unit and designed to compare the generated, differentiated signal with a first threshold value and to output a binary output signal based on the comparison for a duration during which the threshold value is exceeded.

[0016] The photon-counting X-ray detector used in the invention can also be referred to as a counting, direct-converting X-ray detector. Direct-converting X-ray detectors are usually implemented in a stacked structure in which an associated evaluation unit, for example in the form of an ASIC (Application Specific Integrated Circuit), is connected to the underside of a layer of converter material, i.e., to the converter element. An intermediate layer, an interposer, can optionally be arranged between the evaluation unit and the converter element; this interposer can serve to provide stability or redirect signal lines. The underside of the converter element usually has a plurality of electrodes in the form of metallized contact elements. The evaluation unit is contacted to these for signal transmission purposes, usually by soldering.Typically, each contact element on the converter side is matched by a pixel-shaped counter-contact element on the evaluation unit side. In a typical design, the evaluation unit provides pixel electronics for pixel-by-pixel processing of a signal received via the electrodes. Incoming X-ray radiation is converted into charge carriers in the converter material of the converter element depending on the locally deposited energy of an X-ray photon. Based on these charge carriers, a signal is generated and further processed in the pixel-by-pixel pixel electronics.A pixel element of a photon-counting X-ray detector can then be understood as consisting of a respective pixel-by-pixel pixel electronics of the evaluation unit and a detection volume in the converter element assigned to the pixel element, which is formed by the electric field between a respective converter-side electrode and a top electrode applied on the opposite side of the converter element.

[0017] Typically, each such pixel element of a photon-counting X-ray detector is assigned a pulse generation unit. This means that the evaluation unit typically comprises a plurality of pulse generation units. A pulse generation unit can, in particular, comprise a signal amplifier and a pulse shaper. The pulse generation unit serves to amplify the signal input to a pixel electronics unit via an electrode and to output an analog signal pulse, the pulse amplitude and / or pulse length of which depends on the charge carriers generated by the energy deposition of an incoming X-ray photon in the detection volume of the converter element assigned to the pulse generation unit in question.

[0018] According to the invention, the analog signal output by the pulse generation unit is then output to the differentiator unit and differentiated, so that the signal output by the differentiator unit represents a derivative of the signal output by the pulse generation unit. By means of the derivative, i.e. the differentiated signal, information about the signal curve, i.e., about rising or falling sections, of the signal output by the pulse generation unit can be provided. If, for example, pulses generated by the pulse generation unit superimpose themselves without the primary pulse generated by the pulse generation unit having decayed, any renewed signal increase that may occur can be detected by means of the differentiated signal.Based on the differentiated signal, information that is more independent of pile-up or an indication of pile-up occurrence can advantageously be derived and used to generate an X-ray image dataset. For example, the analysis of the differentiated signal can provide an improved indication of the actual number of incoming photons. The differentiator unit can be implemented in various ways. For example, it comprises a circuit that determines the sign of the slope of the signal output by the pulse generation unit in an analog manner.

[0019] According to the invention, the differentiated signal is further output to a first comparator, which is signal-coupled to the differentiator unit, by means of which the differentiated signal is compared with the first threshold value and, based on the comparison, a binary signal is output. The differentiated signal is subsequently digitized using the first threshold value for simple and, if necessary, direct further processing. Preferably, the first threshold value is applied in accordance with the electronic noise of the X-ray detector. This advantageously makes it possible to achieve robustness of the derived signal output by the differentiator unit against the presence of electronic noise. Preferably, the first threshold value is set just above the electronic noise value of the X-ray detector, so that the highest possible sensitivity is achieved when generating the binary signal while simultaneously suppressing noise.The duration of a respective output binary signal can in particular correspond to the respective duration of the first threshold value being exceeded by the differentiated signal.

[0020] In a photon-counting X-ray detector with a plurality of pixel elements, a pulse generation unit, a differentiator unit, and a first comparator can be assigned to each pixel element of the X-ray detector. Alternatively, it can also be provided that only one pixel element from a group of pixel elements, for example, only every second or third pixel element of the X-ray detector, is equipped with a differentiator unit, and determined information based on a differentiated signal, for example for correcting a counted number of incoming photons or adjusting setting parameters, is transmitted to the pixel elements of a group.

[0021] The binary signal based on the differentiated signal can advantageously be incorporated into an X-ray image dataset generated by the photon-counting X-ray detector according to the invention in order to obtain a high-quality X-ray image dataset or to obtain more reliable image information in extreme flow situations. In particular, this can be used, for example, to determine an improved estimate of the counted number of incoming X-ray photons in a respective pixel element of the photon-counting X-ray detector or to enable an improved count of the number itself.

[0022] For this purpose, the pulse generation unit can also be signal-coupled to at least one second comparator, designed to compare an electrical pulse generated by the pulse generation unit with a second threshold value. In particular, each pixel element of an X-ray detector can comprise at least one second comparator. Such a coupling of a comparator to the pulse generation unit is generally known within the scope of conventional signal processing in photon-counting X-ray detectors. To count the number of incoming photons, a second binary signal can then be output as a counting signal based on the comparison from the second comparator. This means that as soon as an analog electrical signal pulse generated by the pulse generation unit exceeds the second threshold value, a counting signal can be output by means of the second comparator.The counting signal can then be counted using a counter signal-coupled to the second comparator, for example, implemented as a rising-edge counter or falling-edge counter. The length of the output second binary signal can also correspond to the duration for which the generated analog electrical pulse exceeds the second threshold.

[0023] Likewise, a plurality of second comparators, each with an associated threshold value, can be provided, each coupled to the pulse generation unit. By appropriately adjusting the plurality of threshold values ​​of the second comparators and counting the generated pulses as a function of the threshold values, energy information about the incoming X-ray photons can be obtained in a plurality of energy channels defined by the energy thresholds.

[0024] In a preferred embodiment of the photon-counting X-ray detector, the evaluation unit has at least one such second comparator, which is coupled to the pulse generation unit and configured to compare an electrical pulse generated by the pulse generation unit with a second threshold value. The duration for which the generated electrical pulse exceeds the second threshold value essentially corresponds to the time period within which a subsequent incoming event is not detected as a separate event.

[0025] In addition, the photon-counting X-ray detector in this variant has a determination unit which is designed to determine a sequence of the first binary output signal, which is based on the differentiated signal, at least while an electrical pulse generated by the pulse generation unit is above the second threshold value of the second comparator.

[0026] The determined sequence of the binary first signal based on the differentiated signal can be used to detect pulse overlaps and thus determine an improved number of incoming photons or to correct a number of incoming photons that was counted based on a second binary signal. The sequence can include the temporal progression of the first binary signal over time. The sequence can also include, for example, the number of falling and / or rising edges of the first binary signal.

[0027] By analyzing the sequence of the first binary signal, it is possible to identify events that would not have been counted with a regular count based on the signal pulse directly output by the pulse generation unit and the associated second binary signal. By linking this to the exceedance of the second threshold signal pulse, data acquisition during a measurement sequence and subsequent analysis can be advantageously limited to those signals that are relevant for image generation based on the second threshold.

[0028] Outputting and storing the determined sequence while an electrical pulse generated by the pulse generation unit is above the second threshold can also advantageously allow for subsequent correction during post-processing of recorded count rates based on the electrical pulses generated by the pulse generation unit. However, a temporal link between the determined sequence and the recorded data should preferably be established, at least based on a readout period, to allow for optimal subsequent correction of recorded count rates.

[0029] Furthermore, the photon-counting X-ray detector according to the invention can have a first counting unit which is coupled to the first comparator and is designed to count a number of rising or falling edges of binary output signals output by the first comparator.

[0030] Such an implementation can, for example, be used advantageously to obtain a better measure of the photon flux already during or directly after an ongoing measurement, without subsequent evaluation of a sequence of the binary signal.

[0031] In some embodiments, a measure of a photon flux can also be determined without linking it to exceeding a second threshold in a second comparator, thus reducing the complexity of the circuit. This information can be advantageously used to select setting parameters for data acquisition with the X-ray detector during a measurement sequence or to appropriately select image generation parameters in a generation of an X-ray image dataset based on the measurement data. Since determination based on the differentiated signal is less influenced by pile-up effects, conclusions about improved settings can be drawn based on the counted number of rising or falling edges of the first binary output signal, even at very high photon fluxes.

[0032] In a further development thereof, the photon-counting X-ray detector has an adaptation unit designed to adapt the generation of the electrical pulses in the pulse generation unit based on the number of rising or falling edges counted by the first counting unit.

[0033] The adaptation unit can be provided so as to be individually controllable for each pixel element, i.e. for each pulse generation unit, and can enable pixel-specific control and adaptation of a respective pulse generation unit of a respective pixel element in order to ensure adaptation with the greatest possible spatial resolution based on the existing circumstances. The adaptation can then be based directly on the number of rising or falling edges of the first binary signal counted in a respective pixel element, provided that this is determined individually in each pixel element. The adaptation unit can also be provided for cross-pixel adaptation of the pulse generation units of a plurality of pixel elements, wherein the pulse generation units for the plurality of pixel elements are adapted jointly based on the counted number of rising or falling edges of the first binary signal in at least one pixel element of the plurality of pixel elements.This can enable a simplified implementation of the circuits.

[0034] For example, the transfer function of the pulse generation unit can be adapted during a measurement sequence to a current photon flux or to a future expected photon flux. For example, a decay time, rise time, or amplification of an electrical signal pulse generated by the pulse generation unit can be adjusted. Shortening a generated electrical pulse can, for example, lead to a reduced occurrence of pulse overlaps and thus reduced pile-up. At the same time, however, this can negatively amplify the electronic noise of the X-ray detector or degrade the energy resolution.Adapting the pulse generation in the pulse generation unit as a function of the photon flux allows for optimal pulse generation settings for both low and high photon fluxes, thus always obtaining the highest possible image information under the respective conditions. It would be advantageous if the first binary signal based on the differentiated signal were less affected by pileup than the output signal of the pulse generation unit or the second comparator coupled to it, and thus exhibited better linearity behavior compared to the latter, even at very high photon fluxes. This advantageously enables improved adjustability.

[0035] However, it should be noted that adjusting the pulse generation unit usually also requires adjusting other settings of the X-ray detector and its circuitry. For example, adjusting the pulse generation unit may also require adjusting the first or second threshold of the first or second comparator. Likewise, changes in electronic noise may need to be taken into account.

[0036] However, this can advantageously ensure improved linearity of the X-ray detector even at high fluxes. This can directly and instantly improve the acquired data during an ongoing measurement, thus resulting in a higher-quality X-ray image dataset.

[0037] Furthermore, the pulse generation unit can have a first pulse generation channel and a second pulse generation channel, as well as a switching element configured to switch at least between the first pulse generation channel and the second pulse generation channel for generating the electrical pulses. The adaptation unit can then be configured to switch the switching element based on the number of rising or falling edges counted by the first counting unit.

[0038] The second pulse generation channel can have a shorter signal shaping time than the first pulse generation channel, resulting in shorter signal pulses with the same deposited energy and thus better distinguishability between closely spaced photon events. Longer signal shaping times, on the other hand, generally result in reduced electronic noise and thus improved energy resolution with respect to the photon energy to be determined.

[0039] The first pulse generation channel and the second pulse generation channel can, for example, be set differently from one another using setting parameters before use of the X-ray detector, or they can be permanently implemented in different ways in the evaluation unit. During use of the photon-counting X-ray detector, switching is then simply carried out between the preset or fixed pulse generation channels. For example, a threshold value can be defined based on the number of rising or falling edges counted by the first counting unit. If the threshold value is exceeded or undershot, switching is performed from the first to the second pulse generation channel, or vice versa. More than two pulse generation channels can also be provided.

[0040] This variant can advantageously correspond to a simple and easily controllable implementation of an adjustment of the pulse generation unit based on the counted number. The restriction to a limited number of pulse generation channels and an adjustment in the form of switching between the pulse generation channels also advantageously involves a limitation regarding the effort required to collect and the scope of the setting and calibration data required for the use of the X-ray detector.

[0041] According to the invention, the evaluation unit is designed to determine the duration of a respective output binary output signal of the first comparator.

[0042] The duration of an output binary signal can be implemented, for example, in the form of a so-called "time-over-threshold" measurement, as is widely known in the field of photon-counting X-ray detectors. The duration of the threshold value of a comparator being exceeded is determined by comparing the output binary signal with an external clock signal and in units of the clock signal's beats.

[0043] The inventors have recognized that determining the duration of a binary output signal from the first comparator, i.e., based on the differentiated signal, can also be advantageously used to input image data generation. The determined durations correlate with the energy of the incoming photons and, particularly in high-flux situations, can provide information that is less influenced by pile-up effects than the evaluation of the primary signal from the pulse generation unit.

[0044] According to the invention, the X-ray detector is also designed to determine an integral over the durations or an average of the durations of several successive binary output signals within a time interval.

[0045] The inventors have recognized that this value can exhibit a high correlation with the energy flux of the X-ray field and, particularly in the high-flux case, can provide information similar to a conventional energy-integrating detector, which can be used accordingly to generate an X-ray image dataset. The time interval preferably essentially corresponds to a respective readout time window of the X-ray detector. It is then conceivable that this information, particularly in the high-flux case, can at least be incorporated into the image generation process in order to obtain more reliable image information even under extreme imaging conditions.

[0046] The invention also relates to a medical imaging device comprising a photon-counting X-ray detector according to one of the previously described embodiments and, in contrast thereto, comprising an X-ray source for exposing the X-ray detector to X-ray radiation.

[0047] The features and advantages of the photon-counting X-ray detector can be directly transferred to the medical imaging device.

[0048] To record the X-ray image data set, the object to be imaged can then be placed between the X-ray source and the X-ray detector and irradiated by the X-ray source.

[0049] Typically, the medical imaging device comprises at least one photon-counting X-ray detector according to the invention and, in opposition thereto, at least one X-ray source, for example, an X-ray tube. However, the imaging device can also comprise several X-ray detectors according to the invention.

[0050] In particular, the medical imaging device can be configured as a computed tomography system. However, it can also be configured, for example, as a C-arm X-ray device and / or Dyna-CT or in another way.

[0051] The invention also relates to a method for generating an X-ray image data set by means of a photon-counting X-ray detector having a converter element which is designed to convert incoming X-ray radiation into electrical signals as a function of an energy deposition in the converter element, and an evaluation unit coupled thereto for processing the electrical signals, wherein the X-ray image data set is generated based on the processed electrical signals, and during processing, electrical pulses are generated by means of a pulse generation unit based on electrical signals fed in by the converter element, a differentiated signal of a respective pulse generated by the pulse generation unit is generated by means of a differentiator unit coupled thereto, the differentiated signal is calculated by means of a first comparator which is coupled to the differentiator unit,is compared with a first threshold value and, based on the comparison, a binary output signal is output for a duration during which the threshold value is exceeded, wherein the binary output signal of the first comparator is used to generate the X-ray image data set.

[0052] The input can comprise a correction or adjustment of counted numbers of signal pulses generated by the pulse generation unit by means of at least one second comparator, wherein the image values ​​comprised in the generated X-ray image data set are then based on the adjusted numbers. The input can also comprise initiating an adjustment of setting parameters of the X-ray detector based on the first binary signal, which leads to improved acquisition of the measurement data used for image generation. The input can also comprise that the image generation is based solely on the first binary signal or information derived therefrom. This means that in this case the image values ​​comprised in the generated X-ray image data set can also be based exclusively on the first binary signal.

[0053] The previously described advantages of the X-ray detector according to the invention can also be readily transferred to the method for generating an X-ray image data set by means of a photon-counting X-ray detector and, in a corresponding manner, to the variants described below.

[0054] According to the invention, the evaluation unit is designed to determine the duration of each binary output signal output by the first comparator. According to the invention, an integral or an average of the durations of several consecutive binary output signals of the first comparator is determined by means of a determination unit, and the X-ray image data set is generated based on the integral or average.

[0055] In a further embodiment of the method for generating an X-ray image data set, a number of rising or falling edges of binary output signals output by the first comparator is counted by means of a counting unit coupled to the first comparator, and the generation of the electrical pulses in the pulse generation unit is adjusted by means of an adjustment unit based on the counted number of rising or falling edges.

[0056] Furthermore, a variant of the method for generating an X-ray image data set can comprise that, by means of a second comparator coupled to the pulse generation unit, an electrical pulse generated by the pulse generation unit is compared with a second threshold value and, based thereon, a second binary output signal is output; by means of a second counting unit coupled to the second comparator, a number of rising or falling edges of output second binary output signals is counted; by means of a determination unit, a sequence of the first binary output signal is determined at least while an electrical pulse generated by the pulse generation unit is above the second threshold value of the second comparator; and that, for the generation of the X-ray image data set, the counted number of generated electrical pulses is adapted based on the determined sequence.

[0057] Within the scope of the invention, in particular features that are described with reference to different embodiments of the invention and / or different claim categories (method, use, device, system, arrangement, etc.) can be combined to form further embodiments of the invention. For example, a claim relating to a device can also be developed with features that are described or claimed in connection with a method, and vice versa. Functional features of a method can be implemented by appropriately designed physical components. In addition to the embodiments of the invention expressly described in this application, a wide variety of further embodiments of the invention are conceivable, which the person skilled in the art can arrive at without departing from the scope of the invention, which is defined by the claims.

[0058] The use of the indefinite articles "ein" or "eine" does not preclude the feature in question from being present multiple times. The use of the expression "aufeinander haben" does not preclude the concepts linked by the expression "aufeinander" from being identical. For example, the medical imaging device comprises the medical imaging device. The use of the expression "einheit" does not preclude the object to which the expression "einheit" refers from having multiple components that are spatially separated from one another.

[0059] In the context of the present application, the expression "based on" can be understood in particular in the sense of the expression "using." In particular, a formulation according to which a first feature is generated (alternatively: determined, determined, etc.) based on a second feature does not exclude the possibility that the first feature can be generated (alternatively: determined, determined, etc.) based on a third feature.

[0060] The invention is explained below using exemplary embodiments with reference to the accompanying figures. The representation in the figures is schematic, highly simplified, and not necessarily to scale. They show: Fig. 1 is a schematic representation of a medical imaging device with a photon-counting X-ray detector, Fig. 2 to 4 an illustration in the form of diagrams of resulting signal sequences in response to X-ray radiation incident on a photon-counting X-ray detector, Fig. 5 a schematic representation of a signal processing chain in a first variant using a photon-counting X-ray detector, Fig. 6 a schematic representation of a signal processing chain in a second variant using a photon-counting X-ray detector, Fig. 7 a schematic representation of a signal processing chain in a third variant using a photon-counting X-ray detector, Fig. 8 a schematic representation of a method sequence for generating an X-ray image data set by means of a photon-counting X-ray detector according to a first variant, Fig. 9 a schematic representation of a method sequence for generating an X-ray image data set by means of a photon-counting X-ray detector according to a second variant, Fig. 10 a schematic representation of a method sequence for generating an X-ray image data set by means of a photon-counting X-ray detector according to a third variant, and Fig. 11 a schematic representation of a medical imaging device in the form of a computed tomography device.

[0061] For clarity, only those elements useful for understanding the described embodiments are shown below. In particular, the formation of a photon-counting X-ray detector system using one or more circuits for counting incoming photons is not shown in detail, as the described embodiments are compatible with the current design of such systems. The structure and formation of circuits upstream of the counting circuit, as well as the formation of X-ray detectors from semiconductor material, are also not described in detail, and the described embodiments are substantially compatible with conventional implementations of such detectors and circuits.

[0062] Fig. Figure 1 is a highly simplified representation of an imaging device 32 based on ionizing radiation R.

[0063] Such a medical imaging device 32 generally consists of a radiation source 37, often an X-ray tube, for emitting ionizing radiation R, in particular X-rays. A photon-counting X-ray detector comprising a converter element 4 and an evaluation unit 2 is arranged opposite the radiation source 37. An object 39 to be examined is arranged between the radiation source 37 and the X-ray detector, so that the radiation R emitted by the radiation source 37 radiates through the object 39 and is attenuated by it depending on the nature of the object 39 before reaching the X-ray detector.

[0064] The photon-counting X-ray detector can have a plurality of pixel elements P, in particular for spatially resolved measurement of the incoming X-ray radiation. A pixel element P can be assigned a detection volume in the converter element 4 and, as a rule, pixel-by-pixel assignable pixel electronics for pixel-by-pixel processing of the signals fed in by the converter element 4 in the evaluation unit 2.

[0065] The signals processed by the evaluation unit 2 are usually further processed into an X-ray image dataset by a computing unit 45. The computing unit 45 may contain user interface devices (e.g., one or more display units in the form of screens, one or more input / output devices in the form of a keyboard, mouse, or other type), memory elements, or the like.

[0066] The converter element 4 comprises a converter material suitable for converting incoming X-ray radiation into electrical signals depending on the energy deposited in the converter element 4. The converter element 4 comprises, in particular, a direct-converting semiconductor material, for example, CdTe, CZT, HgI2, GaAs, or others.

[0067] Typically, each pixel element P is assigned a pulse generation unit 6, designed to generate and output an electrical pulse S in response to the energy deposited by an X-ray photon in the converter element 4 and thus based on an electrical signal fed in by the converter element 4.

[0068] According to the invention, the evaluation unit 2 also has a differentiator unit 10, coupled to the pulse generation unit 6 and designed to generate a differentiated signal dS of the electrical pulse S output by the pulse generation unit 6. Furthermore, the differentiator unit 10 is signal-technically coupled to a first comparator 8, which is designed to compare the generated, differentiated signal dS with a first threshold value TH1 and, based on the comparison, to output a binary output signal K1 for a duration during which the threshold value TH1 is exceeded.

[0069] The Fig. Figures 2 to 4 illustrate the signals generated in the photon-counting X-ray detector over time t. Fig. Figure 2 illustrates the signal S output by a pulse generation unit 6 as signal pulses in response to incoming X-ray photons. The bars depicted here represent individual photon events, with the height of the bars correlating with the energy of the incoming photons and thus the energy deposition in the converter element 4. The scaling of the signals and bars is chosen specifically for illustrative purposes.

[0070] At a high photon flux, photon events arriving in close succession can lead to superposition of the signal pulses S generated by the pulse generation unit 6, as shown in Fig. 2. Usually, the number of incoming photons is counted in a photon-counting X-ray detector by comparing the generated electrical signal pulses S with a threshold value TH2 by means of a comparator 81. If the threshold value TH2 is exceeded, a counting signal in the form of a binary signal K2 is generated (see illustration of the output signal K of a comparator 81, 8 in Fig. 4). This can be counted by means of a subsequent counting element 144, for example, designed as a rising-edge counter or falling-edge counter, and can be temporarily stored until the counter reading is read out during a respective readout of the X-ray detector. The vertical dashed lines in Fig. 2 each mark the time of the threshold crossing of the threshold TH2 by the generated signal pulses S. These are shown in the Fig. 3 and Fig. 4. The length of a binary signal K2 in Fig. 4 corresponds to the duration during which the signal pulse S is above the threshold TH2. If multiple comparators 81 with multiple, differently adjustable threshold TH2 values ​​are provided for comparing the generated signals S, energy information can also be obtained. Measuring the duration of the threshold overshoot can also provide conclusions about energy information.

[0071] However, if a primary signal pulse S does not fall below the threshold TH2 before a subsequent signal pulse S, it is not possible to distinguish between the signal pulses S of consecutive photon events. In the case of high flux, this leads to a falsification of the counted number and can even lead to complete paralysis of the detector.

[0072] Fig. 3 shows the differentiated signal dS of Fig. 2, as can be output by a differentiator unit 10 according to the invention and which corresponds to the derivative of the signal S and thus reflects the gradient of the signal S over time t. According to the invention, this is compared with a threshold value TH1 by means of a comparator 8 coupled to the differentiator unit 10 and, based on the comparison, a binary signal K1 (see also Fig. 4) issued.

[0073] The binary comparator output signal K1 based on the differentiated signal is in a high state as long as the differentiator signal is above the threshold TH1. By analyzing the differentiated signal dS, changes in the slope of the signal pulse S generated by the pulse generation unit 6 can be detected. If, for example, a superposition causes the signal pulse to rise again, this can be detected using the differentiated signal dS and the comparator output signal K1 based thereon, even if the generated signal pulse S has not fallen below the threshold TH2 again.

[0074] Not all superpositions can be detected in this way, but the differentiated signal dS can provide information which, in contrast to the signal S, is more independent of superposition effects up to higher photon fluxes, ie, it has an improved linearity behavior up to higher photon fluxes. In the case shown, this would, for example, affect at least the sixth photon event from the left in Fig. 2, which is converted into a binary signal K1 based on the differentiated signal in Fig. 4 is implemented, but cannot be detected as a separate event by means of the binary signal K2 (only based on the output signal S of the pulse generation unit 6).

[0075] The selection of the logic state in Fig. 4 after the high state (logical state 1) or low state (logical state 0) is chosen arbitrarily and essentially corresponds to a conventional implementation.

[0076] Fig. Figure 5 shows a variant embodiment of a processing chain provided by a photon-counting X-ray detector based on the essential processing units. Such a processing chain can be provided, in particular, for each pixel element of an X-ray detector or at least for a selection of pixel elements from a plurality of pixel elements of the photon-counting X-ray detector.

[0077] The evaluation unit 2 of the photon-counting X-ray detector here has the pulse generation unit 6, which is designed to output a signal pulse S based on the electrical signal fed in by the converter element 4. The pulse generation unit 6 can have an amplifier 5 for amplifying the fed-in electrical signal and a pulse shaper 7 for pulse shaping the amplified fed-in signal, so that an analog electrical signal pulse S can be output at the output of the pulse generation unit 6, which correlates with the energy deposited in the converter element 4.

[0078] The generated signal pulse S is output to the differentiator unit 10, which provides a differentiated signal dS, which is output to the first comparator 8. The comparator 8 is designed to compare the differentiated signal dS with a set first threshold value TH1 and to output a first binary signal K1.

[0079] In addition, in this exemplary embodiment, the evaluation unit 2 has a second comparator 81 which is coupled to the pulse generation unit 6 and is designed to compare the electrical signal pulse S generated by the pulse generation unit 6 with a second threshold value TH2 and, based thereon, to output a second binary signal K2 for the duration of the threshold being exceeded.

[0080] Based on the second binary signal K2, a number of signal pulses S which exceed the second threshold value TH2 can be determined, for example by means of a counting unit 144 in the sense of a conventional counting X-ray detector.

[0081] In addition, the photon-counting X-ray detector in the variant shown has a determination unit 12 which is designed to determine a sequence of the binary output signal K1 of the differentiator unit 10 at least while an electrical pulse S generated by the pulse generation unit 6 is above the second threshold value TH2 of the second comparator 8.

[0082] The sequence can represent the course of the high or low state as in Fig. 4 illustrates the sequence over time. The sequence can, for example, include a number of rising and falling edges of the first binary signal K1.

[0083] By determining the sequence during the signal exceedance of the second threshold TH2, a restriction can be made to those signals S which exceed the threshold TH2 and are therefore to be detected as a counting signal, whereas signals which do not exceed the threshold TH2 are masked out.

[0084] By analyzing the sequence of the first binary signal, it is possible to determine events that were not counted by a regular count based on the signal pulse directly output by the pulse generation unit and the associated second binary signal.

[0085] Outputting and storing the determined sequence by means of a storage unit can also advantageously allow subsequent correction as part of post-processing of recorded counting rates based on the electrical pulses generated by the pulse generation unit.

[0086] Fig. Figure 6 shows a further embodiment of a processing chain provided by a photon-counting X-ray detector based on the essential processing units. The photon-counting X-ray detector also has a counting unit 14, which is coupled to the first comparator 8 and is configured to count a number of rising or falling edges of binary output signals K1 output by the first comparator 8.

[0087] In the exemplary embodiment shown, the photon-counting X-ray detector also has an adaptation unit 24 configured to adapt the generation of the electrical pulses S in the pulse generation unit 6 based on the number of rising or falling edges counted by the first counting unit 14. In this way, the pulse generation can be adapted depending on the incoming photon flux. For example, one or more threshold numbers of counted rising or falling edges can be stored, with exceeding or falling below this threshold triggering an adaptation of the pulse generation unit 6 by means of the adaptation unit 24.

[0088] The Fig. The example shown in Figure 6 represents a preferred development of a general adaptation unit 24. The pulse generation unit has a first pulse generation channel 71 in the form of a first pulse shaper 71 and a second pulse generation channel 72 in the form of a second pulse shaper 72 and a switching element 26. The switching element is designed to switch the generation of the electrical pulses S at least between the first pulse generation channel 71 and the second pulse generation channel 72. The adaptation unit 24 is designed to switch the switching element 26 based on the number of rising or falling edges counted by the first counting unit 14 and thus achieve an adaptation of the pulse generation unit.

[0089] The second pulse shaper 72 can have a shorter signal shaping time than the first pulse shaper 71 and thus generate shorter signal pulses S. A shortening of the signal pulse durations can contribute to an improved high-flux behavior of the X-ray detector and thus an improved number of incoming photons counted by a counting unit 144, although a deterioration of the electronic noise and possibly an energy resolution is accepted.

[0090] Fig. 7 shows a schematic representation of a design variant of the photon-counting X-ray detector according to the invention, wherein the evaluation unit 2 is also designed to determine the duration of an output binary output signal K1 of the first comparator 8.

[0091] In the case shown, the evaluation unit 2 has a pulse duration determination unit 31. For example, the pulse duration determination unit 31 can be designed as for a time-over-threshold method widely known in the field of photon-counting X-ray detectors, wherein a pulsed reference signal CLK is input at a fixed frequency and the number of pulses of the reference signal CLK is counted which overlap with the binary signal K1 output by the comparator 8, for example in the high state, whereby a duration of the binary signal K1 can be determined.

[0092] Furthermore, the X-ray detector is also equipped with a determination unit 34, which is designed to determine an integral over the durations or an average of the durations of several consecutive binary output signals K1 within a time interval. The time interval can, in particular, correspond to a readout time window of the X-ray detector.

[0093] In Fig. Figure 8 shows a schematic process flow in which the determined durations can be incorporated in an exemplary embodiment of the method for generating an X-ray image data set using the photon-counting X-ray detector described above. Each pixel element of the X-ray detector can Fig. 7 described processing chain.

[0094] In the method sequence shown, in a step T1, electrical pulses S are generated by means of a pulse generation unit 6 based on electrical signals fed in by the converter element 4.

[0095] In a first processing path, the generated electrical pulses S are compared with a threshold value TH2 in a step T7 by means of a comparator 81 coupled to the pulse generation unit 6. Based on this, a binary output signal K2 is output as a counting signal, which is counted in a step T8 by means of a counting unit 144. This can be based, in particular, on counting a number of rising or falling edges of the binary output signal. The counted number of counting signals in the pixel elements of the X-ray detector can then be processed in a processing step T11 to generate the X-ray image data set. This first processing path essentially corresponds to a conventional processing of the signals generated by a photon-counting X-ray detector, as is known in the art.Here, a plurality of comparators 81 with a plurality of differently adjustable threshold values ​​TH2 for energy-resolved measurements can also be provided, so that in the processing step T11 for generating the X-ray image data set, energy-resolved measurement data can be used.

[0096] In a second processing path, in a step T2, a differentiated signal dS of the pulses S generated by the pulse generation unit 6 is generated by means of a differentiator unit 10 coupled thereto. In a step T3, the differentiated signal dS is compared with a threshold value TH1 by means of a comparator 8 coupled to the differentiator unit 10, and based on the comparison, a binary output signal K1 is output for a duration during which the threshold value is exceeded.

[0097] Furthermore, in the present example, in a step T4, an integral or an average value of the durations of several successive binary output signals K1 of the first comparator 8 is determined by means of the determination unit 34 and then, in the processing step T11, the X-ray image data set is generated based on the integral or average value.

[0098] For example, the first processing path is part of the standard processing. However, at very high fluxes, where the standard processing path no longer provides reliable image data due to strong pile-up effects, the second processing path or the resulting measurement data can be used. Image data can be generated based on an integral or an average of the durations in the pixel elements based on the differentiated signal. The inventors have recognized that this value can exhibit a high correlation with the energy flux of the X-ray field and, particularly in the high flux case, can provide information similar to a conventional energy-integrating detector.This can be used advantageously, in particular, when conventional processing based directly on the signals S generated by the pulse generation unit 6 no longer guarantees reliable image information, or only to a limited extent. Measurement data can be collected via both paths during a measurement sequence, and a decision regarding the use of the measurement data can only be made subsequently after a measurement sequence. Likewise, switching between the processing paths can also be provided during a measurement sequence, for example, based on a threshold value stored in the X-ray detector regarding a counted number of pulses per unit of time.

[0099] Combined processing into an X-ray image dataset is also conceivable, using both a conventional counting signal based on the pulses S generated by the pulse generation unit 6 and the processing of the differentiated signal dS. For example, as a boundary condition in an iterative image reconstruction process or as an input parameter of a machine learning system trained for image reconstruction, such as a neural network.

[0100] In Fig. 9 shows a further exemplary embodiment of a method for generating an X-ray image data set, which comprises an adaptation of the pulse generation unit 6 of the photon-counting X-ray detector. The X-ray detector used for this purpose can, for example, be as Fig. 6, each pixel element of the X-ray detector may have an adaptation unit 24 which can switch between switchable pulse generation channels 71, 72.

[0101] The method comprises, after a step T3, wherein the differentiated signal dS is compared with a threshold value TH1 by means of a comparator 8 which is coupled to the differentiator unit 10, and a binary output signal K1 is output based on the comparison for a duration in which the threshold value TH1 is exceeded, furthermore the step T5, wherein a number of rising or falling edges of binary output signals K1 output by the first comparator K1 are counted by means of a counting unit 14 coupled to the first comparator 8, and the step T6, wherein the generation of the electrical pulses in the pulse generation unit 6 is adapted by means of the adaptation unit 24 based on the counted number of rising or falling edges.

[0102] The adjusted signal pulses S generated by the pulse generation unit 6 can then be compared with a second threshold value in a step T7 and counted in a step T8, to be subsequently processed in a processing step T11 to generate the X-ray image dataset. This means that an X-ray image dataset can be generated based on the adjusted signal pulses S. In this way, the X-ray detector can be adapted to the currently prevailing conditions regarding a photon flux.

[0103] In Fig. 10 shows a further exemplary embodiment of a method for generating an X-ray image data set, wherein a sequence of the first binary output signal K1 is determined. The photon-counting X-ray detector used for this purpose can, for example, be Fig. 5 described have an investigation unit 12.

[0104] In this variant, in a step T9, a sequence of the first binary output signal K1 is determined by means of the determination unit 12, at least while an electrical pulse S generated by the pulse generation unit 6 is above the second threshold value TH2 of the second comparator 81, and in a step T10, the number of generated electrical pulses S counted in step T8 by means of a counting unit 144 is adjusted, in particular corrected. This can be done, for example, by comparing the number counted based on the second binary signal K2 and the number of high states of the first binary signal K1 using the determined sequence. Based on the adjusted number, an x-ray image dataset can then be generated. The adjusted number can, for example, be processed in the further method in a step T11 for generating the x-ray image dataset.

[0105] The variants described can in particular also be combined with several second comparators and second threshold values ​​TH2.

[0106] In the latter variant, for example, a sequence of the first binary signal can be determined individually as a function of every second threshold TH2, and a direct adjustment of the counted numbers as a function of the second thresholds TH2 can be performed. Alternatively, only one sequence can be determined as a function of a lowest-energy threshold TH2, and based on this, an estimated correction factor can be determined for the counted numbers of the further, higher-energy thresholds TH2. The estimation can be based, for example, on preliminary experimental studies and the functional dependencies determined from them.

[0107] Fig.11 shows an exemplary embodiment of a medical imaging device 32 with a detection unit 36 ​​comprising at least one photon-counting X-ray detector according to the invention and an X-ray source 37 in opposition to the detection unit 36. The X-ray source is designed to expose the detection unit 36, and thus the X-ray detector, with X-ray radiation along an X-ray incidence direction. The medical imaging device 32 shown is designed in particular as a computed tomography system. The computed tomography system includes a gantry 33 with a rotor 35. The rotor 35 comprises the X-ray source 37 and the detection unit 36. The rotor 35 is rotatable about the rotation axis 43. The examination object 39, here a patient, is mounted on a patient couch 41 and can be moved along the rotation axis 43 by the gantry 33.A computing unit 45 can be used to control the computed tomography system and to further process the measurement data read by the detection unit 36 ​​to generate an X-ray image dataset depicting the object 39. An input device 47 and an output device 49 are connected to the computing unit 45, which enables a user to interact with the medical imaging device and to display a generated X-ray image dataset.

Claims

[1] Photon-counting X-ray detector comprising a converter element (4) designed to convert incoming X-ray radiation (R) into electrical signals as a function of an energy deposition in the converter element (4), and an evaluation unit (2) coupled thereto, comprising - a pulse generation unit (6) configured to generate and output an electrical pulse (S) based on an electrical signal fed in by the converter element (4), - a differentiator unit (10) coupled to the pulse generating unit (6) and designed to generate a differentiated signal (dS) of the electrical pulse (S) output by the pulse generating unit (6), and - a first comparator (8), coupled to the differentiator unit (10) and designed to compare the generated, differentiated signal (dS) with a first threshold value (TH1) and, based on the comparison, to output a binary output signal (K1) for a duration during which the threshold value (TH1) is exceeded, wherein the evaluation unit (2) is also designed to determine the duration of an output binary output signal (K1) of the first comparator (8) and the X-ray detector is designed to determine an integral over the durations or an average value of the durations of several successive binary output signals (K1) within a time interval. [2] Photon-counting X-ray detector according to claim 1, wherein the evaluation unit (2) further comprises a second comparator (81), coupled to the pulse generation unit (6) and designed to compare an electrical pulse (S) generated by the pulse generation unit (6) with a second threshold value (TH2), and wherein the photon-counting X-ray detector further comprises a determination unit (12), designed to determine a sequence of the binary output signal (K1) of the first comparator (8) at least while an electrical pulse (S) generated by the pulse generation unit (6) is above the second threshold value (TH2) of the second comparator (81). [3] Photon-counting X-ray detector according to one of the preceding claims, further comprising a first counting unit (14) coupled to the first comparator (8) and configured to count a number of rising or falling edges of binary output signals (K1) output by the first comparator (8). [4] Photon-counting X-ray detector according to claim 3, further comprising an adaptation unit (24) configured to adapt the generation of the electrical pulses (S) in the pulse generation unit (6) based on the counted number of rising or falling edges. [5] Photon-counting X-ray detector according to claim 4, wherein the pulse generation unit (6) has a first pulse generation channel (71) and a second pulse generation channel (72) and a switching element (26) which is designed to switch the generation of the electrical pulses (S) at least between the first pulse generation channel (71) and the second pulse generation channel (72), and wherein the adaptation unit (24) is designed to switch the switching element (26) based on the counted number of rising or falling edges. [6] Medical imaging device (32), in particular a computed tomography device, comprising a photon-counting X-ray detector according to one of the preceding claims and, in opposition thereto, comprising an X-ray source (37) for exposing the X-ray detector with X-radiation (R). [7] Method for generating an X-ray image data set by means of a photon-counting X-ray detector comprising a converter element (4) designed to convert incoming X-ray radiation (R) into electrical signals as a function of an energy deposition in the converter element (4), and an evaluation unit (2) coupled thereto for processing the electrical signals, wherein the X-ray image data set is generated based on the processed electrical signals, and during processing - electrical pulses (S) are generated by means of a pulse generation unit (6) based on electrical signals fed in by the converter element (4) (T1), - a differentiated signal (dS) of a respective pulse (S) generated by the pulse generation unit (6) is generated by means of a differentiator unit (10) coupled thereto (T2), - the differentiated signal (dS) is compared with a first threshold value (TH1) by means of a first comparator (8) which is coupled to the differentiator unit (10), and based on the comparison, a binary output signal (K1) is output for a duration during which the threshold value is exceeded (T3), wherein the binary output signal (K1) of the first comparator (8) is included in the generation of the X-ray image data set, and wherein the evaluation unit (2) is also designed to determine the duration of a respective output binary output signal (K1) of the first comparator (8), and an integral or an average value of the durations of several successive binary output signals (K1) of the first comparator (8) is determined by means of a determination unit (34) (T4). [8] A method for generating an X-ray image data set according to the preceding claim 7, wherein - a number of rising or falling edges of binary output signals (K1) output by the first comparator (8) is counted (T5) by means of a counting unit (14) coupled to the first comparator (8), and - the generation of the electrical pulses (S) in the pulse generation unit (6) is adapted by means of an adaptation unit (24) based on the counted number of rising or falling edges (T6). [9] Method for generating an X-ray image data set according to one of the preceding claims 7 or 8, wherein - by means of a second comparator (81) coupled to the pulse generation unit (6), an electrical pulse (S) generated by the pulse generation unit (6) is compared with a second threshold value (TH2) and, based thereon, a second binary output signal (K2) is output (T7), - by means of a second counting unit (144) coupled to the second comparator (81), a number of second binary output signals (K2) output on rising or falling edges are counted (T8), - by means of a determination unit (12), a sequence of the first binary output signal (K1) is determined (T9) at least while an electrical pulse (S) generated by the pulse generation unit (6) is above the second threshold value (TH2) of the second comparator (81), and - for the generation of the X-ray image data set, the counted number of generated electrical pulses (S) is adjusted based on the determined sequence (T10).

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