Method and system for analyzing an object

Abstract

A method and system for analyzing an object (2) are described. At least one supplying means (3), at least one "first" analyzing laser (4.1), and at least one spectrometer (5) are provided and / or present. The object (2) is supplied and / or moved, in particular fed, by the supplying means (3), and the object (2) is moved, in particular dropped by the supplying means (3), in a flight path (6) at the end (3.e) of the supplying means (3) for its analysis. The first analyzing laser (4.1) is positioned and / or is positioned relative to the supplying means (3) so that the object (2) flies through the laser beam (4.1.s) in the region of the focal point (4.1.p) during each movement in its respective flight path (6). The field of view (5.s) of the spectrometer (5) is positioned and / or is positioned to coincide with the region of the flight path (6) of the object (2). The fact that the field of view (5.s) of the spectrometer (5) is realized by the bare fiber end (5.ofe) improves the analysis of the object (2) and in particular allows the material of the object (2) to be accurately identified with a high degree of certainty, or allows the material of the object (2) to be accurately identified with a high degree of certainty.

Description

[Technical Field]

[0001] The invention relates to a method for analyzing an object having the features of the preamble of claim 1 and to a system for analyzing an object having the features of the preamble of claim 16. [Background technology]

[0002] Such methods and systems for analyzing and in particular also sorting objects are used, for example, in particular during the recycling process of objects, which may in particular be metal parts, metal scrap, in particular aluminum scrap, ore pieces, batteries, packaging, waste, etc.

[0003] A corresponding method and system for analyzing an object is known from Patent Document 1. The object leaves a supply means configured as a chute along a corresponding flight path, is analyzed during flight, and is correspondingly classified based on the analysis. For the analysis, an analysis laser and a spectrometer are arranged below the flight path. Furthermore, a pre-cleaning laser (ablation laser) is provided, with which the object can be correspondingly cleaned before analysis. The analysis laser and the pre-cleaning laser are arranged parallel to each other or at a predetermined angle to each other. The radiation of the plasma generated in the object by the pre-cleaning laser is not detectable by the spectrometer. A separating metal sheet is arranged between the two lasers, particularly between the pre-cleaning laser and the spectrometer, so that radiation possibly induced in the object by the pre-cleaning laser is captured by the separating metal sheet before it can reach the spectrometer. The pre-cleaning laser therefore serves exclusively for pre-cleaning or ablation of the object. In contrast, the radiation of the plasma generated in the object by the analysis laser is detectable by the spectrometer and evaluated to analyze the object. The plasma generated by the analysis laser is generated at the location of the object pre-cleaned by the pre-cleaning laser, so that the object itself or the object's material is analyzed by the spectrometer, without potentially present object contaminants being analyzed by the spectrometer. In other words, the focus of the analysis laser is located within the field of view of the spectrometer, while the focus of the pre-cleaning laser is located outside the field of view of the spectrometer. The analysis laser has a pulse repetition frequency of 50 kHz or higher. With each laser pulse of the analysis laser, an implantation crater is formed in the object to generate plasma at the measurement point. At such high pulse repetition frequencies, at least two implantation craters may overlap. Thus, two consecutive laser pulses strike the object at least partially in the same area of ​​the object.In devices known from the prior art, the supply means has a number of supply tracks, each of which is assigned one laser or one blow-out nozzle, and in this case the blow-out nozzles are formed in a so-called nozzle bar.

[0004] The above-mentioned known methods or systems are not yet optimally designed. Known spectrometers have imaging optics through which radiation or light rays then enter the spectrometer. Due to the imaging optics, the spectrometer has a limited, small field of view, so that even imprecision in adjusting the spectrometer can lead to serious malfunctions of the spectrometer. Furthermore, so-called chromatic aberrations occur in the collimator of the imaging optics, whereby radiation of different wavelengths is refracted with different intensities, and the collimator cannot be adjusted "sharply" for each wavelength simultaneously. This also poses problems when evaluating the measurement results of the spectrometer, as the respective materials of the respective objects to be analyzed may not be accurately identified or corresponding errors may occur. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] European Patent No. 3352919 Summary of the Invention [Problem to be solved by the invention]

[0006] The problem underlying the present invention is therefore to improve and / or configure known methods and / or known systems for analyzing objects in such a way that the analysis of objects is improved, in particular so that the material of the object is accurately identified or can be identified with a high degree of certainty, and in particular so that the higher costs that may arise in some cases are avoided. [Means for solving the problem]

[0007] This problem underlying the present invention is firstly solved by a method for analyzing an object having the features of claim 1.

[0008] An important aspect of the present invention is that the field of view of the spectrometer is essentially realized by the exposed fiber end of the optical fiber.

[0009] Such bare fiber ends are, first of all, particularly easy to manufacture and particularly inexpensive to produce. Furthermore, bare fiber ends are less sensitive to inaccuracies in the adjustment of the spectrometer than known collimators, since they have a significantly larger field of view than collimators. Furthermore, the now-bare fiber ends effectively avoid the "chromatic aberration" that occurs in collimators, since the bare fiber ends accept radiation of different wavelengths with the same intensity ratio as emitted from the plasma. This is also extremely advantageous when the intensity accepted by the bare fiber ends varies due to the possibly different spacing of the plasma relative to the bare fiber ends. This intensity variation cannot be avoided due to the sometimes complex geometry of the object. However, when using bare fiber ends (without a collimator), different intensities can be accepted clearly, particularly without distortion of the intensity ratio, and / or can then be assigned to different spacings. The bare fiber end is particularly positioned near the flight path of the target so that radiation can reach the bare fiber end with a sufficiently high intensity for accurate measurement. Therefore, radiation from the plasma generated in the target by the analyzing laser is received by the bare fiber end. Therefore, the bare fiber end is less sensitive to adjustment than a collimator, for which accurate and identical adjustment becomes very problematic when multiple supply / measurement tracks are provided. The field of view of the bare fiber end is particularly large enough, even without a lens, to completely capture the plasma, even when the plasma position changes slightly due to the surface shape of the target.

[0010] During the generation of plasma, electromagnetic light rays, in particular light with a specific wavelength / light of a specific wavelength, are generated, where each wavelength and / or intensity spectrum is characteristic for each material of each object. The light rays originate from the plasma and ultimately reach a spectrometer or a spectrometer sensor for analysis. This electromagnetic light rays, in particular the corresponding light with the respective wavelength, are also referred to herein as the "radiation" of the plasma. Via this plasma radiation, the respective material of the object is identified.

[0011] Thus, first, the plasma radiation is transmitted in the form of an electromagnetic beam from the plasma to the bare fiber end. The radiation or beam is coupled into the optical fiber at the bare fiber end. In other words, the radiation or beam enters the optical fiber directly at the bare fiber end. The optical fiber then further guides the radiation or beam to a sensor of the spectrometer, where it can then be converted into an electrical signal by one or more sensors.

[0012] In another embodiment or configuration of the method, a second laser generates a second laser beam having a second focal point, and the second laser is positioned relative to the supply means and / or the second laser is positioned relative to the supply means such that the object flies through the second laser beam in the region of the second focal point during its respective movement along its respective flight path.

[0013] The second laser is in particular formed and / or configured as a second analysis laser or as an ablation laser, or is then used correspondingly.

[0014] If the second laser is configured as an analysis laser, the second focal point of the second analysis laser is in particular also in the field of view of the spectrometer or in this embodiment in the field of view formed by the bare fiber end of the optical fiber. The first analysis laser and the second analysis laser are therefore aligned or are aligned with each other in such a way that the first focal point of the first analysis laser is spaced apart from the second focal point of the second analysis laser, in which case plasmas of the object are generated by the first focal point of the first analysis laser and / or by the second focal point of the second analysis laser and the radiation of these plasmas is analyzed by the spectrometer.

[0015] This allows objects with more complex geometries, especially those that are not flat, to be analyzed optimally as desired. The material type of the object is correctly and accurately identified with a high degree of certainty. Plasmas are generated in each object by each analysis laser, i.e., at multiple measurement points, and the radiation, preferably all of these plasmas, is evaluated by a spectrometer. Even if one of the two analysis lasers does not generate an evaluable plasma due to the complex geometry of the object to be analyzed, in a preferred embodiment of the method, at least one evaluable plasma is generated by the other of the at least two analysis lasers with at least a high degree of certainty. It should be noted here that the focal spot has a certain spatial extent, particularly due to the corresponding focusing of the laser beam emitted by the analysis laser.

[0016] Alternatively, the focal point of the second laser, particularly the ablation laser, may be located outside the field of view of the spectrometer, i.e., outside the field of view achieved by the bare fiber end, and thus, based on its function, the second laser is utilized / used for "pre-ablation" of the target object, rather than as an analytical laser.

[0017] In another embodiment or configuration of the method, the first analysis laser and the second analysis laser are positioned relative to each other so that the focal points of the first analysis laser and the second analysis laser are spaced apart and positioned above and below each other, particularly on a line perpendicular to the flight path of the object.

[0018] This allows for a further increase in the number of measurement points at which plasma is generated that can be evaluated by the spectrometer, thus further increasing the reliability of an accurate analysis of the material type of the object, which in turn allows for a highly accurate identification of each specific material of the object.

[0019] In another alternative embodiment of the method, the first analysis laser and the second laser, in particular the second analysis laser or ablation laser, are aligned with each other so that the foci of the first analysis laser and the foci of the second laser are positioned substantially horizontally next to each other in the feed direction of the object.

[0020] In a particularly preferred embodiment, when two lasers are used as analysis lasers, the number of measurement points at which plasma is generated and can be evaluated by the spectrometer can be further increased by horizontally arranging the focal points. This also correspondingly increases the reliability of accurate analysis of the material type of the object. This also applies in particular when the second laser is configured and used as an ablation laser. In particular, depending on the specific shape and / or three-dimensional configuration of the object, the above-mentioned possibilities for adjusting the focal points relative to each other can be highly advantageous.

[0021] The plasma radiation generated in the object by the first and / or second analysis lasers is received by or sensed and / or first detected via the bare fiber end. The plasma radiation reaches the bare fiber end in the form of plasma, particularly electromagnetic, light rays. The radiation or light rays are directly coupled into the optical fiber at the bare fiber end. In other words, the radiation or light rays enter the optical fiber at the bare fiber end. The optical fiber further guides the radiation or light rays to one or more sensors of a spectrometer, where the radiation or light rays can be correspondingly analyzed by the spectrometer.

[0022] In another embodiment of the method, the first analysis laser and / or the second laser emit pulses having a specific pulse repetition frequency. The value of this pulse repetition frequency in kHz corresponds to a specific value of the object's velocity in m / s upon leaving the supply means multiplied by a specific factor, in particular a factor of at least 15. In particular, the first analysis laser and / or the second laser have a specific pulse repetition frequency. If the second laser is configured as an ablation laser, this ablation laser has a pulse repetition frequency of at least 45 kHz, in particular, and the first analysis laser has a pulse repetition frequency of at least 5 kHz. If both lasers are configured as analysis lasers, the lasers have a pulse repetition frequency of at least 20 kHz, in particular at least 45 kHz.

[0023] If the pulse repetition frequency is one of these values ​​and the focal diameter is a corresponding, particularly specific value, then an overlap of two successive pulses of the respective analysis laser occurs at the object, so that any cleaning or preliminary ablation that may be carried out at the respective object is essentially already carried out by the respective analysis laser, i.e., by the preceding pulse, and the subsequent pulse makes it possible to precisely identify, with a high degree of certainty, the respective material of the respective object.

[0024] The first analysis laser and / or the second laser, in particular the second analysis laser or ablation laser, preferably have a positioning device. If necessary, each positioning device changes the position of the corresponding laser and thus the location of the corresponding focus. In particular, the spatial arrangement of the focus of the first analysis laser and the focus of the second laser relative to each other and relative to the field of view of the spectrometer can be changed and / or adapted.

[0025] This particularly increases the flexibility of use of the method. Different configurations can be quickly adjusted, and in some cases, positioning can even be performed while the system is running. Thus, the positioning of the lasers relative to each other and relative to the field of view of the spectrometer can be adapted and / or optimized depending on the type of object to be analyzed. Thus, for example, the object can be detected by a separate detection means / sensor, for example by a camera, during its movement by or on the supply means, and / or its geometry, size, and / or position on the supply means can be correspondingly analyzed, and then the lasers can be automatically optimally positioned relative to each other and relative to the field of view of the spectrometer, in particular by controlling the actuators of the positioning devices.

[0026] In a preferred embodiment or configuration of the method, a sorting device is provided and / or present, which classifies and / or sorts the objects into at least two mutually different categories based on the measurement data generated by the spectrometer, in particular depending on the detected and identified material of the objects, in particular by means of an air jet.

[0027] This classification, for example, simplifies subsequent recycling of the objects, since objects of the same material can be recycled better.

[0028] In another embodiment of the method, at least one control unit and / or computer is provided and / or present. The supply means, in particular in the form of a conveyor belt, in particular its drive, is controlled and / or regulated by the control unit and / or computer, in particular the speed of the conveyor belt is controlled and / or regulated. The first analysis laser is controlled and / or regulated by the control unit and / or computer. The second laser, in particular the second analysis laser or ablation laser, is controlled and / or regulated by the control unit and / or computer. The spectrometer is controlled and / or regulated by the control unit and / or computer or is operatively connected to the control unit and / or computer in terms of data technology. The control unit and / or computer evaluates the measurement data generated by the spectrometer, in particular thereby identifying the material of the object. The sorting device is controlled and / or regulated by the control unit and / or computer, in particular subsequently.

[0029] In particular, a first control module and / or a second control module are provided or present for controlling the first analysis laser and / or the second laser, in particular the second analysis laser or ablation laser, and the first analysis laser and / or the second laser and / or the first control module and / or the second control module are configured and / or formed as a LIBS system or as part of a LIBS system. In particular, the optical fiber, in particular with a bare fiber end, and / or the spectrometer are configured and / or formed as part of the LIBS device. The control modules for the first laser and / or the second laser may be functionally and / or structurally part of a control unit and / or a computer, in particular integrated into the control unit and / or a computer. The control unit and / or a computer may also be configured and / or formed as part of a LIBS system or form an essential component of the LIBS system.

[0030] In another embodiment of the method, further detection means are provided and / or present, by means of which the geometry and / or size and / or position of the object can be detected on the supply means, in particular a corresponding camera system is provided and / or is operatively connected in control technology to a control unit and / or computer.

[0031] The problem underlying the present invention is further solved by a system for analyzing an object having the features of claim 16.

[0032] Therefore, an important aspect of the present invention is that the field of view of the spectrometer is realized by the bare fiber end of the optical fiber.

[0033] Such bare fiber ends are, first of all, particularly easy and inexpensive to manufacture. Furthermore, they are less sensitive to inaccuracies in the spectrometer adjustment than collimators positioned in front of the fiber ends, since they have a significantly larger field of view than collimators. Furthermore, bare fiber ends effectively avoid the "chromatic aberration" that would otherwise occur in collimators, since the bare fiber ends accept radiation of different wavelengths with the same intensity ratio as emitted by the plasma. This is also advantageous when the intensities accepted by the bare fiber ends vary due to different spacings of the plasma relative to the bare fiber ends. This intensity variation cannot be avoided if the object has a complex geometric shape. However, different intensities can be accepted clearly and / or assigned to different spacings when using bare fiber ends (without a collimator), particularly without distortion of the intensity ratio. The bare fiber end is specifically positioned near the flight path of the object so that radiation can reach the bare fiber end with a sufficiently high intensity for accurate measurement, and thus radiation of the plasma generated in the object by the analyzing laser can be received by the bare fiber end.

[0034] The preferred spacing between the bare fiber end and the end of the supply means, in particular up to the drop edge of the supply means, has a particular value, in particular less than 350 mm, in particular between 50 mm and 200 mm, in another preferred configuration of the system, which ensures that a sufficiently high intensity of the radiation incident on the bare fiber end is achieved.

[0035] In another configuration of the system, the bare fiber end has a numerical aperture of 0.14 to 0.28, especially 0.18 to 0.24. The full "aperture angle" of the bare fiber end is especially 15 to 50 degrees, especially 20 to 30 degrees.

[0036] The optical fiber is preferably configured as a so-called step-index fiber, in particular as a multimode fiber, so that multiple modes of the light beam received by the optical fiber can propagate within the optical fiber or be detected and / or transmitted to the spectrometer.

[0037] In another embodiment of the device, the optical fiber has a silica glass core and a cladding, and in particular, the cladding has an outer acrylate coating and a fluorine-doped intermediate layer.

[0038] In a preferred embodiment of the system, the optical fiber has a core diameter between 50 μm and 700 μm, in particular between 400 μm and 600 μm. With such a core diameter, the optical fiber can be bent sufficiently well to position the bare fiber end of the optical fiber at the desired position and to effectively connect the optical fiber to another functional element, such as the evaluation unit of a spectrometer, or to a spectrometer. Furthermore, the core diameter also influences whether the intensity of the light beam coupled into the optical fiber is sufficiently high for measurement, with a substantially square-law relationship between the coupled-in light dose and the core diameter.

[0039] Preferably, a second laser is provided and / or present, which is formed and / or configured as a second analytical laser or as an ablation laser, by which a second laser beam having a second focal point can be generated, and which is positioned relative to the supply means such that the object flies through the second laser beam in the region of the second focal point during its respective movement on its respective flight path.

[0040] If the second laser is configured as a second analyzing laser, then the second focal point is also arranged in the field of view of the spectrometer, and the first and second analyzing lasers are aligned with each other so that the first focal point of the first analyzing laser is arranged at a distance from the second focal point of the second analyzing laser, in which case plasmas of the object can be generated by the first focal point of the first analyzing laser and / or by the second focal point of the second analyzing laser, and the radiation of these plasmas can be spectroscopically analyzed by the spectrometer.

[0041] This allows for the desired analysis of objects with more complex geometries, particularly more complex three-dimensional geometries, especially objects that are not flat. The type of material of the object can be correctly and accurately identified with a high degree of certainty. By means of the two analysis lasers, i.e., at multiple measurement points, corresponding plasmas can be generated in each object, and the radiation of these plasmas can be evaluated by a spectrometer. Even if the object to be analyzed has a very complex geometry and therefore does not allow for the generation of plasmas that can be evaluated by one of the two analysis lasers, it is still possible with at least a high degree of certainty to generate plasmas that can be evaluated by at least the other of the two analysis lasers.

[0042] Alternatively or additionally, it is conceivable that the focus of the second laser, in particular the ablation laser, is located outside the field of view of the spectrometer, i.e., outside the field of view realized by the bare fiber end. Therefore, the second laser is not used as an "analysis laser" based on its function, but rather for "pre-ablation" of the object, i.e., in particular for partial "cleaning" of the object before it is analyzed with the first analysis laser.

[0043] In a preferred embodiment of the system, the first and second analysis lasers are positioned relative to each other so that the first and second analysis lasers are spaced apart above each other on a line substantially perpendicular to the object's flight path. The first focus of the first analysis laser thus has a different vertical distance from the second focus of the second analysis laser relative to the end of the supply means, in particular the drop edge, or relative to a plane extending horizontally through the end of the supply means. This further increases the number of measurement points at which plasma can be generated that can be evaluated by the spectrometer. This further increases the reliability of a correct and accurate analysis of the object's material type.

[0044] In another preferred second embodiment of the system, the first analysis laser and the second laser, in particular the second analysis laser or ablation laser, are aligned with each other so that the first focus of the first analysis laser and the second focus of the second laser are arranged substantially horizontally next to each other in the feed direction of the object. In particular, when the second laser is configured as a second analysis laser, the number of measurement points at which plasmas that can be evaluated by the spectrometer can be generated can be further increased, especially in relation to the specific shape of the object, especially in cases with more complex three-dimensional structures. This further increases the reliability of a correct and accurate analysis of the material type of the object.

[0045] The spectrometer therefore now comprises an optical fiber with a bare fiber end for receiving and / or sensing and / or detecting the radiation of the plasma generated in the object by the first analyzing laser and / or by the second analyzing laser, whereby the field of view of the spectrometer is realized in particular exclusively via the bare fiber end of the optical fiber.

[0046] Such bare fiber ends are particularly easy to manufacture. Furthermore, they are less sensitive to inaccuracies in the spectrometer adjustment, especially compared to the use of a collimator in front of the fiber end, because they have a significantly larger field of view than the use of a collimator in front of the fiber end. Furthermore, the use of bare fiber ends makes it possible to effectively avoid chromatic aberrations that occur in collimators, because the bare fiber ends accept radiation of different wavelengths with the same intensity ratio. This is also advantageous when the intensity accepted by the bare fiber ends varies due to different spacings of the plasma relative to the bare fiber ends. This intensity variation cannot be avoided due to the complex geometric shape of some of the objects. However, when using bare fiber ends, different intensities can be accepted clearly, especially without distortion of the intensity ratio, and / or can then be assigned to different spacings. The bare fiber end is specifically positioned near the flight path of the target so that the radiation can reach the bare fiber end with a sufficiently high intensity for accurate measurements.

[0047] In another embodiment of the invention, the first analysis laser and / or the second laser, in particular the second analysis laser, have a predetermined pulse repetition frequency. The value of this pulse repetition frequency in kHz corresponds to a specific value of the object's velocity in m / s upon leaving the supply means multiplied by a specific factor, in particular a factor of at least 15. If the first analysis laser and the second analysis laser are used in particular as lasers, the pulse repetition frequency for at least one or both of the respective analysis lasers is at least 20 kHz, in particular at least 45 kHz. If an ablation laser is used as the second laser, whereby the first analysis laser and the ablation laser are used in combination, the pulse repetition frequency for the ablation laser is in particular at least 45 kHz, and the pulse repetition frequency for the first analysis laser is in particular at least 5 kHz or correspondingly higher.

[0048] In another embodiment or configuration of the system, the first focal point of the first analyzing laser and / or the second focal point of the second laser has a focal diameter of 0.1 mm to 0.2 mm, in particular 0.15 mm.

[0049] At these values ​​of the pulse repetition frequency and the focal diameter, an overlap of two successive pulses also occurs, so that the possible cleaning or pre-ablation of the respective object is additionally carried out by one of the respective analysis lasers, i.e. by the preceding pulse, and the subsequent pulse allows a correct and / or precise identification of the material of the object.

[0050] In a preferred embodiment of the system, the first analyzing laser has a first lens forming a first focus, and the second laser has a second lens forming a second focus, and the first lens and the second lens each have the same focal length, in particular between 250 mm and 400 mm.

[0051] In order to achieve that the first focus of the first analysis laser is spaced apart from the second focus of the second laser, the two lasers are also arranged offset from each other. However, this is not necessarily required, and identical or parallel arrangement of the lasers is also conceivable. For example, when using analysis lasers with the same focal length, two analysis lasers with identical structures can be used, which also provides cost advantages when procuring the analysis lasers.

[0052] In an alternative embodiment or configuration of the system, the first lens of the first analyzing laser and the second lens of the second laser have different focal lengths, in particular the focal length of the second lens being 5% to 10% smaller or larger than the focal length of the first lens, so that the two lasers can be placed very close to each other and still achieve a spacing between the foci of the two lasers relative to each other.

[0053] In a first preferred embodiment or configuration of the system, the first analyzing laser, the second laser and the spectrometer are arranged above the flight path of the object, so that the two lasers and the spectrometer can be arranged particularly near the end of the supply means and thus particularly near the beginning of the object's trajectory.

[0054] In a second preferred alternative embodiment or configuration of the system, the first analysis laser, the second laser, and the spectrometer are arranged below the flight path of the object. When the lasers are arranged below the flight path of the object, it is also advantageous, in particular, that the placement point of the object on the feed means is in a predetermined plane, so that the distances to the respective lenses, in particular the distance of the first analysis laser to the respective lenses, and also the distance to the second analysis laser or ablation laser, if present, are known. Furthermore, a particularly compact arrangement of all structural components of the system is possible.

[0055] Advantageously, the first analysis laser and / or the second laser each have a positioning device, by means of which the positioning of the corresponding laser and thus the location of the corresponding focus can be changed, in particular the spatial arrangement of the focus of the first analysis laser and the focus of the second laser relative to each other and relative to the field of view of the spectrometer can be changed, adjusted and / or adapted depending on the application.

[0056] This also increases the flexibility of use of the system: different configurations can be adjusted quickly, and in particular automatically, even during operation of the device. However, depending on the respective type of object to be analyzed, the positioning of the lasers relative to one another and relative to the field of view of the spectrometer can be adapted and / or optimally adjusted before the start of operation of the system.

[0057] However, in particular, the objects can be detected on the supply means by a further detection means / sensor, for example a camera, so that their geometric shape and / or size and / or position can be analyzed and the sorting device, in particular the blow-off nozzles and / or lasers, can be optimally controlled. In particular, the supply means can be configured as a V-shaped or curved conveyor belt or as a V-shaped or curved chute. In particular, the supply means allows for the individual supply of the objects to the measurement area or the focal area. In particular, the objects are already separated before they are supplied by the supply means. In particular, if the supply means is configured as a conveyor belt, in particular as a V-shaped conveyor belt, the objects can be individually supplied or successively and individually dropped off from the drop edge of the conveyor belt, and the first analysis laser and / or the second analysis laser or ablation laser can be correspondingly controlled based on the previously determined position of each object on the conveyor belt and the known speed of the conveyor belt. In a highly preferred embodiment or configuration of the method, the laser is already aligned with the measurement area and / or the expected trajectory of the object before the system is activated and is in particular continuously activated during the execution of the method.

[0058] However, in certain other embodiments and / or configurations, it is also conceivable that the lasers are positioned relative to each other and relative to the field of view of the spectrometer, particularly automatically, via drive control of the actuators during operation, particularly after the size of the object to be analyzed has been detected and sensed in advance.

[0059] The angle between the first laser beam of the first analyzing laser and the second laser beam of the second laser is preferably less than 30°, in particular less than 20°. Therefore, both laser beams of the analyzing lasers can be positioned at a small angle relative to the normal of the spectrometer, which in particular forms the axis of symmetry of the spectrometer's field of view and is perpendicular to the exposed fiber end. This ensures that the plasma radiation of the two analyzing lasers can be detected with sufficient intensity and analyzed by the spectrometer.

[0060] In a highly preferred embodiment or configuration of the system, the supply means is configured as a conveyor belt, in particular a driven conveyor belt. In another embodiment, it is also conceivable that the supply means is configured as a chute, in particular a chute with a V-shaped or curved cross section.

[0061] The use of a conveyor belt as the supply device is particularly advantageous because the conveyor belt further simplifies the analysis of the object. That is, the speed of the object is accurately known based on the adjustable, known conveyor belt speed. Based on the known speed of the conveyor belt or the object, the overlap of the impact craters of, for example, the pulsed analysis laser or the ablation laser is then also known, and in particular, the overlap can be adjusted to a value advantageous for the analysis of the object.

[0062] In another embodiment or configuration of the system, the conveyor belt is aligned substantially horizontally, thus preventing objects from slipping / shifting on the conveyor belt. The term "substantially" in this context means only a slight deviation from horizontal alignment, such as a few degrees, in particular ≦10 degrees, especially when objects are prevented from slipping on the feed belt.

[0063] A chute as a feeding device can also be advantageous, since when using the chute, no separate drive is required for moving the object by the feeding means, and thus no energy is required: movement on the chute is carried out solely based on the gravity of the object in particular.

[0064] In another advantageous embodiment or configuration of the system, a sorting device is provided and / or present. The objects can be sorted into at least two different categories based on the measurement data generated by the spectrometer, particularly depending on the identified material of the objects, especially by air jets, and then sorted, especially according to the respective categories. This sorting simplifies the subsequent recycling of the objects, since, for example, objects of the same material can be recycled more easily.

[0065] In certain embodiments or configurations of the system, at least one control unit and / or computer is provided and / or present. The control unit and / or computer is effectively connected in control technology to the supply means, in particular configured as a conveyor belt, and in particular to a drive of the supply means controlling the speed of the supply means, for controlling and / or regulating the same. The control unit and / or computer is effectively connected in control technology and / or data technology to the first analysis laser, for controlling and / or regulating the same. The control unit and / or computer is effectively connected in control technology and / or data technology to the spectrometer, for evaluating measurement data generated by the spectrometer, in particular to determine the respective material and / or the respective material composition of the object. In particular, the control unit and / or computer is effectively connected in control technology to the sorting device, for controlling and / or regulating the same. A first control module and / or a second control module are provided and / or present for controlling the first analysis laser and for controlling the second laser. In particular, the first and / or second analysis lasers are configured and / or formed as a LIBS system or as part of a LIBS system. In particular, the optical fiber and / or the bare fiber end and / or the spectrometer are also configured and / or formed as part of the LIBS system. The control module for the lasers can be configured functionally and / or structurally as part of a control unit and / or a computer, in particular as an integrated processing component in the control unit and / or computer. In particular, the control unit and / or the computer are also configured as part of the LIBS system.

[0066] In particular, further detection means are provided and / or are present, by means of which the geometry and / or size and / or position of the object to be fed can be detected on the feeding means, in particular a corresponding camera system is provided and / or is effectively connected in terms of control technology to a control unit and / or computer.

[0067] This allows for automation of the system, minimizing the amount of manual work required to operate the system.

[0068] The corresponding system for analyzing and / or classifying objects, in particular the supply means present here, has at least one supply track for supplying each object. In a highly preferred embodiment or configuration, the supply means for supplying and / or feeding the objects has multiple supply tracks, each of which is assigned at least a respective first analysis laser and a respective field of view of the spectrometer, and therefore, in particular, each of which is assigned a respective optical fiber with a bare fiber end. In a highly preferred configuration, each of which is also assigned a respective separate spectrometer, and therefore, in particular, each optical fiber is connected to a corresponding separate spectrometer. The respective supply tracks may be formed as physically and / or mechanically separated supply tracks, in particular on the supply means, or a plurality of single-track supply means may be provided. In a preferred embodiment or configuration, the supply means is formed as a conveyor belt, which has a correspondingly large width, and on which multiple supply tracks are formed that are "virtually" separated, in particular by corresponding separating devices present upstream. It should be noted that these separating devices are distributed across the width of each conveyor belt and then distribute the objects across the width of the conveyor belt to the supply means, in particular the conveyor belt. If multiple supply tracks are present, the distance between adjacent first analysis lasers or adjacent bare fiber ends is preferably 20 to 200 millimeters, and more preferably 50 to 100 millimeters. In other words, the distance between adjacent supply tracks is preferably 20 to 200 millimeters, and more preferably 50 to 100 millimeters. Therefore, in particular, if multiple supply tracks are formed, the sorting device has multiple blow-out nozzles, and therefore in particular the sorting device has a corresponding nozzle bar, which includes the above-mentioned multiple blow-out nozzles. In this case, at least one blow-out nozzle is assigned to each supply track.If a second laser, in particular a second analysis or ablation laser, is present as the second laser, each supply track is assigned to a respective second laser, and it should be noted that the above explanations, in particular regarding the spacing of adjacently arranged second lasers, also apply correspondingly.

[0069] In another preferred embodiment or configuration, it may also be provided that the non-identifiable or insufficiently identifiable objects can be fed back to the supply means by means of the return system present in this case, which in particular has a separate blow-out nozzle or a separate second nozzle bar and / or a separate conveyor belt, by means of which the non-identifiable or insufficiently identified objects can in this case be fed back to the supply means again for further analysis or are fed accordingly.

[0070] There are now numerous possibilities for advantageously configuring and improving the method according to the invention for analyzing an object or the system according to the invention for analyzing an object, to which reference is first made to the patent claims dependent on claim 1 or claim 16. In the following, certain preferred embodiments of the method according to the invention for analyzing an object and the system according to the invention for analyzing an object are explained or described in more detail with reference to the drawings and the corresponding description. [Brief explanation of the drawings]

[0071] [Figure 1] 1 is a highly simplified schematic side view of a first embodiment of a system for analyzing an object; [Figure 2] 1 is a highly simplified schematic side view of a second embodiment of a system for analyzing an object; FIG. [Figure 3] 1 is a highly simplified schematic side view of a third embodiment of a system for analyzing an object; FIG. [Figure 4] 10 is a highly simplified schematic side view of a fourth embodiment of a system for analyzing an object; FIG. [Figure 5] 10 is a highly simplified schematic side view of a fifth embodiment of a system for analyzing an object; FIG. [Figure 6] 10 is a highly simplified schematic side view of a sixth embodiment of a system for analyzing an object; FIG. [Figure 7] FIG. 7 is a highly simplified and schematic perspective view of a seventh embodiment of a system for analyzing objects, the system shown in FIG. 7 having multiple supply tracks for supplying / feeding objects. [Figure 8] 8 is a perspective view showing a greatly simplified schematic of an eighth embodiment of a system for analyzing objects, generally corresponding to FIG. 1, the system shown in FIG. 8 having multiple supply tracks for supplying / feeding objects. DETAILED DESCRIPTION OF THE INVENTION

[0072] 1 to 8 show, in highly simplified schematic diagrams, eight respective embodiments of a system 1 according to the invention for analysing an object 2. In FIG.

[0073] 1 to 6 show respective embodiments or configurations of the system 1 in side view, mainly illustrating only one feed track formed on the feed means 3, which feeds the individualized objects 2.

[0074] 7 and 8 partially show, in a perspective view, the main important components of the system 1, whereby a plurality of feed tracks 10 are visible or formed on the conveyor belt 3. It should be noted that in particular in FIGS. 7 and 8 not all components shown, for example, in FIGS. 1 to 6 are shown. Therefore, the corresponding explanations in particular with regard to FIGS. 1 to 4 also apply correspondingly for the embodiment shown in FIGS. 7 and 8, but it should be noted that in FIGS. 7 and 8, instead of just one feed track 10, a plurality of feed tracks 10 are shown, in comparison with FIGS. 1 to 6. For identical or similar components, substantially the same reference numerals are used in all figures.

[0075] The method according to the invention for analyzing and / or classifying an object 2, which will be described below, can be substantially realized using all eight embodiments shown in FIGS.

[0076] The system 1 shown in FIGS. 1 to 8 and the method realized by the system 1 are suitable for a wide variety of applications. This system 1 or method can be used to analyze and / or classify, particularly separate, specific objects 2, such as metal parts, scrap metal, especially aluminum scrap, ore pieces, batteries, packaging, waste, etc. Therefore, this system 1 or method is particularly suitable for separating and / or classifying metal pieces, for the circular economy, and / or for use in the mining sector and during the mining of ores and / or minerals. Numerous applications are conceivable and possible. A highly preferred application is the separation of metal parts and / or aluminum scrap. In particular, during the separation or classification of aluminum scrap, classification / sorting into different classes 1XXX to 8XXX according to the DIN EN 573-3 or DIN EN 573-4 standards, as well as within these classes, for example, between 6005 and 6061, is possible. The aforementioned "classes" constitute, for example, different "categories" for classifying the objects 2.

[0077] Firstly, at least one supply means 3, a "first" analysis laser 4.1 and at least one spectrometer 5 are provided and / or present. The objects 2 are supplied and / or moved, in particular fed, by means of the supply means 3, in particular to the measurement / analysis area. For their analysis, the objects 2 move on a flight path 6 away from the end 3e of the supply means 3, in particular are dropped from the supply means 3. This is in particular the case when the supply means is configured as a driven or motor-driveable conveyor belt.

[0078] A "first" laser beam 4.1.s having a "first" focal point 4.1.p is generated by the "first" analyzing laser 4.1. The analyzing laser 4.1 is positioned and / or is positioned relative to the supply means 3 such that the object 2 flies through the laser beam 4.1.s in the region of the focal point 4.1.p during its respective movement on its respective flight path 6. The field of view 5.s of the spectrometer 5 is positioned and / or is positioned to correspond to the region of the flight path 6 of the object 2. The focal point 4.1.p of the analyzing laser 4.1 is therefore in the field of view 5.s of the spectrometer 5.

[0079] The plasma of the object 2 is generated by the focus 4.1.p of the analysis laser 4.1. The radiation of these plasmas is subjected to spectroscopic analysis by a spectrometer 5.

[0080] The disadvantages mentioned at the beginning are now avoided, firstly, by the fact that the field of view 5.s of the spectrometer 5 is realized by the bare fiber end 5.ofe of the optical fiber 5.of. The radiation of the plasma generated in the object 2 by the analyzing laser 4.1 is received by the bare fiber end 5.ofe.

[0081] The bare fiber ends 5.ofe first reduce costs, because they can be manufactured easily and inexpensively. The collimators previously used in the prior art are no longer necessary. In particular, the bare fiber ends 5.ofe are less sensitive to inaccuracies in the adjustment of the spectrometer 5, and in particular, the bare fiber ends 5.ofe have a significantly larger field of view than when using collimators (as in the prior art). Thus, by realizing the field of view 5.s exclusively through the bare fiber ends 5.ofe of the optical fiber 5.of, the advantages mentioned at the outset are achieved and the disadvantages are avoided.

[0082] In the following, the explanations will be made primarily for all Figures 1 to 8, with the difference that the laser 4.2 shown in Figures 1 to 4 and 8 is configured and / or acted as an analysis laser 4.2, while the laser 4.2' shown in Figures 5 and 6 is configured as an ablation laser 4.2'. Also, while Figure 7 shows only one laser, namely the first analysis laser 4.1, in all other Figures two lasers are provided, namely the first analysis laser 4.1 and a second laser that is either the second analysis laser 4.2 or the ablation laser 4.2'. Taking these aspects into account, the following explanations will be made in particular with respect to Figures 1 to 8.

[0083] A second laser beam 4.2.s having a second focal point 4.2.p is generated by means of a second laser 4.2 or 4.2', in particular a second analysis laser 4.2 or ablation laser 4.2'. The second analysis laser 4.2 is positioned and / or is positioned relative to the supply means 3 such that the object 2 flies through the second laser beam 4.2.s in the region of the second focal point 4.2.p during each movement of the object 2 along its respective flight path 6. The second focal point 4.2.p of the second laser 4.2 or 4.2' is located within the field of view 5.s of the spectrometer 5 in the embodiments shown in FIGS. 1 to 4 and 8, and outside the field of view 5.s of the spectrometer 5 in the embodiments shown in FIGS. 5 and 6 (FIG. 7 shows one "first" analysis laser 4.1 per supply trajectory 10).

[0084] The first analysis laser 4.1 and the second laser 4.2 or 4.2' are aligned with each other and / or are aligned such that the first focal point 4.1.p of the first analysis laser 4.1 is spaced apart from the second focal point 4.2.p of the second laser 4.2 or 4.2'. Plasmas are generated at the object 2 by the first focal point 4.1.p of the first analysis laser 4.1 and / or by the second focal point 4.2.p of the second analysis laser 4.2. The radiation of these plasmas is then spectroscopically analyzed by a spectrometer 5.

[0085] It is conceivable that the spectrometer 5 and the first analyzing laser 4.1 and / or the second laser 4.2 or 4.2' are arranged in a common housing, and in particular the first analyzing laser 4.1 and the second laser 4.2 or 4.2' and the spectrometer 5 are configured as a LIBS system or are corresponding components of a LIBS system.

[0086] The first analysis laser 4.1 and the second analysis laser 4.2 are in particular aligned with each other such that the first focal point 4.1.p of the first analysis laser 4.1 and the second focal point 4.2.p of the second analysis laser 4.2 are spaced above and below each other on a substantially perpendicular line S to the flight path 6 of the object 2. The term "substantially" here means in particular that the corresponding imaginary connecting line between the two focal points 4.1.p and 4.2.p may have an inclination of up to + / - 15 degrees, in particular up to + / - 10 degrees, relative to the perpendicular line S. Here, the "perpendicular line S" is an imaginary line that is perpendicular to or aligned correspondingly perpendicular to a tangent line of a specific and / or selected point of the known and / or predicted flight path 6 of the object 2. This situation is illustrated in FIGS. 1 and 2 as well as 8, although the perpendicular line S is only illustrated in FIGS. 1 and 2.

[0087] Alternatively, the first analysis laser 4.1 and the second laser 4.2 or 4.2' can be aligned with respect to one another such that the first focal point 4.1.p of the first analysis laser 4.1 and the second focal point 4.2.p of the second laser 4.2 or 4.2' are positioned substantially horizontally next to one another in the feed direction of the object 2. Here, the term "substantially" particularly means that the corresponding imaginary connecting lines between the two focal points 4.1.p and 4.2.p may have an inclination of up to + / - 10 degrees, in particular up to + / - 5 degrees, relative to the horizontal. Here, the expression "positioned substantially horizontally next to each other in the feeding direction of the objects 2" not only includes first and second foci arranged next to each other horizontally and located directly at the height of the drop edge 3e of the supply means 3, but also first and second foci located next to each other on a horizontal line, which is spaced apart in the height direction from the drop edge 3e or which runs parallel to the plane of the conveyor belt. This situation is illustrated in Figures 3, 4, 5 and 6.

[0088] In a preferred configuration, the first focal point 4.1.p of the first analyzing laser 4.1 and the second focal point 4.2.p of the second laser 4.2 or 4.2' are spaced apart partly horizontally and partly vertically, i.e. in particular with a vertical and a horizontal component, respectively. In particular, the first focal point is located "diagonally" below or "diagonally" above the second focal point (or vice versa), but in particular they are located one above the other on a substantially perpendicular line S to the flight path 6 of the object 2.

[0089] Here, the spectrometer 5 has an optical fiber 5.of with a bare fiber end 5.ofe, or here an optical fiber 5.of with a bare fiber end 5.ofe is provided and / or exists. The radiation of the plasma generated in the object 2 by the first analysis laser 4.1 and / or the second analysis laser 4.2 is received or detected by the bare fiber end 5.ofe. Here, the spectrometer 5 is at least partially shown in the figure as a schematic "box", and the arrow also indicates that the spectrometer 5 is correspondingly connected to the optical fiber 5.of.

[0090] The field of view 5.s of the spectrometer 5 is therefore realized by the bare fiber end 5.ofe of the optical fiber 5.of. The distance between the bare fiber end 5.ofe and the end 3e of the supply means 3, in particular the drop edge of the supply means 3, has a predetermined value, in particular less than 350 mm, in particular between 50 mm and 200 mm. This distance is measured in particular between the bare fiber end 5.ofe and the "drop point" of the object 2 from the supply means 3 or the start of the flight path 6 of the object 2.

[0091] The bare fiber end 5.ofe has a numerical aperture of 0.14 to 0.28, particularly 0.18 to 0.24. The full divergence angle of the bare fiber end 5.ofe is in the range of 15 to 50 degrees, particularly 20 to 30 degrees.

[0092] The optical fiber 5.of is configured as a "step index fiber", particularly as a multimode fiber.

[0093] In particular, the optical fiber 5.of has a silica glass core and a cladding, in particular the cladding having an outer acrylate coating and a fluorine-doped intermediate layer.

[0094] The optical fiber 5.of has a core diameter of 50 μm to 700 μm, particularly 400 μm to 600 μm.

[0095] Pulses having a specific pulse repetition frequency are emitted by the first analysis laser 4.1 and / or by the second laser 4.2 or 4.2'. The value of this pulse repetition frequency in kHz corresponds to a specific value of the velocity of the object 2 when it leaves the supply means 3, multiplied by a specific factor, in particular a factor of at least 15. If only the first analysis laser 4.1 is used in the respective embodiment (here, in particular the embodiment of FIG. 7), the first analysis laser 4.1 in particular has a pulse repetition frequency of at least 20 kHz, in particular 45 kHz. If the first analysis laser 4.1 is used in combination with the second analysis laser 4.2, these two lasers also in particular have the above-mentioned pulse repetition frequencies. Finally, when the first analysis laser 4.1 is used in combination with an ablation laser 4.2' (see in particular Figures 5 and 6), the ablation laser 4.2' in particular has a pulse repetition frequency of at least 45 kHz, and the first analysis laser 4.1 may have or has a pulse repetition frequency of at least 5 kHz or more.

[0096] In particular, the first and second analysis lasers 4.1, 4.2 are identical in construction and may even be installed in a common housing together with the other components of the LIBS system.

[0097] In the embodiment shown in Figures 5 and 6, the second laser shown there is configured in particular as an ablation laser 4.2' and is also formed in particular as a component of a LIBS system. The second laser 4.2 or 4.2' shown in Figures 5 and 6 can therefore also be arranged together with the first analysis laser 4.1 in a common housing.

[0098] The first analysis laser 4.1 and / or the second laser 4.2 or 4.2′ in particular have a positioning device 7. If necessary, each positioning device 7 allows the positioning of the corresponding analysis laser 4.1, 4.2 or ablation laser 4.2′ and thus the location of the corresponding focus 4.1.p, 4.2.p to be changed, adjusted and / or adapted, in particular the spatial arrangement of the focus 4.1.p of the first analysis laser 4.1 and the focus 4.2.p of the second laser 4.2 or 4.2′ relative to each other and relative to the field of view 5.s of the spectrometer 5.

[0099] The positioning device 7 is indicated in FIGS. 1 to 6 by an arrow pointing to the analysis laser 4.1, 4.2 or the second laser 4.2, 4.2′. It is conceivable that only one of the two analysis lasers 4.1 or 4.2 or only the ablation laser 4.2′ has a positioning device 7. Likewise, each laser may have its own positioning device 7. It is also conceivable that only one positioning device 7 is provided and / or exists, which serves to move and position the two analysis lasers 4.1 and 4.2 or the first analysis laser 4.1 and the ablation laser 4.2′.

[0100] In a preferred embodiment or configuration of the system 1 or method, the first analysis laser 4.1 and the second laser 4.2 or 4.2′ are aligned prior to the analysis and / or classification process, taking into account in particular the structure and / or geometry and / or expected size of the object 2 to be analyzed and / or classified. Thus, alignment of the first analysis laser 4.1 and / or the second analysis laser 4.2 or ablation laser 4.2′ during the method is no longer necessarily required after a single optimized alignment.

[0101] However, it is conceivable that the positioning of the first analysis laser and the second laser 4.2 or 4.2' is carried out, in particular automatically, during the implementation of the method, especially if an unexpected, more complex, different structure, geometry and / or size of the object 2 to be analyzed and / or classified, which is outside the expected tolerance range of the object 2 to be analyzed and / or classified, is detected on the supply means via the provided further detection means 11, in particular a camera system.

[0102] Furthermore, the spectrometer 5 itself may also have a positioning device. Thus, various types of positioning devices 7 are conceivable, for example with corresponding actuators, in which case such actuators can also be automatically controlled.

[0103] In particular, the analysis laser 4.1 and / or 4.2 or the ablation laser 4.2' can be rotated by the positioning device 7, in particular around an axis substantially perpendicular to the direction of movement of the object 2 or around an axis extending parallel to the axis of the deflection rollers of the conveyor belt (not shown in detail), and / or can be moved in a plane extending through the flight path 6 of the object 2.

[0104] In a preferred embodiment or configuration, the first analyzing laser 4.1 and the second laser 4.2 or 4.2', in particular also the spectrometer 5, are manually positioned, in particular fixed and aligned correspondingly, for example in corresponding slotted receptacles in the frame, in particular by means of threaded connections, before the system 1 is put into operation or before the method is carried out.

[0105] A sorting device 8 is provided and / or present, which sorts the objects 2 into at least two different categories based on the measurement data generated by the spectrometer 5, in particular depending on the identified material of the objects 2, in particular by means of an air jet. The sorting device 8 therefore in particular has at least one correspondingly controllably operable blow-out nozzle.

[0106] For each category, in particular one container is provided, in which the objects 2 are collected and which can then be subjected to further processing, for example recycling of the objects 2. Such containers or receptacles, or other possible transport means for this purpose, are not shown in detail in Figures 1 to 8.

[0107] At least one control unit 9 and / or computer 9 is provided and / or present. In particular, the supply means 3 formed as a conveyor belt, in particular the speed of the supply means, is controlled and / or regulated by the control unit 9 and / or computer 9. The first analysis laser 4.1 is controlled and / or regulated by the control unit 9 and / or computer 9. The second laser 4.2 or 4.2' is controlled and / or regulated by the control unit 9 and / or computer 9. The spectrometer 5 is controlled and / or regulated by the control unit 9 and / or computer 9 or is effectively connected to the control unit 9 and / or computer 9 in terms of data technology. The control unit 9 and / or computer 9 evaluate the measurement data generated by the spectrometer 5, in particular to identify the respective specific material of the respective object, for example a specific metal or plastic.

[0108] In particular, the sorting device 8 is also controlled and / or regulated by the control unit 9 and / or computer 9, in particular the blow-out nozzles of the sorting device 8 being correspondingly actuated. In particular, the sorting device 8 therefore has blow-out nozzles, in particular formed as a nozzle bar with a plurality of blow-out nozzles.

[0109] A first control module 4.1.LM and / or a second control module 4.2.LM are provided and / or present for controlling the first analysis laser 4.1 and for controlling the second laser 4.2 or 4.2', where the first analysis laser 4.1 and the second laser 4.2 or 4.2' are configured and / or formed in particular as a LIBS system or as part of a LIBS system. In particular, the optical fiber (5.of) and / or the bare fiber end (5.ofe) and the spectrometer (5) are also configured and / or formed in particular as part of the LIBS system, or the above-mentioned components form a LIBS system, so that the object 2 is also analyzed by the LIBS system and classified, in particular partially sorted, based on the detected measurement data.

[0110] The control modules 4.1.LM and 4.2.LM for the respective lasers are also configured functionally and / or structurally as part of a control unit and / or computer 9, which in particular is also formed as part of the LIBS system or as a separate component.

[0111] In a preferred embodiment or configuration, further detection means 11 are provided and / or present, by means of which the geometry and / or size and / or position of the object 2 to be supplied can be detected on the supply means 3, in particular a corresponding camera system is provided or is provided and / or is operatively connected in control technology to the control unit and / or computer 9.

[0112] In particular, all components of the system 1 are controlled and / or coordinated by a control unit 9 and / or a computer 9, whereby optimization of the system 1 can be easily performed by taking into account the relationship of the different components to one another.

[0113] 1 to 8, the control-technically effective and / or data connections between the spectrometer 5, the two analysis lasers 4.1 and 4.2 or the ablation laser 4.2′ and the control unit 9 and / or computer 9 are respectively recognizable or indicated only diagrammatically by a line that is only partially or partially interrupted. However, it is theoretically also conceivable that the respective components are controlled and / or regulated separately, for example by a separate and distinct control unit and / or computer.

[0114] In Figures 1 to 8, the spectrometer 5 and the two analytical lasers 4.1 and 4.2 or the ablation laser 4.2' are each illustrated, at least in part, by a number of schematic elements, the connections between which are shown by partially interrupted lines, each illustrated in the figures, in particular for the transmission of data and / or energy.

[0115] With respect to the drawings of FIGS. 1 to 4 and 8, the following should also be pointed out.

[0116] In a preferred embodiment, the first and second analysis lasers 4.1 and 4.2 and / or the control modules 4.1.LM and 4.2.LM present for the first and second analysis lasers 4.1 and 4.2 are formed as part of a LIBS system. In other words, the first and second analysis lasers 4.1 and 4.2 are formed in particular as LIBS analysis lasers, respectively, and the LIBS system also comprises, in particular, an optical fiber 5.of and a control module 4.1.LM and 4.2.LM. The LIBS system also comprises, in particular, a spectrometer 5 and, in particular, a control unit and / or a computer 9. It should also be noted that some of these components described above, in particular the first and second analysis lasers 4.1 and 4.2 and part of the optical fiber 5.of with the bare fiber end 5.of, may be installed and / or arranged in a common housing.

[0117] The above description applies substantially analogously to the embodiment shown in Figures 5 and 6, where the second laser is formed and configured as an ablation laser 4.2'. The lasers shown in Figures 5 and 6, here the first analysis laser 4.1 and the second laser 4.2', i.e. the ablation laser, are also formed in particular as part of a LIBS device.

[0118] 7 shows in particular a respective analysis laser 4.1 and a respective bare fiber end 5.ofe for each supply track 10, i.e. one analysis laser 4.1 and one bare fiber end 5.ofe per supply track 10. Although not all components are shown in FIG. 7 (and FIG. 8), the above description applies substantially the same way, and in particular also in FIG. 7 the plurality of supply tracks 10 on the conveying means 3 can be seen, and the first analysis laser 4.1 and each bare fiber end 5.ofe used here are formed as part of a LIBS system and / or formed as already described.

[0119] In the following, reference will once again be made in more detail to or this system 1 will once again be described in more detail, for analyzing an object 2 according to eight different embodiments of the system 1 shown in FIGS.

[0120] The system 1 for analyzing an object 2 is particularly useful for carrying out the method described above.

[0121] The system 1 for analyzing an object 2 comprises a supply means 3, a "first" analysis laser 4.1, and a spectrometer 5. The supply means 3 may also be called a "feed means". The object 2 can be supplied by the supply means 3, in particular to a corresponding measurement or analysis area downstream of the end of the supply means 3, or can be moved towards the measurement or analysis area and fed by the supply means 3, in particular or configured as a conveyor belt.

[0122] The supply means 3 is particularly configured so that the objects 2 can be individualized and / or so that the objects 2 are each individualized and move successively on their flight path 6 from the end 3e of the supply means 3 to the measurement or analysis area first.

[0123] In particular, the supply means 3 may have a V-shaped cross section in order to achieve individualization of the objects 2 and / or individualized transport of the objects 2. The supply means 3 is therefore configured in particular as a V-shaped cross section or a curved conveyor belt. As an alternative, a V-shaped cross section or a curved chute is also conceivable.

[0124] From the terminal end 3e of the supply means 3, in particular from the drop edge, the objects 2 are moved on a flight path 6 for their analysis, in particular the objects 2 are dropped from the supply means 3 and then moved on and / or along the flight path 6.

[0125] A "first" laser beam having a first focal point 4.1.p can be generated by the first analyzing laser 4.1, which is positioned relative to the supply means 3 in such a way that the object 2, during each movement on its respective flight path 6, flies through the laser beam 4.1.s in the region of the focal point 4.1.p.

[0126] The spectrometer 5 has a field of view 5.s, which is aligned with a region of the flight path 6 of the object 2.

[0127] The field of view 5.s of the spectrometer 5 is now realized by the bare fiber end 5.ofe of the optical fiber 5.of.

[0128] The first focal point 4.1.p of the first analyzing laser 4.1 is arranged in the field of view of the spectrometer 5, which applies to all embodiments shown in FIGS.

[0129] 1 to 6 and 8, a second laser 4.2 is provided and / or present. The second laser 4.2 or 4.2' is configured as a second analyzing laser 4.2 in the embodiment shown in FIGS. 1 to 4 and 8, and as an ablation laser 4.2' in the embodiment shown in FIGS. 5 and 6. A second laser beam 4.2.s having a second focal point 4.2.p can be generated by the second laser 4.2 or 4.2'. The second laser 4.2 or 4.2' is aligned with the supply means 3 such that the object 2, during its respective movement along its respective flight path 6, flies through the second laser beam 4.2.s in the region of the second focal point 4.2.p.

[0130] The second laser 4.2, in particular the second focal point 4.2.p of the second analyzing laser shown in particular in FIGS. 1 to 4 and 8, is arranged in the field of view 5.s of the spectrometer 5.

[0131] In the embodiment shown in Figures 5 and 6, a first analysis laser 4.1 and a second laser configured as an ablation laser 4.2' are provided. Essentially the same applies as above, except that the second focal point 4.2.s of the second laser 4.2 shown in Figures 5 and 6 is located outside the field of view 5.s.

[0132] In the embodiment shown in FIG. 7, a respective "first" analysis laser 4.1 is provided, which is assigned to each supply track 10. Accordingly, FIG. 7 shows a plurality of analysis lasers 4.1 arranged next to one another and optical fibers 5.of or optical fiber ends 5.ofe arranged next to one another, with each of these first analysis lasers 4.1 and optical fibers 5.of or optical fiber ends 5.ofe being assigned to a respective supply track 10. FIG. 8 shows a first analysis laser 4.1 and a second analysis laser 4.2 for each supply track 10. Accordingly, also in FIG. 8, a plurality of lasers 4.1 / 4.2 or optical fibers 5.of and supply tracks 10 are present or formed, with each supply track 10 being assigned at least a first analysis laser 4.1 and a second analysis laser 4.2 and an optical fiber end 5.ofe. It should be noted once again that the embodiments shown in particular in FIGS. 7 and 8 do not show all of the corresponding components shown, for example, in FIGS. 1 to 4. Nevertheless, it is again pointed out that these corresponding components are correspondingly provided or present in FIGS. 7 and 8 as well.

[0133] The first analysis laser 4.1 and the second analysis laser 4.2 are aligned with one another in such a way that the first focal point 4.1.p of the first analysis laser 4.1 is spaced apart from the second focal point 4.2.p of the second analysis laser 4.2 in FIGS. 1 to 4 and 8. Plasmas of the object 2 can be generated by the first focal point 4.1.p of the first analysis laser 4.1 and / or by the second focal point 4.2.p of the second analysis laser 4.2. The radiation of these plasmas can be spectroscopically analyzed by the spectrometer 5. The first analysis laser 4.1 and the second analysis laser 4.2 are aligned with one another in particular in such a way that the first focal point 4.1.p of the first analysis laser 4.1 and the second focal point 4.2.p of the second analysis laser 4.2 are spaced apart above one another, in particular on a substantially perpendicular line S to the flight path 6 of the object 2. This situation is illustrated in FIGS. 1 and 2 and in FIG. 8, although the vertical S is only illustrated in FIGS.

[0134] Alternatively, the first analysis laser 4.1 and the second analysis laser 4.2 are aligned with one another in such a way that the first focal point 4.1.p of the first analysis laser 4.1 and the second focal point 4.2.p of the second analysis laser 4.2 are arranged substantially horizontally next to one another in the feed direction of the object 2. This situation is illustrated in Figures 3 and 4. In Figures 5 and 6, the focal points of the lasers 4.1.p and 4.2.p in this example are also arranged substantially horizontally next to one another in the feed direction of the object 2, but it should be pointed out once again that in this case the second laser is configured as an ablation laser 4.2', and the corresponding focal point 4.2.p is located outside the field of view 5.s of the optical fiber 5.ofe.

[0135] It should also be noted here that in a highly preferred configuration, the first focal point 4.1.p of the first analysis laser 4.1 and the second focal point 4.2.p of the second analysis laser 4.2 are positioned, in particular, partially vertically and partially horizontally relative to each other, i.e., are spaced apart from each other by corresponding horizontal and / or vertical distances, or, simply stated, the focal points are positioned obliquely offset from each other, in particular on a line S substantially perpendicular to the flight path 6 of the object 2.

[0136] 1-4 also essentially apply to FIGS. 5-6, except that in FIGS. 5 and 6 the second laser is configured not as an analyzing laser but as an ablation laser 4.2', and therefore the two foci, i.e., the first focal point 4.1.s of the first analyzing laser 4.1 and the second focal point 4.2.s of the second laser, i.e., the ablation laser 4.2', are spaced apart substantially horizontally in the feed direction of the object 2, as shown in FIGS. 5 and 6, with the second focal point 4.2.p being located outside the field of view 5.s. Therefore, the plasma generated by the ablation laser 4.2' is not analyzed by the spectrometer 5, because only the plasma or resulting radiation generated by the first analyzing laser 4.1 reaches the sensor of the spectrometer 5 via the bare fiber end 5.ofe.

[0137] Here, the spectrometer 5 has an optical fiber 5.of having a bare fiber end 5.ofe, or in particular is provided and / or exists only with an optical fiber 5.of having a bare fiber end 5.ofe that exclusively receives radiation from the plasma generated in the object 2 by the first analysis laser 4.1 and / or the second analysis laser 4.2.

[0138] The first analyzing laser 4.1 and / or the second laser 4.2 or 4.2' have a pulse repetition frequency, the value of which in kHz corresponds in particular to a particular value of the velocity in m / s of the object 2 on leaving the supply means 3, multiplied by a particular factor, in particular a factor of at least 15.

[0139] The first focal point 4.1.p of the first analyzing laser 4.1 and / or the second focal point 4.2.p of the second laser 4.2 or 4.2' has a focal diameter of 0.1 mm to 0.2 mm, in particular 0.15 mm, measured perpendicular to the respective laser beam 4.1.s or 4.2.s.

[0140] The first analyzing laser 4.1 has a first lens that generates a first focal point 4.1.p, and the second laser 4.2 or 4.2' has a second lens that generates a second focal point 4.2.p. The first and second lenses each have the same focal length, in particular between 250 mm and 400 mm. The lenses influence the coupling of the laser beams 4.1.s or 4.2.s, which in turn influences the formation of the focal points 4.1.p or 4.2.p, both in terms of the spatial extent of the focal points 4.1.p or 4.2.p and the intensity of the laser beams in the area of ​​these focal points 4.1.p or 4.2.p.

[0141] Alternatively, the first and second lenses may have different focal lengths, in particular the focal length of the second lens being 5% to 10% smaller or larger than the focal length of the first lens.

[0142] The first analyzing laser 4.1, the second laser 4.2 or 4.2' and the spectrometer 5 are arranged above the flight path 6 of the object 2 according to Figures 2 and 4 or 6. "Above" here refers to gravity, which also has a significant influence on the flight path 6 of the object 2.

[0143] In a preferred configuration, the first analyzing laser 4.1, the second laser 4.2 or 4.2' and the spectrometer 5 are arranged below the flight path 6 of the object 2. This situation is illustrated in Figures 1 and 3 as well as in Figures 5 and 8. The term "below" is used in this configuration with reference to gravity.

[0144] The first analysis laser 4.1 and / or the second laser, in particular the second analysis laser 4.2 or the ablation laser 4.2' shown in Figures 1 to 6 or 8, preferably have a positioning device 7. Each positioning device 7 allows the positioning of the corresponding laser 4.1, 4.2 or 4.2', and thus the location of the corresponding focal point 4.1.p or 4.2.p, to be changeable, in particular adjustable. Thus, in particular the spatial arrangement of the focal point 4.1.p of the first analysis laser 4.1 and the focal point 4.2.p of the second analysis laser 4.1 relative to each other and relative to the field of view 5.s of the spectrometer 5 is changeable, adjustable and / or adaptable. In a preferred embodiment or configuration, the first analysis laser 4.1 and the second analysis laser 4.2 are positioned or adjusted, in particular manually, before the start of operation of the system 1, in particular depending on the expected object 2 to be analyzed or depending on the expected size and / or expected flight path 6 of the object 2. The above description applies substantially similarly to Figures 5-6, except that in Figures 5-6 an ablation laser 4.2' is provided as the second laser 4.2 rather than an analysis laser, and the second focal point 4.2.s of the second laser is not located within the field of view 5.s of the bare fiber end 5.ofe. In Figure 7, only an analysis laser 4.1 is provided, but the focal point 4.1.p of the first analysis laser 4.1 is located within the field of view 5.s of the bare fiber end 5.ofe of the fiber 5.of, as shown in Figure 7.

[0145] The angle between the first laser beam 4.1.s and the second laser beam 4.2.s has a value of less than 30°, in particular less than 20°.

[0146] According to the embodiment shown in Figures 1 to 8, the supply means 3 is configured as a particularly drivable, particularly flat, conveyor belt 3. The conveyor belt 3 is positioned essentially horizontally, in particular to avoid slipping / falling off of the objects 2 during transport on this conveyor belt.

[0147] In a highly preferred embodiment or configuration, the supply means 3 is formed as a substantially flat conveyor belt, as is shown for example best in Figures 7 and 8. In particular, a flat conveyor belt allows for a plurality of supply tracks 10 to be realized, as will be explained in more detail below.

[0148] Alternatively, the supply means 3 may be configured as a chute, which is therefore arranged at an angle, so that the objects 2 move on the chute relative to the chute surface partially in the direction of gravity. On this basis, a combination of a conveyor belt and a chute to form the supply means 3 is also conceivable.

[0149] A sorting device 8 is furthermore provided and / or present. Based on the measurement data generated by the spectrometer 5, the objects 2 can be sorted into at least two different categories, in particular by air jets, depending in particular on the detected and identified materials of the objects 2. Preferably, the sorting device 8 has a blow-out nozzle or is configured as a blow-out nozzle. The objects are thus analyzed and, based on the results and the detected materials or the detected material composition of the objects 2, are divided into different categories and correspondingly classified into the respective categories, in particular subsequently partially sorted.

[0150] For this purpose, at least one control unit and / or computer 9 is provided and / or present. The control unit 9 and / or computer 9 is, in particular, effectively connected in a control-technological sense to the supply means 3 configured as a conveyor belt for its control and / or regulation. The control unit 9 and / or computer 9 is, in particular, effectively connected in a control-technological sense to the first analysis laser 4.1 for its control and / or regulation. The control unit 9 and / or computer 9 is, in particular, effectively connected in a control-technological sense to the second laser 4.2 or 4.2' for its control and / or regulation. The control unit 9 and / or computer 9 is, in particular, effectively connected in a control-technical sense to the spectrometer 5. The control unit 9 and / or computer 9 can evaluate the measurement data generated by the spectrometer 5, thereby, in particular, making it possible to identify the respective material of each object 2. In particular, the control unit 9 and / or computer 9 is also, in a control-technical sense, effectively connected to the sorting device 8 for its control and / or regulation. To realize the respective control-technically and / or data-technically effective connections, in particular corresponding signal and / or data lines are provided. Signal and / or data transmission via radio, wireless LAN or Bluetooth is also possible or contemplated.

[0151] 1 to 8, a first control module 4.1.LM and a second control module 4.2.LM are provided and / or present for controlling the first analysis laser 4.1 and the second laser 4.2 or 4.2', which are configured and / or formed as a LIBS system or part of a LIBS system. In the embodiment of the system 1 shown in FIGS. 5 and 6, no second analysis laser is provided, but a second laser formed as an ablation laser 4.2' is provided. Otherwise, the above explanations apply analogously.

[0152] Here, the optical fiber 5.of and / or the bare fiber end 5.ofe and / or the spectrometer 5 are also formed and / or configured in particular as part of the LIBS system. The control modules 4.1.LM and 4.2.LM are also, in particular functionally and / or structurally, part of the control unit 9 and / or computer 9. In particular, the control unit and / or computer 9 are likewise formed in particular as part of the LIBS system.

[0153] Further detection means 11 are provided and / or are present, by means of which the geometry and / or size and / or position of the object 2 can be detected on the supply means 3. For this purpose, in particular, a corresponding camera system is provided and / or is operatively connected in terms of control technology to the control unit and / or computer 9.

[0154] The above description essentially relates to all the embodiments shown in FIGS. 1 to 8. It should be pointed out once again that FIGS. 1 to 6 essentially show the corresponding system 1 in side view, with a feed track 10 visibly formed on the feed means 3. In contrast, FIGS. 7 and 8 show, at least partially by way of example, a highly preferred embodiment or configuration of a system with a plurality of feed tracks 10 formed on the feed means 3, in which the feed tracks 10 are not physically and / or mechanically separated from one another but are formed as "virtual" feed tracks 10, in particular by the fact that the feed means 3 is preceded by a corresponding plurality of singulation devices (not shown) arranged across its width. Therefore, the statements or explanations made with respect to FIGS. 1 to 6 also essentially apply to the embodiments shown in FIGS. 7 and 8. However, it should be made clear once again with respect to FIGS. 7 and 8 that: That is to say, in particular, in the example shown in Figures 7 and 8, not all of the components shown in e.g. Figures 1 to 4 are explicitly / shown, and it is again pointed out that corresponding components, e.g. classification devices and / or detection means and control units and / or computers, etc., are also present and / or provided in the embodiment shown in Figures 7 and 8.

[0155] FIG. 8 shows a highly preferred embodiment or configuration of the system 1. In this embodiment, the supply means 3 has a plurality of supply tracks 10 for supplying and / or feeding the objects 2. As can be seen from FIG. 8, the individual supply tracks 10 are not physically and / or mechanically separated from one another, but are realized simply by distributing a plurality of singulation devices at the start of the supply means 3 across the width of the supply means 3, which in the embodiment shown in FIG. 8 is configured as a conveyor belt, i.e., across the width. However, these singulation devices are not explicitly shown in FIG. 8. This therefore realizes the supply tracks 10, which are particularly illustrated by the broken "line 10" on the supply means 3. In a particularly preferred configuration, the conveyor belt 3 is also flat.

[0156] As further shown in FIG. 8, each supply track 10 is assigned a respective first analysis laser 4.1 and a respective second analysis laser 4.2. Furthermore, each supply track 10 is assigned a respective field of view 5.s of a spectrometer 5, in particular here each supply track 10 is assigned a respective optical fiber 5.of with a bare fiber end 5.of and / or a respective separate spectrometer 5. The spectrometers 5 are not shown in detail in FIG. 8 (nor in FIG. 7). In particular, in a preferred configuration of the embodiment shown in FIGS. 7 and 8, each optical fiber 5.of is connected to a respective separate spectrometer 5, which itself is connected to a control unit and / or computer 9 in a control-, signal-, and / or data-technical manner. However, it is also conceivable that only one spectrometer is present and that therefore multiple optical fibers of the supply track are connected to this one spectrometer.

[0157] A highly preferred embodiment of the system 1, shown in FIG. 8, substantially corresponds to FIG. 1. The explanation given for FIG. 1 also applies to FIG. 8. Furthermore, FIG. 8 shows that the first analysis lasers 4.1 shown in FIG. 8 are arranged adjacent to one another, and the second analysis lasers 4.2 are arranged adjacent to one another, with the respective analysis lasers 4.1 or 4.2 having a corresponding spacing between them. The same applies to the adjacently arranged bare fiber ends 5.ofe. The spacing between adjacent first analysis lasers 4.1 or second analysis lasers 4.2 or adjacent bare fiber ends 5.ofe is in the range of 20 to 200 mm, in particular in the range of 50 to 100 mm.

[0158] In a highly preferred embodiment shown in Figure 8, the sorting device has in particular a plurality of blow-out nozzles, in particular formed as a nozzle bar, so that each feed track 10 is assigned at least one blow-out nozzle.

[0159] 7 also shows the supply means 3, which corresponds to FIG. 8. The supply means 3 is in particular formed as a flat conveyor belt, but in FIG. 7 only one laser, namely, a first analysis laser 4.1, is assigned to or arranged for each supply track 10. An optical fiber 5.of having an exposed fiber end 5.of is also provided for each supply track 10, and in particular, a separate spectrometer (not shown) is also provided for each supply track 10. The focus 4.1.p of the first analysis laser 4.1 is located within the field of view 5.s of the optical fiber 5.of, as can be clearly seen in FIG. 7. The above description also applies substantially to FIG. 7, except that in FIG. 7 only one laser, namely, the analysis laser 4.1, is provided for each supply track 10, and the method can be realized in this case using the corresponding respective components (some not shown) in accordance with the above description.

[0160] In another embodiment or configuration, it may or may not be further provided that the unidentifiable or insufficiently identifiable objects 2 can be fed back to the supply means by an existing return system 3, not shown in Figures 1 to 8. Such a return system in particular has at least one further blow-out nozzle and / or a further second nozzle bar and a further conveyor belt, which serve to feed the aforementioned objects 2 back to the supply means 3, in particular at the start end of the supply means 3, so that the objects 2 can be fed again, as described above, at the end end of the supply means 3 to the corresponding measurement area or areas for analysis and / or classification. [Explanation of symbols]

[0161] 1. System for analyzing objects 2. Object 3. Supply means, especially conveyor belts 3.e End of supply means 3 4.1 First laser / first analytical laser 4.1.s First laser beam 4.1.p First focus 4.1.LM Control Module 4.2 Second laser / second analytical laser 4.2' Secondary Laser / Ablation Laser 4.2.s Second laser beam 4.2.p Second focus 4.2.LM Control Module 5 spectrometer 5.s Spectrometer 5 Field of View 5.of optical fiber 5.Ofe bare fiber end 6 Flight Path 7 Position adjustment device 8 Classifier 9 Control Units and / or Computers 10 Supply track 11. Detection methods, especially cameras S Perpendicular to flight path 6

Claims

1. 1. A method for analyzing an object (2), in particular a metal part and / or aluminum scrap, comprising: At least one supply means (3), at least one "first" analyzing laser (4.1) and at least one spectrometer (5) are provided and / or are present, The object (2) is supplied, in particular fed, by said supply means (3) and the object (2) is moved on a flight path (6) from the terminal end (3.e) of said supply means (3) for analysis thereof, in particular dropped from said supply means (3), said "first" analyzing laser (4.1) generating a "first" laser beam (4.1.s) having a "first" focal point (4.1.p); the analyzing laser (4.1) is positioned relative to the supplying means (3) and / or the analyzing laser (4.1) is positioned relative to the supplying means (3) so that the object (2) flies through the laser beam (4.1.s) in the region of a focal point (4.1.p) during each movement on its respective flight path (6), the field of view (5.s) of the spectrometer (5) is aligned and / or aligned with the region of the flight path (6) of the object (2), the focus (4.1.p) of the analyzing laser (4.1) is located within the field of view (5.s) of the spectrometer (5), A method for generating a plasma of an object (2) by means of a focus (4.1.p) of the analyzing laser (4.1) and for spectroscopically analyzing the radiation of the plasma by means of the spectrometer (5), Method, characterized in that the field of view (5.s) of the spectrometer (5) is realized by the bare fiber end (5.ofe) of an optical fiber (5.of).

2. 2. The method according to claim 1, characterized in that the bare fiber end (5. ofe) receives radiation of plasma generated in the object (2) by the first analyzing laser (4.1).

3. a second laser is provided and / or present; The second laser is configured and / or configured as a second analysis laser (4.2) or as an ablation laser (4.2'), or the second laser is used correspondingly as a second analysis laser (4.2) or as an ablation laser (4.2'), said second laser (4.2, 4.2') generating a second laser beam (4.2.s) having a second focal point (4.2.p); 3. The method according to claim 1 or 2, characterized in that the second laser (4.2, 4.2') is aligned with respect to the supply means (3) and / or the second laser (4.2, 4.2') is aligned with respect to the supply means (3) in such a way that the object (2) flies through the second laser beam (4.2.s) in the region of a second focal point (4.2.p) during each movement on its respective flight path (6).

4. a second focus (4.2.p) of the second analyzing laser (4.2.s) is located within the field of view (5.s) of the spectrometer (5), the first analysis laser (4.1) and the second analysis laser (4.2) are aligned with each other and / or the first analysis laser (4.1) and the second analysis laser (4.2) are aligned with each other such that a first focus (4.1.p) of the first analysis laser (4.1) is spaced apart from a second focus (4.2.p) of the second analysis laser (4.2), generating a plasma of the object (2) by the focal point (4.1.p) of the first analyzing laser (4.1) and / or by the focal point (4.2.p) of the second analyzing laser (4.2), 4. The method according to claim 3, characterized in that the radiation of the plasma is spectroscopically analyzed by the spectrometer (5), and the radiation generated by a second focal point (4.2.p), in particular of the object (2), is also received by the bare fiber end (5.ofe).

5. 5. The method according to claim 4, characterized in that the first analysis laser (4.1) and the second analysis laser (4.2) are aligned with each other so that a first focal point (4.1.p) of the first analysis laser (4.1) and a second focal point (4.2.p) of the second analysis laser (4.2) are positioned one above the other on a substantially perpendicular line (S) to the flight path (6) of the object (2).

6. 6. The method according to claim 1, further comprising aligning the first analysis laser (4.1) and the second laser (4.2, 4.2') with respect to one another so that the first focal point (4.1.p) of the first analysis laser (4.1) and the second focal point (4.2.p) of the second laser (4.2, 4.2') are positioned substantially horizontally next to one another or are spaced apart horizontally.

7. Emitting pulses with a specific pulse repetition frequency by the first analyzing laser (4.1) and / or by the second laser (4.2, 4.2'), the value of said pulse repetition frequency in kHz corresponds to a particular value of the velocity in m / s of the object (2) when it leaves said supply means (3), multiplied by a particular factor, in particular a factor of at least 15, 7. The method according to claim 1, characterized in that the ablation laser (4.2') has a pulse repetition frequency, in particular of at least 45 kHz, and the "first" analysis laser (4.1) has a pulse repetition frequency of at least 5 kHz, and / or, when a first analysis laser (4.1) and a second analysis laser (4.2) are used, the first analysis laser (4.1) and the second analysis laser (4.2) have a repetition frequency, in particular of at least 20 kHz, in particular of at least 45 kHz.

8. the first analyzing laser (4.1) and / or the second laser (4.2, 4.2') have a position adjustment device (7), By means of each positioning device (7), if necessary, the positioning of the corresponding laser (4.1, 4.2, 4.2') and thus the location of the corresponding focal point (4.1.p, 4.2.p) is changed; 8. The method according to claim 1, characterized in that the spatial arrangement of the focal point (4.1.p) of the first analyzing laser (4.1) and the focal point (4.2.p) of the second laser (4.2, 4.2') relative to each other and relative to the field of view (5.s) of the spectrometer (5) is changed.

9. A sorting device (8) is provided and / or present, 9. The method according to claim 1, further comprising classifying the object (2) into at least two different categories based on the measurement data generated by the spectrometer (5), in particular depending on the identified material of the object (2), in particular by means of an air jet.

10. At least one control unit (9) and / or computer (9) is provided and / or present, a supply means (3), in particular formed as a conveyor belt, is controlled and / or regulated by said control unit (9) and / or said computer (9), said first analyzing laser (4.1) being controlled and / or regulated by said control unit (9) and / or said computer (9); said second laser (4.2, 4.2') being controlled and / or regulated by said control unit (9) and / or said computer (9); said spectrometer (5) being controlled and / or regulated by said control unit (9) and / or said computer (9); evaluation of the measurement data generated by the spectrometer (5) by the control unit (9) and / or the computer (9); In particular, identify the material of each object (2), 10. The method according to claim 1, wherein the sorting device (8) is controlled and / or regulated by the control unit (9) and / or the computer (9), in particular for blowing out and / or sorting out the respectively identified objects (2).

11. 11. The method according to claim 1, wherein the objects (2) are individually fed via the feeding means (3), in particular by dropping them individually and successively one after the other from the end (3e) of the feeding means (3).

12. a first control module (4.1.LM) and a second control module (4.2.LM) are provided and / or are present for controlling the first analyzing laser (4.1) and for controlling the second laser (4.2, 4.2'), 12. The method according to claim 1, wherein the first analysis laser (4.1) and / or the second laser (4.2, 4.2') and / or the first control module (4.1.LM) and / or the second control module (4.2.LM) are configured and / or formed as a LIBS system or at least as part of a LIBS system.

13. 13. The method according to claim 12, characterized in that the optical fiber (5) and / or the bare fiber end (5. ofe) and / or the spectrometer (5) are formed and / or configured as part of a LIBS system.

14. 14. The method according to claim 12 or 13, wherein the control modules (4.1.LM and 4.2.LM) are functionally and / or structurally configured as components of the control unit and / or the computer (9), in particular the control unit and / or the computer (9) are also configured as part of a LIBS system.

15. 15. The method according to claim 1, wherein at least one further detection means is provided and / or is present, in particular a camera system, by means of which the geometry and / or size and / or position of the object (2) can be detected on the supply means (3), in particular the camera system being connected in control technology to the control unit and / or the computer (9).

16. A system (1) for analyzing an object (2), in particular a metal part and / or aluminum scrap, which implements in particular a method according to any one of claims 1 to 15, at least one supply means (3), at least one "first" analyzing laser (4.1) and at least one spectrometer (5), the object (2) can be supplied by the supply means (3), and the object (2) can be moved on a flight trajectory (6) from the terminal end (3e) of the supply means (3) for analysis thereof, and in particular can be dropped from the supply means (3); said "first" analyzing laser (4.1) is capable of generating a "first" laser beam (4.1.s) having a "first" focal point (4.1.p), the analyzing laser (4.1) is aligned with the supply means (3) so that the object (2) flies through the laser beam (4.1.s) in the region of a focal point (4.1.p) during each movement along its respective flight path (6), the spectrometer (5) has a field of view (5.s), the field of view (5.s) of said spectrometer (5) is aligned with a region of the flight path (6) of the object (2), the focus (4.1.p) of the analyzing laser (4.1) is located within the field of view (5.s) of the spectrometer (5), A system (1) in which a plasma of an object (2) can be generated by the focus (4.1.p) of the analyzing laser (4.1), the radiation of which can be spectroscopically analyzed by the spectrometer (5), A system (1), characterized in that the field of view (5.s) of said spectrometer (5) is realized by the bare fiber end (5.ofe) of an optical fiber (5.of).

17. 17. The system (1) according to claim 16, characterized in that the bare fiber end (5. of) is receptive to radiation of a plasma generated in the object (2) by the analyzing laser (4.1).

18. 18. The system (1) according to claim 16 or 17, characterized in that the distance between the bare fiber end (5.ofe) and the terminal end (3.e) of the supply means (3), in particular the drop edge, has a particular value, in particular at least less than 350 mm, in particular between 50 mm and 200 mm.

19. System (1) according to any one of claims 16 to 18, characterized in that the bare fiber end (5.ofe) has a numerical aperture of 0.14 to 0.28, in particular 0.18 to 0.

24.

20. 20. The system (1) according to any one of claims 16 to 19, characterized in that the optical fiber (5. of) is configured as a step-index fiber, in particular as a multimode fiber.

21. 21. The system (1) according to any one of claims 16 to 20, characterized in that the optical fiber (5. of) has a silica glass core and a cladding, in particular the cladding having an outer acrylate coating and a fluorine-doped intermediate layer.

22. System (1) according to any one of claims 16 to 21, characterized in that the optical fiber (5. of) has a core diameter having a value between 50 μm and 700 μm, in particular between 400 μm and 600 μm.

23. a second laser is provided and / or present; the second laser is configured and / or configured or correspondingly usable as a second analysis laser (4.2) or as an ablation laser (4.2'), the second laser (4.2, 4.2') is capable of generating a second laser beam (4.2.s) having a second focal point (4.2.p); 23. The system (1) according to any one of claims 16 to 22, characterized in that the second laser (4.2, 4.2') is aligned with the supply means (3) so that the object (2) flies through the second laser beam (4.2.s) in the region of a second focal point (4.2.p) during each movement on its respective flight path (6).

24. a second focus (4.2.p) of the second analyzing laser (4.2) is arranged in the field of view (5.s) of the spectrometer (5), the first analyzing laser (4.1) and the second analyzing laser (4.2) are aligned with each other such that a first focal point (4.1.p) of the first analyzing laser (4.1) is spaced apart from a second focal point (4.2.p) of the second analyzing laser (4.2), a plasma of the object (2) can be generated by the focal point (4.1.p) of the first analyzing laser (4.1) and / or by the focal point (4.2.p) of the second analyzing laser (4.2), 24. The system (1) according to any one of claims 16 to 23, characterized in that the radiation of the plasma can be spectroscopically analyzed by the spectrometer (5), and in particular the radiation generated by a second focal point (4.2.p) of the object (2) can also be received by the bare fiber end (5.ofe).

25. 25. The system (1) according to claim 24, characterized in that the first analysis laser (4.1) and the second analysis laser (4.2) are aligned with each other so that the focal point (4.1.p) of the first analysis laser (4.1) and the focal point (4.2.p) of the second analysis laser (4.2) are arranged above and below each other on a substantially perpendicular line (S) to the flight path (6) of the object (2).

26. 26. The system (1) according to any one of claims 23 to 25, characterized in that the first analysis laser (4.1) and the second analysis laser (4.2, 4.2') are aligned with each other so that the focal points (4.1.p) of the first analysis laser (4.1) and the focal points (4.2.p) of the second analysis laser (4.2, 4.2') are arranged substantially horizontally next to each other or are spaced apart from each other in the horizontal direction.

27. the first analyzing laser (4.1) and / or the second laser (4.2) have a pulse repetition frequency, 27. The system (1) according to any one of claims 16 to 26, characterized in that the value of the pulse repetition frequency in kHz corresponds to a specific value of the velocity in m / s of the object (2) when leaving the supply means (3), multiplied by a specific factor, in particular a factor of at least 15.

28. 28. The system (1) according to any one of claims 16 to 27, characterized in that the first focal point (4.1.p) of the first analyzing laser (4.1) and / or the second focal point (4.2.p) of the second laser (4.2, 4.2') have a focal diameter of 0.1 mm to 0.2 mm, in particular 0.15 mm.

29. the first analyzing laser (4.1) has a first lens forming a first focal point (4.1.p), and the second laser (4.2, 4.2') has a second lens forming a second focal point (4.2.p), 29. The system (1) according to any one of claims 23 to 28, characterized in that the first lens and the second lens each have the same focal length, in particular between 250 mm and 400 mm.

30. the first analyzing laser (4.1) has a first lens forming a first focal point (4.1.p), and the second laser (4.2, 4.2') has a second lens forming a second focal point (4.2.p), the first lens and the second lens have different focal lengths; System (1) according to any one of claims 23 to 28, characterized in that the focal length value of the second lens is in particular 5% to 10% smaller or larger than the focal length value of the first lens.

31. 31. The system (1) according to any one of claims 16 to 30, characterized in that the first analyzing laser (4.1), the spectrometer (5) and in particular the second laser (4.2, 4.2') are arranged above the flight path (6) of the object (2).

32. 31. The system (1) according to any one of claims 16 to 30, characterized in that the first analyzing laser (4.1), the spectrometer (5) and in particular the second laser (4.2, 4.2') are arranged below the flight path (6) of the object (2).

33. the first analyzing laser (4.1) and / or the second laser (4.2, 4.2') have a positioning device (7), Each positioning device (7) allows the positioning of the corresponding laser (4.1, 4.2, 4.2') and thus the location of the corresponding focal point (4.1.p, 4.2.p) to be changed; 33. The system (1) according to any one of claims 16 to 32, characterized in that the spatial arrangement of the focal point (4.1.p) of the first analyzing laser (4.1) and the focal point (4.2.p) of the second laser (4.2, 4.2') relative to each other and relative to the field of view (5.s) of the spectrometer (5) is changeable.

34. 34. The system (1) according to any one of claims 28 to 33, characterized in that the angle between the first laser beam (4.1.s) and the second laser beam (4.2.s) has a value of less than 30°, in particular less than 20°.

35. 35. The system (1) according to one or more of claims 16 to 34, characterized in that the supply means (3) is formed and / or configured in such a way that individualization of the objects (2) on the supply means (3) and / or individualized transport of the objects (2) is possible and is realized, in particular in a line in a consecutive order.

36. System (1) according to any one of claims 16 to 35, characterized in that the supply means (3) are configured as a conveyor belt (3) and / or as a chute.

37. 37. System (1) according to claim 36, characterized in that the conveyor belt (3) is aligned substantially horizontally.

38. 38. System (1) according to any one of claims 16 to 37, characterized in that the conveyor belt (3) or the chute is V-shaped or curved in cross section.

39. A sorting device (8) is provided and / or present, 39. The system (1) according to any one of claims 16 to 38, characterized in that the objects (2) can be classified into at least two mutually different categories based on the measurement data generated by the spectrometer (5), in particular depending on the identified material of the objects (2), in particular by means of an air jet, in particular the classification device (8) having an air nozzle.

40. At least one control unit (9) and / or computer (9) is provided and / or present, In particular, the control unit (9) and / or the computer (9) are effectively connected in control technology to the supply means (3) configured as a conveyor belt for the control and / or regulation thereof, the control unit (9) and / or the computer (9) are effectively connected in control technology to a first analyzing laser (4.1) for controlling and / or regulating it, the control unit (9) and / or the computer (9) are effectively connected in control technology to the second laser (4.2, 4.2') for the control and / or regulation thereof, the control unit (9) and / or the computer (9) are operatively connected to the spectrometer (5) in terms of control technology and / or data technology, the control unit (9) and / or the computer (9) are capable of evaluating the measurement data generated by the spectrometer (5), In particular, the respective material of each object (2) can be identified, 40. The system (1) according to any one of claims 16 to 39, characterized in that the control unit (9) and / or the computer (9) are effectively connected in control technology to the sorting device (8) for controlling and / or regulating it.

41. a first control module (4.1.LM) and a second control module (4.2.LM) are provided and / or are present for controlling the first analyzing laser (4.1) and for controlling the second laser (4.2, 4.2'), 41. The system according to claim 16, wherein the first analysis laser (4.1) and / or the second laser (4.2, 4.2') and / or the first control module (4.1.LM) and / or the second control module (4.2.LM) are configured and / or formed as a LIBS system or as part of a LIBS system.

42. 42. The system according to any one of claims 16 to 41, characterized in that the optical fiber (5. of) and / or the spectrometer (5) are formed and / or configured as part of a LIBS system.

43. 43. The system according to claim 41 or 42, wherein the first control module (4.1.LM) and / or the second control module (4.2.LM) are formed functionally and / or structurally as part of the control unit and / or the computer (9), in particular the control unit and / or the computer (9) are also formed as part of a LIBS system.

44. 44. The system according to claim 16, wherein at least one further detection means is provided and / or is present, in particular a camera system, by means of which the geometry and / or size and / or position of the object (2) to be fed can be detected on the feeding means (3), in particular the camera system being operatively connected in control technology to the control unit and / or the computer (9).

45. 45. The system according to any one or more of claims 16 to 44, characterized in that the supply means (3) have at least one supply track (10) for supplying and / or feeding the objects (2).

46. the supply means (3) has a plurality of supply tracks (10), in particular a plurality of virtually separated supply tracks (10) or a plurality of physically separated supply tracks (10), for supplying and / or feeding the objects (2), each supply track (10) is assigned a respective first analysis laser (4.1) and / or a respective second analysis laser (4.2) and / or an ablation laser (4.2') and a respective field of view (5.s) of the spectrometer (5), 46. ​​The system according to claim 16, characterized in that each supply track (10) is assigned a respective optical fiber (5.of) having a bare fiber end (5.ofe) and / or a respective separate spectrometer (5).

47. 47. The system according to claim 46, characterized in that the spacing between adjacent first analysis lasers (4.1) or between adjacent second analysis lasers (4.2) or between adjacent ablation lasers (4.2') and / or the spacing between adjacent bare fiber ends (5.ofe) is in the range of 20 to 200 mm, in particular in the range of 50 to 100 mm.

48. The sorting device (8) includes a "first" nozzle bar having a plurality of blowing nozzles, 48. System according to claim 46 or 47, characterized in that each supply track (10) is assigned at least one blow-off nozzle.

49. 49. The system according to claim 16, wherein the non-identifiable or insufficiently identifiable objects (2) can then be fed again to the feeding means (3) by means of an existing return system.

50. 50. The system of claim 49, wherein the return system includes at least one blow-out nozzle and / or a further second nozzle bar and / or a further conveyor belt.

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