Inspection process in the production of modules or precursors of modules

Abstract

The invention relates to an inspection process in the production of modules or precursors of modules, having the steps of: providing an individualized anode / cathode layer at a receiving location; conveying a stacking device to the receiving location; receiving the anode / cathode layer from the receiving location by means of the stacking device; detecting the position and / or orientation of the anode / cathode layer; transporting the anode / cathode layer to a stacking location by means of the stacking device; aligning the stacking device together with the transported anode / cathode layer relative to the stacking location; and stacking the transported anode / cathode layer at the stacking location.

Description

[0001] Inspection during the production of modules or pre-module stages

[0002] Description

[0003] background

[0004] This discloses an inspection during the manufacture of modules or module precursors. These modules or their precursors can be, for example, layered assemblies containing layered material, assemblies for fuel or battery cells, or parts for their manufacture. This inspection is disclosed as a method and as a device. Details are defined in the claims. The description also contains relevant information on the structure and functioning of the inspection, as well as on device and method variants.

[0005] State of the art

[0006] WO 2021 171 946 A1 relates to a testing device for testing the position of the electrode layer in a laminate in which a release film and an electrode layer are bonded by an adhesive, from the release film side. An infrared irradiation unit irradiates the laminate with infrared light from the release film side. A camera sensitive to infrared light records the infrared light transmitted through the release film and reflected by the electrode layer. A detection unit detects the position of the electrode layer based on the image captured by the camera. Laminate stacks consisting of release films and electrode layers are stacked on a stacking table. A transport unit transports the release films and electrode layers and places them on the stacking table. The testing device checks the position of the electrode layer in the laminate stack released by the transport unit.

[0007] KR 10 23 70 748 B1 relates to an electrode layer loading device for a secondary battery. The device has an electrode layer receiving unit for receiving electrode layers that are stacked and fed individually to a magazine unit. A visual inspection unit records the alignment state of the electrode layer by directing a plurality of cameras at the electrode layer of the electrode layers. A loading driver serves to place the electrode layer onto the stacking table by moving the electrode plate receiving unit to a position on the stacking table.

[0008] Other known solutions involve testing the finished battery cell, and in preliminary stages, the electrode stacks, for electrical short circuits. This procedure leads to a high proportion of unusable (intermediate and final) products, as even imprecisely manufactured electrode stacks are laminated and then processed into inadequate battery cells. Technical problem

[0009] Based on this, an arrangement and a procedure are to be provided that allows modules or precursors of modules, for example fuel or battery cells containing layered material, to be manufactured with high precision at high processing speed, to reduce their short-circuit risk and to improve their efficiency.

[0010] Technical solution

[0011] An inspection method in the manufacture of modules or precursors of modules comprises, for example in the following order, the steps: providing a separated anode and / or cathode layer at a receiving location; conveying a stacking device to the receiving location; receiving the anode / cathode layer from the receiving location by the stacking device; detecting the position and / or orientation of the anode / cathode layer; transporting the anode / cathode layer to a stacking location by the stacking device; aligning the stacking device with the transported anode / cathode layer relative to the stacking location; and unstacking the transported anode / cathode layer at the stacking location.

[0012] In variants of the inspection method, individual anode layers are alternately transported from a first side to the stacking location using a first stacking device, and individual cathode layers are alternately transported from an opposite second side to the stacking location using a second stacking device. In variants of the inspection method, individual anode layers are alternately transported from the first side to the stacking location using a first stacking device, and individual cathode layers are alternately transported from the opposite second side to the stacking location using a second stacking device. These procedures are advantageous because they ensure that the sensitive electrodes are handled separately by the stacking device, without any risk of contamination of the electrode coatings on the contact surfaces of the stacking devices.

[0013] In variants of the inspection method, the position and / or orientation of the anode / cathode layer is recorded before the anode / cathode layer is picked up by the stacking device from the pick-up point and / or during the anode / cathode layer is transported by the stacking device to the stacking point. In variants of the inspection method, the position and / or orientation of the anode / cathode layer is recorded using a first camera during the anode / cathode layer is transported by the stacking device to the stacking point, and / or using a second camera before the anode / cathode layer is picked up by the stacking device from the pick-up point. To ensure precise positioning, in one variant, a preliminary position on the transport of the incoming anode / cathode layers is first checked using a matrix camera and a lighting device (white, adjustable from 0-20°).

[0014] In variants of the inspection method, the first and / or second camera capture the position and / or orientation of the anode / cathode layer in a vertical, ± approximately 25°, top view. In variants of the inspection method, a white light source associated with the first and / or second camera illuminates the anode / cathode layer for image acquisition by the first and / or second camera, respectively. In variants of the inspection method, the first and / or second camera capture the entire anode / cathode layer with a (single) image acquisition in order to capture its position and / or orientation. In variants of the inspection method, the first and / or second camera capture an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least a portion of an edge of the anode / cathode layer with a single image acquisition in order to capture the position and / or orientation of the anode / cathode layer.In variants of the inspection method, the first and / or the second camera are designed as line scan cameras that record the position and / or orientation of the anode / cathode layer before being picked up by the stacking device or upon arrival at the pick-up location or on the way to the pick-up location.

[0015] In variants of the inspection method, at least one optically active element is connected upstream of the first and / or the second camera in order to detect the position and / or orientation of the anode / cathode layer at one or more locations or regions before it is picked up by the stacking device or upon its arrival at the pick-up location or on the way to the pick-up location.

[0016] In variants of the inspection method, correction values ​​are determined from the position and / or orientation of the anode / cathode layer before it is picked up by the stacking device, the position and / or orientation of the stacking device, and / or the position and / or orientation of the picked up individual anode / cathode layer while the anode / cathode layer is being transported to the stacking location. In variants of the inspection method, these correction values ​​are taken into account when aligning the stacking device with the transported anode / cathode layer relative to the stacking location. In variants of the inspection method, these correction values ​​are taken into account when aligning the stacking device for picking up the anode / cathode layer by the stacking device in such a way that the anode / cathode layer is picked up by the stacking device in a central zero position and / or aligned.In one variant of the inspection method, the stacking device can be positioned relative to the anode / cathode layer using the calculated correction values ​​before / during its pickup such that the anode / cathode layer is picked up by the stacking device in a zero position. For this purpose, the stacking device's position and / or orientation relative to the anode / cathode layer can be corrected at the pickup location.

[0017] Similarly, after recording, the stacking device can be positioned during transport according to the correction values ​​from the image acquisition so that the anode / cathode layer is deposited by the stacking device at the stacking point on the electrode stack located there in a suitable manner and with minimal or no further corrective movement.

[0018] This process can be carried out very quickly and with high precision. For example, a device described below is suitable for carrying out this process.

[0019] A device for conveying and inspecting modules or precursors of modules comprises: a stacking device, designed and configured to receive a separated anode / cathode layer at a receiving location; a conveyor device, designed and configured to convey the stacking device to the receiving location and away from the receiving location; a first camera, designed and configured to detect the position and / or orientation of the anode / cathode layer on its way from the receiving location to the stacking location; an actuating device, comprising at least one actuator, designed and configured to actuate the stacking device to receive the anode / cathode layer, and / or to align the stacking device with the anode / cathode layer relative to the stacking location during the transport of the anode / cathode layer to the stacking location, and / or to unstack the anode / cathode layer at the stacking location.

[0020] In variants of the device, a first stacking device is provided and configured to transport individual anode layers from a first side, and a second stacking device is provided and configured to transport individual cathode layers from an opposite second side to the stacking location, alternating with the first stacking device. In variants of the device, the first stacking device transports individual anode layers exclusively from the first side to the stacking location, and the second stacking device transports individual cathode layers exclusively from the opposite second side to the stacking location.

[0021] In variants of the device, a first camera is designed and configured to capture the position and / or orientation of the anode / cathode layer during transport of the anode / cathode layer through the stacking device to the stacking location. In variants of the device, a second camera is designed and configured to capture the position and / or orientation of the anode / cathode layer before the anode / cathode layer is picked up by the stacking device from the pick-up location.

[0022] In variants of the device, the first and / or second camera are designed and configured to capture the position and / or orientation of the anode / cathode layer in a vertical, ± approximately 25°, top view. In variants of the device, a white light source associated with the first and / or second camera is designed and configured to illuminate the anode / cathode layer for image acquisition by the first or second camera. In variants of the device, the first and / or second camera are designed and configured to completely capture the anode / cathode layer with a (single) image acquisition in order to capture its position and / or orientation.In variants of the device, the first and / or the second camera are intended and configured to capture an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least a portion of an edge of the anode / cathode layer with a single image capture in order to capture the position and / or orientation of the anode / cathode layer. In variants of the device, the first and / or the second camera are designed as line scan cameras, which are intended and configured to capture the position and / or orientation of the anode / cathode layer before it is picked up by the stacking device or upon its arrival at the pick-up location or on the way to the pick-up location.

[0023] In variants of the device, at least one optically active element is arranged upstream of the first and / or second camera, intended and configured to detect the position and / or orientation of the anode / cathode layer at one or more locations or regions prior to being picked up by the stacking device or upon arrival at the pick-up location or on the way to the pick-up location. In variants of the device, the at least one optically active element is a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a surface light, a coaxial ring light, a dark-field light, or combinations thereof.

[0024] In variants of the device, a control unit is intended and configured to determine correction values ​​from the image acquisition and / or data from the capture device and / or the first and / or second camera, based on the position and / or orientation of the anode / cathode layer before it is picked up by a stacking device, the position and / or orientation of the stacking device, and / or the position and / or orientation of the picked up individual anode / cathode layer relative to the stacking device while the anode / cathode layer is being transported to the stacking location. In variants of the device, the control unit is intended and configured to take these correction values ​​into account when aligning the stacking device with the transported anode / cathode layer relative to the stacking location in positioning commands to the positioning device, the conveyor device, and / or the stacking device.In variants of the device, a control unit is intended and configured to take these correction values, the orientation and the location of the stacking device into account when picking up the anode / cathode layer in positioning commands to the positioning device, the conveyor device and / or the stacking device in such a way that the stacking device picks up the respective anode / cathode layer in a central zero position and / or aligned with the electrode stack located at the stacking location.

[0025] By checking the position of the incoming anode / cathode layer before or at the pick-up station, the alignment and location of the stacking device can be precisely determined during or before picking up the anode / cathode layer. This allows for a precise, corrected pick-up of the anode / cathode layer by the stacking device. In one variant, the alignment and location of the raised individual anode / cathode layer is further checked while the stacking device is being conveyed to the stacking station, which further increases the precision of the deposition of the individual anode / cathode layer on the electrode stack at the stacking station.

[0026] A further inspection method in the manufacture of modules or precursors of modules comprises, for example in the following order, the steps: providing a separated anode / cathode layer; transporting the anode / cathode layer to a stacking location by a stacking device; unstacking the transported anode / cathode layer at the stacking location; detecting an electrode stack grown around the unstashed anode / cathode layer at the stacking location in at least a side view and / or a vertical edge of the electrode stack at the stacking location; and checking the alignment and / or position of the or each unstashed anode / cathode layer relative to the remaining electrode stack grown at the stacking location.

[0027] This procedure allows for precise determination of the position of the top layer relative to the other layers of the electrode stack. This inspection becomes increasingly important with increasing electrode stack height, since incorrect placement of the top layer without further correction will inevitably result in the rejection of the electrode stack. However, the inspection becomes increasingly more accurate with increasing electrode stack height, as the geometric areas to be measured (corners or vertical edges of the electrode stack) can be recorded and evaluated more easily and precisely.

[0028] In a variant of the process, this also allows for the calculation of more precise correction values ​​when depositing the next layer on the electrode stack. Overall, this approach, with its precise position verification, allows for a significant reduction in the risk of short circuits, for example, in fuel or battery cells. This is also evident from the fact that previous solutions only deposit the layers with an accuracy of ± 0.5 mm, whereas the solution presented here, to reduce scrap and improve efficiency, allows for an accuracy of ± 0.1 mm or more when depositing the anode / cathode layers on the electrode stack.

[0029] After the anode / cathode layers have been placed on the electrode stack, the position / offset of the individual layers relative to one another is checked, and with it whether and with what deviation in the longitudinal or transverse direction the individual layers of the entire electrode stack are aligned with one another. In one variant, the offset of the individual layers relative to one another is determined using a (single) image acquisition from at least a third camera of at least one (vertical and / or transverse) edge of the electrode stack (which has grown up to the current image acquisition). By analyzing the resulting image acquisition using image processing tools (corner / edge search, etc.), it can be checked whether one or more layers of the electrode stack are above or below the other layers in the longitudinal or transverse direction, and whether a pre-specified accuracy was maintained when stacking the anode / cathode layers relative to one another.The alternating anode and cathode layers of the electrode stack have differing dimensions, resulting in a stepped (vertical) edge in the side view, which requires corresponding image processing. It may be relevant to determine the degree to which each individual layer is (laterally) above or below the other anode or cathode layers. It may also be relevant that the various anode / cathode layers always form steps of equal height within the entire electrode stack. The latter is evidence that the individual anode / cathode layers were stacked without folds or creases.

[0030] For this purpose, in one variant of the process, anode layers and cathode layers of the electrode stack, which are alternately stacked on top of one another and have different dimensions with a (vertical) edge that is stepped in the z-direction when viewed from the side, are examined for their shape and / or dimensions. In one variant of the process, anode layers and cathode layers of the electrode stack, which are alternately stacked on top of one another, are examined to determine the deviation with which each individual layer is (laterally) above or below the other anode or cathode layers of the electrode stack. In one variant of the process, it is examined the deviation with which the various anode / cathode layers form steps in the electrode stack in the z-direction (vertical axis).

[0031] In one variant of the process, two third matrix cameras are used, which (seen from above) are aimed at diagonally opposite corners / (vertical) edges of the electrode stack at the deposition point. In one variant of the process, the cameras are focused on the respective edge of the electrode stack. In one variant of the process, (white) point lamps are used to illuminate the respective edge of the electrode stack, illuminating the desired position. In one variant of the process, four third matrix cameras are used, which (seen from above) are aimed at all four corners / (vertical) edges of the electrode stack at the deposition point. In one variant of the process, backlighting or darkfield illumination is achieved using the respective light sources. This allows the relevant areas of the various anode / cathode layers to be clearly seen in transmitted light.In a variant of the process, the beam path of the third camera is guided using mirrors or prisms to adapt to spatial conditions.

[0032] In one variant of the method, a third matrix camera is used with a field of view of the electrode stack from above, which captures the electrode stack as a whole in a single image, or two third matrix cameras, each capturing one of two diagonal corners of the electrode stack from above, up to four third matrix cameras, each capturing all four corners of the electrode stack from above, and which are directed in a top view onto the electrode stack at the deposition point. Here, too, in one variant, the beam path of the cameras is guided to adapt to spatial conditions using appropriate arrangements of mirrors or prisms. For illumination, in one variant, a coaxial (red) illumination and a (white) point source are used for each of the third cameras.

[0033] This makes it possible to see very precisely that the anode / cathode layers are always placed in the correct position on the electrode stack.

[0034] In a variant of the process, the movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies are also taken into account. Before the anode / cathode layers are deposited to form the electrode stack, the x and y positions of the workpiece carrier are recorded at various z-heights using the third cameras. This way, the third cameras can be used to check during the depositing of the anode / cathode layers whether the anode / cathode layers have been stacked in the correct x and y position, which corresponds to the respective z-position of the workpiece carrier on the lifting device. The accuracy in the direction of rotation around the vertical axis (in theta) when picking up the anode / cathode layers with the stacking device can also be corrected in this way for later precise stacking of the anode / cathode layers of the electrode stack.

[0035] A device for conveying and inspecting modules or precursors of modules is equipped with a receiving station for providing a separated anode / cathode layer; a stacking device, designed and configured to transport the anode / cathode layer to a stacking station; for unstacking the transported anode / cathode layer at the stacking station; a camera, designed and configured to capture an image of an electrode stack grown around the unstashed anode / cathode layer at the stacking station in at least one side view and / or including a vertical edge in the z-direction of the electrode stack at the stacking station; and a control unit, designed and configured to determine the orientation and / or position of the or each unstashed anode / cathode layer relative to the remaining electrode stack grown at the stacking station from the image acquired by the second camera.

[0036] In a variant of the device, the control unit is intended and configured to determine a position of a stacked anode / cathode layer in relation to the remaining layers of the electrode stack by checking the position / rotation / offset of the individual anode / cathode layers relative to one another after the anode / cathode layers have been placed on the electrode stack, and / or wherein the control unit is intended and configured to determine an offset of the individual anode / cathode layers relative to one another using an image acquisition of at least one third camera from at least one (vertical and / or transverse) edge of the electrode stack.In a variant of the device, the control unit is intended and configured to check a received image capture by corner / edge search to determine whether one or more of the anode / cathode layers of the electrode stack are above or below the remaining anode / cathode layers, and / or whether an accuracy was maintained when stacking the anode / cathode layers.

[0037] In one variant of the device, the control unit is designed and configured to determine, from the image acquisition of alternating anode layers and cathode layers of the electrode stack, different dimensions with a stepped (vertical) edge in the z-direction in the side view, and to examine the stacked anode layers and cathode layers for their shape and / or dimensions. In one variant of the device, the control unit is designed and configured to examine the stacked anode layers and cathode layers to determine the deviation by which each individual layer is above or below the other anode or cathode layers of the electrode stack.In a variant of the device, the control unit is designed and configured to examine an image acquisition to determine the deviation in the z-direction (vertical axis) with which the various anode / cathode layers form steps in the electrode stack.

[0038] In a variant of the device, the control unit is intended and configured to receive image captures from at least two third cameras, which contain, from the side, diagonally opposite corners and / or their edges in the vertical axis (z-axis) of the electrode stack ES at the deposition point, as seen from above, in order to examine the deviation in the x or y direction (transverse, longitudinal) of the stacked anode layers and cathode layers with which each individual layer protrudes above or below the other anode or cathode layers of the electrode stack in the longitudinal and / or transverse direction of the layers; and / or to examine the deviation in the z direction (vertical axis) with which the various anode / cathode layers form steps in the electrode stack.In a variant of the device, the at least two third cameras are aligned to a (vertical) edge of the electrode stack, and / or (white) spotlights are used to illuminate the respective edge of the electrode stack to illuminate the desired position on the electrode stack.

[0039] In a variant of the device, the control unit is intended and configured to receive image captures from at least four third cameras, which contain the four corners of the electrode stack at the deposition location as seen from above, in order to determine a position of the uppermost stacked anode / cathode layer in relation to at least one underlying layer of the electrode stack by checking the position / rotation / offset of the individual anode / cathode layers relative to one another after the anode / cathode layers have been deposited on the electrode stack by means of an image capture from each of the four cameras.

[0040] In a variant of the device, the control unit is designed and configured to take into account movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies by capturing the x- and y-positions of the workpiece carrier at various z-heights with the third cameras before the start of the deposition of the anode / cathode layers to form the electrode stack, the corresponding data are stored in a data memory for comparison with the x- and y-positions of the workpiece carrier at various z-heights during the deposition of the anode / cathode layers in order to check whether the anode / cathode layers have been stacked within the accuracy at the x- and y-position corresponding to the respective z-position of the workpiece carrier on the lifting device,and / or to correct the orientation in the direction of rotation around the z-axis (vertical axis) (in theta) when picking up the anode / cathode layers with the stacking device.

[0041] The procedures and devices described above allow a significant reduction in the risk of short circuits in the module thus formed, which also leads to an increase in the overall quality and efficiency of the fuel or battery cell.

[0042] Overall, the device and method described above allow an accuracy of ± 0.1 mm or better at high stack throughput.

[0043] Above, process aspects are presented in device terms and vice versa. Both the process aspects and the device aspects serve to explain the arrangement and its operation.

[0044] Brief Description of the Figures Further features, properties, and advantages of the devices and methods can be found in the following description in conjunction with the drawings. Possible modifications will become clear to a person skilled in the art from the following description, which refers to the accompanying drawings. The figures schematically show the devices discussed here and explain their operation. Herein:

[0045] Fig. 1 shows an assembly line with inspection during the production of modules or precursors of modules in a schematic plan view;

[0046] Fig. 1a shows a second camera arrangement for inspecting the layers before they are picked up by the stacking device;

[0047] Fig. 2 shows a process station of the assembly line from Fig. 1 designed as a stacking unit in a schematic side view;

[0048] Fig. 2a shows a first variant of a second camera arrangement for inspecting the layers during transport from the pick-up point to the stacking point by means of the stacking device;

[0049] Fig. 2b shows a second variant of a second camera arrangement for inspecting the layers during transport from the pick-up point to the stacking point by means of the stacking device;

[0050] Fig. 3 shows a variant of a third camera arrangement in a side view for inspecting the layers of an electrode stack after they have been stacked at the stacking location by means of the stacking device; and

[0051] Fig. 3a shows the variant of the third camera arrangement from Fig. 3 in a plan view.

[0052] Detailed description of variants of devices and procedures

[0053] Fig. 1 schematically illustrates part of an assembly line 100 for producing modules or precursors of modules. Here, the assembly line 100 is explained using the example of the production of fuel or battery cells that contain layer material and / or fluid. A central transport line 110 conveys a plurality of workpiece carriers 120 between several process stations. The central transport line 110 is configured, by means of drives not shown in detail, to convey the workpiece carriers 120 in groups in individual transport sections. As supply stations for the assembly line 100, a first cutting or punching station (not shown in detail) is configured to divide a first continuous layer material coming from a roll into uniform rectangular pieces and to deliver them as a sequence of individual anode layers AL onto a carrier 82.A second cutting or punching station (not shown) is configured to divide a second continuous layer material coming from a roll into uniform rectangular pieces and to deliver them as a sequence of individual cathode layers KL onto a carrier 92. A first depositing station 80 feeds the individual anode layers AL onto transportable adhesive trays 212 of a first transport path 210 to feed them to a stacking unit 138. A second depositing station 90 feeds the individual cathode layers KL onto transportable adhesive trays 312 of a second transport path 310 to feed them to a stacking unit 138. During their transport to the stacking unit 130, the anode and cathode layers AL, KL are guided through an inspection station 84, 94 assigned to the respective transport path 210, 310 to check their quality. In one variant, the cathode is a metal foil coated on both sides with a conductive coating and a protruding conductor tab.In one variant, the anode is a double-sided conductive coated metal foil, which is laminated between two dielectric foils (separators), with the current collector tab protruding laterally, i.e. on one of the short sides between the separators.

[0054] Instead of the transportable adhesive trays 212 of the first transport path 210 and the transportable adhesive trays 312 of the second transport path 310, one variant provides a vacuum conveyor belt. In this variant, the first and second transport paths 210, 310 also have multiple pick-up points 221, 321. Here, too, separate handling of the sensitive electrodes is provided, which prevents contamination of the electrode coatings.

[0055] Such an assembly line 100 has a first transport section 116 with the receiving area 132, the stacking area 134, and the delivery area 136. In the stacking area 134, several, for example four, first lifting devices 135 are provided to lift workpiece carriers 120 from the carriage 140 in the Z direction. The carriage 140 can be positioned in and opposite to the outgoing path 112 along a first transport section 116. The carriage 140 is configured to position several empty workpiece carriers 120 in groups from the receiving area 132 into the stacking area 134 and / or several workpiece carriers, each carrying a stack created in the stacking area 134, from the stacking area 134 into the delivery area 136. Each lifting device 135 is configured to raise and lower the respective workpiece carrier 120 in a controlled manner by the carriage 140 for stacking.The carriage 140 has a length in the conveying direction (x-direction) of the workpiece carriers 120 that at least approximately corresponds to the extension of the receiving area 132 and the stacking area 134, or of the stacking area 134 and the delivery area 136 in the conveying direction of the workpiece carriers 120. The carriage 140 is arranged for longitudinal movement on two opposing linear guides and has 2xN pickups 142 on each long side for N workpiece carriers 120 to be positioned. The lifting devices 135 extend between the linear guides and can thus lift the N workpiece carriers 120 in the z-direction while remaining at their respective x- and y-positions, while the carriage 140 is moved along the linear guides (in the x-direction). Analogously, the lifting device 150 is provided in the receiving area 132 for the N workpiece carriers 120, and a lifting device is provided in the delivery area 136.

[0056] In the variant shown here, several workpiece carriers 120 - here as a group of four - can be removed from the central transport route 110 in the receiving area 132. In other variants, more or fewer than four workpiece carriers 120 can be removed from the central transport route 110. For this purpose, the central transport route 110 has a lifting device 150 upstream of the stacking unit 130 in the receiving area 132, which in one variant can be part of the central transport route 110, here in the form of a scissor lift table. The lifting device 150 is configured to lift a group of four workpiece carriers 120 from the central transport route 110 in the receiving area 132 and place them on a carriage 140. In one variant, the carriage 140 can also be part of the central transport route 110.This carriage 140 in the stacking unit 130 is to be moved in and against the conveying direction x of the workpiece carriers 120 in a controlled manner by means of a drive not further illustrated in order to receive the group of workpiece carriers 120 in the receiving area 132, to convey them from the receiving area 132 into a stacking area 134, and from the stacking area 134 into a delivery area 136.

[0057] In the stacking area 134, individual anode layers AL and individual cathode layers KL are transported into the stacking area 134 (see also Fig. 1) by a number of stacking devices 138 (here four) corresponding to the number of workpiece carriers 120 in the group from a respective first and second transport line 210, 310 located on both longitudinal sides of the central transport line 110 with suppression or adhesive trays 212, 312, also called shuttles. In other words, two stacking devices 138 are assigned to each workpiece carrier 120 in the stacking area 134. For this purpose, the arrangement of the stacking devices 138 is equipped with respective drives (not further illustrated) in order to move the stacking devices 138 individually vertically in the z-direction to raise and lower the individual anode and cathode layers KL.In the variant shown here, the transport lines 210, 310 are each endless transport lines and are configured to convey the suppression or adhesive trays 212, 312 in a horizontal conveying plane along a closed path. Further drives 224, illustrated below in connection with Fig. 2, serve to move the stacking devices 138 individually horizontally in the y-direction, transversely to the central transport line 110, in order to transport the individual anode and cathode layers AL, KL from the trays of the first and second transport lines 210, 310 to the respective stacking location 133 on the workpiece carrier 120 in the stacking area 134.In this case, individual anode layers AL from a first side of the workpiece carriers 120 and individual cathode layers KL from a second side of the workpiece carriers 120 are alternately brought to the respective workpiece carrier 120 on workpiece carriers 120 removed from the central transport path 110 at the respective stacking points 133 of the stacking unit 130 and stacked on the respective workpiece carrier 120 to form an electrode stack ES. The assembly line 100 / the stacking unit 130 according to Fig. 1 comprises, for example, 4 stacking stations 133. The stacking unit 130 further has a plurality of first lifting devices 135 acting in the z-direction, one per workpiece carrier 120, in order to lift the workpiece carrier 120 in the z-direction under the control of the carriage 140 and thus to separate it from the carriage 140, and to place this workpiece carrier 120 on the carriage 140 in the z-direction under the control.This allows the workpiece carriers 120 to be loaded with the layer material to form the electrode stacks ES, while the carriage 140 can be moved back and forth in the x-direction.

[0058] At each stacking point 133, a flat holder 137 with positioning pins 139 is provided, which receives an empty workpiece carrier 120 and holds it in a precisely positioned position (see Fig. 2).

[0059] Fig. 2 shows a workpiece carrier 120 located in the stacking unit 130 on one of the first lifting devices 135, which is lifted out of the carriage 140 (not shown) and is located at a stacking point 133. At this stacking point 133, the empty workpiece carrier 120 is filled as described below and then returned to the central transport path 110 for conveyance to a subsequent process station. The first lifting device 135 serves, as described above, to remove the at least one empty workpiece carrier 120 from the central transport path 110. At each stacking point 133, a stacking device 138 transports the individual anode layers AL (left in Fig. 2) and a stacking device 138 transports the individual cathode layers KL (left in Fig.

[0060] 2 right) alternately approach from both sides of the workpiece carrier 120 in and against the y-direction and stack them in the z-direction on the workpiece carrier 120. In this way, the electrode stack ES grows to the desired number of layers. In one variant, the workpiece carrier 120 is lowered in the z-direction after each anode layer AL or cathode layer by the height / thickness of one anode layer AL or cathode layer. Each of the stacking devices 138 is provided and configured to pick up either the individual anode layers AL or the individual cathode layers KL by means of controlled pneumatic vacuum and to hold them above the workpiece carrier 120 during transport to the stacking point 133. Each stacking device 138 has a flat gripping tool which is to be subjected to negative pressure for holding and transporting an anode / cathode layer AL, KL.In one variant, it is also provided to deliver the individual anode layers AL and the individual cathode layers KL to the stacking point 133 by means of a short controlled pneumatic overpressure pulse in order to stack the layers AL, KL on the workpiece carrier 120.

[0061] In addition to conveying the layers AL, KL, the device described here also serves to inspect the layers AL, KL on their way from their respective transport routes 210, 310 to the corresponding stacking station 133. For this purpose, the receiving stations 221, 321 are provided in the stacking area 134, to which the separated anode / cathode layers AL, KL are transported with the suppression or adhesive trays 212, 312. Before the adhesive trays 212, 312 with the anode / cathode layers arrive at the corresponding stacking station 133, the anode / cathode layers AL, KL are captured by a second camera 220. This second camera 220 is used to detect the position and / or orientation, here in x, y and theta, of the anode / cathode layer on its adhesive tray 212, 312 before the anode / cathode layers AL, KL are picked up from their adhesive tray 212, 312 by the stacking device 138. An inspection of an anode layer AL ora cathode layer KL with the second camera 220 can be carried out while the suppression or adhesive tray 212, 312 transporting the anode / cathode layer AL, KL to be inspected is moved along the closed path of the transport path 210, 310.

[0062] Alternatively, an inspection of an anode layer AL or a cathode layer KL can be carried out with the second camera 220, while the suppression or adhesion tray 212, 312 transporting the anode / cathode layer AL, KL to be inspected is stationary (briefly, a few milliseconds) and other suppression or adhesion trays 212, 312 movable along the closed path of the transport path 210, 310, for example one immediately along the closed path before and / or after the suppression or adhesion tray 212, 312 that is (briefly) stationary for the inspection with the second camera 220, are moved along the closed path of the transport path 210, 310.

[0063] The second camera 220 is oriented such that it can capture an image of the anode / cathode layer during transport, in a vertical plan view of its position and / or orientation (in x, y, and / or theta), shortly before the respective anode / cathode layer AL, KL arrives at its pickup location 221, 321. Figure 2 illustrates two of the first cameras 220, one for the anode layers AL and one for the cathode layers KL. It should be understood that a second camera 220 can also be provided in front of each pickup location 221, 321, or only in front of the respective first pickup location 221, 321. For each first camera 220, a white light source 225 is provided (see Fig. 1a) to illuminate the anode / cathode layer for image acquisition by the camera 220. Depending on the spatial conditions, the second camera 220 - as also shown in Fig.1a illustrates - is designed as a full-frame camera to completely capture the anode / cathode layer AL, KL with a single image capture, or the second camera is designed as a line scan camera to capture the position and / or orientation in x, y, and / or theta of the anode / cathode layer while it is transported to the corresponding recording location 221, 321. The full-frame camera can, for example, have a 24-megapixel digital image capture chip 220a. Depending on the requirements for accuracy and resolution and the spatial conditions, the second camera 220 can also - with appropriate optics, for example a lens 226 and a 90° deflection mirror 227 semi-transparent to white light - provide a full-frame capture from above of the anode / cathode layer.

[0064] Each stacking device 138 is assigned a conveyor device 224 for conveying the stacking device 138 back and forth between the respective receiving point 221, 321 and the stacking point 133. Thus, with a number of stacking devices 138 (here four) corresponding to the number of workpiece carriers 120 in the group, individual anode layers AL and individual cathode layers KL are transported into the stacking area 134 from a respective first and second transport line 210, 310 located on both longitudinal sides of the central transport line 110 with suppression or adhesive trays 212, 312, also called shuttles (see also Fig. 1). In other words, two stacking devices 138 are assigned to each workpiece carrier 120 in the stacking area 134.For this purpose, the arrangement of stacking devices 138 is equipped with respective actuators 138a to move the stacking devices 138 individually vertically in the z-direction to raise and lower the individual anode and cathode layers KL. Additional drives 224 serve to move the stacking devices 138 individually horizontally in the y-direction, transverse to the central transport path 110, to transport the individual anode and cathode layers AL, KL from the trays 211, 311 of the first and second transport paths 210, 310 to the respective stacking location 133.

[0065] A common horizontal linear guide is provided for each of two stacking devices 138 and is arranged above a respective workpiece carrier positioned in the stacking area 134. The linear guide extends from a pick-up point of the transport path 210 to a pick-up point of the transport path 310 and spans the stacking area 134.

[0066] Sensors 230 serve as a detection device for detecting the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138. These sensors 230, of which only the position of the stacking device 138 in the y-direction is illustrated here for clarity, supply corresponding data to a control unit ECU.

[0067] On the way from the pick-up point 221, 321 to the stacking point 133, each stacking device 138 passes a first camera 260. This first camera 260 serves to record the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer AL, KL adhering to the underside of the stacking device 138 relative to the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138 on its way to the stacking point 133. This data is fed to the control unit ECU and processed there in order to control corresponding actuating devices, for example the actuators 138a, 224, etc.These actuating devices also include pneumatic actuators (not further illustrated) to enable the stacking device 138 to pick up and place the anode / cathode layers AL, KL, electrical or pneumatic actuators to align the stacking device 138 in x, y, z, and / or theta while transporting the anode / cathode layer to the stacking location 133 so that the anode / cathode layer AL, KL is optimally positioned for stacking relative to the stacking location 133 and the electrode stack located there, and to stack the anode / cathode layer at the stacking location 133.

[0068] The first camera 260 serves to capture the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer AL, KL relative to the stacking device 138 before the anode / cathode layer AL, KL is stacked at the stacking location 133. This data is fed to the control unit ECU and processed there. The control unit ECU determines correction values ​​from the image acquisition and the data from the various acquisition devices.In particular, the correction values ​​are determined from the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer AL, KL at the pick-up location or on the way there before it is picked up by a stacking device 138, the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138 at the pick-up location or on the way there, as well as the position and / or orientation (in x, y, z, and / or theta) of the picked-up individual anode / cathode layer relative to the stacking device 138 during transport of the anode / cathode layer to the stacking location 133. These correction values ​​serve to align the stacking device 138 with the transported anode / cathode layer relative to the stacking location 133 in x, y, z, and / or theta so that the transported anode / cathode layer is precisely deposited at its desired position relative to the electrode stack ES located at the stacking location 133.This means that these correction values ​​are converted into positioning commands to the positioning device, the conveyor device 224 and / or the stacking device 138 when correcting the orientation and location (in x, y, z, and / or theta) of the stacking device 138 when picking up the anode / cathode layer such that the anode / cathode layer is picked up by the stacking device 138, for example, in a central zero position or aligned with the electrode stack located at the stacking point 133.

[0069] The first camera 260 is aligned such that, during transport of the anode / cathode layer, its position and / or orientation (in x, y, and / or theta) is captured in a vertical view from below with an image acquisition, shortly before the respective anode / cathode layer AL, KL arrives at its stacking point 133. Fig. 2 illustrates one of the second cameras 260 for the anode layers AL and one of the second cameras 260 for the cathode layers KL. A light source 275, for example a white light source, is provided for every second camera 260 to illuminate the anode / cathode layer for image acquisition by the first camera 260. Depending on the spatial conditions, the second camera 220—as shown in Fig.1a illustrates - designed as a full-frame camera to completely capture the anode / cathode layer AL, KL with a single image capture, or the first camera 260 is designed as a line scan camera to capture the position and / or orientation in x, y, and / or theta of the anode / cathode layer as it is transported to the corresponding stacking location 133. The full-frame camera can, for example, have a 24-megapixel digital image capture chip 260a. Depending on the requirements for accuracy and resolution and spatial conditions, the first camera 260 can also - with appropriate optics, for example a lens 276 and a 90° deflection mirror 277 semi-transparent to white light - provide a full-frame capture from below of the anode / cathode layer. The light source 275 can also be arranged pivotably in order to provide optimal light incidence on the respective anode / cathode layer AL, KL.For example, the first camera 260 can provide a field of view of the anode / cathode layer AL, KL of at least 720 x 400 mm at a resolution of 134 pm / pixel or higher.

[0070] A ring light source is arranged in the beam path of the second camera 260, i.e., in the region of the vertical section of the beam path. Light (approximately 600–780 nm) from the ring light source impinges on the underside of the anode or cathode at a shallow angle, i.e., less than 45 degrees, to enhance the contrast of surface defects.

[0071] Fig. 2a shows a variant of an arrangement of the second camera 260. Here, the first camera 260 is also aligned such that, during the transport of the anode / cathode layer, its position and / or orientation (in x, y, and / or theta) is captured in a vertical view from below with an image capture, shortly before the respective anode / cathode layer AL, KL arrives at its stacking location 133. In contrast to the arrangement in Fig. 2, here the white light source 275 is provided between the horizontal section of the optical path of the camera 260 and the stacking device 138. For this purpose, a further semi-transparent 90° deflection mirror 277a is provided between the camera 260 and the semi-transparent 90° deflection mirror 277 to direct the white light into the beam path onto the underside of the stacking device 138 with the anode / cathode layer for image acquisition by the first camera 260. Otherwise, the arrangement of the camera in Fig. 2a corresponds to that in Fig. 2.

[0072] Instead of a full-frame capture using a single camera, only selected areas, here corner / edge areas of the anode / cathode layer AL, KL, can be captured during their transport for their position and / or orientation (in x, y, and / or theta) in a vertical view from below, shortly before the respective anode / cathode layer AL, KL arrives at its stacking point 133. For this purpose, as shown in Fig. 2b, two second cameras 260 capture the corner areas of the anode / cathode layer AL, KL vertically from below as the anode / cathode layer AL, KL is transported over them. In particular, an image capture is taken at each corner of the layer KL adhered to the stacking device 138 by means of vacuum during transport ("on the fly"), ie while the anode / cathode layer AI, KL held on the stacking device is continuously moved to the stacking point 133.

[0073] In front of each stacking point there are (on one side) one or two cameras 260 for the anode layer AL and (on the other side) one or two cameras 260 for the cathode layer KL. For the sake of clarity, only one camera 260 is shown in each of the figures. While the anode / cathode layers AI, KL held on the stacking device move past the cameras 260, first an image of a corner at the front edge of the layer AL or KL is recorded, or two images of the corners at the front edge of the layer AL or KL are recorded. Then, first an image of a (preferably diagonal) corner at the rear edge of the layer AL or KL is recorded, or the other two corners at the rear edge of the layer AL or KL are recorded with the two cameras 260. Any deviations between the positions of the corners on the front edge and the corners on the rear edge transverse to the transport direction of the respective layer AL orKL, the control unit ECU determines correction values ​​(in x, y, and / or theta) for the movement and orientation of the stacking device 138 relative to the location / corners of the electrode stack ES, so that the anode / cathode layer AL, KL can be deposited very quickly vertically onto the electrode stack ES upon reaching the stacking location 133 with minimal (ideally no) further correction required.

[0074] In one variant of the stacking devices 138, the holding surface of the gripping tool for receiving and holding an anode / cathode layer AL, KL can be smaller than the surface of an anode / cathode layer AL, KL. For example, the (four) corner regions of the gripping tool can be left out. Consequently, an anode / cathode layer AL, KL can be illuminated during transport in the corner regions from above, i.e., from the side, with the light source 275, which rests against the gripping tool. This allows edges of the cathode layer KL to be captured with particularly high contrast compared to the surroundings.

[0075] In Fig. 2b, the arrangement of each of the first cameras comprises a matrix camera 260 with a red coaxial ring illumination 266 and / or a blue dark field illumination 268. The dark field illumination provides flat light (here at an angle of 45° to the optical axis) so that, for example, the edge regions reflect or scatter light towards the camera and then appear clearly contrasted and bright in the camera image.

[0076] With such an arrangement, it is possible to capture a square area of ​​approximately 21 x 21 mm at a resolution of 10.8 um / pixel or better.

[0077] Due to the presence of several adjacent stacking units 130, the inspection of the anode / cathode layers AL, KL can be parallelized.

[0078] It can be provided that several anodes for a first group of not directly adjacent electrode stacks or workpiece carriers 120 in the stacking area 134, e.g. the first workpiece carrier and the third workpiece carrier, are inspected with the respective second camera 260 in a temporally overlapping manner and / or several cathodes for a second group, different from the first, of not directly adjacent electrode stacks or workpiece carriers 120 in the stacking area, e.g. workpiece carriers 2 and 4, are inspected with the respective second camera 260 in a temporally overlapping manner.

[0079] Since directly adjacent stacking devices 138 move toward each other, i.e., perform opposing movements in the Y-direction, oscillations / vibrations can be compensated and efficient inspection achieved. Furthermore, the separate stacking devices 138 allow the anodes to be handled independently of the cathodes. This prevents the sensitive electrodes from alternately contacting the same surfaces. This avoids contamination of the electrode coatings.

[0080] Alternatively, it can be provided that the anode layers and the cathode layers are provided in groups at the multiple receiving points of the respective transport path 210, 310 by the suppression or adhesion tray 212, 312.

[0081] In another variant, a group inspection is performed by the camera 260 for the anode and cathode layers. In a variant not shown, for example, a different resolution and field of view can be achieved, whereby four cameras 260 can be used to inspect all four corners simultaneously, or a line scan camera.

[0082] All of the inspection variants described above serve to determine the exact position of the anode / cathode layer AL, KL at least once and then correct the alignment before depositing. By optically detecting the position and alignment of characteristic areas (corners, edges) of the layers AL, KL at the pick-up point and / or during transport to stacking point 133, and using the data thus obtained to correct the alignment of the stacking device 138 relative to the electrode stack ES at stacking point 133 before and / or during transport of the layers AL, KL to stacking point 133, this depositing is possible in a time-efficient and highly precise manner.

[0083] With reference to Figs. 2 and 3, a further inspection method is explained below which is to be used in the production of modules or precursors of modules. In a first step, an isolated anode / cathode layer AL, KL is provided on a respective suppression or adhesive tray 212, 312. The isolated anode / cathode layer AL, KL is then transported by a stacking device 138 to a stacking station 133. There, the transported anode / cathode layer AL, KL is unstacked. At the stacking station 133, an electrode stack ES which has grown around the stacked anode / cathode layer AL, KL at the stacking station 133 is detected in at least one side view and / or including a vertical edge of the electrode stack ES. In a variant of the method, this capture of the side view or a vertical edge of the electrode stack ES provides an image capture.Finally, the alignment and / or position of the or each stacked anode / cathode layer AL, KL relative to the remaining electrode stack grown at the stacking location is checked.

[0084] A position of a stacked anode / cathode layer AL, KL relative to the remaining layers of the electrode stack ES is determined, for example, by checking the position / rotation / offset of the individual anode / cathode layers AL, KL relative to one another after the anode / cathode layers AL, KL have been deposited on the electrode stack ES. An offset of the individual anode / cathode layers (AL, KL) relative to one another can be determined, for example, by an image acquisition of at least one third camera 320 from at least one (vertical and / or transverse) edge of the electrode stack ES.For example, a received image can be checked using computer-aided image processing methods through corner / edge detection to determine whether one or more of the anode / cathode layers AL, KL of the electrode stack ES are laterally or longitudinally higher or lower than the remaining anode / cathode layers AL, KL, and / or whether a specified accuracy was maintained when stacking the anode / cathode layers AL, KL. A variant of the edge detection method uses a Canny algorithm (Canny edge detector), which produces an image that ideally contains only the edges of the original image.

[0085] Alternating anode layers AL and cathode layers KL of the electrode stack ES generally have different dimensions. This results in a stepped (vertical) edge in the z-direction when stacked when viewed from the side. Using the acquired images, this vertical edge or the two vertical edges kl, k2 (see Fig. 3) are examined. The stacked anode layers AL and cathode layers KL are examined for their shape and / or dimensions. In other variants, the stacked anode layers AL and cathode layers KL are examined to determine the deviation by which each individual layer protrudes laterally or longitudinally compared to the other anode or cathode layers AL, KL of the electrode stack ES. These overhangs / underhangs (ul, u2 in Fig.3) a rotation around the vertical axis (in theta) can also be determined, or with which deviation in the z-direction (vertical axis) the different anode / cathode layers (AL, KL) form steps (sl, s2 in Fig. 3) in the electrode stack.

[0086] Fig. 3, 3a illustrates how two third cameras 320 are directed from the side onto diagonally opposite corners e1, e2 and / or their edges kl, k2 (see Fig. 3) in the vertical axis (z-axis) of the electrode stack ES at the deposition point, as seen from above. Thus, the anode layers (AL) and cathode layers KL stacked on top of one another are examined to determine the deviation ul, u2 (see Fig. 3) in the x- or y-direction (transverse, longitudinal) with which each individual layer is above or below the other anode or cathode layers AL, KL of the electrode stack ES in the longitudinal and / or transverse direction of the layers. Thus, a deviation sl, s2 of the steps (see Fig. 3) in the z-direction (vertical axis) formed by the superimposed anode / cathode layers AL, KL in the electrode stack is to be examined.

[0087] The two third cameras 320 are aimed directly at a vertical edge of the electrode stack. Furthermore, a white spotlight 330 can be used to illuminate the respective edge of the electrode stack ES, illuminating the desired position at an angle of approximately 45° to the optical axis of the respective third camera 320.

[0088] In a variant shown in dashed lines in Fig. 3a, four third cameras 320' are directed vertically from above, with point emitters 330 (not shown), onto the four corners e1, e2, e3, e4 of the electrode stack at the deposition point, as seen from above. This allows the position of the uppermost stacked anode / cathode layer AL, KL to be determined in relation to at least one underlying layer of the electrode stack ES. By means of an image acquisition from each of the four cameras 320', after the anode / cathode layers AL, KL have been deposited on the electrode stack ES, the position / rotation / offset of the individual anode / cathode layers AL, KL relative to one another is checked. With the cameras 320 directed laterally onto the vertical edge of the electrode stack ES (see Fig. 3), movements of the lifting device 135 with the respective workpiece carrier 120 along the vertical axis (z-axis) can be determined by appropriate processing of the image captures.Before the anode / cathode layers AI, KL begin to be deposited to form the electrode stack ES, the x- and y-positions of the workpiece carrier at various z-heights are captured using the third cameras 320 from the resulting images. The corresponding data are stored for comparison with the x- and y-positions of the workpiece carrier at various z-heights during the depositing of the anode / cathode layers to verify whether the anode / cathode layers were stacked within a specified accuracy at the x- and y-position corresponding to the respective z-position of the workpiece carrier on the lifting device 135. In one variant, the data obtained above is used to correct the orientation in the direction of rotation around the z-axis (vertical axis) (in theta) when picking up the anode / cathode layers with the stacking device 138.

[0089] From the processed data of the image captures from the cameras, in particular at least one of the third cameras, it is also provided in a variant that the stacking device 138 is used to pick up an incorrectly deposited layer from the electrode stack ES again and optionally to deposit it correctly again on the electrode stack or to transport it to a position at which it is discarded.

[0090] The variants of the device described above, their construction and operating aspects, as well as the variants of the procedure, serve only to improve understanding of the structure, mode of operation, and properties; they do not restrict the disclosure to the exemplary embodiments. The figures are partly schematic. Key properties and effects are sometimes shown significantly enlarged in order to clarify the functions, operating principles, technical designs, and features. Each mode of operation, each principle, each technical design, and each feature disclosed in the figures or in the text can be integrated with all claims, each feature in the text, and in the other figures., other modes of operation, principles, technical embodiments and features contained in this disclosure or resulting therefrom can be freely and arbitrarily combined so that all conceivable combinations can be assigned to the described procedure. This also includes combinations between all individual embodiments in the text, i.e. in every section of the description, in the claims and also combinations between different variants in the text, in the claims and in the figures. The claims also do not limit the disclosure and thus the possible combinations of all the features shown with one another. All disclosed features are explicitly disclosed here, both individually and in combination with all other features.

Claims

Claims 1. An inspection procedure in the manufacture of modules or module precursors includes the following steps: - Providing a single anode / cathode layer (AL, KL) at a receiving point (221, 321); - Conveying a stacking device (138) to the receiving point (221, 321); - Picking up the anode / cathode position (AL, KL) from the pickup point (221, 321) by the stacking device (138); - Detecting the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL); Transporting the anode / cathode layer (AL, KL) to a stacking point (133) by the stacking device (138); - Alignment (in x, y, z, and / or theta) of the stacking device (138) with the transported anode / cathode position (AL, KL) relative to the stacking location (133); and - Stacking of the transported anode / cathode layer (AL, KL) at the stacking point (133).

2. The inspection method according to claim 1, wherein alternately - with a first stacking device (138) individual anode layers (AL) are transported from a first side to the stacking point (133), and - with a second stacking device (138) from an opposite second side, individual cathode layers (KL) are transported to the stacking point (133); and / or wherein alternately - with a first stacking device (138) individual anode layers (AL) are transported exclusively from the first side to the stacking point (133), and - with a second stacking device (138) individual cathode layers (KL) are transported exclusively from the opposite second side to the stacking point (133).

3. The inspection method according to claim 1 or 2, wherein the detection of the position and / or orientation of the anode / cathode position (AL, KL) - before the stacking device picks up the anode / cathode layer (AL, KL) (138) from the receiving station (221, 321) and / or - during the transport of the anode / cathode layer (AL, KL) by the stacking device (138) to the stacking point (133); and / or wherein - Determining the position and / or orientation of the anode / cathode position (AL, KL) - during the transport of the anode / cathode layer (AL, KL) by the stacking device (138) to the stacking location (133) by means of a first camera (260), and / or - before the anode / cathode position (AL, KL) is recorded by the stacking device (138) from the recording point (221, 321) by means of a second camera (220).

4. The inspection method according to claim 2 or 3, wherein: - the first and / or second camera (260, 220) at a perpendicular angle, ± approximately 25°, - top view of the anode / cathode position (AL, KL) capturing its position and / or orientation (in x, y, z, and / or theta); and / or - a light source (275, 225) assigned to one of the first and / or the second camera (260, 220) illuminates the anode / cathode layer (AL, KL) for image acquisition by the first or second camera (260, 220); and / or - the first and / or the second camera (260, 220) with an image acquisition system to fully capture the anode / cathode position (AL, KL) in order to determine their position and / or orientation (in x, y, z, and / or theta); and / or - the first and / or the second camera (260, 220) with a single image feed - an area, - at least one corner area, - two diagonal corner areas, and / or - capture at least one corner region and at least one section of an edge of the anode / cathode layer (AL, KL) to determine the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer (AL, KL); and / or - the first and / or the second camera (260, 220) are designed as line cameras that detect the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer (AL, KL) before being picked up by the stacking device (138) or upon its arrival at the pickup point (221, 321) or on the way to the pickup point (221, 321).

5. The inspection method according to any one of claims 1 to 4, wherein: - at least one optically effective element is placed in front of the first and / or the second camera (260, 220) in order to detect the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL) at one or more points or areas before being picked up by the stacking device (138) or when it arrives at the pickup point (221, 321) or on its way to the pickup point (221, 321).

6. The inspection method according to any one of claims 1 to 5, wherein: - Correction values ​​from - the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL) before their placement by the stacking device (138), - the position and / or orientation (in x, y, z, and / or theta) of the stacking device (138), and / or - the position and / or orientation (in x, y, z, and / or theta) of the recorded individual anode / cathode layer (AL, KL) during transport of the anode / cathode layer (AL, KL) to the stacking point (133); and - these correction values ​​when aligning (in x, y, z, and / or theta) the stacking device (138) with the transported anode / cathode position (AL, KL) relative to the stacking point (133) 133 be taken into account; and / or - these correction values ​​(in x, y, z, and / or theta) are taken into account when aligning the stacking device (138) for receiving the anode / cathode position (AL, KL) by the stacking device (138) in such a way that the anode / cathode position (AL, KL) is received by the stacking device (138) in a central zero position and / or aligned with the surroundings.

7. The inspection method according to any one of claims 1 to 6, wherein: - several isolated anode or cathode layers (AL, KL) are provided in groups at the respective receiving points (221, 321) according to the number of stacking units (130) in the stacking area (134).

8. A device for conveying and inspecting modules or pre-modules comprises: - a stacking device (138), designed and configured to receive a single anode / cathode layer (AL, KL) at a receiving point; - a conveying device (224), designed and equipped for conveying the stacking device (138) to and from the receiving point (221, 321); - a first camera (260), designed and set up to detect position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL) on its way from the pickup point (221, 321) to the stacking point (133); - an actuating device comprising at least one actuator, designed and configured for - Actuating the stacking device (138) to pick up the anode / cathode layer (AL, KL), and / or to - Aligning (in x, y, z, and / or theta) the stacking device (138) with the anode / cathode layer (AL, KL) relative to the stacking location (133) 133 during transport of the anode / cathode layer (AL, KL) to the stacking location (133) 133, and / or to the - Stacking of the anode / cathode layer (AL, KL) at the stacking point (133) 133.

9. The device for conveying and inspecting modules or precursors of modules according to claim 8, wherein a first stacking device (138) is provided and configured to transport individual anode layers (AL) from a first side, and a second stacking device (138) is provided and configured to transport individual cathode layers (KL) alternately from an opposite second side to the stacking point (133); and / or wherein the first stacking device (138) transports individual anode layers (AL) exclusively from the first side, and the second stacking device (138) transports individual cathode layers (KL) exclusively from the opposite second side.

10. The device for conveying and inspecting modules or precursors of modules according to claim 8 or 9, wherein - a first camera (260) is designed and configured to detect the position and / or orientation of the anode / cathode layer (AL, KL) during transport of the anode / cathode layer (AL, KL) through the stacking device (138) to the stacking location (133); and / or - a second camera (220) is designed and set up to detect the position and / or orientation of the anode / cathode layer (AL, KL) before the anode / cathode layer (AL, KL) is picked up by the stacking device (138) from the pickup point (221, 321).

11. The device for conveying and inspecting modules or pre-modules according to claim 8, 9 or 10, wherein - the first and / or the second camera (260, 220) are designed and configured to capture the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode (AL, KL) in a perpendicular, ± approximately 25°, top view; and / or - a light source (275, 225) assigned to one of the first and / or the second camera (260) is designed and configured to illuminate the anode / cathode layer (AL, KL) for image acquisition by the first or second camera (260); and / or - the first and / or the second camera (260, 220) are designed and configured to fully capture the anode / cathode position (AL, KL) with an image acquisition system in order to determine their position and / or orientation (in x, y, z, and / or theta); and / or - the first and / or second camera (260, 220) are designed and equipped to be equipped with an image feeder - an area, - at least one corner area, - two diagonal corner areas, and / or - to capture at least one corner region and at least one section of an edge of the anode / cathode layer (AL, KL) in order to capture the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer (AL, KL); and / or - the first and / or the second camera (260, 220) are designed as line cameras, which are intended and configured to detect the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL) before being picked up by the stacking device (138) or upon its arrival at the pickup point (221, 321) or on the way to the pickup point (221, 321).

12. The device for conveying and inspecting modules or pre-modules according to any one of claims 8 to 11, wherein - at least one optically effective element is placed in front of the first and / or the second camera (260, 220), designed and configured to determine the position and / or orientation (in x, y, z, and / or theta) at one or more locations or areas of the to determine the anode / cathode position (AL, KL) before being picked up by the stacking device (138) or upon its arrival at the picking point (221, 321) or on the way to the picking point (221, 321).

13. The device for conveying and inspecting modules or pre-modules according to any one of claims 8 to 12, wherein: - a control unit (ECU) is designed and configured to determine correction values ​​from the data from the capture device and / or the image capture of the first and / or second camera, whereby these correction values ​​can be determined from - the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position (AL, KL) before their placement by a stacking device (138), - the position and / or orientation (in x, y, z, and / or theta) of the stacking device (138), and / or - the position and / or orientation (in x, y, z, and / or theta) of the recorded individual anode / cathode layer (AL, KL) relative to the stacking device (138) during transport of the anode / cathode layer (AL, KL) to the stacking location (133); and - to take these correction values ​​into account when aligning (in x, y, z, and / or theta) the stacking device (138) with the transported anode / cathode position (AL, KL) relative to the stacking point (133) in setting commands to the setting device, the conveying device (224) and / or the stacking device (138); and / or - these correction values ​​take into account the orientation and location (in x, y, z, and / or theta) of the stacking device (138) when receiving the anode / cathode position (AL, KL) in positioning commands to the positioning device, the conveying device (224) and / or the stacking device (138) so that the stacking device (138) receives the respective anode / cathode position (AL, KL) in a central zero position and / or aligned with the electrode stack located at the stacking point (133).

14. The device for conveying and inspecting modules or pre-modules according to any one of claims 8 to 13, wherein the transport section (210, 310) is set up and designed to provide anode / cathode layers (AL, KL) in groups at several receiving points (221, 321) with respective suppression or holding trays (212, 312).

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