Impact test apparatus, impact test method, abnormality detection device, and refractory thickness measurement method

Abstract

To provide an impact test apparatus and an impact test method capable of detecting an abnormality in an impact device, as well as an abnormality detection device and a refractory thickness measurement method for the impact device.SOLUTION: An impact test apparatus for performing an impact test on an impact test target comprises an impact device that excites the impact test target and outputs an excitation signal, and a computing device that collects data of the excitation signal and performs calculations on the collected data. The computing device detects an abnormality of the impact device by using an indicator of a normal state obtained from characteristic quantities extracted from the waveform of the excitation signal output by the impact device.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to an impact testing device and an impact testing method used, for example, to measure the thickness of furnace refractories, as well as an abnormality detection device for the impact device and a refractory thickness measurement method. [Background technology]

[0002] The furnace walls of industrial furnaces, such as blast furnaces, typically have a multi-layer structure consisting of, from the outside, a steel shell, monolithic refractories, and the primary refractory material, firebricks. The innermost firebricks wear away from the core, and cracks inside the firebricks shorten the furnace's lifespan. Therefore, measuring the thickness of the firebricks and clarifying their internal condition are extremely important for furnace maintenance. The hearth of a blast furnace, in particular, is constantly exposed to molten iron, even during refrigeration shutdowns, and therefore suffers from severe wear. Furthermore, direct repair is impossible during the decades the furnace is in operation. Accurately measuring the thickness of the refractory material during operation and clarifying the internal condition of the firebricks can enable the detection of abnormalities during operation, the optimization of furnace operation to extend the furnace's lifespan, and the accurate prediction of furnace lifespan and refurbishment timing.

[0003] As a method for measuring the thickness of refractory, Patent Document 1 describes a method for measuring the thickness of refractory by an impact elastic wave resonance method. The method described in Patent Document 1 involves frequency analysis of the measured signal and converting the peak frequency into the remaining thickness of the brick. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 8-219751 Summary of the Invention [Problem to be solved by the invention]

[0005] In the impact acoustic wave resonance method, the frequency characteristics of the input signal must correspond to the expected frequency band of the received signal, but the hammer used as the input device for the impact acoustic wave resonance method becomes deformed or damaged as measurements continue, causing changes in the frequency characteristics and excitation force. However, the method described in Patent Document 1 does not take into account changes in the frequency characteristics and excitation force of the impact device, and as measurements are repeated, the upper limit frequency of the input signal decreases, preventing the appearance of a peak corresponding to the remaining thickness, making it impossible to measure the remaining thickness.

[0006] Therefore, the present invention provides an impact testing device and an impact testing method that can detect an abnormality in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method. [Means for solving the problem]

[0007] In order to solve the above problems, the present invention provides the following [1] to

[19] .

[0008] [1] An impact test device for performing an impact test on an impact test object, an impact device that vibrates the impact test object and outputs an excitation signal; a computing device that collects data of the excitation signal and calculates the collected data; and The computing device detects an abnormality in the impact device based on an index of a normal state obtained from a feature extracted from a waveform of a vibration signal output by the impact device.

[0009] [2] The impact testing device according to [1], wherein the impact device impacts the impact object at least once, and the calculation device uses the feature value obtained from the single impact or the statistics of the feature values ​​obtained from multiple impacts as an indicator of the normal state.

[0010] [3] The impact test device according to [2], wherein the statistical value of the feature is at least one of the average, median, maximum, and minimum values ​​of the plurality of feature values ​​obtained from the plurality of impacts.

[0011] [4] The computing device is The impact testing device according to [1], wherein the feature quantity is either a contact time between the impact device and the impact test object calculated from the excitation signal, or a maximum value of the excitation signal, or both.

[0012] [5] The computing device is a normal state indicator acquisition unit that acquires either or both of a normal value of the contact time and a normal value of the maximum value of the vibration signal by striking the strike test object with the striking device in a normal state; a storage unit that stores either or both of the normal value of the contact time and the normal value of the maximum value of the vibration signal in association with a set collision speed between the impact device and the impact test object; an abnormality detection unit that detects an abnormality in the impact device based on either or both of the difference between a contact time obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the contact time in a normal state, and the difference between a maximum value of a vibration signal obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state; The impact test device according to [4],

[0013] [6] The impact test device described in [5], wherein the arithmetic unit further includes an abnormality prediction unit that calculates the time when an abnormality will occur in the impact device based on either or both of the following: the time progression of the difference between the contact time obtained by striking the impact test object with the impact device in an unknown state at the collision speed and the statistics of the contact time in a normal state; and the time progression of the difference between the maximum value of the excitation signal obtained by striking the impact test object with the impact device in an unknown state at the collision speed and the statistics of the maximum value of the excitation signal in a normal state.

[0014] [7] The impact testing device described in [5], wherein the arithmetic device further has a function setting unit that selects whether to execute processing by the normal state index acquisition unit or by the abnormality detection unit.

[0015] [8] The impact test device according to any one of [1] to [7], wherein the object to be impact tested has a refractory material, and the thickness of the refractory material is measured by vibrating the object to be impact tested.

[0016] [9] The impact testing device according to [8], wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

[0017]

[10] A method for performing a hit test on a hit test object, comprising: vibrating the impact test object with an impact device; acquiring and storing an index of a normal state obtained from a feature amount extracted from a waveform of the vibration signal output by the impact device; Detecting an abnormality in the impact device using the indicator; The impact test method has the following features.

[0018]

[11] An impact test device that vibrates an impact test object by an impact device and performs an impact test using the output vibration signal, and an abnormality detection device that detects an abnormality in the impact device, an anomaly detection device that collects data of the excitation signal, calculates the collected data, and detects an abnormality in the impact device based on an index of a normal state obtained from a feature amount extracted from a waveform of the excitation signal output by the impact device.

[0019]

[12] The anomaly detection device according to

[11] , wherein the impact device strikes the target at least once, and the feature value obtained from the single strike or the statistics of the feature values ​​obtained from multiple strikes is used as an indicator of the normal state.

[0020]

[13] The anomaly detection device according to

[12] , wherein the statistical value of the feature is at least one of the average, median, maximum, and minimum values ​​of the multiple feature values ​​obtained from the multiple hits.

[0021]

[14] The anomaly detection device according to

[11] , wherein the feature quantity is either the contact time between the impact device and the impact test object calculated from the excitation signal, or the maximum value of the excitation signal, or both.

[0022]

[15] A normal state indicator acquisition unit that acquires either or both of a normal value of the contact time and a normal value of the maximum value of the vibration signal by striking the strike test object with the strike device in a normal state; a storage unit that stores either or both of the normal value of the contact time and the normal value of the maximum value of the vibration signal in association with a set collision speed between the impact device and the impact test object; an abnormality detection unit that detects an abnormality in the impact device based on either or both of the difference between a contact time obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the contact time in a normal state, and the difference between a maximum value of a vibration signal obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state;

[14] The anomaly detection device according to

[14] ,

[0023]

[16] The anomaly detection device described in

[14] further includes an anomaly prediction unit that calculates the time when an abnormality will occur in the impact device based on either or both of the following: the time progression of the difference between the contact time obtained by striking the impact test object with the impact device in an unknown state at the collision speed and the statistics of the contact time in a normal state; and the time progression of the difference between the maximum value of the vibration signal obtained by striking the impact test object with the impact device in an unknown state at the collision speed and the statistics of the maximum value of the vibration signal in a normal state.

[0024]

[17] The abnormality detection device according to

[14] , further comprising a function setting unit for selecting whether to execute processing by the normal state index acquisition unit or processing by the abnormality detection unit.

[0025]

[18] A method for measuring the thickness of a refractory material, comprising: vibrating an impact test object having a refractory material using the impact test apparatus according to any one of [1] to [7] above; and measuring the thickness of the refractory material.

[0026]

[19] The method for measuring the thickness of a refractory material according to

[18] , wherein the thickness of the refractory material is measured by an impact elastic wave resonance method. [Effects of the Invention]

[0027] According to the present invention, there are provided an impact test device and an impact test method that can detect an abnormality in the impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method, which enable degradation of the impact device to be detected quickly and prevent measurement errors due to degradation of the impact device during an impact test. [Brief explanation of the drawings]

[0028] [Figure 1] 1 is a functional block diagram showing an impact test device according to a first embodiment of the present invention. [Figure 2] FIG. 10 is a diagram showing an example of the time progression of the excitation force generated when a normal impact device impacts an impact test object at a collision velocity v. [Figure 3] FIG. 10 is a diagram showing an example of the time progression of the excitation force output by the excitation force measuring unit when an impact test object is struck at a collision velocity v using the impact unit of the impact device that has softened due to deterioration. [Figure 4] FIG. 10 is a diagram showing an example in which an average value is used as a statistical quantity of feature quantities obtained from multiple hits. [Figure 5] FIG. 10 is a diagram showing an example in which a median is used as a statistical quantity of feature quantities obtained from multiple hits. [Figure 6] FIG. 10 is a diagram showing an example in which maximum and minimum values ​​are used as statistics of feature quantities obtained from multiple hits. [Figure 7] 10 is a flowchart illustrating an example of the flow of a control process of the anomaly detection device. [Figure 8] FIG. 5 is a functional block diagram showing an impact test device according to a second embodiment of the present invention. [Figure 9] FIG. 10 is a diagram showing an example of the time progression of the excitation force output by the excitation force measuring unit and an example of the time progression of the contact time output by the excitation force measuring unit when the impact test object is impacted multiple times at a collision speed v using the impact unit of the impact device. [Figure 10] 1 is a schematic diagram showing an example of a usage mode of an abnormality detection device 1A in an impact test device 10 according to a first embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0029] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

[0030] First Embodiment [Overall configuration] FIG. 1 is a functional block diagram showing an impact testing device according to a first embodiment of the present invention. The impact testing device 10 measures the thickness of refractory materials in industrial furnaces such as blast furnaces, and includes an abnormality detection device 1A, an impact device 2, and a control device 3. The abnormality detection device 1A detects abnormalities in the impact device 2. The impact device 2 vibrates an object to be impact tested and outputs a vibration signal. The control device 3 controls the operation of the abnormality detection device 1A and the impact device 2.

[0031] [Percussion Device 2] The impact device 2 has a driving unit 201, an impact unit 202, and an excitation force measuring unit 203. The driving unit 201 drives the impact unit 202. The impact unit 202 is, for example, a hammer. The excitation force measuring unit 203 measures the excitation force when the impact unit 202 impacts the impact test object.

[0032] [Control device 3] The control device 3 has an input unit 301, a speed setting unit 302 that sets the collision speed between the impact unit 202 and the impact test object, a trigger unit 303 that triggers the drive unit 201 to impact and also triggers the abnormality detection processing unit 103 (described later) to execute the abnormality detection processing, and a function selection unit 304 that selects the functions of the abnormality detection device 1A.

[0033] [Anomaly detection device 1A] The abnormality detection device 1A collects data of the excitation signal from the impact device 2 and performs calculations on the collected data, detecting an abnormality in the impact device 2 using an index extracted from a change over time in the waveform of the excitation signal output by the impact device 2. As shown in Fig. 1, the abnormality detection device 1A includes a function setting unit 101, a normal state index acquisition unit 102, an abnormality detection processing unit 103, and a storage unit 104, and functions as a calculation device. The abnormality detection device 1A may be part of the calculation device.

[0034] 1, the anomaly detection device 1A is configured independently of the control device 3, but this is not limiting, and the anomaly detection device 1A and the control device 3 may be configured as a single device. For example, the anomaly detection device 1A and the control device 3 may be configured as a personal computer (PC) or the like.

[0035] (Function setting unit 101) The function setting unit 101 selects whether to execute processing by the normal state index acquiring unit 102 or by the abnormality detection processing unit 103, depending on the information received from the control device 3. Details of the normal state index acquiring unit 102 and the abnormality detection processing unit 103 will be described below.

[0036] (Normal state index acquisition unit 102) The normal state index acquisition unit 102 acquires, at least once, a feature quantity extracted from the waveform of the excitation signal output by the impact device 2 when the impact device 2 (impact unit 202) impacts the impact test object at the impact speed specified by the speed setting unit 302, and acquires the feature quantity itself acquired from one impact or statistics (average, median, maximum, minimum) of multiple feature quantities acquired from multiple impacts as an index of the normal state of the impact device 2. In one aspect, the normal state index acquisition unit 102 includes a maximum excitation force detection unit 1021 that detects the maximum value of the excitation force and a contact time detection unit 1022 that detects the contact time between the impact device 2 (impact unit 202) and the impact test object, and acquires the maximum excitation force and the contact time between the impact device 2 and the impact test object as the feature quantities extracted from the waveform of the excitation signal. The acquired information is stored in the storage unit 104, which will be described later. The normal state index acquiring unit 102 may include only one of the maximum excitation force detecting unit 1021 and the contact time detecting unit 1022.

[0037] (Abnormality detection processing unit 103) The abnormality detection processing unit 103 detects an abnormality in the impact device 2 based on the index of the normal state acquired by the normal state index acquisition unit 102, and determines an abnormality in the impact device 2 using the maximum excitation force and contact time, or the statistics of the maximum excitation force and the contact time output by the normal state index acquisition unit 102, as reference values. More specifically, the abnormality detection processing unit 103 detects an abnormality in the impact device 2 based on either or both of the difference between the contact time obtained when the impact unit 202, whose state is unknown, strikes the impact target at the collision speed when the index of the normal state is acquired and the statistics of the contact time in the normal state, and the difference between the maximum excitation force obtained when the impact unit 202, whose state is unknown, strikes the impact test target at the collision speed when the index of the normal state is acquired and the statistics of the maximum excitation force in the normal state. In one aspect, the abnormality detection processing unit 103 includes an excitation force comparison unit 1031 that compares excitation forces, a contact time comparison unit 1032 that compares contact times, and an abnormality determination unit 1033 that determines an abnormality in the impact device 2.

[0038] (Acquisition of maximum excitation force and contact time in normal state index acquisition unit 102) The acquisition of the reference value in the normal state index acquisition unit 102 will be explained using FIG. 2, taking as an example a case where the maximum value of the excitation force and the contact time are used as feature quantities that serve as indicators of the normal state. FIG. 2 is a diagram showing an example of an excitation signal generated when a normal impact device 2 impacts an impact test object at a collision speed v. When the impact device 2 starts to come into contact with the impact test object, an excitation force is applied to the excitation force measurement unit of the impact device 2. As the impact device 2 starts to move away from the impact test object, the excitation force gradually weakens, and when the impact device 2 is completely away, the excitation force becomes 0. The excitation force maximum value detection unit 1021 in the normal state index acquisition unit 102 detects the maximum value (peak) of the excitation force F shown in FIG. h The contact time detection unit detects the contact time t h Detect the maximum value (peak) of the excitation force F h and contact time t h The maximum value (peak) of the excitation force F varies depending on the impact speed between the impact device 2 and the impact test object. h and contact time t h The normal state index acquisition unit 102 calculates the normal state index based on the collision speed v and the maximum value (peak) of the excitation force F h The minimum value of F hmin and the maximum contact time t hmax and are stored in the storage unit 104.

[0039] (Detection of abnormality in impact device 2 by abnormality detection processing unit 103) The method of detecting an abnormality in the impact device 2 in the abnormality detection processing unit 103 will be described with reference to Fig. 3, taking as an example a case where both the maximum value of the excitation force and the contact time are used as feature quantities that serve as indicators of a normal state. Fig. 3 is a diagram showing an example of an excitation signal output by the excitation force measuring unit 203 when an impact test object is impacted at a collision speed v using the impact part 202 of the impact device 2 that has softened due to deterioration. As shown in Fig. 3, when the impact part 202 of the impact device 2 softens, the maximum value of the excitation force becomes smaller and the contact time becomes longer. The maximum excitation force when the impact device 2 impacts the impact test object at the collision speed v is defined as F s , the contact time between the impact device 2 and the impact test object is t sWhen this is the case, the excitation force comparison unit 1031 of the abnormality detection processing unit 103 detects an impact using equation (1).

number

number

number

[0040] (When using statistics of features obtained from multiple hits) The above has explained the case where the feature values ​​(maximum excitation force and contact time) obtained from a single impact are used as an indicator of the normal state. However, when using the statistics of feature values ​​obtained from multiple impacts, the indicator is calculated using the following procedure. (1) Collect the feature values ​​(maximum excitation force and contact time) multiple times. (2) Calculate an index from the obtained feature values. When the average value is used as the statistical quantity, the average value of each feature quantity is taken. When the median value is used as the statistical quantity, the median value of each feature quantity is taken. When the maximum and minimum values ​​are used as the statistical quantity, the minimum value of the excitation force and the maximum value of the contact time are taken. In this way, when using the statistical quantities (average value, median value, maximum and minimum values) of the features obtained from multiple impacts, the anomaly detection of the impact device in the anomaly detection processing unit 103 involves comparison of the magnitude with the average value, comparison of the magnitude with the median, and comparison of the magnitude with the maximum and minimum values. Below, we will specifically explain the cases where the average value, median, maximum and minimum values ​​are used as statistical quantities.

[0041] Figure 4 shows the case where the mean value is used as a statistic. Figure 4(a) shows the case where the test subjects are tested multiple times (N n 10 is a diagram showing an example of the excitation force output by the excitation force measuring unit 203 at each impact when impacts are applied (number of times), and shows the peak F of the excitation force at each impact. h The average value of F have Figure 4(b) shows the impact test object after multiple times (N n 10 is a diagram showing an example of the contact time output by the excitation force measuring unit 203 for each impact when impacts are applied (number of times), and the contact time t h The average value of t have is used as an indicator.

[0042] Figure 5 shows the case where the median is used as a statistic. Figure 5(a) shows the case where the test subjects are tested multiple times (N n 10 is a diagram showing an example of the excitation force output by the excitation force measuring unit 203 at each impact when impacts are applied (number of times), and shows the peak F of the excitation force at each impact. h Median of F hmed Figure 5(b) shows the impact test object after multiple times (N n 10 is a diagram showing an example of the contact time output by the excitation force measuring unit 203 for each impact when impacts are applied (number of times), and the contact time t h Median of t hmed is used as an indicator.

[0043] Figure 6 shows the case where the maximum and minimum values ​​are used as statistics. n10 is a diagram showing an example of the excitation force output by the excitation force measuring unit 203 at each impact when impacts are applied (number of times), and shows the peak F of the excitation force at each impact. h The minimum value of F hmin Figure 6(b) shows the impact test object after multiple times (N n 10 is a diagram showing an example of the contact time output by the excitation force measuring unit 203 for each impact when impacts are applied (number of times), and the contact time t h The maximum value of t hmax is used as an indicator.

[0044] (Storage unit 104) The memory unit 104 stores the maximum excitation force value and contact time in a normal state acquired (detected) by the normal state index acquisition unit 102. At this time, the normal value of the contact time and the normal value of the maximum excitation signal value are stored in association with the collision speed. The memory unit 104 also stores various other data used in processing. The memory unit 104 can be configured with a storage device such as a RAM (Random Access Memory) or a hard disk.

[0045] [Control process by abnormality detection device 1A] Next, the control process of the abnormality detection device 1A will be described with reference to Fig. 7. Fig. 7 is a flowchart showing an example of the flow of the control process of the abnormality detection device 1A.

[0046] First, in step S100, the function setting unit 101 of the abnormality detection device 1A sets the abnormality detection device 1A to a normal state index acquisition state.

[0047] Next, in step S101, the normal state index acquisition unit 102 of the abnormality detection device 1A receives the excitation force of the impact device 2, the excitation force maximum value detection unit 1021 detects the maximum value of the excitation force, and the contact time detection unit 1022 acquires (detects) the contact time.

[0048] Next, in step S102, the function setting unit 101 of the abnormality detection device 1A sets the abnormality detection device 1A to an abnormality detection state.

[0049] Next, in step S103, the abnormality detection processing unit 103 of the abnormality detection device 1A receives the excitation force of the impact device 2, and the excitation force comparison unit 1031 compares the maximum value of the excitation force with the maximum value of the excitation force in the normal state, and the contact time comparison unit 1032 compares the contact time with the contact time in the normal state.

[0050] In step S104, the comparison result of the excitation force comparison unit 1031 and the comparison result of the contact time comparison unit 1032 are added together, and the abnormality determination unit 1033 determines whether the result of the addition is less than 2. If the result of the addition is less than 2 (YES in step S104), the process proceeds to step S105, and if the result of the addition is 2 or more (NO in step S104), the process proceeds to step S106.

[0051] In step S105, the abnormality determination unit 1033 of the abnormality detection device 1A outputs an abnormality in the impact device.

[0052] In step S106, the abnormality detection device 1A determines whether or not to end the display process. If the abnormality determination process is to be continued without ending (NO in step S106), the process returns to step S103 and the abnormality determination process described above is repeated. If the abnormality determination process is to be ended (YES in step S106), all processes are ended.

[0053] In addition, when index acquisition and abnormality detection are always performed in pairs, it is not necessary to switch between the normal state index acquisition state and the abnormality detection state (steps S100 and S102).

[0054] As described above, the abnormality detection device of this embodiment evaluates the vibration signal output by the impact device using either or both of the vibration force and contact time, making it possible to easily detect abnormal conditions in the impact device.

[0055] <Second embodiment> FIG. 8 is a functional block diagram showing an impact testing device according to a second embodiment of the present invention. In this embodiment, the impact test apparatus 10′ includes an abnormality detection device 1B, an impact device 2, and a control device 3. The impact device 2 and the control device 3 are configured similarly to those in the first embodiment. The abnormality detection device 1B further includes an abnormality prediction unit 105 that predicts an abnormality in the impact device 2 in addition to the configuration of the abnormality detection device 1A in the first embodiment. More specifically, the abnormality prediction unit 105 calculates the timing at which an abnormality will occur in the impact device 2 (predicts the occurrence of an abnormality in the impact device 2) based on either or both of the following: a time transition of the difference between the contact time obtained by striking the impact test object with the impact unit 202, whose state is unknown, at the impact speed when the indicator of the normal state is obtained and the statistics of the contact time in the normal state; and a time transition of the difference between the maximum value (peak) of the excitation signal obtained by striking the impact test object with the impact unit 202, whose state is unknown, at the impact speed when the indicator of the normal state is obtained and the statistics of the maximum excitation force in the normal state. The calculation results in the abnormality prediction unit 105 are stored in the memory unit 104.

[0056] (Method for predicting abnormality in impact device 2 using abnormality prediction unit 105) An example of a method for predicting an abnormality of the impact device 2 in the abnormality prediction unit 105 will be described with reference to Fig. 9. Fig. 9(a) is a diagram showing an example of the time transition of the maximum value (peak) of the excitation force output by the excitation force measurement unit 203 when the impact test object is hit multiple times at a collision speed v using the impact unit 202 of the impact device 2. Fig. 9(b) is a diagram showing an example of the time transition of the contact time output by the excitation force measurement unit 203 when the impact test object is hit multiple times at a collision speed v using the impact unit 202 of the impact device 2. In the example shown in Fig. 9, n The excitation force and contact time are actual measurements, and the number of uses is N L The excitation force and contact time are predicted values. L The predicted maximum value (peak) of the excitation force in the normal state is the minimum value F hmin Also, the number of times of use is N L The predicted contact time is the minimum contact time under normal conditions, t hmax At this time, the number of times of use is N L is the time when the abnormality occurs.

[0057] The predicted maximum value of the excitation force at the number of uses n is n The predicted contact time for the nth use is calculated from the maximum excitation force up to the nth use. n The maximum value (peak) of the excitation force in the number of uses n is calculated as F h (n), the maximum value (peak) of the excitation force in the normal state is F hmax Then, the prediction formula for the maximum excitation force is the function f(n) that minimizes equation (4).

number

[0058] In addition, the contact time for n uses is t h (n), the minimum contact time under normal conditions is t hmin Then, the prediction formula for the contact time is the function g(n) that minimizes the following equation (5).

number

[0059] The inverse function of the function f(n) is f -1 (n), the predicted maximum value of the excitation force is F hmin Number of uses less than N L is calculated using the following equation (6).

number

[0060] The inverse function of the function g(n) is g -1 (n), the predicted contact time is t hmax Number of uses greater than NL is calculated using the following equation (7).

number

[0061] <Example of use of an anomaly detection device> FIG. 10 is a schematic diagram showing an example of a usage mode of the abnormality detection device 1A in the impact test device 10 according to the first embodiment. The impact testing device 10 includes an abnormality detection device 1A, an impact device 2, and a control device 3. The abnormality detection device 1A is a device that detects abnormalities in the impact device, which serves as an input signal source when measuring the thickness of the refractory in a furnace having a furnace wall composed of a steel shell and refractory. The refractory thickness is measured, for example, by an impact acoustic wave resonance method. Examples of furnaces having furnace walls composed of a steel shell and refractory include industrial furnaces such as blast furnaces, gasification melting furnaces, and RH furnaces.

[0062] Figure 10 shows how the impact device 2 impacts the steel shell Z based on the impact speed set by the control device 3, and the abnormality detection device 1A receives the excitation force as an excitation signal obtained during the impact, and determines whether there is an abnormality based on the maximum value of the excitation force as an index extracted from the time change in the waveform of the excitation signal output by the impact device and the contact time between the impact device and the steel shell.

[0063] 10, the anomaly detection device 1A, the impact device 2, and the control device 3 operate as follows. First, the control device 3 transmits a set impact speed to the impact device 2. The impact device 2 strikes the surface of the steel shell Z at the set impact speed. The excitation force generated by the impact of the impact device 2 as an excitation signal is transmitted to the anomaly detection device 1A, which analyzes the excitation force and detects an abnormality in the impact device 2 as described above.

[0064] In this embodiment, the case where the anomaly detection device 1A and the control device 3 are performed on different terminals is described, but this embodiment is not limited to this, and these processes may be performed on the same terminal, or some of these processes may be performed on a server. [Explanation of symbols]

[0065] 1A, 1B Abnormality detection device (arithmetic device) 2. Percussion device 3. Control device 10, 10´ Impact Testing Apparatus 101 Function setting section 102 Normal state indicator acquisition unit 103 Abnormality detection processing unit 104 Storage section 105 Abnormality Prediction Department 201 Drive unit 202 Striking section 203 Excitation force measurement section 1021 Maximum excitation force detector 1022 Contact time detection unit 1031 Excitation force comparison section 1032 Contact time comparison section 1033 Abnormality determination section

Claims

1. An impact test device for performing an impact test on an impact test object, an impact device that vibrates the impact test object and outputs an excitation signal; a computing device that collects data of the excitation signal and calculates the collected data; and The computing device detects an abnormality in the impact device based on an index of a normal state obtained from a feature extracted from a waveform of a vibration signal output by the impact device.

2. 2. The impact testing device according to claim 1, wherein the impact device impacts the impact target at least once, and the computing device uses, as the indicator of the normal state, a feature value obtained from the single impact or a statistic of feature values ​​obtained from multiple impacts.

3. The impact testing device according to claim 2 , wherein the statistics of the feature quantities are at least one of an average value, a median value, a maximum value, and a minimum value of the plurality of feature quantities obtained by the plurality of impacts.

4. The computing device The impact test device according to claim 1 , wherein the feature quantity is either a contact time between the impact device and the impact test object calculated from the excitation signal, or a maximum value of the excitation signal, or both of these.

5. The computing device a normal state indicator acquisition unit that acquires either or both of a normal value of the contact time and a normal value of the maximum value of the vibration signal by striking the strike test object with the striking device in a normal state; a storage unit that stores either or both of the normal value of the contact time and the normal value of the maximum value of the vibration signal in association with a set collision speed between the impact device and the impact test object; an abnormality detection unit that detects an abnormality in the impact device based on either or both of the difference between a contact time obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the contact time in a normal state, and the difference between a maximum value of a vibration signal obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state; The impact test device according to claim 4, further comprising:

6. 6. The impact test device according to claim 5, wherein the arithmetic unit further comprises an abnormality prediction unit that calculates a time when an abnormality will occur in the impact device based on either or both of: a time progression of a difference between a contact time obtained by striking the impact test object with the impact device in an unknown state at the collision speed and a statistic of the contact time in a normal state; and a time progression of a difference between a maximum value of a vibration signal obtained by striking the impact test object with the impact device in an unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state.

7. The impact testing device according to claim 5 , wherein the arithmetic device further comprises a function setting unit that selects whether to execute the process by the normal state index acquisition unit or the process by the abnormality detection unit.

8. The impact test device according to claim 1 , wherein the object to be impact tested has a refractory material, and the thickness of the refractory material is measured by vibrating the object to be impact tested.

9. 9. The impact testing device according to claim 8, wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

10. An impact test method for performing an impact test on an impact test object, comprising: vibrating the impact test object with an impact device; acquiring and storing an index of a normal state obtained from a feature amount extracted from a waveform of the vibration signal output by the impact device; Detecting an abnormality in the impact device using the indicator; The impact test method has the following features.

11. An impact testing device that vibrates an impact test object by an impact device and performs an impact test using an output vibration signal, comprising: an anomaly detection device that collects data of the excitation signal, calculates the collected data, and detects an abnormality in the impact device based on an index of a normal state obtained from a feature amount extracted from a waveform of the excitation signal output by the impact device.

12. 12. The anomaly detection device according to claim 11, wherein the impact device impacts the impact target at least once, and the feature value obtained from the single impact or a statistic of feature values ​​obtained from multiple impacts is used as the indicator of the normal state.

13. The anomaly detection device according to claim 12 , wherein the statistics of the feature quantities are at least one of an average value, a median value, a maximum value, and a minimum value of the plurality of feature quantities obtained from the plurality of hits.

14. The anomaly detection device according to claim 11 , wherein the feature quantity is either a contact time between the impact device and the impact test object calculated from the excitation signal, or a maximum value of the excitation signal, or both of these.

15. a normal state indicator acquisition unit that acquires either or both of a normal value of the contact time and a normal value of the maximum value of the vibration signal by striking the strike test object with the striking device in a normal state; a storage unit that stores either or both of the normal value of the contact time and the normal value of the maximum value of the vibration signal in association with a set collision speed between the impact device and the impact test object; an abnormality detection unit that detects an abnormality in the impact device based on either or both of the difference between a contact time obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the contact time in a normal state, and the difference between a maximum value of a vibration signal obtained by impacting the impact test object with the impact device in an unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state; The anomaly detection device according to claim 14, further comprising:

16. 15. The anomaly detection device according to claim 14, further comprising an anomaly prediction unit that calculates a time when an abnormality will occur in the impact device based on either or both of: a time progression of the difference between a contact time obtained by impacting the impact test object with the impact device in the unknown state at the collision speed and a statistic of the contact time in a normal state; and a time progression of the difference between a maximum value of a vibration signal obtained by impacting the impact test object with the impact device in the unknown state at the collision speed and a statistic of the maximum value of the vibration signal in a normal state.

17. The abnormality detection device according to claim 14 , further comprising a function setting unit that selects whether to execute the process by the normal state index acquisition unit or the process by the abnormality detection unit.

18. A method for measuring the thickness of a refractory material, comprising: vibrating an impact test object having a refractory material using the impact test apparatus according to any one of claims 1 to 7; and measuring the thickness of the refractory material.

19. The method for measuring a thickness of a refractory material according to claim 18, wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

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