System for evaluating differences between devices
The specimen analysis system automates inter-device difference evaluations by automatically selecting and measuring target samples, reducing operator burden and ensuring consistent measurement results across multiple units.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- SYSMEX CORP
- Filing Date
- 2025-11-18
- Publication Date
- 2026-07-01
AI Technical Summary
Conventional inter-device difference evaluations in specimen measurement systems require significant operator involvement, leading to a heavy burden on operators.
A specimen analysis system and computer program that automates the identification and measurement of target samples for inter-device difference evaluation, reducing operator involvement by automatically selecting samples, controlling multiple measurement units, and storing results for comparison.
Reduces the burden on operators by automating the inter-device difference evaluation process, ensuring accurate and compatible measurements across multiple measurement units.
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