Solar battery module inspection device, solar battery module inspection method, and solar battery module manufacturing method

Abstract

To provide a solar battery module inspection device that can inspect at one time solar batteries on the front and rear of a tandem type solar battery module.SOLUTION: A solar battery module inspection device comprises: an inspection power supply that applies inspection voltage to an inspection light source irradiating a solar battery module with inspection light, or to a perovskite solar battery and a crystal silicon solar battery; an imaging apparatus that photographs an image of the solar battery module; and an image processing device that evaluates the perovskite solar battery and the crystal silicon solar battery on the basis of the image of the solar battery module. The image processing device has: an image extraction unit that extracts, from the image of the solar battery module, an image of a first wavelength region and an image of a second wavelength region; a first evaluation unit that evaluates the perovskite solar battery on the basis of the image of the first wavelength region; and a second evaluation unit that evaluates the crystal silicon solar battery on the basis of the image of the second wavelength region.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a solar cell module inspection device, a solar cell module inspection method, and a solar cell module manufacturing method. [Background technology]

[0002] Tandem solar cell modules are known in which two types of solar cells that absorb different wavelengths are arranged in an overlapping manner to improve the photoelectric conversion efficiency of the solar cell module. A typical example is a solar cell module that uses a perovskite solar cell as the solar cell on the front side and a crystalline silicon solar cell as the solar cell on the back side (see, for example, Patent Document 1).

[0003] Since the solar cells on the front and back sides may be damaged during modularization, it is desirable to inspect the quality of the solar cells on the front and back sides after modularization. Known methods for inspecting solar cells include a method that utilizes the phenomenon in which a solar cell emits light when a current is applied to the solar cell (EL: electroluminescence), and a method that utilizes the phenomenon in which a solar cell emits light due to recombination of excited photocarriers when light is irradiated onto the solar cell (PL: photoluminescence) (see, for example, Patent Document 2). [Prior art documents] [Patent documents]

[0004] [Patent Document 1] International Publication No. 2019 / 087918 [Patent Document 2] JP 2015-59781 A Summary of the Invention [Problem to be solved by the invention]

[0005] When performing EL inspection or PL inspection of a tandem solar cell module, a current is selectively applied to one of the solar cells on the front and back sides so that only one of the solar cells emits light, or light of a wavelength that only the one solar cell absorbs is irradiated, and an electroluminescence image or a photoluminescence image is taken, so that the solar cells on the front and back sides can be inspected separately. However, two imaging steps are required to inspect one solar cell module, which takes time. Therefore, the present invention aims to provide a solar cell module inspection device and a solar cell module inspection method that can inspect the solar cells on the front and back sides of a tandem solar cell module at the same time, and a solar cell module manufacturing method that can guarantee the performance of the solar cells on the front and back sides. [Means for solving the problem]

[0006] A solar cell module inspection apparatus according to one embodiment of the present invention is a solar cell module inspection apparatus for inspecting a solar cell module having perovskite solar cells and crystalline silicon solar cells that are arranged in a stack and each independently output power, and includes an inspection light source that irradiates inspection light to the solar cell module or an inspection power source that applies an inspection voltage to the perovskite solar cells and the crystalline silicon solar cells, an imaging device that takes an image of the solar cell module, and an image processing device that evaluates the perovskite solar cells and the crystalline silicon solar cells based on the image of the solar cell module, wherein the image processing device has an image extraction unit that extracts an image in a first wavelength range and an image in a second wavelength range from the image of the solar cell module, a first evaluation unit that evaluates the perovskite solar cells based on the image in the first wavelength range, and a second evaluation unit that evaluates the crystalline silicon solar cells based on the image in the second wavelength range.

[0007] In a solar cell module inspection apparatus according to one embodiment of the present invention, it is preferable that a lower limit of the first wavelength range is 200 nm or more and 400 nm or less, an upper limit of the first wavelength range is 500 nm or more and 700 nm or less, a lower limit of the second wavelength range is 800 nm or more and 1000 nm or less, and an upper limit of the second wavelength range is 1100 nm or more and 1300 nm or less.

[0008] A solar cell module inspection method according to one embodiment of the present invention is a solar cell module inspection method for inspecting a solar cell module having perovskite solar cells and crystalline silicon solar cells that are arranged in a stack and each independently output power, the method comprising the steps of irradiating the solar cell module with inspection light or applying an inspection voltage to the perovskite solar cells and the crystalline silicon solar cells, taking an image of the solar cell module, extracting an image in a first wavelength range and an image in a second wavelength range from the image of the solar cell module, evaluating the perovskite solar cells based on the image in the first wavelength range, and evaluating the crystalline silicon solar cells based on the image in the second wavelength range.

[0009] A solar cell module manufacturing method according to one embodiment of the present invention includes a step of obtaining a solar cell module by stacking and sealing perovskite solar cells and crystalline silicon solar cells, each of which independently outputs power, and a step of inspecting the solar cell module by the above-described solar cell module inspection method. Effect of the Invention

[0010] According to the present invention, it is possible to provide a solar cell module inspection device and a solar cell module inspection method capable of inspecting solar cells on the front and back of a tandem solar cell module at the same time, and a solar cell module manufacturing method capable of ensuring the performance of the solar cells on the front and back. [Brief description of the drawings]

[0011] [Figure 1]1 is a schematic diagram showing the configuration of a first embodiment of a solar cell module inspection device according to the present invention. [Diagram 2] 2 is a flowchart showing the procedure of an embodiment of a solar cell module manufacturing method according to the present invention that can be carried out using the solar cell module inspection apparatus of FIG. [Diagram 3] FIG. 4 is a schematic diagram showing the configuration of a second embodiment of a solar cell module inspection device according to the present invention. [Figure 4] 4 is a flowchart showing the procedure of an embodiment of a solar cell module manufacturing method according to the present invention that can be carried out using the solar cell module inspection apparatus of FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described with reference to the drawings. Fig. 1 is a schematic diagram showing the configuration of a solar cell module inspection device 1 according to a first embodiment of the present invention.

[0013] The solar cell module inspection device 1 inspects a solar cell module 100 having a perovskite solar cell 101 and a crystalline silicon solar cell 102 that are arranged in a stacked manner and output power independently. Specifically, the solar cell module 100 inspected by the solar cell module inspection device 1 may be configured to have one or more perovskite solar cells 101, one or more crystalline silicon solar cells 102 arranged on the back side of the perovskite solar cell 101, a surface protection member 103 that covers the front side of the perovskite solar cell 101, a back protection member 104 that covers the back side of the crystalline silicon solar cell 102, and a sealant 105 that fills the space around the perovskite solar cell 101 and the crystalline silicon solar cell 102 between the surface protection member 103 and the back protection member 104. The perovskite solar cell 101 may be a solar cell submodule in which a plurality of subcells having a first transparent electrode layer, a perovskite photoelectric conversion layer, and a second transparent electrode layer are formed on a substrate. The crystalline silicon solar cell 102 may be configured as a solar cell string in which a plurality of solar cells are mechanically and electrically connected by wiring material.

[0014] The solar cell module inspection device 1 includes an inspection light source 10 that irradiates inspection light onto the side (front surface) of the perovskite solar cell 101 of the solar cell module 100, an imaging device 20 that captures an image of the solar cell module 100, and an image processing device 30 that evaluates the performance of the perovskite solar cell 101 and the crystalline silicon solar cell 102 based on the image of the solar cell module 100.

[0015] The inspection light source 10 irradiates the entire surface of the solar cell module 100 with inspection light including a wavelength that is absorbed by the perovskite solar cell 101 to generate photocarriers (electrons and holes) and a wavelength that is transmitted through the perovskite solar cell 101 and absorbed by the crystalline silicon solar cell 102 to generate photocarriers. In other words, the inspection light source 10 causes photoluminescence in the perovskite solar cell 101 and the crystalline silicon solar cell 102. The inspection light irradiated by the inspection light source 10 may be, for example, a mixed light (light having two peaks) of near-infrared or red light and near-ultraviolet or blue light, or may be white light.

[0016] The imaging device 20 captures an image of the solar cell module 100 from the front side, and transmits the obtained image data to the image processing device 30. The imaging device 20 captures an image of light generated by the recombination of photocarriers in the perovskite solar cell 101 and the crystalline silicon solar cell 102, that is, a photoluminescence image. The first image is acquired as data expressing the color of each pixel by a color value consisting of a plurality of values ​​such as RGB, CMYK, HSV, HSL, Lab, etc. The imaging device 20 may be, for example, one having a two-dimensional imaging element such as a CMOS image sensor. Note that light other than photoluminescence such as the inspection light of the inspection light source 10 is noise that reduces the accuracy of judging the quality of the perovskite solar cell 101. For this reason, it is preferable that the imaging device 20 is placed in a position where the inspection light or its reflected light is not incident, or is controlled to capture the image after the inspection light source 10 is turned off.

[0017] The image processing device 30 judges the presence or absence of defects in the perovskite solar cell 101 and the crystalline silicon solar cell 102 based on the photoluminescence image of the solar cell module 100 captured by the imaging device 20. The image processing device 30 can be realized by, for example, one or more computer devices having a processor (CPU), memory, an input / output interface, etc., and executing appropriate processing programs. The image processing device 30 of this embodiment also serves as a control device that controls the inspection light source 10 and the imaging device 20, but the inspection light source 10 and the imaging device 20 may be controlled by another control device or may be operated manually by an operator.

[0018] The image processing device 30 includes an imaging control unit 31 that controls the inspection light source 10 and the imaging device 20, an image extraction unit 32 that extracts an image in a first wavelength range and an image in a second wavelength range from a photoluminescence image of the solar cell module 100, a first evaluation unit 33 that evaluates the perovskite solar cell 101 based on the image in the first wavelength range, and a second evaluation unit 34 that evaluates the crystalline silicon solar cell 102 based on the image in the second wavelength range.

[0019] The photography control unit 31 turns on the inspection light source 10 and causes the imaging device 20 to capture a photoluminescence image. The photography control unit 31 may control the inspection light source 10 and the imaging device 20 so that the first image and the second image can be captured in synchronization with a device that transports the solar cell module 100.

[0020] The image extraction unit 32 extracts an image of a first wavelength range in which the light emitted from the perovskite solar cell 101 is dominant, and an image of a second wavelength range in which the light emitted from the crystalline silicon solar cell 102 is dominant, from the photoluminescence image of the solar cell module 100 acquired from the imaging device 20. The first wavelength range and the second wavelength range are preferably set so as not to overlap, and more preferably set with an interval between them. Specifically, the lower limit of the first wavelength range is preferably 200 nm or more and 400 nm or less, the upper limit of the first wavelength range is preferably 500 nm or more and 700 nm or less, the lower limit of the second wavelength range is preferably 800 nm or more and 1000 nm or less, and the upper limit of the second wavelength range is preferably 1100 nm or more and 1300 nm or less. By setting such wavelength ranges, it is possible to increase the correlation between the color value of an image in the first wavelength range and the luminescence intensity of the perovskite solar cell 101, and the correlation between the color value of an image in the second wavelength range and the luminescence intensity of the crystalline silicon solar cell 102.

[0021] The first evaluation unit 33 judges whether or not the perovskite solar cell 101 has a defect based on the image in the first wavelength range. That is, it can be judged that a pixel with low brightness indicated by a color value (for example, Lab brightness, or only a specific value therein) in the image in the first wavelength range has low luminance intensity at the corresponding part of the perovskite solar cell 101 and may have some defect. The first evaluation unit 33 may specify a pixel with low brightness after performing a masking process to exclude from the judgment target an area where a light shielding object such as a metal electrode and wiring exists on the surface side of the perovskite solar cell 101, and an area where the perovskite solar cell 101 does not exist. In addition, the first evaluation unit 33 may judge whether or not the brightness of each pixel is sufficient by comparing with a standard image in the first wavelength range extracted from a photoluminescence image of a normal solar cell module 100. In order to suppress erroneous judgment due to noise, the first evaluation unit 33 may judge a pixel area where not only the brightness of each pixel but also the number and density of pixels with low brightness are above a standard, as a defective area. The perovskite solar cells 101 may also be classified into three or more quality grades depending on the degree of defects, for example, deviation of color values ​​or derived values, difference values, number of non-standard pixels, density, etc.

[0022] The second evaluation unit 34 determines the presence or absence of defects in the crystalline silicon solar cell 102 based on the image in the second wavelength range. The evaluation method for the crystalline silicon solar cell 102 in the second evaluation unit 34 may be the same as the evaluation method for the perovskite solar cell 101 in the first evaluation unit 33.

[0023] Fig. 2 is a flow chart showing the steps of a solar cell module manufacturing method capable of manufacturing the solar cell module 100. The solar cell module manufacturing method of Fig. 2 can be carried out using a solar cell module inspection apparatus 1. The solar cell module manufacturing method of Fig. 2 is one embodiment of the solar cell module manufacturing method according to the present invention.

[0024] The solar cell module manufacturing method of this embodiment includes a perovskite solar cell forming step (step S01), a crystalline silicon solar cell forming step (step S02), a solar cell module forming step (step S03), an inspection light irradiation step (step S04), a photographing step (step S05), an image extraction step (step S06), a perovskite solar cell evaluation step (step S07), a crystalline silicon solar cell evaluation step (step S08), and a sorting step (step S09). Steps S04 to S08 are a procedure of one embodiment of the solar cell module inspection method according to the present invention.

[0025] In the perovskite solar cell formation step of step S01, a perovskite solar cell 101 is formed. The perovskite solar cell 101 can be formed by a well-known method, for example, a method including a step of applying a material that forms a perovskite photoelectric conversion layer.

[0026] In step S02, the crystalline silicon solar cell formation process, a crystalline silicon solar cell 102 is formed. The crystalline silicon solar cell 102 can be formed by a well-known method, such as a method including a process of forming a semiconductor layer on a crystalline silicon substrate. The order of this crystalline silicon solar cell formation process and the perovskite solar cell formation process is not limited to the order described above, and they may be performed in reverse order or in parallel.

[0027] In step S03, the solar cell module formation process, the perovskite solar cells 101 and the crystalline silicon solar cells 102 are sealed between the front surface protective member 103 and the back surface protective member 104 by a sealing material 105 to obtain the solar cell module 100. The sealing of the perovskite solar cells 101 and the crystalline silicon solar cells 102 can be performed by a well-known method such as vacuum heat pressing.

[0028] In the inspection light irradiation step of step S04, the inspection light source 10 irradiates the solar cell module 100 with inspection light from the perovskite solar cell 101 side.

[0029] In the photographing step of step S05, the solar cell module 100 is photographed by the imaging device 20 to obtain a photoluminescence image including light due to photoluminescence of the perovskite solar cell 101 and light due to photoluminescence of the crystalline silicon solar cell 102.

[0030] In the image extraction process of step S06, an image in the first wavelength range and an image in the second wavelength range are extracted from the photoluminescence image of the solar cell module 100. Such image extraction can be performed by a well-known image processing technique, and may be performed using commercially available image processing software executed by a general-purpose personal computer.

[0031] In the perovskite solar cell evaluation step of step S07, the first evaluation unit 33 judges the quality of the perovskite solar cell 101 based on the image in the first wavelength range.

[0032] In the crystalline silicon solar cell evaluation step of step S08, the second evaluation unit 34 judges the quality of the crystalline silicon solar cell 102 based on the image in the second wavelength range. The order of this crystalline silicon solar cell evaluation step, the image extraction step, and the perovskite solar cell evaluation step is not limited to the order described.

[0033] In the sorting process of step S09, the solar cell modules 100 are sorted (physically separated) according to the level of defects based on the judgment results of the perovskite solar cell evaluation process and the judgment results of the crystalline silicon solar cell evaluation process. As a simple example, in the sorting process, it is possible to keep only non-defective products with defects below a certain standard and reject defective products with defects exceeding a certain standard.

[0034] In the solar cell module inspection device 1 and the solar cell module inspection method and solar cell module manufacturing method that can be implemented using the solar cell module inspection device 1 described above, a photoluminescence image of the solar cell module 100 in which photoluminescence is simultaneously generated in the perovskite solar cell 101 and the crystalline silicon solar cell 102 by the inspection light is taken, and from this photoluminescence image, an image in a first wavelength range in which the light due to the photoluminescence of the perovskite solar cell 101 is dominant, and an image in a second wavelength range in which the light due to the photoluminescence of the crystalline silicon solar cell 102 is dominant are extracted, so that the performance of the perovskite solar cell 101 and the crystalline silicon solar cell 102 can be accurately evaluated with a single image. This ensures the accuracy of the judgment of the solar cell module inspection method, so that only defect-free solar cell modules can be used as the final product in the solar cell module manufacturing method.

[0035] Fig. 3 is a schematic diagram showing the configuration of a solar cell module inspection apparatus 1A according to a second embodiment of the present invention. The solar cell module inspection apparatus 1A inspects a solar cell module 100 in the same manner as the solar cell module inspection apparatus 1 in Fig. 1. In the solar cell module inspection apparatus 1A in Fig. 3, components similar to those in the solar cell module inspection apparatus 1 in Fig. 1 are given the same reference numerals, and duplicated explanations may be omitted.

[0036] The solar cell module inspection apparatus 1A includes an inspection power supply 10A that applies an inspection voltage to each of the perovskite solar cells 101 and the crystalline silicon solar cells 102, an imaging device 20 that photographs the solar cell module 100, and an image processing device 30A that judges the quality of the perovskite solar cells 101 and the crystalline silicon solar cells 102.

[0037] The inspection power supply 10A applies a predetermined inspection voltage to each of the perovskite solar cell 101 and the crystalline silicon solar cell 102, causing them to emit light by electroluminescence. Therefore, in the solar cell module inspection apparatus 1A, the image of the solar cell module 100 captured by the imaging device 20 is an electroluminescence image.

[0038] The image processing device 30A includes an imaging control unit 31A that controls the inspection power supply 10A and the imaging device 20, an image extraction unit 32 that extracts an image in a first wavelength range and an image in a second wavelength range from a photoluminescence image of the solar cell module 100, a first evaluation unit 33 that evaluates the perovskite solar cell 101 based on the image in the first wavelength range, and a second evaluation unit 34 that evaluates the crystalline silicon solar cell 102 based on the image in the second wavelength range.

[0039] The imaging control unit 31A causes the inspection power supply 10A to apply an inspection voltage to the perovskite solar cell 101 and the crystalline silicon solar cell 102, and causes the imaging device 20 to capture an electroluminescence image.

[0040] The solar cell module inspection apparatus 1A in Figure 3 differs from the solar cell module inspection apparatus 1 in Figure 1 only in the method of causing the perovskite solar cell 101 and the crystalline silicon solar cell 102 to emit light, and like the solar cell module inspection apparatus 1 in Figure 1, it can accurately inspect each of the perovskite solar cell 101 and the crystalline silicon solar cell 102 with a single photograph.

[0041] Fig. 4 is a flow chart showing the steps of a solar cell module manufacturing method that can be carried out using the solar cell module inspection apparatus 1 A. The solar cell module manufacturing method of Fig. 4 is one embodiment of the solar cell module manufacturing method according to the present invention.

[0042] The solar cell module manufacturing method of this embodiment includes a perovskite solar cell forming step (step S01), a crystalline silicon solar cell forming step (step S02), a solar cell module forming step (step S03), an inspection voltage application step (step S14), a photographing step (step S05), an image extraction step (step S06), a perovskite solar cell evaluation step (step S07), a crystalline silicon solar cell evaluation step (step S08), and a sorting step (step S09). Steps S14 to S08 are a procedure of one embodiment of the solar cell module inspection method according to the present invention.

[0043] As is clear from the explanation of the solar cell module inspection apparatus 1A, the solar cell module manufacturing method of Fig. 4 differs from the solar cell module manufacturing method of Fig. 1 only in that, instead of the inspection light irradiation step (step S04), it includes an inspection voltage application step (step S14) of applying an inspection voltage to the perovskite solar cell 101 and the crystalline silicon solar cell 102 to cause the perovskite solar cell 101 and the crystalline silicon solar cell 102 to emit electroluminescence. Therefore, the solar cell module manufacturing method of Fig. 4 can accurately determine the quality of the perovskite solar cell 101 and the crystalline silicon solar cell 102 with a single image capture, similar to the solar cell module manufacturing method of Fig. 1.

[0044] Although the embodiment of the present invention has been described above, the present invention is not limited to the above-mentioned embodiment, and various modifications and variations are possible. For example, in the solar cell module manufacturing method according to the present invention, the sorting step is not essential, and it is sufficient to simply link and record the individual number of the solar cell module and the evaluation result. [Explanation of symbols]

[0045] 1,1A Solar cell module inspection equipment 10 Inspection light source 10A Test Power Supply 20 Imaging device 30, 30A Image processing device 31, 31A Imaging control unit 32 Image Extraction Section 33 First Evaluation Section 34 Second Evaluation Section 100 Solar Modules 101 Perovskite solar cells 102 Crystalline silicon solar cells 103 Surface protection materials 104 Back surface protection material 105 Encapsulating material

Claims

1. A solar cell module inspection device for inspecting a solar cell module having perovskite solar cells and crystalline silicon solar cells arranged in a stack and each independently outputting electric power, comprising: an inspection light source that irradiates the solar cell module with inspection light, or an inspection power source that applies an inspection voltage to the perovskite solar cell and the crystalline silicon solar cell; an imaging device that captures an image of the solar cell module; an image processing device for evaluating the perovskite solar cell and the crystalline silicon solar cell based on an image of the solar cell module; Equipped with The image processing device includes: an image extraction unit that extracts an image in a first wavelength range and an image in a second wavelength range from the image of the solar cell module; A first evaluation unit that evaluates the perovskite solar cell based on an image in the first wavelength range; A second evaluation unit that evaluates the crystalline silicon solar cell based on the image in the second wavelength range; A solar cell module inspection device comprising:

2. the lower limit of the first wavelength range is 200 nm or more and 400 nm or less; The upper limit of the first wavelength range is 500 nm or more and 700 nm or less, the lower limit of the second wavelength range is 800 nm or more and 1000 nm or less, The inspection device according to claim 1 , wherein an upper limit of the second wavelength range is not less than 1100 nm and not more than 1300 nm.

3. A solar cell module inspection method for inspecting a solar cell module having perovskite solar cells and crystalline silicon solar cells arranged in a stack and each independently outputting power, comprising: applying an inspection voltage to the perovskite solar cell and the crystalline silicon solar cell; taking an image of the solar cell module; extracting an image in a first wavelength range and an image in a second wavelength range from the image of the solar cell module; evaluating the perovskite solar cell based on the image in the first wavelength range; evaluating the crystalline silicon solar cell based on the image in the second wavelength range; A solar cell module inspection method comprising:

4. obtaining a solar cell module by stacking and sealing perovskite solar cells and crystalline silicon solar cells, each of which independently outputs power; A step of inspecting the solar cell module by the solar cell module inspection method according to claim 3; A solar cell module manufacturing method comprising:

Images