Industrial inspection apparatus and inspection method for producing energy cells, and manufacturing method for manufacturing the inspection apparatus

Abstract

An industrial inspection device (1) for producing energy cells, the inspection device (1) being configured to inspect a planar element (2) suitable for forming a cell stack, the inspection device (1) comprising a plurality of inspection units (4), the inspection units (4) being movable relative to a fixed part (5) of the inspection device (1) by means of a transport device (3), the inspection units (4) each having at least two contact surfaces (6, 7, 8) for making electrical and / or signal-technical contact connections to the planar element (2) to be inspected, the inspection units (4) each having one carrier (9) having electrical insulation properties, by means of which carrier (9) the contact surfaces (6, 7, 8) of each inspection unit (4) are supported relative to one another in a predefined position and orientation, the carrier (9) of the inspection unit (4) being attached to the transport device (3), an industrial inspection device (1) for producing energy cells.

Description

Technical Field

[0001] The present invention relates to an industrial inspection device for producing energy cells, which is configured to inspect planar elements suitable for forming a cell laminate. Further, the present invention relates to a corresponding inspection method and a manufacturing method for manufacturing the inspection device.

Background Art

[0002] Energy cells or energy accumulator cells, such as battery cells, are used for energy storage in, for example, automobiles and other land vehicles, ships, and aircraft, where a significant amount of energy must be stored extractably over a relatively long period. For this purpose, such energy cells have a structure consisting of a number of planar elements laminated into one laminate, hereinafter referred to as a cell laminate. These planar elements are formed, for example, by monocells. A monocell is, in turn, an alternating anode sheet and cathode sheet, also referred to as electrodes, which are isolated from each other by a separator sheet. One monocell typically has the layer sequence: separator - electrode (e.g., anode) - separator - electrode (e.g., cathode).

[0003] The planar elements are precut in the manufacturing process and then stacked in a predetermined order to form a cell laminate and are bonded to each other, for example, by lamination.

[0004] Devices for manufacturing battery cells are known, for example, from Patent Document 1 and Patent Document 2.

[0005] It can happen that the planar elements are damaged during the manufacturing process. In the case of planar elements in the form of monocells, for example, the separator can be damaged during production. If a monocell containing a damaged separator is used for forming a cell laminate, this can have a negative impact on the functionality and lifespan of the cell laminate.

[0006] The energy cell may be, for example, a fuel cell or a solar cell, and in the case of a fuel cell or a solar cell as well, planar elements may also be damaged during production.

[0007] Therefore, it is known in principle in the prior art to inspect planar elements before the lamination process and, in some cases, exclude them from the manufacturing process, and as a result, use only defect-free planar elements for the formation of the cell stack.

[0008] Such an inspection process must be carried out while taking into account the production output and transport speed of today's production equipment. Therefore, it is known in principle in the prior art to provide a plurality of test devices that travel during the production process together with the planar elements, and for these test devices to inspect the planar elements one after another. For this purpose, the test devices actively make contact connections with so-called conductor tabs, which are components of the electrodes of the planar elements. In the case of such an inspection method, however, based on discontinuous movement, the output of the machine is limited. Furthermore, the planar elements may be damaged during the contact connection of the conductor tabs.

Prior Art Documents

Patent Documents

[0009]

Patent Document 1

Patent Document 2

Summary of the Invention

Problems to be Solved by the Invention

[0010] The problem of the present application is to present an improved inspection device for inspecting planar elements, a corresponding inspection method, and a manufacturing method for manufacturing the inspection device.

Means for Solving the Problems

[0011] The above problem is solved by the features of the independent claims. Further preferred embodiments of the present invention are discernible from the dependent claims, the figures and the corresponding description.

[0012] According to a first aspect of the present application, to solve the above problem, there is provided an industrial inspection device for producing energy cells, the inspection device being configured to inspect planar elements suitable for forming a cell stack, the inspection device comprising a plurality of inspection units, the inspection units being movable relative to a fixed part of the inspection device by a transport device, the inspection units each having at least two contact surfaces for making electrical and / or signal-technical contact connections to the planar element to be inspected, the inspection units each having one carrier having an electrically insulating property, by which carriers the contact surfaces of the respective inspection units are supported relative to each other in a predefined position and orientation, and the carriers of the inspection units being attached to the transport device, and an industrial inspection device for producing energy cells is proposed.

[0013] By positioning the contact surfaces using the carriers, the contact surfaces can be easily attached to the transport device. Further, the contact surfaces of each inspection unit are electrically insulated and supported relative to each other by the insulating property of the carriers, so that as a result, the planar element can be inspected by contacting the contact surfaces of the inspection units without any disturbing influence. For this purpose, the contact surfaces are preferably connected or connectable to a measuring device. Further, the contact surfaces are electrically insulated from the transport device by the carriers, so that as a result, for example, the transport device can be configured to be electrically conductive. The carrier elements may be formed, for example, only partially, and further, for example, only on the surface, from an electrically insulating material. Preferably, however, the carrier consists entirely of an electrically insulating material, for example plastic.

[0014] Preferably, the planar element to be inspected is a monocell.

[0015] Preferably, the number of carriers attached to the conveying device is a multiple of 3 or 4. In particular, it has been found that exactly 12 carriers are advantageous. This is because this number represents an ideal compromise between, on the one hand, the parallelization of measurements and, on the other hand, the number of measuring devices that can still be approved.

[0016] Preferably, the conveying device is formed by a drum that is rotatably supported, and the inspection unit is attached to the outer peripheral surface of the drum that is located radially outside. Thereby, the planar element to be inspected can be measured while the planar element is moved on a circular orbit. Thus, the measurement is carried out particularly simply and efficiently during the conveying movement of the planar element. In such a case, the inspection device can also be referred to as an inspection drum.

[0017] Furthermore, according to the proposed solution, each inspection unit has first and second contact surfaces, and the first and second contact surfaces are configured to make electrical and / or signal-technical contact connections with two electrodes of the planar element when the planar element abuts against the inspection unit. The inspection unit has a third contact surface each for making electrical and / or signal-technical contact connections with the separators of the planar element that abuts against the inspection unit. By arranging the three contact surfaces of one inspection unit on the carrier in this way, the separators of the monocells can be inspected in an advantageous manner separately from each other without the need for the monocells to be removed from the inspection unit. The third contact surface is thereby used as a temporary electrode assigned to the inspection device, and using these electrodes, the outer separators of the planar element can be inspected. It is expressly noted that the disclosure of the present application also includes the proposed inspection device including one or more planar elements in the form of, for example, monocells supported within the inspection unit.

[0018] Preferably, the contact surfaces are each formed by a thin metal sheet. Using a thin metal sheet has been found to be advantageous in actual use. This is because the thin metal sheet can be easily brought into the desired shape and at the same time forms a planar, and thus non-damaging base for the conductor tabs. Preferably, the thin metal sheet is formed from a material having extremely good electrical conductivity, for example copper, gold, silver, nickel, aluminum or steel. Furthermore, it is possible to use specially processed thin metal sheets, for example thin metal sheets having a coating consisting of nickel and / or gold.

[0019] Preferably, the contact surfaces are attached to the carrier by a material bond or a form-fit bond. As a material bond, for example, an adhesive bond can be considered. In the case of a form-fit bond, the bond can be formed, for example, by a screw connection, and it has been found to be advantageous to screw the corresponding screw from the side of the transport device to the contact surface. Thus, it can be ensured that the planar element abuts against the contact surface during the inspection process without affecting the screw connection. When the transport device is formed by a drum that is rotatably supported, the screw fastening of the contact surface to the carrier is carried out correspondingly from the radially inner side.

[0020] Preferably, the carrier is formed by a decomposable carrier element, preferably a one-piece decomposable carrier element, and the carrier element is attached to the conveying device by attachment means. Preferably, the attachment means is formed by attachment means releasable using tools. More preferably, the attachment means is formed by countersunk screws or socket screws, so that the screw head does not protrude from the upper surface of the carrier element to which the contact surface is also attached. The screw connection further provides the advantage that individual inspection units can be replaced with little effort or cost when necessary, for example in case of damage or for maintenance measures. The inspection unit thus forms a module, and the module can be replaced as a whole. The contact surface can be assembled on the carrier before the carrier is attached to the conveying device. This reduces the downtime of the inspection device during assembly or maintenance work.

[0021] The carrier is preferably formed by a dielectric structure, for example the carrier is formed by plastic parts. Further, for example, the carrier may be a cast molded part or a 3D printed part.

[0022] When the conveying device is formed by a drum, various geometric shapes can be considered for the carrier. When the drum has a cylindrical outer peripheral surface, the carrier preferably has a concave surface with a radius corresponding to the drum on the lower surface of the carrier facing the drum. When the outer peripheral surface has a number of flat surfaces, the carrier preferably has a flat surface on the lower surface of the carrier facing the drum. Depending on the configuration of the contact surface, the upper surface of the carrier facing the contact surface can be configured to be flat or convex. In the first embodiment, the surface of the contact surface is formed convex, and as a result, the contact surface formed by a thin metal plate is bent so as to be placed planar on the convex upper surface of the carrier. Thus, the side of the contact surface facing the planar element is also concave. In the second embodiment, the thin plate forming the contact surface is configured to be thicker than in the first embodiment. The thin plate can thus be placed flat on the flat upper surface of the carrier. The concave shape on the side where the planar element of the contact surface abuts during operation can be generated, for example, by machining.

[0023] When referring to the convex or concave surfaces of the carrier or the contact surface within the scope of the present application, this geometric shape relates to the corresponding cross-section extending perpendicular to the axis of rotation of the drum of the assembled carrier or contact surface.

[0024] Instead of configuring the carrier as a detachable carrier element, the carrier may be formed by an adhesive medium layer. The adhesive medium layer also has electrically insulating properties in this case. The adhesive medium electrically insulates the contact surfaces from each other and from the conveying device. Furthermore, the orientation and arrangement of the contact surfaces of the inspection unit can be easily determined by the adhesive medium.

[0025] Furthermore, according to a further proposal, a cavity is provided on the upper surface of the carrier, and the cavity is configured to correspond to the shape of the contact surface. The cavity provides a more reliable orientation of the contact surface.

[0026] Preferably, the carrier has a plurality of air passages, and the air passages fluid-technically connect the lower surface of the carrier to the upper surface of the carrier. The air passages can be connected, for example, to the pipeline system of the conveying device, and a negative pressure can be applied to the air passages via the pipeline system. Preferably, for each inspection unit, at least one of the contact surfaces has at least one permeable region, and the permeable regions are in an interaction relationship with at least one of the air passages of the respective carrier. A negative pressure can also be applied to the permeable regions of the contact surface in this way, so that the planar element to be inspected is sucked towards the contact surface.

[0027] Preferably, the permeable cross-section of the air passage on the upper surface of the carrier is smaller than the permeable cross-section of the permeable region of the contact surface that interacts with the air passage. In this way, the holding force acting on the planar element by the negative pressure can be distributed over a larger area, so that a contact connection that does not damage the planar element can be realized by the inspection unit. The smaller permeable cross-section of the air passage of the carrier element, on the one hand, improves the stability of the carrier element, and on the other hand, provides sufficient space for the mounting means, specifically, on the one hand, for mounting the carrier on the conveying device, and on the other hand, for mounting the contact surface on the carrier.

[0028] The holding of the planar element, especially the conductor tab, can be carried out particularly gently by the negative pressure. This is because grippers and / or clamps that could damage the conductor tab can be omitted. The permeable regions can be provided on the first, second, and / or third contact surfaces. The permeable regions can be formed, for example, by one or more holding holes or by the pores of a porous material with air permeability. Such a porous material can be produced, for example, by manufacturing the carrier by 3D printing. Such a porous material is produced, for example, by reducing the material density in the permeable region. The porosity of the material must be selected so that the planar element can be sucked.

[0029] Alternatively, however, it is also possible for the planar element to be held in the inspection unit by mechanical means, for example by a belt or a roll.

[0030] Preferably, the carrier has at least one cable passage, within which a cable electrically and / or signal-technologically connected to one of the contact surfaces is guided. The cable passage enables a predefined guidance and support of the cable, so that possible disturbing influences can be reduced. Preferably, the cable is a coaxial cable, which has the following structure from the radially inner side to the radially outer side: inner conductor, insulator, outer conductor and protective sheath. The protective sheath preferably does not extend completely up to the soldering point where the inner conductors are connected to the respective contact surfaces. By means of screws screwed into the carrier via threads, the outer conductor can be pressed against the part of the conveying device connected to ground in the section not covered by the protective sheath. Thus, disturbing influences are reduced. The contact surfaces are preferably connected to the inner conductors of the cables by soldering joints. In order to reduce disturbing influences as extensively as possible, the outer conductor used for shielding preferably reaches up to immediately before the soldering point. Preferably, the length of the part of the cable not surrounded by the outer conductor is less than 1 cm, more preferably less than 0.5 cm, and particularly preferably less than 0.1 cm. Each contact surface is preferably connected to an independent cable. Preferably, each cable is also guided within the respective carrier's own cable passage.

[0031] The previously proposed cavities, air passages and / or cable passages of the carrier can be provided not only in the case of decomposable carrier elements, but also when the carrier is formed by an adhesive medium layer. In such a case, the adhesive medium can be cast and / or dispensed, for example, around a negative provided for this purpose. Alternatively, however, a functional unit, for example a cable or the contact surface itself, may form such a negative.

[0032] According to another preferred embodiment, it is proposed that the inspection units are each configured to receive and convey planar elements. Preferably, the third contact surface simultaneously forms a conveying table or at least a part of the conveying table for each planar element. Thereby, the conveying table simultaneously assumes the function of conveying the planar elements and the function of electrical or signal-technical connection of the separators of the planar elements to be conveyed. For example, when a planar element in the form of a monocell is conveyed within the inspection unit, the planar element to be inspected is preferably placed on the conveying table of each inspection unit with one of the separators of the planar element. In this case, both electrodes of the planar element are contact-connected by the mentioned conductor tabs protruding beyond the base surface of the separator to the first and second contact surfaces.

[0033] According to another preferred embodiment, instead of the third contact surface, a mere conveying table may be provided. In this embodiment, the mere conveying table is preferably made of an insulating material, for example, to reduce the stray capacitance during measurement by the first and second contact surfaces. Preferably, the mere conveying table is formed by a surface section of the carrier provided therefor.

[0034] In this way, the planar elements positioned within the inspection unit can be conveyed by a conveying device, and during the conveying process, the planar elements can be inspected by the contact surfaces. To prevent the planar elements from shifting during conveyance, the above-described configuration that enables the application of a negative pressure to the contact surfaces can be adopted.

[0035] Preferably, the planar extension of the third contact surface corresponds to the surface of the electrode of each planar element that does not include the conductor tab. Preferably, the deviation of the planar extension of the third contact surface from the planar extension of the electrode surface is less than 100%, preferably less than 50%, more preferably less than 25%, particularly less than 10%. Thus, the third contact surface forms an electrode pair together with the closest electrode of the abutting planar element, and this electrode pair provides suitable measurement results for quality inspection.

[0036] Instead of the inspection unit configured to receive and transport the planar element simultaneously, for example, a transport device configured to transport the planar element from a receiving location to a discharging location along a transport path may be provided. The transport device is configured to bring one or more inspection units of the transport device into contact with the planar element while the planar element is being transported by the transport device, and the contact between each inspection unit and each planar element is maintained along a part or the whole of the transport path. In the present embodiment, the transport device is responsible for transporting the planar element, while the inspection device is responsible for inspecting the planar element. The inspection device is preferably configured to press the inspection unit against the planar element transported by the transport device with a pre-specified force.

[0037] When the transport device is a transport drum and is formed by a transport drum on the outer peripheral surface of which the planar element is moved on a circular orbit, the transport device is configured to guide the inspection unit over at least a corresponding part of the circular orbit. This can be achieved, for example, by the transport device moving the inspection unit on a sickle-shaped orbit corresponding to the geometry of the transport drum.

[0038] Preferably, at least one measuring device is provided, and at least two of the contact surfaces of each one of the plurality of inspection units can be connected to at least one measuring device by a switch matrix.

[0039] When the inspection unit has at least two contact surfaces, at least one of the separators of both sides of one monocell can be measured.

[0040] Preferably, the inspection unit has at least three contact surfaces each, more preferably exactly three contact surfaces.

[0041] Preferably, the switch matrix is configured to connect variously at least two or three contact surfaces of one inspection unit out of a plurality of inspection units, so that the measurement can be carried out by at least one measuring device within a predetermined one electric circuit or within respectively different electric circuits.

[0042] The switch matrix in the sense of the present application preferably has at least one input channel and at least one output channel, preferably a plurality of output channels, and advantageously, one or a plurality of input channels can be connected or are connected to one or a plurality of output channels in a predefined configuration.

[0043] By connecting at least two contact surfaces of each inspection unit to the output channels of the switch matrix, the contact surfaces can be connected to at least one measuring device connected to at least one input channel. Basically, it is also possible to connect at least one measuring device to the switch matrix via two or more input channels respectively.

[0044] Preferably, all the contact surfaces of the inspection unit are connected to the switch matrix on the output channel side. More preferably, all the measuring devices are also connected to the switch matrix on the input channel side.

[0045] It is obvious that the switch matrix may basically also have another input channel and / or another output channel that is not connected to at least one measuring device or contact surface. Thus, for example, another input channel connecting a voltage source to the switch matrix may be provided.

[0046] At least two of at least three contact surfaces of one inspection unit are preferably connectable to the measuring device simultaneously. Thus, for example, based on measuring impedance, ohmic resistance or capacitance between two of at least three contact surfaces, the system state of each planar element can be estimated. The ohmic resistance can be measured with direct current or, for example, with an alternating voltage having a frequency of 1 kHz, 10 kHz or 1000 kHz, as the reciprocal of the real part of the complex admittance. The capacitance can also be measured with an alternating voltage. By means of a breakdown measurement, for example, foreign objects having a diameter or extension smaller than the layer thickness of the separator can be recognized. For example, when the planar element to be inspected is formed by the monocell described at the beginning, the electrical resistance between two electrodes can decrease when the separator arranged between these electrodes is damaged.

[0047] Each inspection unit has at least three, preferably exactly three, contact surfaces, thereby enabling so-called three-port measurements of the planar elements arranged in the inspection unit. This has the advantage that both separators of one monocell can be inspected separately and / or together. That is, not only the separator arranged between the first and second electrodes of the planar element, but also the outer separator, which is only contact-connected to the electrodes of the adjacent planar element for the first time during the formation of the cell stack, can be inspected. The corresponding measurement can be carried out by intelligently connecting the contact surface to at least one measuring device.

[0048] According to a preferred embodiment, a plurality of measuring devices are provided, and the switch matrix is configured to electrically and / or signal-technologically connect individual or multiple contact surfaces of one contact surface of each of the plurality of test units to different measuring devices respectively. Thereby, the planar element can be connected to different measuring devices without being removed from each test unit, which enables the measurement of different parameters, especially without damaging the product. For example, it is also possible to perform the inspection of the planar element that is in contact with or supported by different test units in parallel.

[0049] Preferably, the switch matrix is configured to connect the first and second contact surfaces to the same measuring device simultaneously, to connect the first and third contact surfaces to the same measuring device simultaneously, and / or to connect the second and third contact surfaces to the same measuring device simultaneously. For example, when a planar element in the form of a monocell is in contact with one test unit for inspection purposes, for example, three contact surfaces of one test unit connect the set planar element to the contacts as follows: The planar element is placed on the third contact surface with the first separator. The first electrode adjacent to the first separator, for example, the first electrode in the form of an anode, contacts the first contact surface with the conductor tab of the first electrode. The second electrode isolated from the first electrode by the second separator, for example, the second electrode in the form of a cathode, contacts the second contact surface with the conductor tab of the second electrode.

[0050] When the first and second contact surfaces are connected to at least one measuring device simultaneously, the second separator disposed between the first and second contact surfaces can be inspected.

[0051] When the first and third contact surfaces are connected to at least one measuring device simultaneously, the first separator disposed outside the planar element can be inspected.

[0052] When the second and third contact surfaces are connected to one measuring device simultaneously, the first and second separators can be inspected simultaneously. In this case, the first and second separators are arranged between the second and third contact surfaces in series connection or parallel connection depending on the circuit configuration.

[0053] These circuit configurations that can be set by the switch matrix enable a comprehensive test of the planar elements to be inspected.

[0054] Preferably, the switch matrix is configured to connect the three contact surfaces of each one of a plurality of inspection units in various ways, so that the measurement can be carried out by at least one measuring device in different electrical circuits. For example, depending on whether the first separator or the second separator or both separators of a single cell are to be inspected, the circuit configuration can be various. Thus, a large number of measurements can be carried out on the planar element while the planar element is in contact with the inspection unit. By avoiding delivering the planar element to be inspected to another inspection device, a measurement that is particularly gentle on the planar element, especially on the product, can be performed. In particular, the very delicate conductor tabs of the electrodes, already mentioned at the beginning, do not need to be connected to the contacts repeatedly. For example, two or more contact surfaces of one inspection unit may be short-circuited with each other.

[0055] Preferably, the switch matrix is configured to connect the individual or multiple contact surfaces of the contact surfaces of each one of a plurality of inspection units to a voltage source and / or to connect to ground. By connecting in this way, further circuit configurations can be made possible, and as a result, the possibilities of measurement can be extended.

[0056] Preferably, the switch matrix has a plurality of relays for connecting a plurality of contact surfaces to each other and / or for connecting individual or a plurality of contact surfaces to one or more measuring devices. The relays can, in this case, be controlled in an open-loop or closed-loop manner, for example, by a control unit. It has been found to be advantageous to operate the switch matrix by means of relays based on a large number of switching combinations. The switch matrix, and thus also the relays, can be implemented, for example, based on the position of the transport device relative to a fixed part of the inspection device. Alternatively or additionally, it is obvious that other input parameters can be used to control the switch matrix or the relays in an open-loop or closed-loop manner. Connecting individual or a plurality of contact surfaces to ground and / or connecting them to a voltage source is preferably carried out by means of relays. The main advantages of relays are passive, galvanically isolated switching and a minimally invasive behavior with respect to changing the measurement interval. Furthermore, relays can conduct both direct current and alternating current. Switching transistors can only do this to a limited extent. Furthermore, switching transistors have a significant impact on the measurement interval.

[0057] Preferably, the switch matrix is a component of the transport device. In this way, the connection to the transport device can be carried out efficiently.

[0058] Furthermore, it is advantageous if at least one measuring device is configured to measure the real part and / or the imaginary part of the electrical capacitance and / or the ohmic resistance, generally the electrical impedance, and / or to carry out a breakdown measurement. By using the measurement of the ohmic resistance and / or the electrical capacitance to inspect planar elements, the system state of the planar elements to be inspected can be estimated with high reliability.

[0059] Preferably, at least one measuring device is a component of the fixed part of the inspection device. Thereby, at least one measuring device does not need to be moved together with the conveying device. This is particularly advantageous when the inspection device comprises a plurality of measuring devices. Furthermore, the measuring devices can also advantageously be connected to the contact surfaces of different inspection units respectively, so that the number of measuring devices required is reduced. Basically, however, it is also possible to incorporate one or more of the measuring devices into the conveying device.

[0060] According to another preferred embodiment, it is proposed to implement the electrical and / or signal-technical connection of the conveying device to the fixed part using a sliding contact device. The sliding contact device has been found to be advantageous for electrically and / or signal-technically connecting a moving conveying device, for example a rotating conveying device, to the fixed part of the inspection device.

[0061] According to a second aspect of the present application, there is provided a manufacturing method for manufacturing an inspection device to solve the above problems. In method step a), a metal sheet having an oversized dimension is prepared to form a contact surface. In method step b), the metal sheet is attached to the conveying device by a carrier. In method step c), the metal sheet attached to the conveying device by the carrier is processed by a cutting tool. By the proposed method, in particular, the surface of the contact surface can be processed to have a predefined surface geometry. For example, by cutting, the metal sheet may be divided such that a divided contact surface of one inspection unit is formed from the metal sheet. Alternatively or additionally, a flowable region to which a negative pressure can be applied during operation may also be formed by cutting, for example by drilling.

[0062] According to a third aspect of the present application, the above problem is solved by a method for inspecting a planar element for forming an industrial cell stack for producing an energy cell. At this time, the planar element is inspected using an inspection device as described above. At this time, each of the planar elements to be inspected abuts against the contact surface of one of the plurality of inspection units.

[0063] Preferably, the inspection of the planar element is carried out during the transport of the planar element, i.e., while the transport device is moving relative to the fixed part of the inspection device.

[0064] More preferably, the detection of damaged or low-quality planar elements causes these planar elements to be excluded from the manufacturing process. This may be carried out, for example, by the inspection device itself or, alternatively, by an independent device, such as a device in the form of an ejector drum.

[0065] Alternatively or additionally, however, it is also possible for the inspection device to detect quality parameters of the planar elements without necessarily excluding the planar elements from the process for later use. In this way, for example, the formed cell stacks can be classified into different quality grades.

[0066] Regarding the technical effects and advantages associated with the proposed method, reference is made to the previous description in the context of the inspection device.

[0067] The present invention will be described below based on preferred embodiments with reference to the accompanying drawings.

Brief Description of the Drawings

[0068]

Figure 1

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Mode for Carrying Out the Invention

[0069] Figure 1 shows the inspection device 1 without its fixed part 5. The fixed part 5 is shown in Figure 13. The inspection device 1 includes a transport device 3, and the transport device 3 is formed by a drum that is rotatably supported around a rotation axis 32. Twelve flat surfaces are provided on the outer peripheral surface 25 of the transport device 3, and here, the carriers 9 are attached only every other one of these flat surfaces. One of these carriers 9 is hidden from the perspective shown in the figure. The fact that not all of the flat surfaces are occupied by the carriers 9 serves better for illustration. Basically, carriers 9 are attached to all twelve flat surfaces of the transport device 3. In principle, the transport device can have any number of receiving surfaces for the carriers, and for the purpose of parallelization described in more detail below, a number divisible by 3 or 4 is particularly suitable. Furthermore, it can be seen that on each of the carriers 9, first and second contact surfaces 6 and 7, and a third contact surface 8 arranged between them are provided. Each carrier 9, together with the contact surfaces 6, 7, and 8 arranged on the carrier 9, forms a modular unit in the form of an inspection unit 4, and the inspection unit 4 will be further described below with reference to Figure 2. Furthermore, it can be seen that a switch matrix 26 is provided on one end face of the transport device 3, and the switch matrix 26 is used to connect the contact surfaces 6, 7, and 8 to a measuring device 27 (see Figure 13).

[0070] Figure 2 shows a modular unit consisting of the carrier 9 and the contact surfaces 6, 7, and 8 arranged on the carrier 9. In this embodiment, the contact surfaces 6, 7, 8 are adhered to the carrier 9, and as a result, the contact surfaces 6, 7, 8 are positioned by the carrier 9 in a predefined orientation and arrangement relative to each other. Furthermore, a through-opening 33 is provided, and through the through-opening 33, the carrier 9 can be attached to the flat surface of the transport device 3 by a countersunk screw (not shown). Furthermore, the lower surface 15 of the carrier 9 has a flat surface, and as a result, it can be seen that the lower surface 15 abuts flatly against the also flat surface of the outer peripheral surface 25 of the transport device 3 (see Figure 1).

[0071] The upper surface 14 of the carrier 9 has a convex curvature, and the contact surfaces 6, 7 and 8 also abut against the upper surface 14 in a planar manner. The contact surfaces 6, 7 and 8 formed from a thin metal sheet can be adapted to the convex geometry of the carrier 9 and adhered onto the carrier 9 without applying too much force.

[0072] In this embodiment, the carrier 9 is made of an electrically non-conductive plastic. Alternatively, however, the carrier 9 may be manufactured from another non-conductive material. Thereby, the contact surfaces 6, 7, 8 are supported and electrically insulated from each other and with respect to the conveying device 3.

[0073] Furthermore, an air passage 19 can be discerned, and the air passage 19 cooperates with a permeable region 20 of the contact surfaces. The reference numeral of the air passage 19 is only exemplarily attached to the third contact surface 8 in FIG. 3. The first and second contact surfaces 6 and 7 also have a permeable region 20 which is in an interaction relationship with the air passage 19. Thus, a negative pressure can be applied to the permeable regions 20 of the contact surfaces 6, 7 and 8, and as a result, the planar element 2 to be inspected (see FIGS. 3 and 4) is adsorbed onto the contact surfaces 6, 7 and 8.

[0074] FIG. 3 shows a schematic cross-sectional view of the planar element 2 arranged on the inspection unit 4, where the cross-section is arranged in a plane perpendicular to the axis of rotation 32 (see FIG. 1) of the conveying device 3.

[0075] The planar element 2 shown in FIGS. 3 and 4 has the following layer structure from bottom to top: a first separator 10 - a first electrode 11 - a second separator 12 - a second electrode 13. In this embodiment, the first electrode 11 is formed by an anode, and the second electrode 13 is formed by a cathode. In principle, however, the first electrode 11 may be formed by a cathode and the second electrode 13 may be formed by an anode.

[0076] The cross-sectional view of FIG. 3 shows one of the inspection units 4 shown in FIG. 1. In the illustrated cross-sectional view of FIG. 3, it can be seen that the third contact surface 8 is supported by the carrier 9. Since the carrier 9 is made of an electrically non-conductive material, the third contact surface 8 is supported electrically insulated from the transport device 3. The planar element 2 is placed on the third contact surface 8 with the first separator 10, and at the same time, the third contact surface 8 forms a suitable carrier for the planar element 2. Furthermore, if the planar extension of the third contact surface 8 does not take into account the conductor tabs 34 and 35 (see FIG. 4), which are not shown here, it can be seen that it substantially coincides with the base surfaces of the first and second electrodes 11 and 13. Thus, the third contact surface 8 can form an electrode pair together with the first electrode 11 arranged on the first separator 10, and this electrode pair is suitable for the inspection of the first separator 10 arranged between these electrodes. In this case, the first electrode 11 is connected in contact by bringing the conductor tab 34 of the first electrode 11 into contact with the first contact surface 6.

[0077] Furthermore, FIG. 3 shows that the second separator 12 and the second electrode 13 follow on the first electrode 11. Thereby, the first electrode 11 and the second electrode 13 also form an electrode pair, and this electrode pair is suitable for the inspection of the second separator 12 arranged between these electrodes.

[0078] FIG. 4 shows another cross-sectional view of the planar element 2 arranged on the inspection unit 4, where the cross-section extends in a plane parallel to the axis of rotation 32 (see FIG. 1) of the transport device 3. In this figure, it can be seen that the first electrode 11 is connected in contact with the first contact surface 6 by the conductor tab 34 of the first electrode 11. Furthermore, it can be seen that the second electrode 13 is connected in contact with the second contact surface 7 by the conductor tab 35 of the second electrode 13. In order to avoid bending of the conductor tabs 34, 35, the contact surfaces 6, 7 may have a correspondingly adapted height in the radial direction. Accordingly, the height of the first contact surface 6 is lower than the height of the second contact surface 7 in the radial direction.

[0079] Figure 5 shows the contact surfaces 6, 7, and 8 without the carrier 9. It can be seen that the contact surfaces 6, 7, and 8 are formed of a thin metal sheet, which may consist of, for example, copper, gold, silver, nickel, aluminum, or steel, and it is also possible to use a thin metal sheet having a coating consisting of nickel and / or gold.

[0080] Figure 6 shows the carrier 9 without the contact surfaces 6, 7, and 8 deposited thereon. On the upper surface 14 of the carrier 9, cavities 16, 17, and 18 corresponding to the planar extent of the contact surfaces 6, 7, and 8 are provided at the locations where the contact surfaces 6, 7, and 8 of FIG. 5 are arranged. The cavity 16 is used for positioning and orienting the first contact surface 6, the cavity 17 is used for positioning and orienting the second contact surface 7, and the cavity 18 is used for positioning and orienting the third contact surface 8. The carrier 9 shown in FIG. 6 is formed from a one-piece plastic part. Such a plastic carrier can be, for example, an injection-molded part or a 3D printed part. Further, in FIG. 6, it can be seen that four air passages 19 in an interaction relationship with the third contact surface 8 abut against the upper surface 14 at the bottom of the groove 36 of the groove 36. Thus, the air passages 19 can be connected to each other in a fluid-technical manner four by four, and then transition into the permeable region 20 (see FIG. 5) of the third contact surface 8.

[0081] FIG. 7 shows the lower surface 14 of the carrier 9, on which a plurality of cable passages 21 extend. The first cable passage 21a is configured to guide a cable 22 (see FIGS. 12 and 13) from one end face 37 of the carrier 9 to the first contact surface 6. Correspondingly, the second cable passage 21b is configured to guide to the second contact surface 7, and the third cable passage 21c is configured to guide to the third contact surface 8 (see FIG. 2). The cable passages 21a, 21b, and 21c are open at the lower surface 15 and are closed by the outer peripheral surface 25 of the transport device 3 when the carrier 9 is attached to the transport device 3 (see FIG. 1). Furthermore, it can be seen that the air passage 19 abuts against the flat lower surface 15 of the carrier 9. A negative pressure can be applied to the air passage 19 via a pipeline system 23 (see FIG. 13) provided for this purpose in the transport device 3.

[0082] FIG. 8 shows a schematic cross-sectional view through the carrier 9 in a plane parallel to the axis of rotation 32 (see FIG. 1) of the transport device 3. This figure shows the cable 22 laid in the cable passage 21c, which is connected to the third contact surface 8. The cable 22 is configured as a coaxial cable. Radially inward, an inner conductor 40 extends, and the inner conductor 40 is brazed to the third contact surface 8. Subsequently, there is an outer conductor 42 used for shielding, and the outer conductor 42 is isolated from the inner conductor 40 by an insulator 41. Radially outward, there is a protective sheath 38 following. The cable 22 extends parallel to the axis of rotation 32 (see FIG. 1) in the passage 21c and then turns at a right angle, here, that is, radially with respect to the axis of rotation 32, and abuts against the brazing point. The protective sheath 38 reaches up to just before the right-angle direction change, and as a result, in a partial section of the cable 22, the outer conductor 42 is exposed. The outer conductor 42 is pressed against the electrically conductive transport device 3 by one end face 43 of a ground contact screw 39 screwed into the carrier 9 with a thread to form a defined ground contact. Similarly, the cable 22 leading to the first and second contact surfaces 6 and 7 is also laid in the carrier 9.

[0083] Figure 9 shows a front view of the conveying device 3 together with the carrier 9 assembled on the conveying device 3. As also shown in FIG. 1, the carriers 9 are assembled on the conveying device 3 only every other one. Further, it can be seen that the cable passage 21 is closed also at the lower surface 15 of the carrier 9 by assembling the carrier 9 to the conveying device 3. Further, a cover 44 is provided, and the cover 44 covers the switch matrix 26 (see FIG. 12) at the end face.

[0084] FIGS. 10 and 11 show two alternatives for adhering the contact surfaces 6, 7, and 8 to the carrier 9 as shown in FIG. 2. In the embodiments of FIGS. 10 and 11, the contact surfaces 6, 7, and 8 can be individually attached to the carrier 9 by separable screw connections. Hereinafter, this principle shown in FIGS. 10 and 11 will be described based on the third contact surface 8. However, attaching the first and second contact surfaces 6 and 7 to the carrier 9 can also be carried out in a similar manner.

[0085] FIGS. 10 and 11 show a flat section of the outer peripheral surface 25 of the conveying device 3 configured as a drum, as already shown in FIG. 1. The contact surface 8 can be screwed to the carrier 9 by a screw (not shown) screwed in from the radially inner side. For this purpose, a blind hole 58 is provided, and the blind hole 58 completely penetrates the carrier 9, and the bottomed hole of the blind hole 58 is located within the third contact surface 8. The female thread 60 with which the screw (not shown) engages is arranged within the third contact surface 8. Since the blind hole 58 has an appropriate counterbore diameter within the carrier, the screw head of the countersunk screw (not shown) is completely recessed within the carrier 9 in the screwed state. The screw fastening from the radially inner side does not affect the upper surface of the contact surface 8. The screw fastening between the contact surface 8 and the carrier 9 is carried out before the carrier 9 is assembled to the conveying device 3.

[0086] In the embodiment shown in FIG. 10, the carrier 9 is attached to the conveying device 3 by means of a blind hole 57 that completely penetrates both the contact surface 8 and the carrier 9. The blind hole bottom and the female thread 62 are arranged within the conveying device 3. Further, since the blind hole 57 has a counterbore diameter, a screw (not shown) does not protrude from the third contact surface 8 in the assembled state. If it protrudes, it may cause damage to the planar element 2 supported on the third contact surface 8.

[0087] In the embodiment shown in FIG. 11, a unit consisting of contact surfaces 6, 7, and 8 (only the contact surface 8 is visible in this plane) is attached to the conveying device 3 by a screw connection from the radially inner side. A corresponding blind hole 59 completely penetrates the conveying device 3, while a bottomed hole and a female thread 61 are arranged within the carrier 9. Since a corresponding counterbore diameter is provided, the screw head of a screw (not shown) does not protrude from the hole.

[0088] The holes described here do not necessarily have to be manufactured by machining.

[0089] FIG. 12 shows the electrical and signal-technical connection of the contact surfaces 6, 7, and 8 of the inspection unit 4 to the switch matrix 26, which, on the other hand, is electrically and signal-technically connected to a measuring device 27 (see FIG. 13). The switch matrix 26 has a plurality of relays, which are configured to connect the cable 22 to the cables of the input channel cable set 49. Basically, the switch matrix 26 makes it possible to connect a planar element 2 (see FIGS. 3 and 4) placed on a specific inspection unit 4 to any one of the measuring devices 27 (see FIG. 13). In actual use, however, it has been proven that a plurality of inspection units 4 can be connected to a plurality of measuring devices 27 in parallel in terms of time. This means that a plurality of measuring devices 27 are provided and each inspection unit 4 is always assigned to the same measuring device 27.

[0090] Parallelization can extend the time available for testing the planar element 2. In the embodiment shown in FIG. 12, the conveying device 3 is provided with exactly 12 inspection units 4.

[0091] Without any parallelization, the planar element 2 present in one inspection unit 4 could only be inspected over an angular section of 360° / 12 = 30°. Correspondingly, only a relatively short time span would be available.

[0092] In the case of parallelization with a factor of 2, every other inspection unit 4 will be assigned to the first set 27 - A1 and 27 - B1 of measuring devices, and the other half of the inspection units will be assigned to the second set 27 - A2 and 27 - B2 of measuring devices. The measuring devices with the identification letter "A", here, that is, the measuring devices 27 - A1 and 27 - A2, are configured to measure capacitance. The measuring devices with the identification letter "B", here, that is, 27 - B1 and 27 - B2, are configured to measure ohmic resistance and to perform dielectric breakdown measurements. In the case of parallelization with a factor of 2, the planar element 2 present in one inspection unit 4 can be inspected over an angular section of (360° / 12)×2 = 60°. Thus, assuming the same rotational speed of the conveying device 3 as in the previous case, twice the time span is available.

[0093] Based on FIGS. 12 and 13, the parallelization with a factor of 3 will be described in detail.

[0094] First, in FIG. 13, it can be seen that according to the parallelization with a coefficient of 3, the switch matrix 26 is divided into three electronic units 46, 47, and 48. By means of the cable 22, the contact surfaces 6, 7, and 8 of the inspection units 4-1, 4-4, 4-7, and 4-10 are connected to the first electronic unit 46, and through the first electronic unit 46, it is possible to connect to the measuring devices 27-A1 and 27-B1. Thus, for example, any two of the three contact surfaces 6, 7, and 8 of one inspection unit 4 can be connected to the measuring device 27 in pairs, and as a result, both separators 10 and 12 of the corresponding planar element 2 (see FIGS. 3 and 4) can be inspected.

[0095] FIG. 12 does not show the wiring between the contact surfaces 6, 7, and 8 of the inspection units 4-2, 4-5, 4-8, and 4-11 and the second electronic unit 47. Connection to the measuring devices 27-A2 and 27-B2 is carried out through the second electronic unit 47 (see also FIG. 13).

[0096] Similarly, FIG. 3 does not show the wiring between the contact surfaces 6, 7, and 8 of the inspection units 4-3, 4-6, 4-9, and 4-12 and the third electronic unit 48. Connection to the measuring devices 27-A3 and 27-B3 is carried out through the third electronic unit 48 (see also FIG. 13).

[0097] For a parallelization factor of 3, i.e., a total of six measuring devices 27 - A1 to 27 - B3 are required. This is because different measuring device types (identification alphabets "A" and "B") are needed for capacitance measurement and for resistance measurement and breakdown measurement, respectively. Such parallelization enables the inspection of the planar elements 2 each present in the inspection unit 4 over an angular section of (360° / 12)×3 = 90°. In actual use, parallelization with a factor of 3 has been found to be advantageous. This is because it provides an ideal compromise between, on the one hand, a still acceptable number of relatively expensive measuring devices 27 - A1 to 27 - B3 and, on the other hand, a sufficiently large measuring section of 90° and the associated available measurement duration.

[0098] It is self - evident that parallelization with factors of 4 or 6 is also possible in a corresponding manner. Based on the fact that the number 12 is divisible by the values 2, 3, 4, and 6, basically, there are four possibilities for parallelization.

[0099] Basically, and of course, regardless of the parallelization factor, there is a possibility of adding one or more additional measuring device types to perform the corresponding measurements.

[0100] The three electronic units 46, 47, 48 of the switch matrix 26 are assembled on the end face of the transport device 3 configured as a drum. Thus, the switch matrix 26 is arranged in the relatively close vicinity of the inspection unit 4, whereby a qualitatively better measurement result is achieved. Furthermore, the switch matrix 26 is thus easily assemblable.

[0101] In the embodiment shown in FIG. 12, 12 × 3 = 36 cables 22 are connected to output channels 53 that are arranged radially outside with respect to the axis of rotation 32 of the switch matrix 26. Connections to the measuring devices 27-A1 to 27-B3 can be formed via the input channels 52 located radially inside. The input channels 52 and the output channels 53 are connected to each other by communication lines and can be interconnected as desired by relays. The input channels and the output channels 52 and 53 each have one coaxial connector, for example an SMA screw connector, for connecting corresponding coaxial cables.

[0102] It is obvious that the switch matrix 26 can in principle also be connected to further different lines. For example, it can also be connected to lines used for the earth or ground connection of individual or multiple contact surfaces 6, 7 and / or 8 or to control lines for controlling the switch matrix 26.

[0103] FIG. 13 shows a cross-sectional view of the inspection apparatus 1, from which the electrical and / or signal-technical connections between the contact surfaces 6, 7, and 8 of the inspection unit 4 and the measuring device 27 can be discerned. The cable 22 starting from the inspection unit 4 is connected to the output channel 53 of a switch matrix 26 that is non-rotatably coupled to the transport device 3. Starting from the input channel 52 of the switch matrix 26, an input cable set 49 extends through the interior of the transport device 3 configured as a drum up to a sliding contact device 50, and the sliding contact device 50 is formed by slip rings. The sliding contact device 50 is present, for example, on a rotating hollow shaft 24 provided inside the drum. In an alternative configuration, the slip ring may be attached outside the shaft 24, for example, on the side of a cover, or in the region of a stator 55 shown in FIG. 14. In the region of the input channel 52, the input cable set 49 is guided through the hollow shaft 24 and connected to a measurement cable set 51 via the sliding contact device 50 in the form of slip rings, and the measurement cable set 51 is assigned to the fixed part 5 of the inspection apparatus. The measurement cable set 51 is then connected to the measuring devices 27-A1 to 27-B3, and the measuring devices 27-A1 to 27-B3 are components of the fixed part 5 of the inspection apparatus 1.

[0104] In addition to signal cables that can be directly connected to the cable 22, the input cable set 49 and the measurement cable set 51 also have a data supply cable and a voltage supply cable, and the data supply cable and the voltage supply cable are also connected to the switch matrix 26.

[0105] The inspection device 1 thereby comprises three cable sets. The first cable set has a cable 22 which connects the contact surfaces 6, 7 and 8 of the inspection device 4 to the output channels 53 of the switch matrix 26. The input cable set 49 assigned to the rotatable transport device 3 connects the input channels 52 of the switch matrix 26 to the slip contact device 50. The measurement cable set 51 assigned to the fixed part 5 of the inspection unit 4 connects the slip contact device 50 to the measuring device 27 or another device, such as a control unit or a voltage source.

[0106] Furthermore, from FIG. 13, the pipeline system 23 of the transport device 3 can be discerned, and a negative pressure can also be applied to the inspection unit 4 via the transport device 3. Since the pipeline system 23 is configured to apply a negative pressure only to a part of the inspection device 4 according to the rotation angle of the transport device 3 relative to the fixed part 5, it is obvious that the planar element 2 is adsorbed only to the contact surfaces 6, 7 and 8 of the inspection device 4 in a certain specific section (see also FIGS. 3 and 4).

[0107] FIG. 14 shows an alternative embodiment with respect to the wiring as compared to the embodiment shown in FIG. 13. Otherwise, the inspection device 1 in FIG. 14 is, however, identical to the inspection device 1 shown in FIG. 13. In the embodiment shown in FIG. 14, the input cable set 49 is not guided inside the transport device 3 configured as a drum, but a connection to the rotor 54 is made. The rotor 54 is arranged at the center of the printed circuit board configured in a ring shape of the switch matrix 26. The connection to the stator 55 is made by the slip contact device 50, and from the stator 55, the measurement cable set 51 is connected to the measuring devices 27-A1 to 27-B3. In this embodiment, the slip contact device 50 and the measuring devices 27-A1 to 27-B3 are arranged in front of the end face of the transport device 3.

[0108] FIG. 15 shows an embodiment of the inspection device 1 in which the carrier 9 is formed not by decomposable carrier elements but by an adhesive medium layer. Here too, three contact surfaces 6, 7 and 8 are provided for each inspection unit 4.

[0109] FIG. 16 shows a cross-sectional view of the embodiment shown in FIG. 15, where the cross-section extends orthogonally to the axis of rotation also in this figure. The third contact surface 8 visible in this figure is held on the transport device 3 by a carrier 9 in the form of an adhesive medium respectively. Since this adhesive has electrically insulating properties, also in this embodiment, the contact surfaces 6, 7 and 8 are electrically insulated from the transport device 3 and from each other.

[0110] This embodiment allows for subsequent machining of the contact surfaces 6, 7 and 8, so that the contact surfaces 6, 7 and 8 have an ideal roundness forming a partial section of a virtual cylindrical surface. In this embodiment, the contact surfaces 6, 7 and 8 shown in FIG. 15 are provided in the form of a metal sheet having an oversized dimension in method step a). Subsequently, in method step b), the metal sheet is attached to the transport device 3 by a carrier 9 made of an adhesive material. The adhesive material may be applied separately for each inspection unit 4 or for each of the contact surfaces 6, 7 and 8 at that time. Alternatively, however, the adhesive material may first be applied for all inspection units 4, so that subsequently the contact surfaces 6, 7 and 8 can be arranged thereon. In method step c), the metal sheet attached to the transport device 3 by the carrier 9 is then machined by a cutting tool, so that the surfaces of the contact surfaces 6, 7, 8 have the desired geometry. The contact surfaces 6, 7, 8 and the transport device 3 can thus easily be made of various different metal materials. The holes (see FIG. 13) connecting the contact surfaces 6, 7 and 8 fluid-technically to the pipeline system 23 of the transport device 3 can likewise be made subsequently.

[0111] As shown in FIGS. 1, 2, and 6 to 14, it is obvious that even when the carrier 9 is formed of decomposable carrier elements, the cutting of the contact surfaces 6, 7, and 8 may be performed.

[0112] FIG. 17 shows an alternative embodiment in which the planar element 2 is transported from a receiving location 30 to a discharging location 31 along a transport path 29 by an independent transport device 28. At the receiving location 30, the planar element 2 is received by a first transport drum 45, and at the discharging location 31, it is discharged to a second transport drum 56. The transport device 3 is configured to bring a plurality of inspection units 4 of the transport device 3 into contact with the planar element 2 transported by the transport device 28 at a defined pressure while these planar elements 2 are being transported. At that time, the first, exposed separator 10 (see FIGS. 3 and 4) is facing the direction of the inspection device 4. On the transport device 28, the planar element 2 is accordingly placed with the outer electrode 13. In this embodiment, the contact between each inspection unit 4 and each planar element 2 is maintained substantially along the entire transport path 29. For this purpose, the conveyor device 3 moves the inspection unit 4 around the transport device 28 by a sickle-shaped endless web, and the smaller radius of the sickle, i.e., the inner radius, is in surface contact with a part of the transport device 28. In this embodiment, the transport device 28 is configured as a mere transport drum on the outer peripheral surface of which the planar element 2 is held by the action of negative pressure. However, alternatively, it is also possible that the transport device 28 itself is also configured as an inspection drum, and as a result, the test of this inspection drum and the test performed by the inspection unit 4 of the transport device 3 complement each other.

[0113] In another possible embodiment, the transport device 3 is used only for pressing the planar element 2 instead of or in addition to using suction with negative pressure, and in this case, it does not necessarily have to perform measurements itself. This has the advantage of a more constant pressure for reproducible measurements.

Explanation of Reference Numerals

[0114] 1 Inspection device 2 planar elements 3 conveying device 4 inspection unit 5 fixed part 6 first contact surface 7 second contact surface 8 third contact surface 9 carrier 10 separator 11 electrode 12 separator 13 electrode 14 upper surface of the carrier 15 lower surface of the carrier 16 first cavity 17 second cavity 18 third cavity 19 air passage 20 permeable region 21 cable passage 22 cable 23 pipeline system 24 hollow shaft 25 outer peripheral surface 26 switch matrix 27 measuring device 28 transporting device 29 conveying path 30 receiving location 31 discharging location 32 axis of rotation 33 through-opening 34 conductor tab 35 conductor tab 36 groove 37 end face (of the carrier) 38 protective sheath 39 ground contact screw 40 internal conductor 41 insulator 42 external conductor 43 end face (of the ground contact screw) 44 cover 45 first conveying drum 46 first electronic unit 47 second electronic unit 48 The third electronic unit 49 Input cable set 50 Rubbing contact device 51 Measurement cable set 52 Input channel 53 Output channel 54 Rotor 55 Stator 56 The second conveying drum 57 Docking hole 58 Docking hole 59 Docking hole 60 Female thread 61 Female thread 62 Female thread

Claims

1. An industrial inspection device (1) for producing energy cells, wherein the inspection device (1) is configured to inspect planar elements (2) suitable for forming a cell stack, The inspection device (1) comprises a plurality of inspection units (4), and the inspection units (4) are movable relative to the fixed part (5) of the inspection device (1) by a transport device (3). The inspection unit (4) has at least two contact surfaces (6, 7, 8) that electrically and / or signal-technically connect the planar elements (2) to be inspected. Each inspection unit (4) has one carrier (9) having electrical insulating properties, and the contact surfaces (6, 7, 8) of each inspection unit (4) are supported by the carrier (9) in predetermined positions and orientations. The carrier (9) of the inspection unit (4) is attached to the transport device (3). Industrial inspection equipment for producing energy cells (1).

2. The conveying device (3) is formed by a rotatably supported drum, and the inspection unit (4) is attached to the outer peripheral surface (25) of the drum, which is located radially outward. The inspection apparatus (1) according to claim 1, characterized in that

3. The inspection unit (4) has first and second contact surfaces (6, 7), and the first and second contact surfaces (6, 7) are configured to electrically and / or signal-technically connect the two electrodes (11, 13) of the planar element (2) when the planar element (2) comes into contact with the inspection unit (4). The inspection unit (4) has a third contact surface (8) that electrically and / or signal-technically connects the separator (10) of the planar element (2) that abuts against the inspection unit (4). The inspection apparatus (1) according to claim 1, characterized in that

4. The contact surfaces (6, 7, 8) are each formed from thin metal plates. The inspection apparatus (1) according to claim 1, characterized in that

5. The contact surfaces (6, 7, 8) are attached to the carrier (9) by a material-bonding or shape-bonding method. The inspection apparatus (1) according to claim 1, characterized in that

6. The carrier (9) is formed of a detachable carrier element, preferably a one-piece detachable carrier element, and the carrier element is attached to the conveying device (3) by mounting means. The inspection apparatus (1) according to claim 1, characterized in that

7. The carrier (9) is formed by an adhesive medium layer. The inspection apparatus (1) according to claim 1, characterized in that

8. The upper surface (14) of the carrier (9) is provided with cavities (16, 17, 18), and the cavities (16, 17, 18) are configured to correspond in shape to the contact surfaces (6, 7, 8). The inspection apparatus (1) according to claim 1, characterized in that

9. The carrier (9) has a plurality of air passages (19), and the air passages (19) connect the lower surface (15) of the carrier (9) to the upper surface (14) of the carrier (9) in a flow-technology manner. The inspection apparatus (1) according to claim 1, characterized in that

10. For each inspection unit, at least one of the contact surfaces (6, 7, 8) has at least one passable region (20), and the passable region (20) is in an interaction relationship with at least one of the air passages (19) of each of the carriers (9). The inspection apparatus (1) according to claim 9, characterized in that

11. The carrier (9) has at least one cable passage (21) through which a cable (22) is guided, which is electrically and / or signal-technically connected to one of the contact surfaces (6, 7, 8). The inspection apparatus (1) according to claim 1, characterized in that

12. Each of the inspection units (4) is configured to receive and transport planar elements (2). The inspection apparatus (1) according to claim 1, characterized in that

13. The system includes a transport device (28) that transports planar elements (2) along a transport path (29) from a receiving point (30) to a discharge point (31), The transport device (3) is configured such that one or more of the inspection units (4) of the transport device (3) are in contact with the planar element (2) while the planar element (2) is being transported by the transport device (28). Contact between each of the inspection units (4) and each of the planar elements (2) is maintained along a portion or the entirety of the transport path (29). The inspection apparatus (1) according to claim 1, characterized in that

14. It is equipped with at least one measuring device (27), At least two of the contact surfaces (6, 7, 8) of each of the multiple inspection units (4) can be connected to at least one of the measuring devices (27) by a switch matrix (26). The inspection apparatus (1) according to claim 1, characterized in that

15. Equipped with multiple measuring devices (27), The switch matrix (26) is configured to electrically and / or signal-technically connect individual or multiple contact surfaces of the contact surfaces (6, 7, 8) of each of the multiple inspection units (4) to different measuring devices (27). The inspection apparatus (1) according to claim 14, characterized in that

16. comprising at least one measuring device (27), At least two of the contact surfaces (6, 7, 8) of each of the multiple inspection units (4) can be connected to at least one of the measuring devices (27) by a switch matrix (26). The aforementioned switch matrix (26) is In order to connect the first and second contact surfaces (6, 7) to the same measuring device (27) at the same time, To connect the first and third contact surfaces (6, 8) to the same measuring device (27) at the same time, and / or In order to connect the second and third contact surfaces (7, 8) to the same measuring device (27) at the same time, It is composed of, The inspection apparatus (1) according to claim 3, characterized in that

17. comprising at least one measuring device (27), At least two of the contact surfaces (6, 7, 8) of each of the multiple inspection units (4) can be connected to at least one of the measuring devices (27) by a switch matrix (26). Equipped with multiple measuring devices (27), The switch matrix (26) is configured to electrically and / or signal-technically connect individual or multiple contact surfaces of the contact surfaces (6, 7, 8) of each of the multiple inspection units (4) to different measuring devices (27). The aforementioned switch matrix (26) is In order to connect the first and second contact surfaces (6, 7) to the same measuring device (27) at the same time, To connect the first and third contact surfaces (6, 8) to the same measuring device (27) at the same time, and / or In order to connect the second and third contact surfaces (7, 8) to the same measuring device (27) at the same time, It is composed of, The inspection apparatus (1) according to claim 3, characterized in that

18. The switch matrix (26) is configured to connect the three contact surfaces (6, 7, 8) of each of the multiple inspection units (4) in various ways, and as a result, measurements can be performed by at least one of the measuring devices (27) in different electrical circuits. An inspection apparatus (1) according to any one of claims 14 to 17, characterized in that

19. At least one of the measuring devices (27) is configured to measure the real and / or imaginary parts of impedance, such as capacitance and / or ohm resistance, and / or to perform dielectric breakdown measurements. An inspection apparatus (1) according to any one of claims 14 to 17, characterized in that

20. A manufacturing method for manufacturing an inspection device (1) according to any one of claims 1 to 17, In step a) of the method, a thin metal sheet having excessive dimensions is prepared in order to form the contact surfaces (6, 7, 8), In step b) of the method, the thin metal sheet is attached to the conveying device (3) by the carrier (9), In step c) of the method, the thin metal sheet attached to the conveying device (3) by the carrier (9) is processed with a cutting tool. A manufacturing method for producing an inspection device (1), characterized by the above.

21. A method for inspecting planar elements (2) for forming an industrial cell laminate that produces energy cells, The planar elements (2) are inspected using the inspection device (1) described in any one of claims 1 to 17, and in this case, each planar element (2) to be inspected is in contact with the contact surface (6, 7, 8) of one of the multiple inspection units (4). An inspection method for inspecting planar elements (2) for forming an industrial cell laminate for producing energy cells, characterized by the above.

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