Monitoring system and methods

Abstract

A monitoring system (100). The monitoring system (100) comprises an emission system (106) comprising: one or more environment mapping emitters (108); and one or more targeting optical systems (110). Each environment mapping emitter (108) is configured to emit electromagnetic radiation at a respective targeting optical system (110) of the one or more targeting optical systems (110). Each targeting optical system (110) is configured to direct the electromagnetic radiation towards a respective target region of an environment of the monitoring system. The monitoring system (100) comprises a sensing system (120) that is configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters (108) that is reflected by the target regions of the environment.

Description

MONITORING SYSTEM AND METHODSTECHNICAL FIELD

[0001] The disclosure relates to a monitoring system. In particular, this disclosure relates to a monitoring system that is configured to emit electromagnetic radiation and generate data indicative of a state of the environment near the monitoring system based at least in part on the portion of this electromagnetic radiation that is reflected by the environment near the monitoring system and detected by a sensing system of the monitoring system. This disclosure also relates to a method of generating monitoring system output data. In particular, this disclosure relates to a method of generating monitoring system output data based at least in part on electromagnetic radiation that is incident to at least part of the monitoring system.BACKGROUND

[0002] Monitoring the state of an environment and any objects within that environment, over a period of time, presents a significant number of technical challenges. That said, there are considerable benefits that can be provided by accurately monitoring a particular environment and the objects within that environment. For example, manufacturing facilities often include complex manufacturing equipment and / or machinery. The incorrect use of machinery or faulty machinery can result in operators of the machinery or people that work in the vicinity of the machinery being exposed to hazards. Further, the incorrect use of machinery or faulty machinery can result in an increased risk of damage to the machinery.

[0003] For example, without effective systems of monitoring manufacturing machinery, personnel can be injured or trapped by moving parts of machines, such as by robotic arms, mobile carriers, travelling machine heads / blades etc. Further, in cooperative working environments (e.g., machining or assembly facilities), where humans and manufacturing machinery (e.g., robots) work alongside each other sharing the same space to complete tasks independently or sequentially, it can be beneficial to protect the humans from inadvertent movement or failure of the manufacturing machinery.

[0004] Light barriers are one type of system that may be used around or on machines to reduce the probability that personnel within the vicinity of the machine will be inadvertently injured. In such systems, light curtains and light beams are provided, with interruption of one or more of the light curtains or light beams slowing or stopping the relevant piece of machinery. However, these systems are largely incapable of providing useful information outside the scope of whether a particular physical boundary has been crossed.

[0005] Safety Integrity Levels (SILs) are prescribed for some industrial applications (manufacturing, machining, assembly). A SIL is a relative level of risk reduction provided by a safety function. SILs relate to the likelihood and severity of one or more hazards. SIL levelsdetermine the performance required to maintain and achieve safety and the probability of failure.

[0006] SILs are graded 1-4, with increasing number relating to an increase in prevailing risk of safety failure, and therefore the more stringent the safety requirements for that particular level 1-4.

[0007] Hazards created by operation of a machine or process determine the level of safety required and therefore the SIL required to be met. A safety assessment includes:1 . Determining the frequency or likelihood of a hazard occurring; and2. The severity of the consequences if an identified hazard does occur. The SIL level can then be set to reduce risk to personnel.

[0008] It is to be understood that, if any prior art publication is referred to herein, such reference does not constitute an admission that the publication forms a part of the common general knowledge in the art, in Australia or any other country.SUMMARY

[0009] In some embodiments, there is provided a monitoring system. The monitoring system may comprise: an emission system comprising: one or more environment mapping emitters; and one or more targeting optical systems. Each environment mapping emitter may be configured to emit electromagnetic radiation at a respective targeting optical system of the one or more targeting optical systems. Each targeting optical system may be configured to direct the electromagnetic radiation towards a respective target region of an environment of the monitoring system. The monitoring system may comprise a sensing system that is configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

[0010] In some embodiments, the environment mapping system comprises: a first emission module comprising: a first body; a first subset of the environment mapping emitters, each environment mapping emitter of the first subset of the environment mapping emitters being mounted to the first body; a first subset of the targeting optical systems, one or more of the targeting optical systems of the first subset of targeting optical systems being: mounted to the first body; and configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the first subset of the environment mapping emitters.

[0011] In some embodiments, an exterior surface of the first body defines a first plane; and each targeting optical system of the first subset of targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the first plane, thereby directing the electromagnetic radiation towards the respective target region.

[0012] In some embodiments, the environment mapping emitters of the first subset of environment mapping emitters are mounted to the first body such that they are coplanar.

[0013] In some embodiments, the emission system comprises: a second emission module comprising: a second body; a second subset of the environment mapping emitters, each environment mapping emitter of the second subset of the environment mapping emitters being mounted to the second body; a second subset of the targeting optical systems, each targeting optical system of the second subset of the targeting optical systems being: mounted to the second body; and configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the second subset of the environment mapping emitters.

[0014] In some embodiments, an exterior surface of the second body defines a second plane; and each of the second subset of the targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the second plane, thereby directing the electromagnetic radiation towards the respective target region.

[0015] In some embodiments, the first plane is transverse to the second plane.

[0016] In some embodiments, the second subset of the environment mapping emitters are mounted to the second body such that they are coplanar.

[0017] In some embodiments, the emission system comprises a one or more emission modules, each emission module comprising: a body; a subset of the environment mapping emitters, each environment mapping emitter of the subset of the environment mapping emitters being mounted to the body; a subset of the targeting optical systems, each targeting optical system of the subset of targeting optical systems being: mounted to the body; and configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter of the subset of environment mapping emitters, thereby directing the electromagnetic radiation towards the respective target region.

[0018] In some embodiments, the monitoring system comprises six emission modules.

[0019] In some embodiments, the one or more targeting optical systems comprises one or more of: a refractor; a reflector; and a diffractor.

[0020] In some embodiments, the emission system comprises: a depth testing system comprising: one or more depth testing emitters; and one or more depth testing optical systems; each depth testing emitter being configured to emit electromagnetic radiation at an associated depth testing optical system of the one or more depth testing optical systems.

[0021] In some embodiments, each depth testing optical system extends from an incident end portion to an emitting end portion, the incident end portion and the emitting end portion being separated by a length of the respective depth testing optical system.

[0022] In some embodiments, each depth testing optical system is configured to: direct at least some of the electromagnetic radiation that is emitted at its incident end portion by the respective depth testing emitter, along its length; and emit at least some of the electromagnetic radiation directed along its length from its emitting end portion.

[0023] In some embodiments, each of the depth testing optical systems comprises one or more of: a depth testing refractor; a depth testing reflector; and a depth testing diffractor.

[0024] In some embodiments, each depth testing optical system is configured to: totally internally reflect at least some of the electromagnetic radiation that is emitted at its incident end portion by the associated depth testing emitter, along its length; and emit at least some of the totally internally reflected electromagnetic radiation from its emitting end portion.

[0025] In some embodiments, the length of each depth testing optical system is different from the lengths of the other depth testing optical systems.

[0026] In some embodiments, the length of one or more of the depth testing optical systems is a multiple of the length of another one of the depth testing optical systems.

[0027] In some embodiments, the length of one or more of the depth testing optical systems is about 2m; the length of one or more of the depth testing optical systems is about 4m; the length of one or more of the depth testing optical systems is about 6m; and the length of one or more of the depth testing optical systems is about 8m.

[0028] In some embodiments, the depth testing system comprises a depth testing system body; and the depth testing emitters are mounted to the depth testing system body.

[0029] In some embodiments, each depth testing optical system is configured to be connected to the associated depth testing emitter such that the incident end portion of the respective depth testing optical system faces the respective depth testing emitter.

[0030] In some embodiments, a face of the depth testing system body defines a depth testing system body plane; and one or more of the depth testing optical systems extend away from the depth testing system body in a direction that is transverse to the depth testing system body plane.

[0031] In some embodiments, the depth testing optical systems curve to encircle an internal region of the monitoring system.

[0032] In some embodiments, the depth testing optical systems each comprise an optical fibre.

[0033] In some embodiments, the depth testing system comprises: four depth testing emitters; and four depth testing optical systems.

[0034] In some embodiments, the monitoring system further comprises a window that is transparent to a first range of electromagnetic wavelengths.

[0035] In some embodiments, the window is opaque to a second range of electromagnetic wavelengths.

[0036] In some embodiments, the monitoring system further comprises an optical filter that is transparent to some electromagnetic wavelengths and opaque to other electromagnetic wavelengths.

[0037] In some embodiments, the emission system comprises a planar testing system comprising one or more planar testing emitters.

[0038] In some embodiments, each planar testing emitter is configured to emit electromagnetic radiation at a respective target portion of the window.

[0039] In some embodiments, the monitoring system further comprises one or more planar testing optical systems; wherein: each planar testing emitter is configured to emit electromagnetic radiation at a respective planar testing optical system; and each planar testing optical system is configured to direct at least some of the electromagnetic radiation emitted from the respective planar testing emitter towards a respective target portion of the window.

[0040] In some embodiments, each planar testing optical system is configured to refract at least some of the electromagnetic radiation emitted from the respective planar testing emitter to direct the electromagnetic radiation towards the respective target portion of the window.

[0041] In some embodiments, the planar testing system further comprises a planar testing body; and the planar testing emitters are mounted to the planar testing body.

[0042] In some embodiments, the planar testing optical systems are mounted to the planar testing body.

[0043] In some embodiments, the planar testing emitters and the planar testing optical systems are mounted to the planar testing body to form an arrangement of planar testing emission units, each planar testing emission unit comprising one of the planar testing emitters and the associated planar testing optical system.

[0044] In some embodiments, the arrangement comprises a plurality of rows of planar testing emission units and a plurality of columns of planar testing emission units.

[0045] In some embodiments, the window is configured to reflect at least some of the electromagnetic radiation emitted by the planar testing emitters.

[0046] In some embodiments, a centre of each target portion of the window is equidistant from the centre of two or more other target portions of the window.

[0047] In some embodiments, the centres of the target portions of the window form a two-dimensional array on the window.

[0048] In some embodiments, the monitoring system further comprises a plurality of intensity testing optical systems, each intensity testing optical system being configured to redirect at least some of the electromagnetic radiation that is: emitted by one or more environment mapping emitter; and reflected off a surface of the window.

[0049] In some embodiments, one or more of the intensity testing optical systems comprises an intensity testing optical fibre.

[0050] In some embodiments, each intensity testing optical system: extends from an incident end portion to an emitting end portion; and is configured to: totally internally reflect, along its length, at least some of the electromagnetic radiation that is: emitted by one or more environment mapping emitter; and reflected off the surface of the window; and emit the totally internally reflected electromagnetic radiation from its emitting end portion.

[0051] In some embodiments, the sensing system comprises: a lens system defining an optical axis; and a sensor module; wherein the lens system is configured to focus incident electromagnetic radiation on the sensor module; and the sensor module is configured to: detect the incident electromagnetic radiation; and generate the sensing system data based at least in part on the detected incident electromagnetic radiation.

[0052] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation that is: emitted by the environment mapping emitters; and reflected by the target region of the environment at which the electromagnetic radiation emitted by the environment mapping emitters is directed by the respective targeting optical systems; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0053] In some embodiments, the lens system is configured to focus the electromagnetic radiation that is: emitted by the environment mapping emitters; and reflected by the target region of the environment at which the electromagnetic radiation is directed by the respective targeting optical systems; onto a first portion of the sensor module.

[0054] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation emitted from the emitting end portions of the depth test optical systems; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0055] In some embodiments, the emitting end portions of the depth testing optical systems are positioned such that they emit electromagnetic radiation that is totally internally reflected by the depth testing optical systems onto a second portion of the sensor module.

[0056] In some embodiments, there is no overlap between the first portion of the sensor module and the second portion of the sensor module.

[0057] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation that is: emitted by the planar testing emitters; and reflected by the window; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0058] In some embodiments, the lens system is configured to focus the electromagnetic radiation that is: emitted by the planar testing emitters; and reflected by the window; onto the first portion of the sensor module.

[0059] In some embodiments, the sensing system is configured to: detect ambient electromagnetic radiation; and generate the sensing system data based at least in part on the detected ambient electromagnetic radiation.

[0060] In some embodiments, the first emission module is disposed radially outwards from the optical axis.

[0061] In some embodiments, the second emission module is disposed radially outwards from the optical axis.

[0062] In some embodiments, each emission module is disposed radially outwards from the optical axis.

[0063] In some embodiments, the incident end portions of the intensity testing optical systems are disposed radially outwards from the environment mapping emitters, with respect to the optical axis.

[0064] In some embodiments, each intensity testing optical system is configured to emit at least part of the totally internally reflected electromagnetic radiation from its emitting end portion, towards the sensor module.

[0065] In some embodiments, each targeting optical system is configured to refract the electromagnetic radiation that is emitted by the respective environment mapping emitter to direct the electromagnetic radiation such that a reflected portion of the electromagnetic radiation that is reflected off the window avoids intersecting the lens system.

[0066] In some embodiments, the monitoring system further comprises a control system comprising: at least one processor; and memory accessible by the at least one processor, the memory storing program instructions that are configured to cause the at least one processor to control the emission system and the sensing system.

[0067] In some embodiments, the memory is configured to store the sensing system data.

[0068] In some embodiments, one or more of the environment mapping emitters, one or more of the plurality of depth testing emitters and / or one or more of the planar testing emitters comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 400nm and 1000nm.

[0069] In some embodiments, one or more of the environment mapping emitters, one or more of the plurality of depth testing emitters and / or one or more of the planar testing emitters comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm.

[0070] In some embodiments, the monitoring system further comprises a control system comprising: at least one processor; and memory storing program instructions accessible by the at least one processor.

[0071] In some embodiments, the program instructions are configured to cause the at least one processor to: energise the emission system in accordance with an emission sequence, such that the emission system emits electromagnetic radiation into an environment near the emission system; detect, using the sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system; determine the sensing system data based at least in part on the detected incident electromagnetic radiation; and generate monitoring system output data based at least in part on the sensing system data.

[0072] In some embodiments, the program instructions are configured to cause the at least one processor to: energise the depth testing system such that the depth testing system emits electromagnetic radiation from an end of at least one depth testing optical system towards a sensor module of a sensing system of the monitoring system; detect, using the sensing system,the electromagnetic radiation emitted from the end of the at least one depth testing optical system; determine the sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the end of the at least one depth testing optical system; comparing the sensing system data to a depth testing profile; in response to a value of one or more parameter of the sensing system data differing from a value of one or more parameter of the depth testing profile, adjusting a value of one or more control parameters of the monitoring system.

[0073] In some embodiments, the program instructions are configured to cause the at least one processor to: energise the planar testing system in accordance with a planar testing emission sequence, such that the planar testing system emits electromagnetic radiation towards a surface of the monitoring system; detect, using the sensing system, incident electromagnetic radiation, the incident electromagnetic radiation: being electromagnetic radiation that is incident to a sensor module of the sensing system; and comprising at least part of the electromagnetic radiation emitted by the planar testing system that is reflected by the surface; determine the sensing system data based at least in part on the detected incident electromagnetic radiation; compare the sensing system data to a planar test criterion; and in response to a value of one or more parameter of the sensing system data differing from a value of the planar test criterion, adjusting a value of one or more control parameters of the monitoring system.

[0074] In some embodiments, the program instructions are configured to cause the at least one processor to: energise the mapping emission system such that the mapping emission system emits electromagnetic radiation towards the window of the monitoring system; totally internally reflect at least some of the electromagnetic radiation that is: emitted by the mapping emission system; and reflected by the window; along a length of an intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from an emitting end portion of the intensity testing reflector, towards a sensor module of a sensing system of the monitoring system; detect, using the sensing system, the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; determine sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; compare the sensing system data to an intensity metric; and in response to a value of one or more parameter of the sensing system data differing from a value of the intensity metric, adjust a value of one or more control parameters of the monitoring system.

[0075] In some embodiments, there is provided a monitoring system. The monitoring system comprises an emission system. The emission system comprises one or more environment mapping emitters. Each environment mapping emitter is configured to emit electromagnetic radiation towards a respective target region of an environment of the monitoring system. The monitoring system comprises a sensing system. The sensing system is configured to generatesensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

[0076] In some embodiments, there is provided a method of generating monitoring system output data. The method may comprise energising a mapping emission system in accordance with an emission sequence, such that the mapping emission system emits electromagnetic radiation into an environment near the mapping emission system; detecting, using a sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic radiation; and generating the monitoring system output data based at least in part on the sensing system data.

[0077] In some embodiments, the mapping emission system comprises a plurality of environment mapping emitters; and energising the mapping emission system in accordance with the emission sequence comprises energising the environment mapping emitters in accordance with the emission sequence.

[0078] In some embodiments, energising the plurality of environment mapping emitters in accordance with the emission sequence comprises sequentially energising one or more subsets of the plurality of environment mapping emitters.

[0079] In some embodiments, energising the environment mapping emitters in accordance with the emission sequence comprises sequentially energising one environment mapping emitter at a time.

[0080] In some embodiments, energising the plurality of environment mapping emitters in accordance with the emission sequence comprises de-energising all of the environment mapping emitters between sequential energisations of the one or more subsets of environment mapping emitters.

[0081] In some embodiments, detecting incident electromagnetic radiation comprises: detecting incident electromagnetic radiation prior to energising the mapping emission system; and detecting incident electromagnetic radiation while the mapping emission system is being energised in accordance with the emission sequence.

[0082] In some embodiments, detecting incident electromagnetic radiation while the emission system is being energised in accordance with the emission sequence comprises detecting incident electromagnetic radiation: during each sequential energisation of the one or more subsets of environment mapping emitters; and while all of the environment mapping emitters are de-energised between sequential energisations of the one or more subsets of environment mapping emitters.

[0083] In some embodiments, determining the sensing system data comprises: determining energisation state data based at least in part on incident electromagnetic radiation emitted bythe mapping emission system during energisation; determining ambient state data based at least in part on ambient incident electromagnetic radiation.

[0084] In some embodiments, determining the sensing system data comprises comparing the energisation state data to the ambient state data.

[0085] In some embodiments, determining the sensing system data comprises subtracting at least some of the ambient state data from at least some of the energisation state data.

[0086] In some embodiments, the sensing system data comprises time difference data; the time difference data comprises a plurality of time difference data elements; each time difference data element is indicative of a difference in time between a first time and a second time; the first time is associated with a start of one of the energisations of the energisation sequence; and the second time is associated with a time at which an intensity of the detected incident electromagnetic radiation exceeds an intensity threshold.

[0087] In some embodiments, the sensing system data comprises a time difference data element for one or more sensing units of the sensing system, the sensing units being configured to be responsive to the intensity of the incident electromagnetic radiation.

[0088] In some embodiments, each time difference element is indicative of a distance the detected electromagnetic radiation emitted by the mapping emission system has travelled.

[0089] In some embodiments, the monitoring system output data comprises a matrix that is indicative of a state of the environment.

[0090] In some embodiments, the sensing system data is indicative of an intensity of the incident electromagnetic radiation.

[0091] In some embodiments, the method further comprises determining an operation scenario of the monitoring system, based at least in part on the sensing system data.

[0092] In some embodiments, in response to the operation scenario being determined to be a first operation scenario, generating the monitoring system output data comprises generating three-dimensional state data that is indicative of a state of at least part of the environment of the monitoring system.

[0093] In some embodiments, in response to the operation scenario being determined to be a second operation scenario, generating the monitoring system output data comprises generating an obstruction-free environment output.

[0094] In some embodiments, in response to the operation scenario being determined to be a third operation scenario, generating the monitoring system output data comprises generating a machinery shutdown output.

[0095] In some embodiments, the method further comprises detecting, using the sensing system, incident electromagnetic radiation, within a plurality of time windows, each time window being associated with one or more emissions of the emission sequence.

[0096] In some embodiments, a start of one or more of the time windows is delayed after the associated emission of the emission sequence by a predetermined time delay.

[0097] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a depth testing system of the monitoring system such that the depth testing system emits electromagnetic radiation from an end of at least one depth testing optical system towards a sensor module of a sensing system of the monitoring system; detecting, using the sensing system, the electromagnetic radiation emitted from the end of the at least one depth testing optical system; determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the end of the at least one depth testing optical system; comparing the sensing system data to a depth testing profile; and in response to a value of one or more parameter of the sensing system data differing from a value of one or more parameter of the depth testing profile, adjusting a value of one or more control parameters of the monitoring system.

[0098] In some embodiments, the sensing system data comprises a time difference parameter for each depth testing optical system; a value of each time difference parameter is indicative of a time difference between a first time and a second time; the first time corresponds to a time at which the depth testing system is energised; and the second time corresponds to a time at which the electromagnetic radiation emitted from the end of the respective depth testing optical system is detected by the sensing system.

[0099] In some embodiments, the value of one or more parameter of the sensing system data is the value of the time difference parameter(s).

[0100] In some embodiments, the one or more parameter of the depth testing profile comprises an expected time delay value indicative of an expected time delay between energisation of the depth testing system and detection of the electromagnetic radiation emitted from the end of the at least one depth testing reflector by the sensing system.

[0101] In some embodiments, the at least one depth testing optical system comprises a plurality of depth testing optical systems, each of a different length.

[0102] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise: energising a planar testing system of the monitoring system in accordance with a planar testing emission sequence, such that the planar testing system emits electromagnetic radiation towards a surface of the monitoring system; detecting, using a sensing system of the monitoring system, incident electromagnetic radiation, the incident electromagnetic radiation: being electromagnetic radiation that is incident to a sensor module of the sensing system; and comprising at least part of the electromagnetic radiation emitted by the planar testing system that is reflected by the surface; determining sensing system data based at least in part on the detected incident electromagnetic radiation; comparing the sensing system data to a planar test criterion; and in response to a value of one or more parameter of the sensing system data differing from a value of the planar test criterion, adjusting a value of one or more control parameters of the monitoring system.

[0103] In some embodiments, the planar testing system comprises a plurality of planar testing emitters; and energising the planar testing system in accordance with the planar test emission sequence comprises energising one or more subsets of the planar testing emitters.

[0104] In some embodiments, energising the planar testing system in accordance with the planar test emission sequence comprises sequentially energising one subset of the planar testing emitters at a time.

[0105] In some embodiments, each subset of the planartesting emitters comprises more than one planar testing emitter.

[0106] In some embodiments, the planar testing system comprises a first number of columns of planar testing emitters and a second number of rows of planar testing emitters.

[0107] In some embodiments, each subset of the plurality of planar testing emitters comprises one planar testing system emitter of each column and one planar testing system emitter of each row.

[0108] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a mapping emission system of the monitoring system such that the mapping emission system emits electromagnetic radiation towards a window of the monitoring system; totally internally reflecting at least some of the electromagnetic radiation that is: emitted by the mapping emission system; and reflected by the window; along a length of an intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from an emitting end portion of the intensity testing reflector, towards a sensor module of a sensing system of the monitoring system; detecting, using the sensing system, the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; comparing the sensing system data to an intensity metric; and in response to a value of one or more parameter of the sensing system data differing from a value of the intensity metric, adjusting a value of one or more control parameters of the monitoring system.

[0109] In some embodiments, the sensing system data comprises a value of an intensity parameter, the value of the intensity parameter being indicative of an intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system.

[0110] In some embodiments, a value of the intensity metric is indicative of a minimum operating intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing reflector.

[0111] In some embodiments, there is provided a monitoring system. The monitoring system may comprise an emission system. The emission system may comprise one or more environment mapping emitters. The emission system may comprise one or more targetingoptical systems. Each environment mapping emitter may be configured to emit electromagnetic radiation at a respective targeting optical system of the one or more targeting optical systems. Each targeting optical system may be configured to direct the electromagnetic radiation towards a respective target region of an environment of the monitoring system. The monitoring system may comprise a sensing system. The sensing system may be configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

[0112] In some embodiments, the environment mapping system comprises a first emission module. The first emission module may comprise a first body. The first emission module may comprise a first subset of the environment mapping emitters. Each environment mapping emitter of the first subset of environment mapping emitters may be mounted to the first body. The first emission module may comprise a first subset of the targeting optical systems. One or more of the targeting optical systems of the first subset of targeting optical systems may be mounted to the first body. One or more of the targeting optical systems of the first subset of targeting optical systems may be configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the first subset of the environment mapping emitters.

[0113] In some embodiments, an exterior surface of the first body defines a first plane. In some embodiments, each targeting optical system of the first subset of targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the first plane, thereby directing the electromagnetic radiation towards the respective target region.

[0114] In some embodiments, the environment mapping emitters of the first subset of environment mapping emitters are mounted to the first body such that they are coplanar.

[0115] In some embodiments, the emission system comprises a second emission module. The second emission module may comprise a second body. The second emission module may comprise a second subset of the environment mapping emitters. Each environment mapping emitter of the second subset of environment mapping emitters may be mounted to the second body. The second emission module may comprise a second subset of the targeting optical systems. Each targeting optical system of the second subset of targeting optical systems may be mounted to the second body. Each targeting optical system of the second subset of targeting optical systems may be configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the second subset of environment mapping emitters.

[0116] In some embodiments, an exterior surface of the second body defines a second plane. In some embodiments, each targeting optical system of the second subset of targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the second plane, thereby directing the electromagnetic radiation towards the respective target region.

[0117] In some embodiments, the first plane is transverse to the second plane.

[0118] In some embodiments, the second subset of environment mapping emitters are mounted to the second body such that they are coplanar.

[0119] In some embodiments, the first emission module and the second emission module are radially offset from an axial axis of the monitoring system by the same amount.

[0120] In some embodiments, the emission system comprises a plurality of emission modules, each emission module comprising: a body; a subset of the environment mapping emitters, each environment mapping emitter of a respective subset of environment mapping emitters being mounted to the body of the respective emission module; a subset of the targeting optical systems, each targeting optical system of a respective subset of targeting optical systems being: mounted to the body; and configured to redirect electromagnetic radiation emitted from an environment mapping emitter of the respective subset of environment mapping emitters, thereby directing the electromagnetic radiation towards the respective target region.

[0121] In some embodiments, the monitoring system comprises six emission modules.

[0122] In some embodiments, the one or more targeting optical systems are configured to manipulate electromagnetic radiation.

[0123] In some embodiments, one or more of the targeting optical systems comprises one or more of: a refractor; a reflector; a diffractor; an optical splitter; an optical filter; an optical switch; an optical transmitter; and an optical disperser.

[0124] In some embodiments, the target region at which electromagnetic radiation emitted by a particular environment mapping emitter is directed is the target region of that environment mapping emitter.

[0125] In some embodiments, the target region of at least one environment mapping emitter is different to the target region of another environment mapping emitter.

[0126] In some embodiments, the target region of at least one environment mapping emitter overlaps the target region of another environment mapping emitter.

[0127] In some embodiments, at least one of the environment mapping emitters emits electromagnetic radiation with a first emission profile. In some embodiments, at least one of the environment mapping emitters emits electromagnetic radiation with a second emission profile.

[0128] In some embodiments, the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the first emission profile is different to the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the second emission profile.

[0129] In some embodiments, the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the first emission profile overlaps the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the second emission profile.

[0130] In some embodiments, the monitoring system comprises at least one pair of environment mapping emitters. The at least one pair of environment mapping emitters may comprise: a first environment mapping emitter that is configured to emit electromagnetic radiation with the first emission profile; and a second environment mapping emitter that is configured to emit electromagnetic radiation with the second emission profile. The target region of the first environment mapping emitter may be the same as the target region of the second environment mapping emitter. At least one of the environment mapping emitters may be configured to: emit electromagnetic radiation with a first emission profile; and emit electromagnetic radiation with a second emission profile.

[0131] In some embodiments, the emission system comprises a depth testing system. The depth testing system may comprise one or more depth testing emitters. The depth testing system may comprise one or more depth testing optical systems. Each depth testing emitter may be configured to emit electromagnetic radiation at an associated depth testing optical system of the one or more depth testing optical systems.

[0132] In some embodiments, one or more of the depth testing optical systems are configured to manipulate electromagnetic radiation.

[0133] In some embodiments, the depth testing optical systems are configured to introduce an optical delay.

[0134] In some embodiments, a plurality of the depth testing optical systems extend from an incident end portion to an emitting end portion, the incident end portion and the emitting end portion being separated by a length of the respective depth testing optical system.

[0135] In some embodiments, the depth testing optical systems are configured to direct at least some of the electromagnetic radiation that is emitted at the incident end portion of the respective depth testing optical system, by the respective depth testing emitter, along its length. In some embodiments, the depth testing optical systems are configured to emit at least some of the electromagnetic radiation directed along the length of the respective depth testing optical system from the emitting end portion of the respective depth testing optical system.

[0136] In some embodiments, each of the depth testing optical systems comprises one or more of: a depth testing refractor; a depth testing reflector; a depth testing diffractor; a depth testing optical splitter; a depth testing optical filter; a depth testing optical switch; a depth testing optical transmitter; and a depth testing optical disperser.

[0137] In some embodiments, at least one of the depth testing optical systems is configured to: totally internally reflect at least some of the electromagnetic radiation that is emitted at its incident end portion by the associated depth testing emitter, along its length; and emit at least some of the totally internally reflected electromagnetic radiation from its emitting end portion.

[0138] In some embodiments, the length of at least one of the depth testing optical systems is different from the length of at least one other depth testing optical system.

[0139] In some embodiments, the length of one or more of the depth testing optical systems is a multiple of the length of another of the depth testing optical systems.

[0140] In some embodiments, the length of one or more of the depth testing optical systems is about 2m. In some embodiments, the length of one or more of the depth testing optical systems is about 4m. In some embodiments, the length of one or more of the depth testing optical systems is about 6m. In some embodiments, the length of one or more of the depth testing optical systems is about 8m.

[0141] In some embodiments, the depth testing system comprises a depth testing system body; and the depth testing emitters are mounted to the depth testing system body.

[0142] In some embodiments, the depth testing system body is oriented in a way that is transverse to the first body of the first emission module.

[0143] In some embodiments, each depth testing optical system is configured to be connected to the associated depth testing emitter such that the incident end portion of the respective depth testing optical system faces the respective depth testing emitter.

[0144] In some embodiments, a face of the depth testing system body defines a depth testing system body plane. In some embodiments, one or more of the depth testing optical systems extend away from the depth testing system body in a direction that is transverse to the depth testing system body plane.

[0145] In some embodiments, one or more of the depth testing optical systems curve to encircle an internal region of the monitoring system.

[0146] In some embodiments, a plurality of the depth testing optical systems comprise an optical fibre.

[0147] In some embodiments, the optical fibres curve to encircle the internal region of the monitoring system.

[0148] In some embodiments, one or more of the optical fibres encircles the internal region of the monitoring system a different number of times to another of the optical fibres.

[0149] In some embodiments, the depth testing system comprises: four depth testing emitters; and four depth testing optical systems.

[0150] In some embodiments, the emission system comprises a planar testing system. The planar testing system may comprise one or more planar testing emitters. Each planar testing emitter may be configured to emit electromagnetic radiation.

[0151] In some embodiments, the planar testing system comprises one or more planar testing optical systems. Each planar testing emitter may be configured to emit electromagnetic radiation at a respective planar testing optical system. Each planar testing optical system may be configured to direct at least some of the electromagnetic radiation emitted at it from the respective planar testing emitter towards a respective planar testing target area.

[0152] In some embodiments, each of the planar testing optical systems comprises one or more of: a planar testing refractor; a planar testing reflector; a planar testing diffractor; a planartesting optical splitter; a planar testing optical filter; a planar testing optical switch; a planar testing optical transmitter; and a planar testing optical disperser.

[0153] In some embodiments, the monitoring system further comprises a window that is optically transparent to at least some electromagnetic radiation.

[0154] In some embodiments, each planar testing emitter is configured to emit electromagnetic radiation that is directed at a respective target portion of the window.

[0155] In some embodiments, each planar testing target area is a respective target portion of the window.

[0156] In some embodiments, each planar testing optical system is configured to refract at least some of the electromagnetic radiation emitted from the respective planar testing emitter to direct the electromagnetic radiation towards the respective target portion of the window.

[0157] In some embodiments, a centre of each target portion of the window is equidistant from the centre of two or more other target portions of the window.

[0158] In some embodiments, the centres of the target portions of the window form a two- dimensional array on the window.

[0159] In some embodiments, the target portions of the window are irregularly distributed across the window.

[0160] In some embodiments, the window is configured to reflect at least some of the electromagnetic radiation emitted by the planar testing emitters.

[0161] In some embodiments, the monitoring system further comprises an intensity testing system,. The intensity testing system may comprise a plurality of intensity testing optical systems. The intensity testing optical systems may be configured to redirect at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter.

[0162] In some embodiments, each of the intensity testing optical systems comprises one or more of: an intensity testing refractor; an intensity testing reflector; an intensity testing diffractor; an intensity testing optical splitter; an intensity testing optical filter; an intensity testing optical switch; an intensity testing optical transmitter; and an intensity testing optical disperser.

[0163] In some embodiments, one or more of the intensity testing optical systems comprises an intensity testing optical fibre.

[0164] In some embodiments, each intensity testing optical system extends from an incident end portion to an emitting end portion. In some embodiments, each intensity testing optical system is configured to totally internally reflect, along its length, at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter; and reflected off one or more of the planar testing target areas. In some embodiments, each intensity testing optical system is configured to emit the totally internally reflected electromagnetic radiation from its emitting end portion.

[0165] In some embodiments, the intensity testing optical systems are configured to redirect at least some of the electromagnetic radiation that is: emitted by one or more environment mapping emitter; and reflected off a surface of the window.

[0166] In some embodiments, the sensing system comprises a lens system defining an optical axis. In some embodiments, the sensing system comprises a sensor module. The lens system may be configured to focus incident electromagnetic radiation on the sensor module. The sensor module may be configured to detect the incident electromagnetic radiation; and generate the sensing system data based at least in part on the detected incident electromagnetic radiation.

[0167] In some embodiments,

[0168] In some embodiments, the sensing system is configured to detect the electromagnetic radiation that is emitted by the environment mapping emitters and reflected by the target regions of the environment at which the electromagnetic radiation emitted by the environment mapping emitters is directed by the respective targeting optical systems. In some embodiments, the sensing system is configured to generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0169] In some embodiments, the lens system is configured to focus the electromagnetic radiation that is: emitted by the environment mapping emitters; and reflected by the target regions of the environment at which the electromagnetic radiation is directed by the respective targeting optical systems; onto a first portion of the sensor module.

[0170] In some embodiments, the sensing system is configured to detect the electromagnetic radiation emitted by the depth testing emitters; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0171] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation emitted from the emitting end portions of the depth test optical systems; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0172] In some embodiments, the emitting end portions of the depth testing optical systems are positioned such that the depth testing optical systems emit electromagnetic radiation that has been totally internally reflected along the length of the respective depth testing optical system onto a second portion of the sensor module.

[0173] In some embodiments, there is no overlap between the first portion of the sensor module and the second portion of the sensor module.

[0174] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation that is emitted by the planar testing emitters; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0175] In some embodiments, the lens system is configured to focus the electromagnetic radiation that is emitted by the planar testing emitters onto the sensor module.

[0176] In some embodiments, the lens system is configured to focus the electromagnetic radiation that is emitted by the planar testing emitters onto the first portion of the sensor module.

[0177] In some embodiments, the sensing system is configured to: detect the electromagnetic radiation that is: emitted by the planar testing emitters; and reflected by the window.

[0178] In some embodiments, the electromagnetic radiation that is emitted by the planar testing emitters is directed onto the sensor module.

[0179] In some embodiments, the electromagnetic radiation that is emitted by the planar testing emitters is directed directly onto the sensor module.

[0180] In some embodiments, the electromagnetic radiation that is emitted by the planar testing emitters bypasses the lens system.

[0181] In some embodiments, the planar testing system further comprises a planar testing body. In some embodiments, the planar testing emitters are mounted to the planar testing body. In some embodiments, the planar testing optical systems are mounted to the planar testing body.

[0182] In some embodiments, the planar testing emitters and the planar testing optical systems are mounted to the planar testing body to form an arrangement of planar testing emission units, each planar testing emission unit comprising one of the planar testing emitters and an associated planar testing optical system.

[0183] In some embodiments, the arrangement comprises a plurality of rows of planar testing emission units and a plurality of columns of planar testing emission units. In some embodiments, the planar testing emission units are irregularly disposed on the planar testing body.

[0184] In some embodiments, the sensing system is configured to detect ambient electromagnetic radiation. In some embodiments, the sensing system is configured to generate the sensing system data based at least in part on the detected ambient electromagnetic radiation.

[0185] In some embodiments, the first emission module is disposed radially outwards from the optical axis. In some embodiments, the second emission module is disposed radially outwards from the optical axis. In some embodiments, each emission module is disposed radially outwards from the optical axis. In some embodiments, each emission module is intersected by a common plane that is orthogonal to the optical axis.

[0186] In some embodiments, the incident end portions of the intensity testing optical systems are disposed radially outwards from the environment mapping emitters, with respect to the optical axis.

[0187] In some embodiments, each intensity testing optical system is configured to emit at least part of the totally internally reflected electromagnetic radiation from its emitting end portion, towards the sensor module.

[0188] In some embodiments, each targeting optical system is configured to refract the electromagnetic radiation that is emitted by the respective environment mapping emitter to direct the electromagnetic radiation such that a reflected portion of the electromagnetic radiation that is reflected off the window avoids intersecting the lens system.

[0189] In some embodiments, an inner emission angle of an emission angle range associated with at least one environment mapping emitter is greater than an inner emission angle threshold at which electromagnetic radiation emitted by the at least one environment mapping emitter will encounter the lens system. In some embodiments, the inner emission angle and the inner emission angle threshold are angles measured with respect to a frontal plane that is orthogonal to the optical axis.

[0190] In some embodiments, at least one of the environment mapping system, the depth testing system and the planar testing system comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 200nm and 3000nm.

[0191] In some embodiments, at least one of the environment mapping system, the depth testing system and the planar testing system comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm.

[0192] In some embodiments, the monitoring system further comprises an optical filter that is transparent to some electromagnetic radiation and opaque to other electromagnetic radiation. In some embodiments, the optical filter is a multi-band pass optical filter. In some embodiments, the window comprises the optical filter. In some embodiments, the lens system comprises the optical filter.

[0193] In some embodiments, the monitoring system further comprises a control system. The control system may comprise at least one processor. The control system may comprise memory storing program instructions accessible by the at least one processor.

[0194] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one of the environment mapping emitters from a first emission commencement time to a first emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards a first obstruction within an environment of the monitoring system, between the first emission commencement time and the first emission end time. The first obstruction may be at least partially optically transparent. The first obstruction may be between the monitoring system and a second obstruction. In some embodiments, the program instructions are configured to cause the at least one processor to commence a detection operation of the sensing system at a first gate time. In some embodiments, the program instructions are configured to cause the at least one processor to terminate the detection operation at a second gate time that is after the first gate time, the second gate time differing from the first gate time by a gate width. In some embodiments, the program instructions are configured to cause the at least one processor tostore sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0195] In some embodiments, the first gate time differs from the first emission commencement time by a detection time offset. In some embodiments, the detection time offset is a positive offset. In some embodiments, the detection time is a negative offset.

[0196] In some embodiments, the first gate time is the same as the first emission commencement time.

[0197] In some embodiments, the first gate time is associated with a first distance from the monitoring system. In some embodiments, the second gate time is associated with a second distance from the monitoring system; the second distance being greater than the first distance. In some embodiments, at least part of the first obstruction is spaced apart from the monitoring system by a distance that greater than the first distance and less than the second distance. In some embodiments, the gate width is proportional to the difference between the first distance and the second distance.

[0198] In some embodiments, the electromagnetic radiation detected during the detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the first obstruction.

[0199] In some embodiments, the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation is stored in memory as a first time-of-flight data array.

[0200] In some embodiments, the program instructions are configured to cause the at least one processor to iteratively commence and terminate a plurality of detection operations of the sensing system. Each detection operation may be commenced at a respective commencement gate time. Each detection operation may be terminated at a respective termination gate time. In some embodiments, the program instructions are configured to cause the at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the iteratively performed detection operations. The electromagnetic radiation detected during a plurality of the iteratively performed detection operations may include electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

[0201] In some embodiments, the electromagnetic radiation detected during a second plurality of the iteratively performed detection operations includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

[0202] In some embodiments, the program instructions are configured to cause the at least one processor to commence a second detection operation of the sensing system at a third gate time. The third gate time may be after the first gate time. The third gate time may differ from thefirst gate time by a gate offset. In some embodiments, the program instructions are configured to cause the at least one processor to terminate the second detection operation at a fourth gate time that is after the third gate time. The fourth gate time may differ from the third gate time by a second gate width. In some embodiments, the program instructions are configured to cause the at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation.

[0203] In some embodiments, the gate offset is equal to or greater than a difference between the first gate time and the second gate time. In some embodiments, the second detection operation is one of the plurality of iteratively performed detection operations. In some embodiments, the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the second obstruction, after passing through the first obstruction.

[0204] In some embodiments, the third gate time differs from the first emission commencement time by a second detection time offset. The second detection time offset may be greater than the first detection time offset.

[0205] In some embodiments, the third gate time is associated with a third distance from the monitoring system. In some embodiments, the fourth gate time is associated with a fourth distance from the monitoring system. In some embodiments, the fourth distance is greater than the third distance. In some embodiments, at least part of the second obstruction is spaced apart from the monitoring system by a distance that is greater than the third distance and less than the fourth distance.

[0206] In some embodiments, the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction, after passing through the first obstruction.

[0207] In some embodiments, the program instructions are further configured to cause the at least one processor to energise at least one of the environment mapping emitters from a second emission commencement time to a second emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards the target region associated with the at least one environment mapping emitter, between the second emission commencement time and the second emission end time.

[0208] In some embodiments, the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are the same environment mapping emitter(s) as those energised between the first emission commencement time and the first emission end time. In some embodiments, the environment mapping emitter(s) energised between the second emission commencement time and the second emission endtime are different environment mapping emitter(s) to those energised between the first emission commencement time and the first emission end time.

[0209] In some embodiments, the program instructions are configured to cause the at least one processor to determine at least one subsequent environment mapping emitter to energise during a second emission, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation. In some embodiments, the at least one environment mapping emitter energised from the second emission commencement time to the second emission end time is the determined subsequent environment mapping emitter.

[0210] In some embodiments, the program instructions are configured to cause the at least one processor to determine the second gate width, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0211] In some embodiments, the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction without passing through the first obstruction.

[0212] In some embodiments, the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation is stored in memory as a second time-of-flight data array.

[0213] In some embodiments, the second emission commencement time is after the first emission end time; and at or before the third gate time. In some embodiments, the second emission end time is after the first emission end time; and at or before the fourth gate time.

[0214] In some embodiments, incident electromagnetic radiation detected during the second detection operation comprises electromagnetic radiation that was emitted by the at least one environment mapping emitter between the second emission commencement time and the second emission end time.

[0215] In some embodiments, the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least in part on the sensing system data.

[0216] In some embodiments, the monitoring system output comprises monitoring system output data.

[0217] In some embodiments, the sensing system data generated in response to incident electromagnetic radiation detected during the detection operation is indicative of a characteristic of the first obstruction.

[0218] In some embodiments, the sensing system data generated in response to incident electromagnetic radiation detected during the second detection operation is indicative of a characteristic of the second obstruction.

[0219] In some embodiments, the characteristic of the first obstruction is associated with at least one of: a distance of the first obstruction from the monitoring system; a dimension of the first obstruction; an obstruction label for the first obstruction, the obstruction label identifying a type of the first obstruction; an opacity of the first obstruction; a reflectiveness of the first obstruction; a brightness of the first obstruction.

[0220] In some embodiments, the characteristic of the second obstruction is associated with at least one of: a distance of the second obstruction from the monitoring system; a dimension of the second obstruction; an obstruction label for the second obstruction, the obstruction label identifying a type of the second obstruction; an opacity of the second obstruction; a reflectiveness of the second obstruction; and a brightness of the second obstruction.

[0221] In some embodiments, the first obstruction is within a first distance range, with respect to the monitoring system, that is associated with the first gate time and the second gate time.

[0222] In some embodiments, the second obstruction is within a second distance range, with respect to the monitoring system, that is associated with the third gate time and the fourth gate time.

[0223] In some embodiments, an outer profile of the first obstruction wholly contains an outer profile of the second obstruction.

[0224] In some embodiments, the monitoring system output comprises a three-dimensional model of at least part of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

[0225] In some embodiments, the monitoring system output comprises a time-of-flight data array.

[0226] In some embodiments, the at least one subsequent environment mapping emitter emits electromagnetic radiation, between the second emission commencement time and the second emission end time, with a different emission profile to that emitted between the first emission commencement time and the first emission end time.

[0227] In some embodiments, the program instructions are configured to cause the at least one processor to determine the different emission profile, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0228] In some embodiments, a frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, is different to the frequency of the electromagnetic radiation emitted by the at least one environment mapping emitter, between the first emission commencement time and the first emission end time.

[0229] In some embodiments, the program instructions are configured to cause the at least one processor to determine the frequency of the electromagnetic radiation emitted by the atleast one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0230] In some embodiments, the monitoring system output adjusts a value of at least one control parameter.

[0231] In some embodiments, the at least one control parameter comprises a control parameter of the monitoring system, and is associated with at least one of: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

[0232] In some embodiments, the monitoring system output adjusts a value of one or more control parameters of another apparatus, the apparatus being within the environment of the monitoring system.

[0233] In some embodiments, the monitoring system output shuts down another apparatus, the apparatus being within the environment of the monitoring system.

[0234] In some embodiments, the second object is an apparatus. In some embodiments, the at least one control parameter comprises a control parameter of the apparatus.

[0235] In some embodiments, adjusting the value of the at least one control parameter shuts down the apparatus.

[0236] In some embodiments, the program instructions are further configured to cause the at least one processor to control the sensor system to perform an ambient state detection operation. In some embodiments, the program instructions are further configured to cause the at least one processor to store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation. In some embodiments, the ambient state detection operation is conducted over a time period in which detected incident electromagnetic radiation is only ambient electromagnetic radiation.

[0237] In some embodiments, the program instructions are configured to cause the at least one processor to determine the monitoring system output based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation.

[0238] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one environment mapping emitter such that the environmentmapping emitter emits electromagnetic radiation at and through a first obstruction in the environment of the monitoring system. In some embodiments, the program instructions are configured to cause the at least one processor to store sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by the first obstruction. In some embodiments, the program instructions are configured to cause the at least one processor to store sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by a second obstruction that is behind the first obstruction.

[0239] In some embodiments, the program instructions are configured to cause the at least one processor to perform a first detection operation, using the sensing system, over a first time window. In some embodiments, the program instructions are configured to cause the at least one processor to perform a second detection operation, using the sensing system, over a second time window. In some embodiments, the second time window is after the first time window. In some embodiments, the sensing system data is generated based at least in part on electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the first obstruction that is detected during the first time window; and electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction during the second time window.

[0240] In some embodiments, the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least in part on the sensing system data.

[0241] In some embodiments, the monitoring system output comprises at least one of: a characteristic of the first obstruction; a characteristic of the second obstruction; a time-of-flight data array; and a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

[0242] In some embodiments, the monitoring system output adjusts a value of at least one control parameter.

[0243] In some embodiments, the at least one control parameter comprises a control parameter of the monitoring system, and is associated with at least one of: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

[0244] In some embodiments, the monitoring system output is configured to adjust a value of one or more control parameters of another apparatus, the apparatus being within the environment of the monitoring system. In some embodiments, the second object is an apparatus. In some embodiments, the at least one control parameter comprises a control parameter of the apparatus.

[0245] In some embodiments, the environment mapping emitters are activated in accordance with an emission sequence that comprises sequentially activating a plurality of the environment mapping emitters.

[0246] In some embodiments, the program instructions are configured to cause the at least one processor to energise the emission system in accordance with an emission sequence, such that the emission system emits electromagnetic radiation into an environment near the emission system. In some embodiments, the program instructions are configured to cause the at least one processor to detect, using the sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system. In some embodiments, the program instructions are configured to cause the at least one processor to determine sensing system data based at least in part on the detected incident electromagnetic radiation. In some embodiments, the program instructions are configured to cause the at least one processor to generate monitoring system output data based at least in part on the sensing system data.

[0247] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one depth testing emitter from a depth emission commencement time to a depth testing emission end time, such that the at least one depth testing emitter emits electromagnetic radiation that is directed towards the associated depth testing optical system. In some embodiments, the program instructions are configured to cause the at least one processor to detect, using the sensing system, electromagnetic radiation that is emitted from the emitting end portion of the at least one depth testing optical system. In some embodiments, the program instructions are configured to cause the at least one processor to determine the sensing system data based at least in part on the detected electromagnetic radiation. In some embodiments, the program instructions are configured to cause the at least one processor to compare the sensing system data to a depth testing profile. In some embodiments, in response to a value of at least one parameter of the sensing system data differing from a value of at least one corresponding parameter of the depth testing profile, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter.

[0248] In some embodiments, the program instructions are configured to cause the at least one processor to energise each depth testing emitter from respective depth emission commencement times to respective depth testing emission end times. In some embodiments, the program instructions are configured to cause the at least one processor to detect, using thesensing system, electromagnetic radiation that is emitted from the depth testing optical systems. In some embodiments, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0249] In some embodiments, the program instructions are configured to cause the at least one processor to: determine sensing system data based at least in part on the detected electromagnetic radiation, the sensing system data comprising a time delay associated with each depth testing emitter; the time delay associated with a particular depth testing emitter indicating a time between the energisation of that depth testing emitter and the detection of electromagnetic radiation emitted from the depth testing optical system associated with that depth testing emitter.

[0250] In some embodiments, the program instructions are configured to cause the at least one processor to compare the sensing system data to a depth testing profile, the depth testing profile comprising an expected time delay parameter for each depth testing emitter. In some embodiments, the program instructions are configured to cause the at least one processor to adjust the value of the at least one control parameter in response to at least one of the determined time delays differing from a value of a corresponding expected time delay parameter of the depth testing profile.

[0251] In some embodiments, the at least one control parameter comprises at least one control parameter of the monitoring system.

[0252] In some embodiments, adjusting the value of the at least one control parameters causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0253] In some embodiments, the at least one control parameter comprises at least one control parameter of another apparatus.

[0254] In some embodiments, adjusting the value of the at least one control parameters causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0255] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one planar testing emitter from a planar emission commencement time to a planar emission end time, such that the at least one planar testing system emitter emits electromagnetic radiation that is directed towards the associated planar testing system optical system. In some embodiments, the program instructions are configured to cause the at least one processor to detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one planar testing emitter between the planar emission commencement time and the planar emission end time. In some embodiments, the program instructions are configured to cause the at least one processor to determine sensing system data based at least in part on thedetected electromagnetic radiation. In some embodiments, the program instructions are configured to cause the at least one processor to compare the sensing system data to a planar test criterion. In some embodiments, in response to a value of at least one parameter of the sensing system data differing from a value of the planar test criterion, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter.

[0256] In some embodiments, the program instructions are configured to cause the at least one processor to energise each planar testing emitter from respective planar emission commencement times to respective planar emission end times. In some embodiments, the program instructions are configured to cause the at least one processor to detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the planar testing emitters. In some embodiments, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0257] In some embodiments, the detected electromagnetic radiation comprises electromagnetic radiation that is emitted by at least one planar testing emitter; reflected by the window; and incident to the sensor module.

[0258] In some embodiments, the program instructions are configured to cause the at least one processor to: determine sensing system data based at least in part on the detected electromagnetic radiation; and adjust the value of the at least one control parameter in response to a value of at least one parameter of the sensing system data differing from a value of a planar test criterion.

[0259] In some embodiments, the planar test criterion comprises at least one of: a time delay criterion associated with a time delay between the planar emission commencement time and a time at which the electromagnetic radiation emitted by a respective planar testing emitter is detected at the sensor module; and a position criterion associated with a position on the sensor module at which the electromagnetic radiation emitted by a respective planar testing emitter is detected.

[0260] In some embodiments, the at least one control parameter comprises at least one control parameter of the monitoring system.

[0261] In some embodiments, adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0262] In some embodiments, the at least one control parameter comprise at least one control parameter of another apparatus.

[0263] In some embodiments, adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0264] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one of the environment mapping emitters from an intensity emission commencement time to an intensity emission end time. In some embodiments, the program instructions are configured to cause the at least one processor to detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time and directed toward the sensor module by the at least one intensity testing optical system. In some embodiments, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0265] In some embodiments, the program instructions are configured to cause the at least one processor to energise at least one of the environment mapping emitters from an intensity emission commencement time to an intensity emission end time, such that the at least environment mapping emitter emits electromagnetic radiation that is directed towards the window. In some embodiments, the program instructions are configured to cause the at least one processor to detect electromagnetic radiation that: is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module; and comprises electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time, that has been reflected off the window and directed towards the sensor module by the at least one intensity testing optical system. In some embodiments, the program instructions are configured to cause the at least one processor to determine sensing system data based at least in part on the detected electromagnetic radiation. In some embodiments, in response to a value of one or more parameter of the sensing system data differing from a value of at least one intensity metric, the program instructions are configured to cause the at least one processor to adjust a value of at least one control parameter.

[0266] In some embodiments, the at least one intensity testing optical system totally internally reflects at least some of the electromagnetic radiation that is: emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time; and reflected by the window; along a length of the at least one intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from the emitting end portion of the intensity testing reflector, towards the sensor module.

[0267] In some embodiments, the at least one intensity metric is associated with an expected intensity of the electromagnetic radiation that is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module, the at least one intensity metric comprising an allowable intensity range.

[0268] In some embodiments, the intensity emission commencement time is the first emission commencement time and the intensity emission end time is the intensity emission end time.

[0269] In some embodiments, the at least one control parameter comprises at least one control parameter of the monitoring system.

[0270] In some embodiments, adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0271] In some embodiments, the at least one control parameter comprises at least one control parameter of another apparatus.

[0272] In some embodiments, adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0273] In some embodiments, there is provided a monitoring system. The monitoring system may comprise an emission system comprising one or more environment mapping emitters, each environment mapping emitter being configured to emit electromagnetic radiation towards a respective target region of an environment of the monitoring system; and a sensing system that is configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

[0274] In some embodiments, there is provided a monitoring system. The monitoring system may comprise an environment mapping emitter configured to emit an emission at a respective target region of an environment of the monitoring system; and a sensing system that is configured to generate sensing system data based at least in part on a portion of the emission emitted by the environment mapping emitter that is reflected by the target region of the environment.

[0275] In some embodiments, there is provided a method. The method may comprise energising a mapping emission system in accordance with an emission sequence, such that the mapping emission system emits electromagnetic radiation into an environment near the mapping emission system; detecting, using a sensing system, incident electromagnetic radiation, the incident electromagnetic radiation including electromagnetic radiation: emitted by the mapping emission system as part of the emission sequence; reflected by the environment; and that is incident to a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic radiation; and generating monitoring system output data based at least in part on the sensing system data.

[0276] In some embodiments, the incident electromagnetic radiation includes electromagnetic radiation: emitted by the mapping emission system as part of the emission sequence; directed through a first environmental obstruction; reflected off a secondenvironmental obstruction that is behind the first environmental obstruction; and is incident to the sensor module of the sensing system.

[0277] In some embodiments, the mapping emission system comprises a plurality of environment mapping emitters; and energising the mapping emission system in accordance with the emission sequence comprises energising the environment mapping emitters in accordance with the emission sequence.

[0278] In some embodiments, energising the plurality of environment mapping emitters in accordance with the emission sequence comprises sequentially energising one or more subsets of the plurality of environment mapping emitters.

[0279] In some embodiments, energising the environment mapping emitters in accordance with the emission sequence comprises sequentially energising one environment mapping emitter at a time.

[0280] In some embodiments, energising the plurality of environment mapping emitters in accordance with the emission sequence comprises de-energising all of the environment mapping emitters between sequential energisations of the one or more subsets of environment mapping emitters.

[0281] In some embodiments, detecting incident electromagnetic radiation comprises: detecting incident electromagnetic radiation prior to energising the mapping emission system; detecting incident electromagnetic radiation while the mapping emission system is being energised in accordance with the emission sequence; and / or detecting incident electromagnetic radiation after the mapping emission system has been energised in accordance with the emission sequence.

[0282] In some embodiments, incident electromagnetic radiation is detected: during each sequential energisation of the one or more subsets of environment mapping emitters; and while all of the environment mapping emitters are de-energised between sequential energisations of the one or more subsets of environment mapping emitters.

[0283] In some embodiments, determining the sensing system data comprises: determining energisation state data based at least in part on incident electromagnetic radiation emitted by the mapping emission system during energisation; determining ambient state data based at least in part on ambient incident electromagnetic radiation.

[0284] In some embodiments, determining the sensing system data comprises comparing the energisation state data to the ambient state data.

[0285] In some embodiments, determining the sensing system data comprises processing the ambient state data and the energisation state data.

[0286] In some embodiments, the sensing system data comprises time difference data; the time difference data comprises a plurality of time difference data elements; each time difference data element is indicative of a difference in time between a first time and a second time; the first time is associated with a start of one of the energisations of the energisation sequence; and thesecond time is associated with a time at which an intensity of the detected incident electromagnetic radiation exceeds an intensity threshold.

[0287] In some embodiments, the sensing system data comprises a time difference data element for one or more sensing units of the sensing system, the sensing units being configured to be responsive to the intensity of the incident electromagnetic radiation.

[0288] In some embodiments, each time difference element is indicative of a distance the detected electromagnetic radiation emitted by the mapping emission system has travelled.

[0289] In some embodiments, the monitoring system output data comprises a matrix that is indicative of a state of the environment.

[0290] In some embodiments, the sensing system data is indicative of an intensity of the incident electromagnetic radiation.

[0291] In some embodiments, the method further comprises determining an operation scenario of the monitoring system, based at least in part on the sensing system data.

[0292] In some embodiments, in response to the operation scenario being determined to be a first operation scenario, generating the monitoring system output data comprises generating three-dimensional state data that is indicative of a state of at least part of the environment of the monitoring system.

[0293] In some embodiments, in response to the operation scenario being determined to be a second operation scenario, generating the monitoring system output data comprises generating an obstruction environment output that is indicative of the state of an obstruction within the environment.

[0294] In some embodiments, in response to the operation scenario being determined to be a third operation scenario, generating the monitoring system output data comprises generating an apparatus shutdown output that is configured to shut down an apparatus within the environment.

[0295] In some embodiments, in response to the operation scenario being determined to be a third operation scenario, generating the monitoring system output data comprises generating a monitoring system shutdown output that is configured to shut down the mapping emission system.

[0296] In some embodiments, the method further comprises detecting, using the sensing system, incident electromagnetic radiation, within a plurality of time windows, each time window being associated with one or more emissions of the emission sequence.

[0297] In some embodiments, a start of one or more of the time windows is delayed after the associated emission of the emission sequence by a predetermined time delay.

[0298] In some embodiments, one or more of the time windows is associated with a respective distance range, the distance range being a range of distances within which electromagnetic radiation that was emitted by the mapping emission system was reflected by the environment, prior to detection.

[0299] In some embodiments, there is provided a method of monitoring an environment using a monitoring system. The method may comprise energising at least one environment mapping emitter from a first emission commencement time to a first emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards a first obstruction within an environment of the monitoring system, between the first emission commencement time and the first emission end time. The first obstruction may be at least partially optically transparent; and between the monitoring system and a second obstruction. The method may comprise commencing a detection operation of a sensing system at a first gate time. The method may comprise terminating the detection operation at a second gate time that is after the first gate time, the second gate time differing from the first gate time by a gate width. The method may comprise storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0300] In some embodiments, the method further comprises generating the sensing system data based at least in part on the incident electromagnetic radiation detected during the detection operation.

[0301] In some embodiments, the first gate time differs from the first emission commencement time by a detection time offset.

[0302] In some embodiments, the detection time offset is a positive offset; or a negative offset.

[0303] In some embodiments, the first gate time is the same as the first emission commencement time.

[0304] In some embodiments, the first gate time is associated with a first distance from the sensing system. In some embodiments, the second gate time is associated with a second distance from the sensing system. In some embodiments, the second distance being greater than the first distance. In some embodiments, at least part of the first obstruction being spaced apart from the monitoring system by a distance greater than the first distance and less than the second distance. In some embodiments, the gate width is proportional to the difference between the first distance and the second distance.

[0305] In some embodiments, the electromagnetic radiation detected during the detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the first obstruction.

[0306] In some embodiments, the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation is stored in memory as a first time-of-flight data array.

[0307] In some embodiments, the method comprises iteratively commencing and terminating a plurality of detection operations, each detection operation being commenced at a respectivecommencement gate time; and terminated at a respective termination gate time. In some embodiments, the method comprises storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the iteratively performed detection operations. The electromagnetic radiation detected during a plurality of the iteratively performed detection operations includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

[0308] In some embodiments, the electromagnetic radiation detected during a second plurality of the iteratively performed detection operations includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

[0309] In some embodiments, the method further comprises commencing a second detection operation of the sensing system at a third gate time, the third gate time being: after the first gate time; and differing from the first gate time by a gate offset; terminating the second detection operation at a fourth gate time that is after the third gate time, the fourth gate time differing from the third gate time by a second gate width; storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation.

[0310] In some embodiments, the gate offset is equal to or greater than a difference between the first gate time and the second gate time; the second detection operation is one of the plurality of iteratively performed detection operations; and the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the second obstruction, after passing through the first obstruction.

[0311] In some embodiments, the third gate time differs from the first emission commencement time by a second detection time offset, the second detection time offset being greater than the first detection time offset.

[0312] In some embodiments, the third gate time is associated with a third distance from the sensing system; the fourth gate time is associated with a fourth distance from the sensing system; the fourth distance being greater than the third distance; and at least part of the second obstruction is spaced apart from the monitoring system by a distance that is greater than the third distance and less than the fourth distance.

[0313] In some embodiments, the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction, after passing through the first obstruction.

[0314] In some embodiments, the method further comprises energising at least one of the environment mapping emitters from a second emission commencement time to a secondemission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards the target region associated with the at least one environment mapping emitter, between the second emission commencement time and the second emission end time.

[0315] In some embodiments, the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are the same environment mapping emitter(s) as those energised between the first emission commencement time and the first emission end time.

[0316] In some embodiments, the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are different environment mapping emitter(s) to those energised between the first emission commencement time and the first emission end time.

[0317] In some embodiments, the method further comprises determining at least one subsequent environment mapping emitter to activate during a second emission, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation; wherein the at least one environment mapping emitter energised from the second emission commencement time to the second emission end time is the determined subsequent environment mapping emitter.

[0318] In some embodiments, the method further comprises determining the second gate width, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0319] In some embodiments, the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction without passing through the first obstruction, the second obstruction being within a second gate distance window that is associated with the third gate time and the fourth gate time.

[0320] In some embodiments, the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation is stored in memory as a second time-of-flight data array.

[0321] In some embodiments, the second emission commencement time is: after the first emission end time; and at or before the third gate time; the second emission end time is: after the first emission end time; and at or before the fourth gate time.

[0322] In some embodiments, incident electromagnetic radiation detected during the second detection operation comprises electromagnetic radiation that was emitted between the second emission commencement time and the second emission end time.

[0323] In some embodiments, the method further comprises generate a monitoring system output based at least in part on the sensing system data.

[0324] In some embodiments, the monitoring system output comprises monitoring system output data.

[0325] In some embodiments, the sensing system data generated in response to incident electromagnetic radiation detected during the detection operation is indicative of a characteristic of the first obstruction; and the sensing system data generated in response to incident electromagnetic radiation detected during the second detection operation is indicative of a characteristic of the second obstruction.

[0326] In some embodiments, the characteristic is associated with at least one of: a distance of the first obstruction from the sensing system; a dimension of the first obstruction; an obstruction label for the first obstruction, the obstruction label identifying a type of the first obstruction; an opacity of the first obstruction; a reflectiveness of the first obstruction; a brightness of the first obstruction; a distance of the second obstruction from the sensing system; a dimension of the second obstruction; an obstruction label for the second obstruction, the obstruction label identifying a type of the second obstruction; an opacity of the second obstruction; a reflectiveness of the second obstruction; and a brightness of the second obstruction.

[0327] In some embodiments, the first obstruction is within a first distance range that is associated with the first gate time and the second gate time.

[0328] In some embodiments, the second obstruction is within a second distance range that is associated with the third gate time and the fourth gate time.

[0329] In some embodiments, an outer profile of the first obstruction wholly contains an outer profile of the second obstruction.

[0330] In some embodiments, the monitoring system output comprises a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

[0331] In some embodiments, the monitoring system output comprises a time-of-flight data array.

[0332] In some embodiments, the at least one subsequent environment mapping emitter emits electromagnetic radiation, between the second emission commencement time and the second emission end time, with a different emission profile to that emitted during between the first emission commencement time and the first emission end time.

[0333] In some embodiments, the method further comprises determining the different emission profile, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0334] In some embodiments, a frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, is different to the frequency of theelectromagnetic radiation emitted by the at least one environment mapping emitter, between the first emission commencement time and the first emission end time.

[0335] In some embodiments, the method further comprises determining the frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

[0336] In some embodiments, the monitoring system output adjusts a value of at least one control parameter of a monitoring system comprising the sensing system.

[0337] In some embodiments, the at least one control parameter is associated with: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; and a particular environment mapping emitter that is to be energised for a future emission a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more environment mapping emitter is energised.

[0338] In some embodiments, the monitoring system output adjusts a value of one or more control parameters of another apparatus, the apparatus being within the environment of the sensing system.

[0339] In some embodiments, the monitoring system output shuts down another apparatus, the apparatus being within the environment of the sensing system.

[0340] In some embodiments, the second object is an apparatus. In some embodiments, the at least one control parameter comprises a control parameter of the apparatus.

[0341] In some embodiments, adjusting the value of the at least one control parameter shuts down the apparatus.

[0342] In some embodiments, the method further comprises controlling the sensor system to perform an ambient state detection operation; and storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation; wherein the ambient state detection operation is conducted over a time period in which detected incident electromagnetic radiation is only ambient electromagnetic radiation.

[0343] In some embodiments, the method further comprises determining the monitoring system output based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation.

[0344] In some embodiments, there is provided a method. The method may comprise energising at least one environment mapping emitter such that the environment mappingemitter emits electromagnetic radiation at and through a first obstruction in an environment. The method may comprise storing sensing system data generated by a sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by the first obstruction. The method may comprise storing sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by a second obstruction that is behind the first obstruction.

[0345] In some embodiments, the method further comprises performing a first detection operation, using the sensing system, over a first time window. In some embodiments, the method further comprises performing a second detection operation, using the sensing system, over a second time window. The second time window may be after the first time window. In some embodiments, the method further comprises generating sensing system data based at least in part on electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the first obstruction that is detected during the first time window. In some embodiments, the method further comprises detecting electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction during the second time window. In some embodiments, the method further comprises generating sensing system data based at least in part on electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction that is detected during the second time window.

[0346] In some embodiments, the method further comprises generating a monitoring system output based at least in part on the sensing system data.

[0347] In some embodiments, the monitoring system output comprises at least one of: a characteristic of the first obstruction; a characteristic of the second obstruction; a time-of-flight data array; a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

[0348] In some embodiments, the monitoring system output adjusts a value of at least one control parameter.

[0349] In some embodiments, the at least one control parameter comprises a control parameter of the monitoring system, and is associated with: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

[0350] In some embodiments, the monitoring system output is configured to adjust a value of one or more control parameters of another apparatus, the apparatus being within the environment of the sensing system.

[0351] In some embodiments, the second object is an apparatus. In some embodiments, the at least one control parameter comprises a control parameter of the apparatus.

[0352] In some embodiments, the method further comprises activating the environment mapping emitters in accordance with an emission sequence that comprises sequentially activating a plurality of the environment mapping emitters.

[0353] In some embodiments, there is provided a method comprising energising an emission system in accordance with an emission sequence, such that the emission system emits electromagnetic radiation into an environment near the emission system; detecting, using a sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic radiation; and generating monitoring system output data based at least in part on the sensing system data.

[0354] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a depth testing system of the monitoring system such that the depth testing system emits electromagnetic radiation from an end of at least one depth testing optical system towards a sensor module of a sensing system of the monitoring system. The method may comprise detecting, using the sensing system, the electromagnetic radiation emitted from the end of the at least one depth testing optical system. The method may comprise determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the end of the at least one depth testing optical system. The method may comprise comparing the sensing system data to a depth testing profile. In response to a value of one or more parameter of the sensing system data differing from a value of one or more parameter of the depth testing profile, the method may comprise adjusting a value of at least one control parameter.

[0355] In some embodiments, the sensing system data comprises a time difference parameter for each depth testing optical system. In some embodiments, a value of each time difference parameter is indicative of a time difference between a first time and a second time. In some embodiments, the first time corresponds to a time at which the depth testing system is energised. In some embodiments, the second time corresponds to a time at which the electromagnetic radiation emitted from the end of the respective depth testing optical system is detected by the sensing system.

[0356] In some embodiments, the value of one or more parameter of the sensing system data is the value of the time difference parameter(s).

[0357] In some embodiments, the one or more parameter of the depth testing profile comprises an expected time delay value indicative of an expected time delay between energisation of the depth testing system and detection of the electromagnetic radiation emitted from the end of the at least one depth testing reflector by the sensing system.

[0358] In some embodiments, the at least one depth testing optical system comprises a plurality of depth testing optical systems, each of a different length.

[0359] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising at least one depth testing emitter from a depth emission commencement time to a depth emission end time, such that the at least one depth testing emitter emits electromagnetic radiation that is directed towards an associated depth testing optical system. The method may comprise detecting, using a sensing system, electromagnetic radiation that is emitted from an emitting end portion of the depth testing optical systems. The method may comprise determining sensing system data based at least in part on the detected electromagnetic radiation. The method may comprise comparing the sensing system data to a depth testing profile. In response to a value of at least one parameter of the sensing system data differing from a value of at least one corresponding parameter of the depth testing profile, the method may comprise adjusting a value of at least one control parameter.

[0360] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising each depth testing emitter of the monitoring system from respective depth emission commencement times to respective depth emission end times. The method may comprise detecting, using a sensing system, electromagnetic radiation that is emitted from depth testing optical systems of the monitoring system. The method may comprise adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0361] In some embodiments, the method further comprises determining sensing system data based at least in part on the detected electromagnetic radiation, the sensing system data comprising a time delay associated with each depth testing emitter; the time delay associated with a particular depth testing emitter indicating a time between the energisation of that depth testing emitter and the detection of electromagnetic radiation emitted from the depth testing optical system associated with that depth testing emitter.

[0362] In some embodiments, the method further comprises comparing the sensing system data to a depth testing profile, the depth testing profile comprising an expected time delay parameter for each depth testing emitter; and adjusting the value of the at least one control parameter in response to at least one of the determined time delays differing from a value of a corresponding expected time delay parameter of the depth testing profile.

[0363] In some embodiments, the at least one control parameter comprises at least one control parameter of the monitoring system.

[0364] In some embodiments, adjusting the value of the at least one control parameters causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0365] In some embodiments, the at least one control parameter comprises at least one control parameter of another apparatus.

[0366] In some embodiments, adjusting the value of the at least one control parameters causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0367] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a planar testing system of the monitoring system in accordance with a planar testing emission sequence, such that the planar testing system emits electromagnetic radiation towards a surface of the monitoring system. The method may comprise detecting, using a sensing system of the monitoring system, incident electromagnetic radiation, the incident electromagnetic radiation: being electromagnetic radiation that is incident to a sensor module of the sensing system; and comprising at least part of the electromagnetic radiation emitted by the planar testing system that is reflected by the surface. The method may comprise determining sensing system data based at least in part on the detected incident electromagnetic radiation. The method may comprise comparing the sensing system data to a planar test criterion. In response to a value of one or more parameter of the sensing system data differing from a value of the planar test criterion, the method may comprise adjusting a value of one or more control parameters of the monitoring system.

[0368] In some embodiments, the planar testing system comprises a plurality of planar testing emitters; and energising the planar testing system in accordance with the planar test emission sequence comprises energising one or more subsets of the planar testing emitters.

[0369] In some embodiments, energising the planar testing system in accordance with the planar test emission sequence comprises sequentially energising one subset of the planar testing emitters at a time.

[0370] In some embodiments, each subset of the planar testing emitters comprises more than one planar testing emitter.

[0371] In some embodiments, the planar testing system comprises a first number of columns of planar testing emitters and a second number of rows of planar testing emitters.

[0372] In some embodiments, each subset of the plurality of planar testing emitters comprises one planar testing system emitter of each column and one planar testing system emitter of each row.

[0373] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising at least one planar testing emitter from a planar emission commencement time to a planar emission end time, such that the at least one planar testing system emitter emits electromagnetic radiation that is directed towards an associated planartesting system optical system. The method may comprise detecting electromagnetic radiation that: is incident to a sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one planar testing emitter between the planar emission commencement time and the planar emission end time. The method may comprise determining sensing system data based at least in part on the detected electromagnetic radiation. The method may comprise comparing the sensing system data to a planar test criterion. In response to a value of at least one parameter of the sensing system data differing from a value of the planar test criterion, the method may comprise adjusting a value of at least one control parameter.

[0374] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a plurality of planar testing emitters from respective planar emission commencement times to respective planar emission end times. The method may comprise detecting electromagnetic radiation that: is incident to a sensor module; and comprises at least part of the electromagnetic radiation emitted by the planar testing emitters. The method may comprise adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0375] In some embodiments, the detected electromagnetic radiation comprises electromagnetic radiation that is: emitted by at least one planar testing emitter; reflected by a window; and incident to the sensor module.

[0376] In some embodiments, the method further comprises determining sensing system data based at least in part on the detected electromagnetic radiation; and adjusting the value of the at least one control parameter in response to a value of at least one parameter of the sensing system data differing from a value of a planar test criterion.

[0377] In some embodiments, the planar test criterion comprises at least one of: a time delay criterion associated with a time delay between the first planar emission commencement time and a time at which the electromagnetic radiation emitted by a respective planar testing emitter is detected at the sensor module; and a position criterion associated with a position on the sensor module at which the electromagnetic radiation emitted by a respective planar testing emitter is detected.

[0378] In some embodiments, the at least one control parameter comprise at least one control parameter of the monitoring system.

[0379] In some embodiments, adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0380] In some embodiments, the at least one control parameter comprise at least one control parameter of another apparatus.

[0381] In some embodiments, adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0382] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising a mapping emission system of the monitoring system such that the mapping emission system emits electromagnetic radiation towards a window of the monitoring system. The method may comprise totally internally reflecting at least some of the electromagnetic radiation that is: emitted by the mapping emission system; and reflected by the window; along a length of an intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from an emitting end portion of the intensity testing reflector, towards a sensor module of a sensing system of the monitoring system. The method may comprise detecting, using the sensing system, the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system. The method may comprise determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system. The method may comprise comparing the sensing system data to an intensity metric. In response to a value of one or more parameter of the sensing system data differing from a value of the intensity metric, the method may comprise adjusting a value of one or more control parameters of the monitoring system.

[0383] In some embodiments, the sensing system data comprises a value of an intensity parameter, the value of the intensity parameter being indicative of an intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system.

[0384] In some embodiments, a value of the intensity metric is indicative of a minimum operating intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing reflector.

[0385] In some embodiments, there is provided a method of testing a monitoring system. The method may comprise energising at least one environment mapping emitter from an intensity emission commencement time to an intensity emission end time. The method may comprise detecting electromagnetic radiation that: is incident to a sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time and directed toward the sensor module by at least one intensity testing optical system. The method may comprise adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

[0386] In some embodiments there is provided a method of testing a monitoring system. The method may comprise energising at least one environment mapping emitter from an intensity emission commencement time to an intensity emission end time, such that the at least environment mapping emitter emits electromagnetic radiation that is directed towards a window. The method may comprise detecting electromagnetic radiation that: is emitted from an emitting end portion of one or more intensity testing optical system, onto a sensor module; andcomprises electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time, that has been reflected off the window and directed towards the sensor module by the at least one intensity testing optical system. The method may comprise determining sensing system data based at least in part on the detected electromagnetic radiation. In response to a value of one or more parameter of the sensing system data differing from a value of at least one intensity metric, the method may comprise adjusting a value of at least one control parameter.

[0387] In some embodiments, the method further comprises totally internally reflecting, by the at least one intensity testing optical system, at least some of the electromagnetic radiation that is: emitted by the at least one environment mapping emitter between the first intensity emission commencement time and the first intensity emission end time; and reflected by the window; along a length of the at least one intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from the emitting end portion of the intensity testing reflector, towards the sensor module.

[0388] In some embodiments, the at least one intensity metric comprises an intensity of the electromagnetic radiation that is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module, the at least one intensity metric comprising an allowable intensity range.

[0389] In some embodiments, the intensity emission commencement time is the first emission commencement time and the intensity emission end time is the intensity emission end time.

[0390] In some embodiments, the at least one control parameter comprises at least one control parameter of the monitoring system.

[0391] In some embodiments, adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

[0392] In some embodiments, the at least one control parameter comprises at least one control parameter of another apparatus.

[0393] In some embodiments, adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

[0394] In some embodiments, there is provided a system. The system may comprise a plurality of the monitoring devices described herein. The system may be configured to generate a system output based on at least one of: the sensor system data generated by one or more of the monitoring systems; and the sensor system output of one or more of the monitoring systems.

[0395] In some embodiments, the system output is configured to change a value of one or more control parameter of an apparatus of the system, a visual obstruction being between the apparatus and at least one of the monitoring systems.BRIEF DESCRIPTION OF THE DRAWINGS

[0396] Embodiments of the invention are described further below by way of example only with reference to the accompanying Figures, in which:Figure 1 shows a perspective view of a monitoring system, according to some embodiments;Figure 2 shows a front view of the monitoring system, according to some embodiments;Figure 3 shows a side view of the monitoring system, according to some embodiments;Figure 4 shows a rear view of the monitoring system, according to some embodiments;Figure 5 shows another side view of the monitoring system, according to some embodiments;Figure 6 shows a top view of the monitoring system, according to some embodiments;Figure 7 shows a bottom view of the monitoring system, according to some embodiments;Figure 8 shows another perspective view of the monitoring system, with a housing of the monitoring system hidden, according to some embodiments;Figure 9 shows another perspective view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 10 shows a front view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 11 shows a side view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 12 shows a rear view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 13 shows another side view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 14 shows a top view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 15 shows a bottom view of the monitoring system, with the housing of the monitoring system hidden, according to some embodiments;Figure 16 shows a perspective view of the monitoring system, with the housing and a number of additional components of the monitoring system hidden, according to some embodiments;Figure 17 is a block diagram of a control system of the monitoring system, according to some embodiments;Figure 18 is a process flow diagram of a method of generating monitoring system output data, according to some embodiments;Figure 18A is a top view of an environment including a tool, according to some embodiments;Figure 18B is a top view of the environment of Figure 18A, with a person, according to some embodiments;Figure 18C is a top view of the environment of Figure 18A, with the tool having been moved, according to some embodiments;Figure 18D is a top view of the environment of Figure 18A, with a portion of a person within a zone, according to some embodiments;Figure 19 shows a schematic representation of an example monitoring system, with three environment mapping emitters represented, according to some embodiments;Figure 20 shows a three-dimensional representation of an example monitoring system with a number environment mapping emitters, according to some embodiments;Figure 21 shows a sensor module of the monitoring system, according to some embodiments;Figure 22A shows a three-dimensional representation of an example monitoring system with six environment mapping emitters, according to some embodiments;Figure 22B shows regions of the sensor module dedicated to detecting reflections of the emissions of Figure 22A, according to some embodiments;Figure 23 shows a schematic of electromagnetic radiation emitted by an environment mapping emitter that is reflected by an object and detected by the sensor module, according to some embodiments;Figure 24 shows a schematic of electromagnetic radiation emitted by an environment mapping emitter that does not reach an object, with the object reflecting only ambient electromagnetic radiation, according to some embodiments;Figure 25 shows a schematic of electromagnetic radiation emitted by an environment mapping emitter that does not reach an object, with no ambient electromagnetic radiation being emitted by the object and detected by the sensor module, according to some embodiments;Figure 26 shows a three-dimensional representation of a number of the components of the monitoring system of Figure 1 , with electromagnetic rays incident to the sensor module shown, according to some embodiments;Figure 26A is a process flow diagram of a method, according to some embodiments;Figure 27 shows the monitoring system of Figure 1 in an environment comprising a plurality of objects, according to some embodiments;Figure 28 shows times at which electromagnetic radiation that is emitted by the monitoring system of Figure 1 and reflected off the objects of Figure 27 is detected by the monitoring system, according to some embodiments;Figure 29 shows times at which electromagnetic radiation that is emitted by the monitoring system of Figure 1 and reflected off a window and an object behind the window is detected by the monitoring system, along with a representation of an environment including the monitoring system, the window and the object, according to some embodiments;Figure 30 shows times at which electromagnetic radiation that is emitted by the monitoring system of Figure 1 and reflected by a visual obstruction and an object behind the visual obstruction is detected by the monitoring system, along with a representation of an environment including the monitoring system, the visual obstruction and the object, according to some embodiments;Figure 31 A shows times at which electromagnetic radiation that is emitted by the monitoring system of Figure 1 and is reflected by a mirror and / or an object is detected by the monitoring system, along with a representation of an environment including the monitoring system, the mirror and the object, according to some embodiments;Figure 31 B shows another view of the environment of Figure 31 A;Figure 32 shows a process flow diagram of a method of testing the monitoring system, according to some embodiments;Figure 33 shows a schematic diagram of part of the monitoring system of Figure 1 , according to some embodiments;Figure 34 shows a process flow diagram of another method of testing the monitoring system, according to some embodiments;Figure 35 shows a schematic illustration of the monitoring system of Figure 1 , in use, according to some embodiments;Figure 36 shows a number of target regions on a window of the monitoring system, according to some embodiments;Figures 37A-37E show the target regions on the window and a representation of a planar testing emission sequence, according to some embodiments;Figure 38 shows a process flow diagram of another method of testing the monitoring system, according to some embodiments;Figure 39 shows a schematic representation of the monitoring system when performing the method of Figure 38, according to some embodiments;Figure 40 shows a schematic representation of the monitoring system when performing the method of Figure 38, according to some embodiments;Figure 41 shows a system comprising a plurality monitoring systems, according to some embodiments;Figure 42 shows another system comprising a plurality of monitoring systems, according to some embodiments;Figure 43 shows potential fields of view of the system of Figure 42, according to some embodiments;Figure 44 shows another system comprising a plurality of monitoring systems, according to some embodiments;Figure 45 shows a perspective view of fields of view of the system of Figure 44, according to some embodiments;Figure 46 shows another perspective view of the fields of view of the system of Figure 44, according to some embodiments;Figure 47 shows a perspective view of an apparatus onto which a plurality of monitoring systems are mounted;Figure 48 shows a schematic of an environment through which an apparatus is to travel, according to some embodiments;Figure 49A shows a schematic view of an apparatus in an environment, according to some embodiments;Figure 49B shows another schematic view of the apparatus and environment of Figure 49A, with a number of boundaries shown, according to some embodiments;Figure 50 shows a path along which the apparatus may travel, according to some embodiments;Figure 51 shows the path of Figure 50 with reference to a number of boundaries, with the path not intersecting the boundaries, according to some embodiments;Figure 52 shows another path along which the apparatus may travel, with reference to a number of boundaries, with the path intersecting the boundaries, according to some embodiments;Figure 53 shows a schematic view of an environment through which an apparatus is to travel, according to some embodiments;Figure 54 shows a path along which the machine may travel, according to some embodiments;Figure 55 shows a schematic view of the environment with a number of defined boundaries, and the machine’s position across a number of points of time as it traverses the environment, according to some embodiments;Figure 56 shows a schematic view of an environment to be traversed by a machine, according to some embodiments;Figure 57 shows the environment and a number of defined boundaries, according to some embodiments; andFigure 58 shows a path to be traversed by a machine, with reference to a number of the boundaries of Figure 57.DETAILED DESCRIPTION

[0397] The present disclosure relates to a monitoring system. The monitoring system includes an emission system with a number of environmental mapping emitters. The environmentalmapping emitters emit electromagnetic radiation which is directed towards one or more target regions of the environment surrounding the monitoring system. The environment surrounding the monitoring system and objects within the environment reflect both ambient electromagnetic radiation and the electromagnetic radiation emitted from the environmental mapping emitters. A sensing system of the monitoring system generates sensing system data based on electromagnetic radiation that is incident to the sensing system. This incident electromagnetic radiation includes reflected ambient electromagnetic radiation (if any) and the electromagnetic radiation emitted from the environmental mapping emitters that is reflected by the environment around the monitoring system.

[0398] One or more control decisions are made based on the detected electromagnetic radiation. As part of this process, a virtual three-dimensional model of the environment is generated based on the detected electromagnetic radiation. The position of one or more objects within the environment (e.g., machinery or personnel) can be determined, with control decisions being made based on the determined positions. For example, if part of a piece of machinery is outside an expected region within which it is prescribed to operate, the machinery may be stopped to reduce the associated safety risks. Similarly, if a person is determined to be outside a prescribed region, nearby machinery may be stopped.

[0399] The monitoring system is capable of generating three-dimensional models of an environment even in the case where doing so is difficult or impossible with traditional monitoring systems. For example, the monitoring system described herein may be capable of monitoring objects that are behind windows or smoke and distinguishing those objects from the windows and / or smoke itself.

[0400] The monitoring system is also configured to ‘fail to safe’ in the event that one or more of its subsystems are determined to be providing unreliable information. In this way, machinery in the relevant environment can be stopped in the case that the monitoring system itself fails.

[0401] Throughout this description, it will be appreciated that the terminology “electromagnetic radiation” may be interpreted to include one or more types of electromagnetic waves.Electromagnetic radiation as used within this description includes electromagnetic waves that are emitted or radiated from an energy source. Electromagnetic radiation as used within this description also includes electromagnetic waves that are reflected from an object or material. For example, electromagnetic waves that are emitted from an energy source, and subsequently reflected from one or more objects are considered electromagnetic radiation within the present description, even though the relevant electromagnetic waves were most recently reflected, rather than being directly emitted from an energy source. Examples of electromagnetic radiation include visible light, ultraviolet light, infrared light, radio waves, gamma rays and X-rays.Electromagnetic radiation may be referred to as light throughout this description.

[0402] Electromagnetic radiation may be considered incident to an object, throughout this description, if the direction of propagation of the electromagnetic radiation is such that itencounters the object during propagation. This electromagnetic radiation may be said to be incident to the object at the point where it encounters the object. The object may be said to encounter the electromagnetic radiation. The object may be said to receive the electromagnetic radiation.Monitoring System 100

[0403] Figures 1 to 16 show a monitoring system 100, according to some embodiments of the disclosure. A number of the reference numeral labels in the Figures include dashed portions (for example, see Figure 1). The dashed portions may be taken to mean that the particular portion of that reference numeral label extends ‘behind’ a feature of the monitoring system 100, in order to point to the feature of the relevant reference numeral. The monitoring system 100 comprises a housing 102. The housing 102 houses a number of the sub-systems of the monitoring system 100. The housing 102 comprises a number of housing walls 104. The housing 102 comprises one or more housing walls 104. A number of the housing walls 104 are integrally formed. That is, a number of the housing walls 104 together form a piece of the housing 102. Such housing walls 104 may be contemporaneously formed in, for example, a moulding process. One or more sections of the housing 102 may be configured to connect to one or more other sections of the housing 102, to form the housing 102.

[0404] The housing comprises a front wall 104A. The front wall 104A is planar. The front wall 104A comprises a number of holes 105. One or more of the holes 105 defines an opening into an internal portion of the housing 102. The housing comprises a plurality of angled walls 104B. The angled walls 104B are transverse to the front wall 104A. Each angled wall 104B is planar. Each angled wall 104B meets the front wall 104A along an edge. Each angled wall 104B meets two other angled walls 104B, each at a respective edge. The housing 104 comprises one or more side walls 104C. The side walls 104C are planar. The side walls 104C are transverse to the angled walls 104B. Each side wall 104 meets one or more angled wall 104B at an edge. The side walls 104C are orthogonal to the front wall 104A. The housing comprises rear angled walls 104D. The rear angled walls 104D are transverse to the side walls 104C. Each rear angled wall 104D is planar. Each rear angled wall 104D meets a side wall 104C at an edge. The housing 104 comprises a rear wall 104E. The rear wall 104E is parallel to the front wall 104A. Each rear angled wall 104D meets the rear wall 104E at an edge.Emission System 106

[0405] The monitoring system 100 comprises an emission system 106. The emission system 106 is configured to emit electromagnetic radiation. That is, the emission system 106 emits electromagnetic radiation. The emission system 106 comprises a mapping emission system 107. The mapping emission system emits electromagnetic radiation. The mapping emission system 107 comprises an environment mapping emitter 108. The mapping emission system 107 comprises one or more environment mapping emitters 108. The illustrated mapping emission system 107 comprises a plurality of environment mapping emitters 108. Therefore, themonitoring system 100 may be said to comprise a plurality of environment mapping emitters 108. The environment mapping emitters 108 emit electromagnetic radiation. That is, the environment mapping emitters 108 are configured to emit electromagnetic radiation. In the illustrated embodiment, each environment mapping emitter 108 is configured to emit electromagnetic radiation. That is, each environment mapping emitter 108 emits electromagnetic radiation. The environment mapping emitters 108 emit electromagnetic radiation when energised. That is, the environment mapping emitters 108 emit electromagnetic radiation when activated.

[0406] The mapping emission system 107 comprises a targeting optical system 110. The targeting optical system 110 is configured to direct incident electromagnetic radiation towards a target region. That is, the targeting optical system 110 directs incident electromagnetic radiation towards the target region. The mapping emission system 107 comprises one or more targeting optical systems 110. The mapping emission system 107 comprises a plurality of targeting optical systems 110. In the illustrated embodiment, each targeting optical system 110 is configured to direct incident electromagnetic radiation towards a respective target region. That is, each targeting optical system 110 directs incident electromagnetic radiation towards a respective target region. More generally, it may be said that the emission system 106 comprises one or more environment mapping emitters 108 and one or more targeting optical systems 110. The illustrated emission system 106 comprises a plurality of environment mapping emitters 108 and a plurality of targeting optical system 110.Environment Mapping Emitters 108

[0407] An environment mapping emitter 108 is configured to emit electromagnetic radiation within a frequency range. That is, an environment mapping emitter 108 emits electromagnetic radiation within a frequency range. One or more of the environment mapping emitters 108 is configured to emit electromagnetic radiation within the frequency range. One or more of the environment mapping emitters 108 emits electromagnetic radiation within the frequency range. A plurality of the environment mapping emitters 108 are configured to emit electromagnetic radiation within a frequency range. That is, a plurality of the environment mapping emitters 108 emit electromagnetic radiation within the frequency range. In the illustrated embodiment, each of the environment mapping emitters 108 are configured to emit electromagnetic radiation within a frequency range. That is, each of the environment mapping emitters 108 emits electromagnetic radiation within the frequency range.

[0408] The frequency range may be referred to as an environment mapping frequency range. In particular, one or more of the environment mapping emitters 108 is configured to emit electromagnetic radiation within a frequency range that spans from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It will be appreciated that the lower frequency threshold and / or the upper frequency threshold may correspond to points at whichthe intensity of the emitted electromagnetic radiation falls below an emission intensity threshold.

[0409] The frequency range of one or more of the environment mapping emitters 108 may comprise 450nm. The frequency range of one or more of the environment mapping emitters 108 may comprise 940nm. The frequency range of one or more of the environment mapping emitters 108 may comprise one or more of 200nm, 250nm, 300nm, 400nm, 450nm, 500nm, 550nm, 600nm, 650nm, 700nm, 750nm, 800nm, 850nm, 900nm, 950nm, 1000nm, 1100nm, 1200nm, 1300nm, 1400nm, 1500nm, 1600nm, 1700nm, 1800nm, 1900nm and 2000nm. In some embodiments, the environment mapping emitters 108 are configured to emit electromagnetic radiation with a wavelength that is between 200nm and 3000nm. In some embodiments, the environment mapping emitters 108 are configured to emit electromagnetic radiation with a wavelength that is between 400nm and 1000nm. In some embodiments, the environment mapping emitters 108 are configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm. In some embodiments, the environment mapping emitters 108 are configured to emit electromagnetic radiation with a wavelength that is between 300nm and 2000nm. In some embodiments, the frequency range of one or more of the environment mapping emitters 108 is different to the frequency range of one or more other environment mapping emitter 108. That is, a first environment mapping emitter 108 may emit electromagnetic radiation within a first frequency range. A second environment mapping emitter 108 may emit electromagnetic radiation within a second frequency range. The second frequency range may be different to the first frequency range. The first frequency range may overlap the second frequency range.

[0410] That is, an environment mapping emitter 108 emits electromagnetic radiation within a frequency range. One or more of the environment mapping emitters 108 is configured to emit electromagnetic radiation within the frequency range. One or more of the environment mapping emitters 108 emits electromagnetic radiation within the frequency range. A plurality of the environment mapping emitters 108 are configured to emit electromagnetic radiation within a frequency range. That is, a plurality of the environment mapping emitters 108 emit electromagnetic radiation within the frequency range. In the illustrated embodiment, each of the environment mapping emitters 108 are configured to emit electromagnetic radiation within a frequency range. That is, each of the environment mapping emitters 108 emits electromagnetic radiation within the frequency range.

[0411] An environment mapping emitter 108 is configured to emit electromagnetic radiation with an emission profile. The emission profile of emitted electromagnetic radiation characterises one or more features of the electromagnetic radiation. For example, an emission profile of emitted electromagnetic radiation may describe the frequency of the electromagnetic radiation. The emission profile of emitted electromagnetic radiation may describe a wavelength of the emitted electromagnetic radiation. The emission profile of emitted electromagnetic radiation may describe an amplitude of the emitted electromagnetic radiation. The emission profile ofemitted electromagnetic radiation may describe a polarization of the emitted electromagnetic radiation. Emission profile data for one or more of the environment mapping emitters 108 may be stored by the monitoring system. The emission profile data may comprise at least one emission profile parameter for one or more environment mapping emitter 108. A value of an emission profile parameter may indicate a feature of the radiation emitted by a particular environment mapping emitter 108. The emission profile data may comprise at least one of a frequency parameter, a wavelength parameter, an amplitude parameter and a polarization parameter for one or more of the environment mapping emitters 108. Each environment mapping emitter 108 may be energised in accordance with associated emission profile data. The value of one or more emission profile parameter of the emission profile data of one environment mapping emitter 108 may be the same as the value of one or more emission profile parameter of the emission profile data of another environment mapping emitter 108. The value of one or more emission profile parameter of the emission profile data of one environment mapping emitter 108 may be different to the value of one or more emission profile parameter of the emission profile data of another environment mapping emitter 108. That is, a first environment mapping emitter 108 may emit electromagnetic radiation with a first emission profile. A second environment mapping emitter 108 may emit electromagnetic radiation with a second emission profile. Alternatively, one or more of the environment mapping emitters 108 may be configured to emit electromagnetic radiation with more than one emission profile. That is, one or more of the environment mapping emitters 108 may be configured to emit electromagnetic radiation with a first emission profile and electromagnetic radiation with a second emission profile. The emission profile data may be stored by the monitoring system 100.

[0412] Utilizing different emission profiles can be useful in enabling detailed monitoring of the environment. For example, certain wavelengths of light penetrate certain obstructions (e.g. smoke) better than others. Therefore, using different environment mapping emitters 108 that emit different frequencies of light can allow improved monitoring of the environment in the case of particular obstructions. Alternatively, using environment mapping emitters 108 that are capable of selectively emitting electromagnetic radiation of different wavelengths can provide the same benefit.

[0413] An environment mapping emitter 108 is configured to emit electromagnetic radiation in a respective emission direction. That is, an environment mapping emitter 108 emits electromagnetic radiation in a respective emission direction. Each environment mapping emitter 108 is configured to emit electromagnetic radiation in a respective emission direction. That is, each environment mapping emitter 108 emits electromagnetic radiation in a respective emission direction. The emission direction of a respective environment mapping emitter 108 may be determined, at least in part, by the configuration in which the environment mapping emitter 108 is mounted to another component of the monitoring system 100. One or more of the environment mapping emitters 108 is in the form of a laser. One or more of the environmentmapping emitters 108 may be in the form of a light emitting diode or another light emitting component.

[0414] The illustrated monitoring system 100 comprises 24 environment mapping emitters 108. It will, however, be appreciated that in some embodiments, the monitoring system 100 may comprise a different number of environment mapping emitters 108. For example, the monitoring system 100 may comprise any number of environment mapping emitters 108 between the numbers 1 and 24. Alternatively, the monitoring system 100 may comprise more than 24 environment mapping emitters 108. The monitoring system 100 may comprise 1 , 2, 3, 4, 5, 6, 7, 8, 9, 10, 11 , 12, 13, 14, 15, 16, 17, 18, 19, 20, 21 , 22 or 23 environment mapping emitters 108. The number of environment mapping emitters 108 may be a power of 2. The number of environment mapping emitters 108 may be a multiple of 2. Targeting Optical Systems 110

[0415] The monitoring system 100 comprises a targeting optical system 110. The targeting optical system 110 is configured to manipulate electromagnetic radiation. The targeting optical system 110 manipulates electromagnetic radiation. The monitoring system 100 comprises one or more targeting optical systems 110. The targeting optical systems 110 are configured to manipulate electromagnetic radiation. The targeting optical systems 110 manipulate electromagnetic radiation. The illustrated monitoring system 100 comprises a plurality of targeting optical systems 110. The emission system 106 comprises the targeting optical systems 110. More specifically, the mapping emission system 107 comprises the targeting optical systems 110. The monitoring system 100 comprises a targeting optical system 110 for each environment mapping emitter 108. That is, one or more of the targeting optical systems 110 is associated with a respective environment mapping emitter 108. In the illustrated configuration, each targeting optical system 110 is associated with a respective environment mapping emitter 108.

[0416] An environment mapping emitter 108 is configured to emit electromagnetic radiation at a respective targeting optical system 110. That is, an environment mapping emitter 108 emits electromagnetic radiation at a respective targeting optical system 110. One or more of the environment mapping emitters 108 is configured to emit electromagnetic radiation at a respective targeting optical system 110. That is, one or more of the environment mapping emitters 108 emits electromagnetic radiation at a respective targeting optical system 110. The targeting optical system 110 at which a particular environment mapping emitter 108 emits electromagnetic radiation may be considered to be the targeting optical system 110 that is associated with the particular environment mapping emitter 108. In other words, one or more of the environment mapping emitters 108 is configured to emit electromagnetic radiation at an associated targeting optical system 110. A plurality of the environment mapping emitters 108 are configured to emit electromagnetic radiation at respective targeting optical systems 110. In the illustrated embodiment, each environment mapping emitter 108 is configured to emitelectromagnetic radiation at an associated targeting optical system 110. That is, each environment mapping emitter 108 emits electromagnetic radiation at an associated targeting optical system 110.

[0417] A targeting optical system 110 is configured to direct incident electromagnetic radiation. That is, a targeting optical system 110 directs incident electromagnetic radiation. One or more of the targeting optical systems 110 is configured to direct electromagnetic radiation. That is, one or more of the targeting optical systems 110 directs electromagnetic radiation. In particular, one or more of the targeting optical systems 110 is configured to direct the electromagnetic radiation emitted at it by the associated environment mapping emitter 108 towards a respective target region of the environment of the monitoring system 100. That is, one or more of the targeting optical systems 110 directs the electromagnetic radiation emitted at it by the associated environment mapping emitter 108 towards the respective target region of the environment of the monitoring system 100. In the illustrated embodiment, each targeting optical system 110 is configured to direct the electromagnetic radiation emitted at it by the associated environment mapping emitter 108 towards the respective target region of the environment of the monitoring system 100. That is, each targeting optical system directs the electromagnetic radiation emitted at it by the associated environment mapping emitter 108 towards the respective target region of the environment of the monitoring system 100.

[0418] A targeting optical system 110 comprises a refractor. One or more of the targeting optical systems 110 comprise a refractor. A plurality of the targeting optical systems 110 comprise a refractor. In the illustrated embodiment, each targeting optical system 110 comprises a refractor. The refractor is configured to refract incident electromagnetic radiation. The refractor refracts incident electromagnetic radiation. The refractor is configured to redirect incident electromagnetic radiation by refracting the electromagnetic radiation. That is, the refractor redirects incident electromagnetic radiation by refracting the electromagnetic radiation. In this way, the refractor changes the electromagnetic radiation’s direction of propagation from a first direction of propagation to a second direction of propagation.

[0419] The refractor may be in the form of a prism. The refractor may be in the form of a lens. The refractor may be in the form of an optical fibre. The refractor may take another form. One or more of the targeting optical systems 110 may comprise a plurality of refractors (e.g., one or more prisms, one or more lenses and / or one or more optical fibres). Although each targeting optical system 110 of the illustrated embodiment comprises a refractor, it will be appreciated that in some embodiments, only one or more of the targeting optical systems 110 may comprise a respective refractor. That is, not all of the targeting optical systems 110 may comprise a refractor. Therefore, it may be said that in some embodiments, a subset of the targeting optical systems 110 comprise a refractor. In some embodiments, none of the targeting optical systems 110 comprise a refractor.

[0420] A targeting optical system 110 may comprise a reflector. One or more of the targeting optical systems 110 may comprise a reflector. A plurality of the targeting optical systems 110 may comprise reflectors. Each of the targeting optical systems 110 may comprise a reflector. One or more of the targeting optical systems 110 may comprise a mirror. That is, the reflector may be in the form of a mirror. One or more of the targeting optical systems 110 may comprise an optical fibre. The reflector may be in the form of an optical fibre. One or more of the targeting optical systems 110 may comprise one or more mirrors and / or an optical fibre that is configured to totally internally reflect incident electromagnetic radiation. The one or more mirrors may be configured to redirect incident electromagnetic radiation emitted from the associated environment mapping emitter 108 towards the one or more optical fibres. That is, the one or more mirrors may redirect incident electromagnetic radiation emitted from the associated environment mapping emitter 108 towards the one or more optical fibres. The one or more optical fibres may be configured to redirect incident electromagnetic radiation emitted from the associated environment mapping emitter 108 towards the one or more mirrors. That is, the one or more optical fibres may redirect incident electromagnetic radiation emitted from the associated environment mapping emitter 108 towards the one or more mirrors. The one or more mirrors may be configured to redirect the incident electromagnetic radiation towards the respective target region. That is, the one or more mirrors may redirect the incident electromagnetic radiation towards the respective target region. The one or more optical fibres may be configured to redirect the incident electromagnetic radiation towards the respective target region. That is, the one or more optical fibres may redirect the incident electromagnetic radiation towards the respective target region.

[0421] A targeting optical system 110 may comprise a diffractor. One or more of the targeting optical systems 110 may comprise a diffractor. A plurality of the targeting optical systems 110 may comprise diffractors. Each targeting optical system 110 may comprise a diffractor. For example, one or more of the targeting optical systems 110 may comprise one or more diffractor gratings. The one or more diffractors may be configured to diffract incident electromagnetic radiation emitted from the associated environment mapping emitter 108 as it propagates towards the respective target region. That is, the one or more diffractors may diffract incident electromagnetic radiation emitted from the associated environment mapping emitter 108 as it propagates towards the respective target region.

[0422] A targeting optical system 110 may comprise an optical splitter. One or more of the targeting optical systems 110 may comprise an optical splitter. A plurality of the targeting optical systems 110 may comprise an optical splitter. Each targeting optical system 110 may comprise an optical splitter. A targeting optical system 110 may comprise an optical filter. One or more of the targeting optical systems 110 may comprise an optical filter. A plurality of the targeting optical systems 110 may comprise an optical filter. Each targeting optical system 110 may comprise an optical filter. A targeting optical system 110 may comprise an optical switch. One ormore of the targeting optical systems 110 may comprise an optical switch. A plurality of the targeting optical systems 110 may comprise an optical switch. Each targeting optical system 110 may comprise an optical switch. A targeting optical system 110 may comprise an optical transmitter. One or more of the targeting optical systems 110 may comprise an optical transmitter. A plurality of the targeting optical systems 110 may comprise an optical transmitter. Each targeting optical system 110 may comprise an optical transmitter. A targeting optical system 110 may comprise an optical disperser. One or more of the targeting optical systems 110 may comprise an optical disperser. A plurality of the targeting optical systems 110 may comprise an optical disperser. Each targeting optical system 110 may comprise an optical disperser.

[0423] In some embodiments, a targeting optical system 110 comprises one or more of a refractor, a reflector and a diffractor. In some embodiments, one or more of the targeting optical systems 110 comprises one or more of a refractor, a reflector and a diffractor. A targeting optical system 110 may comprise at least one of a refractor, a reflector and a diffractor. A targeting optical system 110 may comprise a refractor and a reflector. A targeting optical system 110 may comprise a refractor and a diffractor. A targeting optical system 110 may comprise a reflector and a diffractor. A targeting optical system 110 may comprise a refractor, a reflector and a diffractor.

[0424] An environment mapping emitter 108 and the associated targeting optical system 110 may, together, be considered an emission unit. In other words, an emission unit may comprise an environment mapping emitter 108 and the associated targeting optical system 110. The mapping emission system 107 may be said to comprise an emission unit. The mapping emission system 107 comprises one or more emission units. The mapping emission system 107 comprises a plurality of emission units.

[0425] An environment mapping emitter 108 and the associated targeting optical system 110 may be mounted to each other. That is, an environment mapping emitter 108 and the associated targeting optical system 110 may be connected. The environment mapping emitter 108 may be connected to the associated targeting optical system 110. This may be a separable connection. This may be a permanent connection. The combined unit may be mounted to a body 114 of an emission module 112 of the monitoring system 100, as described herein.

[0426] One or more of the emission units may be in the form of a laser. One or more of the emission units may be in the form of a light emitting diode or another light emitting component. In some embodiments, one or more of the targeting optical systems 110 may be considered to be the optical system of a laser. That is, a targeting optical system 110 may be the optical system of a laser. The respective environment mapping emitter 108 may comprise an excitation mechanism (e.g., a flashlamp) and a laser medium (e.g., a laser medium such as a crystal). In other words, the environment mapping emitter 108 may comprise a flashlamp and / or a lasermedium. The respective targeting optical system 110 may comprise an optical resonator (e.g., a pair of opposed mirrors, one of which comprising a hole for the laser output).

[0427] It will be appreciated that the targeting optical systems 110 may be optional. That is, in some embodiments, the monitoring system 100 does not comprise a targeting optical system 110 that is configured to direct the electromagnetic radiation emitted by a respective environment mapping emitter 108 towards a respective target region of the environment of the monitoring system 100. In such an embodiment, one or more of the environment mapping emitters 108 are positioned such that the emitted electromagnetic radiation propagates directly at the respective target region. In some embodiments, one or more of the environment mapping emitters 108 may comprise an integrated optical system. In such a case, independent targeting optical systems 110 may not be necessary. Alternatively, the integrated optical system of each environment mapping emitter 108 may be considered the associated targeting optical system 110.

[0428] The target region at which electromagnetic radiation emitted by a particular environment mapping emitter 108 is directed is the target region of that environment mapping emitter 108. That is, the target region at which electromagnetic radiation emitted by a particular environment mapping emitter 108 is directed may be referred to as a target region that is associated with that target region. It will be understood herein that this is the case regardless of whether the environment mapping emitter 108 emits the electromagnetic radiation directly at the target region (i.e. without manipulation by a targeting optical system 110) or the electromagnetic radiation is manipulated by a targeting optical system.

[0429] It will be understood that the target region of at least one environment mapping emitter 108 may overlap the target region of another environment mapping emitter 108. The target region of at least one environment mapping emitter 108 may partially overlap the target region of another environment mapping emitter 108. The target region of at least one environment mapping emitter 108 may entirely overlap the target region of another environment mapping emitter 108. That is, the target region of at least one of the environment mapping emitters 108 may be the same as the target region of another of the environment mapping emitters 108.

[0430] The target region of at least one environment mapping emitter 108 that emits electromagnetic radiation with a first emission profile may overlap the target region of another environment mapping emitter 108. The other environment mapping emitter 108 may emit electromagnetic radiation with a second emission profile. That is, the environment mapping emitters may map a common part of the environment.

[0431] The target region of at least one of the environment mapping emitters 108 that emits electromagnetic radiation with a first emission profile may be different to the target region of at least one environment mapping emitter 108 that emits electromagnetic radiation with a secondemission profile. That is, the environment mapping emitters 108 may map different parts of the environment.

[0432] The monitoring system 100 may comprise at least one pair of environment mapping emitters 108. The monitoring system 100 may comprise a plurality of pairs of environment mapping emitters 108. One environment mapping emitter 108 of the pair may emit electromagnetic radiation with a first emission profile. One environment mapping emitter 108 of the pair may emit electromagnetic radiation with a second emission profile. The first emission profile may be different to the second emission profile. For example, a frequency at which the first environment mapping emitter 108 emits electromagnetic radiation may be different to the frequency at which the second does. The target region of the first environment mapping emitter 108 may be the same as that of the second environment mapping emitter 108. That is, the emitters 108 of the pair may target the same region of the environment.Emission Modules 112

[0433] Referring to Figures 1 to 16, the monitoring system 100 comprises an emission module 112. The monitoring system 100 comprises one or more emission modules 112. The illustrated monitoring system 100 comprises a plurality of emission modules 112. The environment mapping system 106 comprises the emission modules 112. In particular, the mapping emission system 107 comprises the emission modules 112.

[0434] The illustrated environment mapping system 106 comprises a plurality of emission modules 112. Specifically, the environment mapping system 106 comprises six emission modules 112. It will be appreciated, however, that in some embodiments, the environment mapping system 106 may comprise another number of emission modules 112. For example, the environment mapping system 106 may comprise one, two, three, four, five, six, seven, eight, nine, ten or more than ten emission modules 112. One or more of the emission modules 112 may be in the form of a printed circuit board. One or more of the emission modules 112 comprises a respective printed circuit board.

[0435] An emission module 112 comprises a body 114. One or more of the emission modules 112 comprise a body 114. A plurality of the emission modules 112 comprise respective bodies 114. In the illustrated embodiment, each emission module 112 comprises a body 114. The body 114 may be in the form of a base of a printed circuit board.

[0436] An emission module 112 comprises a subset of the environment mapping emitters 108. One or more of the emission modules 112 comprise a subset of the environment mapping emitters 108. A plurality of the emission modules 112 comprise respective subsets of the environment mapping emitters 108. In the illustrated embodiment, each emission module 112 comprises a subset of the environment mapping emitters 108. One or more of the environment mapping emitters 108 of a respective subset of environment mapping emitters 108 is mounted to the respective body 114. The environment mapping emitters 108 of a respective subset of environment mapping emitters 108 are mounted to the respective body 114. In other words,each environment mapping emitter 108 of a respective subset of environment mapping emitters 108 is mounted to the respective body 114 of the relevant emission module 112.

[0437] An emission module 112 comprises a subset of the targeting optical systems 110. One or more of the emission modules 112 comprise a subset of the targeting optical systems 110. A plurality of the emission modules 112 comprise respective subsets of the targeting optical systems 110. In the illustrated embodiment, each emission module 112 comprises a subset of the targeting optical systems 110. A targeting optical system 110 is mounted to the body 114 of the respective emission module 112. One or more of the targeting optical systems 110 of a respective subset of targeting optical systems 110 is mounted to the respective body 114. A plurality of the targeting optical systems 110 of a respective subset of targeting optical systems 110 are mounted to the body 114 of the respective emission module 112. In the illustrated embodiment, each targeting optical system 110 of a respective subset of targeting optical systems 110 is mounted to body 114 of the respective emission module 112. The targeting optical systems 110 of a respective subset of targeting optical systems 110 are associated with the environment mapping emitters 108 of a corresponding subset of environment mapping emitters 108.

[0438] As described herein, each targeting optical system 110 of a respective subset of targeting optical systems 110 is configured to redirect electromagnetic radiation. In particular, each targeting optical system 110 of a respective subset of targeting optical systems 110 is configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter 108 of the respective subset of environment mapping emitters 108, thereby directing the electromagnetic radiation towards the respective target region.

[0439] The environment mapping system 106 comprises a first emission module 112A. The first emission module 112A comprises a first body 114A. The first body 114A is in the form of a base of a printed circuit board. The first emission module 112A comprises a first subset 108A of the environment mapping emitters 108 (see Figure 1). The first subset 108A of environment mapping emitters 108 comprises four environment mapping emitters 108. Each environment mapping emitter 108 of the first subset 108A of environment mapping emitters 108 is mounted to the first body 114A. In other words, the environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 are mounted to the first body 114A. It will be appreciated that these mountings may be direct (e.g. the environment mapping emitters 108 may be directly soldered to a connection on the first body 114A). Alternatively, these mountings may be indirect (e.g. the environment mapping emitters 108 may be removably mounted to one or more mounting components that are directly mounted to the first body 114A, for example, with a soldered connection). The environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 are mounted to the first body 114A such that they are coplanar. The environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 may be mounted to the first body 114A such that they are colinear.Alternatively, environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 may mounted to the second body 114 in irregular positions.

[0440] The first emission module 112A comprises a first subset 110A of the targeting optical systems 110. Each targeting optical system 110 of the first subset 110A of targeting optical systems 110 is mounted to the first body 114A. Each targeting optical system 110 of the first subset 110A of targeting optical systems 110 is configured to redirect electromagnetic radiation. In particular, each targeting optical system 110 of the first subset 110A of targeting optical systems 110 is configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter 108 of the first subset 108A of environment mapping emitters 108. That is, each targeting optical system 110 of the first subset 110A of targeting optical systems 110 redirects electromagnetic radiation emitted from a respective environment mapping emitter 108 of the first subset 108A of environment mapping emitters 108. Each targeting optical system 110 of the first subset 110A of targeting optical systems 110 is configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter 108 of the first subset 108A of environment mapping emitters 108 towards a respective target region. The target regions may be independent of each other. That is, the target regions may each be a different region of the environment. In some embodiments, there is overlap in the target regions. That is, part of a first target region may overlap part of a second target region. In other words, a portion of a first target region may also be portion of a second target region.

[0441] An exterior surface 116A of the first body 114A defines at least part of a first plane. In other words, the exterior surface 116A of the first body 114A is planar. A targeting optical system 110 of the first subset 110A of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. That is, a targeting optical system 110 of the first subset 110A of targeting optical systems 110 directs the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. One or more of the targeting optical systems 110 of the first subset 110A of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane. In the illustrated embodiment, each targeting optical system 110 of the first subset 110A of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the first plane.

[0442] Throughout this description, the term “transverse” may be interpreted as non-parallel. That is, a straight line is transverse to a plane when the straight line is not parallel to the plane. In such a case, the straight line will intersect the plane at one point. Similarly, a first plane may be said to be transverse to a second plane when the first plane and the second plane intersect. Such planes can intersect at any angle greater than 0° and the planes will still be consideredtransverse. In other words, a first plane is transverse to a second plane when the first plane and the second plane are non-parallel.

[0443] The environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 are mounted to the first body 114A such that they are colinear. The environment mapping emitters 108 of the first subset 108A of environment mapping emitters 108 are mounted to the first body 114A such that they are coplanar.

[0444] The environment mapping system 106 comprises a second emission module 112B. The second emission module 112B comprises a second body 114B. The second body 114B is in the form of a base of a printed circuit board. The second emission module 112B comprises a second subset 108B of the environment mapping emitters 108 (see Figure 1). Each environment mapping emitter 108 of the second subset 108B of environment mapping emitters 108 is mounted to the second body 114B. In other words, the environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 are mounted to the first body 114A. It will be appreciated that this mounting may be direct (e.g. the environment mapping emitters 108 may be directly soldered to a connection on the second body 114B). Alternatively, this mounting may be indirect (e.g. the environment mapping emitters 108 may be removably mounted to one or more mounting components that are directly mounted to the second body 114B, for example, with a soldered connection). The environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 are mounted to the second body 114B such that they are coplanar. The environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 are mounted to the second body 114B such that they are colinear. Alternatively, environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 may mounted to the second body 114B in irregular positions.

[0445] The second emission module 112B comprises a second subset 110B of the targeting optical systems 110. Each targeting optical system 110 of the second subset 110B of targeting optical systems 110 is mounted to the second body 114B. Each targeting optical system 110 of the second subset 110B of targeting optical systems 110 is configured to redirect electromagnetic radiation. In particular, each targeting optical system 110 of the second subset 110B of targeting optical systems 110 is configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter 108 of the second subset 108B of environment mapping emitters 108. That is, each targeting optical system 110 of the second subset 110B of targeting optical systems 110 redirects electromagnetic radiation emitted from a respective environment mapping emitter 108 of the second subset 108B of environment mapping emitters 108. Each targeting optical system 110 of the second subset 110B of targeting optical systems 110 is configured to redirect electromagnetic radiation emitted from a respective environment mapping emitter 108 of the second subset 108B of environment mapping emitters 108 towards a respective target region. The target regions may be independent of each other.That is, the target regions may each be a different region of the environment. In some embodiments, there is overlap in the target regions. That is, part of a first target region may overlap part of a second target region. In other words, a portion of a first target region may also be portion of a second target region.

[0446] The target regions associated with the second emission module 112B may have one or more portions in common with the target regions associated with the first emission module 112A. In other words, there may be an overlap between the regions of the environment targeted by the second emission module 112B compared to those targeted by the first emission module 112A. It will be understood; however, that the target regions of the second emission module 112B may comprise different regions of the environment of the monitoring system 100 to the target regions associated with the first emission module 112A. That is, at least part of the regions of the environment of the monitoring system 100 that are targeted by the second emission module 112B is different to those targeted by the first emission module 112A.

[0447] An exterior surface 116B of the second body 114B defines at least part of a second plane. In other words, the exterior surface 116B of the second body 114B is planar. A targeting optical system 110 of the second subset 110B of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. That is, a targeting optical system 110 of the second subset 11 OB of targeting optical systems 110 directs the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. One or more of the targeting optical systems 110 of the second subset 110B of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. In the illustrated embodiment, each targeting optical system 110 of the second subset 110B of targeting optical systems 110 is configured to direct the electromagnetic radiation emitted from the associated environment mapping emitter 108 in one or more directions that are transverse to the second plane. The first plane is transverse to the second plane.

[0448] The environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 are mounted to the second body 114B such that they are colinear. The environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 are mounted to the second body 114B such that they are coplanar. The environment mapping emitters 108 of the second subset 108B of environment mapping emitters 108 may be mounted to the second body 114B in another formation.

[0449] The first emission module 112A is radially offset from an axial axis of the monitoring system 100. The axial axis may correspond to the optical axis 174. The optical axis 174 may be the axial axis of the monitoring system 100. The first emission module 112A is radially offset from an axial axis of the monitoring system 100 along a plane that is orthogonal to the opticalaxis 174. The second emission module 112B is radially offset from the axial axis of the monitoring system 100. The second emission module 112B is radially offset from the axial axis of the monitoring system 100 along the plane that is orthogonal to the optical axis 174. The first emission module 112A and the second emission module 112B are radially offset from the axial axis of the monitoring system 100 by the same amount. That is, they are the same distance away from the axial axis, measured in respective radial directions that are orthogonal to the axial axis.Depth Testing System 122

[0450] Referring to Figures 8 to 13, the monitoring system 100 comprises a depth testing system 122. In particular, the emission system 106 comprises the depth testing system 122. The depth testing system 122 is configured to emit electromagnetic radiation. That is, the depth testing system 122 emits electromagnetic radiation. The depth testing system 122 comprises a depth testing emitter 124. The depth testing system 122 comprises one or more depth testing emitters 124. The illustrated depth testing system 122 comprises a plurality of depth testing emitters 124.

[0451] The depth testing emitter 124 is configured to emit electromagnetic radiation. The depth testing emitter 124 emits electromagnetic radiation. One or more of the depth testing emitters 124 is configured to emit electromagnetic radiation. One or more of the depth testing emitters 124 emits electromagnetic radiation. A plurality of the depth testing emitters 124 are configured to emit electromagnetic radiation. A plurality of the depth testing emitters 124 emit electromagnetic radiation. In the illustrated embodiment, each depth testing emitter 124 is configured to emit electromagnetic radiation. That is, each depth testing emitter 124 emits electromagnetic radiation. The depth testing emitters 124 emit electromagnetic radiation when energised. That is, the depth testing emitters 124 emit electromagnetic radiation when activated.

[0452] The depth testing system 122 comprises a depth testing optical system 126. The depth testing optical system 126 is configured to manipulate electromagnetic radiation. The depth testing optical system 126 manipulates electromagnetic radiation. In particular, the depth testing optical system 126 introduces an optical delay. The optical delay is a delay between a time at which incident electromagnetic radiation encounters the depth testing optical system 126 and a time that it is emitted. The depth testing optical system 126 is configured to direct incident electromagnetic radiation along its length. The depth testing optical system 126 directs incident electromagnetic radiation along its length. This takes time. Thus, the time delay is, in some embodiments, introduced by the depth testing optical system 126 directing incident electromagnetic radiation along its length. The depth testing system 122 comprises one or more depth testing optical systems 126. The depth testing optical systems 126 are configured to manipulate electromagnetic radiation. The depth testing optical systems 126 manipulate electromagnetic radiation. One or more of the depth testing optical systems 126 is configuredto direct incident electromagnetic radiation along its length. One or more of the depth testing optical systems 126 emit incident electromagnetic radiation along its length. The depth testing system 122 comprises a plurality of depth testing optical systems 126. Each depth testing optical system 126 is configured to direct incident electromagnetic radiation along its length. That is, each depth testing optical system directs incident electromagnetic radiation along its length.Depth Testing Emitters 124

[0453] A depth testing emitter 124 is configured to emit electromagnetic radiation within a frequency range. That is, a depth testing emitter 124 emits electromagnetic radiation within a frequency range. One or more of the depth testing emitters 124 is configured to emit electromagnetic radiation within a frequency range. One or more of the depth testing emitters 124 emits electromagnetic radiation within the frequency range. A plurality of the depth testing emitters 124 are configured to emit electromagnetic radiation within a frequency range. That is, a plurality of depth testing emitters 124 emit electromagnetic radiation within the frequency range. In the illustrated embodiment, each of the depth testing emitters 124 are configured to emit electromagnetic radiation within a frequency range. That is, each of the depth testing emitters 124 emit electromagnetic radiation within the frequency range.

[0454] The frequency range may be referred to as a depth testing frequency range. In particular, one or more of the depth testing emitters 124 is configured to emit electromagnetic radiation within a frequency range that spans from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It will be appreciated that the lower frequency threshold and / or the upper frequency threshold may correspond to points at which the intensity of the emitted electromagnetic radiation falls below an intensity threshold.

[0455] The frequency range of one or more of the depth testing emitters 124 may comprise 450nm. The frequency range of one or more of the depth testing emitters 124 may comprise 940nm. The frequency range of one or more of the depth testing emitters 124 may comprise one or more of 200nm, 250nm, 300nm, 400nm, 450nm, 500nm, 550nm, 600nm, 650nm, 700nm, 750nm, 800nm, 850nm, 900nm, 950nm, 1000nm, 1100nm, 1200nm, 1300nm, 1400nm, 1500nm, 1600nm, 1700nm, 1800nm, 1900nm and 2000nm. In some embodiments, the depth testing emitters 124 are configured to emit electromagnetic radiation with a wavelength that is between 200nm and 3000nm. In some embodiments, the depth testing emitters 124 are configured to emit electromagnetic radiation with a wavelength that is between 400nm and 1000nm. In some embodiments, the depth testing emitters 124 are configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm. In some embodiments, the depth testing emitters 124 are configured to emit electromagnetic radiation with a wavelength that is between 300nm and 2000nm.

[0456] In some embodiments, the frequency range of one or more of the depth testing emitters 124 is different to the frequency range of one or more other depth testing emitter 124. That is, a first depth testing emitter 124 may emit electromagnetic radiation within a first frequency range. A second first depth testing emitter 124 may emit electromagnetic radiation within a second frequency range. The second frequency range may be different to the first frequency range. The first frequency range may overlap the second frequency range.

[0457] A depth testing emitter 124 is configured to emit electromagnetic radiation in a respective emission direction. That is, a depth testing emitter 124 emits electromagnetic radiation in a respective emission direction. Each depth testing emitter 124 is configured to emit electromagnetic radiation in a respective emission direction. That is, each depth testing emitter 124 emits electromagnetic radiation in a respective emission direction. The emission direction of a respective depth testing emitter 124 may be determined, at least in part, by the configuration in which the depth testing emitter 124 is mounted to another component of the monitoring system 100. One or more of the depth testing emitters 124 is in the form of a laser. One or more of the depth testing emitters 124 may be in the form of a light emitting diode or another light emitting component.

[0458] The illustrated monitoring system 100 comprises four depth testing emitters 124. It will, however, be appreciated that in some embodiments, the monitoring system 100 may comprise a different number of depth testing emitters 124. For example, the monitoring system 100 may comprise any number of depth testing emitters 124 between the numbers 1 and 10. Alternatively, the monitoring system 100 may comprise more than 10 depth testing emitters 124. The monitoring system 100 may comprise 1 , 2, 3, 5, 6, 7, 8, 9 or 10 depth testing emitters 124. The number of depth testing emitters 124 may be a power of 2. The number of depth testing emitters 124 may be a multiple of 2.Depth Testing Optical Systems 126

[0459] The monitoring system 100 comprises a depth testing optical system 126. The monitoring system 100 comprises one or more depth testing optical systems 126. The illustrated monitoring system 100 comprises a plurality of depth testing optical systems 126. The depth testing system 122 comprises the depth testing optical systems 126. In particular, the depth testing system 122 comprises a depth testing optical system 126 for each depth testing emitter 124. In other words, the number of depth testing optical systems 126 is the same as the number of depth testing emitters 124. One or more of the depth testing optical systems 126 is associated with a respective depth testing emitter 124. In the illustrated configuration, each depth testing optical system 126 is associated with a respective depth testing emitter 124.

[0460] A depth testing emitter 124 is configured to emit electromagnetic radiation at a respective depth testing optical system 126. That is, a depth testing emitter 124 emits electromagnetic radiation at a respective depth testing optical system 126. One or more of the depth testing emitters 124 is configured to emit electromagnetic radiation at a respective depthtesting optical system 126. That is, one or more of the depth testing emitters 124 emits electromagnetic radiation at a respective depth testing optical system 126. The depth testing optical system 126 at which a particular depth testing emitter 124 emits electromagnetic radiation may be considered to be the depth testing optical system 126 that is associated with the particular depth testing emitter 124. In other words, one or more of the depth testing emitters 124 is configured to emit electromagnetic radiation at an associated depth testing optical system 126. A plurality of the depth testing emitters 124 are configured to emit electromagnetic radiation at respective depth testing optical systems 126. In the illustrated embodiment, each depth testing emitter 124 is configured to emit electromagnetic radiation at an associated depth testing optical system 126. That is, each depth testing emitter 124 emits electromagnetic radiation at an associated depth testing optical system 126.

[0461] A depth testing optical system 126 comprises an incident end portion 128. One or more of the depth testing optical systems 126 comprises an incident end portion 128 (see Figure 12). A plurality of the depth testing optical systems 126 comprise respective incident end portions 128. The incident end portion 128 comprises an incident end of the depth testing optical system 126. In the illustrated embodiment, each depth testing optical system 126 comprises an incident end portion 128. A depth testing optical system 126 comprises an emitting end portion 130. One or more of the depth testing optical systems 126 comprises an emitting end portion 130 (see Figure 10). A plurality of the depth testing optical systems 126 comprise respective emitting end portions 130. The emitting end portion 130 comprises an emitting end of the depth testing optical system 126. In the illustrated embodiment, each depth testing optical system 126 comprises an emitting end portion 130.

[0462] A depth testing optical system 126 extends from its incident end portion 128 or its emitting end portion 130. One or more of the depth testing optical systems 126 extends from its incident end portion 128 to its emitting end portion 130. A plurality of the depth testing optical systems 126 extend from their respective incident end portion 128 to their respective emitting end portion 130. In the illustrated embodiment, each depth testing optical system 126 extends from its incident end portion 128 to its emitting end portion 130. That is, each depth testing optical system 126 extends from its incident end to its emitting end. The incident end portion 128 and the emitting end portion 130 of a respective depth testing optical system 126 are separated by a length of the respective depth testing optical system 126. That is, a length of a depth testing optical system 126 is the distance between its incident end and its emitting end. The length of a number of the depth testing optical systems 126 is the distance between the incident end and the emitting end of that depth testing optical system 126.

[0463] A depth testing emitter 124 is configured to emit electromagnetic radiation at the incident end portion 128 of the associated depth testing optical system. A depth testing emitter 124 emits electromagnetic radiation at the incident end portion 128 of the associated depth testing optical system. One or more of the depth testing emitters 124 is configured to emitelectromagnetic radiation at the incident end portion 128 of the associated depth testing optical system 126. One or more of the depth testing emitters 124 emits electromagnetic radiation at the incident end portion 128 of the associated depth testing optical system 126. A plurality of the depth testing emitters 124 are configured to emit electromagnetic radiation at the incident end portions 128 of the associated depth testing optical systems 126. A plurality of the depth testing emitters 124 emit electromagnetic radiation at the incident end portions 128 of the associated depth testing optical systems 126. In the illustrated embodiment, each depth testing emitter 124 is configured to emit electromagnetic radiation at the incident end portion 128 of the associated depth testing optical system 126. That is, each depth testing emitter 124 is configured to emit electromagnetic radiation at the incident end portion 128 of the associated depth testing optical system 126.

[0464] A depth testing optical system 126 is configured to direct electromagnetic radiation. A depth testing optical system 126 directs electromagnetic radiation. One or more of the depth testing optical systems 126 is configured to direct electromagnetic radiation. One or more of the depth testing optical systems 126 directs electromagnetic radiation. In particular, one or more of the depth testing optical systems 126 is configured to direct at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. That is, one or more of the depth testing optical systems 126 directs at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. In the illustrated embodiment, each depth testing optical system 126 is configured to direct at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. That is, each depth testing optical system 126 directs at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. A depth testing optical system 126 is configured to emit at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130. A depth testing optical system 126 emits at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130. One or more of the depth testing optical systems 126 is configured to emit at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130. One or more of the depth testing optical systems 126 emit at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130. A plurality of the depth testing optical systems 126 are configured to emit at least some of the electromagnetic radiation directed along their lengths, from their respective emitting end portions 130. A plurality of the depth testing optical systems 126 emit at least some of the electromagnetic radiation directed along their lengths, from their respective emitting end portions 130. In the illustrated embodiment, each depth testing optical system 126 is configured to emit at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130. That is,each depth testing optical system 126 emits at least some of the electromagnetic radiation directed along its length, from its emitting end portion 130.

[0465] A depth testing optical system 126 comprises a depth testing refractor. One or more of the depth testing optical systems 126 comprise a depth testing refractor. A plurality of the depth testing optical systems 126 comprise a depth testing refractor. In the illustrated embodiment, each of the depth testing optical systems 126 comprise a depth testing refractor. The depth testing refractor may be in the form of a prism. The depth testing refractor may be in the form of a lens. The depth testing refractor may be in the form of an optical fibre. One or more of the depth testing optical systems 126 may comprise a plurality of refractors (e.g., one or more prisms, one or more lenses and / or one or more optical fibres).

[0466] A depth testing optical system 126 may comprise a depth testing reflector. One or more of the depth testing optical systems 126 may comprise a depth testing reflector. A plurality of the depth testing optical systems 126 comprise a depth testing reflector. For example, one or more of the depth testing optical systems 126 may comprise one or more mirrors and / or an optical fibre that is configured to totally internally reflect incident electromagnetic radiation. The one or more mirrors may be configured to redirect incident electromagnetic radiation emitted from the associated depth testing emitter 124.

[0467] A depth testing optical system 126 may comprise a depth testing diffractor. One or more of the depth testing optical systems 126 may comprise a depth testing diffractor. A plurality of the depth testing optical systems 126 may comprise a depth testing diffractor. For example, one or more of the depth testing optical systems 126 may comprise one or more diffractor gratings. The one or more diffractors may be configured to diffract incident electromagnetic radiation emitted from the associated depth testing emitter 124.

[0468] The illustrated depth testing optical systems 126 comprise an optical fibre 132. Specifically, the illustrated depth testing optical systems 126 each comprise an optical fibre 132. The optical fibres 132 each extend from a respective incident end portion 128 to an emitting end portion 130. A length of an optical fibre 132 is a distance between the incident end portion 128 and the emitting end portion 130 of that optical fibre 132. The incident end portion 128 of an optical fibre 132 comprises an incident end. The incident end is a first end of the optical fibre 132. The emitting end portion 130 of that optical fibre 132 comprises an emitting end. The emitting end is a second end of the optical fibre 132. The length of the optical fibre 132 is the distance between the incident end and the emitting end of the optical fibre 132, measured along the longitudinal length of the optical fibre 132. It will be appreciated that optical fibres 132 may curve along their length. In such a case, the length of the optical fibre 132 is the distance between the incident end and the emitting end of that optical fibre 132, measured along the curved length of the optical figure 132. That is, the path along which the measurement is taken curves with the optical fibre 132.

[0469] An optical fibre 132 is configured to totally internally reflect at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. That is, an optical fibre 132 totally internally reflects at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. In the illustrated embodiment, each optical fibre 132 is configured to totally internally reflect at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. That is, each optical fibre 132 totally internally reflects at least some of the electromagnetic radiation that is emitted at its incident end portion 128 by the associated depth testing emitter 124, along its length. Further, each optical fibre 132 is configured to emit at least some of the totally internally reflected electromagnetic radiation from its emitting end portion 130. That is, each optical fibre 132 emit at least some of the totally internally reflected electromagnetic radiation from its emitting end portion 130. It will be appreciated that some proportion of the electromagnetic radiation that is totally internally reflected towards the incident end portion 128 may be lost to inefficiencies (e.g. leaked) along the length of the optical fibre 132.

[0470] The length of one or more of the depth testing optical systems 126 is different from the length of one or more of the other depth testing optical systems 126. In the illustrated embodiment, the length of each of the optical fibres 132 is different. The length of one or more of the optical fibres 132 is a multiple of the length of one or more other optical fibre 132.

[0471] In particular, the plurality of depth testing optical systems 126 comprises a first optical fibre 132A. In particular, a first depth testing optical system 126 comprises the first optical fibre 132A. The first optical fibre 132A is of a first length. The plurality of depth testing optical systems 126 comprises a second optical fibre 132B. In particular, a second depth testing optical system 126 comprises the second optical fibre 132B. The second optical fibre 132B is of a second length. The second length is a multiple of the first length. The plurality of depth testing optical systems 126 comprises a third optical fibre 132C. In particular, a third depth testing optical system 126 comprises the third optical fibre 132C. The third optical fibre 132C is of a third length. The third length is a multiple of the first length. The plurality of depth testing optical systems 126 comprises a fourth optical fibre 132D. The fourth optical fibre 132D is of a fourth length. The fourth length is a multiple of the first length.

[0472] The length of one or more of the depth testing optical systems 126 is about 2m. The length of one or more of the optical fibres 132 is about 2m. The length of one or more of the depth testing optical systems 126 is about 4m. The length of one or more of the optical fibres 132 is about 4m. The length of one or more of the depth testing optical systems 126 is about 6m. The length of one or more of the optical fibres 132 is about 6m. The length of one or more of the depth testing optical systems 126 is about 8m. The length of one or more of the optical fibres 132 is about 8m. In some embodiments, the length of one or more of the depthtesting optical systems 126 and / or the length of one or more of the depth testing optical fibres 132 is about 1 m, 2m, 3m, 4m, 5m, 6m, 7m, 8m, 9m, 10m or more than 10m.

[0473] A depth testing optical system 126 may comprise a depth testing refractor. A depth testing optical system 126 may comprise depth testing reflector. A depth testing optical system 126 may comprise a depth testing diffractor. A depth testing optical system 126 may comprise a depth testing optical splitter. One or more of the depth testing optical systems 126 may comprise an optical splitter. A plurality of the depth testing optical systems 126 may comprise an optical splitter. Each depth testing optical system 126 may comprise an optical splitter. A depth testing optical system 126 may comprise an optical filter. One or more of the depth testing optical systems 126 may comprise an optical filter. A plurality of the depth testing optical systems 126 may comprise an optical filter. Each depth testing optical system 126 may comprise an optical filter. A depth testing optical system 126 may comprise an optical switch. One or more of the depth testing optical systems 126 may comprise an optical switch. A plurality of the depth testing optical systems 126 may comprise an optical switch. Each depth testing optical system 126 may comprise an optical switch. A depth testing optical system 126 may comprise an optical transmitter. One or more of the depth testing optical systems 126 may comprise an optical transmitter. A plurality of the depth testing optical systems 126 may comprise an optical transmitter. Each depth testing optical system 126 may comprise an optical transmitter. A depth testing optical system 126 may comprise an optical disperser. One or more of the depth testing optical systems 126 may comprise an optical disperser. A plurality of the depth testing optical systems 126 may comprise an optical disperser. Each depth testing optical system 126 may comprise an optical disperser.Depth Testing Module 134

[0474] Referring to Figures 8, 13 and 14, the monitoring system 100 comprises a depth testing module 134. The illustrated monitoring system 100 comprises one depth testing module 134. It will be appreciated however, that in some embodiments, the monitoring system 100 may comprise more than one depth testing module 134 that is the same as or similar to the depth testing module 134 described herein. That is, the monitoring system 100 may comprise a plurality of depth testing modules. The depth testing module 134 may be in the form of a printed circuit board. The depth testing system 122 comprises the depth testing module 134.

[0475] The depth testing system 122 comprises a depth testing system body 136. In particular, the depth testing module 134 comprises the depth testing system body 136. That is, the depth testing system body 136 may be a body of the depth testing module 134. The depth testing system body 136 may be in the form of a base of a printed circuit board. The depth testing emitters 124 are mounted to the depth testing system body 136. The depth testing system body 136 is oriented in a way that is transverse to one or more of the emission modules 112. The depth testing system body 136 is oriented in a way that is transverse to the first body 114A of the first emission module 112A.

[0476] A depth testing optical system 126 is configured to be connected to the associated depth testing emitter 124. A depth testing optical system 126 is connected to the associated depth testing emitter 124. This connection may be a physical connection. This connection may be an optical connection. In other words, a depth testing optical system 126 is optically connected to the associated depth testing emitter. One or more depth testing optical system 126 is configured to be connected to the associated depth testing emitter 124. One or more depth testing optical system 126 is connected to the associated depth testing emitter 124. One or more depth testing optical system 126 is optically connected to the associated depth testing emitter 124. A plurality of the depth testing optical systems 126 are configured to be connected to the respective associated depth testing emitters 124. A plurality of the depth testing optical systems 126 are connected to the respective associated depth testing emitters 124. A plurality of the depth testing optical systems 126 are optically connected to the respective associated depth testing emitters 124. In the illustrated embodiment, each depth testing optical system 126 is configured to be connected to the associated depth testing emitter 124. That is, each depth testing optical system 126 is connected to the associated depth testing emitter 124. Each depth testing optical system 126 is optically connected to the associated depth testing emitter 124.

[0477] In particular, each depth testing optical system 126 is configured to be connected to the associated depth testing emitter 124 such that the incident end portion 128 of the respective depth testing optical system 126 faces the associated depth testing emitter 124. Each depth testing optical system 126 is connected to the associated depth testing emitter 124 such that the incident end portion 128 of the respective depth testing optical system 126 faces the associated depth testing emitter 124. In other words, each depth testing optical system 126 is mounted, with respect to the associated depth testing emitter 124, such that the incident end portion 128 of the respective depth testing optical system 126 faces the associated depth testing emitter 124. The depth testing optical systems 126 may be mounted to the associated depth testing emitters 124. The depth testing optical systems 126 may be mounted to another component of the monitoring system 100. In some embodiments, a depth testing optical system 126 is mounted to the associated depth testing emitter 124 such that the depth testing optical system 126 and the associated depth testing emitter 124 are in contact. That is, one or more, or a plurality of the depth testing optical systems 126 are in contact with the respective associated depth testing emitters 124.

[0478] An exterior surface 138 (see Figure 13) of the depth testing system body 136 defines at least part of a depth testing system body plane. In other words, the exterior surface 138 of the depth testing system body 136 is planar. The exterior surface 138 of the depth testing system body 136 may be referred to as a face of the depth testing system body 136.

[0479] One or more of the depth testing optical systems 126 extend away from the depth testing system body 136. In the illustrated embodiment, each of the depth testing optical systems 126 extend away from the depth testing system body 136 in a direction that istransverse to the depth testing system body plane. In particular, the optical fibres 132 extend perpendicularly away from the depth testing system body plane. The optical fibres 132 extend away from the depth testing system body 136 in a direction that is orthogonal to the plane of the depth testing system body 136.

[0480] A depth testing optical system 126 curves along its length. That is, an optical fibre 132 curves along its length. One or more of the depth testing optical systems 126 curve along their length. One or more of the optical fibres 132 curve along their respective lengths. In the illustrated embodiment, the depth testing optical systems 126 curve to encircle an internal region 140 of the monitoring system 100 (see Figures 9 and 12). In particular, the optical fibres 132 curve to encircle the internal region 140 of the monitoring system 100. The optical fibres 132 curve to define the internal region 140. The internal region 140 is cylindrical. One or more of the optical fibres 132 encircle the internal region 140 of the monitoring system 100 a different number of times to another of the optical fibres 132. This is because one or more of the optical fibres 132 is longer than another of the optical fibres 132. In the illustrated embodiment, each depth testing optical fibre 132 encircles the internal region 140 of the emission system a different number of times to each other depth testing optical fibre 132.

[0481] The depth testing system 122 comprises four depth testing emitters 124. It will be appreciated however, that in some embodiments, the depth testing system 122 may comprise an alternative number of depth testing emitters 124. For example, the depth testing system 122 may comprise one, two, three, four, five, six, seven, eight, nine, ten or more than ten depth testing emitters 124. The depth testing system 122 comprises four depth testing optical systems 126. It will be appreciated however, that in some embodiments, the depth testing system 122 may comprise an alternative number of depth testing optical systems 126. For example, the depth testing system 122 may comprise one, two, three, four, five, six, seven, eight, nine, ten or more than ten depth testing optical systems 126. The depth testing system 122 comprises the same number of depth testing emitters 124 and depth testing optical systems 126.Planar Testing System 146

[0482] The monitoring system 100 comprises a window 142 (see Figure 1). The window 142 is optically transparent to at least some electromagnetic radiation. The window 142 may be opaque to some electromagnetic radiation. That is, the window 142 may act to filter certain frequency bands of electromagnetic radiation. The window 142 is configured to reflect at least some electromagnetic radiation that is incident to a surface of the window 142. Specifically, the window 142 reflects at least some of the electromagnetic radiation that is incident on an inner surface of the window 142. The window 142 may comprise a polarization switch. In such a configuration, the window 142 can selectively enable simple transmission of polarized electromagnetic radiation or can rotate the polarized electromagnetic radiation by a rotation angle (about an incident axis). The rotation angle may be 45°, 90° or another angle.

[0483] The window 142 is mounted in position with respect to the housing 102. In some embodiments, the window 142 is mounted to the housing 102. The window 142 is positioned at a front of the monitoring system 100. The window 142 is parallel to the front wall 104A of the housing 102. The window 142 is transparent to a range of electromagnetic wavelengths. This range may be referred to as a first range. The window 142 is opaque to another range of electromagnetic wavelengths. This range may be referred to as a second range. While the illustrated embodiment comprises one window 142, it will be appreciated that some embodiments may comprise more than one window. For example, in some embodiments, the monitoring system 100 comprises a plurality of windows. Further, while the illustrated window 142 is planar, it will be appreciated that in some embodiments, a profile of the window 142 may comprise one or more curves. That is, the window 142 may curve along one or more radius of curvature.

[0484] The monitoring system 100 comprises an optical filter 144 (see Figure 26). The optical filter 144 is transparent to some electromagnetic radiation. The optical filter 144 is opaque to other electromagnetic radiation. The optical filter 144 is transparent to a range of electromagnetic wavelengths. The optical filter 144 is opaque to another range of electromagnetic wavelengths. In other words, the optical filter 144 is configured to filter out wavelengths within a particular range. The optical filter 144 may be a multi-band pass optical filter. The window 142 may comprise the optical filter 144. The lens system 172 may comprise the optical filter 144. The optical filter 144 may comprise a polarization switch. In such a configuration, the optical filter 144 can selectively enable simple transmission of polarized electromagnetic radiation or can rotate the polarized electromagnetic radiation by a rotation angle (about an incident axis). The rotation angle may be 45°, 90° or another angle.

[0485] The emission system 106 comprises a planar testing system 146 (see Figure 8). The planar testing system 146 is configured to enable one or more features of the monitoring system 100 to be tested. In the illustrated embodiment, the planar testing system 146 enables a physical characteristic of the monitoring system 100 to be tested. Specifically, the planar testing system 146 enables the presence of the window 142 to be tested. The planar testing system 146 also enables the physical position and / or orientation of the window 142 to be tested. The planar testing system 146 enables the operation of the sensing system 120 to be tested. For example, the planar testing system 146 enables testing of the functionality of the sensor module 170. Specifically, the planar testing system 146 enables testing of the functionality of row portions and / or column portions of the sensor module 170. The row portions and / or column portions comprise sensing units that can be tested. The planar testing system 146 enables testing of the lens system 172 to be tested.

[0486] The planar testing system 146 is configured to emit electromagnetic radiation. The planar testing system 146 comprises a planar testing emitter 148. The planar testing emitter 148 is configured to emit electromagnetic radiation. The planar testing emitter 148 emitselectromagnetic radiation. The planar testing system 146 comprises one or more planar testing emitters 148. The one or more planar testing emitter 148 is configured to emit electromagnetic radiation. The one or more planar testing emitter 148 emits electromagnetic radiation. The illustrated planar testing system 146 comprises a plurality of planar testing emitters 148. The plurality of planar testing emitters 148 are configured to emit electromagnetic radiation. The plurality of planartesting emitters 148 emit electromagnetic radiation. In the illustrated embodiment, each planar testing emitter 148 emits electromagnetic radiation. The planar testing emitters 148 emit electromagnetic radiation when energised. That is, the planartesting emitters 148 emit electromagnetic radiation when activated.

[0487] A planar testing emitter 148 is configured to emit electromagnetic radiation. A planar testing emitter 48 emits electromagnetic radiation. One or more planartesting emitter 148 is configured to emit electromagnetic radiation. One or more planar testing emitter 148 emits electromagnetic radiation. A plurality of planartesting emitters 146 are configured to emit electromagnetic radiation. A plurality of planartesting emitters 146 emit electromagnetic radiation. Each planartesting emitter 148 is configured to emit electromagnetic radiation. Each planar testing emitter emits electromagnetic radiation.

[0488] The planartesting emitters 148 are configured to emit electromagnetic radiation at respective target portions of the window 142. The planar testing emitters 148 emit electromagnetic radiation at respective target portions of the window 142. In the illustrated embodiment, each planar testing emitter 148 is configured to emit electromagnetic radiation at a respective target portion of the window 142. That is, each planartesting emitter 148 emits electromagnetic radiation at a respective target portion of the window 142. In other words, the planar testing target area of each planar testing emitter 148 is a respective target portion of the window 142. The planar testing emitters 148 may be configured to emit electromagnetic radiation directly at the respective target portion of the window 142. That is, the planar testing emitters 148 may emit electromagnetic radiation directly at the respective target portions of the window 142. Alternatively, the planartesting emitters 148 may be configured to emit electromagnetic radiation towards one or more optical systems that redirects the electromagnetic radiation towards the respective target portion of the window 142. That is, the planar testing emitters 148 may emit electromagnetic radiation towards an optical system that redirects the electromagnetic radiation towards the respective target portion of the window 142. Planar Testing Emitters 148

[0489] A planar testing emitter 148 is configured to emit electromagnetic radiation within a frequency range. That is, a planartesting emitter 148 emits electromagnetic radiation within a frequency range. One or more of the planartesting emitters 148 is configured to emit electromagnetic radiation within the frequency range. One or more of the planar testing emitters 148 emits electromagnetic radiation within the frequency range. A plurality of the planar testing emitters 148 are configured to emit electromagnetic radiation within a frequency range.That is, a plurality of the planar testing emitters 148 emit electromagnetic radiation within the frequency range. In the illustrated embodiment, each of the planar testing emitters 148 are configured to emit electromagnetic radiation within a frequency range. That is, each of the planar testing emitters 148 emits electromagnetic radiation within the frequency range.

[0490] The frequency range may be referred to as a planar testing frequency range. In particular, one or more of the planar testing emitters 148 is configured to emit electromagnetic radiation within a frequency range that spans from a lower frequency threshold to an upper frequency threshold. That is, the frequency range extends between the lower frequency threshold and the upper frequency threshold. It will be appreciated that the lower frequency threshold and / or the upper frequency threshold may correspond to points at which the intensity of the emitted electromagnetic radiation falls below an intensity threshold.

[0491] The frequency range of one or more of the planar testing emitters 148 may comprise 450nm. The frequency range of one or more of the planar testing emitters 148 may comprise 940nm. The frequency range of one or more of the planar testing emitters 148 may comprise one or more of 200nm, 250nm, 300nm, 400nm, 450nm, 500nm, 550nm, 600nm, 650nm, 700nm, 750nm, 800nm, 850nm, 900nm, 950nm, 1000nm, 1100nm, 1200nm, 1300nm, 1400nm, 1500nm, 1600nm, 1700nm, 1800nm, 1900nm and 2000nm. In some embodiments, the planar testing emitters 148 are configured to emit electromagnetic radiation with a wavelength that is between 200nm and 3000nm. In some embodiments, the planar testing emitters 148 are configured to emit electromagnetic radiation with a wavelength that is between 400nm and 1000nm. In some embodiments, the planar testing emitters 148 are configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm. In some embodiments, the planar testing emitters 148 are configured to emit electromagnetic radiation with a wavelength that is between 300nm and 2000nm.

[0492] In some embodiments, the frequency range of one or more of the planar testing emitters 148 is different to the frequency range of one or more other planar testing emitter 148. That is, a first planar testing emitter 148 may emit electromagnetic radiation within a first frequency range. A second planar testing emitters 148 may emit electromagnetic radiation within a second frequency range. The second frequency range may be different to the first frequency range. The first frequency range may overlap the second frequency range.

[0493] The frequency range of a planar testing emitter 148 may be the same as the frequency range of an environment mapping emitter 108. The frequency range of a planar testing emitter 148 may be the same as the frequency range of a depth testing emitter 124. The frequency range of a plurality of the planar testing emitters 148 may be the same as the frequency range of one or more of the environment mapping emitters 108. The frequency range of a plurality of planar testing emitters 148 may be the same as the frequency range of one or more of the depth testing emitters 124. The frequency range of a planar testing emitter 148 may be the different to the frequency range of an environment mapping emitter 108. The frequencyrange of a planar testing emitter 148 may be different to the frequency range of a depth testing emitter 124. The frequency range of a plurality of the planar testing emitters 148 may be different to the frequency range of one or more of the environment mapping emitters 108. The frequency range of a plurality of planar testing emitters 148 may be different to the frequency range of one or more of the depth testing emitters 124.

[0494] A planar testing emitter 148 is configured to emit electromagnetic radiation in a respective emission direction. That is, a planar testing emitter 148 emits electromagnetic radiation in a respective emission direction. Each planar testing emitters 148 is configured to emit electromagnetic radiation in a respective emission direction. That is, each planar testing emitter 148 emits electromagnetic radiation in a respective emission direction. The emission direction of a respective planar testing emitter 148 may be determined, at least in part, by the configuration in which the planar testing emitter 148 is mounted to another component of the monitoring system 100. One or more of the planar testing emitters 148 is in the form of a laser. One or more of the planar testing emitters 148 may be in the form of a light emitting diode or another light emitting component.

[0495] The illustrated embodiment includes sixteen planar testing emitters 148. It will be appreciated however, that some embodiments may include an alternative number of planar testing emitters 148. For example, some embodiments may comprise one, two, three, four, five, six, seven, eight, nine, ten, eleven, twelve, thirteen, fourteen, fifteen or sixteen planar testing emitters 148. Some embodiments may comprise more than sixteen planar testing emitters 148. The number of planar testing emitters 148 may be a power of 2. The number of planar testing emitters 148 may be a multiple of 2.Planar Testing Optical Systems 150

[0496] The monitoring system 100 may comprise a planar testing optical system 150. The planar testing optical system 150 is configured to manipulate electromagnetic radiation. The planar testing optical system 150 manipulates electromagnetic radiation. The planar testing system 146 may comprise the planar testing optical system 150. In some embodiments, the planar testing system 146 comprises one or more planar testing optical systems 150. The planar testing optical systems 150 are configured to manipulate electromagnetic radiation. The planar testing optical systems 150 manipulate electromagnetic radiation. The monitoring system 100 may comprise a plurality of planar testing optical systems 150. The emission system 106 may comprise the planar testing optical systems 150. In particular, the monitoring system 100 may comprise a planar testing optical systems 150 for each planar testing emitter 148. That is, one or more of the planar testing optical systems 150 may be associated with a respective planar testing emitter 148. In some embodiments, each planar testing optical system 150 is associated with a respective planar testing emitter 148.

[0497] A planar testing emitter 148 is configured to emit electromagnetic radiation at a respective planar testing optical system 150. That is, a planar testing emitter 148 emitselectromagnetic radiation at a respective planar testing optical system 150. One or more of the planar testing emitters 148 is configured to emit electromagnetic radiation at a respective planar testing optical system 150. That is, one or more of the planar testing system emitters 148 emit electromagnetic radiation at a respective planar testing optical system 150. The planar testing optical system 150 at which a particular planar testing emitter 148 emits electromagnetic radiation may be considered to be the planar testing optical system 150 that is associated with the particular planar testing emitter 148. In other words, one or more of the planar testing emitters 148 is configured to emit electromagnetic radiation at an associated planar testing optical system 150. A plurality of the planar testing emitters 148 may be configured to emit electromagnetic radiation at a respective planar testing optical system 150. In the illustrated embodiment, each planar testing emitter 148 is configured to emit electromagnetic radiation at an associated planar testing optical system 150. That is, each planar testing emitter 148 emits electromagnetic radiation at an associated planar testing optical system 150.

[0498] A planar testing optical system 150 is configured to direct electromagnetic radiation. That is, a planar testing optical system 150 directs incident electromagnetic radiation. One or more of the planar testing optical systems 150 is configured to direct electromagnetic radiation. That is, one or more of the planar testing optical systems 150 directs electromagnetic radiation.

[0499] A planar testing optical system 150 is configured to direct the electromagnetic radiation emitted at it by the associated planar testing emitter 148 towards a planar testing area. The planar testing area is an area of the monitoring system 100. The planar testing area is an area on a surface of the monitoring system 100. The planar testing area may be on a sensor module of the monitoring system 100. The planar testing optical system 150 may direct electromagnetic radiation emitted at it by the associated planar testing emitter 148 at the sensor module. It may emit it directly at the sensor module, so that the electromagnetic radiation encounters the sensor module without being further manipulated. Alternatively, the planar testing area may be an area of a lens system of the monitoring system 100 .That is, the planar testing optical system 150 may direct the electromagnetic radiation emitted at it by the associated planar testing emitter 148 at the lens system. The lens system may manipulate the electromagnetic radiation prior to it encountering the sensor module. While this function is described with reference to a planar testing optical system 150, it will be appreciated that the function of a plurality of the planar testing optical systems 150 may be the same.

[0500] In the illustrated embodiment, one or more of the planar testing optical systems 150 is configured to direct the electromagnetic radiation emitted at it by the associated planar testing emitter 148 towards a respective target portion of the window 142. That is, the planar testing target area may be on the window 142. One or more of the planar testing optical systems 150 directs the electromagnetic radiation emitted at it by the associated planar testing emitter 148 towards the respective target portion of the window 142. In some embodiments, each planar testing optical system 150 is configured to direct the electromagnetic radiation emitted at it bythe associated planar testing emitter 148 towards the respective target portion of the window 142. That is, each planar testing optical system 150 directs the electromagnetic radiation emitted at it by the associated planar testing emitter 148 towards the respective target portion of the window 142.

[0501] A planar testing optical system 150 comprises a planar testing refractor. One or more of the planar testing optical systems 150 comprise a planar testing refractor. A plurality of the planar testing optical systems 150 comprise a planar testing refractor. In the illustrated embodiment, each planar testing optical system 150 comprises a planar testing refractor. The planar testing refractor may be configured to refract incident electromagnetic radiation, thereby directing the incident electromagnetic radiation emitted from the associated planar testing emitter 148 towards the respective target portion of the window 142. That is, the planar testing refractor may redirect incident electromagnetic radiation by refracting the electromagnetic radiation, thereby changing the electromagnetic radiation’s direction of propagation. The planar testing refractor may be in the form of a prism. The planar testing refractor may be in the form of a lens. The planar testing refractor may be in the form of an optical fibre. One or more of the planar testing optical systems 150 may comprise a plurality of refractors (e.g., one or more prisms, one or more lenses and / or one or more optical fibres).

[0502] A planar testing optical system 150 may comprise a planar testing reflector. One or more of the planar testing optical systems 150 may comprise a planar testing reflector. A plurality of the planar testing optical systems 150 may comprise a planar testing reflector. For example, one or more of the targeting optical systems 110 may comprise one or more mirrors and / or an optical fibre that is configured to totally internally reflect incident electromagnetic radiation. The one or more mirrors may be configured to redirect incident electromagnetic radiation emitted from the associated planar testing emitter 148 towards the respective target portion of the window 142.

[0503] A planar testing optical system 150 may comprise a planar testing diffractor. One or more of the planar testing optical systems 150 may comprise a planar testing diffractor. A plurality of the planar testing optical systems 150 may comprise a planar testing diffractor. For example, one or more of the planar testing optical systems 150 may comprise one or more diffractor gratings. The one or more diffractors may be configured to diffract incident electromagnetic radiation emitted from the associated planar testing emitter 148.

[0504] In some embodiments, a planar testing emitter 148 and the associated planar testing optical system 150 (if present) may, together, be considered a planar testing emission unit. For example, a planar testing emitter 148 and the associated planar testing optical system 150 may be mounted to each other, with the combined unit being mounted to a body 154 of a planar testing emission module 152. One or more of the emission units may be in the form of a laser. One or more of the emission units may be in the form of a light emitting diode or another light emitting component. In some embodiments, one or more of the planar testing opticalsystems 150 may be considered to be the optical system of a laser. That is, the respective planar testing emitter 148 may comprise an excitation mechanism (e.g., a flashlamp) and a laser medium (e.g., a laser medium such as a crystal). The respective planar testing optical system 150 may comprise an optical resonator (e.g., a pair of opposed mirrors, one of which comprising a hole for the laser output).

[0505] A planar testing optical system 150 may comprise an optical splitter. One or more of the planar testing optical systems 150 may comprise an optical splitter. A plurality of the planar testing optical systems 150 may comprise an optical splitter. Each planar testing optical system 150 may comprise an optical splitter. A planar testing optical system 150 may comprise an optical filter. One or more of the planar testing optical systems 150 may comprise an optical filter. A plurality of the planar testing optical systems 150 may comprise an optical filter. Each planar testing optical system 150 may comprise an optical filter. A planar testing optical system 150 may comprise an optical switch. One or more of the planar testing optical systems 150 may comprise an optical switch. A plurality of the planar testing optical systems 150 may comprise an optical switch. Each planar testing optical system 150 may comprise an optical switch. A planar testing optical system 150 may comprise an optical transmitter. One or more of the planar testing optical systems 150 may comprise an optical transmitter. A plurality of the planar testing optical systems 150 may comprise an optical transmitter. Each planar testing optical system 150 may comprise an optical transmitter. A planar testing optical system 150 may comprise an optical disperser. One or more of the planar testing optical systems 150 may comprise an optical disperser. A plurality of the planar testing optical systems 150 may comprise an optical disperser. Each planar testing optical system 150 may comprise an optical disperser.

[0506] In some embodiments, rather than the planar testing optical systems 150 (if present) directing electromagnetic radiation emitted from a respective planar testing emitter 148 towards the target potion of the window 142, the planar testing emitters 148 are arranged to emit electromagnetic radiation directly at the respective target portions of the window 142. That is, in some embodiments, the monitoring system 100 does not include a planar testing optical system 150.Planar Testing Emission Module 152

[0507] Referring to Figures 8, the monitoring system 100 comprises a planar testing emission module 152. The monitoring system 100 comprises one or more planar testing emission modules 152. In particular, the planar testing system 146 comprises one or more planar testing emission modules 152. The illustrated planar testing system 146 comprises one planar testing emission module 152. The planar testing emission module 152 is in the form of a printed circuit board. It will be appreciated however that in some embodiments, the planar testing system 146 may comprise more than one planar testing emission module 152.

[0508] The planar testing emission module 152 comprises a planar testing body 154. The planar testing body 154 is in the form of a base of a printed circuit board. The planar testing emission module 152 comprises the planar testing emitters 148. The planar testing emitters 148 are mounted to the planar testing body 154. Where the planar testing system 146 comprises one or more planar testing optical systems 150, the planar testing optical systems 150 may also be mounted to the planar testing body 154. This may be directly, or via the planar testing emitters 148.

[0509] The planar testing emitters 148 are mounted to the planar testing body 154 to form an arrangement of planar testing emitters 148. The arrangement comprises a plurality of rows of planar testing emitters 148. The arrangement comprises a plurality of columns of planar testing emitters 148. In other words, the planar testing emitters 148 are arranged into a grid. It will be appreciated however, that in some embodiments, the arrangement does not comprise a plurality of rows or a plurality of columns. That is, the arrangement may take a form other than a grid.

[0510] As described herein, in some embodiments, the planar testing emitters 148 are connected with their respective planar testing optical systems 150 to form an emission unit. In some embodiments, the planar testing emitters 148 and their associated planar testing optical systems 150 are mounted to the planar testing body 154 to form an arrangement of planar testing emission units. Each planar testing emission unit may comprise one planar testing emitter 148 and its associated planar testing optical system 150. The arrangement may comprise a plurality of rows of planar testing emission units. The arrangement may comprise a plurality of columns of planar testing emission units. In other words, the planar testing emission units may be arranged into a grid. It will be appreciated however, that in some embodiments, the arrangement does not comprise a plurality of rows or a plurality of columns. That is, the arrangement may take a form other than a grid. In some embodiments, the planar testing emission units are irregularly disposed on the planar testing body 154.

[0511] The window 142 is configured to reflect at least some of the electromagnetic radiation emitted by the planar testing emitters 148. As described herein, each planar testing emitter 148 emits electromagnetic radiation. The electromagnetic radiation is directed towards a target portion of the window 142. Each planar testing emitter 148 is associated with a different target portion of the window 142. That is, the electromagnetic radiation emitted from a planar testing emitter 148 is directed towards a different target portion of the window 142 than the electromagnetic radiation emitted from the other planar testing emitters 148. The centre of each target portion of the window 142 may be equidistant to the centre of two or more other target portions of the window 142. The centres of the target portions of the window 142 form a two-dimensional arrangement on the window 142. The arrangement may be a regular arrangement. That is, the arrangement may be symmetric about an axis of symmetry. The arrangement may be symmetric about two axes of symmetry. The centres of the target portions of the window 142 form a two-dimensional array on the window 142. The target portions of thewindow 142 may be irregularly distributed across the window 142. The window 142 reflects at least some of the electromagnetic radiation emitted by the planar testing emitters 148. In particular, the window 142 reflects at least some of the electromagnetic radiation that is emitted by the planar testing emitters 148, and directed towards the inner surface of the window 142. Intensity Testing System 156

[0512] Referring to Figures 1 , 8, 39 and 40, the monitoring system 100 comprises an intensity testing system 156. The intensity testing system 156 is configured to enable an intensity of one or more of the environment mapping emitters 108 to be tested. In other words, the intensity testing system 156 is configured to enable an output power of one or more of the environment mapping emitters 108 to be tested. The intensity testing system 156 can be used to ensure that electromagnetic radiation is being emitted by the monitoring system 100. The intensity testing system 156 enables testing of the environment mapping emitters 108 (e.g. confirming they are working). The intensity testing system 156 also enables a physical characteristic of the window 142 to be tested. For example, if the window 142 is dirty, this would be reflected in the amount of electromagnetic radiation that is emitted by the environment mapping emitters 108 that transits the window 142, and so, would be reflected in the data collected during operation of the intensity testing system 156.

[0513] The intensity testing system 156 comprises an intensity testing optical system 158. The intensity testing optical system 158 is configured to manipulate electromagnetic radiation. The intensity testing optical system 158 manipulates electromagnetic radiation. The intensity testing optical system 158 introduces an optical delay. The optical delay is a delay between a time at which incident electromagnetic radiation encounters the intensity testing optical system 158 and a time that it is emitted from the intensity testing optical system 158. The intensity testing optical system 158 extends from an incident end portion 162 to an emitting end portion 164. The intensity testing system 156 comprises one or more intensity testing optical systems 156. In particular, the intensity testing system 156 comprises a plurality of intensity testing optical systems 158. The intensity testing optical systems 156 are configured to manipulate electromagnetic radiation. The intensity testing optical systems 156 manipulate electromagnetic radiation. The intensity testing system 156 comprises an intensity testing optical system 158 for each emission module 112. A number of these are hidden in Figure 40 for clarity. An intensity testing optical system 158 comprises an intensity testing optical fibre 160. The intensity testing optical fibre 160 introduces an optical delay. That is, there is a delay between when light encounters a first end of the intensity testing optical fibre 160 and when it is emitted from a second end thereof. One or more of the intensity testing optical systems 158 comprises a respective intensity testing optical fibre 160.

[0514] An intensity testing optical fibre 160 extends from an incident end portion 162 to an emitting end portion 164. Each intensity testing optical fibre 160 extends from an incident end portion 162 to an emitting end portion 164. It will be appreciated that there may be one or morecomponents attached to the incident end of the optical fibre. These components may be optically transparent. These components may assist in mounting the intensity testing optical fibre 160 to the respective emission module 112. Where this is the case, the incident end portion 162 of the relevant intensity testing optical fibre 160 will be understood to comprise the one or more components. It will be appreciated that there may be one or more components attached to the emitting end of the optical fibre. These components may be optically transparent. These components may assist in mounting the intensity testing optical fibre 160 to a mounting portion of the monitoring system 100. Where this is the case, the emitting end portion 164 of the relevant intensity testing optical fibre 160 will be understood to comprise the one or more components.

[0515] As described herein, the environment mapping emitters 108 are configured to emit electromagnetic radiation which is directed towards a respective target region of the environment. As the emitted electromagnetic region propagates towards the target region, a portion 143 of it passes through the window 142 (see Figure 40). Another portion is reflected 168 by the window 142. In particular, an internal surface 166 of the window 142 reflects 168 some of the electromagnetic radiation that is emitted by the environment mapping emitters 108. This reflection is shown schematically in Figures 39 and 40.

[0516] The intensity testing optical fibre 160 is configured to totally internally reflect, along its length, at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter 108 and reflected 168 off the window 142. That is, the intensity testing optical fibre 160 totally internally reflects, along its length, at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter 108 and reflected 168 off the internal surface 166 of the window 142 so that it is directed at the incident end portion 162 of that intensity testing optical fibre 160. The intensity testing optical fibre 160 is configured to totally internally reflect, along its length, at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter 108 and reflected 168 off the internal surface 166 of the window 142. The intensity testing optical fibre 160 is configured to emit the totally internally reflected electromagnetic radiation from its emitting end portion 164. That is, the intensity testing optical fibre 160 emits the totally internally reflected electromagnetic radiation from its emitting end portion 164. In particular, the intensity testing optical fibre 160 is configured to emit the totally internally reflected electromagnetic radiation from its emitting end portion 164 onto a third portion of a sensor module 170. That is, the intensity testing optical fibre 160 emits the totally internally reflected electromagnetic radiation from its emitting end portion 164 onto the third portion of the sensor module 170. The third portion 179 of the sensor module 170 is mutually exclusive from the first portion 176 and the second portion 178 of the sensor module 170.

[0517] An intensity testing optical system 158 redirects at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter 108 and reflected of a surface of the window 142. This surface is the internal surface 166 of the window 142.

[0518] Each intensity testing optical system 158 is associated with a respective emission module 112. In particular, at least part of each intensity testing optical system 158 extends through a hole in the body 114 of the respective emission module 112.

[0519] In some embodiments, the intensity testing optical fibre 160 of an intensity testing optical system 158 extends through a hole in the body 114 of the respective emission module 112. In some embodiments, an intensity testing optical system 158 comprises an incident end optical component. The incident end optical component is connected to the intensity testing optical fibre 160, and extends through the hole in the body 114 of the respective emission module 112. The incident end optical component may be considered to form the incident end portion 162 of a respective intensity testing optical system 158.

[0520] An incident end 163 of the intensity testing optical system 158 is generally orthogonal to the exterior surface 116 of the body 114 of the respective emission module 112. The incident end 163 may be an end of the intensity testing optical fibre 160. The incident end 163 may be an end of the incident end optical component. In the illustrated embodiment, the incident end 163 of the intensity testing optical system 158 is disposed centrally between lateral edges of the respective emission module 112. In other words, the incident end 163 of the intensity testing optical system 158 is disposed centrally between the environment mapping emitters 108 of a respective emission module 112. The incident end 163 of the intensity testing optical system 158 offset from the environment mapping emitters 108. That is, the incident end 163 of the intensity testing optical system 158 is not colinear with the environment mapping emitters 108. The incident end 163 of the intensity testing optical system 158 is laterally offset from the colinear environment mapping emitters 108. The incident end 163 of the intensity testing optical system 158 is closer to an outer edge of the emission module 112 than the environment mapping emitters 108 of that emission module 112. It will be appreciated that in some embodiments, a different configuration may be provided.

[0521] An intensity testing optical system 158 may comprise an intensity testing refractor. An intensity testing optical system 158 may comprise an intensity testing reflector. An intensity testing optical system 158 may comprise an intensity testing diffractor. An intensity testing optical system 158 may comprise an optical splitter. One or more of the intensity testing optical systems 156 may comprise an optical splitter. A plurality of the intensity testing optical systems 156 may comprise an optical splitter. Each intensity testing optical system 158 may comprise an optical splitter. An intensity testing optical system 158 may comprise an optical filter. One or more of the intensity testing optical systems 156 may comprise an optical filter. A plurality of the intensity testing optical systems 156 may comprise an optical filter. Each intensity testing optical system 158 may comprise an optical filter. An intensity testing optical system 158 may comprisean optical switch. One or more of intensity testing optical systems 156 may comprise an optical switch. A plurality of the intensity testing optical systems 156 may comprise an optical switch. Each intensity testing optical system 158 may comprise an optical switch. An intensity testing optical system 158 may comprise an optical transmitter. One or more of the intensity testing optical systems 156 may comprise an optical transmitter. A plurality of the intensity testing optical systems 156 may comprise an optical transmitter. Each intensity testing optical system 158 may comprise an optical transmitter. An intensity testing optical system 158 may comprise an optical disperser. One or more of the intensity testing optical systems 156 may comprise an optical disperser. A plurality of the intensity testing optical systems 156 may comprise an optical disperser. Each intensity testing optical system 158 may comprise an optical disperser.Sensing System 120

[0522] The monitoring system 100 comprises a sensing system 120. The sensing system 120 may comprise a camera system. The sensing system 120 may comprise a three-dimensional time-of-flight camera. The sensing system 120 may comprise a three-dimensional time-of-flight camera system. The sensing system 120 is configured to generate sensing system data. That is, the sensing system 120 generates sensing system data. The sensing system 120 generates sensing system data in response to detecting electromagnetic radiation that is incident to the sensing system 120. In particular, the sensing system 120 is configured to generate sensing system data based at least in part on electromagnetic radiation emitted by the environment mapping emitters 108 that is reflected by the target regions of the environment. The sensing system 120 generates sensing system data based at least in part on electromagnetic radiation emitted by the environment mapping emitters 108 that is reflected by the target regions of the environment. This reflected electromagnetic radiation is detected by the sensing system 120, which generates the sensing system data in response.

[0523] The sensing system 120 comprises a sensor module 170. The sensor module 170 comprises a three-dimensional time-of-flight sensor module. The sensor module 170 may be in the form of a three-dimensional time-of-flight sensor module. The sensing system 120 comprises a lens system 172. The lens system 172 defines an optical axis 174. The lens system 172 is configured to focus incident electromagnetic radiation on the sensor module 170. That is, the lens system 172 focuses incident electromagnetic radiation on the sensor module 170. The lens system 172 may comprise the optical filter 144. One or more of the emission modules 112 may be intersected by a plane that is orthogonal to the optical axis 174. In the illustrated embodiment, each emission module 112 is intersected by a common plane that is orthogonal to the optical axis.

[0524] The sensor module 170 is configured to generate sensing system data based at least in part on incident electromagnetic radiation. In the illustrated embodiment, the sensor module 170 generates sensing system data based at least in part on incident electromagnetic radiation. In particular, the sensor module 170 is configured to detect the incident electromagneticradiation and generate the sensing system data based at least in part on the detected incident electromagnetic radiation. That is, the sensor module 170 detects the incident electromagnetic radiation and generates the sensing system data in response to the detected incident electromagnetic radiation. The sensing system data may be time-series data. That is, the sensing system data may comprise a plurality of time-indexed data sets or data elements.

[0525] For the purposes of this description, the incident electromagnetic radiation may be considered to have been detected in cases where a change in the value of one or more operating parameters of the sensor module 170 changes in response to the incident electromagnetic radiation.

[0526] The sensor module 170 comprises a number of sensing units (not shown). Each sensing unit is responsive to the intensity of incident electromagnetic radiation. In particular, an intensity parameter is associated with each sensing unit. The intensity parameter may take an intensity value that is indicative of an intensity of electromagnetic radiation that is incident on the respective sensing unit.

[0527] The sensing system data may comprise a plurality of snapshots of the values of the intensity parameters of each sensing unit at a particular time. That is, the sensing system data may comprise a time-series of intensity data sets, each intensity data set comprising the value of the intensity parameter output by each sensing unit at the relevant time.

[0528] As described herein, the sensor module 170 is configured to generate the sensing system data based at least in part on electromagnetic radiation that is incident to the sensor module 170 at one or more times. That is, the sensor module 170 generates the sensing system data based at least in part on electromagnetic radiation that is incident to the sensor module 170 at one or more times. The incident electromagnetic radiation may comprise ambient electromagnetic radiation. This may, for example, be electromagnetic radiation emitted by the Sun, by one or more artificial light sources in or around the environment of the monitoring system 100 and / or electromagnetic radiation that is reflected by the environment and / or one or more objects in the environment, towards the sensor module 170.

[0529] As described herein, the environment mapping emitters 108 are configured to emit electromagnetic radiation which is directed towards target regions of the environment around the monitoring system 100. A portion of this electromagnetic radiation is reflected by the environment and / or objects within the environment. The sensing system 120 is configured to detect the electromagnetic radiation that is emitted by the environment mapping emitters 108 and reflected by the target region(s) at which the electromagnetic radiation emitted by the environment mapping emitters 108 is directed by the respective targeting optical systems 110. The sensing system 120 is configured to generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0530] In other words, the environment mapping emitters 108 emit electromagnetic radiation which is directed towards target regions of the environment around the monitoring system 100.The sensing system 120 detects the electromagnetic radiation that is emitted by the environment mapping emitters 108 and reflected by the target region(s) at which the electromagnetic radiation emitted by the environment mapping emitters 108 is directed by the respective targeting optical systems 110. The sensing system 120 generates the sensing system data based at least in part on the detected electromagnetic radiation.

[0531] The lens system 172 is positioned in front of the sensor module 170. An axis of the lens system 172 passes through the sensor module 170.

[0532] The lens system 172 is configured to focus incident electromagnetic radiation on the sensor module 170. That is, the lens system 172 is configured to focus electromagnetic radiation that encounters the lens system 172 during its propagation, on the sensor module 170. As such, the lens system 172 is configured to focus ambient electromagnetic radiation on the sensor module 170. The lens system 172 is configured to focus the electromagnetic radiation that is emitted by the environment mapping emitters 108 and reflected by the target region(s) at which the electromagnetic radiation emitted by the environment mapping emitters 108 is directed by the respective targeting optical systems 110. In other words, the lens system 172 is configured to focus a superposition of ambient electromagnetic radiation and electromagnetic radiation emitted by the environment mapping emitters 108 and reflected by the environment, on the sensor module 170.

[0533] The lens system 172 focuses incident electromagnetic radiation on the sensor module 170. That is, the lens system 172 focuses electromagnetic radiation that encounters the lens system 172 during its propagation, on the sensor module 170. As such, the lens system 172 focuses ambient electromagnetic radiation on the sensor module 170. The lens system 172 focuses the electromagnetic radiation that is emitted by the environment mapping emitters 108 and reflected by the target region(s) at which the electromagnetic radiation emitted by the environment mapping emitters 108 is directed by the respective targeting optical systems 110. In other words, the lens system 172 focuses a superposition of ambient electromagnetic radiation and electromagnetic radiation emitted by the environment mapping emitters 108 and reflected by the environment, on the sensor module 170.

[0534] Referring to Figure 21 , the lens system 172 is configured to focus incident electromagnetic radiation onto a first portion 176 of the sensor module 170 (see Figure 21). That is, the lens system 172 focuses incident electromagnetic radiation onto the first portion 176 of the sensor module 170. The first portion 176 of the sensor module 170 is a central portion of the sensor module 170. The first portion 176 of the sensor module 170 may form a Reuleaux triangle. The first portion 176 of the sensor module 170 may approximate a Reuleaux triangle. The first portion 176 of the sensor module 170 may resemble a Reuleaux triangle. It will be appreciated that there may be a spherical aberration from the lens system 172 that results in the first portion 176 deviating from the shape of a Reuleaux triangle.

[0535] The electromagnetic radiation that is emitted by the planar testing emitters 148 is directed onto the sensor module 170. In some embodiments, the electromagnetic radiation that is emitted by the planar testing emitters 148 is directed directly onto the sensor module 170. That is, in some embodiments, the electromagnetic radiation that is emitted by the planar testing emitters 148 bypasses the lens system 172. In some embodiments, the lens system 172 focuses electromagnetic radiation that is emitted by the planar testing emitters 148 onto the first portion 176 of the sensor module 170. The sensing system 120 detects the electromagnetic radiation that is emitted by the planar testing emitters 148. In particular, the sensing system 120 detects the electromagnetic radiation that is emitted by the planar testing emitters 148 and reflected by the window 142. It will be appreciated, however, that in some embodiments, the electromagnetic radiation may be emitted off another surface.

[0536] The sensing system 120 is also configured to detect the electromagnetic radiation emitted from the emitting end portions 130 of the depth test optical systems 126. The sensing system 120 also detects the electromagnetic radiation emitted from the emitting end portions 130 of the depth test optical systems 126. The emitting end portions 130 of the depth test optical systems 126 are secured in place such that they emit the electromagnetic radiation that is directed therethrough from the respective incident end portions 128 towards the sensing system 120. In particular, this electromagnetic radiation is directed towards the sensor module 170. The sensing system 120 is configured to generate the sensing system data based at least in part on this detected electromagnetic radiation. That is, the sensing system 120 generates the sensing system data based at least in part on this detected electromagnetic radiation. In other words, the sensing system 120 is configured to detect the electromagnetic radiation emitted by the depth testing emitters 124 and generate the sensing system data based at least in part on the detected electromagnetic radiation.

[0537] The emitting end portions 130 of the depth testing optical systems 126 are positioned such that they emit electromagnetic radiation that is totally internally reflected by the depth testing optical systems 126 onto a second portion 178 of the sensor module 170. In other words, the emitting end portions 130 of the depth testing optical systems 126 are positioned to face the second portion 178 of the sensor module 170. There is no overlap between the first portion 176 of the sensor module 170 and the second portion 178 of the sensor module 170. The second portion 178 of the sensor module 170 is triangular. The second portion 178 of the sensor module 170 is laterally offset from the first portion 176 of the sensor module 170. The second portion 178 of the sensor module 170 is vertically offset with respect to the first portion 176 of the sensor module 170.

[0538] The sensing system 120 is configured to detect the electromagnetic radiation that is emitted by the planar testing emitters 148 and reflected by the window 142. That is, the sensing system 120 detects the electromagnetic radiation that is emitted by the planar testing emitters 148. Specifically, this electromagnetic radiation is totally internally reflected along thedepth testing optical fibres 132 and emitted at the second portion 178 of the sensor module 170, where it is detected.

[0539] The sensing system 120 is configured to generate the sensing system data based at least in part on this detected electromagnetic radiation. That is, the sensing system 120 generates the sensing system data based at least in part on this detected electromagnetic radiation. In some embodiments, this electromagnetic radiation is emitted directly onto the sensor module 170 by the depth testing optical fibres 132. In some embodiments, this electromagnetic radiation is directed towards one or more lenses (e.g., part of the lens system 172), prior to encountering the sensor module 170. Therefore, in some embodiments, the lens system 172 is configured to focus the electromagnetic radiation that is emitted by the planar testing emitters 148 and reflected by the window 142 on to the first portion 176 of the sensor module 170.

[0540] The sensing system 120 is configured to detect ambient electromagnetic radiation. The sensing system 120 is configured to generate the sensing system data based at least in part on the detected ambient electromagnetic radiation. The lens system 172 is configured to focus incident ambient electromagnetic radiation onto the first portion 176 of the sensor module 170.

[0541] The sensing system 120 detects ambient electromagnetic radiation. The sensing system 120 generates the sensing system data based at least in part on the detected ambient electromagnetic radiation. The lens system 172 focuses incident ambient electromagnetic radiation onto the first portion 176 of the sensor module 170.

[0542] The emitting end portions 164 of the of the intensity testing optical systems 158 are positioned such that they emit electromagnetic radiation that is totally internally reflected by the intensity testing optical systems 158 towards the sensor module 170. In other words, each intensity testing optical system 158 is configured to emit at least part of the totally internally reflected electromagnetic radiation from its emitting end portion 164, towards the sensor module 170. Specifically, the intensity testing optical fibres 160 are positioned to emit electromagnetic radiation towards the sensor module 170. The intensity testing optical fibres 160 emit electromagnetic radiation at a third portion 179 of the sensor module 170. The third portion 179 of the sensor module 170 is triangular. The third portion 179 of the sensor module 170 is laterally offset from the first portion 176 of the sensor module 170. The third portion 179 of the sensor module 170 is vertically offset with respect to the first portion 176 of the sensor module 170. The third portion 179 of the sensor module 170 is on an opposite side of the first portion 176 of the sensor module 170 as the second portion 178 of the sensor module 170.Physical Structure of the Monitoring System 100

[0543] As described herein, the monitoring system 100 comprises a housing 102. The housing 102 comprises a number of housing walls 104, the housing walls 104 defining a volume enclosed by the housing 102. The housing walls 104 comprise the planar front wall 104A andthe angled walls 104B. The exterior surface 116 of the body 114 of one or more of the emission modules 112 is parallel with a respective angled wall 104B. At least part of each emission module 112 is external to the housing 102. In particular, the body 114 of each emission module 112 is external to the housing 102. Further, the environment mapping emitters 108 of the illustrated embodiment are external to the housing 102. It will be appreciated; however, that in some embodiments, at least part of one or more of the emission modules 112 is within the housing 102. For example, the body 114 of one or more of the emission modules 112 may be within the housing 102. Further, one or more of the environment mapping emitters 108 may be within the housing 102. In such an embodiment, the housing may comprise one or more holes with which the environment mapping emitters 108 are configured to be aligned, such that they can emit electromagnetic radiation beyond the housing 102. These holes may have windows through which the environment mapping emitters 108 emit electromagnetic radiation, a window may be transparent to the frequency of electromagnetic radiation emitted from the respective environment mapping emitter 108.

[0544] The housing comprises the holes 105. Each hole 105 is aligned with a respective planar testing emitter 148. The planar testing emitters 148 are configured such that the electromagnetic radiation emitted therefrom passes through a respective hole 105, thereby enabling it to propagate beyond the housing 104. In other words, a planar testing emitter 148 emits electromagnetic radiation through a respective hole 105, thereby enabling it to propagate beyond the housing 104. Again, one or more of these holes may be covered by a window. The window may be transparent to the frequency of electromagnetic radiation emitted from the respective planar testing emitter 148. The front wall 104A of the housing 102 comprises a lens system opening. The lens system 172 extends through the lens system opening, as shown in Figure 1 . It will be appreciated that in some embodiments, an outer surface of the lens system 172 may be aligned, at at least one point, with the front wall 104A of the housing 102. That is, the lens system 172 may be flush with the front wall 104A of the housing 102.

[0545] The housing 102 comprises a mounting portion 103 (see Figures 2 to 4). The mounting portion 103 is configured to enable the monitoring system 100 to be mounted to a structure. The structure may, for example, be in the form of a wall, a scaffold or a frame of a piece of machinery such as a robot. The structure may be part of a vehicle. The illustrated mounting portion 103 is in the form of an elongate projection. It will be appreciated, however, that the mounting portion 103 may take another form. For example, the housing 102 may include a plurality of mounting portions in the form of recesses and / or holes at which the housing 102 can be mounted to another structure with a nut and bolt connection system, or a screw-based connection system.

[0546] The monitoring system 100 comprises a sensor module body 109 (see Figure 9). The sensor module body 109 is housed within the housing 102. The sensor module 172 is mounted to the sensor module body 109. The sensor module body 109 may be in the form of a base of aprinted circuit board. The sensor module body 109 is a planar body. The sensor module body 109 has a thickness. The thickness may be constant across the sensor module body 109. One or more components of the monitoring system 100 are configured to connect to the sensor module body 109. That is, one or more components of the monitoring system 100 connect to the sensor module body 109. The sensor module body 109 may be configured to connect to the housing 102. That is, the sensor module body 109 may connect to the housing 102. When connected to the housing 102, relative movement between the sensor module body 109 and the housing 102 is inhibited. The sensor module body 109 may therefore anchor other components that are connected thereto, to the housing 102. In this way, movement of the housing 102 causes corresponding movement of the sensor module body 109, and therefore corresponding movement of the components of the monitoring system 100 that are rigidly connected to the sensor module body 109.

[0547] An emission module 112 is disposed radially outward with respect to the lens system 172. It will be understood that a first component being disposed radially outward with respect to a second component means that the first component is further away from an axial centreline of the monitoring system 100, in a direction that is orthogonal to that axial centreline, than the second component. The axial centreline of the monitoring system 100, in the illustrated embodiment, corresponds to the optical axis 174 of the lens system 172. That is, the axial centreline of the monitoring system 100 is colinear with the optical axis 174 of the lens system 172. One or more of the emission modules 112 are disposed radially outward with respect to the lens system 172. In the illustrated embodiment, each of emission modules 112 are disposed radially outward with respect to the lens system 172. That is, the emission modules 112 are disposed radially outwards from the optical axis 174. The first emission module 112A is disposed radially outwards from the optical axis 174. The second emission module 112B is disposed radially outwards from the optical axis 174.

[0548] The monitoring system 100 comprises an emission system connecting member 111. An emission system connecting member 111 may be referred to as a connecting member 111. The monitoring system 100 comprises a plurality of emission system connecting members 111 (see Figures 10 and 16). An emission system connecting member 111 extends between the sensor module body 109 and an emission module 112. One or more connecting member 111 extends between the sensor module body 109 and a respective emission module 112. In the illustrated embodiment, each emission system connecting member 111 extends between the sensor module body 109 and a respective emission module 112. The emission system connecting members 111 are connected, at a first end, to the sensor module body 109. The emission system connecting members 111 are connected, at a second end, to a respective emission module 112.

[0549] The emission system connecting members 111 may be flexible printed circuit boards that electronically connect the respective emission modules 112 to the sensor modulebody 109. The emission system connecting members 111 may be in the form of electrical wires and / or cables that electrically connect the respective emission modules 112 to the sensor module body 109. In the illustrated embodiment, the emission system connecting members 111 are rigid. The connecting members 111 are elongate members. An emission system connecting member 111 rigidly connects the respective emission module 112 and the sensor module body 109.

[0550] Each emission module 112 is connected to a respective connecting member 111 at one end of the connecting member 111. The other end of the connecting member 111 is connected to the sensor module body 109.

[0551] In some embodiments, one or more of the emission modules 112 is moveable with respect to one or more other parts of the monitoring system 100. For example, an emission module 112 may be movably connected to the sensor module body 109. The emission module 112 may be moved by an actuator. In this way, the target regions of the environment that may be imaged using the environment mapping emitters 108 of the emission module 112 can be changed with a change in position or orientation of the emission module 112.

[0552] The emission modules 112 face away from each other. The planes formed by the bodies 114 of the emission modules 112 are not parallel. That is, the planes formed by the bodies 114 of the emission modules 112 are transverse with respect to each other. The emission modules 112 face away from a common point. That is, a line extending away from a centre point of an emission module 112, in a direction that is orthogonal to the plane formed by the body 114 of that emission module 112, intersects corresponding lines for the other emission modules 112 at a common point. In other words, an outer edge of an emission module 112 is axially offset with respect to an inner edge of that emission module 112. That is, the outer edge of an emission module 112 is closer to the rear wall 104E of the monitoring system 100 than the inner edge of the emission module 112. It will be appreciated that the outer edge of the emission module 112 is radially outward with respect to the inner edge of the emission module 112. In the illustrated embodiment, this is the case for each of the emission modules 112.

[0553] The incident end portions 162 of the intensity testing optical systems 158 are disposed radially outwards from the environment mapping emitters 108, with respect to the optical axis 174. In other words, the incident end portions 162 of the intensity testing optical systems 158 are disposed radially outwards from the environment mapping emitters 108. The incident end portions 162 of the intensity testing optical systems 158 are disposed radially outwards from the inner edge of the respective emission module 112. The incident end portions 162 of the intensity testing optical systems 158 are disposed radially inwards with respect to the outer edge of the respective emission module 112.

[0554] The environment mapping emitters 108 and / or the targeting optical systems 110, if present, are configured such that electromagnetic radiation emitted by the environment mapping emitters 108 does not reflect off the window 142 and intersect the lens system 172.That is, the environment mapping emitters 108 are positioned such that their emitted electromagnetic radiation that reflects off the window 142 avoids the lens system 172. In some embodiments, the environment mapping emitters 108 are mounted to the respective emission module 112 body 114 at predetermined angles. Alternatively, the environment mapping emitters 108 are mounted to the respective emission module 112 body 114 such that they emit electromagnetic radiation within a predetermined range of angles. These angles are determined such that reflection at the lens system 172 is minimised or avoided.

[0555] Referring to Figure 39, the environment mapping emitters 108 are shown mounted to the body 114 of a particular emission module 112. The view of Figure 39 may reflect a top view of an emission module 112. The environment mapping emitters 108 are arranged such that electromagnetic radiation that they emit, that is reflected off the window 142, avoids intersecting the lens system. An environment mapping emitter 108 emits electromagnetic radiation within an emission angle range 141. One or more environment mapping emitter 108 emits electromagnetic radiation within an emission angle range 141. In the illustrated embodiment, each environment mapping emitter 108 emits electromagnetic radiation within an emission angle range 141. The emission angle range 141 of the uppermost environment mapping emitter 108 of Figure 39 is shown; however, it will be appreciated that each environment mapping emitter 108 emits electromagnetic radiation within such a range. The emission angle range 141 may be influenced by the corresponding targeting optical system 110. For example, an environment mapping emitter 108 may emit electromagnetic radiation, which is then manipulated by the associated targeting optical system 110, such that the electromagnetic radiation propagates within the emission angle range 141 . In this way, the targeting optical systems 110 may control the emission angle range 141. Each environment mapping emitter 108 may be associated with a corresponding emission angle range 141. That emission angle range 141 may be dictated by the properties of the associated targeting optical system 110.

[0556] An inner boundary 151 of the emission angle range 141 of an environment mapping emitter 108 exists. The inner boundary 151 of the emission angle range 141 of an environment mapping emitter 108 is the boundary of the electromagnetic radiation emission of that environment mapping emitter 108 that is closest to the optical axis 174 of the monitoring system 100. It will be appreciated that the inner boundary 151 of the emission angle range 141 of an environment mapping emitter 108 is the boundary of the electromagnetic radiation emission of that environment mapping emitter 108 that is closest to the axial axis of the monitoring system 100. The inner boundary 151 of the electromagnetic radiation emission of an environment mapping emitter 108 forms an inner emission angle 153 with a plane that is orthogonal to the optical axis 174. Such a plane may be referred to as a frontal plane. Each environment mapping emitter 108 may be associated with a corresponding frontal plane.

[0557] The inner emission angle 153 of an environment mapping emitter 108 is measured on a plane that is orthogonal to the frontal plane. This plane may be referred to as a radial plane.The radial plane is orthogonal to the frontal plane and parallel to the optical axis 174. Each environment mapping emitter 108 is associated with a radial plane. The optical axis 174 falls on each radial plane. The radial plane associated with an environment mapping emitter 108 bisects the electromagnetic radiation emitted by the environment mapping emitter 108.

[0558] An environment mapping emitter 108 is configured to emit electromagnetic radiation such that the inner emission angle 153 of that environment mapping emitter 108 is greater than an inner emission angle threshold 157. The inner emission angle threshold 157 is a threshold angle. The inner emission angle threshold 157 of an environment mapping emitter 108 is the angle between the frontal plane, and a lens intersection angle 157 of that environment mapping emitter 108. The lens intersection angle 157 is an angle, measured from the relevant frontal plane, along the relevant radial plane, at which electromagnetic radiation 191 emitted by the relevant environment mapping emitter 108 will encounter the lens system 172. The angle of the inner emission angle threshold 157 may be different between environment mapping emitters 108.

[0559] Therefore, the inner emission angle 153 of an environment mapping emitter 108 is greater than the inner emission angle threshold 157 of that environment mapping emitter 108. In the illustrated embodiment, the inner emission angle 153 of each of the environment mapping emitters 108 is greater than the inner emission angle threshold 157 of the relevant environment mapping emitter 108. The inner emission angle thresholds 157 of environment mapping emitters 108 that are radially closer to the optical axis 174 are less than the inner emission angle thresholds 157 of environment mapping emitters 108 that are radially further from the optical axis 174. The inner emission angle threshold 157 of an environment mapping emitter 108 is therefore related to the radial distance of that environment mapping emitter 108 from the optical axis 174. Therefore, the environment mapping emitters 108 are arranged such that the inner emission angle 153 of an environment mapping emitter 108 decreases as a function of increasing radial distance from the optical axis 174.

[0560] Therefore, the body 114 and the environment mapping emitters 108 are positioned such that some or all of the emitted electromagnetic radiation that is reflected from the internal surface 166 of the window is not directed at the lens system 172 and / or the sensor module 174. This advantageously reduces or eliminates the extent to which electromagnetic radiation that is reflected off the internal surface 166 of the window 142 will influence the sensing system data.

[0561] In other words, the environment mapping emitters 108 (and the associated targeting optical systems 110, if present) direct emitted electromagnetic radiation towards target regions of the environment. This electromagnetic radiation transits the window 142. In particular, it transits the window 142 at at least some positions on the window 142 where incoming electromagnetic radiation also transits the window 142 prior to encountering the sensing system 120. The environment mapping emitters 108 (and the associated targeting optical systems 110, if present) direct emitted electromagnetic radiation such that it does not reflect back into the lenssystem 172, off the window 142. This is achieved by controlling one or more of the emission angle range of an emission unit, and an orientation of the emission unit.Control System 180

[0562] The monitoring system 100 comprises a control system 180. Figure 17 is a block diagram showing the control system 180, according to some embodiments. The block diagram of Figure 17 represents a number of the features of the monitoring system 100. The control system 180 comprises at least one processor 182. The at least one processor 182 is configured to process data re...

Claims

CLAIMS1 . A monitoring system comprising: an emission system comprising: one or more environment mapping emitters; and one or more targeting optical systems; each environment mapping emitter being configured to emit electromagnetic radiation at a respective targeting optical system of the one or more targeting optical systems; each targeting optical system being configured to direct the electromagnetic radiation towards a respective target region of an environment of the monitoring system; and a sensing system that is configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

2. The monitoring system of claim 1 , wherein the environment mapping system comprises: a first emission module comprising: a first body; a first subset of the environment mapping emitters, each environment mapping emitter of the first subset of environment mapping emitters being mounted to the first body; a first subset of the targeting optical systems, one or more of the targeting optical systems of the first subset of targeting optical systems being: mounted to the first body; and configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the first subset of the environment mapping emitters.

3. The monitoring system of claim 2, wherein: an exterior surface of the first body defines a first plane; and each targeting optical system of the first subset of targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the first plane, thereby directing the electromagnetic radiation towards the respective target region.

4. The monitoring system of claim 2 or claim 3, wherein the environment mapping emitters of the first subset of environment mapping emitters are mounted to the first body such that they are coplanar.

5. The monitoring system of any one of claims 1 to 4, wherein the emission system comprises:a second emission module comprising: a second body; a second subset of the environment mapping emitters, each environment mapping emitter of the second subset of environment mapping emitters being mounted to the second body; and a second subset of the targeting optical systems, each targeting optical system of the second subset of targeting optical systems being: mounted to the second body; and configured to redirect the electromagnetic radiation emitted from a respective environment mapping emitter of the second subset of environment mapping emitters.

6. The monitoring system of claim 5, wherein: an exterior surface of the second body defines a second plane; and each targeting optical system of the second subset of targeting optical systems is configured to direct the electromagnetic radiation emitted from the respective environment mapping emitter in one or more directions that are transverse to the second plane, thereby directing the electromagnetic radiation towards the respective target region.

7. The monitoring system of claim 6, when dependent on claim 3, wherein the first plane is transverse to the second plane.

8. The monitoring system of any one of claims 5 to 7, wherein the second subset of environment mapping emitters are mounted to the second body such that they are coplanar.

9. The monitoring system of any one of claims 5 to 8, when dependent on claim 2, wherein the first emission module and the second emission module are radially offset from an axial axis of the monitoring system by the same amount.

10. The monitoring system of claim 1 , wherein the emission system comprises a plurality of emission modules, each emission module comprising: a body; a subset of the environment mapping emitters, each environment mapping emitter of a respective subset of environment mapping emitters being mounted to the body of the respective emission module; a subset of the targeting optical systems, each targeting optical system of a respective subset of targeting optical systems being: mounted to the body; andconfigured to redirect electromagnetic radiation emitted from an environment mapping emitter of the respective subset of environment mapping emitters, thereby directing the electromagnetic radiation towards the respective target region.

11. The monitoring system of claim 10, wherein the monitoring system comprises six emission modules.

12. The monitoring system of any one of claims 1 to 11 , wherein the one or more targeting optical systems are configured to manipulate electromagnetic radiation.

13. The monitoring system of any one of claims 1 to 12, wherein one or more of the targeting optical systems comprises one or more of: a refractor; a reflector; a diffractor; an optical splitter; an optical filter; an optical switch; an optical transmitter; and an optical disperser.

14. The monitoring system of any one of claims 1 to 13, wherein the target region at which electromagnetic radiation emitted by a particular environment mapping emitter is directed is the target region of that environment mapping emitter.

15. The monitoring system of claim 14, wherein the target region of at least one environment mapping emitter is different to the target region of another environment mapping emitter.

16. The monitoring system of claim 14 or claim 15, wherein the target region of at least one environment mapping emitter overlaps the target region of another environment mapping emitter.

17. The monitoring system of any one of claims 1 to 16, wherein: at least one of the environment mapping emitters emits electromagnetic radiation with a first emission profile; and at least one of the environment mapping emitters emits electromagnetic radiation with a second emission profile.

18. The monitoring system of claim 17, when dependent on claim 14, wherein the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the first emission profile is different to the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the second emission profile.

19. The monitoring system of claim 17 when dependent on claim 14, or claim 18, wherein the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the first emission profile overlaps the target region of at least one of the environment mapping emitters that emits electromagnetic radiation with the second emission profile.

20. The monitoring system of claim 17 when dependent on claim 14, claim 18 or claim 19, wherein the monitoring system comprises at least one pair of environment mapping emitters, the at least one pair of environment mapping emitters comprising: a first environment mapping emitter that is configured to emit electromagnetic radiation with the first emission profile; and a second environment mapping emitter that is configured to emit electromagnetic radiation with the second emission profile; wherein the target region of the first environment mapping emitter is the same as the target region of the second environment mapping emitter.

21. The monitoring system of any one of claims 1 to 16, wherein at least one of the environment mapping emitters is configured to: emit electromagnetic radiation with a first emission profile; and emit electromagnetic radiation with a second emission profile.

22. The monitoring system of any one of claims 1 to 21 , wherein the emission system comprises: a depth testing system comprising: one or more depth testing emitters; and one or more depth testing optical systems; each depth testing emitter being configured to emit electromagnetic radiation at an associated depth testing optical system of the one or more depth testing optical systems.

23. The monitoring system of claim 22, wherein one or more of the depth testing optical systems are configured to manipulate electromagnetic radiation.

24. The monitoring system of claim 22 or claim 23, wherein the depth testing optical systems are configured to introduce an optical delay.

25. The monitoring system of any one of claims 22 to 24, wherein a plurality of the depth testing optical systems extend from an incident end portion to an emitting end portion, the incident end portion and the emitting end portion being separated by a length of the respective depth testing optical system.

26. The monitoring system of claim 25, wherein the depth testing optical systems are configured to: direct at least some of the electromagnetic radiation that is emitted at the incident end portion of the respective depth testing optical system, by the respective depth testing emitter, along its length; and emit at least some of the electromagnetic radiation directed along the length of the respective depth testing optical system from the emitting end portion of the respective depth testing optical system.

27. The monitoring system of any one of claims 22 to 26, wherein each of the depth testing optical systems comprises one or more of: a depth testing refractor; a depth testing reflector; a depth testing diffractor; a depth testing optical splitter; a depth testing optical filter; a depth testing optical switch; a depth testing optical transmitter; and a depth testing optical disperser.

28. The monitoring system of claim 25, or claim 26 or 27 when dependent on claim 25, wherein at least one of the depth testing optical systems is configured to: totally internally reflect at least some of the electromagnetic radiation that is emitted at its incident end portion by the associated depth testing emitter, along its length; and emit at least some of the totally internally reflected electromagnetic radiation from its emitting end portion.

29. The monitoring system of claim 25, or any one of claims 26 to 28, when dependent on claim 25, wherein the length of at least one of the depth testing optical systems is different from the length of at least one other depth testing optical system.

30. The monitoring system of claim 25 or any one of claims 26 to 29 when dependent on claim 25, wherein the length of one or more of the depth testing optical systems is a multiple of the length of another of the depth testing optical systems.

31. The monitoring system of claim 25, or any one of claims 26 to 30 when dependent on claim 25, wherein: the length of one or more of the depth testing optical systems is about 2m; the length of one or more of the depth testing optical systems is about 4m; the length of one or more of the depth testing optical systems is about 6m; and the length of one or more of the depth testing optical systems is about 8m.

32. The monitoring system of any one of claims 22 to 31 , wherein: the depth testing system comprises a depth testing system body; and the depth testing emitters are mounted to the depth testing system body.

33. The monitoring system of claim 32, when dependent on claim 2, wherein the depth testing system body is oriented in a way that is transverse to the first body of the first emission module.

34. The monitoring system of claim 25, or any one of claims 26 to 33 when dependent on claim 25, wherein each depth testing optical system is configured to be connected to the associated depth testing emitter such that the incident end portion of the respective depth testing optical system faces the respective depth testing emitter.

35. The monitoring system of claim 32, or claim 33 or claim 34, when dependent on claim 32, wherein: a face of the depth testing system body defines a depth testing system body plane; and one or more of the depth testing optical systems extend away from the depth testing system body in a direction that is transverse to the depth testing system body plane.

36. The monitoring system of any one of claims 22 to 35, wherein one or more of the depth testing optical systems curve to encircle an internal region of the monitoring system.

37. The monitoring system of any one of claims 22 to 36, wherein a plurality of the depth testing optical systems comprise an optical fibre.

38. The monitoring system of claim 37, when dependent on claim 36, wherein the optical fibres curve to encircle the internal region of the monitoring system.

39. The monitoring system of claim 37 or claim 38, when dependent on claim 36, wherein one or more of the optical fibres encircles the internal region of the monitoring system a different number of times to another of the optical fibres.

40. The monitoring system of any one of claims 22 to 39, wherein the depth testing system comprises: four depth testing emitters; and four depth testing optical systems.

41. The monitoring system of any one of claims 1 to 40, wherein the emission system comprises a planar testing system comprising one or more planar testing emitters, each planar testing emitter being configured to emit electromagnetic radiation.

42. The monitoring system of claim 41 , wherein: the planar testing system comprises one or more planar testing optical systems; each planar testing emitter is configured to emit electromagnetic radiation at a respective planar testing optical system; and each planar testing optical system is configured to direct at least some of the electromagnetic radiation emitted at it from the respective planar testing emitter towards a respective planar testing target area.

43. The monitoring system of claim 42, wherein each of the planar testing optical systems comprises one or more of: a planar testing refractor; a planar testing reflector; a planar testing diffractor; a planar testing optical splitter; a planar testing optical filter; a planar testing optical switch; a planar testing optical transmitter; and a planar testing optical disperser.

44. The monitoring system of any one of claims 1 to 43, further comprising a window that is optically transparent to at least some electromagnetic radiation.

45. The monitoring system of claim 44, when dependent on claim 41 , wherein each planar testing emitter is configured to emit electromagnetic radiation that is directed at a respective target portion of the window.

46. The monitoring system of claim 45, when dependent on claim 42, wherein each planar testing target area is a respective target portion of the window.

47. The monitoring system of claim 46, wherein each planar testing optical system is configured to refract at least some of the electromagnetic radiation emitted from the respective planar testing emitter to direct the electromagnetic radiation towards the respective target portion of the window.

48. The monitoring system of claim 46 or claim 47, wherein a centre of each target portion of the window is equidistant from the centre of two or more other target portions of the window.

49. The monitoring system of any one of claims 46 to 48, wherein the centres of the target portions of the window form a two-dimensional array on the window.

50. The monitoring system of claim 46 or claim 47, wherein the target portions of the window are irregularly distributed across the window.

51. The monitoring system of any one of claims 44 to 50, wherein the window is configured to reflect at least some of the electromagnetic radiation emitted by the planar testing emitters.

52. The monitoring system of any one of claims 1 to 51 , further comprising an intensity testing system, the intensity testing system comprising a plurality of intensity testing optical systems, the intensity testing optical systems being configured to redirect at least some of the electromagnetic radiation that is emitted by one or more environment mapping emitter.

53. The monitoring system of claim 52, wherein each of the intensity testing optical systems comprises one or more of: an intensity testing refractor; an intensity testing reflector; an intensity testing diffractor; an intensity testing optical splitter; an intensity testing optical filter; an intensity testing optical switch; an intensity testing optical transmitter; andan intensity testing optical disperser.

54. The monitoring system of claim 52 or claim 53, wherein one or more of the intensity testing optical systems comprises an intensity testing optical fibre.

55. The monitoring system of any one of claims 52 to 54, wherein each intensity testing optical system: extends from an incident end portion to an emitting end portion; and is configured to: totally internally reflect, along its length, at least some of the electromagnetic radiation that is: emitted by one or more environment mapping emitter; and reflected off one or more of the planar testing target areas; and emit the totally internally reflected electromagnetic radiation from its emitting end portion.

56. The monitoring system of any one of claims 52 to 55, when dependent on claim 44, wherein the intensity testing optical systems are configured to: redirect at least some of the electromagnetic radiation that is: emitted by one or more environment mapping emitter; and reflected off a surface of the window.

57. The monitoring system of any one of claims 1 to 56, wherein the sensing system comprises: a lens system defining an optical axis; and a sensor module; wherein the lens system is configured to focus incident electromagnetic radiation on the sensor module; and the sensor module is configured to: detect the incident electromagnetic radiation; and generate the sensing system data based at least in part on the detected incident electromagnetic radiation.

58. The monitoring system of claim 57, wherein the sensing system is configured to: detect the electromagnetic radiation that is: emitted by the environment mapping emitters; andreflected by the target regions of the environment at which the electromagnetic radiation emitted by the environment mapping emitters is directed by the respective targeting optical systems; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

59. The monitoring system of claim 57 or claim 58, wherein the lens system is configured to focus the electromagnetic radiation that is: emitted by the environment mapping emitters; and reflected by the target regions of the environment at which the electromagnetic radiation is directed by the respective targeting optical systems; onto a first portion of the sensor module.

60. The monitoring system of any one of claims 57 to 59, when dependent on claim 22, wherein the sensing system is configured to: detect the electromagnetic radiation emitted by the depth testing emitters; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

61. The monitoring system of any one of claims 57 to 60, when dependent on claim 25, wherein the sensing system is configured to: detect the electromagnetic radiation emitted from the emitting end portions of the depth test optical systems; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

62. The monitoring system of any one of claims 57 to 61 , when dependent on claim 25, wherein the emitting end portions of the depth testing optical systems are positioned such that the depth testing optical systems emit electromagnetic radiation that has been totally internally reflected along the length of the respective depth testing optical system onto a second portion of the sensor module.

63. The monitoring system of claim 62, when dependent on claim 59, wherein there is no overlap between the first portion of the sensor module and the second portion of the sensor module.

64. The monitoring system of any one of claims 57 to 63, when dependent on claim 41 , wherein the sensing system is configured to:detect the electromagnetic radiation that is emitted by the planar testing emitters; and generate the sensing system data based at least in part on the detected electromagnetic radiation.

65. The monitoring system of any one of claims 57 to 64, wherein the lens system is configured to focus the electromagnetic radiation that is emitted by the planar testing emitters onto the sensor module.

66. The monitoring system of claim 65, when dependent on claim 59, wherein the lens system is configured to focus the electromagnetic radiation that is emitted by the planar testing emitters onto the first portion of the sensor module.

67. The monitoring system of any one of claims 57 to 66, when dependent on claim 44, wherein the sensing system is configured to: detect the electromagnetic radiation that is: emitted by the planar testing emitters; and reflected by the window.

68. The monitoring system of any one of claims 57 to 66, wherein the electromagnetic radiation that is emitted by the planar testing emitters is directed onto the sensor module.

69. The monitoring system of any one of claims 57 to 66, or claim 68 wherein the electromagnetic radiation that is emitted by the planar testing emitters is directed directly onto the sensor module.

70. The monitoring system of claims 68 or 69, wherein the electromagnetic radiation that is emitted by the planar testing emitters bypasses the lens system.

71. The monitoring system of any one of claims 41 to 51 , or claims 57 to 70, wherein: the planar testing system further comprises a planar testing body; and the planar testing emitters are mounted to the planar testing body.

72. The monitoring system of claim 42, any one of claims 43 to 51 when dependent on claim 42, or any one of claims 57 to 71 , when dependent on claim 42, wherein the planar testing optical systems are mounted to the planar testing body.

73. The monitoring system of claim 72, wherein the planar testing emitters and the planar testing optical systems are mounted to the planar testing body to form an arrangement of planartesting emission units, each planar testing emission unit comprising one of the planar testing emitters and an associated planar testing optical system.

74. The monitoring system of claim 73, wherein the arrangement comprises a plurality of rows of planar testing emission units and a plurality of columns of planar testing emission units.

75. The monitoring system of claim 73, wherein the planar testing emission units are irregularly disposed on the planar testing body.

76. The monitoring system of any one of claims 57 to 75, wherein the sensing system is configured to: detect ambient electromagnetic radiation; and generate the sensing system data based at least in part on the detected ambient electromagnetic radiation.

77. The monitoring system of any one of claims 57 to 76, when dependent on claim 2, wherein the first emission module is disposed radially outwards from the optical axis.

78. The monitoring system of any one of claims 57 to 77, when dependent on claim 5, wherein the second emission module is disposed radially outwards from the optical axis.

79. The monitoring system of any one of claims 57 to 78, when dependent on claim 10, wherein each emission module is disposed radially outwards from the optical axis.

80. The monitoring system of claim 79, wherein each emission module is intersected by a common plane that is orthogonal to the optical axis.

81. The monitoring system of any one of claims 57 to 80, when dependent on claim 55, wherein the incident end portions of the intensity testing optical systems are disposed radially outwards from the environment mapping emitters, with respect to the optical axis.

82. The monitoring system of any one of claims 57 to 81 , when dependent on claim 52, wherein each intensity testing optical system is configured to emit at least part of the totally internally reflected electromagnetic radiation from its emitting end portion, towards the sensor module.

83. The monitoring system of any one of claims 57 to 82, when dependent on claim 44, wherein each targeting optical system is configured to refract the electromagnetic radiation thatis emitted by the respective environment mapping emitter to direct the electromagnetic radiation such that a reflected portion of the electromagnetic radiation that is reflected off the window avoids intersecting the lens system.

84. The monitoring system of any one of claims 57 to 83, when dependent on claim 44, wherein: an inner emission angle of an emission angle range associated with at least one environment mapping emitter is greater than an inner emission angle threshold at which electromagnetic radiation emitted by the at least one environment mapping emitter will encounter the lens system; the inner emission angle and the inner emission angle threshold are angles measured with respect to a frontal plane that is orthogonal to the optical axis.

85. The monitoring system of any one of claims 1 to 84, wherein at least one of the environment mapping system, the depth testing system and the planar testing system comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 200nm and 3000nm.

86. The monitoring system of any one of claims 1 to 85, wherein at least one of the environment mapping system, the depth testing system and the planar testing system comprises a laser that is configured to emit electromagnetic radiation with a wavelength that is between 900nm and 1000nm.

87. The monitoring system of any one of claims 1 to 86, further comprising an optical filter that is transparent to some electromagnetic radiation and opaque to other electromagnetic radiation.

88. The monitoring system of claim 87, wherein the optical filter is a multi-band pass optical filter.

89. The monitoring system of claim 87 or claim 88, when dependent on claim 44, wherein the window comprises the optical filter.

90. The monitoring system of claim 87 or claim 89, wherein the lens system comprises the optical filter.

91. The monitoring system of any one of claims 1 to 90, further comprising a control system comprising: at least one processor; andmemory storing program instructions accessible by the at least one processor.

92. The monitoring system of claim 91 , wherein the program instructions are configured to cause the at least one processor to: energise at least one of the environment mapping emitters from a first emission commencement time to a first emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards a first obstruction within an environment of the monitoring system, between the first emission commencement time and the first emission end time, the first obstruction being: at least partially optically transparent; and between the monitoring system and a second obstruction; commence a detection operation of the sensing system at a first gate time; terminate the detection operation at a second gate time that is after the first gate time, the second gate time differing from the first gate time by a gate width; store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

93. The monitoring system of claim 92, wherein the first gate time differs from the first emission commencement time by a detection time offset.

94. The monitoring system of claim 93, wherein the detection time offset is: a positive offset; or a negative offset.

95. The monitoring system of claim 92, wherein the first gate time is the same as the first emission commencement time.

96. The monitoring system of any one of claims 92 to 95, wherein: the first gate time is associated with a first distance from the monitoring system; the second gate time is associated with a second distance from the monitoring system; the second distance being greater than the first distance; at least part of the first obstruction is spaced apart from the monitoring system by a distance that greater than the first distance and less than the second distance; and the gate width is proportional to the difference between the first distance and the second distance.

97. The monitoring system of any one of claims 92 to 96, wherein the electromagnetic radiation detected during the detection operation includes electromagnetic radiation that wasemitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the first obstruction.

98. The monitoring system of any one of claims 92 to 97, wherein the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation is stored in memory as a first time-of-flight data array.

99. The monitoring system of any one of claims 92 to 98, wherein: the program instructions are configured to cause the at least one processor to: iteratively commence and terminate a plurality of detection operations of the sensing system, each detection operation being: commenced at a respective commencement gate time; and terminated at a respective termination gate time; and store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the iteratively performed detection operations; the electromagnetic radiation detected during a plurality of the iteratively performed detection operations including electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

100. The monitoring system of claim 99, wherein the electromagnetic radiation detected during a second plurality of the iteratively performed detection operations includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.101 . The monitoring system of any one of claims 92 to 99, wherein the program instructions are configured to cause the at least one processor to: commence a second detection operation of the sensing system at a third gate time, the third gate time being: after the first gate time; and differing from the first gate time by a gate offset; terminate the second detection operation at a fourth gate time that is after the third gate time, the fourth gate time differing from the third gate time by a second gate width; store sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation.

102. The monitoring system of claim 101 , when dependent on claim 99, wherein: the gate offset is equal to or greater than a difference between the first gate time and the second gate time;the second detection operation is one of the plurality of iteratively performed detection operations; and the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the second obstruction, after passing through the first obstruction.

103. The monitoring system of claim 101 or claim 102, wherein the third gate time differs from the first emission commencement time by a second detection time offset, the second detection time offset being greater than the first detection time offset.

104. The monitoring system of any one of claims 101 to 103, wherein: the third gate time is associated with a third distance from the monitoring system; the fourth gate time is associated with a fourth distance from the monitoring system; the fourth distance being greater than the third distance; and at least part of the second obstruction is spaced apart from the monitoring system by a distance that is greater than the third distance and less than the fourth distance.

105. The monitoring system of any one of claims 101 to 104, wherein the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction, after passing through the first obstruction.

106. The monitoring system of any one of claims 92 to 105, wherein the program instructions are further configured to cause the at least one processor to energise at least one of the environment mapping emitters from a second emission commencement time to a second emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards the target region associated with the at least one environment mapping emitter, between the second emission commencement time and the second emission end time.

107. The monitoring system of claim 106, wherein: the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are the same environment mapping emitter(s) as those energised between the first emission commencement time and the first emission end time; or the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are different environment mappingemitter(s) to those energised between the first emission commencement time and the first emission end time.

108. The monitoring system of any one of claims 105 to 107, wherein: the program instructions are configured to cause the at least one processor to determine at least one subsequent environment mapping emitter to energise during a second emission, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation; and the at least one environment mapping emitter energised from the second emission commencement time to the second emission end time is the determined subsequent environment mapping emitter.

109. The monitoring system of any one of claims 100 to 108, wherein the program instructions are configured to cause the at least one processor to determine the second gate width, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

110. The monitoring system of any one of claims 100 to 109, wherein the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction without passing through the first obstruction.

111. The monitoring system of any one of claims 100 to 110, wherein the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation is stored in memory as a second time-of-flight data array.

112. The monitoring system of claim 105, or any one of claims 106 to 111 , wherein: the second emission commencement time is: after the first emission end time; and at or before the third gate time; the second emission end time is: after the first emission end time; and at or before the fourth gate time.

113. The monitoring system of claim 105, or any one of claims 106 to 112, wherein incident electromagnetic radiation detected during the second detection operation comprises electromagnetic radiation that was emitted by the at least one environment mapping emitter between the second emission commencement time and the second emission end time.

114. The monitoring system of any one of claims 92 to 113, wherein the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least in part on the sensing system data.

115. The monitoring system of claim 114, wherein the monitoring system output comprises monitoring system output data.

116. The monitoring system of any one of claims 92 to 115, wherein: the sensing system data generated in response to incident electromagnetic radiation detected during the detection operation is indicative of a characteristic of the first obstruction; and the sensing system data generated in response to incident electromagnetic radiation detected during the second detection operation is indicative of a characteristic of the second obstruction.

117. The monitoring system of claim 116, wherein the characteristic is associated with at least one of: a distance of the first obstruction from the monitoring system; a dimension of the first obstruction; an obstruction label for the first obstruction, the obstruction label identifying a type of the first obstruction; an opacity of the first obstruction; a reflectiveness of the first obstruction; a brightness of the first obstruction; a distance of the second obstruction from the monitoring system; a dimension of the second obstruction; an obstruction label for the second obstruction, the obstruction label identifying a type of the second obstruction; and an opacity of the second obstruction; a reflectiveness of the second obstruction; and a brightness of the second obstruction.

118. The monitoring system of claim 116 or claim 117, wherein: the first obstruction is within a first distance range, with respect to the monitoring system, that is associated with the first gate time and the second gate time.

119. The monitoring system of any one of claims 116 to 118, wherein:the second obstruction is within a second distance range, with respect to the monitoring system, that is associated with the third gate time and the fourth gate time.

120. The monitoring system of any one of claims 116 to 119, wherein an outer profile of the first obstruction wholly contains an outer profile of the second obstruction.

121. The monitoring system of any one of claims 114 to 120, wherein the monitoring system output comprises a three-dimensional model of at least part of the environment, the three- dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

122. The monitoring system of any one of claims 114 to 121 , wherein the monitoring system output comprises a time-of-flig ht data array.

123. The monitoring system of claim 108, or any one of claims 109 to 122 when dependent on claim 108, wherein the at least one subsequent environment mapping emitter emits electromagnetic radiation, between the second emission commencement time and the second emission end time, with a different emission profile to that emitted between the first emission commencement time and the first emission end time.

124. The monitoring system of claim 123, wherein the program instructions are configured to cause the at least one processor to determine the different emission profile, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

125. The monitoring system of claim 124, wherein a frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, is different to the frequency of the electromagnetic radiation emitted by the at least one environment mapping emitter, between the first emission commencement time and the first emission end time.

126. The monitoring system of claim 125, wherein the program instructions are configured to cause the at least one processor to determine the frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

127. The monitoring system of claim 114, or any one of claims 115 to 126 when dependent on claim 114, wherein the monitoring system output adjusts a value of at least one control parameter.

128. The monitoring system of claim 127, wherein the at least one control parameter comprises a control parameter of the monitoring system, and is associated with at least one of: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

129. The monitoring system of claim 114, or any one of claims 115 to 128 when dependent on claim 114, wherein the monitoring system output adjusts a value of one or more control parameters of another apparatus, the apparatus being within the environment of the monitoring system.

130. The monitoring system of claim 114, or any one of claims 115 to 129 when dependent on claim 114, wherein the monitoring system output shuts down another apparatus, the apparatus being within the environment of the monitoring system.131 . The monitoring system of claim 114, or any one of claims 115 to 130 when dependent on claim 114, wherein: the second object is an apparatus; and the at least one control parameter comprises a control parameter of the apparatus.

132. The monitoring system of claim 131 , wherein adjusting the value of the at least one control parameter shuts down the apparatus.

133. The monitoring system of any one of claims 92 to 132, wherein the program instructions are further configured to cause the at least one processor to: control the sensor system to perform an ambient state detection operation; andstore sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation; wherein the ambient state detection operation is conducted over a time period in which detected incident electromagnetic radiation is only ambient electromagnetic radiation.

134. The monitoring system of claim 133, wherein the program instructions are configured to cause the at least one processor to determine the monitoring system output based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation.

135. The monitoring system of claim 91 , wherein the program instructions are configured to cause the at least one processor to: energise at least one environment mapping emitter such that the environment mapping emitter emits electromagnetic radiation at and through a first obstruction in the environment of the monitoring system; store sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by the first obstruction; and store sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by a second obstruction that is behind the first obstruction.

136. The monitoring system of claim 135, wherein the program instructions are configured to cause the at least one processor to: perform a first detection operation, using the sensing system, over a first time window; and perform a second detection operation, using the sensing system, over a second time window; the second time window being after the first time window; wherein the sensing system data is generated based at least in part on: electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the first obstruction that is detected during the first time window; and electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction during the second time window.

137. The monitoring system of claim 135 or claim 136, wherein the program instructions are further configured to cause the at least one processor to generate a monitoring system output based at least in part on the sensing system data.

138. The monitoring system of claim 137, wherein the monitoring system output comprises at least one of: a characteristic of the first obstruction; a characteristic of the second obstruction; a time-of-flight data array; and a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

139. The monitoring system of claim 137 or claim 138, wherein the monitoring system output adjusts a value of at least one control parameter.

140. The monitoring system of claim 139, wherein the at least one control parameter comprises a control parameter of the monitoring system, and is associated with at least one of: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

141. The monitoring system of any one of claims 137 to 140, wherein the monitoring system output is configured to adjust a value of one or more control parameters of another apparatus, the apparatus being within the environment of the monitoring system.

142. The monitoring system of any one of claims 137 to 141 , wherein: the second object is an apparatus; and the at least one control parameter comprises a control parameter of the apparatus.

143. The monitoring system of any one of claims 92 to 142, wherein the environment mapping emitters are activated in accordance with an emission sequence that comprises sequentially activating a plurality of the environment mapping emitters.

144. The monitoring system of claim 91 , wherein the program instructions are configured to cause the at least one processor to: energise the emission system in accordance with an emission sequence, such that the emission system emits electromagnetic radiation into an environment near the emission system; detect, using the sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system; determine sensing system data based at least in part on the detected incident electromagnetic radiation; and generate monitoring system output data based at least in part on the sensing system data.

145. The monitoring system of any one of claims 91 to 144, when dependent on claims 57 and 25, wherein the program instructions are configured to cause the at least one processor to: energise at least one depth testing emitter from a depth emission commencement time to a depth testing emission end time, such that the at least one depth testing emitter emits electromagnetic radiation that is directed towards the associated depth testing optical system; detect, using the sensing system, electromagnetic radiation that is emitted from the emitting end portion of the at least one depth testing optical system; determine the sensing system data based at least in part on the detected electromagnetic radiation; compare the sensing system data to a depth testing profile; and in response to a value of at least one parameter of the sensing system data differing from a value of at least one corresponding parameter of the depth testing profile, adjust a value of at least one control parameter.

146. The monitoring system of claim 91 , when dependent on claims 57 and 25, or claim 145, wherein the program instructions are configured to cause the at least one processor to: energise each depth testing emitter from respective depth emission commencement times to respective depth testing emission end times; detect, using the sensing system, electromagnetic radiation that is emitted from the depth testing optical systems; and adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

147. The monitoring system of claim 146, wherein the program instructions are configured to cause the at least one processor to:determine sensing system data based at least in part on the detected electromagnetic radiation, the sensing system data comprising a time delay associated with each depth testing emitter; the time delay associated with a particular depth testing emitter indicating a time between the energisation of that depth testing emitter and the detection of electromagnetic radiation emitted from the depth testing optical system associated with that depth testing emitter.

148. The monitoring system of claim 147, wherein the program instructions are configured to cause the at least one processor to: compare the sensing system data to a depth testing profile, the depth testing profile comprising an expected time delay parameter for each depth testing emitter; and adjust the value of the at least one control parameter in response to at least one of the determined time delays differing from a value of a corresponding expected time delay parameter of the depth testing profile.

149. The monitoring system of any one of claims 145 to 148, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

150. The monitoring system of claim 149, wherein adjusting the value of the at least one control parameters causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.151 . The monitoring system of any one of claims 145 to 150, wherein the at least one control parameter comprises at least one control parameter of another apparatus.

152. The monitoring system of claim 151 , wherein adjusting the value of the at least one control parameters causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

153. The monitoring system of any one of claims 91 to 152, when dependent on claims 57 and claim 42, wherein the program instructions are configured to cause the at least one processor to: energise at least one planar testing emitter from a planar emission commencement time to a planar emission end time, such that the at least one planar testing system emitter emitselectromagnetic radiation that is directed towards the associated planar testing system optical system; detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one planar testing emitter between the planar emission commencement time and the planar emission end time; determine sensing system data based at least in part on the detected electromagnetic radiation; compare the sensing system data to a planar test criterion; and in response to a value of at least one parameter of the sensing system data differing from a value of the planar test criterion, adjust a value of at least one control parameter.

154. The monitoring system of claim 91 , when dependent on claims 57 and 42, wherein the program instructions are configured to cause the at least one processor to: energise each planar testing emitter from respective planar emission commencement times to respective planar emission end times; detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the planar testing emitters; and adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

155. The monitoring system of claim 153 or claim 154, when dependent on claim 44, wherein the detected electromagnetic radiation comprises electromagnetic radiation that is: emitted by at least one planar testing emitter; reflected by the window; and incident to the sensor module.

156. The monitoring system of claim 154 or claim 155 when dependent on claim 154, wherein the program instructions are configured to cause the at least one processor to: determine sensing system data based at least in part on the detected electromagnetic radiation; and adjust the value of the at least one control parameter in response to a value of at least one parameter of the sensing system data differing from a value of a planar test criterion.

157. The monitoring system of claim 153 or claim 156, wherein the planar test criterion comprises at least one of: a time delay criterion associated with a time delay between the planar emission commencement time and a time at which the electromagnetic radiation emitted by a respective planar testing emitter is detected at the sensor module; and a position criterion associated with a position on the sensor module at which the electromagnetic radiation emitted by a respective planar testing emitter is detected.

158. The monitoring system of any one of claims 153 to 157, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

159. The monitoring system of any one of claims 153 to 158, wherein adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

160. The monitoring system of any one of claims 153 to 159, wherein the at least one control parameter comprise at least one control parameter of another apparatus.

161. The monitoring system of claim 160, wherein adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

162. The monitoring system of any one of claims 91 to 161 , when dependent on claim 52, wherein the program instructions are configured to cause the at least one processor to: energise at least one of the environment mapping emitters from an intensity emission commencement time to an intensity emission end time; detect electromagnetic radiation that: is incident to the sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time and directed toward the sensor module by the at least one intensity testing optical system; and adjust a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

163. The monitoring system of any one of claims 91 to 161 , when dependent on claim 52 and claim 44, wherein the program instructions are configured to cause the at least one processor to: energise at least one of the environment mapping emitters from an intensity emission commencement time to an intensity emission end time, such that the at least environment mapping emitter emits electromagnetic radiation that is directed towards the window; detect electromagnetic radiation that: is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module; and comprises electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time, that has been reflected off the window and directed towards the sensor module by the at least one intensity testing optical system; determine sensing system data based at least in part on the detected electromagnetic radiation; and in response to a value of one or more parameter of the sensing system data differing from a value of at least one intensity metric, adjust a value of at least one control parameter.

164. The monitoring system of claim 163, wherein the at least one intensity testing optical system totally internally reflects at least some of the electromagnetic radiation that is: emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time; and reflected by the window; along a length of the at least one intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from the emitting end portion of the intensity testing reflector, towards the sensor module.

165. The monitoring system of any one of claims 163 or 164, wherein the at least one intensity metric is associated with an expected intensity of the electromagnetic radiation that is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module, the at least one intensity metric comprising an allowable intensity range.

166. The monitoring system of any one of claims 162 to 165, when dependent on claim 92, wherein the intensity emission commencement time is the first emission commencement time and the intensity emission end time is the intensity emission end time.

167. The monitoring system of any one of claims 162 to 166, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

168. The monitoring system of any one of claims 162 to 167, wherein adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

169. The monitoring system of any one of claims 162 to 168, wherein the at least one control parameter comprises at least one control parameter of another apparatus.

170. The monitoring system of claim 169, wherein adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.171 . A monitoring system comprising: an emission system comprising one or more environment mapping emitters, each environment mapping emitter being configured to emit electromagnetic radiation towards a respective target region of an environment of the monitoring system; and a sensing system that is configured to generate sensing system data based at least in part on the electromagnetic radiation emitted by the environment mapping emitters that is reflected by the target regions of the environment.

172. A monitoring system comprising: an environment mapping emitter configured to emit an emission at a respective target region of an environment of the monitoring system; and a sensing system that is configured to generate sensing system data based at least in part on a portion of the emission emitted by the environment mapping emitter that is reflected by the target region of the environment.

173. A method comprising: energising a mapping emission system in accordance with an emission sequence, such that the mapping emission system emits electromagnetic radiation into an environment near the mapping emission system;detecting, using a sensing system, incident electromagnetic radiation, the incident electromagnetic radiation including electromagnetic radiation: emitted by the mapping emission system as part of the emission sequence; reflected by the environment; and that is incident to a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic radiation; and generating monitoring system output data based at least in part on the sensing system data.

174. The method of claim 173, wherein the incident electromagnetic radiation includes electromagnetic radiation: emitted by the mapping emission system as part of the emission sequence; directed through a first environmental obstruction; reflected off a second environmental obstruction that is behind the first environmental obstruction; and is incident to the sensor module of the sensing system.

175. The method of claim 173 or claim 174, wherein: the mapping emission system comprises a plurality of environment mapping emitters; and energising the mapping emission system in accordance with the emission sequence comprises energising the environment mapping emitters in accordance with the emission sequence.

176. The method of claim 175, wherein energising the plurality of environment mapping emitters in accordance with the emission sequence comprises sequentially energising one or more subsets of the plurality of environment mapping emitters.

177. The method of any one of claims 173 to 176, wherein energising the environment mapping emitters in accordance with the emission sequence comprises sequentially energising one environment mapping emitter at a time.

178. The method of claim 177, wherein energising the plurality of environment mapping emitters in accordance with the emission sequence comprises de-energising all of the environment mapping emitters between sequential energisations of the one or more subsets of environment mapping emitters.

179. The method of any one of claims 173 to 178, wherein detecting incident electromagnetic radiation comprises: detecting incident electromagnetic radiation prior to energising the mapping emission system; detecting incident electromagnetic radiation while the mapping emission system is being energised in accordance with the emission sequence; and / or detecting incident electromagnetic radiation after the mapping emission system has been energised in accordance with the emission sequence.

180. The method of claim 179, when dependent on claim 178, wherein incident electromagnetic radiation is detected: during each sequential energisation of the one or more subsets of environment mapping emitters; and while all of the environment mapping emitters are de-energised between sequential energisations of the one or more subsets of environment mapping emitters.181 . The method of any one of claims 173 to 180, wherein determining the sensing system data comprises: determining energisation state data based at least in part on incident electromagnetic radiation emitted by the mapping emission system during energisation; determining ambient state data based at least in part on ambient incident electromagnetic radiation.

182. The method of claim 181 , wherein determining the sensing system data comprises comparing the energisation state data to the ambient state data.

183. The method of claim 181 or claim 182, wherein determining the sensing system data comprises processing the ambient state data and the energisation state data.

184. The method of any one of claims 176 to 178, or any one of claims 179 to 183 when dependent on claim 176, wherein: the sensing system data comprises time difference data; the time difference data comprises a plurality of time difference data elements; each time difference data element is indicative of a difference in time between a first time and a second time; the first time is associated with a start of one of the energisations of the energisation sequence; andthe second time is associated with a time at which an intensity of the detected incident electromagnetic radiation exceeds an intensity threshold.

185. The method of claim 184, wherein the sensing system data comprises a time difference data element for one or more sensing units of the sensing system, the sensing units being configured to be responsive to the intensity of the incident electromagnetic radiation.

186. The method of claim 184 or claim 185, wherein each time difference element is indicative of a distance the detected electromagnetic radiation emitted by the mapping emission system has travelled.

187. The method of any one of claims 173 to 186, wherein the monitoring system output data comprises a matrix that is indicative of a state of the environment.

188. The method of any one of claims 173 to 187, wherein the sensing system data is indicative of an intensity of the incident electromagnetic radiation.

189. The method of any one of claims 173 to 188, further comprising determining an operation scenario of the monitoring system, based at least in part on the sensing system data.

190. The method of claim 189, wherein in response to the operation scenario being determined to be a first operation scenario, generating the monitoring system output data comprises generating three-dimensional state data that is indicative of a state of at least part of the environment of the monitoring system.191 . The method of claim 189, wherein in response to the operation scenario being determined to be a second operation scenario, generating the monitoring system output data comprises generating an obstruction environment output that is indicative of the state of an obstruction within the environment.

192. The method of claim 189, wherein in response to the operation scenario being determined to be a third operation scenario, generating the monitoring system output data comprises generating an apparatus shutdown output that is configured to shut down an apparatus within the environment.

193. The method of claim 189, wherein in response to the operation scenario being determined to be a third operation scenario, generating the monitoring system output data comprisesgenerating a monitoring system shutdown output that is configured to shut down the mapping emission system.

194. The method of any one of claims 173 to 183, further comprising detecting, using the sensing system, incident electromagnetic radiation, within a plurality of time windows, each time window being associated with one or more emissions of the emission sequence.

195. The method of claim 194, wherein a start of one or more of the time windows is delayed after the associated emission of the emission sequence by a predetermined time delay.

196. The method of claim 194 or claim 195, wherein one or more of the time windows is associated with a respective distance range, the distance range being a range of distances within which electromagnetic radiation that was emitted by the mapping emission system was reflected by the environment, prior to detection.

197. A method of monitoring an environment using a monitoring system, the method comprising: energising at least one environment mapping emitter from a first emission commencement time to a first emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards a first obstruction within an environment of the monitoring system, between the first emission commencement time and the first emission end time, the first obstruction being: at least partially optically transparent; and between the monitoring system and a second obstruction; commencing a detection operation of a sensing system at a first gate time; terminating the detection operation at a second gate time that is after the first gate time, the second gate time differing from the first gate time by a gate width; storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

198. The method of claim 197, further comprising generating the sensing system data based at least in part on the incident electromagnetic radiation detected during the detection operation.

199. The method of claim 197 or claim 198, wherein the first gate time differs from the first emission commencement time by a detection time offset.

200. The method of claim 199, wherein the detection time offset is: a positive offset; ora negative offset.201 . The method of claim 198, wherein the first gate time is the same as the first emission commencement time.

202. The method of any one of claims 197 to 201 , wherein: the first gate time is associated with a first distance from the sensing system; the second gate time is associated with a second distance from the sensing system; the second distance being greater than the first distance; at least part of the first obstruction being spaced apart from the monitoring system by a distance greater than the first distance and less than the second distance; and the gate width is proportional to the difference between the first distance and the second distance.

203. The method of any one of claims 197 to 202, wherein the electromagnetic radiation detected during the detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the first obstruction.

204. The method of any one of claims 197 to 203, wherein the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation is stored in memory as a first time-of-flight data array.

205. The method of any one of claims 197 to 203, comprising: iteratively commencing and terminating a plurality of detection operations, each detection operation being: commenced at a respective commencement gate time; and terminated at a respective termination gate time; and storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the iteratively performed detection operations; the electromagnetic radiation detected during a plurality of the iteratively performed detection operations including electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

206. The method of claim 205, wherein the electromagnetic radiation detected during a second plurality of the iteratively performed detection operations includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the first obstruction.

207. The method of any one of claims 197 to 206, further comprising: commencing a second detection operation of the sensing system at a third gate time, the third gate time being: after the first gate time; and differing from the first gate time by a gate offset; terminating the second detection operation at a fourth gate time that is after the third gate time, the fourth gate time differing from the third gate time by a second gate width; storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation.

208. The method of claim 207, when dependent on claim 205, wherein: the gate offset is equal to or greater than a difference between the first gate time and the second gate time; the second detection operation is one of the plurality of iteratively performed detection operations; and the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter between the first emission commencement time and the first emission end time and reflected by the second obstruction, after passing through the first obstruction.

209. The method of claim 206 or claim 207, wherein the third gate time differs from the first emission commencement time by a second detection time offset, the second detection time offset being greater than the first detection time offset.

210. The method of any one of claims 206 to 209, wherein: the third gate time is associated with a third distance from the sensing system; the fourth gate time is associated with a fourth distance from the sensing system; the fourth distance being greater than the third distance; and at least part of the second obstruction is spaced apart from the monitoring system by a distance that is greater than the third distance and less than the fourth distance.

211. The method of any one of claims 206 to 210, wherein the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction, after passing through the first obstruction.

212. The method of any one of claims 197 to 211 , further comprising energising at least one of the environment mapping emitters from a second emission commencement time to a second emission end time, such that the at least one environment mapping emitter emits electromagnetic radiation that is directed towards the target region associated with the at least one environment mapping emitter, between the second emission commencement time and the second emission end time.

213. The method of claim 212, wherein the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are the same environment mapping emitter(s) as those energised between the first emission commencement time and the first emission end time.

214. The method of claim 212, wherein the environment mapping emitter(s) energised between the second emission commencement time and the second emission end time are different environment mapping emitter(s) to those energised between the first emission commencement time and the first emission end time.

215. The method of any one of claims 212 to 214, further comprising: determining at least one subsequent environment mapping emitter to activate during a second emission, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation; wherein the at least one environment mapping emitter energised from the second emission commencement time to the second emission end time is the determined subsequent environment mapping emitter.

216. The method of any one of claims 206 to 215, further comprising determining the second gate width, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

217. The method of any one of claims 206 to 216, wherein the electromagnetic radiation detected during the second detection operation includes electromagnetic radiation that was emitted by the at least one environment mapping emitter and reflected by the second obstruction without passing through the first obstruction, the second obstruction being within a second gate distance window that is associated with the third gate time and the fourth gate time.

218. The method of any one of claims 206 to 217, wherein the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the second detection operation is stored in memory as a second time-of-flight data array.

219. The method of claim 212, or any one of claims 213 to 218, wherein: the second emission commencement time is: after the first emission end time; and at or before the third gate time; the second emission end time is: after the first emission end time; and at or before the fourth gate time.

220. The method of claim 212, or any one of claims 213 to 219, wherein incident electromagnetic radiation detected during the second detection operation comprises electromagnetic radiation that was emitted between the second emission commencement time and the second emission end time.221 . The method of any one of claims 197 to 220, further comprising generate a monitoring system output based at least in part on the sensing system data.

222. The method of claim 221 , wherein the monitoring system output comprises monitoring system output data.

223. The method of claim any one of claims 197 to 222, wherein: the sensing system data generated in response to incident electromagnetic radiation detected during the detection operation is indicative of a characteristic of the first obstruction; and the sensing system data generated in response to incident electromagnetic radiation detected during the second detection operation is indicative of a characteristic of the second obstruction.

224. The method of claim 223, wherein the characteristic is associated with at least one of: a distance of the first obstruction from the sensing system; a dimension of the first obstruction; an obstruction label for the first obstruction, the obstruction label identifying a type of the first obstruction; an opacity of the first obstruction; a reflectiveness of the first obstruction;a brightness of the first obstruction; a distance of the second obstruction from the sensing system; a dimension of the second obstruction; an obstruction label for the second obstruction, the obstruction label identifying a type of the second obstruction; an opacity of the second obstruction; a reflectiveness of the second obstruction; and a brightness of the second obstruction.

225. The method of claim 223 or claim 224, wherein: the first obstruction is within a first distance range that is associated with the first gate time and the second gate time.

226. The method of any one of claims 223 to 225, wherein: the second obstruction is within a second distance range that is associated with the third gate time and the fourth gate time.

227. The method of any one of claims 223 to 226, wherein an outer profile of the first obstruction wholly contains an outer profile of the second obstruction.

228. The method of any one of claims 223 to 227, wherein the monitoring system output comprises a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

229. The method of any one of claims 223 to 228, wherein the monitoring system output comprises a time-of-flight data array.

230. The method of claim 215, or any one of claims 216 to 229 when dependent on claim 215, wherein the at least one subsequent environment mapping emitter emits electromagnetic radiation, between the second emission commencement time and the second emission end time, with a different emission profile to that emitted during between the first emission commencement time and the first emission end time.231 . The method of claim 230, further comprising determining the different emission profile, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

232. The method of claim 231 , wherein a frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, is different to the frequency of the electromagnetic radiation emitted by the at least one environment mapping emitter, between the first emission commencement time and the first emission end time.

233. The method of claim 232, further comprising determining the frequency of the electromagnetic radiation emitted by the at least one subsequent environment mapping emitter, between the second emission commencement time and the second emission end time, based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the detection operation.

234. The method of claim 221 , or any one of claims 222 to 233 when dependent on claim 221 , wherein the monitoring system output adjusts a value of at least one control parameter of a monitoring system comprising the sensing system.

235. The method of claim 234, wherein the at least one control parameter is associated with: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; and a particular environment mapping emitter that is to be energised for a future emission a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more environment mapping emitter is energised.

236. The method of claim 221 , or any one of claims 222 to 235 when dependent on claim 221 , wherein the monitoring system output adjusts a value of one or more control parameters of another apparatus, the apparatus being within the environment of the sensing system.

237. The method of claim 221 , or any one of claims 222 to 236 when dependent on claim 221 , wherein the monitoring system output shuts down another apparatus, the apparatus being within the environment of the sensing system.

238. The method of claim 221 , or any one of claims 222 to 237, wherein: the second object is an apparatus; andthe at least one control parameter comprises a control parameter of the apparatus.

239. The method of claim 238, wherein adjusting the value of the at least one control parameter shuts down the apparatus.

240. The method of any one of claims 197 to 238, further comprising: controlling the sensor system to perform an ambient state detection operation; and storing sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation; wherein the ambient state detection operation is conducted over a time period in which detected incident electromagnetic radiation is only ambient electromagnetic radiation.241 . The method of any one of claims 221 to 240, further comprising determining the monitoring system output based at least in part on the sensing system data generated by the sensing system in response to incident electromagnetic radiation detected during the ambient state detection operation.

242. A method comprising: energising at least one environment mapping emitter such that the environment mapping emitter emits electromagnetic radiation at and through a first obstruction in an environment; storing sensing system data generated by a sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by the first obstruction; and storing sensing system data generated by the sensing system in response to detecting the electromagnetic radiation that is emitted by the at least one environment mapping emitter and reflected by a second obstruction that is behind the first obstruction.

243. The method of claim 242, further comprising: performing a first detection operation, using the sensing system, over a first time window; and performing a second detection operation, using the sensing system, over a second time window; the second time window being after the first time window; generating sensing system data based at least in part on electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the first obstruction that is detected during the first time window; detecting electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction during the second time window; andgenerating sensing system data based at least in part on electromagnetic radiation emitted by the at least one environment mapping emitter and reflected by the second obstruction that is detected during the second time window.

244. The method of claim 242 or claim 243, further comprising generating a monitoring system output based at least in part on the sensing system data.

245. The method of claim 244, wherein the monitoring system output comprises at least one of: a characteristic of the first obstruction; a characteristic of the second obstruction; a time-of-flight data array; a three-dimensional model of the environment, the three-dimensional model comprising a virtual representation of the first obstruction and a virtual representation of the second obstruction.

246. The method of claim 244 or claim 245, wherein the monitoring system output adjusts a value of at least one control parameter.

247. The method of claim 246, wherein the at least one control parameter comprises a control parameter of the monitoring system, and is associated with: an emission frequency of at least one environment mapping emitter; an emission commencement time of a future emission; an emission end time of the future emission; a first gate time of a future detection operation of the sensing system; a second gate time of the future detection operation; a particular environment mapping emitter that is to be energised for a future emission; a polarization of electromagnetic radiation emitted by at least one environment mapping emitter; a number of detection operations per electromagnetic radiation emission; and a number of times one or more of the environment mapping emitters are energised.

248. The method of any one of claims 244 to 247, wherein the monitoring system output is configured to adjust a value of one or more control parameters of another apparatus, the apparatus being within the environment of the sensing system.

249. The method of claim 247 or claim 248, wherein: the second object is an apparatus; and the at least one control parameter comprises a control parameter of the apparatus.

250. The method of any one of claims 197 to 249, further comprising activating the environment mapping emitters in accordance with an emission sequence that comprises sequentially activating a plurality of the environment mapping emitters.251 . A method comprising: energising an emission system in accordance with an emission sequence, such that the emission system emits electromagnetic radiation into an environment near the emission system; detecting, using a sensing system, incident electromagnetic radiation, the incident electromagnetic radiation being electromagnetic radiation that is incident to a sensor module of the sensing system; determining sensing system data based at least in part on the detected incident electromagnetic radiation; and generating monitoring system output data based at least in part on the sensing system data.

252. A method of testing a monitoring system, the method comprising: energising a depth testing system of the monitoring system such that the depth testing system emits electromagnetic radiation from an end of at least one depth testing optical system towards a sensor module of a sensing system of the monitoring system; detecting, using the sensing system, the electromagnetic radiation emitted from the end of the at least one depth testing optical system; determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the end of the at least one depth testing optical system; comparing the sensing system data to a depth testing profile; and in response to a value of one or more parameter of the sensing system data differing from a value of one or more parameter of the depth testing profile, adjusting a value of at least one control parameter.

253. The method of claim 252, wherein: the sensing system data comprises a time difference parameter for each depth testing optical system; a value of each time difference parameter is indicative of a time difference between a first time and a second time; the first time corresponds to a time at which the depth testing system is energised; and the second time corresponds to a time at which the electromagnetic radiation emitted from the end of the respective depth testing optical system is detected by the sensing system.

254. The method of claim 253, wherein the value of one or more parameter of the sensing system data is the value of the time difference parameter(s).

255. The method of any one of claims 252 to 254, wherein the one or more parameter of the depth testing profile comprises an expected time delay value indicative of an expected time delay between energisation of the depth testing system and detection of the electromagnetic radiation emitted from the end of the at least one depth testing reflector by the sensing system.

256. The method of any one of claims 252 to 255, wherein the at least one depth testing optical system comprises a plurality of depth testing optical systems, each of a different length.

257. A method of testing a monitoring system, the method comprising: energising at least one depth testing emitter from a depth emission commencement time to a depth emission end time, such that the at least one depth testing emitter emits electromagnetic radiation that is directed towards an associated depth testing optical system; detecting, using a sensing system, electromagnetic radiation that is emitted from an emitting end portion of the depth testing optical systems; determining sensing system data based at least in part on the detected electromagnetic radiation; comparing the sensing system data to a depth testing profile; and in response to a value of at least one parameter of the sensing system data differing from a value of at least one corresponding parameter of the depth testing profile, adjusting a value of at least one control parameter.

258. A method of testing a monitoring system, the method comprising: energising each depth testing emitter of the monitoring system from respective depth emission commencement times to respective depth emission end times; detecting, using a sensing system, electromagnetic radiation that is emitted from depth testing optical systems of the monitoring system; and adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

259. The method of claim 258, further comprising determining sensing system data based at least in part on the detected electromagnetic radiation, the sensing system data comprising a time delay associated with each depth testing emitter;the time delay associated with a particular depth testing emitter indicating a time between the energisation of that depth testing emitter and the detection of electromagnetic radiation emitted from the depth testing optical system associated with that depth testing emitter.

260. The method of claim 259, further comprising comparing the sensing system data to a depth testing profile, the depth testing profile comprising an expected time delay parameter for each depth testing emitter; and adjusting the value of the at least one control parameter in response to at least one of the determined time delays differing from a value of a corresponding expected time delay parameter of the depth testing profile.261 . The method of any one of claims 252 to 260, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

262. The method of claim 261 , wherein adjusting the value of the at least one control parameters causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

263. The method of any one of claims 252 to 262, wherein the at least one control parameter comprises at least one control parameter of another apparatus.

264. The method of claim 263, wherein adjusting the value of the at least one control parameters causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

265. A method of testing a monitoring system, the method comprising: energising a planar testing system of the monitoring system in accordance with a planar testing emission sequence, such that the planar testing system emits electromagnetic radiation towards a surface of the monitoring system; detecting, using a sensing system of the monitoring system, incident electromagnetic radiation, the incident electromagnetic radiation: being electromagnetic radiation that is incident to a sensor module of the sensing system; andcomprising at least part of the electromagnetic radiation emitted by the planar testing system that is reflected by the surface; determining sensing system data based at least in part on the detected incident electromagnetic radiation; comparing the sensing system data to a planar test criterion; and in response to a value of one or more parameter of the sensing system data differing from a value of the planar test criterion, adjusting a value of one or more control parameters of the monitoring system.

266. The method of claim 265, wherein: the planar testing system comprises a plurality of planar testing emitters; and energising the planar testing system in accordance with the planar test emission sequence comprises energising one or more subsets of the planar testing emitters.

267. The method of claim 266, wherein energising the planar testing system in accordance with the planar test emission sequence comprises sequentially energising one subset of the planar testing emitters at a time.

268. The method of claim 266 or claim 267, wherein each subset of the planar testing emitters comprises more than one planar testing emitter.

269. The method of any one of claims 266 to 268, wherein the planar testing system comprises a first number of columns of planar testing emitters and a second number of rows of planar testing emitters.

270. The method of claim 269, when dependent on claim 267, wherein each subset of the plurality of planar testing emitters comprises one planar testing system emitter of each column and one planar testing system emitter of each row.271 . A method of testing a monitoring system, the method comprising: energising at least one planar testing emitter from a planar emission commencement time to a planar emission end time, such that the at least one planar testing system emitter emits electromagnetic radiation that is directed towards an associated planar testing system optical system; detecting electromagnetic radiation that: is incident to a sensor module; andcomprises at least part of the electromagnetic radiation emitted by the at least one planar testing emitter between the planar emission commencement time and the planar emission end time; determining sensing system data based at least in part on the detected electromagnetic radiation; comparing the sensing system data to a planar test criterion; and in response to a value of at least one parameter of the sensing system data differing from a value of the planar test criterion, adjusting a value of at least one control parameter.

272. A method of testing a monitoring system, the method comprising: energising a plurality of planar testing emitters from respective planar emission commencement times to respective planar emission end times; detecting electromagnetic radiation that: is incident to a sensor module; and comprises at least part of the electromagnetic radiation emitted by the planar testing emitters; and adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

273. The method of claim 271 or claim 272, wherein the detected electromagnetic radiation comprises electromagnetic radiation that is: emitted by at least one planar testing emitter; reflected by a window; and incident to the sensor module.

274. The method of claim 272 or claim 273, further comprising: determining sensing system data based at least in part on the detected electromagnetic radiation; and adjusting the value of the at least one control parameter in response to a value of at least one parameter of the sensing system data differing from a value of a planar test criterion.

275. The method of claim 271 or claim 274, wherein the planar test criterion comprises at least one of: a time delay criterion associated with a time delay between the first planar emission commencement time and a time at which the electromagnetic radiation emitted by a respective planar testing emitter is detected at the sensor module; and a position criterion associated with a position on the sensor module at which the electromagnetic radiation emitted by a respective planar testing emitter is detected.

276. The method of any one of claims 271 to 275, wherein the at least one control parameter comprise at least one control parameter of the monitoring system.

277. The method of any one of claims 271 to 276, wherein adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

278. The method of any one of claims 271 to 277, wherein the at least one control parameter comprise at least one control parameter of another apparatus.

279. The method of claim 278, wherein adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

280. A method of testing a monitoring system, the method comprising: energising a mapping emission system of the monitoring system such that the mapping emission system emits electromagnetic radiation towards a window of the monitoring system; totally internally reflecting at least some of the electromagnetic radiation that is: emitted by the mapping emission system; and reflected by the window; along a length of an intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from an emitting end portion of the intensity testing reflector, towards a sensor module of a sensing system of the monitoring system; detecting, using the sensing system, the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; determining sensing system data based at least in part on the detection, by the sensing system, of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system; comparing the sensing system data to an intensity metric; and in response to a value of one or more parameter of the sensing system data differing from a value of the intensity metric, adjusting a value of one or more control parameters of the monitoring system.281 . The method of claim 280, wherein the sensing system data comprises a value of an intensity parameter, the value of the intensity parameter being indicative of an intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing optical system.

282. The method of claim 280 or claim 281 , wherein a value of the intensity metric is indicative of a minimum operating intensity of the electromagnetic radiation emitted from the emitting end portion of the intensity testing reflector.

283. A method of testing a monitoring system, the method comprising: energising at least one environment mapping emitter from an intensity emission commencement time to an intensity emission end time; detecting electromagnetic radiation that: is incident to a sensor module; and comprises at least part of the electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time and directed toward the sensor module by at least one intensity testing optical system; and adjusting a value of at least one control parameter, based at least in part on the detected electromagnetic radiation.

284. A method of testing a monitoring system, the method comprising: energising at least one environment mapping emitter from an intensity emission commencement time to an intensity emission end time, such that the at least environment mapping emitter emits electromagnetic radiation that is directed towards a window; detecting electromagnetic radiation that: is emitted from an emitting end portion of one or more intensity testing optical system, onto a sensor module; and comprises electromagnetic radiation emitted by the at least one environment mapping emitter between the intensity emission commencement time and the intensity emission end time, that has been reflected off the window and directed towards the sensor module by the at least one intensity testing optical system; determining sensing system data based at least in part on the detected electromagnetic radiation; and in response to a value of one or more parameter of the sensing system data differing from a value of at least one intensity metric, adjusting a value of at least one control parameter.

285. The method of claim 284, further comprising totally internally reflecting, by the at least one intensity testing optical system, at least some of the electromagnetic radiation that is: emitted by the at least one environment mapping emitter between the first intensity emission commencement time and the first intensity emission end time; and reflected by the window; along a length of the at least one intensity testing optical system, such that at least some of the totally internally reflected electromagnetic radiation is emitted from the emitting end portion of the intensity testing reflector, towards the sensor module.

286. The method of any one of claims 284 or 285, wherein the at least one intensity metric comprises an intensity of the electromagnetic radiation that is emitted from the emitting end portion of one or more intensity testing optical system, onto the sensor module, the at least one intensity metric comprising an allowable intensity range.

287. The method of any one of claims 283 to 286, when dependent on claim 197, wherein the intensity emission commencement time is the first emission commencement time and the intensity emission end time is the intensity emission end time.

288. The method of any one of claims 283 to 287, wherein the at least one control parameter comprises at least one control parameter of the monitoring system.

289. The method of any one of claims 283 to 288, wherein adjusting the value of the at least one control parameter causes: the monitoring system to shut down; the monitoring system to emit an alarm; and / or the monitoring system to transmit an alarm signal to another computing device.

290. The method of any one of claims 283 to 289, wherein the at least one control parameter comprises at least one control parameter of another apparatus.291 . The method of claim 290, wherein adjusting the value of the at least one control parameter causes: the apparatus to shut down; the apparatus to emit an alarm; and / or the apparatus to transmit an alarm signal to another computing device.

292. A system comprising: a plurality of monitoring systems as defined in any one of claims 1 to 172;wherein the system is configured to generate a system output based on at least one of: the sensor system data generated by one or more of the monitoring systems; and the sensor system output of one or more of the monitoring systems.

293. The system of claim 292, wherein the system output is configured to change a value of one or more control parameter of an apparatus of the system, a visual obstruction being between the apparatus and at least one of the monitoring systems.

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