Information processing device, information processing method, and information processing program

By designing an information processing device, using measured values, system information and fault types, the fault resistance is calculated and the response surface is generated, the problem of low fault positioning accuracy of power system is solved, and accurate fault point and fault resistance output is achieved.

JP2025070751APending Publication Date: 2025-05-02FUJI ELECTRIC CO LTD
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Patent Information

Application Number
JP2023181270
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2023-10-20
Publication Date
2025-05-02

AI Technical Summary

Technical Problem

In the prior art, when the power system fails, and when measurement noise or error exists, it is difficult to accurately locate the fault point and the fault resistance, resulting in a decrease in positioning accuracy.

Method used

An information processing device is designed to obtain the measured values ​​provided by the sensor after the power system failure, and combine the system information and fault type to calculate the fault resistance, so that the evaluation index (the difference between the measured value and the calculated value) reaches the optimal value. Then generate the response surface, approximate optimization evaluation metrics, and output information about the fault point and fault resistance.

Benefits of technology

It realizes that when the power system fails, the information about the fault point and fault resistance is accurately output, which improves positioning accuracy and reduces the impact of noise and error.

✦ Generated by Eureka AI based on patent content.

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Abstract

To provide an information processing device capable of accurately outputting information on a location and resistance of a point of failure in the event of power system failure.SOLUTION: There is provided an information processing device comprising: an acquisition unit for acquiring predetermined post-failure measurement values from sensors installed in a power system; a computation unit configured to assume each of a plurality of predetermined nodes as a point of failure and compute a resistance value at each node such that an evaluation indicator representing a difference between a measurement value and a computation value corresponding to the measurement value is optimum on the basis of a type of failure and system information indicative of components of the power system and electrical characteristics of the components; a generation unit configured to generate a response surface approximating an optimum value of the evaluation indicator corresponding to each of the plurality of nodes on the basis of the plurality of nodes and the optimum value of the evaluation indicator corresponding to the resistance value computed at each of the plurality of nodes; and an output unit for outputting at least either of failure point information and resistance value information based on the response curve.SELECTED DRAWING: Figure 11
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Description

[Technical field]

[0001] The present invention relates to an information processing device, an information processing method, and an information processing program. [Background technology]

[0002] 2. Description of the Related Art When a fault occurs in a power system, techniques are known for locating the location of the fault point and the resistance of the fault point.

[0003] For example, Patent Document 1 derives equations for current, voltage, etc., with the distance from the transmission end to the fault point as a variable. Furthermore, a method is disclosed for locating the fault point by measuring the current and voltage at the transmission end during a fault and solving the equations for current, voltage, etc., based on the measured current and voltage. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2000-227453 A Summary of the Invention [Problem to be solved by the invention]

[0005] However, in the method described in Patent Document 1, if the measurement value of the power system measuring device contains noise or error, the location of the fault point or the resistance of the fault point may not be uniquely located. In such a case, the accuracy of the location may deteriorate.

[0006] The present invention has been made in consideration of such problems, and aims to provide an information processing device that can accurately output information on the location of a fault point and the resistance of the fault point when a fault occurs in a power system. [Means for solving the problem]

[0007] One invention for achieving the above-mentioned object is an information processing device that outputs information regarding a fault point when a fault occurs in an electric power system, the information processing device comprising: an acquisition unit that acquires a predetermined measurement value after a fault occurs from a sensor installed in the electric power system; a calculation unit that calculates the resistance value based on system information indicating components of the electric power system and the electrical characteristics of the components and the type of the fault when each of a predetermined number of nodes is set as a fault point, so that a calculated value corresponding to the measurement value and an evaluation index indicating the difference between the measured value and the resistance value become optimal values; a generation unit that generates a response surface that approximates the optimal value of the evaluation index corresponding to each of the plurality of nodes based on the optimal value of the evaluation index corresponding to the resistance value calculated at each of the plurality of nodes and the plurality of nodes; and an output unit that outputs information on at least one of the fault point and the resistance value based on the response surface.

[0008] Also, an information processing method for outputting information regarding a fault point when a fault occurs in a power system includes the steps of: an information processing device acquiring a predetermined measurement value after the fault occurs from a sensor installed in the power system; calculating the resistance value based on system information indicating components of the power system and the electrical characteristics of the components and the type of fault, so that when each of a predetermined number of nodes at the fault point is set as the fault point, a calculated value corresponding to the measurement value and an evaluation index indicating the difference between the measurement value and the measured value become optimal values; generating a response surface approximating the optimal value of the evaluation index corresponding to each of the plurality of nodes based on the optimal value of the evaluation index corresponding to the resistance value calculated at each of the plurality of nodes and the plurality of nodes; and outputting information on at least one of the fault point and the resistance value based on the response surface.

[0009] Also, the information processing program is an information processing program that outputs information regarding a fault point when a fault occurs in a power system, the information processing device realizing: an acquisition unit that acquires a predetermined measurement value after a fault occurs from a sensor installed in the power system; a calculation unit that calculates the resistance value based on system information indicating components of the power system and the electrical characteristics of the components and the type of fault when each of a predetermined number of nodes at the fault point is set as the fault point, so that a calculated value corresponding to the measurement value and an evaluation index indicating the difference between the measured value and the measurement value become optimal values; a generation unit that generates a response surface that approximates the optimal values ​​of the evaluation index corresponding to each of the plurality of nodes based on the optimal values ​​of the evaluation index corresponding to the resistance values ​​calculated at each of the plurality of nodes and the plurality of nodes; and an output unit that outputs information on at least one of the fault point and the resistance value based on the response surface. Effect of the Invention

[0010] According to the present invention, it is possible to provide an information processing device capable of outputting information on the location of a fault point and the resistance of the fault point with high accuracy when a fault occurs in a power grid. [Brief description of the drawings]

[0011] [Figure 1] 1 is a diagram showing an example of a power system 1 in which an information processing device 2 locates a fault point. [Diagram 2] 2 is a diagram illustrating a hardware configuration of an information processing device 2. FIG. [Diagram 3] FIG. 2 is a diagram illustrating functional blocks of the information processing device 2. [Figure 4] FIG. 1 is a diagram illustrating a distribution line 11 in which a fault has occurred. [Diagram 5] FIG. 1 is a diagram illustrating a distribution line 11 in which a ground fault has occurred. [Figure 6] FIG. 2 is a diagram showing an equivalent circuit of the power system 1 when a single line-to-ground fault occurs at one node. [Figure 7] FIG. 13 is a diagram showing the calculation results of a calculation unit 211. [Figure 8] This is the relationship between the resistance of the fault point and the distance obtained by the calculation unit 211. [Figure 9] 13 is a diagram showing the calculation results of the calculation unit 211 when an abnormal value occurs in the resistance value. FIG. [Figure 10] This is the relationship between the resistance of the fault point and the distance, corrected by substituting a normal value for the resistance value corresponding to the abnormal value. [Figure 11] FIG. 2 is a diagram for explaining a response surface S generated by the generating unit 212. [Figure 12] 13 is a flowchart illustrating a process executed by the information processing device 2. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] == Implementation form == <<Power system 1>> 1 is a diagram showing an example of a power system 1 in which an information processing device 2 described later locates a fault point. The power system 1 includes a distribution substation 10, a distribution line 11, and a plurality of nodes N installed at predetermined positions on the distribution line 11. k (k is a natural number) and sensor-equipped switches SW1 and SW2 installed at predetermined positions on the distribution line 11.

[0013] [Distribution Substation 10] The distribution substation 10 transforms the voltage supplied from a transmission line (not shown) and outputs a voltage of 6.6 kV to the distribution line 11.

[0014] [Power distribution line 11] A plurality of distribution lines 11 are radially connected to the distribution substation 10, with the distribution substation 10 serving as the origin (sending node). Only one distribution line 11 is shown in Fig. 1. The distribution line is a three-phase AC distribution line.

[0015] [node] Multiple nodes N k (1≦k≦M) are provided on a power distribution line 11. In FIG. 1, nodes N1 to N4 are shown. In this embodiment, the node is an aggregation unit managed on a pole transformer (not shown) basis. Node Nk A load and a consumer such as a solar power generation facility are connected to the distribution substation 10 via a pole transformer. The power output from the distribution substation 10 to the distribution line 11 is k The power is supplied to consumers via

[0016] [Switches with sensors SW1, SW2] The sensor-equipped switches SW1 and SW2 are switches having sensors capable of periodically measuring measured values ​​at the installed positions.

[0017] The measurement values ​​of the sensor-equipped switches SW1 and SW2 include at least the voltage of the distribution line 11 at the installation points of the sensor-equipped switches SW1 and SW2 and the current flowing through the distribution line 11. The measurement values ​​of the sensor-equipped switches SW1 and SW2 are output to and stored in a measurement value DB3 (described later).

[0018] In this embodiment, two sensor-equipped switches SW1 and SW2 are installed on one power distribution line 11, but there is no particular limit to the number of sensor-equipped switches.

[0019] Next, before describing the information processing device 2, the measurement value DB 3 and system information DB 4 will be described.

[0020] <<Measurement value DB3>> The measurement value DB3 stores the measurement values ​​of the sensor-equipped switches SW1 and SW2. The measurement values ​​of the sensor-equipped switches SW and SW2 are used when the information processing device 2 locates the position of a fault point. The measurement value DB3 stores the measurement values ​​measured within a predetermined period of time in the past (for example, one week).

[0021] <<System information DB4>> The system information DB 4 stores system information I1 of the power system 1 and information I2 regarding the power system 1 at the time of a fault.

[0022] <System information I1> The system information I1 is information indicating components of the power system 1 and electrical characteristics of the components. The system information I1 includes information indicating the position of a node, information indicating a connected node, information on impedance, and information on ancillary devices.

[0023] That is, in this embodiment, the nodes on the power distribution line 11 are assigned node numbers that are greater on the downstream side of the power distribution line 11.

[0024] Note that the method of assigning node numbers here is merely an example and is not limited to this. Any method of assigning node numbers that allows each of a plurality of nodes to be identified may be used.

[0025] In the following description, "node N k " (k is a natural number), this refers to the node assigned node number k.

[0026] Returning to the explanation of the system information I1, the information indicating the node position, the information relating to impedance, and the information relating to the connected node will be explained.

[0027] [Information indicating the node's location] The information indicating the node positions is information for identifying the positions of each of a plurality of nodes. The information indicating the node positions is a position on a map. The position on the map can be expressed by latitude and longitude.

[0028] [Information about the connected node] The information about the connected nodes is stored in multiple nodes N k The nodes N1 are adjacent upstream for each of the nodes (2≦k≦M). Note that the most upstream node, node N1, does not have information about the nodes to which it is connected.

[0029] [Information about impedance] The information about impedance is, for example, impedance Z for the power system 1. When the current injected into each of the multiple nodes is I and the voltage of each of the multiple nodes is V, the impedance Z is expressed by the following equation.

number

[0030] In the following description, the power system 1 includes M nodes (nodes N1 to N M In this case, the voltage V, current I, and impedance Z are expressed by the following equations.

number

number

number

[0031] That is, the voltage V and the current I are a matrix with M rows and 1 column, and the impedance Z is a matrix with M rows and M columns. Hereinafter, the impedance Z in Equation 4 will be particularly referred to as the "impedance matrix Z."

[0032] In Equation 2, the component V of the voltage V k (1≦k≦M) is node N k In addition, in Equation 3, the component I of the current I k (1≦k≦M) is node N k is the injection current into the

[0033] In Equation 4, the component Z of the impedance matrix Z kl (1≦k≠l≦M) is the node N k and node N l is the impedance between

[0034] In addition, in Equation 4, the diagonal components Z of the impedance matrix Z kk is the node Nk This corresponds to the impedance of the entire power system 1 when the reference voltage is 1.

[0035] [Additional equipment information] The auxiliary device information is stored in multiple nodes N k This is information indicating the auxiliary devices provided in each of the (1≦k≦M) power grids. The auxiliary devices are the sensor-equipped switches SW1 and SW2, the pole transformer, and other devices.

[0036] <Information I2 about power system 1 at the time of the failure> The information I2 on the power system 1 during the fault is k This is information showing an equivalent circuit of the power system 1 according to the fault type CF when a fault occurs in (1≦k≦M).

[0037] Here, the "fault type CF" is any one of a single line ground fault, a double line ground fault, a two-phase short circuit, a three-line ground fault, and a three-phase short circuit. Note that the equivalent circuit of the power system 1 according to the fault type CF will be described in detail later with reference to the drawings.

[0038] <<Information processing device 2>> The information processing device 2 is a device that outputs information about a fault point when a fault occurs in the power system 1. Here, the "information about the fault point" is the location of the fault point and the resistance value R f Hereinafter, the hardware configuration and functional blocks of the information processing device 2 will be described in that order.

[0039] <Hardware configuration of information processing device 2> 2 is a diagram illustrating a hardware configuration of an information processing device 2 according to an embodiment of the present invention. The information processing device 2 is a computer having a CPU (Central Processing Unit) 200, a memory 201, a communication device 202, a storage device 203, an input device 204, an output device 205, and a recording medium reading device 206.

[0040] [CPU200] The CPU 200 executes information processing programs stored in the memory 201 or the storage device 203 to realize various functions of the information processing device 2.

[0041] [Memory 201] The memory 201 is, for example, a RAM (Random-Access Memory) and is used as a temporary storage area for various programs, data, and the like.

[0042] [Communication device 202] The communication device 202 exchanges various programs and data with other computers via the network.

[0043] [Storage device 203] The storage device 203 is a non-transitory (eg, non-volatile) storage device that stores various data to be executed or processed by the CPU 200.

[0044] [Input device 204] The input device 204 is a device that accepts commands and data input by a user, and includes an input interface such as a keyboard and a touch sensor that detects a touch position on a touch panel display.

[0045] [Output Device 205] The output device 205 is, for example, a display or a printer.

[0046] [Recording medium reader 206] The recording medium reader 206 reads various data such as information processing programs recorded on the recording medium 3 such as an SD card, a DVD, or a CD-ROM, and stores the data in the storage device 203 .

[0047] <Function blocks of information processing device 2> 3 is a diagram illustrating functional blocks of the information processing device 2. The information processing device 2 includes an acquisition unit 210, a calculation unit 211, a generation unit 212, and an output unit 213. Each of these will be described below.

[0048] [Acquisition unit 210] The acquisition unit 210 acquires predetermined measured values ​​after a fault occurs from the sensor-equipped switches SW1, SW2 installed in the power system 1. As described above, in this embodiment, the measured values ​​are voltage and current.

[0049] When a fault occurs in the power system 1, the power system 1 uses a protective relay system to identify the distribution line 11 in which the fault has occurred, and notifies the banks of the power system 1 of the occurrence of the fault.

[0050] 4 is a diagram illustrating a distribution line 11 in which a fault has occurred. As shown in this diagram, when a bank 12 is configured in the power system 1, the distribution line 11 in which a fault has occurred is identified. At this time, the acquisition unit 210 acquires the measurement values ​​of the sensor-equipped switches SW1 and SW2 installed in the distribution line 11 in which the fault has occurred.

[0051] 5 is a diagram illustrating a distribution line 11 in which a ground fault, which is an example of a fault, occurs. As shown in this figure, when a ground fault occurs, a ground fault resistance R f occurs.

[0052] Voltage measurement value V by SW1 and SW2 m (i) and the measured current I m (i) is expressed as the following Equation 5 and Equation 6, respectively.

number

number

[0053] Here, "i" identifies the sensor-equipped switches SW1 and SW2. In this embodiment, i is 1 or 2, and when i is 1 it corresponds to the sensor-equipped switch SW1, and when i is 2 it corresponds to the sensor-equipped switch SW2.

[0054] Also, V1 on the right side of Equation 5 m (i), V2m (i) and V0 m (i) are the positive-sequence, negative-sequence, and zero-sequence components of the voltage measurement, respectively. I1 on the right side of Equation 6 m (i), I2 m (i) and I0 m (i) are the positive sequence, negative sequence, and zero sequence components of the measured current, respectively.

[0055] The positive, negative and zero phases of the measured voltage and current values ​​are effective values ​​and are expressed as phases relative to a certain reference value phase or as complex numbers.

[0056] [Calculation section 211] The calculation unit 211 calculates the number of nodes N k When each of the nodes (1≦k≦M) is set as a fault point, the node N k Resistance value R k At this time, the calculation unit 211 calculates the resistance value so that the evaluation index indicating the difference between the calculated value corresponding to the measured value and the measured value becomes an optimal value.

[0057] In the following, let us assume that node N k When the fault point is set to node N k Resistance value R k Here we explain the procedure for calculating the measured voltage V m The calculated voltage corresponding to (i) is V s (i, k, R k ), the measured current I m Calculated current value I corresponding to (i) s (i, k, R k ) and place it as

[0058] Calculated voltage V s (i, k, R k ) and the calculated current I s (i, k, R k ) are expressed as the following Equations 7 and 8, respectively.

number

number

[0059] Here, i identifies the sensor-equipped switches SW1 and SW2, as in the formulas 5 and 6. k identifies the node assumed to be the fault point (in this case, node N k ) is the node number. k is the fault point (node ​​N k ) resistance.

[0060] Also, V1 in Equation 7 s (i, k, R k ), V2 s (i, k, R k ) and V0 s (i, k, R k ) are the positive sequence component, negative sequence component, and zero sequence component of the calculated voltage, respectively. I1 in Equation 8 s (i, k, R k ), I2 s (i, k, R k ) and I0 s (i, k, R k ) are the positive-sequence, negative-sequence, and zero-sequence components of the calculated current, respectively.

[0061] Next, the calculation unit 211 calculates the value V s (i, k, R k ) and I s (i, k, R k ) is calculated based on the equivalent circuit of power system 1 when a fault occurs. s and I s In this embodiment, a case where the fault type CF is a single line to ground fault will be described as an example.

[0062] Figure 6 shows the node N k 1 is a diagram showing an equivalent circuit of the power system 1 when a line-to-ground fault occurs at 100V. The information processing device 2 locates the fault point using voltage, current, and impedance expressed in a symmetric coordinate system expressed by zero phase, positive phase, and negative phase.

[0063] Therefore, in FIG. 6, the voltage V, current I and impedance matrix Z are given a superscript (0, 1 or 2) to indicate that they are expressed in a symmetric coordinate system.

[0064] In the representation using the symmetrical coordinate system, the superscript "0" means zero-sequence, the superscript "1" means positive sequence, and the superscript "2" means negative sequence.

[0065] In Figure 6, Z kk 1 , Z kk 2 and Z kk 0 are the nodes N k These are the positive-phase, negative-phase, and zero-phase impedances on the power system 1 side as seen from the

[0066] Also, V k 1 , V k 2 and V k 0 are the nodes N k These are the positive, negative and zero sequence voltages before the fault occurs (when the system is healthy). k 1 , I k 2 and I k 0 are the nodes N k These are the positive, negative and zero sequence earth fault currents after a fault occurs in the

[0067] Also, R k is the fault point (node ​​N k ) is the resistance of the fault point R k is the object of orientation and is an unknown value at this stage.

[0068] And the fault point (node ​​N k ) earth fault current can be calculated using the following formula:

number

[0069] According to formula 9, the earth fault current I k 1 , I k 2 and I k 0 After calculating V, the calculation unit 211 solves the circuit equation using the impedance matrix with the earth fault current as the current source. This makes it possible to calculate the voltage and current at any point on the power system 1 after a fault occurs, and the calculated value V of Equation 7 and Equation 8 is s (i, k, R k ),I s (i, k, R k ) is obtained.

[0070] Then, the calculation unit 211 calculates the value V s (i, k, R k ),I s (i, k, R k ) and the measured value V m (i),I m (i) Evaluation index F(R k ) is optimized by setting the resistance R k Calculate.

[0071] Specifically, the calculation unit 211 calculates the resistance value R k Calculate.

number

number

number

[0072] Formula 10 expresses the evaluation index F(R k ) to optimize (in this case minimize) the resistance R k Formula 11 is a specific example of the evaluation index F. Formula 12 is a condition imposed when minimizing the evaluation index F. k indicates that it is positive.

[0073] In formula 11, n on the right side V and n I are coefficients for adjusting the dimensions of the first and second terms in the parentheses on the right side of the equation. V and n I is a positive real number.

[0074] n V and n I are predetermined characteristic values ​​of the voltage and current, respectively. V and n I may be a value multiplied by a predetermined weight.

[0075] As can be seen from Equation 11, the smaller the difference between the measured value and the calculated value, the smaller the evaluation index F becomes, and when they match, the evaluation index F becomes zero.

[0076] The calculation unit 211 solves the optimization problems of Equations 10 to 12 to obtain the resistance value R k The calculation unit 211 calculates all the nodes N k Resistance value R when (1≦k≦M) is the fault point k Find (1≦k≦M).

[0077] 7 is a diagram showing the calculation results of the calculation unit 211. In this figure, k (1≦k≦M) k , the resistance value of the fault point R k and the optimal value of the evaluation index F(R k ) is shown. k " refers to the distance from the sending node (distribution substation 10) to node N k This is the length measured along the distribution line 11 (FIG. 5).

[0078] [Generation unit 212] The generation unit 212 generates a plurality of nodes N k The optimal value of the evaluation index F(R k) (1≦k≦M) is generated. The response surface is calculated by fitting the optimal value F(R k ) (1≦k≦M).

[0079] At this time, the generation unit 212 generates a plurality of nodes N k The resistance value R calculated for each of (1≦k≦M) k The optimal value of the evaluation index F(R k ) (1≦k≦M) and multiple nodes N k (1≦k≦M) and generate a response surface.

[0080] Before explaining the response surface in detail, let us consider the resistance value R k and distance Y k FIG. 8 shows the relationship between the resistance R k and distance Y k 8 is a plot of some of the calculation results shown in FIG. 7.

[0081] In this diagram, the resistance R at the fault point k is the distance Y k It can be seen that the longer the distance, the smaller the distance becomes. The reason why such a relationship exists can be explained as follows.

[0082] First, regarding the resistance components (positive sequence component, negative sequence component, and zero sequence component) of the line impedance of the distribution line 11, r k-1 <r k Here, r k (r k-1 ) is a signal from the sending node (distribution substation 10) to node N k (Node N k-1 ) is the resistive component of the line impedance.

[0083] Also, from the perspective of the sending node, node N k Resistance value r up to k and node N k Resistance value R from kThe following equation approximately holds for the sum of and (positive phase component):

number

[0084] Therefore, r k―1 <r k Considering the relationship between R k―1 >R k The following relationship is established.

[0085] However, if the measured values ​​of the sensor-equipped switches SW1 and SW2 contain measurement errors, and if the calculated values ​​contain calculation errors, R k―1 >R k In other words, the resistance value at each of the multiple nodes may include an abnormal value. In this case, the abnormal value is a resistance value that deviates from a predetermined relationship that should be satisfied between the resistance value at each of the multiple nodes and the multiple nodes.

[0086] The predetermined relationship in this case is the relationship between the distance of the node in the downstream direction from a predetermined point in the power system 1 (for example, the distribution substation 10) and the resistance value at the node.

[0087] For example, as shown in (a) and (b) of FIG. 9, k-1 >R k It is possible that abnormal values ​​that deviate from the above relationship will occur.

[0088] In such a case, the generating unit 212 may generate a response surface after removing the optimal values ​​of the evaluation indexes corresponding to the abnormal values.

[0089] Furthermore, in such a case, the generating unit 212 may generate a response surface by using values ​​that satisfy the above relationship instead of the resistance values ​​corresponding to the abnormal values, as shown in Fig. 10. In Fig. 10, the data points used instead of the abnormal values ​​are indicated by black circles.

[0090] In this embodiment, the resistance value R k and distance Yk The relationship R that must be satisfied k-1 <R k Based on the resistance R k is an abnormal value, but the present invention is not limited to this.

[0091] Alternatively, for example, the resistance R k (1≦k≦M)) based on the average value and standard deviation of the resistance value R k In this case, it may be determined whether the resistance value R is an abnormal value or not, and the absolute value of the difference from the average value exceeds the standard deviation. k may be determined to be an abnormal value.

[0092] In addition, the generation unit further removes, from the optimal values ​​of the multiple evaluation indexes, optimal values ​​of evaluation indexes that are abnormal values ​​that deviate from specified conditions based on specified statistical processing, and then generates a response surface.

[0093] Here, the predetermined statistical processing is, for example, processing for calculating the average value and standard deviation of the optimal values ​​of a plurality of evaluation indexes.

[0094] In this case, the specified condition is, for example, that each of the optimal values ​​of multiple evaluation indexes is within a range of a standard deviation (or a value based on the standard deviation, such as a constant multiple of the standard deviation) centered on the average value.

[0095] In this case, among the optimal values ​​of a plurality of evaluation indexes, the optimal values ​​of the evaluation indexes that fall outside the range of the standard deviation centered on the average value are eliminated.

[0096] Furthermore, in this case, the response surface S may be generated using values ​​that satisfy the above conditions, instead of the optimal values ​​of the evaluation indexes that are abnormal values.

[0097] In addition, the above resistance value R k An abnormal value for the optimal value of the evaluation index corresponds to a “first abnormal value.” An abnormal value for the optimal value of the evaluation index corresponds to a “second abnormal value.”

[0098] Fig. 11 is a diagram illustrating the response surface S generated by the generating unit 212. Fig. 11 is shown in a three-dimensional orthogonal coordinate system with the distance Y, the resistance value R of the fault point, and the evaluation index F as axes.

[0099] Also, in this figure, the distance Y k , the resistance value of the fault point R k and the evaluation index F(R k The calculated values ​​of F(R k ) is a continuous surface that approximates the calculated value of the response surface S. Note that the response surface S is a one-dimensional curve in three-dimensional space, but the "curve" here refers to a generalized surface.

[0100] [Output section 213] The output unit 213 outputs the location of the fault point (distance Y f ) and the resistance value R of the fault point f At least one of the above information is output.

[0101] In this embodiment, the output unit 213 detects the location of the fault point (distance Y f ) and the resistance value R of the fault point f Specifically, the output unit 213 outputs the information on the distance Y f and resistance value R f Output.

[0102] In this embodiment, the output unit 213 outputs a distance Y f and the resistance value R of the fault point f are output as their respective coordinated values.

[0103] The information on the location of the fault point and the resistance value of the fault point are the location distance Y f and the resistance value R of the fault point f For example, a range of distance Y within which the possibility of a fault point in the power system 1 is equal to or greater than a predetermined value may be output.

[0104] On the response surface S, the distance Y corresponds to the position where the evaluation index F is small. f and the resistance value R of the fault point f The closer the distance to the actual fault point and the closer the resistance value to the actual fault point, the higher the possibility that the distance Y is closer to the actual fault point. Therefore, in this case, it is sufficient to output the range of distance Y on the response surface S, which gives the value of the evaluation index F at or below a predetermined position.

[0105] According to the information processing device 2 described above, when a fault occurs in the power system 1, it is possible to output information on the location of the fault point and the resistance of the fault point with high accuracy.

[0106] <Processing Executed by Information Processing Device 2> The process executed by the information processing device 2 will be described with reference to a flowchart. Fig. 12 is a flowchart illustrating the process executed by the information processing device 2. This process includes steps S101 to S108.

[0107] When a fault occurs in the power system 1, first, in step S101, the acquisition unit 210 acquires measured values ​​of voltage and current after the fault occurs from the sensor-equipped switches SW1 and SW2.

[0108] Next, in step S102, the calculation unit 211 calculates the node N k (1≦k≦M) for each resistance value R k In this case, the resistance value R is calculated by solving the optimization problem using the evaluation index shown in Equation 11. k Calculate the optimal value of (Figure 7).

[0109] Next, in step S103, the generation unit 212 calculates the resistance value R k Outliers are extracted from (1≦k≦M) (Figure 9).

[0110] Next, in step S104, the generation unit 212 generates the resistance value R k Node N corresponding to k Data (distance Y kand resistance value R k ) is removed.

[0111] Next, in step S105, the generation unit 212 generates at least one node N k Using the normal value data of the nodes connected to k Data (distance Y k and resistance value R k ) is interpolated (Figure 10).

[0112] The processes in steps S104 and S105 are not executed unless an abnormal value is extracted in S103.

[0113] Next, in step S106, the generation unit 212 calculates the optimal values ​​F(R k ) (1≦k≦M) is used to generate a response surface (Figure 11).

[0114] Next, in step S107, the distance Y from the sending node to the fault point is calculated based on the response surface S. f and the resistance value R of the fault point f Each of the above is oriented.

[0115] Finally, in step S108, the distance Y f and resistance value R f Output.

[0116] Through the above procedure, when a fault occurs in the power grid 1, the information processing device 2 can estimate the distance Y f and the resistance value R of the fault point f and output the result.

[0117] ==Summary== As described above, the information processing device 2 of the embodiment is an information processing device that outputs information on a fault point and a resistance value at the fault point when a fault occurs in the power system 1, and includes an acquisition unit 210 that acquires a predetermined measurement value after the fault occurs from the sensor-equipped switches SW1 and SW2 installed in the power system 1, a calculation unit 211 that calculates a resistance value so that a calculated value corresponding to the measurement value and an evaluation index F indicating a difference from the measurement value become optimal values ​​based on system information I1 indicating the components of the power system 1 and the electrical characteristics of the components and a fault type CF when each of a predetermined number of nodes at the fault point is set as the fault point, a generation unit 212 that generates a response surface S that approximates each optimal value of the multiple evaluation indexes F based on the optimal values ​​of each of the multiple evaluation indexes corresponding to the resistance values ​​calculated at each of the multiple nodes and the multiple nodes, and an output unit 213 that outputs information on the fault point and the resistance value based on the response surface S.

[0118] According to this configuration, the information on the fault point and the resistance value is further optimized by an optimization method using the response surface S. Therefore, when a ground fault occurs in the power system 1, the information on the location of the fault point and the resistance of the fault point can be output with high accuracy.

[0119] In the information processing device 2, when the resistance value at each of the multiple nodes includes an abnormal value that deviates from a predetermined relationship that should be satisfied between the resistance value at each of the multiple nodes and the multiple nodes, the generating unit 212 generates a response surface S after removing an optimal value of an evaluation index corresponding to the abnormal value, or an optimal value of an evaluation index that is an abnormal value that deviates from a predetermined condition based on a predetermined statistical processing, from among the optimal values ​​of the multiple evaluation indexes. With this configuration, the response surface S is generated after removing the abnormal value. Therefore, it is possible to prevent deterioration in the accuracy of information on the location of the fault point and the resistance of the fault point when a ground fault occurs in the power system 1.

[0120] In the information processing device 2, the generating unit 212 uses a value that satisfies the relationship instead of the resistance value corresponding to the abnormal value, and uses a value that satisfies the condition instead of the optimal value of the evaluation index that is an abnormal value to generate the response surface S. With this configuration, when an abnormal value occurs, the influence of the abnormal value on the response surface can be reduced. Therefore, when a ground fault occurs in the power system 1, it is possible to prevent deterioration in the accuracy of the information on the location of the fault point and the resistance of the fault point.

[0121] In the information processing device 2, the relationship is the relationship between the distance of the node in the downstream direction from a predetermined point in the power system 1 and the resistance value at the node. With this configuration, it becomes easy to determine whether the calculated resistance value is an abnormal value or a normal value.

[0122] In the information processing device 2, the output unit 213 outputs the fault points and the resistance values ​​located based on the response surface S. With this configuration, it is possible to output the specific positions of the located fault points and the specific values ​​of the resistance.

[0123] The information processing method of the embodiment is an information processing method that outputs information on a fault point and a resistance value at the fault point when a fault occurs in the power system 1, and includes the steps of: an information processing device 2 acquiring a predetermined measurement value after the fault occurs from the sensor-equipped switches SW1, SW2 installed in the power system 1; calculating a resistance value based on system information I1 indicating the components of the power system 1 and the electrical characteristics of the components and a fault type CF so that a calculated value corresponding to the measurement value and an evaluation index F indicating the difference between the measured value and the calculated value are optimal values ​​when each of a predetermined number of nodes is set as the fault point; generating a response surface S that approximates the optimal values ​​of each of the multiple evaluation indexes F based on the multiple nodes and the optimal values ​​of each of the multiple evaluation indexes corresponding to the resistance values ​​calculated at each of the multiple nodes; and outputting information on the fault point and the resistance value based on the response surface S.

[0124] According to this method, the information on the fault point and the resistance value is further optimized by an optimization method using the response surface S. Therefore, when a ground fault occurs in the power system 1, the information on the location of the fault point and the resistance of the fault point can be output with high accuracy.

[0125] The information processing program of the embodiment is an information processing program that outputs information on a fault point and a resistance value at the fault point when a fault occurs in the power system 1, and the information processing device 2 is made to realize an acquisition unit 210 that acquires a predetermined measurement value after a fault occurs from the sensor-equipped switches SW1, SW2 installed in the power system 1, a calculation unit 211 that calculates a resistance value so that a calculated value corresponding to the measurement value and an evaluation index F indicating a difference from the measurement value become optimal values ​​based on system information I1 indicating the components of the power system 1 and the electrical characteristics of the components and a fault type CF when each of a predetermined number of nodes is set as a fault point, a generation unit 212 that generates a response surface S that approximates each optimal value of the multiple evaluation indexes F based on the multiple nodes and optimal values ​​of each of the multiple evaluation indexes F corresponding to the resistance values ​​calculated at each of the multiple nodes, and the multiple nodes, and an output unit 213 that outputs information on the fault point and the resistance value based on the response surface S.

[0126] According to such a program, the information on the fault point and the resistance value is further optimized by an optimization method using the response surface S. Therefore, when a ground fault occurs in the power system 1, the information on the location of the fault point and the resistance of the fault point can be output with high accuracy. [Explanation of symbols]

[0127] power system 1 Distribution Substation 10 Power Lines 11 Bank 12 Data processing device 2 CPU 200 Memory 201 Communication device 202 Storage device 203 Input Device 204 Output Device 205 Recording medium reader 206 Acquisition Department 210 Calculation section 211 Generation section 212 Output section 213

Claims

1. An information processing device that outputs information about a fault point when a fault occurs in a power grid, An acquisition unit that acquires a predetermined measurement value after a fault occurs from a sensor installed in the power system; a calculation unit that calculates a resistance value at the fault point based on system information indicating components of the power system and electrical characteristics of the components and a type of the fault, so that an evaluation index indicating a difference between a calculated value corresponding to the measured value and the measured value becomes an optimal value when each of a predetermined number of nodes is set as a fault point; a generating unit that generates a response surface that approximates an optimal value of an evaluation index corresponding to each of the plurality of nodes, based on an optimal value of an evaluation index corresponding to the resistance value calculated at each of the plurality of nodes and the plurality of nodes; an output unit that outputs information on at least one of the failure points and the resistance value based on the response surface; An information processing device comprising:

2. 2. The information processing device according to claim 1, The generation unit is When the resistance value at each of the plurality of nodes includes a first abnormal value that deviates from a predetermined relationship that should be satisfied between the resistance value at each of the plurality of nodes and the plurality of nodes, an optimal value of the evaluation index corresponding to the first abnormal value, or generating the response surface after removing, from the optimal values ​​of the plurality of evaluation indexes, an optimal value of the evaluation index that is a second abnormal value that deviates from a predetermined condition based on a predetermined statistical processing; Information processing device.

3. 3. The information processing device according to claim 2, The generation unit is generating the response surface by using a value that satisfies the relationship instead of the resistance value corresponding to the first abnormal value, and using a value that satisfies the condition instead of the optimal value of the evaluation index that is the second abnormal value; Information processing device.

4. 3. The information processing device according to claim 2, The relationship is a relationship between a distance of the node from a predetermined point in the power system in a downstream direction and a resistance value at the node. Information processing device.

5. The information processing device according to any one of claims 1 to 4, The output unit outputs the fault points and the resistance values ​​located based on the response surface. Information processing device.

6. An information processing method for outputting information about a fault point when a fault occurs in a power grid, comprising: An information processing device, obtaining predetermined measurements from sensors installed in the power grid after a fault has occurred; calculating a resistance value at the fault point based on system information indicating components of the power system and electrical characteristics of the components, and the type of the fault, so that an evaluation index indicating a difference between a calculated value corresponding to the measured value and the measured value becomes an optimal value when each of a plurality of predetermined nodes of the fault point is set as a fault point; generating a response surface that approximates the optimal values ​​of the evaluation indexes corresponding to the resistance values ​​calculated at each of the plurality of nodes, based on the plurality of nodes and the optimal values ​​of the evaluation indexes corresponding to the respective plurality of nodes; outputting at least one of information on the failure points and the resistance value based on the response surface; An information processing method comprising:

7. An information processing program for outputting information regarding a fault point when a fault occurs in a power system, In the information processing device, An acquisition unit that acquires a predetermined measurement value after a fault occurs from a sensor installed in the power system; a calculation unit that calculates a resistance value at the fault point based on system information indicating components of the power system and electrical characteristics of the components and a type of the fault, so that an evaluation index indicating a difference between a calculated value corresponding to the measured value and the measured value becomes an optimal value when each of a plurality of predetermined nodes of the fault point is set as a fault point; a generating unit that generates a response surface that approximates an optimal value of an evaluation index corresponding to each of the plurality of nodes, based on an optimal value of an evaluation index corresponding to the resistance value calculated at each of the plurality of nodes and the plurality of nodes; an output unit that outputs information on at least one of the failure points and the resistance value based on the response surface; An information processing program that realizes this.

Citation Information

Patent Citations

  • Spotting of failure position in electric power transmission system

    JP2000227453A