Inspection socket

Abstract

To provide an inspection socket having high contact reliability.SOLUTION: An inspection socket includes first, second, third, and fourth probe pins each having a first contact and a second contact at ends in a first direction. In a second direction crossing the first direction, the first probe pin and the second probe pin face each other, and the third probe pin and the fourth probe pin face each other. In a third direction crossing the first direction and the second direction, the first probe pin and the third probe pin are arranged side by side, and the second probe pin and the fourth probe pin are arranged side by side. The second contact of the third probe pin is positioned between the second contact of the first probe pin and the second contact of the second probe pin in the second direction. The second contact of the second probe pin is positioned between the second contact of the third probe pin and the second contact of fourth probe pin in the second direction. In the second direction, the position at which the first contact of the first probe pin contacts with a contact object is different from the position at which the first contact of the third probe pin contacts with the contact object.SELECTED DRAWING: Figure 5

Description

[Technical Field]

[0001] The present disclosure relates to a test socket. [Background technology]

[0002] Patent Document 1 describes an inspection jig used for conducting electrical continuity tests and measuring characteristics of electronic modules. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Publication No. 2022-135106 Summary of the Invention [Problem to be solved by the invention]

[0004] The inspection socket including the inspection jig of Patent Document 1 has multiple probe pins. The probe pins are arranged side by side at intervals and housed in a housing in a state where they are electrically isolated from one another. However, if the intervals between the terminals of the object (e.g., a connector) that the inspection socket will contact are narrow, the intervals between the probe pins that contact the terminals must be narrow. If the intervals between the probe pins are narrow, poor contact may occur during inspection.

[0005] An object of the present disclosure is to provide a test socket with high contact reliability. [Means for solving the problem]

[0006] A test socket according to one aspect of the present disclosure includes: Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; the second probe pin and the fourth probe pin are arranged side by side in the third direction; a first contact point of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin has an inclined surface that can come into contact with a contact object; the second contact point of the first probe pin is located on one side in the second direction with respect to the second contact point of the third probe pin; The second contact point of the second probe pin is located on one side in the second direction relative to the second contact point of the fourth probe pin. [Effects of the Invention]

[0007] According to the present disclosure, it is possible to provide an inspection socket with high contact reliability. [Brief explanation of the drawings]

[0008] [Figure 1] 1 is a perspective view of a test socket according to one embodiment of the present disclosure; [Figure 2] FIG. 2 is an exploded perspective view of the test socket of FIG. 1; [Figure 3] FIG. [Figure 4] FIG. [Figure 5] 4. FIG. 5 is a cross-sectional view taken along line AA in FIG. [Figure 6] FIG. 5 is a cross-sectional view taken along line BB in FIG. 4. [Figure 7] FIG. 6 is a cross-sectional view showing a first modified example of the probe pin of FIG. 5. [Figure 8] FIG. 7 is a cross-sectional view showing a first modified example of the probe pin of FIG. 6. [Figure 9]FIG. 6 is a cross-sectional view showing a second modified example of the probe pin of FIG. 5. [Figure 10] FIG. 7 is a cross-sectional view showing a second modified example of the probe pin of FIG. 6. DETAILED DESCRIPTION OF THE INVENTION

[0009] An example of the present disclosure will now be described with reference to the accompanying drawings. The following description is merely exemplary in nature and is not intended to limit the present disclosure, the application of the present disclosure, or uses of the present disclosure. The drawings are schematic, and the proportions of the dimensions do not necessarily correspond to those of reality. Furthermore, in the following description, terms indicating specific directions or positions (e.g., terms including "upper," "lower," "right," "left," "front," and "rear") are used as necessary. However, the use of terms indicating specific directions or positions is intended to facilitate understanding of the present disclosure with reference to the drawings, and the meanings of these terms do not limit the technical scope of the present disclosure.

[0010] As shown in FIGS. 1 and 2, a test socket 1 according to an embodiment of the present disclosure includes housings 2, 3, 4, 5, and 6, and a plurality of plate-shaped probe pins 7 housed inside the housings 2, 3, 4, 5, and 6.

[0011] 2, the housing 2 has through holes 2A and 2B that penetrate the housing 2 in the vertical direction (for example, the Z direction shown in each figure). The vertical direction and the Z direction are examples of a first direction. In this embodiment, in the vertical direction, the side where the housing 2 is located is the upper side, and the side where the housing 6 is located is the lower side.

[0012] The housing 3 has a base 31 and a protruding portion 32 protruding upward from the base 31. Here, "protruding upward" means "protruding in a direction from the housing 6 toward the housing 2 along the first direction." The protruding portion 32 has a recess 3A that is recessed downward. Here, "recessed downward" means "recessed in a direction from the housing 2 toward the housing 6 along the first direction." The protruding portion 32 has a bottom surface 31B that forms the recess 31A, with a plurality of through holes 3B that penetrate the protruding portion 32 in the up-down direction. Each of the plurality of through holes 3B corresponds to a respective one of the plurality of probe pins 7.

[0013] The housing 4 has through holes 4A and 4B that pass through the housing 4 in the vertical direction.

[0014] The housing 5 holds a plurality of probe pins 7 in an array as shown in FIG.

[0015] The housing 6 has pins 61 protruding upward and recesses 6A recessed downward from the top surface (in other words, the outer surface of the housing 6 facing the housing 4). The housing 6 has a plurality of through holes 6B penetrating the housing 6 in the vertical direction in the bottom surface forming the recesses 6A. Each of the plurality of through holes 6B corresponds to each of the plurality of probe pins 7.

[0016] The lower portion of the housing 5 that holds the probe pins 7 is accommodated in the recess 6A of the housing 6. The lower portion of the housing 5 is the portion of the housing 5 that is closest to the housing 6 in the first direction. At this time, the second contacts 121, 122, 752, 762 (see FIG. 3) of each probe pin 7 are exposed to the outside of the test socket 1 through the through-hole 6B.

[0017] Housings 2, 3, and 4 are assembled above housing 6, which houses housing 5. Housings 2, 3, and 4 are assembled to housing 6 from below in the order of housings 4, 3, and 2.

[0018] A pin 61 of the housing 6 passes through the through-hole 4B of the housing 4 and the through-hole 2B of the housing 2. As a result, the housings 2 and 4 are positioned relative to the housing 6.

[0019] The protrusion 32 of the housing 3 passes through the through-hole 2A of the housing 2 from below. This exposes the protrusion 32 to the outside of the test socket 1, and the housing 3 is positioned relative to the housing 2.

[0020] The first connection portion 11 (see FIGS. 5 and 6) of each probe pin 7 passes through the through hole 4A of the housing 4 from below. The first contact points 111, 751, 761 (see FIG. 3) of each probe pin 7 are exposed to the outside of the test socket 1 through the through hole 3B of the housing 3.

[0021] The test socket 1 is connected to a test device (not shown), and a contact object 8 (see FIGS. 4, 5, and 6) is connected to the test socket 1. In this connected state, continuity between the contact object 8 and the test device is tested.

[0022] The test socket 1 is placed on a circuit board provided in the test device, whereby the second contacts 121, 122, 752, 762 (see FIG. 3) of each probe pin 7 exposed to the outside of the test socket 1 through the through hole 6B are electrically connected to conductive pads formed on the circuit board.

[0023] The contact object 8 shown in Figures 4, 5, and 6 is fitted into the recess 3A of the housing 3. As shown in Figures 5 and 6, the contact object 8 has a plurality of terminals 81. When the contact object 8 is fitted into the recess 3A of the housing 3, each terminal 81 is electrically connected to the first contacts 111, 751, 761 (see Figure 3) of each probe pin 7 exposed to the outside of the test socket 1 through the through hole 3B.

[0024] 3 and 4 , the probe pins 7 include a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, and a sixth probe pin 76. At least one of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, the fourth probe pin 74, the fifth probe pin 75, and the sixth probe pin 76 is provided. In this embodiment, the probe pins 7 include thirteen first probe pins 71, thirteen second probe pins 72, thirteen third probe pins 73, thirteen fourth probe pins 74, two fifth probe pins 75, and two sixth probe pins 76.

[0025] In this embodiment, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 are signal terminals, and the fifth probe pin 75 and the sixth probe pin 76 are power supply terminals or ground terminals. However, the types of the probe pins are not limited to this.

[0026] The first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the fifth probe pins 75, and the sixth probe pins 76 are arranged at intervals. In other words, the first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the fifth probe pins 75, and the sixth probe pins 76 are electrically insulated from one another.

[0027] The first probe pin 71, the third probe pin 73, and the fifth probe pin 75 are arranged at intervals along a front-rear direction (for example, the Y direction shown in each drawing) that intersects (orthogonal in this embodiment) the up-down direction of the inspection socket 1. The front-rear direction and the Y direction are thickness directions of the probe pins 7, and are examples of a third direction. The first probe pins 71 and the third probe pins 73 are arranged alternately in the front-rear direction.

[0028] The two fifth probe pins 75 sandwich the thirteen first probe pins 71 and the thirteen third probe pins 73 in the front-to-rear direction. In other words, the two fifth probe pins 75 are arranged at the frontmost and rearmost positions among the first probe pins 71, the third probe pins 73, and the fifth probe pins 75.

[0029] The second probe pins 72, the fourth probe pins 74, and the sixth probe pins 76 are arranged at intervals along the front-rear direction of the test socket 1. The second probe pins 72 and the fourth probe pins 74 are arranged alternately in the front-rear direction.

[0030] The two sixth probe pins 76 sandwich the thirteen second probe pins 72 and the thirteen fourth probe pins 74 in the front-to-rear direction. In other words, the two sixth probe pins 76 are arranged at the frontmost and rearmost positions among the second probe pins 72, the fourth probe pins 74, and the sixth probe pins 76.

[0031] 5, the first probe pins 71 and the second probe pins 72 are arranged opposite to each other with a gap in the left-right direction (for example, the X direction shown in each drawing) that intersects both the up-down direction and the front-back direction (in this embodiment, perpendicular to both the up-down direction and the front-back direction). The left-right direction and the X direction are examples of the second direction.

[0032] As shown in FIG. 6, the third probe pins 73 and the fourth probe pins 74 are arranged opposite to each other with a gap in the left-right direction.

[0033] In this embodiment, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is the first probe pin 71, but is arranged in the opposite direction in the left-right direction.

[0034] In this embodiment, the second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is the second probe pin 72, but is arranged in the opposite direction in the left-right direction.

[0035] As described above, in this embodiment, the test socket 1 includes two types of probe pins 7 instead of four types of probe pins 7 each having a different configuration. One of the two types of probe pins 7 is the probe pins 71 and 74, and the other of the two types of probe pins 7 is the probe pins 72 and 73.

[0036] As shown in FIG. 3, the fifth probe pins 75 and the sixth probe pins 76 are arranged opposite to each other with a gap in the left-right direction.

[0037] In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 have the same configuration (in other words, the same size and shape). In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 are arranged in opposite directions in the left-right direction. The fifth probe pin 75 and the sixth probe pin 76 are arranged symmetrically with respect to a virtual line L1 that extends in the up-down direction between the fifth probe pin 75 and the sixth probe pin 76.

[0038] The configuration of each probe pin 7 will be described below. In this embodiment, the first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the probe pins 75, and the probe pins 76 have roughly the same configuration. Therefore, the configuration of the first probe pin 71 will be described below, and a description of the configuration of the other probe pins will be omitted as a general rule. In each drawing, the same reference numerals are used for common configurations. However, configurations of the other probe pins that differ from the first probe pin 71 will be described. In the following description, "left" and "right" in the left-right direction have the following meanings. That is, for the first probe pin 71 and the third probe pin 73, the side facing the curved portion 133 in the left-right direction is the "left," and the side opposite the curved portion 133 is the "right." On the other hand, in the left-right direction, the second probe pin 72 and the fourth probe pin 74 are on the side opposite to the curved portion 133, which is the "left side", and the curved portion 133 side is the "right side".

[0039] As shown in FIG. 5 , the first probe pin 71 includes a first connecting portion 11, a second connecting portion 12, and an elastic portion 13. The first connecting portion 11 is connected to a first end 13A, which is one of the ends of the elastic portion 13 in the vertical direction (in this embodiment, the upper end of the elastic portion 13). In other words, the lower end of the first connecting portion 11 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the upper end of the elastic portion 13. The second connecting portion 12 is connected to a second end 13B, which is the other of the ends of the elastic portion 13 in the vertical direction (in this embodiment, the lower end of the elastic portion 13). In other words, the upper end of the second connecting portion 12 (in this embodiment, the end closer to the elastic portion 13 in the vertical direction) is connected to the lower end of the elastic portion 13.

[0040] The first connection portion 11 has a first contact 111 provided at an upper end portion of the first connection portion 11 (in this embodiment, the end portion farther from the second connection portion 12 in the vertical direction). The second connection portion 12 has a second contact 121 provided at a lower end portion of the second connection portion 12 (in this embodiment, the end portion farther from the first connection portion 11 in the vertical direction). In other words, the first probe pin 71 has the first contact 111 provided at one end portion in the vertical direction (in this embodiment, the upper end portion) and the second contact 121 provided at the other end portion in the vertical direction (in this embodiment, the lower end portion).

[0041] The elastic portion 13 has a first portion 131 , a second portion 132 , and a curved portion 133 .

[0042] The first portion 131 extends in the left-right direction from the first end portion 13A. The second portion 132 extends in the left-right direction from the second end portion 13B. The second portion 132 extends on the same side as the first portion 131 in the left-right direction. In the example shown in FIG. 5, the first portion 131 extends leftward from the first end portion 13A, and the second portion 132 extends leftward from the second end portion 13B.

[0043] The curved portion 133 has a curved shape and connects one of the left and right ends of the first portion 131 that is farther from the first end 13A (for example, the left end in FIG. 5) to another of the left and right ends of the second portion 132 that is farther from the second end 13B (for example, the left end in FIG. 5).

[0044] The first end 13A and the second end 13B, which are both ends of the elastic portion 13, are connected to the first connecting portion 11 and the second connecting portion 12 from the same side in the left-right direction (the left side in this embodiment). In other words, the elastic portion 13 is located on the same side (the left side in this embodiment) of one side surface (the left surface in this embodiment) of the first connecting portion 11 in the left-right direction.

[0045] A length L2 along the vertical direction between the end 11A to which the first end 13A of the first connecting portion 11 is connected and the end 12A to which the second end 13B of the second connecting portion 12 is connected is longer than an inner radius R1 of the curve of the elastic portion 13. In this embodiment, the end 11A is the lower end of the first connecting portion 11, and the end 12A is the upper end of the second connecting portion 12. In this embodiment, the inner radius R1 of the curve of the elastic portion 13 is the inner radius R1 of the curved portion 133.

[0046] The elastic portion 13 includes a plurality of long plate portions 134 (three long plate portions 134A, 134B, and 134C in this embodiment). Each of the long plate portions 134A, 134B, and 134C spans the first portion 131, the second portion 132, and the curved portion 133.

[0047] Each of the long plate portions 134A, 134B, and 134C extends along the length direction of the elastic portion 13. The length direction of the elastic portion 13 is the direction in which the elastic portion 13 extends from the first portion 131 through the curved portion 133 to the second portion 132. In other words, the length direction of the elastic portion 13 is the left-right direction in the first portion 131 and the second portion 132, and is the direction along the curved shape in the curved portion 133.

[0048] The long plate portions 134A, 134B, and 134C are arranged side by side at intervals along the width direction of the elastic portion 13. The width direction of the elastic portion 13 is a direction perpendicular to both the front-rear direction (the thickness direction of the probe pin 7 in this embodiment) and the length direction of the elastic portion 13.

[0049] The longer the long plate portions 134 are in the width direction, the further they are positioned outside the curved shape of the curved portion 133. In this embodiment, the long plate portion 134A is longer in the width direction than the long plate portion 134B, and the long plate portion 134B is longer in the width direction than the long plate portion 134C.

[0050] The second portion 132 extends upward toward the right on the page of Fig. 5. That is, the second portion 132 extends so as to approach the first end 13A in the up-down direction as it approaches the second end 13B in the left-right direction. That is, the surface that forms the inner edge and the surface that forms the outer edge in the radial direction of the second portion 132 are inclined surfaces that are inclined with respect to the left-right direction.

[0051] The upper edge 12B of the second connection portion 12 extends downward toward the right on the paper surface of FIG. 5. In other words, the edge 12B of the second connection portion 12 on the first connection portion 11 side in the up-down direction (the upper side in this embodiment) extends away from the first connection portion 11 in the up-down direction as it moves away from the elastic portion 13 in the left-right direction. In other words, the edge 12B is an inclined surface inclined with respect to the left-right direction. The edge 12B may extend along the left-right direction. As shown in FIG. 3, the edge portions 12B of the fifth probe pin 75 and the sixth probe pin 76 extend along the left-right direction.

[0052] 5, the first contact point 111 has a protruding shape and protrudes upward (in the first direction, in the direction away from the second connection portion 12) from the upper end of the first connection portion 11. The first contact point 111 includes an inclined surface 111A and a protrusion 111B.

[0053] The inclined surface 111A is located on one side in the left-right direction of the first contact point 111. The inclined surface 111A is inclined in the up-down direction so as to move away from the center line C as it moves away from the elastic portion 13. The center line C is a line that passes through the center of the first connection portion 11 in the left-right direction and extends in the up-down direction.

[0054] The protrusion 111B protrudes upward (in the first direction, in this embodiment, in a direction away from the second connection portion 12). The protrusion 111B faces the inclined surface 111A with a gap in the left-right direction. The protruding tip (the upper end in this embodiment) of the protrusion 111B is located below the upper end of the inclined surface 111A and above the lower end of the inclined surface 111A. In other words, in the first direction, the protruding tip of the protrusion 111B is located between the end of the inclined surface 111A that is farther from the elastic portion 13 and the end that is closer to the elastic portion 13.

[0055] The terminal 81 of the contact object 8 can come into contact with the inclined surface 111A and the protrusion 111B. When the contact object 8 is fitted into the recess 3A of the housing 3, the terminal 81 has a U-shaped portion in a side view along the front-rear direction. In other words, the terminal 81 has a downwardly convex curved portion at the tip. The inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction.

[0056] In this embodiment, the first contact point 111 has only one inclined surface that can come into contact with the contact object 8. That is, in this embodiment, the only inclined surface of the first contact point 111 that can come into contact with the contact object 8 is the inclined surface 111A.

[0057] The second contact point 121 has a protruding shape and protrudes downward (in the present embodiment, in the direction away from the first connection point 11 in the first direction) from the lower end of the second connection point 12. The second contact point 121 has a notch 121C. The notch 121C is cut out from the lower surface of the second contact point 121 upward (towards the first connection point 11 in the first direction in the present embodiment).

[0058] The second connection portion 12 has a notch 12C. The notch 12C is provided between the second contact point 121 and the second portion 132 of the elastic portion 13. The notch 12C is cut out from the left-right end of the second connection portion 12 along the left-right direction.

[0059] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 have differences in their arrangement, configuration, etc., which will be described in detail below.

[0060] As shown in Fig. 5, the first probe pin 71 and the second probe pin 72 are arranged opposite to each other in the left-right direction so that the elastic portions 13 face outward in the left-right direction. As shown in Fig. 6, the third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other in the left-right direction so that the elastic portions 13 face outward in the left-right direction.

[0061] 5 and 6, the inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 are located on the curved portion 133 side of the elastic portion 13 at the first contact point 111 in the left-right direction. The inclined surfaces 111A of the first probe pin 71 and the fourth probe pin 74 face the opposite side of the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusions 111B of the first probe pin 71 and the fourth probe pin 74 are located on the opposite side of the inclined surface 111A from the curved portion 133 of the elastic portion 13 in the left-right direction.

[0062] The inclined surface 111A of the first probe pin 71 is located to the left of the first contact point 111 on the page of Fig. 5, extends downward toward the right, and faces upward and to the right. The protrusion 111B of the first probe pin 71 is located to the right of the inclined surface 111A of the first probe pin 71 on the page of Fig. 5. The inclined surface 111A of the fourth probe pin 74 is located to the right of the first contact point 111 on the page of Fig. 6, extends downward toward the left, and faces upward and to the left. The protrusion 111B of the fourth probe pin 74 is located to the left of the inclined surface 111A of the fourth probe pin 74 on the page of Fig. 6.

[0063] 5 and 6, the inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 are located on the opposite side of the first contact point 111 from the elastic portion 13 in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the third probe pin 73 face the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusions 111B of the second probe pin 72 and the third probe pin 73 are located on the elastic portion 13 side of the inclined surfaces 111A in the left-right direction.

[0064] The inclined surface 111A of the second probe pin 72 is located to the left of the first contact point 111 on the page of Fig. 5, extends downward toward the right, and faces upward and to the right. The protrusion 111B of the second probe pin 72 is located to the right of the inclined surface 111A of the second probe pin 72 on the page of Fig. 5. The inclined surface 111A of the third probe pin 73 is located to the right of the first contact point 111 on the page of Fig. 6, extends downward toward the left, and faces upward and to the left. The protrusion 111B of the third probe pin 73 is located to the left of the inclined surface 111A of the third probe pin 73 on the page of Fig. 6.

[0065] 5, the inclined surface 111A of the first contact point 111 of the first probe pin 71 and the inclined surface 111A of the first contact point 111 of the second probe pin 72 face the same side in the left-right direction (right in this embodiment). As shown in Fig. 6, the inclined surface 111A of the first contact point 111 of the third probe pin 73 and the inclined surface 111A of the first contact point 111 of the fourth probe pin 74 face the same side in the left-right direction (left in this embodiment).

[0066] 5 and 6, the inclined surface 111A (see FIG. 5) of the first contact point 111 of the first probe pin 71 and the inclined surface 111A (see FIG. 6) of the first contact point 111 of the third probe pin 73 face opposite sides in the left-right direction. The inclined surface 111A (see FIG. 5) of the first contact point 111 of the second probe pin 72 and the inclined surface 111A (see FIG. 6) of the first contact point 111 of the fourth probe pin 74 face opposite sides in the left-right direction.

[0067] Also, when viewed along the front-rear direction, the inclined surface 111A of the first contact point 111 of the first probe pin 71 and the inclined surface 111A of the first contact point 111 of the third probe pin 73 face each other in the left-right direction. When viewed along the front-rear direction, the inclined surface 111A of the first contact point 111 of the second probe pin 72 and the inclined surface 111A of the first contact point 111 of the fourth probe pin 74 face each other in the left-right direction.

[0068] The first probe pin 71 and the fourth probe pin 74 have a second contact 121 and a notch 12C. The second probe pin 72 and the third probe pin 73 have a second contact 122 instead of the second contact 121. The second contact 122 does not have the notch 12C. The second contact 122 differs from the second contact 121 in that it does not have the notch 121C.

[0069] In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the first contact 111 when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the inclined surface 111A when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, a portion of the second connecting portion 12 including the second contact 121 overlaps with the elastic portion 13 when viewed in the up-down direction. That is, in the first probe pin 71 and the fourth probe pin 74, at least a part of the portion of the second connecting portion 12 including the second contact 121 is located at the same position as at least a part of the elastic portion 13 in the left-right direction. Furthermore, in the first probe pin 71 and the fourth probe pin 74, the elastic portion 13 and the second contact 121 are located on the same side of the first connecting portion 11 in the left-right direction.

[0070] In the second probe pin 72 and the third probe pin 73, the second contact 122 and the first contact 111 are positioned so that at least a portion of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the first contact 111 in the left-right direction. Furthermore, in the second probe pin 72 and the third probe pin 73, the first contact 111 and the second contact 122 are positioned on the same side of the elastic portion 13 in the left-right direction. In the second probe pin 72 and the third probe pin 73, the second contact 122 and the inclined surface 111A are positioned so that at least a portion of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a portion of the second contact 122 is in the same position as at least a portion of the inclined surface 111A in the left-right direction. In the second probe pin 72 and the third probe pin 73, the inclined surface 111A and the second contact point 122 are located on the same side of the elastic portion 13 in the left-right direction.

[0071] As shown in Fig. 5, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left side of the first contact point 111. As shown in Fig. 6, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first contact point 111. The left side in Figs. 5 and 6 (and Figs. 7 to 10 described later) is an example of one side in the left-right direction, and the right side in Figs. 5 and 6 (and Figs. 7 to 10 described later) is an example of the other side in the left-right direction.

[0072] 5 and 6 , the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73. That is, when viewed in the front-rear direction, the second contact 121 of the first probe pin 71 does not overlap with the second contact 122 of the third probe pin 73. That is, in the left-right direction, the second contact 121 of the first probe pin 71 is located at a different position from the second contact 122 of the third probe pin 73. Note that, when viewed in the front-rear direction, the second contact 121 of the first probe pin 71 may only partially overlap with the second contact 122 of the third probe pin 73. That is, the second contact 121 of the first probe pin 71 may be located at a partial position coincident with the second contact 122 of the third probe pin 73.

[0073] The second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, when viewed in the front-rear direction, the second contact 122 of the second probe pin 72 does not overlap with the second contact 121 of the fourth probe pin 74. In other words, in the left-right direction, the second contact 122 of the second probe pin 72 is located at a different position from the second contact 121 of the fourth probe pin 74. Note that, when viewed in the front-rear direction, the second contact 122 of the second probe pin 72 may only partially overlap with the second contact 121 of the fourth probe pin 74. In other words, the second contact 122 of the second probe pin 72 may be located at a partial position coincident with the second contact 121 of the fourth probe pin 74.

[0074] As described above, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left part of the first contact point 111. Furthermore, the second contact point 121 of the first probe pin 71 is located to the left of the second contact point 122 of the third probe pin 73, and the second contact point 122 of the second probe pin 72 is located to the left of the second contact point 121 of the fourth probe pin 74. In other words, the inclined surface 111A of the first contact point 111 of the first probe pin 71 is located on the left side in the left-right direction, which is the side of the first contact point 111 of the first probe pin 71 where the second contact point 121 of the first probe pin 71 is located relative to the second contact point 122 of the third probe pin 73. In addition, the inclined surface 111A of the first contact 111 of the second probe pin 72 is located on the left side in the left-right direction, which is the side of the first contact 111 of the second probe pin 72 where the second contact 122 of the second probe pin 72 is located relative to the second contact 121 of the fourth probe pin 74.

[0075] As described above, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right part of the first contact point 111. In addition, the second contact point 122 of the third probe pin 73 is located to the right of the second contact point 121 of the first probe pin 71, and the second contact point 121 of the fourth probe pin 74 is located to the right of the second contact point 122 of the second probe pin 72. In other words, the inclined surface 111A of the first contact point 111 of the third probe pin 73 is The first contact 111 of the third probe pin 73 is disposed on the right side, that is, on the side where the second contact 122 of the third probe pin 73 is disposed relative to the second contact 121 of the first probe pin 71. The inclined surface 111A of the first contact 111 of the fourth probe pin 74 is disposed on the right side, that is, on the side where the second contact 121 of the fourth probe pin 74 is disposed relative to the second contact 122 of the second probe pin 72, that is, on the side where the first contact 111 of the fourth probe pin 74 is disposed relative to the second contact 122 of the second probe pin 72.

[0076] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 can exert the following effects.

[0077] In the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the length L2 in the up-down direction between the end 11A and the end 12A is longer than the inner radius R1 of the curve of the elastic portion 13. The edge portion 12B of the second connection portion 12 on the first connection portion 11 side in the up-down direction extends so as to move away from the first connection portion 11 in the up-down direction as it moves away from the elastic portion 13 in the left-right direction. Therefore, in the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the up-down stroke of the elastic portion 13 can be increased. As a result, the contact reliability of the probe pins 7 can be improved.

[0078] The second portion 132 extends so as to approach the first end 13A in the up-down direction as it approaches the second end 13B in the left-right direction. Therefore, the area of ​​each probe pin 7 occupied by the elastic portion 13 can be reduced.

[0079] The elastic portion 13 includes a plurality of long plate portions 134. The more the plurality of long plate portions 134 are positioned on the outside of the curved shape of the curved portion 133, the longer they are in the width direction. This allows the elastic portion 13 to bend easily.

[0080] The first contact 111 has an inclined surface 111A that can come into contact with the contact object 8. For example, if the terminal 81 of the contact object 8 has a curved portion at its tip, the inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction. If only one side of the curved portion of the terminal 81 is gold-plated and the other side is tin-plated, the inclined surface 111A can come into contact with the gold-plated portion.

[0081] The first contact point 111 has a protrusion 111B in addition to the inclined surface 111A, so that the first contact point 111 can come into contact with the contact object 8 at multiple points.

[0082] The first probe pin 71 and the fourth probe pin 74 can exert the following effects.

[0083] When viewed in the up-down direction, the second contacts 121 of the first probe pin 71 and the fourth probe pin 74 are positioned away from the inclined surface 111A. Therefore, in a configuration in which the first probe pin 71 and the third probe pin 73 are arranged side by side in the front-rear direction, the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be positioned at different positions in the left-right direction. Similarly, in a configuration in which the fourth probe pin 74 and the second probe pin 72 are arranged side by side in the front-rear direction, the second contact 121 of the fourth probe pin 74 and the second contact 122 of the second probe pin 72 can be positioned at different positions in the left-right direction.

[0084] The second connection portions 12 of the first probe pin 71 and the fourth probe pin 74 have notches 12C, which allow the second contact points 121 to bend in the vertical direction.

[0085] The second probe pin 72 and the third probe pin 73 can provide the following effects.

[0086] When viewed in the up-down direction, at least a portion of the second contacts 122 of the second probe pin 72 and the third probe pin 73 overlaps at least a portion of the inclined surface 111A. Therefore, in a configuration in which the second probe pin 72 and the fourth probe pin 74 are arranged side by side in the front-rear direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different positions in the left-right direction. Similarly, in a configuration in which the third probe pin 73 and the first probe pin 71 are arranged side by side in the front-rear direction, the second contact 122 of the third probe pin 73 and the second contact 121 of the first probe pin 71 can be positioned at different positions in the left-right direction.

[0087] The test socket 1 can provide the following effects:

[0088] The second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. With this configuration, when the first probe pins 71 and the third probe pins 73 are arranged alternately in the front-rear direction, the pitch between two adjacent second contacts in the front-rear direction can be increased, as described in detail below. If the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 are located at the same position in the left-right direction, the second contacts 121, 122 of the first probe pins 71 and the third probe pins 73 arranged alternately in the front-rear direction will be adjacent to each other in the front-rear direction. On the other hand, when the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, the second contacts 121, 122 of the first probe pins 71 and the third probe pins 73, which are alternately arranged in the front-rear direction, are not adjacent to each other in the front-rear direction. In this case, the second contacts 121, 121 of the two first probe pins 71 are adjacent to each other in the front-rear direction. In other words, since the third probe pin 73 is not located between the two first probe pins 71, the pitch between two adjacent second contacts becomes larger. Similarly, when the second probe pins 72 and the fourth probe pins 74 are alternately arranged in the front-rear direction, the pitch between two adjacent second contacts in the front-rear direction can also be increased. As a result, the contact reliability of the inspection socket 1 can be improved.

[0089] If the spacing between the probe pins is narrow, the spacing between the pads on the board on which the test socket is mounted also becomes narrow, which may make it difficult to form the pads. As described above, the test socket 1 of this embodiment can increase the pitch between two adjacent second contacts in the front-to-rear direction. This allows the pad spacing on the board to be increased, making it easier to form the pads.

[0090] When viewed in the up-down direction, the first contact 111 of the first probe pin 71 and the fourth probe pin 74 is positioned away from the second contact 121. When viewed in the up-down direction, the first contact 111 of the second probe pin 72 and the third probe pin 73 is positioned so as to overlap with the second contact 122. As a result, when the first probe pins 71 and the third probe pins 73 are alternately arranged in the front-rear direction, the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 can be positioned at different positions in the left-right direction. Furthermore, when the second probe pins 72 and the fourth probe pins 74 are alternately arranged in the front-rear direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different positions in the left-right direction.

[0091] The third probe pin 73 has the same configuration as the second probe pin 72, but is arranged in the opposite left-right direction to the second probe pin 72. The fourth probe pin 74 has the same configuration as the first probe pin 71, but is arranged in the opposite left-right direction to the first probe pin 71. This allows the number of types of probe pins included in the testing socket 1 to be reduced.

[0092] The inclined surfaces 111A of the first probe pin 71 and the second probe pin 72, which are arranged opposite each other in the left-right direction, face the same side in the left-right direction. The inclined surfaces 111A of the third probe pin 73 and the fourth probe pin 74, which are arranged opposite each other in the left-right direction, face the same side in the left-right direction. This allows the inclined surfaces 111A of the two probe pins arranged opposite each other in the left-right direction to come into contact with the contact target 8 from the same side in the left-right direction.

[0093] The inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-rear direction, face opposite sides in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-rear direction, face opposite sides in the left-right direction. This allows the inclined surfaces 111A of the two probe pins arranged side by side in the front-rear direction to come into contact with the contact target 8 from opposite sides in the left-right direction.

[0094] When viewed along the front-rear direction, the inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-rear direction, face each other in the left-right direction. When viewed along the front-rear direction, the inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-rear direction, face each other in the left-right direction. This allows the inclined surfaces 111A of the probe pins to come into contact with the contact object 8 from the outside in the left-right direction.

[0095] The first contact point 111 of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 has only one inclined surface 111A that can come into contact with the contact object 8. If the first contact point 111 had two inclined surfaces that can come into contact with the contact object 8, the contact object 8 would be pressed against one inclined surface, increasing the possibility that the contact object 8 would be separated from the other inclined surface. However, with this configuration, it is possible to reduce the possibility that the inclined surface 111A will not come into contact with a desired position on the contact object 8.

[0096] Test socket 1 can also be configured as follows:

[0097] In the above-described embodiment, the configuration has been described in which the test socket 1 is provided with two types of probe pins 7. One of the two types of probe pins 7 is the first probe pin 71 and the fourth probe pin 74, which have the same configuration. The other of the two types of probe pins 7 is the second probe pin 72 and the third probe pin 73, which have the same configuration. However, the types of probe pins 7 provided in the test socket 1 are not limited to two.

[0098] 7 and 8 show a configuration in which the inspection socket 1 is provided with four types of probe pins 7. In FIGS. 7 and 8, parts having the same configuration as the probe pins shown in FIGS. 5 and 6 are denoted by the same reference numerals, and descriptions thereof will be omitted. In the configuration shown in FIGS. 7 and 8, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 each have second contacts with different configurations. That is, the first probe pin 71 has a second contact 123, the second probe pin 72 has a second contact 124, the third probe pin 73 has a second contact 125, and the fourth probe pin 74 has a second contact 126. The second contacts 123, 124, 125, and 126 differ in the number of notches they have. Second contact 123 has three notches, second contact 124 has two notches, second contact 125 has no notches, and second contact 126 has one notch.

[0099] In the above-described embodiment, the first contact point 111 has only one inclined surface 111A that can come into contact with the contact object 8. However, the first contact point 111 may have a plurality of inclined surfaces.

[0100] 9 and 10 show a configuration in which the first contact 111 has two inclined surfaces (inclined surface 111A and second inclined surface 111C). In FIGS. 9 and 10, parts having the same configuration as those of the probe pins shown in FIGS. 5 and 6 are given the same reference numerals, and descriptions thereof will be omitted. In the configuration shown in FIGS. 9 and 10, the first contact 111 of each probe pin 7 has a second inclined surface 111C in addition to the inclined surface 111A. The second inclined surface 111C faces the inclined surface 111A in the left-right direction. The inclined surface 111C is inclined in the opposite direction to the inclined surface 111A that faces it in the left-right direction. For example, if the inclined surface 111A is inclined to face up to the upper right, the second inclined surface 111C is inclined to face up to the upper left. Like the inclined surface 111A, the terminal 81 of the contact object 8 can come into contact with the second inclined surface 111C. The inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction. On the other hand, the second inclined surface 111C comes into contact with the curved portion of the terminal 81 from the other side in the left-right direction.

[0101] The shape and configuration of the housings 2, 3, 4, 5, and 6 can be changed as desired depending on the design of the inspection socket 1. For example, the shape of the housings 2, 3, 4, 5, and 6 is not limited to a substantially rectangular prism, but may be a substantially cylindrical shape or a substantially polygonal shape other than a substantially rectangular prism. The housing 10 is not limited to being made up of five members, but may be made up of one member or a number of members other than five.

[0102] The number of probe pins 7 that the inspection socket 1 has can be changed as desired depending on the design of the inspection socket 1 and the like.

[0103] For example, in the configuration shown in FIGS. 3 and 4 , the probe pins 7 include thirteen first probe pins 71, thirteen second probe pins 72, thirteen third probe pins 73, thirteen fourth probe pins 74, two fifth probe pins 75, and two sixth probe pins 76. Here, a pair of probe pins 71, 72 facing each other in the left-right direction and a pair of probe pins 73, 74 facing each other in the left-right direction are arranged side by side in the front-to-back direction to form a single probe tweezers. In this case, in the configuration shown in FIGS. 3 and 4 , thirteen probe tweezers are arranged side by side in the front-to-back direction. This arrangement results in a configuration in which the second contacts 121, 122 adjacent to each other are positioned at different positions in the left-to-right direction when viewed vertically. The number of probe tweezers arranged side by side in the front-to-back direction may be any number other than thirteen.

[0104] Various embodiments of the present disclosure have been described in detail above with reference to the drawings. Finally, various aspects of the present disclosure will be described. Note that in the following description, reference numerals will also be used as examples.

[0105] (1) The test socket 1 of the present disclosure is Housing 5 and a first probe pin (71), a second probe pin (72), a third probe pin (73), and a fourth probe pin (74), each having a first contact (111) provided at one end in a first direction and second contacts (121, 122) provided at the other end in the first direction, and each supported by the housing (5); The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction, The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction, In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side, In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side, the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction; the second contact point 122 of the second probe pin 72 is located between the second contact point 122 of the third probe pin 73 and the second contact point 121 of the fourth probe pin 74 in the second direction; When the contact object 8 is brought into contact with the first contact 111 of the first probe pin 71 and the first contact 111 of the third probe pin 73 from the first direction, the first contact 111 of the first probe pin 71 comes into contact with the contact object 8 at a first position, and the first contact 111 of the third probe pin 73 comes into contact with the contact object 8 at a second position different from the first position in the second direction.

[0106] (2) In the test socket 1 of (1), When the contact object 8 is brought into contact with the first contact point 111 of the second probe pin 72 and the first contact point 111 of the fourth probe pin 74 from the first direction, the first contact point 111 of the second probe pin 72 may come into contact with the contact object 8 at a third position, and the first contact point 111 of the fourth probe pin 74 may come into contact with the contact object 8 at a fourth position different from the third position in the second direction.

[0107] (3) The inspection socket 1 of the present disclosure is Housing 5 and a first probe pin (71), a second probe pin (72), a third probe pin (73), and a fourth probe pin (74), each having a first contact (111) provided at one end in a first direction and second contacts (121, 122) provided at the other end in the first direction, and each supported by the housing (5); The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction, The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction, In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side, In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side, the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction; the second contact point 122 of the second probe pin 72 is located between the second contact point 122 of the third probe pin 73 and the second contact point 121 of the fourth probe pin 74 in the second direction; When viewed in the third direction, the shape of the first contact 111 of the first probe pin 71 is different from the shape of the first contact 111 of the third probe pin 73 .

[0108] (4) In the test socket 1 of (3), When viewed along the third direction, the shape of the first contact 111 of the second probe pin 72 may be different from the shape of the first contact 111 of the fourth probe pin 74 .

[0109] (5) In any one of the test sockets (1) to (4), The first contact point 111 of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may have an inclined surface 111A.

[0110] (6) In the test socket 1 of (5), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the second probe pin 72 may face the same side in the second direction, The inclined surface 111A of the third probe pin 73 and the inclined surface 111A of the fourth probe pin 74 may face the same side in the second direction.

[0111] (7) In the inspection socket 1 of (5) or (6), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the third probe pin 73 may face opposite sides in the second direction, The inclined surface 111A of the second probe pin 72 and the inclined surface 111A of the fourth probe pin 74 may face opposite directions in the second direction.

[0112] (8) In any one of the test sockets 1 in (5) to (7), The inclined surface 111A of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may be capable of coming into contact with the contact object 8.

[0113] (9) In any one of the test sockets 1 in (5) to (8), In the second direction, the position of the inclined surface 111A of the first probe pin 71 may be different from the position of the inclined surface 111A of the third probe pin 73.

[0114] (10) In any one of the test sockets 1 in (5) to (9), In the second direction, the position of the inclined surface 111A of the second probe pin 72 may be different from the position of the inclined surface 111A of the fourth probe pin 74.

[0115] (11) In any one of the test sockets 1 (1) to (10), When viewed along the first direction, the first contact point 111 of the first probe pin 71 may be located at a position displaced from the second contact point 121 of the first probe pin 71, When viewed along the first direction, the first contact point 111 of the fourth probe pin 74 may be located at a position displaced from the second contact point 121 of the fourth probe pin 74 .

[0116] (12) In any one of the test sockets 1 (1) to (11), When viewed along the first direction, the first contact 111 of the second probe pin 72 and the second contact 122 of the second probe pin 72 may be positioned to partially overlap each other, When viewed along the first direction, the first contact point 111 of the third probe pin 73 and the second contact point 122 of the third probe pin 73 may be positioned so as to partially overlap each other.

[0117] (13) In any one of the test sockets (1) to (12), The third probe pin 73 may have the same configuration as the second probe pin 72 and may be arranged in the opposite direction to the second probe pin 72 in the second direction.

[0118] (14) In any one of the test sockets 1 (1) to (13), The fourth probe pin 74 may have the same configuration as the first probe pin 71 and may be arranged in the opposite direction to the first probe pin 71 in the second direction.

[0119] (15) In any one of the test sockets 1 (1) to (14), The first probe pin 71 may include an identification portion 121C that enables identification of the second probe pin 72.

[0120] (16) Any one of the test sockets (1) to (15) is A fifth probe pin 75 may be a power terminal or a ground terminal and is supported by the housing 5 .

[0121] (17) Inspection socket 1 of (16) is Two of the fifth probe pins 75 may be provided, The two fifth probe pins 75 may sandwich the first probe pin 71 and the third probe pin 73 in the third direction.

[0122] (18) In the inspection socket 1 of (16) or (17), The thickness of the fifth probe pin 75 may be greater than the thickness of the first probe pin 71 .

[0123] (19) In any one of the test sockets 1 of (16) to (18), In the third direction, the gap between the fifth probe pin 75 and the first probe pin 71 may be larger than the gap between the first probe pin 71 and the third probe pin 73 .

[0124] (20) In any one of the test sockets 1 of (16) to (19), Each of the first probe pin 71 and the fifth probe pin 75 may include an elastic portion 13 having a curved portion, When viewed in the third direction, the shape of the elastic portion 13 of the fifth probe pin 75 may be different from the shape of the elastic portion 13 of the first probe pin 71.

[0125] (21) Any one of the test sockets (16) to (20) is and a sixth probe pin (76) supported by the housing (5) as a power terminal or a ground terminal; The fifth probe pin 75 and the sixth probe pin 76 may be arranged opposite to each other with a gap in between in the second direction.

[0126] (22) (21) Inspection socket 1 is Two sixth probe pins 76 may be provided; The two sixth probe pins 76 may sandwich the second probe pin 72 and the fourth probe pin 74 in the third direction.

[0127] (23) In the inspection socket 1 of (21) or (22), The sixth probe pin 76 may have the same configuration as the fifth probe pin 75 and may be arranged in the opposite direction to the fifth probe pin 75 in the second direction.

[0128] Although the present disclosure has been fully described in connection with the preferred embodiments with reference to the accompanying drawings, various changes and modifications will be apparent to those skilled in the art, and such changes and modifications are to be understood as being included within the scope of the present disclosure as defined by the appended claims unless they depart therefrom. [Industrial Applicability]

[0129] The test socket of the present disclosure can be applied to a test device used to test electronic modules such as optical modules, for example. [Explanation of symbols]

[0130] 1 Inspection socket 2, 3, 4, 5, 6 Housing 11 First connection part 11A end 12 Second connection part 12A end 12C notch 13 Elastic part 131 Part 1 132 Part 2 133 Curved section 134 Long board section 13A 1st end 13B 2nd end 71 First probe pin 72 Second probe pin 73 Third probe pin 74 4th probe pin 111 First Contact 111A Slope 111B Protrusion 121, 122 Second contact

Claims

1. Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; the second probe pin and the fourth probe pin are arranged side by side in the third direction; the first contact point of each of the first probe pin and the third probe pin has a protrusion that protrudes in the first direction and that comes into contact with a contact object in the first direction; The position of the protrusion of the first probe pin and the position of the protrusion of the third probe pin are different in the second direction.

2. 2. The test socket according to claim 1, wherein a distance in the second direction between the second contact point of the first probe pin and the second contact point of the third probe pin is the same as a distance in the second direction between the second contact point of the second probe pin and the second contact point of the fourth probe pin.

3. the first contact point of each of the second probe pin and the fourth probe pin has a protrusion that protrudes in the first direction and that comes into contact with a contact object in the first direction; The test socket according to claim 1 , wherein the position of the protrusion of the second probe pin and the position of the protrusion of the fourth probe pin are different in the second direction.

4. the first contact point of each of the first probe pin and the third probe pin has at least one inclined surface positioned with a gap from the protrusion in the second direction; The contact object is a first terminal having at least one curved surface and capable of contacting the inclined surface of the first probe pin from the first direction; 2. The test socket according to claim 1, further comprising a third terminal having at least one curved surface and capable of contacting the inclined surface of the third probe pin from the first direction.

5. the first terminal has a linear portion extending from one end of the at least one curved surface along the second direction and capable of contacting the protrusion of the first probe pin from the first direction; 5. The test socket according to claim 4, wherein the third terminal has a straight portion that extends from one end of the at least one curved surface along the second direction and is capable of contacting the protrusion of the third probe pin from the first direction.

6. the first contact point of each of the second probe pin and the fourth probe pin has at least one inclined surface positioned with a gap from the protrusion in the second direction; The contact object is a second terminal having at least one curved surface and capable of contacting the inclined surface of the second probe pin from the first direction; 4. The test socket according to claim 3, further comprising a fourth terminal having at least one curved surface and capable of contacting the inclined surface of the fourth probe pin from the first direction.

7. the second terminal has a linear portion extending from one end of the at least one curved surface along the second direction and capable of contacting the protrusion of the second probe pin from the first direction; 7. The test socket according to claim 6, wherein the fourth terminal has a straight portion that extends from one end of the at least one curved surface along the second direction and is capable of contacting the protrusion of the fourth probe pin from the first direction.

8. The at least one curved surface is a first curved surface; a second curved surface that is located at a different position from the first curved surface in the second direction, 5. The test socket according to claim 4, wherein when the contact object comes into contact with the first probe pin and the third probe pin, the inclined surface of the first probe pin comes into contact with the first curved surface of the first terminal, and the inclined surface of the third probe pin comes into contact with the second curved surface of the third terminal.

9. The at least one curved surface is a first curved surface; a second curved surface that is located at a different position from the first curved surface in the second direction, 7. The test socket according to claim 6, wherein when the contact object comes into contact with the second probe pin and the fourth probe pin, the inclined surface of the second probe pin comes into contact with the first curved surface of the second terminal, and the inclined surface of the fourth probe pin comes into contact with the second curved surface of the fourth terminal.

10. Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; the second probe pin and the fourth probe pin are arranged side by side in the third direction; the first contact point of each of the first probe pin and the third probe pin has an inclined surface; When viewed along the third direction, the inclined surface of the first probe pin is at a different position in the second direction from the inclined surface of the third probe pin.

11. 11. The test socket of claim 10, wherein a distance in the second direction between the second contact point of the first probe pin and the second contact point of the third probe pin is the same as a distance in the second direction between the second contact point of the second probe pin and the second contact point of the fourth probe pin.

12. the first contact point of each of the second probe pin and the fourth probe pin has an inclined surface; 11. The test socket of claim 10, wherein when viewed along the third direction, the inclined surface of the second probe pin is at a different position in the second direction from the inclined surface of the fourth probe pin.

13. the inclined surface of the first probe pin and the inclined surface of the second probe pin face the same side in the second direction; The test socket according to claim 4 , wherein the inclined surface of the third probe pin and the inclined surface of the fourth probe pin face the same side in the second direction.

14. the inclined surface of the first probe pin and the inclined surface of the third probe pin face opposite sides in the second direction; The test socket according to claim 4 , wherein the inclined surface of the second probe pin and the inclined surface of the fourth probe pin face opposite sides in the second direction.

15. 13. The test socket according to claim 10, wherein the inclined surface of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin is capable of coming into contact with a contact object.

16. The test socket according to claim 4 , wherein a position of the inclined surface of the first probe pin is different from a position of the inclined surface of the third probe pin in the second direction.

17. The test socket according to claim 4 , wherein a position of the inclined surface of the second probe pin is different from a position of the inclined surface of the fourth probe pin in the second direction.

18. When viewed along the first direction, the first contact point of the first probe pin is located at a position offset from the second contact point of the first probe pin; 13. The test socket of claim 1, wherein the first contact point of the fourth probe pin is positioned away from the second contact point of the fourth probe pin when viewed along the first direction.

19. When viewed along the first direction, the first contact point of the second probe pin and the second contact point of the second probe pin are positioned so as to partially overlap each other, 13. The test socket according to claim 1, wherein the first contact point of the third probe pin and the second contact point of the third probe pin are positioned so as to partially overlap each other when viewed along the first direction.

20. 13. The test socket according to claim 1, wherein the third probe pins have the same configuration as the second probe pins and are arranged in an opposite direction to the second probe pins in the second direction.

21. 13. The test socket according to claim 1, wherein the fourth probe pin has the same configuration as the first probe pin and is arranged in an opposite direction to the first probe pin in the second direction.

22. The test socket according to claim 1 , wherein the first probe pin has an identification portion that enables the first probe pin to be identified from the second probe pin.

23. 13. The test socket of claim 1, further comprising a fifth probe pin, the fifth probe pin being a power terminal or a ground terminal, supported by the housing.

24. two of the fifth probe pins; 24. The test socket of claim 23, wherein the two fifth probe pins sandwich the first probe pin and the third probe pin in the third direction.

25. 24. The test socket of claim 23, wherein the thickness of the fifth probe pin is greater than the thickness of the first probe pin.

26. 24. The test socket of claim 23, wherein a gap between the fifth probe pin and the first probe pin in the third direction is larger than a gap between the first probe pin and the third probe pin.

27. a sixth probe pin, which is a power terminal or a ground terminal, supported by the housing; 24. The test socket according to claim 23, wherein the fifth probe pin and the sixth probe pin are arranged opposite to each other with a gap in the second direction.

28. two sixth probe pins; 28. The test socket of claim 27, wherein the two sixth probe pins sandwich the second probe pin and the fourth probe pin in the third direction.

29. 28. The test socket according to claim 27, wherein the sixth probe pin has the same configuration as the fifth probe pin and is arranged in an opposite direction to the fifth probe pin in the second direction.

30. Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin, each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; the second probe pin and the fourth probe pin are arranged side by side in the third direction; the first contact point of each of the first probe pin and the third probe pin has an inclined surface; when viewed along the third direction, an end of the inclined surface of the first probe pin on the second contact side in the first direction is at a different position in the second direction from an end of the inclined surface of the third probe pin on the second contact side in the first direction.

31. 31. The test socket of claim 30, wherein a distance in the second direction between the second contact point of the first probe pin and the second contact point of the third probe pin is the same as a distance in the second direction between the second contact point of the second probe pin and the second contact point of the fourth probe pin.

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