Ripple value correction device, computer program, method for correcting ripple value, and ripple value correction system

Abstract

To provide a ripple value correction device, a computer program, a method for correcting a ripple value, and a ripple value correction system which can provide a ripple value for the same temperature, regardless of an ambient temperature of an electrolytic capacitor.SOLUTION: The ripple value correction device has a control unit. The control unit acquires a ripple value and an ambient temperature of an electrolytic capacitor of a power source mechanism, and corrects the ripple value at the ambient temperature to the ripple value at arbitrary reference temperature in a temperature range defined by plural temperatures, on the basis of correction information defining a correction coefficient on a temperature-by-temperature basis, which is the ratio of a ripple value at a temperature which is not the reference temperature to the acquired ripple value and the ripple values at the ambient temperature and at the reference temperature.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a ripple value correction device, a computer program, a ripple value correction method, and a ripple value correction system.

Background Art

[0002] Various devices such as electrical equipment, electronic equipment, and system equipment are provided with a power supply mechanism (including a power supply device). These power supply mechanisms are generally composed of a switching circuit for miniaturization and weight reduction, and are provided with an electrolytic capacitor to reduce noise and ripple voltage (ripple current) generated by the operation of the switching circuit.

[0003] However, an increase in the ripple value due to deterioration of the characteristics of the electrolytic capacitor causes problems in the power supply mechanism and the equipment equipped with the power supply mechanism. Therefore, it is important to grasp the deterioration state of the electrolytic capacitor. In addition, the characteristics of the electrolytic capacitor are affected by the ambient temperature of the electrolytic capacitor. Patent Document 1 discloses a life detection device that detects the ripple value of an electrolytic capacitor, detects the ambient temperature of the electrolytic capacitor, and outputs a determination signal for determining the life in real time by incorporating a temperature correction value into the detected ripple value.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] However, in the device of Patent Document 1, since the calculated temperature correction value is combined with the detected ripple value, the ripple value for deterioration determination depends on the temperature of the electrolytic capacitor. Therefore, deterioration determination at the same temperature cannot be performed.

[0006] The present invention has been made in view of such circumstances, and an object thereof is to provide a ripple value correction device, a computer program, a ripple value correction method, and a ripple value correction system capable of obtaining a ripple value at the same temperature regardless of the ambient temperature of an electrolytic capacitor.

Means for Solving the Problems

[0007] Although the present application includes a plurality of means for solving the above problems, as an example, the ripple value correction device includes a control unit, and the control unit acquires the ripple value and the ambient temperature of an electrolytic capacitor included in a power supply mechanism, and based on the acquired ripple value and ambient temperature, and correction information that defines a correction coefficient for each temperature, which is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures, corrects the ripple value at the ambient temperature to the ripple value at the reference temperature.

Effects of the Invention

[0008] According to the present invention, it is possible to obtain a ripple value at the same temperature regardless of the ambient temperature of the electrolytic capacitor.

Brief Description of the Drawings

[0009]

Figure 1

Figure 2

Figure 3

Figure 4

Figure 5

Figure 6

Figure 7

Figure 8

Figure 9

Figure 10

Embodiments for Carrying Out the Invention

[0010] Hereinafter, the present invention will be described based on the drawings showing embodiments. FIG. 1 is a diagram showing an example of the configuration of the ripple value correction system of the present embodiment. The ripple value correction system includes a ripple value correction device 50 and a power supply mechanism 100. The power supply mechanism 100 may be a so-called power supply device, a power supply mechanism incorporated in various devices such as electric devices, electronic devices, and system devices, or a power supply mechanism configured separately from the device and used. The power supply mechanism 100 includes an electrolytic capacitor 110. There is no particular limitation on the number and location of the electrolytic capacitors 110 provided in the power supply mechanism 100. The power supply mechanism 100 detects the ambient temperature of the electrolytic capacitor 110 by a temperature sensor (not shown) and outputs the detected ambient temperature to the ripple value correction device 50. The ripple value correction device 50 can acquire the ripple value (ripple voltage) of the electrolytic capacitor 110 of the power supply mechanism 100 in real time. The ripple value correction device 50 may be configured to be incorporated inside the power supply mechanism 100.

[0011] The ripple value correction device 50 includes a control unit 51 that controls the entire device, an acquisition unit 52, a memory 53, a communication unit 54, and a storage unit 55.

[0012] The control unit 51 may be configured by incorporating a required number of CPUs (Central Processing Units), MPUs (Micro-Processing Units), etc. Further, the control unit 51 may be configured by combining DSPs (Digital Signal Processors), FPGAs (Field-Programmable Gate Arrays), etc.

[0013] The acquisition unit 52 can acquire the ripple value and the ambient temperature of the electrolytic capacitor 110 from the power supply mechanism 100.

[0014] The communication unit 54 includes a communication module and has a function of communicating with an external device.

[0015] The storage unit 55 can be configured with a hard disk, a semiconductor memory, or the like, and stores a computer program 56 (program product), a correction table 57, and required information.

[0016] The computer program 56 is an application program that operates on the ripple value correction device 50. Specifically, it realizes each function of the ripple value correction device 50. The computer program 56 may be downloaded from an external device via the communication unit 54 and stored in the storage unit 55. Also, the computer program 56 recorded on a recording medium (for example, an optical readable disk storage medium such as a CD-ROM) may be read by a recording medium reading unit and stored in the storage unit 55. The computer program 56 can be deployed to be executed on a single computer, or arranged at one site, or distributed across multiple sites and interconnected by a communication network on multiple computers. Details of the correction table 57 will be described later.

[0017] The memory 53 can be composed of a semiconductor memory such as SRAM (Static Random Access Memory), DRAM (Dynamic Random Access Memory), or flash memory. The computer program 56 can be deployed in the memory 53 so that the control unit 51 can execute the computer program 56. The control unit 51 can execute the processing defined by the computer program 56. That is, the processing by the control unit 51 is also the processing by the computer program 56.

[0018] FIG. 2 is a diagram showing an example of the correction table 57. The correction table 57 is for correcting (converting) the ripple value of the electrolytic capacitor 110 to the ripple value at the reference temperature. The correction unit that corrects the ripple value of the electrolytic capacitor 110 at the ambient temperature measured or detected to the ripple value at the reference temperature may be the correction table 57, or may be a correction arithmetic expression for correction. Hereinafter, in this specification, the correction unit will be described as the correction table 57.

[0019] As shown in FIG. 2, the correction table 57 is composed of a temperature column and a correction coefficient column corresponding to the temperature. In the example of FIG. 2, the correction coefficients are 0.80, 0.83, 0.86, 0.90, 0.95, and 1.00 for temperatures of 40°C, 30°C, 20°C, 10°C, 0°C, and -10°C, respectively. The correction coefficient 1 is the correction coefficient at the reference temperature. In the example of FIG. 2, the reference temperature is -10°C. The correction table 57 is correction information that defines, for each temperature, a correction coefficient that is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at the reference temperature for any reference temperature within a temperature range (in the example of FIG. 2, the temperature range of -10°C to 40°C) defined by a plurality of temperatures. The reference temperature can be set to any temperature.

[0020] The correction coefficient is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at the reference temperature. For example, since the correction coefficient at 40°C is 0.80, the ratio of the ripple value at 40°C to the ripple value at the reference temperature (0°C) is 0.80. Conversely, if the ripple value at 40°C is multiplied by 1 / 0.80, the ripple value at the reference temperature (0°C) can be obtained. If the ripple value at 40°C is 0.020 (V), the ripple value at the reference temperature (0°C) is 0.020×(1 / 0.8) = 0.025 (V).

[0021] As described above, the control unit 51 can acquire the ripple value and the ambient temperature of the electrolytic capacitor 110 included in the power supply mechanism 100, and correct the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, and the correction table 57 (correction information).

[0022] With the above configuration, regardless of the ambient temperature of the electrolytic capacitor 110 of the power supply mechanism 100, the measured or detected ripple value of the electrolytic capacitor 110 can be corrected to the ripple value at the required reference temperature. As a result, the ripple value at the same temperature (reference temperature) can be obtained regardless of the ambient temperature of the electrolytic capacitor 110. Further, even when determining the degradation characteristics and life of the power supply mechanism 100 or the electrolytic capacitor 110 using the ripple value of the electrolytic capacitor 110, degradation diagnosis and degradation prediction can be performed at the same reference temperature.

[0023] That is, ripple is affected by the ESR (equivalent series resistance) of the capacitor. Also, since the characteristics of the ESR of the capacitor change not only due to the ambient temperature but also due to degradation, it affects the ripple. Although it is sufficient to prepare in advance the relationship between temperature and ESR due to degradation, it is difficult to obtain prior information on capacitor degradation. Further, since the types of power supply mechanisms and capacitors used in the power supply mechanism often differ, it is not practical to prepare in advance the relationship information of ESR due to temperature and degradation, and even if fixed ESR relationship information is prepared, it cannot be applied to power supply mechanisms and capacitors used in various operation modes.

[0024] However, in the present embodiment, as described above, the control unit 51 acquires the ripple value and the ambient temperature of the electrolytic capacitor 110 included in the power supply mechanism 100, and based on the acquired ripple value and ambient temperature, and the correction table 57 (correction information), corrects the ripple value at the ambient temperature to the ripple value at the reference temperature. Therefore, it is possible to omit the acquisition of prior information by using the ripple itself that is affected by temperature and degradation as a correction coefficient, and by updating the information on the correction coefficient while operating the power supply mechanism, the applicable temperature range of the correction table 57 can be expanded, and it becomes possible to update the correction coefficient generated over the past, enabling degradation prediction at an arbitrary temperature.

[0025] Next, a method for generating the correction table 57 will be described.

[0026] FIG. 3 is a diagram showing an example of a method for generating the correction table 57. The ambient temperature around the electrolytic capacitor 110 and the ripple value at the same ambient temperature are collected at the timing during the operation or test of the power supply mechanism 100. As shown in FIG. 3, the ripple values (Vr) collected for each temperature are, for example, 0.0252, 0.0228,... for the ripple value at an ambient temperature of 0°C, 0.0236, 0.0220,... for the ripple value at an ambient temperature of 10°C, and 0.0228, 0.0208,... for the ripple value at an ambient temperature of 20°C.

[0027] Next, for each ambient temperature, the statistical value of the collected ripple values is calculated. The statistical value may be an average value, a median value, or a mode value. In the example of FIG. 3, the statistical value is the average value. The average ripple value at an ambient temperature of 0°C is 0.0252, the average ripple value at an ambient temperature of 10°C is 0.0228, and the average ripple value at an ambient temperature of 20°C is 0.0216.

[0028] Next, the correction coefficient at the reference temperature is set to 1, and the correction coefficients for temperatures other than the reference temperature are calculated. In the example of FIG. 3, the ambient temperature of 0°C is set as the reference temperature. Note that any temperature can be set as the reference temperature. Since the correction coefficient at an ambient temperature of 10°C is the ratio of the ripple value at an ambient temperature of 10°C to the ripple value at the reference temperature, it is 0.905 (=0.0228 / 0.0252). Similarly, since the correction coefficient at an ambient temperature of 20°C is the ratio of the ripple value at an ambient temperature of 20°C to the ripple value at the reference temperature, it is 0.857 (=0.0216 / 0.0252).

[0029] As described above, the control unit 51 collects the ripple values at different times of the electrolytic capacitor 110 for each of a plurality of ambient temperatures, and calculates the statistical value of the ripple values based on the collected ripple values. The control unit 51 can calculate the ratio of the statistical value of the ripple value at an ambient temperature other than the ambient temperature to the statistical value of the ripple value at an arbitrary ambient temperature in the temperature range defined by the plurality of ambient temperatures, and generate the correction table 57 based on the calculated ratio.

[0030] With the above configuration, the correction table 57 can be generated simply by collecting the ambient temperature around the electrolytic capacitor 110 and the ripple value at that ambient temperature during the operation or testing of the power supply mechanism 100. Also, a required temperature among the collected ambient temperatures can be set as the reference temperature. Depending on the operating environment and application of the power supply mechanism 100, a temperature optimal for deterioration diagnosis and deterioration prediction can be set as the reference temperature.

[0031] Next, the extensibility of the correction table 57 will be described.

[0032] FIG. 4 is a diagram showing an example of an extension method for the correction table 57. The extension method for the correction table 57 is to extend the correction coefficient for a new temperature range with respect to the current correction table 57. As shown in FIG. 4, assume that the temperature range of the current correction table is 0°C to 20°C and the correction coefficient in that temperature range is known. If the ripple values at -10°C and 0°C are newly collected due to the operation of the power supply mechanism 100 or the like, the correction coefficient for the temperature range of -10°C to 0°C can be calculated. In the example of FIG. 4, the correction coefficient is set to 1 with -10°C as the reference temperature, and the correction coefficient at 0°C is 0.87.

[0033] Based on the known correction table up to now and the correction coefficient (data) in the new temperature range, a new correction table with the temperature range extended from 0°C to 20°C to -10°C to 20°C can be generated. Specifically, since the correction coefficient at 0°C is 0.87 with respect to the correction coefficient of 1 at the reference temperature of -10°C, by multiplying the correction coefficient for 10°C relative to 0°C by 0.87 and the correction coefficient for 20°C relative to 10°C by 0.87, the correction coefficients of the new correction table for -10°C, 0°C, 10°C, and 20°C are 1, 0.87, 0.78735, and 0.74559, respectively. Note that the number of digits of the correction coefficient may be unified.

[0034] As described above, the control unit 51 acquires the ripple values at a plurality of peripheral temperatures of the electrolytic capacitor 110, and when a new temperature range defined by the acquired peripheral temperature is not included in the correction table 57, the correction coefficient which is the ratio of the ripple value at the acquired peripheral temperature and based on the correction coefficient included in the correction table 57, it is possible to generate a correction table 57 including the new temperature range.

[0035] With the above-described configuration, since the correction table 57 is generated only within the range of the operating temperature range using the ripple value acquired during the operation of the power supply mechanism 100, it is not necessary to acquire the ripples at all temperatures (for example, the operating temperature range of the power supply mechanism 100) in advance and generate the correction table 57. In other words, it becomes possible to expand the temperature range of the correction table 57 at any time using the ripple value at the temperature that can be acquired during operation.

[0036] Next, the aging change of the power supply mechanism 100 (electrolytic capacitor 110) will be described.

[0037] FIG. 5 is a diagram showing an example of the aging change of the ripple value of the electrolytic capacitor 110. When the electrolytic capacitor 110 is continuously used, the ripple value increases due to the characteristic deterioration of the electrolytic capacitor 110. As shown in FIG. 5, as the deterioration progresses from the initial stage, deterioration 1, deterioration 2, and deterioration 3, the ripple value (Vr) increases. Further, as the deterioration of the electrolytic capacitor 110 progresses, the ripple value is greatly affected by the temperature displacement. As shown in FIG. 5, it can be seen that as the electrolytic capacitor 110 deteriorates, the fluctuation of the ripple value with respect to the temperature change becomes large, and as a result, the rate of change (slope) of the correction coefficient becomes large.

[0038] That is, since the ripple value of the electrolytic capacitor 110 is greatly affected by the temperature fluctuation as the electrolytic capacitor 110 deteriorates, it is not possible to continuously use the correction table 57 (correction coefficient) generated in the initial state of the electrolytic capacitor 110 fixedly. It is necessary to update the correction coefficient accompanying the deterioration of the electrolytic capacitor 110. Hereinafter, a method for updating the correction table 57 (correction coefficient) will be described.

[0039] FIG. 6 is a diagram showing a first example of a method for updating the correction table 57. The correction coefficients for temperatures of -10°C, 0°C, 10°C, 20°C, 30°C, 40°C, 50°C, and 60°C in the correction table 57 before update are set to 1.000, 0.856, 0.774, 0.712, 0.692, 0.658, 0.644, and 0.630, respectively. Assuming that a predetermined update period has elapsed since the most recent update of the correction table 57, the measured data collected for updating the correction table 57 are set to ripple values of 0.0352 and 0.0296 at temperatures of 0°C and 10°C, respectively. The update period can be set as appropriate, for example, it can be 1 month, 2 months, 3 months, 6 months, etc.

[0040] At the time of update, that is, in the latest deterioration state of the electrolytic capacitor 110, it can be seen that the relationship between the ripple value at 0°C and the ripple value at 10°C is 0.0352:0.0296 = 1:0.841. Here, 0.841 = 0.0296 / 0.0352. Also, in the deterioration state of the electrolytic capacitor 110 at the time of the most recent update, since the relationship between the ripple value at 0°C and the ripple value at 10°C is equivalent to the relationship between the correction coefficients, it can be seen that 0.856:0.774 = 1:0.904. That is, due to the progress of the deterioration state of the electrolytic capacitor 110, the ratio of the correction coefficients between 0°C and 10°C has become smaller by 0.841 / 0.904 times.

[0041] Therefore, the correction coefficients of the updated correction table 57 can be calculated by multiplying the ratio of the correction coefficients between adjacent temperatures in the correction table 57 before update by 0.841 / 0.904. For example, as shown in FIG. 6, since the ratio of the correction coefficient of 0°C with respect to -10°C in the correction table 57 before update is 0.856, the correction coefficient of 0°C with respect to -10°C in the updated correction table 57 is 1.000 × 0.856 × (0.841 / 0.904) = 0.796.

[0042] Since the ratio of the correction coefficient of 10°C with respect to 0°C in the correction table 57 before update is 0.904, the correction coefficient of 10°C with respect to 0°C in the updated correction table 57 is 0.796 × 0.904 × (0.841 / 0.904) = 0.670.

[0043] Since the ratio of the correction coefficient of 20°C to 10°C in the correction table 57 before update is 0.919, the correction coefficient of 20°C to 10°C in the updated correction table 57 is 0.670 × 0.919 × (0.841 / 0.904) = 0.573. The same applies hereinafter.

[0044] As described above, the control unit 51 acquires the ripple values at a plurality of ambient temperatures of the electrolytic capacitor 110 after aging. In the example of FIG. 6, the ripple values at temperatures of 0°C and 10°C are acquired. The control unit 51 can update the correction table 57 after aging based on the correction coefficient (in the example of FIG. 6, 0.841), which is the ratio of the ripple values (in the example of FIG. 6, 0.0352, 0.0296) at the ambient temperatures within the temperature range (in the example of FIG. 6, 0°C to 10°C) defined by the acquired ambient temperatures, and the correction coefficient included in the correction table 57 before update within the temperature range (in the example of FIG. 6, 0.904).

[0045] More specifically, the control unit 51 can update the correction coefficient within the temperature range (in the example of FIG. 6, 0°C to 10°C) included in the correction table 57 based on the correction coefficient, which is the ratio of the ripple values at the ambient temperatures within the temperature range (in the example of FIG. 6, 0°C to 10°C) defined by the acquired ambient temperatures, and the correction coefficient included in the correction table 57 before update within the temperature range.

[0046] In addition, the control unit 51 can update the correction coefficient within the other temperature range (in the example of FIG. 6, -10°C to 0°C, 10°C to 60°C) included in the correction table 57 based on the correction coefficient, which is the ratio of the ripple values at the ambient temperatures within the temperature range (in the example of FIG. 6, 0°C to 10°C) defined by the acquired ambient temperatures, and the correction coefficient included in the correction table 57 before update within the other temperature range (in the example of FIG. 6, -10°C to 0°C, 10°C to 60°C).

[0047] With the above configuration, even when it is difficult to collect ripple values at all temperatures of the correction table 57 during the operation of the power supply mechanism 100, it is possible to update the correction table 57 to the latest one that reflects the deterioration state of the electrolytic capacitor 110 by using the ripple values at the temperatures that could be collected during operation.

[0048] FIG. 7 is a diagram showing a second example of the method for updating the correction table 57. In the first example shown in FIG. 6, the temperatures that could be collected during operation were two points (0°C and 10°C). However, in the second example, the method for updating the correction table 57 when ripple values at three or more temperatures could be collected will be described.

[0049] Assume that the correction table 57 before update is the same as in the case of FIG. 6. The measured data collected for updating the correction table 57 are the ripple values 0.0352, 0.0296, 0.0260, and 0.0232 at temperatures 0°C, 10°C, 20°C, and 30°C, respectively.

[0050] At the time of update, that is, in the latest deterioration state of the electrolytic capacitor 110, it can be seen that the relationship between the ripple value at 0°C and the ripple value at 10°C is 0.0352:0.0296 = 1:0.841. Here, 0.841 = 0.0296 / 0.0352. Also, it can be seen that the relationship between the ripple value at 10°C and the ripple value at 20°C is 0.0296:0.0260 = 1:0.878. Here, 0.878 = 0.0260 / 0.0296. Similarly, it can be seen that the relationship between the ripple value at 20°C and the ripple value at 30°C is 0.0260:0.0232 = 1:0.892. Here, 0.892 = 0.0232 / 0.0260.

[0051] In the update method illustrated in FIG. 6, the correction coefficient was multiplied by the same ratio (0.841 / 0.904 times) for all temperatures of the correction table 57 before the update. However, in the second example, the ratio is changed according to the temperature range. Specifically, among the correction coefficients of the correction table 57 before the update, for the correction coefficients at temperatures lower than the temperature range of the collected measured data (-10°C to 0°C), the ripple values at the two lowest temperatures among the collected measured data are used. Also, among the correction coefficients of the correction table 57 before the update, for the correction coefficients at temperatures higher than the temperature range of the collected measured data (30°C to 60°C), the ripple values at the two highest temperatures among the collected measured data are used.

[0052] First, the low-temperature side will be explained. At the time of update, that is, in the latest deterioration state of the electrolytic capacitor 110, it can be seen that the relationship between the ripple value at 0°C and the ripple value at 10°C is 0.0352:0.0296 = 1:0.841. Here, 0.841 = 0.0296 / 0.0352. Also, in the deterioration state of the electrolytic capacitor 110 at the most recent update time, since the relationship between the ripple value at 0°C and the ripple value at 10°C is equivalent to the relationship between the correction coefficients, it can be seen that 0.856:0.774 = 1:0.904. That is, due to the progress of the deterioration state of the electrolytic capacitor 110, the ratio of the correction coefficients between 0°C and 10°C has become smaller, being 0.841 / 0.904 times.

[0053] Therefore, the correction coefficient of the corrected table 57 after the update can be calculated by setting the ratio of the correction coefficients between adjacent temperatures of the correction table 57 before the update to 0.841 / 0.904 times. For example, as shown in FIG. 6, since the ratio of the correction coefficient of 0°C with respect to -10°C in the correction table 57 before the update is 0.856, the correction coefficient of 0°C with respect to -10°C in the correction table 57 after the update is 1.000×0.856×(0.841 / 0.904) = 0.796.

[0054] Similarly, since the ratio of the correction coefficient of 10°C with respect to 0°C in the correction table 57 before the update is 0.904, the correction coefficient of 10°C with respect to 0°C in the correction table 57 after the update is 0.796×0.904×(0.841 / 0.904) = 0.670.

[0055] Next, the high-temperature side will be described. At the time of update, that is, in the latest deterioration state of the electrolytic capacitor 110, it can be seen that the relationship between the ripple value at 20°C and the ripple value at 30°C is 0.0260:0.0232 = 1:0.892. Here, 0.892 = 0.0232 / 0.0260. Also, in the deterioration state of the electrolytic capacitor 110 at the most recent update time, since the relationship between the ripple value at 20°C and the ripple value at 30°C is equivalent to the relationship between the correction coefficients, it can be seen that 0.712:0.692 = 1:0.972. That is, due to the progress of the deterioration state of the electrolytic capacitor 110, the ratio of the correction coefficients between 20°C and 30°C has become smaller by 0.892 / 0.972 times.

[0056] Therefore, the correction coefficients of the updated correction table 57 can be calculated by multiplying the ratio of the correction coefficients between adjacent temperatures in the correction table 57 before update by 0.892 / 0.972. For example, as shown in FIG. 6, since the ratio of the correction coefficient of 40°C with respect to 30°C in the correction table 57 before update is 0.951, the correction coefficient of 40°C with respect to 30°C in the updated correction table 57 is 0.525 × 0.951 × (0.892 / 0.972) = 0.458. The same applies to other temperatures.

[0057] As described above, when the control unit 51 includes a low-temperature zone (in the example of FIG. 7, -10°C to 10°C) that is lower than the temperature zone (in the example of FIG. 7, 0°C to 30°C) defined by the acquired ambient temperature in the correction table 57, the control unit 51 can update the correction coefficients in the low-temperature zone included in the correction table 57 based on the correction coefficients that are the ratios of the ripple values at the plurality of lowest ambient temperatures (in the example of FIG. 7, 0°C and 10°C) in the temperature zone and the correction coefficients included in the correction table 57 in the low-temperature zone.

[0058] In addition, when the control unit 51 determines that a high temperature range (in the example of FIG. 7, 20° C. to 60° C.), which is higher than the temperature range (in the example of FIG. 7, 0° C. to 30° C.) defined by the acquired ambient temperature, is included in the correction table 57, the control unit 51 can update the correction coefficient in the high temperature range included in the correction table 57 based on the correction coefficient that is the ratio of the ripple values at a plurality of the highest ambient temperatures (in the example of FIG. 7, 20° C. and 30° C.) in the temperature range and the correction coefficient included in the correction table 57 in the high temperature range.

[0059] For temperature ranges other than the low temperature range and the high temperature range (in the example of FIG. 7, 10° C. to 20° C.), the ratio of the ripple values between the temperatures of the collected measured data may be used as it is.

[0060] With the above-described configuration, the correction coefficient, which is the ratio of the ripple values based on the collected measured data, can be set to an appropriate value for different temperature ranges, and the correction table 57 including the appropriate correction coefficient can be updated.

[0061] FIG. 8 is a diagram showing a third example of the method for updating the correction table 57. In the update methods of the first and second examples described above, the temperature range of the collected measured data is included in the temperature range of the correction table 57 before the update. The third example shown in FIG. 8 is a case where the temperature range of the collected measured data is not included in the temperature range of the correction table 57 before the update.

[0062] As shown in FIG. 8, assume that the temperature range included in the past correction table 57 is 0° C. to 30° C., and the temperatures of the collected measured data are 30° C. and 40° C. In such a case, using the ratio of the ripple value at 40° C. to the ripple value at 30° C. of the collected measured data, multiply the correction coefficient 0.90 at 30° C. in the past correction table by the ratio of the ripple values to calculate the correction coefficient at 40° C. in the past correction table. The updated correction table 57 may be calculated using the same method as the method described in FIG. 6, using the correction coefficient of the past correction table 57 and the ratio of the ripple values in the collected measured data.

[0063] As described above, when the temperature range defined by the acquired ambient temperature is not included in the correction table 57, the control unit 51 can update the correction coefficient included in the correction table 57 so as to include the temperature range based on the correction coefficient included in the correction table 57 and the correction coefficient which is the ratio of the ripple value at the ambient temperature.

[0064] With the above configuration, by collecting the ripple value in a new temperature range not included in the correction table 57 before the update, the correction table 57 can be updated while expanding the temperature range of the correction table 57.

[0065] If there is an error in the measured data for updating the correction table 57, the correction coefficient cannot be calculated correctly, and the correction of the ripple value cannot be performed correctly. Therefore, as the measured data of the ripple value, the ripple value for the required period can be collected, and the influence of inappropriate temporary or transient ripple values can be reduced by using the statistical value of the collected ripple values. The statistical value may be an average value, a median value, or a mode value. The update frequency of the correction table 57 can be, for example, once a month, once every two months, once every three months, once every six months, etc., but it is preferably updated once a month.

[0066] In the operating state of the power supply mechanism 100, since the ambient temperature of the electrolytic capacitor 110 continuously changes, it is considered that the ripple value and the ambient temperature can be constantly collected during the operation period of the power supply mechanism 100, and the ripple value at the temperature included in the correction table 57 before the update can be collected. However, when the ripple value at a temperature not included in the correction table 57 before the update is collected, the correction coefficient may not be updated, and interpolation processing is required.

[0067] FIG. 9 is a diagram showing an example of interpolation processing. As shown in FIG. 9, the temperatures of the correction table before update are set to 10°C, 20°C, 30°C, 40°C, 50°C, and 60°C. Assume that the collected measured data has only ripple values at -10°C and 0°C. The temperature of the collected measured data is not included in the temperature of the correction table 57 before update. In such a case, the temperature of the measured data closest to the temperature of the correction table 57 before update is used. Specifically, the correction table 57 can be updated using the ripple value at 10°C in the immediately previous correction table 57 before update and the ripple value at 0°C in the measured data.

[0068] FIG. 10 is a diagram showing an example of deterioration determination of the power supply mechanism 100 or the electrolytic capacitor 110. In FIG. 10, the horizontal axis represents time, and the vertical axis represents the ripple voltage (ripple value). The control unit 51 can determine the deterioration of the electrolytic capacitor 110 or the power supply mechanism 100 based on the corrected ripple value. As shown in FIG. 10, it is assumed that the life is reached when the ripple voltage becomes equal to or higher than the threshold value. Generally, the lower the temperature, the larger the ripple voltage, and the higher the temperature, the smaller the ripple voltage. Therefore, when the ripple voltage is compared with the threshold value under conditions where the ambient temperature is relatively low, it may be determined that the life has been reached even though the life has not actually been reached. Conversely, when the ripple voltage is compared with the threshold value under conditions where the ambient temperature is relatively high, it may be determined that the life has not been reached even though the life has actually been reached.

[0069] According to the present embodiment, since the ripple value is corrected to the ripple value at the reference temperature, deterioration diagnosis and deterioration prediction can always be performed at the same temperature.

[0070] (Appendix 1) The ripple value correction device includes a control unit. The control unit acquires the ripple value and the ambient temperature of the electrolytic capacitor included in the power supply mechanism, and based on the acquired ripple value and ambient temperature, and correction information that defines a correction coefficient for each temperature, which is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures, corrects the ripple value at the ambient temperature to the ripple value at the reference temperature.

[0071] (Appendix 2) In Appendix 1, the control unit of the ripple value correction device collects the ripple values of the electrolytic capacitor at different times for each of a plurality of ambient temperatures, calculates a statistical value of the ripple values based on the collected ripple values, and calculates a ratio of the statistical value of the ripple values at other ambient temperatures other than the ambient temperature to the statistical value of the ripple values at an arbitrary ambient temperature within the temperature range defined by the plurality of ambient temperatures, and generates the correction information based on the calculated ratio.

[0072] (Appendix 3) In Appendix 1 or Appendix 2, the control unit of the ripple value correction device acquires the ripple values of the electrolytic capacitor at a plurality of ambient temperatures, and when the temperature range defined by the acquired ambient temperatures is not included in the correction information, generates correction information including the temperature range based on the correction coefficient which is the ratio of the ripple values at the acquired ambient temperatures and the correction coefficient included in the correction information.

[0073] (Appendix 4) In any one of Appendix 1 to Appendix 3, the control unit of the ripple value correction device acquires the ripple values of the electrolytic capacitor at a plurality of ambient temperatures after aging, and updates the correction information after aging based on the correction coefficient which is the ratio of the ripple values at the ambient temperatures within the temperature range defined by the acquired ambient temperatures and the correction coefficient included in the correction information for the temperature range.

[0074] (Appendix 5) In any one of Appendix 1 to Appendix 4, the control unit of the ripple value correction device updates the correction coefficient for the temperature range included in the correction information based on the correction coefficient which is the ratio of the ripple values at the ambient temperatures within the temperature range defined by the acquired ambient temperatures and the correction coefficient included in the correction information for the temperature range.

[0075] (Appendix 6) In any one of Appendix 1 to Appendix 5, the control unit of the ripple value correction device updates the correction coefficient for the other temperature range included in the correction information based on the correction coefficient which is the ratio of the ripple values at the ambient temperatures within the temperature range defined by the acquired ambient temperatures and the correction coefficient included in the correction information for the other temperature range other than the temperature range.

[0076] (Appendix 7) In any one of Appendices 1 to 6, when the control unit of the ripple value correction device includes a low temperature range lower than the temperature range defined by the acquired ambient temperature in the correction information, the control unit determines, based on a correction coefficient that is the ratio of ripple values at a plurality of the lowest ambient temperatures in the temperature range and the correction coefficient included in the correction information in the low temperature range, the correction coefficient in the low temperature range included in the correction information is updated.

[0077] (Appendix 8) In any one of Appendices 1 to 7, when the control unit of the ripple value correction device includes a high temperature range higher than the temperature range defined by the acquired ambient temperature in the correction information, the control unit determines, based on a correction coefficient that is the ratio of ripple values at a plurality of the highest ambient temperatures in the temperature range and the correction coefficient included in the correction information in the high temperature range, the correction coefficient in the high temperature range included in the correction information is updated.

[0078] (Appendix 9) In any one of Appendices 1 to 8, when the temperature range defined by the acquired ambient temperature is not included in the correction information, the control unit determines, based on the correction coefficient included in the correction information and the correction coefficient that is the ratio of the ripple value at the ambient temperature, the correction coefficient included in the correction information is updated to include the temperature range.

[0079] (Appendix 10) In any one of Appendices 1 to 9, the control unit of the ripple value correction device determines the deterioration of the electrolytic capacitor or the power supply mechanism based on the corrected ripple value.

[0080] (Appendix 11) A computer program causes a computer to execute a process of acquiring a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, correcting the ripple value at the ambient temperature to the ripple value at a reference temperature based on the acquired ripple value and ambient temperature, and correction information that defines, for each temperature, a correction coefficient that is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature of a temperature range defined by a plurality of temperatures.

[0081] (Appendix 12) The ripple value correction method acquires the ripple value and the ambient temperature of the electrolytic capacitor included in the power supply mechanism, and based on the acquired ripple value and ambient temperature, and correction information that defines, for each temperature, a correction coefficient that is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature within the temperature range defined by a plurality of temperatures, corrects the ripple value at the ambient temperature to the ripple value at the reference temperature.

[0082] (Appendix 13) The ripple value correction system includes the aforementioned ripple value correction device and a power supply mechanism including an electrolytic capacitor.

[0083] The matters described in each embodiment can be combined with each other. Also, the independent claims and dependent claims described in the claims can be combined with each other in all possible combinations regardless of the citation form. Furthermore, although the claims use a form (multi-claim form) that describes claims that cite two or more other claims, it is not limited to this. A form that describes a multi-claim (multi-multi-claim) that cites at least one multi-claim may be used.

Description of Reference Numerals

[0084] 50 Ripple value correction device 51 Control unit 52 Acquisition unit 53 Memory 54 Communication unit 55 Storage unit 56 Computer program 57 Correction table 100 Power supply mechanism 110 Electrolytic capacitor

Claims

1. comprising a control unit, wherein the control unit acquires a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, and corrects the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, and correction information that defines a correction coefficient for each temperature, which is a ratio of the ripple value at a temperature other than the reference temperature to the ripple value at the reference temperature at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures. A ripple value correction device.

2. The control unit collects ripple values of the electrolytic capacitor at different times for each of a plurality of ambient temperatures, calculates a statistical value of the ripple values based on the collected ripple values, calculates a ratio of the statistical value of the ripple values at an ambient temperature other than the ambient temperature to the statistical value of the ripple values at an arbitrary ambient temperature in a temperature range defined by the plurality of ambient temperatures, and generates the correction information based on the calculated ratio. The ripple value correction device according to claim 1.

3. The control unit acquires ripple values of the electrolytic capacitor at a plurality of ambient temperatures, and when a temperature range defined by the acquired ambient temperatures is not included in the correction information, generates correction information including the temperature range based on a correction coefficient that is a ratio of the ripple values at the acquired ambient temperatures and the correction coefficients included in the correction information. The ripple value correction device according to claim 1.

4. The control unit acquires ripple values of the electrolytic capacitor at a plurality of ambient temperatures after aging, and updates the correction information after aging based on a correction coefficient that is a ratio of the ripple values at the ambient temperatures in the temperature range defined by the acquired ambient temperatures and the correction coefficients included in the correction information for the temperature range. The ripple value correction device according to any one of claims 1 to 3.

5. The control unit updates the correction coefficient in the temperature range included in the correction information based on a correction coefficient that is a ratio of the ripple values at the ambient temperatures in the temperature range defined by the acquired ambient temperatures and the correction coefficients included in the correction information for the temperature range. The ripple value correction device according to claim 4.

6. The control unit updates the correction coefficient in the other temperature range included in the correction information based on a correction coefficient that is a ratio of the ripple values at the ambient temperatures in the temperature range defined by the acquired ambient temperatures and the correction coefficients included in the correction information for a temperature range other than the temperature range. The ripple value correction device according to claim 4.

7. The control unit When a low temperature range lower than the temperature range defined by the acquired ambient temperature is included in the correction information, based on a correction coefficient that is the ratio of ripple values at a plurality of the lowest ambient temperatures in the temperature range and the correction coefficient included in the correction information for the low temperature range, update the correction coefficient for the low temperature range included in the correction information. The ripple value correction device according to claim 4.

8. The control unit When a high temperature range higher than the temperature range defined by the acquired ambient temperature is included in the correction information, based on a correction coefficient that is the ratio of ripple values at a plurality of the highest ambient temperatures in the temperature range and the correction coefficient included in the correction information for the high temperature range, update the correction coefficient for the high temperature range included in the correction information. The ripple value correction device according to claim 4.

9. The control unit When the temperature range defined by the acquired ambient temperature is not included in the correction information, based on the correction coefficient included in the correction information and the correction coefficient that is the ratio of the ripple value at the ambient temperature, update the correction coefficient included in the correction information so as to include the temperature range. The ripple value correction device according to claim 4.

10. The control unit Determine the deterioration of the electrolytic capacitor or the power supply mechanism based on the corrected ripple value. The ripple value correction device according to any one of claims 1 to 3.

11. Acquire the ripple value and ambient temperature of the electrolytic capacitor included in the power supply mechanism, Based on the acquired ripple value and ambient temperature, and correction information that defines, for each temperature, a correction coefficient that is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature of a temperature range defined by a plurality of temperatures, correct the ripple value at the ambient temperature to the ripple value at the reference temperature. A computer program that causes a computer to execute the processing.

12. Acquire the ripple value and ambient temperature of the electrolytic capacitor included in the power supply mechanism, Based on the acquired ripple value and ambient temperature, and correction information that defines, for each temperature, a correction coefficient that is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at an arbitrary reference temperature of a temperature range defined by a plurality of temperatures, correct the ripple value at the ambient temperature to the ripple value at the reference temperature. A ripple value correction method.

13. The ripple value correction device according to any one of claims 1 to 3, A power supply mechanism including an electrolytic capacitor Comprising A ripple value correction system.

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