Arrangement and method for determining a characteristic of a plurality of antennas

Abstract

An arrangement for determining a characteristic of a plurality of antennas, the arrangement comprising: a plurality of field probes, each field probe having a transmitter for sending information about an amplitude of an electric field existing at the respective field probe; a test antenna; a reference antenna with a predetermined radiation pattern; at least one signal source connected to the test antenna and the reference antenna and configured to supply mutually coherent signals to the test antenna and the reference antenna; a device for determining phase information of the electric field existing at the respective field probe by means of interference of a first signal emitted by the test antenna with a second signal emitted by the reference antenna having the same frequency as the first signal;and a phase shifter designed to shift the phase of the emitted second signal, thereby changing the interference pattern.

Description

[0001] The invention relates to an arrangement and a method for determining a characteristic of a plurality of antennas.

[0002] To characterize antennas, especially group antennas (also known as phased-array antennas), a measurement of the directional characteristic and the determination of the antenna gain are usually carried out.

[0003] Antennas are typically characterized using mechanical antenna scanners. However, scanning the radiation pattern of an antenna with a mechanical antenna scanner is very slow. Furthermore, this process must be repeated for each orientation, especially with electrically steerable antennas.

[0004] US 2018 / 0262279 A1 describes a system for calibrating an antenna array, which includes a parameter setting unit that adjusts the input signal of a first antenna using operating parameters. A signal generator produces a measurement signal that is supplied to the parameter setting unit and a second antenna. A measurement antenna receives a combined signal from both antennas, while a power meter measures its power.

[0005] EP 3945325 A1 describes a field probe for performing antenna measurements, which uses three or four antennas to detect RF waves. The waves are added and subtracted in pairs to determine amplitude and phase patterns, enabling a passive measurement of the electromagnetic emissions of a device under test.

[0006] Various implementation examples provide a faster determination of the characteristics of a large number of antennas.

[0007] Exemplary embodiments of the invention are shown in the figures and are explained in more detail below.

[0008] They show Fig. 1. An arrangement for determining a characteristic of a plurality of antennas according to various aspects of this revelation; Fig. 2 an exemplary setup of a field probe of the arrangement for determining a characteristic of a multitude of antennas Fig. 1; Fig. 3 a method for determining a characteristic of a plurality of antennas according to various aspects of this revelation; and Fig. 4 a method for determining a characteristic of a plurality of antennas according to various aspects of this revelation.

[0009] The following detailed description refers to the accompanying drawings, which form part thereof and illustrate specific embodiments in which the invention can be implemented. In this context, directional terminology such as "top," "bottom," "front," "back," "anterior," "rear," etc., is used with reference to the orientation of the described figure(s). Since components of embodiments can be positioned in a number of different orientations, the directional terminology serves only for illustration and is in no way limiting. It is understood that other embodiments may be used and structural or logical modifications may be made without deviating from the scope of protection of the present invention.It is understood that the features of the various exemplary embodiments described herein can be combined with one another, unless specifically stated otherwise. The following detailed description is therefore not to be interpreted in a limiting sense, and the scope of protection of the present invention is defined by the appended claims.

[0010] Within the scope of this description, the terms "connected," "attached," and "coupled" are used to describe both direct and indirect connections, direct or indirect links, and direct or indirect couplings. In the figures, identical or similar elements are labeled with identical reference symbols where appropriate.

[0011] For the purposes of this description, a processor is understood to mean any type of logic, for example one or more programmable processors (e.g., one or more processors with a complex instruction set (CISC) or one or more processors with a reduced instruction set (RISC) or one or more hard-wired logic devices, such as application-specific integrated circuits (ASICs).

[0012] Several implementations achieve a significant acceleration of measurements for determining the characteristics of a large number of antennas compared to conventional methods. Furthermore, the measurement system, i.e., the arrangement for determining the characteristics of a large number of antennas, is more cost-effective than a conventional arrangement.

[0013] Fig. Figure 1 shows an arrangement 100 for determining a characteristic of a multitude of antennas according to various aspects of this revelation.

[0014] The arrangement 100 comprises various components that are partially or completely (optionally) arranged in an absorber chamber 102. The absorber chamber 102 can have a lower cutoff frequency of, for example, approximately 100 MHz. However, this lower cutoff frequency can also be higher or lower.

[0015] The arrangement 100 can comprise a plurality of field probes 104. The arrangement 100 can comprise an array of (for example, regularly) arranged field probes 104. The field probes 104 can, in principle, be arranged at any position, as long as their individual position in a predefined coordinate system is known.

[0016] The field probes 104 are capable of measuring the magnitude of the electric field located at each field probe 104. However, in order to measure an antenna (also referred to as a test antenna) in the near field with subsequent near-field-to-far-field transformation, the phase information of the electric field located at the respective field probe 104 is also required. According to various aspects of this disclosure, this is intuitively obtained indirectly through interference between a signal radiated by a reference antenna and a signal radiated by the test antenna. The test antenna and the reference antenna are, for example, fed from the same signal source or from two coherent sources.

[0017] The multitude of field probes 104 can be arranged in a common plane 106. Alternatively, the multitude of field probes 104 can be arranged along a common spherical surface (not shown in the figures).

[0018] Fig. Figure 2 shows an exemplary field probe 104. Each field probe 104 (or at least some field probes 104) of the plurality of field probes 104 has a field probe antenna 202 and a power detection circuit 204 electrically connected to the field probe antenna 202. A waveguide or an aperture may also be provided for connecting the field probe antenna 202 and the power detection circuit 204 (in this case, the connection need not necessarily be electrically conductive). The field probe antenna 202 receives an electrical receive signal 203, which represents an amplitude of the electric field that may exist at the respective field probe 104 (in Fig. 2 not shown). The power sensing circuit 204 detects the electrical received signal 203 and generates a detected power signal 205, which represents the electrical power of the electric field possibly existing at the respective field probe 104 (in Fig. (2 not shown) represents. An optional microcontroller 206, which is electrically connected to the power sensing circuit 204, receives the power signal 205 and generates a transmitter control signal 207 that depends on the power signal 205. The transmitter control signal 207 contains information about the amplitude of the electric field that exists at the respective field probe 104 and has been detected by the power sensing circuit 204.

[0019] The field probe 104 also includes a transmitter 208, which is connected to the microcontroller 207 (or directly to the power sensing circuit 204). The transmitter 208 is configured to send information about the amplitude of the electric field.

[0020] The transmitter 208 can be configured to send an optical signal 209. For example, the transmitter 208 can have one or more light-emitting diodes. In other words, the field probe 104 can be equipped with an optical emitter 208 (for example, one or more light-emitting diodes 208).

[0021] Alternatively, transmitter 208 can be configured to transmit a radio signal 209 whose frequency differs from the frequency of a first signal and a second signal, which will be explained in more detail below. Transmitter 208 can therefore, for example, have a radio antenna. At least one of the radio antennas can be smaller than half the wavelength of the first signal, which will be explained in more detail below.

[0022] As long as the transmit power of the antennas, the frequency and the setting of a phase shifter (phase shifter 120) described in more detail below is constant, the intensity of the signal 209 emitted by the transmitter 208 (e.g., the optical transmitter 208, for example, a light-emitting diode (LED) implementing the optical transmitter 208) is also constant.

[0023] The arrangement 100 may further include a power supply unit 108. The power supply unit 108 may be configured to supply energy to the plurality of field probes 104. The power supply unit 108 may be configured as a battery or accumulator.

[0024] The energy supply unit 108 can be provided as a central energy supply unit 108 or alternatively or additionally as a decentralized energy supply unit 108.

[0025] The decentralized energy supply unit 108 can supply a large number of energy supply subunits 210 (see Fig. 2) exhibit. Each power supply subunit 210 can be assigned to at least one field probe 104, but not to all field probes 104 of the plurality of field probes 104. Each power supply subunit 210 can be assigned to exactly one field probe 104 of the plurality of field probes 104. Each power supply subunit 210 can include a battery or an accumulator. Alternatively or additionally, each power supply subunit 210 can include a solar cell. Alternatively or additionally, each power supply subunit 210 can include a capacitor for storing energy.

[0026] The arrangement 100 also includes a test antenna 110, the characteristics of which are to be determined.

[0027] The arrangement 100 further comprises a reference antenna 112 with a predetermined radiation characteristic and at least one signal source 114 which is (electrically conductively) connected to the test antenna 110 and the reference antenna 112.

[0028] The test antenna 110 can be arranged on a first side of the plane 106 in which the plurality of field probes 104 is arranged, and the reference antenna 112 can be arranged on a second side of the plane 106 in which the plurality of field probes 104 is arranged. The second side is located opposite the first side with respect to the plane 106. In other words, the plane 106 can be positioned between the test antenna 110 and the reference antenna 112. Alternatively, the test antenna 110 and the reference antenna can also be positioned on the same side with respect to the plane 106.

[0029] The at least one signal source 114 is configured to supply coherent signals to the test antenna 110 and the reference antenna 112, namely an electrical test signal 116 (supplied to the test antenna 110) and an electrical reference signal 118 (supplied to the reference antenna 112). Furthermore, a phase shifter 120 is provided, which is connected between the at least one signal source 114 and the reference antenna 112 and is configured to shift the phase of the electrical reference signal 118, thereby altering an interference pattern at the field probes 104, which will be explained in more detail below.

[0030] The radiation angle of the test antenna 110 should be large enough to cover as much of the detector area (i.e., the field probes 104) as possible. Switchable polarization may be provided.

[0031] The test antenna 110 is configured to receive the electrical test signal 116 and, in accordance with the electrical test signal 116, to emit a first signal 122 (e.g., a first radio signal 122) in the direction of the plurality of field probes 104. The reference antenna 112 is configured to receive the electrical reference signal 118 and, in accordance with the electrical reference signal 118, to emit a second signal 124 (e.g., a second radio signal 124) in the direction of the plurality of field probes 104. In the plane 106, and thus at the field probes 104, the first signal 122 and the second signal 124 form an interference of an electric field, for example, an interference pattern of an electric field, which is detected by the field probes 104.

[0032] The frequency of the first signal 122 and / or the second signal 124 can be in a range from approximately one MHz to approximately 100 GHz or more, for example in a range from approximately one MHz to approximately 40 GHz, for example in a range from approximately 10 MHz to approximately 40 GHz, for example in a range from approximately 100 MHz to approximately 40 GHz.

[0033] Each field probe 104 of the plurality of field probes 104 can have a maximum distance of half a wavelength of the first signal 122 from any other field probe 104 of the plurality of field probes 104.

[0034] In an exemplary implementation, the field probes 104 can be arranged in a regular grid with a distance between them less than half the wavelength of the highest frequency to be measured of the first signal 122 and / or the second signal 124.

[0035] The arrangement 100 further includes a receiver 126, which is equipped to receive the information 209 sent by the field probes 104, which is emitted by the field probes 104, for example in the form of an optical signal 209 or a radio signal 209.

[0036] The receiver 126 can be configured as an optical receiver 126, for example, if the transmitter 208 of the respective field probe 104 is configured to transmit the optical signal 209. For example, the optical signals 209 from the field probes 104 are thus recorded by a camera 126 (as an example for the receiver 126) and further processed by software.

[0037] Alternatively or additionally, the receiver 126 can be configured as a radio receiver, for example, if the transmitter 208 of the respective field probe 104 is configured to transmit the radio signal 209. For example, in this example, the radio signals 209 from the field probes 104 are received by a radio receiver 126 (as an example of receiver 126) and further processed by software.

[0038] The receiver 126 thus receives signals 130 containing information from the field probes 104. This information includes details about the interference patterns occurring at the field probes 104 in plane 106 (generated by interference between the first signal 122 and the second signal 124). The transmission of the signals 130, which also contain the measured values ​​acquired by the field probes 104, is wireless (optically or via radio signal). Whether this occurs using a frequency in the wavelength range of visible light (i.e., optically) or, for example, using another (radio) frequency, is irrelevant.

[0039] The arrangement 100 further comprises a device 128 for determining phase information of the electric field existing at the respective field probe 104. The device 128 can be implemented by one or more processors. The device 128 is connected to or implemented in the receiver 126. The device 128 is configured to determine the phase information of the electric field by interfering with the first signal 122 emitted by the test antenna 110 and the second signal 124 emitted by the reference antenna 112, which has the same frequency as the first signal 122.

[0040] Based on the known radiation pattern of the reference antenna 112 and the interference pattern on the field probe array (generally the arrangement of the plurality of field probes 104), the amplitude and phase information in the plane 106 (or, for example, the spherical surface) of the field probes 104 can be deduced. In other words, the amplitude and phase information in the plane 106 (or, for example, the spherical surface) of the field probes 104 can be calculated.

[0041] The following describes a possible calculation of the phase information of the electric field that can be performed by the device 128.

[0042] Each sensor has field components E AUT and E REF The amplitude A1 and the phase angle ϕ originating from the antenna to be measured are unknown. The amplitude A2 caused by the reference antenna is known. Likewise, the phase angle θ of the field E is also known. REFwill be changed.

[0043] The fields result in: EAUT(t)=A1e(j(ωt+ϕ)) EREF(t,θ)=A2e(j(ωt+θ))

[0044] Two measurements, M1 and M2, are now performed with each field probe, between which only the phase angle θ changes by, for example, 90°: M1=|(EAUT(t)+EREF(t,0))2|=A12+A22+2A1A2cosϕ M2=|(EAUT(t)+EREF(t,90°))2|=A12+A22+2A1A2sinθ

[0045] Rearranging for cosϕ and sinϕ and then applying the arctangent yields: cosϕ=M1−A12−A222A1A2 sinϕ=M2−A12−A222A1A2 ϕ=arctan(sinϕcosϕ)

[0046] The amplitude A1 can either be determined by a third measurement with the reference antenna deactivated, i.e., A2 = 0, or by using the identity cosϕ. 2 + sinϕ 2 = 1, substitute the terms above accordingly and solve the equation for A1: A1=±1(2)M1+M2±−4A24+4A22M1−M12+4A22M2+2M1M2−M22

[0047] Two of the four solutions are negative and can be discarded. The correct choice can be made from the two remaining solutions using prior knowledge (e.g., neighboring elements) or by a third measurement.

[0048] The phase shifter 120 between the signal generator (also referred to as signal source) 114 and the reference antenna 112 is used by the device 128 to determine phase information of the electric field existing at the respective field probe 104 in order to shift the interference pattern, for example to perform a linearity calibration of the individual field probes 104.

[0049] Thus, the device 128 is configured such that, using the absolute values ​​of the electric field at the respective field probes 104 determined by means of the field probes 104 and transmitted to the receiver 126, and using the phase information determined by the device 128, the characteristics of the test antenna 110 are determined. For example, the device 128 can be configured for characterizing antenna patterns and / or for visualizing electromagnetic fields at the field probes 104.

[0050] A highly parallel measurement of the electric field is illustrated in combination with the use of interference between an unknown signal (e.g., the first signal 122, emitted by the test antenna 110) and a known signal (e.g., the second signal 124, emitted by the reference antenna 112). The field probes 104 and, for example, the camera 126 are comparatively inexpensive.

[0051] The device 128 for determining phase information can be configured to determine a first interference pattern in a first measurement, wherein in the first measurement the first signal 122 and the second signal 124 are in a first phase relative to each other, and to determine a second interference pattern in a second measurement, wherein in the second measurement the first signal 122 and the second signal 124 are in a second phase relative to each other, the second phase being different from the first phase. The first phase can be a 0° phase difference, and the second phase can be a 90° phase difference.

[0052] Alternatively or additionally, the device 128 can be configured to determine phase information, to determine a first interference pattern in a first measurement, wherein in the first measurement the first signal 122 and the second signal 124 are in a (known, for example fixed) frequency ratio to each other, and to determine a second interference pattern in a second measurement, wherein in the second measurement the first signal 122 and the second signal 124 are in the same frequency ratio to each other.

[0053] Thus, for example, (at least) two measurements are performed with phase angles of 0° and 90° of the reference signal 118 from the reference antenna 112 to the test signal 116 from the test antenna 110. From a combination of the two intensity distributions, the device 128 determines the amplitude and phase of the electric field at the field probes 104 using simple trigonometry.

[0054] If the measurement was taken in the far field, the determined electric field should then be projected onto a spherical surface. In the case of a near-field measurement, a near-field-to-far-field transformation follows, which is also performed by device 128.

[0055] The arrangement 100 may further include a calibration device configured for calibrating the field probes 104 by deactivating the test antenna 110 and having only the reference antenna 112 transmit a signal (the second signal 124), and determining the amplitude of the electric field existing at the respective field probe 104, and using the determined amplitudes of the electric field existing at the respective field probe 104 for calibration of the field probes 104. The calibration device may also be configured for linearity calibration of the field probes 104 using the determined amplitudes of the electric field existing at the respective field probe 104.

[0056] By using only the reference antenna without a test antenna, an absolute calibration of the detectors can be performed.

[0057] The arrangement 100 may further include a device for determining the directional characteristic of the test antenna 110 using the information, wherein the device for determining the directional characteristic may be part of the arrangement 128 or may be provided separately from it. One or more processors may implement the device for determining the directional characteristic of the test antenna 110.

[0058] The arrangement 100 may further include a device for determining the antenna gain of the test antenna 110 using the information and the phase information, wherein the device for determining the antenna gain may be part of the arrangement 128 or may be provided separately from it. One or more processors may implement the device for determining the antenna gain of the test antenna 110.

[0059] It should be noted that conventional measurements typically take between 30 minutes and 12 hours, depending on the frequency and required resolution. Measurements according to various aspects of this revelation will be possible within a few seconds.

[0060] Sensor calibration is possible, for example, by activating only the reference antenna and performing a power / frequency sweep.

[0061] Several aspects provide a quick and inexpensive way to characterize antennas. Antenna characterization involves determining the amplitude and, if applicable, the phase for different directions in the far field.

[0062] Various aspects of this revelation can be vividly described: - Characterization: A sensor array is positioned between the test antenna and the reference antenna. Both antennas radiate (at the same frequency), with the phase between them being varied and the characteristics of the reference antenna being known. The amplitude of the electric field is then measured at the respective sensor location using the sensors of the sensor array (field sensors 104), and the test antenna is characterized. - Sensor array consisting of multiple field sensors: Each field sensor 104 measures the amplitude of the electric field. Each field sensor 104 has a radiation source (e.g., an optical emitter such as an LED, for example, with a frequency > 1 THz) and emits radiation depending on the measured amplitude (varying the intensity and / or changing the frequency depending on the measured amplitude). The receiver 126, e.g., the camera 126, detects the radiation from the radiation sources (parallel detection - fast detection). - Method for characterizing antennas in a few seconds.

[0063] Fig. Figure 3 shows a method 300 for determining a characteristic of a plurality of antennas according to various aspects of this disclosure.

[0064] Method 300 may include: in 302, emitting a first signal using a test antenna; in 304, measuring, using a plurality of field probes, an amplitude of an electric field existing at each field probe; in 306, transmitting the respective information; in 308, emitting a second signal using a reference antenna with a predetermined radiation pattern, wherein the second signal and the first signal are coherent to each other; in 310, determining phase information of the electric field existing at each field probe using an interference pattern of the first signal emitted by the test antenna with the second signal emitted by the reference antenna, which has a different frequency than the first signal.

[0065] Generally, when testing multiple test antennas, it may be necessary to drive each test antenna with a different frequency. This results in different frequency ratios between the frequency of the signal driving the reference antenna and the frequencies of the signals driving the respective test antennas (each test antenna is then driven with a signal of a different frequency). In this case, the different frequencies do not lead to static interference patterns, but rather to the general case of beat frequencies. These beat frequencies can then be evaluated accordingly.

[0066] The procedure can also include receiving the information transmitted by the field probes.

[0067] The signal can be transmitted as an optical signal. Alternatively or additionally, the signal can be transmitted as a radio signal whose frequency differs from the frequency of the first and second signals.

[0068] In a first measurement, a first interference pattern can be determined, where in the first measurement the first and second signals are in phase with each other. In a second measurement, a second interference pattern can be determined, where in the second measurement the first and second signals are in phase with each other, and the second phase differs from the first. The first phase can be 0°, and the second phase can be 90°.

[0069] The method may further include determining the directional characteristic of the test antenna using the information and the phase information. The method may further include determining the antenna gain of the test antenna using the information and the phase information.

[0070] Fig. Figure 4 shows a method 400 for determining a characteristic of a plurality of antennas according to various aspects of this disclosure.

[0071] The method may comprise, in 402, the emission of a first signal by means of a respective (associated) test antenna from several test antennas, and, in 404, the measurement of an amplitude of an electric field existing at each field probe by means of a plurality of field probes. The method may further comprise, in 406, the transmission of the respective information, and, in 408, the emission of a second signal by means of a reference antenna with a predetermined radiation pattern, wherein the second signal and the first signals are coherent to each other. The method may further comprise, in 410, the determination of phase information of the electric field existing at each field probe by means of a beat frequency of first signals emitted by the test antennas and a second signal emitted by the reference antenna, wherein the frequencies of the first signals at the several test antennas are different from each other.

[0072] The following section will explain various aspects of this description in more detail.

[0073] Example 1 is an arrangement for determining an antenna.The arrangement may comprise: a plurality of field probes, each field probe having a transmitter for sending information about the amplitude of an electric field existing at the respective field probe; a test antenna; a reference antenna with a predetermined radiation pattern; at least one signal source connected to the test antenna and the reference antenna and configured to supply coherent signals to the test antenna and the reference antenna; a device for determining phase information of the electric field existing at the respective field probe by interfering with a first signal emitted by the test antenna with a second signal emitted by the reference antenna having the same frequency as the first signal; and a phase shifter configured to shift the phase of a signal supplied to the reference antenna and thus change the interference pattern.

[0074] Example 2 is an arrangement for determining a characteristic of a large number of antennas.The arrangement can comprise a plurality of field probes, each field probe having a transmitter for sending information about the amplitude of an electric field existing at the respective field probe; multiple test antennas; a reference antenna with a predetermined radiation pattern; at least one signal source connected to each of the multiple test antennas and to the reference antenna, and configured to supply coherent signals to the test antennas and the reference antenna; and a device for determining phase information of the electric field existing at the respective field probe using a beat frequency of first signals emitted by the test antennas and a second signal emitted by the reference antenna, wherein the frequencies of the first signals at the multiple test antennas are different from each other.

[0075] In Example 3, the subject of Example 1 or 2 may optionally include the arrangement further comprising a receiver configured to receive the information transmitted by the field probes.

[0076] In Example 4, the object can optionally have any of Examples 1 to 3, such that the transmitter is set up to send an optical signal.

[0077] In Example 5, the subject of Examples 3 and 4 may optionally have the receiver configured as an optical receiver.

[0078] In Example 6, the item can optionally have any of Examples 4 or 5, such that the transmitter has a light-emitting diode.

[0079] In Example 7, the object of any of Examples 1 to 3 may optionally have a transmitter configured to send a radio signal whose frequency differs from the frequency of the first signal and the second signal.

[0080] In Example 8, the subject of Examples 3 and 7 may optionally have the receiver configured as a radio receiver.

[0081] In Example 9, the item can optionally include any of Examples 7 or 8, such that the transmitter has a radio antenna.

[0082] In Example 10, the subject of Example 9 may optionally have that at least one of the radio antennas is smaller than half the wavelength of the first signal.

[0083] In Example 11, the object of any of Examples 1 to 10 may optionally have the plurality of field probes arranged in a common plane.

[0084] In Example 12, the object can optionally feature any of Examples 1 to 11, such that the plurality of field probes are arranged along a common spherical surface.

[0085] In Example 13, the object of any of Examples 1 to 12 may optionally include a calibration device configured for calibrating the field probes by disabling the test antenna and having only the reference antenna transmit a signal, and determining the amplitude of the electric field existing at each field probe, and for calibrating the field probes using the determined amplitudes of the electric field existing at each field probe.

[0086] In Example 14, the subject of Example 13 may optionally include the calibration device being set up to linearly calibrate the field probes using the determined amplitudes of the electric field existing at the respective field probe.

[0087] In Example 15, the subject of any of Examples 1 to 14 may optionally include the device for determining phase information, in a first measurement determining a first interference pattern, wherein in the first measurement the first signal and the second signal are in a first phase relative to each other, and in a second measurement determining a second interference pattern, wherein in the second measurement the first signal and the second signal are in a second phase relative to each other, wherein the second phase is different from the first phase.

[0088] In Example 16, the object of Example 15 can optionally have the first phase position being 0° phase difference, and the second phase position being 90° phase difference.

[0089] In Example 17, the subject of any of Examples 1 to 16 may optionally include the device for determining phase information, in a first measurement determining a first interference pattern, wherein in the first measurement the first signal and the second signal are in a (known, for example, fixed) frequency ratio to each other, and in a second measurement determining a second interference pattern, wherein in the second measurement the first signal and the second signal are in the same frequency ratio to each other.

[0090] In Example 18, the subject of any of Examples 1 to 17 may optionally have such that each field probe of the plurality of field probes has a maximum distance of half a wavelength of the first signal from every other field probe of the plurality of field probes.

[0091] In Example 19, the object of any of Examples 1 to 18 may optionally include that the arrangement further comprises a power supply unit configured to supply power to the plurality of field probes.

[0092] In Example 20, the object of Example 19 may optionally have the power supply unit configured as a battery or accumulator.

[0093] In Example 21, the item of any of Examples 19 or 20 may optionally include that the power supply unit has a plurality of power supply subunits, each power supply subunit being associated with at least one field probe, but not all field probes, of the plurality of field probes.

[0094] In Example 22, the subject of Example 21 may optionally have that each power supply subunit is assigned to exactly one field probe of the plurality of field probes.

[0095] In Example 23, the item of any of Examples 21 or 22 may optionally include each power supply subunit having a battery or accumulator.

[0096] In Example 24, the item of any of Examples 21 or 22 may optionally have each power supply subunit containing a solar cell.

[0097] In Example 25, the item of any of Examples 20 or 24 may optionally include that each power supply subunit has a capacitor for storing energy.

[0098] In Example 26, the subject matter of any of Examples 1 to 25 may optionally include that the arrangement further includes a device for determining a directional characteristic of the test antenna using the information and the phase information.

[0099] In Example 27, the subject matter of any of Examples 1 to 26 may optionally include that the arrangement further comprises a device for determining an antenna gain of the test antenna using the information and the phase information.

[0100] Example 28 is a method for determining the characteristics of an antenna. The method may include: transmitting a first signal using a test antenna; measuring, using a plurality of field probes, the amplitude of an electric field existing at each field probe; transmitting the respective information; transmitting a second signal using a reference antenna with a predetermined radiation pattern, wherein the second and first signals are coherent; determining phase information of the electric field existing at each field probe using an interference pattern of the first signal emitted by the test antenna with the second signal emitted by the reference antenna, which has a different frequency than the first signal. The first and second signals may be transmitted partially or completely simultaneously.

[0101] Example 29 is a method for determining the characteristics of a plurality of antennas. The method may include: radiating a first signal from several test antennas using a test antenna; measuring, using a plurality of field probes, the amplitude of an electric field existing at each field probe; transmitting this information; radiating a second signal using a reference antenna with a predetermined radiation pattern, wherein the second signal and the first signals are coherent to each other; and determining phase information of the electric field existing at each field probe using a beat frequency of first signals emitted by the test antennas and a second signal emitted by the reference antenna, wherein the frequencies of the first signals at the multiple test antennas are different from each other.The first signal and the second signal can be transmitted partially or completely simultaneously.

[0102] In Example 30, the subject of Example 28 or 29 may optionally include the procedure further comprising: receiving the information sent by the field probes.

[0103] In Example 31, the object can optionally have any of Examples 28 to 30 in such a way that the signal is sent as an optical signal.

[0104] In Example 32, the object may optionally feature any of Examples 28 to 30, such that the signal is transmitted as a radio signal whose frequency differs from the frequency of the first signal and the second signal.

[0105] In Example 33, the object of any of Examples 28 to 32 may optionally include that in a first measurement a first interference pattern is determined, wherein in the first measurement the first signal and the second signal are in a first phase relative to each other, and that in a second measurement a second interference pattern is determined, wherein in the second measurement the first signal and the second signal are in a second phase relative to each other, the second phase being different from the first phase.

[0106] In Example 34, the subject of Example 33 may optionally have that the first phase position is 0° phase difference, and that the second phase position is 90° phase difference.

[0107] In Example 35, the subject matter may optionally include any of Examples 28 to 34, that the method further includes: determining a directional characteristic of the test antenna using the information and the phase information.

[0108] In Example 36, the subject matter may optionally include any of Examples 28 to 35, that the method further includes: determining an antenna gain of the test antenna using the information and the phase information.

Claims

[1] Arrangement (100) for determining a characteristic of an antenna (110), comprising the arrangement: • a plurality of field probes (104), each field probe (104) having a transmitter (208) for transmitting information about an amplitude of an electric field existing at the respective field probe (104); • a test antenna (110); • a reference antenna (112) with a predetermined radiation pattern; • at least one signal source (114) which is connected to the test antenna (110) and the reference antenna (112) and is configured to supply mutually coherent signals (116,118) to the test antenna (110) and the reference antenna (112); • a device (128) for determining phase information of the electric field existing at the respective field probe (104) using an interference pattern of a first signal (122) emitted by the test antenna (110) with a second signal (124) emitted by the reference antenna, having the same frequency as the first signal (112); and • a phase shifter (120) which is configured to shift the phase of a signal (118) supplied to the reference antenna (112) and thus change the interference pattern. [2] Arrangement (100) for determining a characteristic of a plurality of antennas comprising arrangement (100): • a plurality of field probes (104), each field probe (104) having a transmitter (208) for transmitting information about an amplitude of an electric field existing at the respective field probe (104); • several test antennas; • a reference antenna (112) with a predetermined radiation pattern; • at least one signal source (114) which is connected to each of the multiple test antennas (110) and to the reference antenna (112) and is configured to supply mutually coherent signals (116,118) to the test antennas and the reference antenna; • a device (128) for determining phase information of the electric field existing at the respective field probe (114) using a beat frequency of first signals (122) emitted by the test antennas and a second signal (124) emitted by the reference antenna (112), wherein the frequencies of the first signals (122) are different at the multiple test antennas. [3] Arrangement (100) according to claim 1 or 2, further comprising: a receiver (126) designed to receive the information (209) sent by the field probes (104). [4] Arrangement (100) according to one of claims 1 to 3, wherein the transmitter (208) is configured to transmit an optical signal (209). [5] Arrangement (100) according to claim 3 or 4, wherein the receiver (126) is configured as an optical receiver. [6] Arrangement (100) according to one of claims 1 to 3, wherein the transmitter (208) is configured to transmit a radio signal whose frequency differs from the frequency of the first signal (122) and the second signal (124). [7] Arrangement (100) according to claims 3 and 6, wherein the receiver (126) is configured as a radio receiver. [8] Arrangement (100) according to any one of claims 1 to 7, wherein the plurality of field probes (104) are arranged in a common plane (106) or along a common spherical surface. [9] Arrangement (100) according to any one of claims 1 to 8, further comprising: a calibration device, set up for calibrating the field probes (104) by deactivating the test antenna (110) and only the reference antenna (112) emitting a signal, and the amplitude of the electric field that exists at the respective field probe, is determined, and for calibrating the field probes (104) using the determined amplitudes of the electric field that exists at the respective field probe. [10] Arrangement (100) according to one of claims 1 to 9, wherein the device for determining phase information is configured to determine a first interference pattern in a first measurement, wherein in the first measurement the first signal and the second signal are in a first phase position relative to each other, and to determine a second interference pattern in a second measurement, wherein in the second measurement the first signal and the second signal are in a second phase position relative to each other, wherein the second phase position is different from the first phase position. [11] Arrangement (100) according to any one of claims 1 to 10, further comprising: a power supply unit, designed to supply energy to the numerous field probes. [12] Arrangement (100) according to claim 11, wherein the power supply unit (108) comprises a plurality of power supply subunits (210), each power supply subunit being assigned to at least one field probe (104), but not to all field probes (104) of the plurality of field probes. [13] Arrangement according to claim 12, wherein each power supply subunit (210) comprises a solar cell. [14] Method for determining a characteristic of an antenna, comprising the method: • Emitting a first signal (122) using a test antenna (110); • Measuring, by means of a plurality of field probes (104), an amplitude of an electric field that exists at the respective field probe (104); • Sending the relevant information; • Radiating a second signal (124) using a reference antenna (112) with a predetermined radiation pattern, wherein the second signal (124) and the first signal (122) are coherent to each other; • Determining phase information of the electric field existing at the respective field probe (104) using an interference pattern of the first signal (122) emitted by the test antenna (110) with the second signal (124) emitted by the reference antenna (112), which has a different frequency than the first signal (122). [15] Method for determining a characteristic of a plurality of antennas, comprising the method: • Radiation of a respective first signal (122) by means of a respective test antenna (110) from several test antennas; • Measuring, by means of a plurality of field probes (104), an amplitude of an electric field that exists at the respective field probe (104); • Sending the relevant information; • Radiating a second signal (124) using a reference antenna (112) with a predetermined radiation pattern, wherein the second signal (124) and the first signals are coherent to each other; • Determining phase information of the electric field existing at the respective field probe (104) using a beat frequency of first signals (122) emitted by the test antennas and a second signal (124) emitted by the reference antenna, wherein the frequencies of the first signals (122) are different at the multiple test antennas.

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