Ion permeability control plate for plasma processing equipment
JP1742448SActive Publication Date: 2026-04-27TOKYO ELECTRON LTD
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Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Designs
- Current Assignee / Owner
- TOKYO ELECTRON LTD
- Filing Date
- 2022-09-29
- Publication Date
- 2026-04-27
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Abstract
This article is an ion transmission control plate for a plasma processing apparatus that controls the amount of plasma ions generated in the plasma generation chamber that are transmitted into the processing chamber where the semiconductor wafer is placed. By increasing the aperture area, this article can increase the amount of radicals that are transmitted into the processing chamber, and as a result, a suitable ashing rate can be obtained.
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