Imaging System with EMI Correction
By sampling and subtracting EMI noise within a single frame using data lines with varied pixel connections, the detector addresses EMI-induced noise in X-ray imaging, preserving image quality and reducing the need for additional shielding, suitable for radiography and fluoroscopy.
Patent Information
- Application Number
- JP2024568254
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-03-31
- Filing Date
- 2023-06-29
- Publication Date
- 2025-07-17
AI Technical Summary
X-ray detectors are susceptible to electromagnetic interference (EMI), which introduces noise that varies temporally and spatially, affecting image quality and making it difficult to detect fine details, especially in the presence of low-frequency magnetic fields, and existing mitigation methods like shielding can increase weight and attenuate X-rays.
The detector employs data lines configured to sample both desired and EMI-generated signals, allowing for their subtraction within a single frame, using pixels with varied electrical connections to reduce EMI noise without additional shielding material.
This approach effectively reduces EMI noise, maintaining image quality and performance while minimizing the need for costly shielding materials, suitable for radiography and fluoroscopy applications.
Smart Images

Figure 2025522682000001_ABST
Abstract
Description
Background Art
[0001] An X-ray detector can be subject to electromagnetic interference (EMI). EMI can add noise that varies temporally and spatially in the frame. EMI can be mitigated using additional shielding to reduce the EMI.
Brief Description of the Drawings
[0002]
Figure 1
[0003]
Figure 2A
Figure 2B
Figure 2C
Figure 2D
[0004]
Figure 3A
Figure 3B
Figure 3C
Figure 3D
Figure 3E
Figure 3F
Figure 3G
[0005]
Figure 4
[0006]
Figure 5
[0007]
Figure 6
[0008]
Figure 7
DETAILED DESCRIPTION OF THE INVENTION
[0009] Some embodiments relate to an imaging system with electromagnetic interference (EMI) correction. As will be described in more detail below, data lines and / or pixels of various configurations may be used to generate signals that can be used to reduce or remove noise caused by EMI.
[0010] A flat panel detector (FPD) may be subject to electromagnetic interference from low-frequency magnetic fields. If the FPD is in the vicinity of magnetic field noise from a source such as a transducer, solenoid, switch, motor, or the like, image artifacts may be displayed in the X-ray image. Such artifacts may make it impossible to see or more difficult to detect fine details in the X-ray image. As a result, medical diagnosis based on the image may be affected.
[0011] Several trends in the industry can exacerbate the effects of EMI. For example, a plastic housing painted with copper can reduce cost and weight; however, it can increase susceptibility to EMI. For protection against high-frequency EMI, a conductive shielding material can be used; however, for low-frequency EMI, a relatively thick sheet of conductive material may be required to effectively reduce low-frequency EMI. This additional material can increase the weight of the FPD and may exceed the specified limits, and can attenuate the X-ray radiation that was intended to be detected. A high-permeability magnetic shielding material can reduce EMI, but can also degrade image quality due to attenuating X-ray radiation. The embodiments described herein can enable a detector that maintains the same or improved performance while having less expensive housing components and / or less shielding material.
[0012] Software correction of EMI can be difficult because the noise can vary in both time and space. The noise can vary from frame to frame, and the magnitude can vary based on position or the like. In correlated double sampling, the magnitude can change faster than the readout time of the row, so interference may not be mitigated. As a result, the second sampling of the row can include different uncorrelated EMI contributions that are not removed by correlated double sampling.
[0013] To mitigate the effects of EMI, in some embodiments, EMI noise can be sampled. Sampling of the EMI noise can be done both locally and within the same frame in which it is generated. As described in more detail below, when using a data line to sample a signal, a sense line can be used to sample the EMI-generated noise. Subsequently, the sampled noise can be subtracted from the sampled signal. Additionally, since the sampled noise can be removed from the sampled signal, operations can be performed within a single frame. As a result, the detectors described herein can be used in both radiography and fluoroscopy applications.
[0014] FIG. 1 is a block diagram of a detector according to some embodiments. FIGS. 2A-2D are block diagrams of pixels of a detector according to some embodiments. Referring to FIGS. 1-2D, in some embodiments, detector 100 includes an array 102. Array 102 can include various pixels 108. Pixels 108 are arranged within rows 107 and columns 109.
[0015] Detector 100 includes a plurality of gate lines 106 associated with rows 107 of pixels 108 and a plurality of data lines 104 associated with columns 109. As will be described in more detail below, data lines 104 can be configured to provide signals to a sampling circuit (not shown). These signals can include desired signals from detected X-rays and signals due to EMI. In some embodiments, data lines 104 can be dedicated to sensing EMI and can be referred to as data lines 104'. In some embodiments, data lines 104 can be configured to provide desired signals for some rows 107 and EMI signals for other rows 107. When providing EMI signals, data lines 104 can be referred to as data lines 104'. In some embodiments, when sampling different rows 107, data lines 104 that operate as data lines (or sense lines) 104' for sensing EMI signals can change from row 107 to row 107. Data lines 104 that can change from providing desired signals to providing EMI signals are shown as data lines 104 / 104'.
[0016] Pixel 108a is an example of a pixel 108 configured to generate a desired signal based on incident radiation such as X-rays. Pixel 108a includes a sensor 110 electrically connected to a switch 112. Sensor 110 may include devices such as a photodiode, a photodetector, a circuit including such devices, or the like. Sensor 110 is configured to convert X-rays, light, or other photons into an electrical signal such as a charge or a voltage. A scintillator, a direct conversion material, or other X-ray conversion material may be part of array 102 and may be configured to convert incident X-rays into photons that sensor 110 can convert into an electrical signal. For example, the scintillator may include various materials configured to convert X-ray photons into photons detectable by sensor 110, such as cesium iodide (CsI), cadmium tungstate (CdWO4), polyvinyl toluene (PVT), gadolinium oxysulfide (Gd2O2S; GOS; Gadox), terbium-doped gadolinium oxysulfide (Gd2O2S:Tb), or the like. Examples of direct conversion materials include cadmium telluride (CdTe), cadmium zinc telluride (CdZnTe or CZT), mercury iodide (HgI), lead iodide (PbI), selenium, or the like.
[0017] Switch 112 may be various devices including transistors such as transistors based on amorphous silicon (a-Si), complementary metal oxide semiconductor (CMOS), indium gallium zinc oxide (IGZO), or the like. Switch 112 is electrically connected to the corresponding gate line 106 and the corresponding data line 104. Pixel 108a may include additional connections such as bias lines. A bias line (not shown) may be connected to the sensor 110 within the column 109 of the pixel 108a. Pixel 108a may include other components and electrical connections. Signals may be integrated and / or collected within the pixel 108a. The signals may be read out through the switch 112 and the corresponding data line 104 in response to signals on the corresponding gate line 106. For example, charges may be integrated on the sensor 110. The charges may be read out through the switch and the data line 104.
[0018] As described in more detail below, in some embodiments, the array 102 may include a second pixel 108'. Pixels 108b to 108d are examples of the second pixel 108'. Pixels 108b to 108d may be similar to pixel 108a; however, the electrical connections associated with pixels 108b to 108d may be different from those of pixel 108a. Other parasitic connections may still exist between the switch 112, the data line 104, the gate line 106, the sensor 110, or the like; however, the connections within or to pixels 108b to 108d are different such that contributions of unwanted signals generated due to incident X-rays from the sensor 110 are reduced or eliminated in the signals on the data line 104.
[0019] For example, in pixel 108b, sensor 110 is electrically disconnected from switch 112. However, the load of switch 112 on data line 104' can be the same as the load of pixel 108a on data line 104 (when the switch is in the off state, or when pixel sensor 110 has no signal or a minimum signal). Additionally, the parasitic connection between switch 112 and sensor 110, the connection from switch 112 to data line 104', or the like can also be the same as that of pixel 108a. Accordingly, the load on data line 104' can be the same; however, the signal resulting from the signal acquired by sensor 110 can be reduced or removed. Due to the incident X-ray, a signal can be accumulated on sensor 110. Switch 112 can be activated in the same manner as the switches within those pixels 108a when pixel 108a is sampled. However, the switch 112 of pixel 108b is not connected to sensor 110. As a result, the signal on sensor 110 is either not displayed on data line 104' or is only displayed in a significantly reduced form due to the parasitic connection.
[0020] In another example, for pixel 108c, switch 112 is not electrically connected to gate line 106. Switch 112 can be configured to be in the off state. Therefore, even if a signal is accumulated on sensor 110 and can be transmitted through switch 112, switch 112 is not connected to be activated. Thus, the accumulated signal is also either not displayed or is only displayed in a significantly reduced form due to the parasitic connection.
[0021] In another example, for pixel 108d, sensor 110 may not be present. Pixel 108d may otherwise be the same as pixel 108a. The absence of sensor 110 may be implemented by not forming all of the structure of sensor 110, not forming a part of the structure, such as one or both electrodes or the active material, or in a similar manner. Thus, sensor 110 may be wholly or partially absent. The load on switch 112 on data line 104' may be the same as the load on pixel 108b on data line 104.
[0022] Pixels 108b - 108d are used as an example, but other embodiments may include pixels 108' having other electrical connections that are different from the first pixel 108a, which are themselves different from pixels 108b - 108d. At the output of pixel 108' on data line 104', any differences that would otherwise interfere with or significantly reduce the desired signal contribution may be differences in the electrical connection to the first pixel 108a.
[0023] During operation, magnetic field noise or other EMI noise may be present in the vicinity of detector 100. The noise occurs on data line 104 and will be added to the desired signal that is read when switch 112 is on. The charge amplifier amplifies the desired signal as well as the noise that may be displayed in the image as an artifact.
[0024] Data line 104' coupled to pixel 108' such as pixels 108b - 108d may have substantially the same sensitivity to EMI as data line 104 coupled to pixel 108 such as pixel 108a. As a result, substantially the same EMI noise will be generated on both data line 104' and data line 104. By reading the signal on data line 104' and subtracting it from the signal on data line 104, which includes both the desired signal and the EMI noise, the EMI noise may be reduced or removed, leaving the desired signal.
[0025] In some embodiments, data line 104' and data line 104 have the same or substantially the same susceptibility to a magnetic field or other EMI. Data line 104' and data line 104 have the same or substantially the same impedance, parasitic interactions with other components, or the like. As a result, the EMI noise displayed on data line 104' can be displayed without the need for sensor 110 to be attached to data line 104'.
[0026] As described above, in some embodiments, the electrical connections of each pixel 108' different from pixel 108 include the electrical connections between the components of pixel 108'. In other embodiments, the electrical connections of each pixel 108' different from pixel 108 can include electrical connections to pixel 108' such as pixel 108c.
[0027] In some embodiments, each row 107 of array 102 includes at least one of pixels 108a and at least one of pixels 108' having an electrical connection different from that of pixels 108a. As will be described in more detail below, a plurality of pixels 108' can be included in each row 107. Each of these pixels 108' can be configured to generate an EMI noise signal substantially simultaneously with the generation of a desired signal combined with the same or a similar EMI noise signal on data line 104 from the corresponding pixel 108a in conjunction with the corresponding data line 104'.
[0028] Figures 3A - 3G are block diagrams of the connection of pixels and data lines according to some other embodiments. Referring to Figure 3A, in some embodiments, at least one group of pixels 108' forms one of the columns 109 - 1 (or sense columns) of the array 102a. Other columns 109, such as columns 109 - 2 to 109 - 5, include pixels 108a. In the array 102a and other examples described herein, pixels 108' may be shown shaded, while pixels 108a are not shown shaded. A specific number of rows 107 and columns 109 are used as examples, but in other embodiments, either or both numbers may be different.
[0029] Referring to Figure 3B, in some embodiments, the array 102b may be similar to the array 102a. However, the array 102b may include multiple groups of pixels 108'. Each group of pixels 108' may be arranged in a different column 109. Thus, the array 102b may include multiple columns 109 that include a second pixel 108'. In this example, columns 109 - 1, 109 - 6, and 109 - 11 that include a second pixel 108' are examples of multiple columns. The columns 109 having pixels 108' may be repeated every 5 columns. Three columns 109 having a second pixel 108' are used as examples, but in other embodiments, the number may be any integer greater than 1.
[0030] In addition, the pitch or spacing of the columns 109 having a second pixel 108' is 5 pixels, but in other embodiments, the pitch may be different. For example, the pitch may be any integer greater than 1. Further, the pitch between any two adjacent columns 109 having a second pixel 108' may be different from the pitch between another two adjacent columns 109 having a second pixel 108'. However, like in this embodiment, the pitch may be the same.
[0031] In some embodiments, some columns 109 contain only pixels 108'. However, in other embodiments, each column 109 of the array 102 includes at least one pixel 108a. That is, each column 109 may include some pixels 108', but no column 109 includes all pixels 108'.
[0032] In some embodiments, columns 109 formed by some to all pixels 108' may introduce regular artifacts into the resulting image. That is, pixels 108' may not contribute the desired signal to the image and may be used only to reduce or eliminate EMI. Thus, other configurations of pixels 108' within the array 102 may be used, as described in more detail below.
[0033] Referring to FIG. 3C, in some embodiments, the array 102c may be similar to the arrays 102a - 102b. However, each second pixel 108' in the rows 107 of the array 102c is offset from at least one second pixel 108' in another row 107 of the array 102c. In this example, the second pixels 108' in one row 107 are offset by one pixel in a diagonal pattern from the second pixels 108' in adjacent rows. In other embodiments, the second pixels 108' in adjacent rows may be offset by a different number of pixels. As a result, the array 102c may have pixels 108' that are dispersed across the array 102c. In the array 102c, the display of one or more defective columns may be absent.
[0034] In some embodiments, if the separation between adjacent pixels 108' of row 107 is greater than 1, additional pixels 108a having a signal that includes a desired signal from the conversion of incident radiation may be adjacent to each of the pixels 108'. In particular, each of the eight pixels 108 surrounding the pixel 108' may be a pixel 108a. The desired signals from those pixels 108a may be used to interpolate a value for replacing a missing signal associated with the pixel 108'. As an example of pixels whose signals may then be used to interpolate a value, the use of the surrounding eight pixels 108 is employed, but in other embodiments, signals from fewer than all eight pixels 108, including only one pixel 108, and / or signals from pixels 108 beyond the immediately adjacent pixels 108 may be used to interpolate the value.
[0035] Referring to FIG. 3D, in some embodiments, the array 102d may be similar to the array 102c of FIG. 3C. However, the pixels 108' of adjacent rows 107 may be offset by a different number of pixels 108. For example, the pixels 108' of a particular row 107 may be offset by any positive or negative number of pixels 108, such as + / −1, + / −2, + / −3, or more pixels 108, from the pixels 108' of an adjacent row 107. The pixels 108' of another row 107 may be offset by a different amount.
[0036] In some embodiments, the second pixels 108' can be offset from each other within the array 102d such that the second pixels 108' are randomly distributed or distributed in an asymmetric local pattern (within a specified pxq region or subset of the array 102d, where p represents the number of rows 107 and q represents the number of columns 109). In some embodiments, the second pixels 108' can be distributed such that the second pixels 108' are randomly distributed (or asymmetrically distributed) but have a substantially uniform density. As used herein, substantially uniform density means that the number of second pixels 108' within a given region of the pixels 108 is within a defined range, such as from about 2 to about 10, or more, across the array 102d. For example, the second pixels 108' can be distributed across the array 102d such that for any nxn region of the pixels 108 (where n is the number of rows 107 and the number of columns 109), for example, 1, 2, 3, or more m pixels are the second pixels 108'. In another example, for any nxn region of the pixels 108, the number of second pixels 108' present can be within a range, for example, from about 2 to about 10, or more. That is, although the density within the nxn region can vary, it can vary within a range such that the desired signal loss due to the use of the pixels 108' can be limited while sufficient EMI signals can be obtained.
[0037] Referring to FIG. 3E, in some embodiments, the second pixels 108' can be distributed across the array 102e in the same manner as the array 102b. However, the second pixels 108' can be arranged within a continuous sequence of columns 109 that is less than the pitch to the adjacent group of columns 109 that includes the second pixels 108', for example 2 or more. Here, two columns 109-1 and 109-2 are examples of a column sequence. The sequence can be repeated at columns 109-6 and 109-7, and at columns 109-11 and 109-12.
[0038] In some embodiments, the second pixels 108' may be distributed such that all rows 107 of the array 102 include at least one of the pixels 108'. That is, regardless of whether the distribution of the pixels 108' is the same as that of the arrays 102a - 102e or another similar distribution, all rows 107 include at least one pixel 108'.
[0039] In some embodiments, all rows 107 may include a plurality of second pixels 108'. Within a row 107, the pixels 108' may be positioned such that the distance from pixel 108a to pixel 108' is less than the number of pixels such as 5, 10, 20, or more. In some embodiments, even when the pixels 108' are distributed across the array 102 in a random manner, within any given row 107, the second pixels may be evenly spaced. For example, even when the pixels 108' are offset as in the array 102d of FIG. 3D, within a given row 107, the pitch of the pixels 108' may be the same across the row 107. In some embodiments, the pitch of the pixels 108' in other rows may be the same; however, the position of the pixels 108' may be relatively shifted from column 109 to column 109 along the row 107.
[0040] In some embodiments where dedicated second pixels 108' exist, the signal may be generated to approximate the desired signal that would have been generated by the second pixels 108' if the second pixels 108' were configured as the first pixels 108. As described above, any technique may be used to combine signals from adjacent pixels, pixels within a threshold distance, or the like to generate the approximated desired signal.
[0041] Referring to FIG. 3F, in some embodiments, the array 102f may include one or more additional data lines 104'. The additional data lines 104' may be arranged in parallel with and along a corresponding one of the data lines 104. The additional data lines 104' may be arranged within any column 109 of pixels 108' in the array 102a, the array 102b, or the like. That is, instead of using the pixels 108' within a column in the array 102a, the array 102b, or the like, the additional data lines 104' may be used.
[0042] In some embodiments, the additional data lines 104' are disposed on a metal layer of the array 102f that is different from the data lines 104. The additional data lines 104' may be disposed on the corresponding data lines 104. As a result, the additional data lines 104' may be hidden from the user. In some embodiments, the additional data lines 104' are disposed on the same metal layer as the data lines 104. The additional data lines 104' may be disposed proximate to the corresponding data lines 104.
[0043] In some embodiments, the additional data line 104' may have substantially the same structure as the corresponding data line 104. In other embodiments, the structure of the additional data line 104' may differ in such a way that the sensitivity of the additional data line 104' to EMI results in being closer to or substantially the same as that of the data line 104. For example, the additional data line 104' may have a different width, thickness, or the like. In some embodiments, a switch 112, a second pixel 108' including the switch 112, another structure having a similar capacitance, or the like may be coupled to the additional data line 104' to simulate the load of the switch 112 of the pixel 108a coupled to the data line 104. The second pixel 108' / switch 112 is shown as an example of such a structure. In some embodiments, the number of pixels 108' coupled to the additional data line 104' may be less than that of the associated data line 104. The number of second pixels 108' coupled to the additional data line 104' may be a number sufficient to approximate the sensitivity of the data line 104 to the additional data line 104'. In some embodiments, that number may be one second pixel 108'. In other embodiments, the additional data line 104' is not coupled to any pixel 108'.
[0044] In some embodiments, the presence of the additional data line 104' may result in a lower sensitivity of the pixels 108a of the column 109 compared to the adjacent columns 109. Accordingly, the values sampled from the column 109 that overlap with the additional data line 104' may be adjusted to compensate for the reduced sensitivity. In some embodiments, the position of the additional data line 104' is on another metal layer and may overlap with the associated data line 104. As a result, the reduction in the sensitivity of the pixels 108a of the column 109 may be reduced or eliminated as the sensitivity is already reduced due to the presence of the data line 104.
[0045] In some embodiments, the fill factor of array 102f may not be affected by the additional data line 104'. That is, in contrast to embodiments where pixel 108a is replaced by pixel 108' and thus does not contribute the desired signal to the resulting frame, when the additional data line 104' is used, the pixel 108a that converts radiation into an electrical signal is not missing.
[0046] Referring to FIG. 3G, in some embodiments, array 102g may be similar to array 102f. However, data line 104' may be coupled to some second pixels 108'. The second pixels 108' do not share data line 104 with the other pixels 108. Rather, the second pixels 108' are coupled to a dedicated additional data line (or sense line) 104'. The distribution of the second pixels 108' is shown as being similar to that of array 102e shown in FIG. 3E, but in other embodiments, the distribution of the second pixels 108' may be similar to other configurations described above.
[0047] FIG. 4 is a block diagram of a detector including a detector according to some embodiments. Imaging system 100 includes an array 102. Array 102 may be any of the arrays 102 described above, such as arrays 102a - 102f or the like. Array 102 includes data lines 104 / 104'. As described above, in some embodiments, data line 104' may be a dedicated data line 104' coupled to a second pixel 108' for each row 107, or may be an additional data line 104' that coincides with another data line 104 in column 109. In other embodiments, the operation of data lines 104 / 104' may vary based on whether the data lines 104 / 104' are coupled to pixel 108a or pixel 108' for a given row 107.
[0048] The imaging system 100 includes a row driver 122. The row driver 122 may be configured to generate a signal on the gate line 106 to selectively activate the rows 107 of the array 102.
[0049] The imaging system 100 includes control logic 120. The control logic 120 includes a sampling circuit configured to sample signals from the pixels 108. The sampling circuit includes circuits such as a charge amplifier, an analog-to-digital converter (ADC), a sample-and-hold circuit, or the like, configured to perform the sampling. The sampling circuit is coupled to the pixels 108 through the data lines 104 / 104'. The control logic 120 may include a general-purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a microcontroller, a programmable logic device, discrete circuits, a combination of such devices, or the like. The control logic 120 may include other circuits for coupling the control logic 120 to the row driver 122 or the like to enable the control logic 120 to control the operation of such circuits.
[0050] The control logic 120 can be configured to control various operations described herein. As will be described in more detail below, the control logic 120 can be configured to adjust the electrical signal from the pixel 108a of the array 102 based on an electrical signal received through at least one of the at least one data line 104'. In some embodiments, the control logic 120 is configured to combine the signal from the pixel 108a with the signal from a single pixel 108' or through a single data line 104'. However, in other embodiments, the signal from the pixel 108a can be combined with a signal generated based on signals received through a plurality of pixels 108' or a plurality of data lines 104'.
[0051] Figure 5 is a flowchart of a technique for operating a detector according to some embodiments. Referring to FIGS. 1-5, various operations of the detector 100 are described. At 500, a plurality of first signals are received from the pixels 108a configured to convert incident radiation into an electrical signal through a first set of the data lines 104. For example, the control logic 120 can be configured to control the row driver 122 to activate the row 107 of the array 102. An electrical signal such as a current or a voltage can be sampled by the control logic 120 through the data line 104.
[0052] At 502, at least one second signal is received through at least one data line 104' of a second set of data lines 104 / 104' other than the first set of data lines 104. The at least one second signal has a reduced contribution due to radiation conversion as compared to at least one first signal from adjacent data lines 104 of the first set of the plurality of data lines 104. The second set of data lines 104' can be the same for each row 107, can be different for each row 107, or can be shared by one row 107 and be different for other rows 107, or the like. The second set of data lines 104' can be different according to the various embodiments described above. For example, in some embodiments, the at least one second signal is received through a data line 104' that is not coupled to any pixel as described with respect to FIG. 3F. In other embodiments, the at least one second signal is received through a data line coupled to a second pixel 108' having an electrical connection different from the electrical connection of the first pixel 108, such that for the second pixel, the components of the second pixel are different from each component of the first pixel, such as those described with respect to FIG. 2D, and the electrical connection between the components of the components of the second pixel 108' is different from the electrical connection between each component of the first pixel, such as those described with respect to FIG. 2B, or the number of electrical connections to the second pixel 108' is different from the number of electrical connections to each of the first pixels 108, such as those described with respect to FIG. 2C.
[0053] In some embodiments, each electrical connection of the second pixel 108' is different from the electrical connection of the first pixel. At least one data line 104' may include one or more data lines 104' that are coupled to the corresponding second pixel 108' when the gate line of a particular row 107 is activated. In another embodiment, the second data line 104' may include dedicated data lines 104' as described with respect to array 102f. The control logic 120 may be configured to sample the signal received through the data line 104'.
[0054] As a result, a first signal and a second signal are available. The first signal includes both a portion representing the desired signal and a portion representing EMI. The second signal includes the portion representing EMI.
[0055] At 506, at least one second signal is combined with the first signal to generate a modified first signal. The combination can be performed in various ways. In some embodiments, the second signal of a row can be subtracted from each of the first signals of that row. In another embodiment, the leftmost second signal, the rightmost second signal, or the nearest neighbor second signal can be subtracted from a given first signal. Since the first signal and the second signal are sampled substantially simultaneously for a given row 107, the EMI contribution to the second signal should be the same as the EMI contribution to the first signal. In particular, this causes the EMI to be temporally correlated with the desired signal. Substantially simultaneously means within the read cycle for a given row 107.
[0056] FIG. 6 is a flowchart of a technique for operating an imaging system according to some embodiments. Referring to FIGS. 1-4 and FIG. 6, in some embodiments, the operation may be similar to the corresponding operations 500, 502, and 506 of FIG. 5. However, the combination of the first signal and the second signal in 506 may, in 508, interpolate a plurality of second signals of at least one second signal to generate an interpolated second signal for each of the first signals, and, in 510, combine each first signal with the corresponding interpolated second signal. As a result, the second signal may be correlated with a given pixel 108a both spatially and temporally.
[0057] The interpolation in 506 can be performed in various ways. In some embodiments, two second signals can be averaged to generate an interpolated second signal that can be subtracted from the first signal. In some embodiments, the two closest second signals and the position of pixel 108a that generated the first signal for the two second pixels 108' can be used, and the signals can be combined using a weighted average. Equation 1 is FS n is an example of the nth first signal from pixel 108a in column 109-n received through data line 104. SS j and SS k are the jth and kth second signals received from columns 109-j and 109-k from data line 104', where j < n < k. As a result, the nth corrected signal MS n is produced.
[0058]
Equation
[0059] In another embodiment, a plurality of second signals can be combined together to generate a spline interpolation function. For example, a spline interpolation function can be generated using a set of pairs of a pixel column for a given row and a second signal from data line 104'. Using the column associated with a given data line 104, an EMI signal for that particular pixel can be generated based on the column and the spline interpolation function.
[0060] Although interpolation between adjacent nearest neighbors and spline interpolation techniques are used as examples, any interpolation technique can be used to determine an interpolated second value and subtract it from the first signal to generate a modified first signal.
[0061] In some embodiments, the number of data lines 104' used to generate the second signal for each row 107 can be based on the desired noise performance. For example, the spacing of the data lines 104' can be selected based on a signal-to-noise ratio greater than 8, 10, 16, or a larger number. The number of data lines 104' per row can be a percentage of the number of columns 109, such as 5, 10, or more.
[0062] The selection of the number of data lines 104' can be based on the expected EMI. The magnetic field can vary spatially. The spacing of the data lines 104' can be based on that spatial variation. The EMI that can penetrate other EMI shields can be relatively low-frequency EMI. As a result, the placement of the data lines 104' need not be close to any given pixel 108a. The placement can be based on the expected amplitude and frequency of the EMI.
[0063] FIG. 7 is a block diagram of a two-dimensional X-ray imaging system according to some embodiments. The two-dimensional X-ray imaging system 700 includes an X-ray source 702 and a detector 710. The detector 710 can be similar to the detector 100 including the array 102 or the like as described above. The X-ray source 702 is arranged relative to the detector 710 such that X-rays 720 can be generated, pass through the sample 722, and be detected by the detector 710. In some embodiments, the detector 710 is part of a medical imaging system, a non-destructive inspection system, or the like. In other embodiments, the two-dimensional X-ray imaging system 700 can include a portable vehicle scanning system as part of a cargo scanning system.
[0064] Some embodiments include: a plurality of first pixels 108, each first pixel 108 being configured to convert radiation into an electrical signal; and a first set of a plurality of data lines 104 / 104' coupled to the first pixels 108; control logic 120 configured to receive at least one second signal through at least one data line 104' of a second set of a plurality of data lines 104 / 104' other than the first set of a plurality of data lines 104 / 104', and combine the at least one second signal with the first signal to generate a modified first signal, wherein at least one data line 104' of the second set: is not coupled to any pixel; or is coupled to a second pixel 108' by an electrical connection different from the electrical connection of the first pixel 108, such that for the second pixel 108': the components of the second pixel 108' are different from each component of the first pixel 108; the electrical connection between the components of the components of the second pixel 108' is different from the electrical connection between each component of the first pixel 108; or the number of electrical connections to the second pixel 108' is different from the number of electrical connections to each of the first pixels 108, and a detector having the above is provided.
[0065] Some embodiments include: a plurality of first pixels 108, each first pixel 108 configured to convert radiation into an electrical signal; a plurality of second pixels 108'; and a plurality of data lines 104 / 104' coupled to the first pixels 108 and the second pixels 108'; control logic 120 configured to combine a signal from at least one of the second pixels 108' with an electrical signal from one of the first pixels 108; wherein each electrical connection of each second pixel 108' is different from the electrical connection of each first pixel 108, such that for each second pixel: the components of the second pixel 108' are different from the components of each first pixel 108; the electrical connections between the components of the components of the second pixel 108' are different from the electrical connections between the components of each first pixel 108; or the number of electrical connections to the second pixel 108' is different from the number of electrical connections to each first pixel 108, and a detector having the above is provided.
[0066] In some embodiments, each first pixel 108 includes: a sensor 110; and a switch 112 electrically connected between the sensor 110 and an associated one of the data lines 104 / 104'; each second pixel 108' includes: a sensor 110; and a switch 112 electrically connected to an associated one of the data lines 104 / 104' and electrically disconnected from the sensor 110.
[0067] In some embodiments, each first pixel 108 includes: a sensor 110; and a switch 112 electrically connected between the sensor 110 and an associated one of the data lines 104; each second pixel 108' does not include a sensor 110.
[0068] In some embodiments, the detector further includes a plurality of gate lines 106 associated with a first pixel 108 and a second pixel 108'; wherein, for the electrical connection of each second pixel 108' different from the first pixel 108, each transistor 112 of the first pixel 108 is electrically connected to a corresponding one of the gate lines 106, and each corresponding transistor 112 of the second pixel 108' is not electrically connected to a corresponding one of the gate lines 106.
[0069] In some embodiments, the first pixel 108 and the second pixel 108' are arranged within a row 107 and a column 109 of the array 102; and each row 107 of the array 102 includes at least one of the first pixels 108 and at least one of the second pixels 108'.
[0070] In some embodiments, at least one group of the second pixels 108' forms one of the columns 109 of the array 102.
[0071] In some embodiments, the second pixels 108' are arranged in a plurality of groups; and each group of the second pixels 108' forms a corresponding one of the columns 109 of the array 102.
[0072] In some embodiments, each column 109 of the array 102 includes at least one first pixel 108.
[0073] In some embodiments, each second pixel 108' in a row 107 of the array 102 is offset along the row 107 of the array 102 from at least one second pixel 108' in another row 107 of the array 102.
[0074] In some embodiments, the second pixels 108' have a substantially uniform density across the array 102.
[0075] In some embodiments, the data lines 104 / 104' include a first data line 104 and at least one second data line 104'; the first data line 104 is coupled to a first pixel 108; the at least one second data line 104' is coupled to a second pixel 108', and each of the at least one second data line 104' is arranged in parallel with and along a corresponding one of the first data lines 104; and the control logic 120 is configured to adjust an electrical signal from the first pixel 108 based on an electrical signal received through at least one of the at least one second data line 104'.
[0076] In some embodiments, the control logic 120 is configured to combine an electrical signal from one of the first pixels 108 with a signal based on interpolating signals from at least two of the second pixels 108'.
[0077] In some embodiments, the first pixel 108 and the second pixel 108' are disposed within a row 107 and a column 109 of the array 102; each row 107 of the array 102 includes more than one of the first pixels 108 and more than one of the second pixels 108'; and for each first pixel 108 of the row, the control logic 120 is configured to combine an electrical signal from the first pixel 108 with a combination of electrical signals from at least two of the second pixels 108' of the row 107.
[0078] In some embodiments, each second pixel 108' has an electrical connection for reducing an electrical signal resulting from radiation conversion for an adjacent first pixel 108 on one of the plurality of data lines 104 / 104' coupled to the second pixel 108'.
[0079] In some embodiments, the data line 104' coupled to the second pixel 108' is not coupled to the first pixel 108.
[0080] In some embodiments, for each data line 104' coupled to a second pixel 108', the number of second pixels 108' coupled to that data line 104' is less than the number of first pixels 108 coupled to the associated data line 104 coupled to the first pixel 108.
[0081] Some embodiments include: a plurality of pixels 108, each pixel 108 being configured to convert radiation into an electrical signal; a first set of data lines 104 coupled to the pixels 108 and a second set of data lines 104' not coupled to the pixels 108, the plurality of data lines 104 / 104'; and, for each of the pixels 108, control logic 120 configured to combine an electrical signal from the first set of data lines 104 coupled to the pixel 108 with an electrical signal from at least one data line 104' from the second set of data lines 104'.
[0082] In some embodiments, the detector further includes a switch 112 coupled to each of the second set of data lines 104'.
[0083] Some embodiments include: receiving a plurality of first signals from a first pixel 108 configured to convert radiation into an electrical signal through a first set of a plurality of data lines 104; receiving at least one second signal through at least one data line 104' of a second set of a plurality of data lines 104 / 104' other than the first set of the plurality of data lines 104, wherein at least one data line 104' of the second set is not coupled to any pixel; or is coupled to a second pixel 108' by an electrical connection different from the electrical connection of the first pixel 108, such that for the second pixel: the components of the second pixel 108' are different from each component of the first pixel 108; the electrical connections between the components of the components of the second pixel 108' are different from the electrical connections between each component of the first pixel 108; or the number of electrical connections to the second pixel 108' is different from the number of electrical connections to each of the first pixels 108; and combining the at least one second signal with the first signal to generate a modified first signal. A method comprising the above is provided.
[0084] In some embodiments, for each row 107 of the array 102 including the first pixel 108, at least one data line 104' of a plurality of data lines 104 / 104' other than the first set of the plurality of data lines 104 is the same as another row 107.
[0085] In some embodiments, for at least one row 107 of the array 102 including the first pixel 108, at least one data line 104' of a plurality of data lines 104 / 104' other than the first set of the plurality of data lines 104 / 104' is different from another row 107.
[0086] In some embodiments, the step of generating a modified first signal by combining at least one second signal with the first signal includes: interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals; and combining each first signal with the corresponding interpolated second signal.
[0087] Some embodiments include: means for receiving a plurality of first signals from a first pixel configured to convert radiation into an electrical signal through a first set of a plurality of data lines; means for receiving at least one second signal through at least one data line of a second set of a plurality of data lines other than the first set of data lines, wherein at least one data line of the second set is not coupled to any pixel; or is coupled to a second pixel by an electrical connection different from the electrical connection of the first pixel, such that for the second pixel: the components of the second pixel are different from each component of the first pixel; the electrical connections between the components of the components of the second pixel are different from the electrical connections between each component of the first pixel; or the number of electrical connections to the second pixel is different from the number of electrical connections to each of the first pixels; and means for combining the at least one second signal with the first signal to generate a modified first signal.
[0088] Examples of means for receiving a plurality of first signals from a first pixel configured to convert radiation into an electrical signal through a first set of a plurality of data lines include data line 104, row driver 122, control logic 120, or the like.
[0089] Examples of means for receiving at least one second signal through at least one data line of a second set of a plurality of data lines other than the first set of data lines include data line 104', row driver 122, control logic 120, or the like.
[0090] Examples of means for generating a modified first signal by combining at least one second signal with the first signal include control logic 120 or the like.
[0091] In some embodiments, the means for combining at least one second signal with the first signal to generate a modified first signal comprises: means for interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals; and means for combining each first signal with the corresponding interpolated second signal.
[0092] Examples of means for interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals include control logic 120 or the like.
[0093] Examples of means for combining each first signal with the corresponding interpolated second signal include control logic 120 or the like.
[0094] Although structures, devices, methods, and systems according to specific embodiments have been described, those skilled in the art will readily recognize that many variations to the specific embodiments are possible, and thus any variations should be considered to fall within the spirit and scope disclosed herein. Accordingly, many modifications may be made by those skilled in the art without departing from the spirit and scope of the appended claims.
[0095] The claims following this disclosure document are hereby expressly incorporated into this disclosure document, and each claim is independent as a separate embodiment. This disclosure includes all permutations of the independent claims and their dependent claims. Further, additional embodiments derivable from the following independent and dependent claims are also expressly incorporated herein. These additional embodiments are determined by replacing the dependency of a given dependent claim with the phrase "any of the claims beginning with claim [x] and ending with the claim immediately preceding this claim", where the term in brackets "[x]" is replaced with the number of the most recently recited independent claim. For example, for a first set of claims beginning with independent claim 1, claim 4 can be dependent on either claim 1 or claim 3, and these separate dependencies result in two different embodiments; claim 5 can be dependent on any one of claims 1, 3, or 4, and these separate dependencies result in three different embodiments; claim 6 can be dependent on any one of claims 1, 3, 4, or 5, and these separate dependencies result in four different embodiments; and so on.
[0096] Within the claims, the recitation of the term "first" with respect to a feature or element does not necessarily imply the existence of a second or additional such feature or element. Where elements are specifically recited in means-plus-function format, they are intended to be construed to cover the corresponding structures, materials, or acts described herein, and equivalents thereof, in accordance with 35 U.S.C. § 112(f). Embodiments of the invention for which exclusive ownership or privilege is claimed are defined as follows. (Other possible items) (Item 1) A plurality of first pixels, each first pixel being configured to convert radiation into an electrical signal; A plurality of second pixels; and A plurality of data lines coupled to the plurality of first pixels and the plurality of second pixels; Control logic configured to combine a signal from at least one of the plurality of second pixels with an electrical signal from one of the plurality of first pixels; Here, the electrical connection of each of the plurality of second pixels is different from the electrical connection of the plurality of first pixels, so that for each second pixel: The components of the second pixel are different from the components of each of the plurality of first pixels; The electrical connection between the components of the components of the second pixel is different from the electrical connection between the components of each of the plurality of first pixels; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the plurality of first pixels A detector comprising. (Item 2) Each first pixel: A sensor; and A switch electrically connected between the sensor and an associated one of the plurality of data lines Having; and Each second pixel: A sensor; and A switch electrically connected to an associated one of the plurality of data lines and electrically disconnected from the sensor Having The detector according to item 1. (Item 3) Each first pixel: A sensor; and A switch electrically connected between the sensor and an associated one of the plurality of data lines Having; and Each second pixel does not have a sensor The detector according to item 1. (Item 4) A plurality of gate lines associated with the plurality of first pixels and the plurality of second pixels; Here, regarding the electrical connection of each second pixel different from the plurality of first pixels, each transistor of the plurality of first pixels is electrically connected to a corresponding one of the plurality of gate lines, and the corresponding transistor of each of the plurality of second pixels is not electrically connected to a corresponding one of the plurality of gate lines The detector according to any one of items 1 to 3, further comprising . (Item 5) The plurality of data lines include a first data line and at least one second data line; The first data line is coupled to the plurality of first pixels; The at least one second data line is coupled to the plurality of second pixels, Each of the at least one second data lines is arranged in parallel with and along a corresponding one of the first data lines; and The control logic is configured to adjust an electrical signal from the plurality of first pixels based on an electrical signal received through at least one of the at least one second data lines The detector according to any one of items 1 to 4. (Item 6) The detector according to any one of items 1 to 5, wherein the control logic is configured to combine an electrical signal from one of the plurality of first pixels with a signal based on interpolating signals from at least two of the plurality of second pixels. (Item 7) The plurality of first pixels and the plurality of second pixels are arranged within rows and columns of an array; Each row of the array includes more than one of the plurality of first pixels and more than one of the plurality of second pixels; and For each first pixel of a row, the control logic is configured to combine an electrical signal from the first pixel with a combination of electrical signals from at least two of the plurality of second pixels of the row. The detector according to any one of items 1 to 6. (Item 8) Each second pixel has an electrical connection for reducing an electrical signal resulting from radiation conversion of an adjacent first pixel on one of the plurality of data lines coupled to the second pixel, the detector according to any one of items 1 to 7. (Item 9) The plurality of first pixels and the plurality of second pixels are arranged within rows and columns of an array; and Each row of the array includes at least one of the plurality of first pixels and at least one of the plurality of second pixels. The detector according to any one of items 1 to 8. (Item 10) At least one group of the plurality of second pixels forms one of the columns of the array. The detector according to item 9. (Item 11) The plurality of second pixels are arranged within a plurality of groups; and Each group of the plurality of second pixels forms a corresponding one of the columns of the array. The detector according to item 9. (Item 12) Each second pixel of a row of the array is offset along the row of the array from at least one second pixel in another row of the array. The detector according to any one of items 9 to 11. (Item 13) The plurality of second pixels have a substantially uniform density across the array. The detector according to any one of items 9 to 12. (Item 14) The data lines coupled to the plurality of second pixels are not coupled to the plurality of first pixels The detector according to any one of items 1 to 13 (Item 15) For each of the data lines coupled to the plurality of second pixels, the number of second pixels coupled to that data line is less than the number of first pixels coupled to the associated data line coupled to the first pixels The detector according to item 14 (Item 16) Receiving a plurality of first signals from first pixels configured to convert radiation into electrical signals through a first set of a plurality of data lines; Receiving at least one second signal through at least one data line of a second set of the plurality of data lines other than the first set of the plurality of data lines, wherein the at least one data line of the second set is: Not coupled to any pixel; or Coupled to a second pixel by an electrical connection different from the electrical connection of the first pixel, and thus for the second pixel: The components of the second pixel are different from the components of each of the first pixels; The electrical connections between the components of the components of the second pixel are different from the electrical connections between the components of each of the first pixels; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the first pixels; and Combining the at least one second signal with the plurality of first signals to generate a modified first signal A method comprising (Item 17) For at least one row of the array including the first pixels, the at least one data line of the plurality of data lines other than the first set of the plurality of data lines is different from another row The method according to item 16. (Item 18) The step of generating the corrected first signal by combining the at least one second signal with the first signal comprises: Interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals; and Combining each first signal with the corresponding interpolated second signal The method according to any one of item 16 or item 17, having. (Item 19) Means for receiving a plurality of first signals from a first pixel configured to convert radiation into an electrical signal through a first set of a plurality of data lines; Means for receiving at least one second signal through at least one data line of a second set of the plurality of data lines other than the first set of the plurality of data lines, wherein the at least one data line of the second set is: Not coupled to any pixel; or Coupled to a second pixel by an electrical connection different from the electrical connection of the first pixel, so that for the second pixel: The components of the second pixel are different from each component of the first pixel; The electrical connection between the components of the components of the second pixel is different from the electrical connection between each of the components of the first pixel; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the first pixels; and Means for combining the at least one second signal with the plurality of first signals to generate a corrected first signal A detector comprising. (Item 20) The means for combining the at least one second signal with the first signal to generate the corrected first signal is: Means for interpolating a plurality of second signals of said at least one second signal to generate an interpolated second signal for each of said first signals; and Means for combining each first signal with a corresponding interpolated second signal The detector according to item 19, having the above.
Claims
1. A plurality of first pixels, each first pixel being configured to convert radiation into an electrical signal; A plurality of second pixels; and A plurality of data lines coupled to the plurality of first pixels and the plurality of second pixels; Control logic configured to combine a signal from at least one of the plurality of second pixels with an electrical signal from one of the plurality of first pixels; wherein the electrical connection of each of the plurality of second pixels is different from the electrical connection of the plurality of first pixels, such that for each second pixel: The components of the second pixel are different from the components of each of the plurality of first pixels; The electrical connection between the components of the components of the second pixel is different from the electrical connection between the components of each of the plurality of first pixels; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the plurality of first pixels A detector comprising the above.
2. Each first pixel comprises: A sensor; and A switch electrically connected between the sensor and an associated one of the plurality of data lines And; Each second pixel comprises: A sensor; and A switch electrically connected to an associated one of the plurality of data lines and electrically disconnected from the sensor Having the above The detector according to claim 1.
3. Each first pixel comprises: A sensor; and A switch electrically connected between the sensor and an associated one of the plurality of data lines And; Each second pixel does not have a sensor The detector according to claim 1.
4. A plurality of gate lines associated with the plurality of first pixels and the plurality of second pixels; wherein for the electrical connection of each second pixel different from the plurality of first pixels, each transistor of the plurality of first pixels is electrically connected to a corresponding one of the plurality of gate lines, and each corresponding transistor of the plurality of second pixels is not electrically connected to a corresponding one of the plurality of gate lines The detector according to claim 1, further comprising the above.
5. The plurality of data lines have a first data line and at least one second data line; The first data line is coupled to the plurality of first pixels; The at least one second data line is coupled to the plurality of second pixels, each of the at least one second data lines is arranged in parallel with and along a corresponding one of the first data lines; and the control logic is configured to adjust an electrical signal from the plurality of first pixels based on an electrical signal received through at least one of the at least one second data lines The detector according to claim 1.
6. The control logic is configured to combine an electrical signal from one of the plurality of first pixels with a signal based on interpolating signals from at least two of the plurality of second pixels, the detector according to claim 1.
7. The plurality of first pixels and the plurality of second pixels are arranged within rows and columns of an array; each row of the array includes more than one of the plurality of first pixels and more than one of the plurality of second pixels; and for each first pixel of a row, the control logic is configured to combine the electrical signal from the first pixel with a combination of electrical signals from at least two of the plurality of second pixels of the row The detector according to claim 1.
8. Each second pixel has an electrical connection for reducing an electrical signal resulting from radiation conversion to an adjacent first pixel on one of the plurality of data lines coupled to the second pixel, the detector according to claim 1.
9. The plurality of first pixels and the plurality of second pixels are arranged within rows and columns of an array; and each row of the array includes at least one of the plurality of first pixels and at least one of the plurality of second pixels The detector according to any one of claims 1 to 8.
10. At least one group of the plurality of second pixels forms one of the columns of the array The detector according to claim 9.
11. The plurality of second pixels are arranged within a plurality of groups; and each group of the plurality of second pixels forms a corresponding one of the columns of the array The detector according to claim 9.
12. Each second pixel of a row of the array is offset along the row of the array from at least one second pixel in another row of the array. The detector according to claim 9.
13. The plurality of second pixels have a substantially uniform density across the array. The detector according to claim 9.
14. The data lines coupled to the plurality of second pixels are not coupled to the plurality of first pixels. The detector according to any one of claims 1 to 8.
15. For each of the data lines coupled to the plurality of second pixels, the number of second pixels coupled to that data line is less than the number of first pixels coupled to an associated data line coupled to a first pixel. The detector according to claim 14.
16. Receiving a plurality of first signals from first pixels configured to convert radiation to an electrical signal through a first set of a plurality of data lines; Receiving at least one second signal through at least one data line of a second set of the plurality of data lines other than the first set of the plurality of data lines, wherein the at least one data line of the second set is: Not coupled to any pixel; or Coupled to a second pixel by an electrical connection different from the electrical connection of the first pixel, such that for the second pixel: The components of the second pixel are different from the components of each of the first pixels; The electrical connections between the components of the components of the second pixel are different from the electrical connections between the components of each of the first pixels; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the first pixels; and Combining the at least one second signal with the plurality of first signals to generate a modified first signal. A method comprising.
17. For at least one row of the array including the first pixel, the at least one data line of the plurality of data lines other than the first set of the plurality of data lines is different from another row. The method according to claim 16.
18. Combining the at least one second signal with the first signal to generate the modified first signal comprises: Interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals; and Combining each first signal with a corresponding interpolated second signal The method according to any one of claims 16 or 17.
19. Means for receiving a plurality of first signals from a first pixel configured to convert radiation into an electrical signal through a first set of a plurality of data lines; Means for receiving at least one second signal through at least one data line of a second set of the plurality of data lines other than the first set of the plurality of data lines, wherein the at least one data line of the second set is: Not coupled to any pixel; or Coupled to a second pixel by an electrical connection different from the electrical connection of the first pixel, and thus for the second pixel: The components of the second pixel are different from each component of the first pixel; The electrical connection between the components of the components of the second pixel is different from the electrical connection between each of the components of the first pixel; or The number of electrical connections to the second pixel is different from the number of electrical connections to each of the first pixels; and Means for combining the at least one second signal with the plurality of first signals to generate a modified first signal A detector comprising.
20. The means for combining the at least one second signal with the first signal to generate the modified first signal is: Means for interpolating a plurality of second signals of the at least one second signal to generate an interpolated second signal for each of the first signals; and Means for combining each first signal with a corresponding interpolated second signal The detector according to claim 19, having.