Resist composition and method for producing resist patterns and salt
The use of a resist composition with a specific salt and resin structure addresses the issue of poor line edge roughness in resist patterns, improving microfabrication quality and precision.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- SUMITOMO CHEM CO LTD
- Filing Date
- 2025-12-17
- Publication Date
- 2026-07-01
AI Technical Summary
Existing resist compositions form resist patterns with poor line edge roughness (LER), which affects the quality and precision of microfabrication processes.
A resist composition containing a specific salt represented by formula (I) is used, which includes an acid generator with a particular structure, along with a resin containing specific structural units and an acid-unstable group, to improve line edge roughness.
The resist patterns produced exhibit improved line edge roughness (LER), enhancing the quality and precision of microfabrication processes.
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