Sensor unit for measuring magnetic fields

Abstract

The invention relates to a sensor unit for measuring magnetic fields, comprising a magnetometer, wherein the magnetometer has a sensor medium arranged so as to be tilted on a carrier top side of a carrier and is set up to measure a magnetic field strength at a measuring location by reading out a spin resonance in the sensor medium, said spin resonance being dependent on the magnetic field strength, an excitation light source for irradiating light into the sensor medium of the magnetometer. The invention relates to a method for producing a sensor unit for measuring magnetic fields and to a pick-and-place machine.

Description

[0001] Description

[0002] title

[0003] Sensor unit for measuring magnetic fields

[0004] The invention relates to a sensor unit for measuring magnetic fields, a method for producing a sensor unit for measuring magnetic fields and an automatic assembly machine.

[0005] State of the art

[0006] Various sensor technologies are known for measuring very small magnetic field strengths. One of the most sensitive sensor types is SQU ID magnetometers (Superconducting Quantum Interference Devices). These are based on superconducting components and can resolve individual magnetic flux quanta or fields down to the range of a few picoteslas (pT). The disadvantage of SQU ID sensors, however, is the need to cool them below the superconducting transition temperature, which for most superconducting devices is below 63 Kelvin, i.e., below the temperature of liquid nitrogen. Furthermore, the measuring range of these sensors is limited and cannot operate in large interference fields, so measurements are only possible in specially magnetically shielded rooms.

[0007] Likewise, quantum-based magnetic sensors based on nitrogen vacancy centers are known, for example from DE 102018 220234 A1 or DE 10 2018214617 A1, which are based on the detection of spin resonances in magnetic fields.

[0008] Disclosure of the invention The object underlying the invention is to provide a concept which enables efficient production of a sensor unit for measuring magnetic fields.

[0009] This object is achieved by means of the respective subject matter of the independent claims. Advantageous embodiments of the invention are the subject matter of the respective dependent subclaims.

[0010] According to a first aspect, a sensor unit for measuring magnetic fields is provided, comprising a magnetometer, wherein the magnetometer has a sensor medium arranged tilted on a support top side of a support and is configured to detect a magnetic field strength at a measuring location by reading out a spin resonance in the sensor medium that is dependent on the magnetic field strength, an excitation light source for radiating light into the sensor medium of the magnetometer.

[0011] According to a second aspect, a method for manufacturing a sensor unit according to the first aspect is provided, comprising the following step:

[0012] Tilted arrangement of the sensor medium on the top side of the carrier.

[0013] According to a third aspect, a placement machine is provided, comprising a placement head which has an inclined holding surface for holding the sensor medium.

[0014] The invention is based on and includes the realization that it can be advantageous if the sensor medium is tilted relative to other components of the sensor unit. Instead of the sensor medium being arranged planar to the carrier and other components being tilted relative to it, the concept described here provides for the sensor medium to be tilted relative to the carrier, in particular relative to the top side of the carrier. This results in the technical advantage, for example, that only one component, the sensor medium, needs to be tilted, whereas other components, for example a Helmholtz coil arrangement, can be constructed planar to the carrier, in particular relative to the top side of the carrier, and therefore do not need to be tilted relative to the carrier, in particular relative to the top side of the carrier. As a result of the tilted placement orArranging the sensor medium in an otherwise exemplary planar system results in the technical advantage that the complexity is reduced to the extent that only one component, the sensor medium, has to be introduced outside of the usual standard processes and not many components.

[0015] Furthermore, precisely positioning multiple components at an angle requires a higher degree of manufacturing accuracy than positioning just one component. Thus, the required degree of manufacturing accuracy can be reduced accordingly.

[0016] This results in the technical advantage that a concept is provided which enables efficient production of a sensor unit.

[0017] In one embodiment of the sensor unit, it is provided that the magnetometer is a nitrogen vacancy center magnetometer, wherein the sensor medium comprises a diamond crystal with nitrogen vacancy centers or a section of a diamond crystal with nitrogen vacancy centers, wherein the sensor unit further comprises at least one microwave source for generating a resonant field in the sensor medium and at least one photodetector for detecting resonance-dependent fluorescent light from the sensor medium, wherein the diamond crystal is arranged on the carrier tilted relative to the carrier.

[0018] Nitrogen vacancy center magnetometers offer very high sensitivity, but are also easy to implement in a compact design, resulting in small sensor heads. Complex cooling, such as with SQU ID sensors, is not necessary. Furthermore, NV vacancy centers inherently allow for vector magnetic field measurements. This provides the technical advantage, for example, that a magnetic field can be efficiently measured by the sensor unit.

[0019] Furthermore, the sensor unit can comprise, for example, a microwave resonator tuned to the spin resonance of the sensor medium in the region of the sensor medium. A microwave resonator can generate a homogeneous microwave field at the relevant points of the sensor medium, while the microwave source can also be located remotely and fed into the microwave resonator via suitable connections.

[0020] Since diamond has a tetrahedral shape in its Krista II structure, it is advantageous to align the diamond relative to the magnetic field so that the projection (i.e. the 2D view of the 3D Krista II structure) shows different lengths of the tetrahedral connections between the central atom and the four adjoining atoms.

[0021] In one embodiment of the sensor unit, it is provided that the diamond crystal has a cuboid-shaped, in particular cubic, diamond, which has an upper side and a lower side opposite the upper side, wherein the lower side is opposite the carrier upper side of the carrier, wherein a tilt angle between a first normal of the upper side of the diamond and a second normal of the carrier upper side of the carrier is greater than 0° and less than or equal to 45°.

[0022] This provides the technical advantage, for example, that particularly suitable tilt angles can be provided. For example, the tilt angle is between 10° and 15°. For example, the tilt angle is 13.8°.

[0023] For example, edge lengths of the cuboid, especially cubic, diamond lie in the following closed intervals: 0.1 mm to 2 mm, preferably between 0.5 mm and 0.7 mm.

[0024] The diamond can be a diamond plate, for example. The fact that the sensor medium can comprise a diamond plate, for example, offers the technical advantage that a large volume is not required for fluorescence measurement. This allows the sensor unit to be designed even more compactly and cost-effectively.

[0025] In one embodiment of the sensor unit, it is provided that a wedge is arranged between the sensor medium and the carrier for tilting.

[0026] This provides the technical advantage, for example, that tilting can be achieved particularly efficiently.

[0027] In one embodiment of the sensor unit, it is provided that a connecting layer, in particular an adhesive layer, with an inhomogeneous thickness is arranged between the sensor medium and the carrier in order to connect the sensor medium to the carrier in a tilted manner.

[0028] This provides the technical advantage, for example, that the tilting can be achieved particularly efficiently and that the sensor medium can be efficiently connected to the carrier, so that a firm connection can be created between the sensor medium and the carrier.

[0029] In one embodiment of the sensor unit, it is provided that the sensor medium is arranged on an intermediate component, in particular a photodetector, which is arranged on the carrier.

[0030] This provides the technical advantage, for example, that the intermediate component allows the sensor medium to be arranged at different heights relative to the carrier.

[0031] For example, it is provided that the sensor medium is arranged at an angle on the intermediate component, with the intermediate component itself being arranged in a planar, i.e., not tilted, position on the carrier. Alternatively, it is provided, for example, that the intermediate component is also arranged at an angle on the carrier. For example, it is provided that the sensor medium is arranged in a planar, i.e., not tilted, position on the intermediate component, with the intermediate component itself being arranged at an angle on the carrier.

[0032] The manner in which the tilting between the sensor medium and the intermediate component and / or between the intermediate component and the carrier can be achieved is particularly analogous to the tilting between the sensor medium and the carrier without an intermediate component described above. The corresponding statements apply analogously.

[0033] In one embodiment of the sensor unit, it is provided that a wedge is arranged between the intermediate component and the carrier for tilting.

[0034] This provides the technical advantage, for example, that tilting can be achieved particularly efficiently.

[0035] In one embodiment of the sensor unit, it is provided that a connecting layer, in particular an adhesive layer, with an inhomogeneous thickness is arranged between the intermediate component and the carrier in order to connect the intermediate component to the carrier in a tilted manner.

[0036] This provides the technical advantage, for example, that the tilting can be achieved particularly efficiently and that the intermediate component can be efficiently connected to the beam, so that a firm connection can be created between the intermediate component and the beam.

[0037] In one embodiment of the sensor unit, the carrier is a printed circuit board.

[0038] This results in the technical advantage, for example, that electronic components can be arranged on the carrier and can be efficiently electrically contacted. For example, the magnetometer itself can be efficiently electrically contacted. For example, a device for generating a substantially homogeneous bias magnetic field in the region of the sensor medium, which will be described below, can be efficiently electrically contacted. In one embodiment of the sensor unit, it is provided that this comprises a device for generating a substantially homogeneous bias magnetic field in the region of the sensor medium, wherein the device for generating the bias magnetic field is arranged on the carrier in such a way that a magnetic field that can be generated by the device for generating a substantially homogeneous bias magnetic field runs substantially parallel or substantially perpendicular to the main extension plane of the carrier.

[0039] This provides the technical advantage, for example, of enabling vector magnetic field measurements. This is because the NV center in diamond has four possible arrangements, each of which is visible in the fluorescence spectrum as a separate frequency splitting. This allows the magnetic field direction and strength to be extracted for each crystal direction, thus allowing the source of the magnetic field to be localized.

[0040] For example, the device for generating a substantially homogeneous bias magnetic field comprises a Helmholtz coil arrangement, wherein at least the sensor medium of the magnetometer is arranged within the Helmholtz coil arrangement, wherein the Helmholtz coil arrangement is arranged on the carrier such that a magnetic field that can be generated by the Helmholtz coil arrangement runs substantially parallel or substantially perpendicular to the main extension plane of the carrier.

[0041] To generate such a bias magnetic field, a Helmholtz coil arrangement is used, in particular, within which at least the sensor medium or the sensor heads of the magnetometer are located. Helmholtz coils can generate a particularly homogeneous magnetic field.

[0042] In one embodiment of the method, the tilted placement is performed by a placement head of a placement machine having an inclined holding surface for holding the sensor medium. This provides, for example, the technical advantage that the sensor medium can be efficiently positioned at a tilt.

[0043] In one embodiment of the method, it is provided that the inclined holding surface has a stop against which the sensor medium rests during the tilted arrangement.

[0044] This provides the technical advantage, for example, that the sensor medium is held in position in the direction of the stop during tilted positioning. For example, the top side of the carrier forms an additional stop for the sensor medium during tilted positioning, so that the sensor medium is also held in position in the direction of the top side of the carrier.

[0045] In one embodiment of the placement machine, the inclined holding surface has a stop.

[0046] This provides the technical advantage, for example, that a component to be assembled is held in its position in the direction of the stop during tilted placement.

[0047] Tilting in the sense of the description can generally be brought about in particular in accordance with the above and / or following explanations, for example by a wedge and / or by a connecting layer, in particular an adhesive layer, with an inhomogeneous thickness.

[0048] Tilted towards the carrier means in particular tilted towards the top side of the carrier.

[0049] Tilted means, in particular, that a first normal of a top side of the sensor medium and a second normal of the top side of the carrier form an angle that is not equal to zero degrees, in particular greater than 0° and less than or equal to 45°. This angle can be referred to as the tilt angle. The sensor medium, in particular, has a top side. The sensor medium, in particular, has a bottom side opposite the top side. The bottom side of the sensor medium is, in particular, arranged opposite the top side of the carrier, in particular tilted opposite the tilt angle.

[0050] The sensor unit described here is based in particular on a quantum-based or optically pumped magnetometer, whereby a diamond NV magnetometer can be described below as an example of a magnetometer.

[0051] The magnetometers described here as examples use optically pumped and / or optically detected magnetic resonance (ODRM). This technology exploits the fact that the energy levels of certain spin states of unpaired electrons split under the influence of an external magnetic field, the so-called Zeeman effect. The splitting of the energy levels results in altered transitions during relaxation from excited states, which can then be measured, for example, by optical excitation and frequency-dependent detection of the resulting fluorescence radiation or by observing optical properties such as light absorption. The measured optical parameters can then be used to determine the magnetic field strength.

[0052] Diamond NV magnetometers are based on the readout of magnetic resonances from specific defect centers in diamond, in particular nitrogen vacancies (NV), which occur as impurities in the carbon lattice of diamond and can also be deliberately introduced. If the NV center is optically excited in the normal state without an existing magnetic field, for example by irradiating a pump laser beam with a suitable wavelength (in this case in the green wavelength range, e.g. at 532 nm for off-resonance excitation), the electrons are lifted from the triplet ground state to the excited triplet state and relax with the emission of fluorescent light in the red wavelength range at 637 nm. Since the probability for non-spin-conserving transitions from the spin state increases with the spin quantum number m s =±1 is larger, continuous excitation pumping ensures that the NV centers are mostly in the spin state m s =0 hyperpolarized.

[0053] Between the m s = 0 and m s =±1 spin states in the ground state, there is an energy difference, which in this case is about 2.87 GHz. Therefore, if microwave radiation is irradiated into the diamond in addition to the optical excitation, a dip in the red fluorescence occurs at this resonance frequency of 2.87 GHz, since the spin-polarized electrons are deflected by the microwave field from the m s = 0 in the m s =±1 ground state and from there by the pump light into the m s =±1 excited state. From there, however, mainly non-radiative transitions and weak infrared fluorescence transitions occur via the singlet state, while fluorescence in the red region disappears.

[0054] If an external magnetic field is present, the so-called Zeeman effect causes the splitting of the otherwise equally energetic m s=±1 triplet levels into energetically equidistant Zeeman levels. When the fluorescence is plotted against a frequency spectrum of the microwave excitation, two dips are observed in the fluorescence spectrum, the frequency spacing of which is linearly proportional to the magnetic field strength of the external magnetic field. The magnetic field sensitivity is primarily defined by the minimum resolvable frequency shift and can reach up to 1 pTA / Hz. Since the NV center in single-crystal diamond has four possible arrangements in the crystal lattice, the presence of a directed magnetic field causes the NV centers present in the crystal to react with varying degrees of intensity to the external magnetic field depending on their position within the crystal. Ideally, this can result in four pairs of fluorescence minima appearing in the spectrum, from whose shape and position relative to each other, both the magnetic field strength (magnitude) and the direction of the external magnetic field can be unambiguously determined.

[0055] The NV-center magnetometer offers a variety of advantages for this application. In addition to the aforementioned very high sensitivity, a wide measurement range (> 1 Tesla) can also be covered. The underlying Zeeman effect is linearly dependent on the existing magnetic field and, moreover, exhibits no degradation because the measurement is based on quantum mechanical states. Furthermore, an NV-center magnetometer offers the possibility of vectorially determining external magnetic fields based on the various orientations present in the diamond lattice.

[0056] Additionally or alternatively, the magnetic spin resonance in diamond can be read out electrically. This involves detecting charge carriers that have been lifted into the diamond's conduction band by two-photon ionization of the NV centers. If such a method is used to read out the resonance effects, the components for detecting the fluorescent light are not required in the above and / or following examples and are replaced, for example, by suitable photocurrent detectors on the diamond. Apart from that, the method can be adapted for magnetic field measurement and applied in all embodiments with NV center magnetometers.

[0057] Technical functionalities of the sensor unit according to the first aspect arise analogously from corresponding technical functionalities of the method according to the second aspect and / or the placement machine according to the third aspect, and vice versa. This means, in particular, that technical functionalities of the sensor unit arise from corresponding technical functionalities of the method and / or the placement machine, and vice versa.

[0058] The embodiments and forms of embodiment described here can be combined with each other in any way, even if this is not explicitly described.

[0059] The invention is explained in more detail below using preferred embodiments. These show:

[0060] Fig. 1 a sensor unit for measuring magnetic fields,

[0061] Fig. 2 is a flow chart of a method for manufacturing a sensor unit for measuring magnetic fields, Fig. 3 is a placement machine,

[0062] Fig. 4 shows a known method for producing a sensor unit,

[0063] Fig. 5 and 6 each show a view of a placement head of a placement machine and

[0064] Fig. 7 a diamond.

[0065] In the following, the same reference symbols may be used for the same features.

[0066] Fig. 1 shows a sensor unit 101 for measuring magnetic fields.

[0067] The sensor unit 101 comprises a carrier 103, which is, for example, a printed circuit board.

[0068] The sensor unit 101 further comprises a magnetometer 105. The magnetometer 105 comprises a sensor medium 107 having a top side 109 and a bottom side 111, which is opposite the top side 109 of the sensor medium 107.

[0069] The sensor medium 107 is arranged tilted on a carrier top side 113 of the carrier 103. The underside 111 of the sensor medium 107 is arranged opposite the carrier top side 113.

[0070] A first normal of the top side 109 of the sensor medium 107 is represented by a dashed line with the reference numeral 115. A second normal of the carrier top side 113 is represented by a second dashed line with the reference numeral 117. Both normals 115, 117 form an angle 119: the tilt angle. This means that the first normal 115 is tilted relative to the second normal 117. The sensor medium 107 is bonded to the carrier top side 113, i.e., to the carrier 103, by means of an adhesive layer 121 having an inhomogeneous thickness. The tilting is caused, in particular, by the varying thickness of the adhesive layer 121.

[0071] For example, it is provided that the sensor medium 107 is placed on the carrier top side 113 using a placement head having an inclined holding surface, as shown, for example, in Fig. 5 and Fig. 6, wherein adhesive is then introduced between the carrier top side 113 and the underside 111 of the sensor medium 107. Subsequently, for example, the sensor medium 107 is held in the tilted position until the adhesive is at least partially, in particular completely, cured. The cured adhesive thus forms the adhesive layer 121. Curing can be carried out, for example, using UV light.

[0072] An excitation light source 123 is arranged on the carrier top side 113 and can radiate light into the sensor medium 107.

[0073] Here, the sensor medium 107 is configured to detect a magnetic field strength at a measuring location by reading out a spin resonance in the sensor medium 107 that is dependent on the magnetic field strength.

[0074] For example, the magnetometer 105 is a nitrogen vacancy magnetometer.

[0075] The sensor unit 101 further comprises a Helmholtz coil arrangement 125 having a first coil 127 and a second coil 129. The sensor medium 107 is located between the two coils 127, 129. The coils 127, 129 are arranged such that they can generate a magnetic field that runs substantially parallel to the carrier top side 113 of the carrier 103.

[0076] Furthermore, a photodetector 129 is arranged on the carrier top side 113 of the carrier 103, which can detect resonance-dependent fluorescent light from the sensor medium 107. Furthermore, a microwave source 131 is arranged on the carrier top side 113, which can generate a resonant microwave field in the sensor medium 107.

[0077] Fig. 2 shows a flowchart of a method for manufacturing a sensor unit according to the first aspect. The method includes a tilted arrangement 201 of the sensor medium on the top side of the carrier.

[0078] Fig. 3 shows a placement machine 301. The placement machine 301 comprises a placement head 303, which has an inclined holding surface 305 for holding the sensor medium.

[0079] Fig. 4 shows a placement setup for placing a component in a planar manner on a carrier.

[0080] In detail, a carrier 401 is shown, which has a carrier top side 403. A component 405 is placed planarly on the carrier top side 403 in a known manner. The component 405 has a top side 411 and a bottom side 413. The component 405 is placed or arranged on the carrier top side 403 with the bottom side 413 of the component 405. A placement head 407 having a straight holding surface 409 is provided. The placement head 407 belongs to a placement machine (not shown in detail). Thus, with this design, the component 405 can be placed or arranged planarly on the carrier top side 503.

[0081] For example, the diamond plate 405 has been arranged on the top side 503 of the circuit board 501.

[0082] According to the concept described here, the sensor medium, for example, a diamond plate, is positioned tilted on the top of the carrier, and additional components, such as magnets, are also positioned or placed on the top of the carrier. This is illustrated by way of example in Figs. 5 and 6.

[0083] The component 405, which may be the sensor medium, is placed on the top side 403 of the carrier 401 by a placement head 501 having an inclined holding surface 503, as shown in Fig. 5. Adhesive 505 is provided, which is introduced between the bottom side 413 and the carrier top side 403 in order to bond the component 405 to the carrier 401 in a tilted manner.

[0084] Fig. 6 shows another placement head 601, which has a stop 603 on its inclined holding surface 503, against which the component 405 rests during curing and during placement. Furthermore, in the illustration shown in Fig. 6, the carrier top 403 forms a further stop for the component 405, so that a secure fixation of the component 405 in the tilted position can be achieved until the adhesive 505 has cured.

[0085] Further components, for example Helmholtz coils, can now be placed on the carrier top side 403 and, for example, generate a magnetic field which runs essentially parallel to the carrier top side 403 or perpendicular to it.

[0086] Fig. 7 shows a crystal structure of a diamond 701 that was artificially produced.

[0087] The artificially produced diamond 701 grew in layers during the process and thus obtained the Krista II structure shown in Fig. 7.

[0088] Reference numeral 703 indicates the carbon atoms. Reference numeral 705 indicates a nitrogen vacancy. Reference numeral 707 indicates a nitrogen atom.

[0089] Growth begins in the lower layer and individual layers are built up one after the other.

[0090] Fig. 7 shows an exemplary orientation of the nitrogen vacancy 705. In principle, however, the nitrogen vacancy 705 can assume all four directions within the crystal of the nitrogen atom 707. In order to separate the individual orientations as accurately as possible and thus also evaluate them, a projection of the four possible connecting lines onto a support surface of a support has a particularly different length, which can be the case, for example, with a tilt of 13.8° of the crystal structure relative to the support surface. However, depending on the structure, any other tilt angle can also be provided.

Claims

Claims 1. Sensor unit (101) for measuring magnetic fields, comprising a magnetometer (105), wherein the magnetometer (105) has a sensor medium (107) arranged at an angle on a carrier top (113) of a carrier (103) and is configured to detect a magnetic field strength at a measurement location by reading out a spin resonance in the sensor medium (107) that depends on the magnetic field strength, and an excitation light source (123) for shining light into the sensor medium (107) of the magnetometer (105).

2. Sensor unit (101) according to claim 1, wherein the magnetometer (105) is a nitrogen-vacancy center magnetometer, wherein the sensor medium (107) comprises a diamond crystal with nitrogen-vacancy centers or a section of a diamond crystal with nitrogen-vacancy centers, wherein the sensor unit (101) further comprises at least one microwave source (131) for generating a resonant field in the sensor medium (107) and at least one photodetector (129) for detecting resonance-dependent fluorescence light from the sensor medium (107), wherein the diamond crystal is arranged tilted relative to the support (103) on the support (103).

3. Sensor unit (101) according to claim 2, wherein the diamond crystal comprises a cuboid, in particular cubic, diamond which has a top surface (109) and a bottom surface (111) opposite the top surface (109), wherein the bottom surface (111) is opposite the carrier top surface (113) of the carrier (103), wherein a tilt angle exists between a first normal of the top surface of the diamond and a second normal of the The upper surface of the support (113) of the support (103) is greater than 0° and less than or equal to 45°.

4. Sensor unit (101) according to one of the preceding claims, wherein a wedge is arranged between the sensor medium (107) and the carrier (103) for tilting.

5. Sensor unit (101) according to one of the preceding claims, wherein a connecting layer, in particular an adhesive layer (121), with inhomogeneous thickness is arranged between the sensor medium (107) and the carrier (103) in order to connect the sensor medium (107) to the carrier (103) at an angle.

6. Sensor unit (101) according to one of claims 1 to 3, wherein the sensor medium (107) is arranged on an intermediate component, in particular a photodetector (129), which is arranged on the carrier (103).

7. Sensor unit (101) according to claim 6, wherein a wedge is arranged between the intermediate component and the support (103) for tilting.

8. Sensor unit (101) according to claim 6 or 7, wherein a connecting layer, in particular an adhesive layer (121), with inhomogeneous thickness is arranged between the intermediate component and the carrier (103) in order to connect the intermediate component to the carrier (103) at an angle.

9. Sensor unit (101) according to one of the preceding claims, wherein the carrier (103) is a printed circuit board.

10. Sensor unit (101) according to one of the preceding claims, comprising a device for generating a substantially homogeneous bias magnetic field in the region of the sensor medium (107), wherein the device for generating the bias magnetic field is arranged on the carrier (103) such that a magnetic field that can be generated by the device for generating a substantially homogeneous bias magnetic field runs substantially parallel or substantially perpendicular to the upper surface of the carrier (113).

11. Sensor unit (101) according to claim 10, wherein the device for generating a substantially homogeneous bias magnetic field comprises a Helmholtz coil arrangement (125), wherein at least the sensor medium (107) of the magnetometer (105) is arranged within the Helmholtz coil arrangement (125), wherein the Helmholtz coil arrangement (125) is arranged on the support (103) such that a magnetic field that can be generated by the Helmholtz coil arrangement (125) is substantially parallel or substantially perpendicular to the main extension plane of the support (103).

12. Method for manufacturing a sensor unit (101) according to any one of the preceding claims, comprising the following step: Tilted arrangement of the sensor medium (107) on the carrier top (113) of the carrier (103).

13. Method according to claim 12, wherein the tilted arrangement is carried out by a placement head (303) of a placement machine (301) having an inclined holding surface (305) for holding the sensor medium (107).

14. Method according to claim 13, wherein the inclined holding surface (305) has a stop against which the sensor medium (107) rests during the tilted arrangement.

15. Placement machine (301) comprising a placement head (303) which has an inclined holding surface (305) for holding the sensor medium (107).

16. Picking and packing machine (301) according to claim 15, wherein the inclined holding surface (305) has a stop (603).

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