Product inspection device

Abstract

To provide an item inspection device with improved operability. [Solution] The article inspection device 1 images the article being transported as the item to be inspected W, and performs image processing on the inspection image of the article obtained by this imaging to inspect the quality of the article. The device comprises an image storage unit 4 for storing the inspection image of the article, a display unit 5a for displaying the inspection image of the article stored in the image storage unit 4, an instruction means 5b for double-tapping to indicate any position in the inspection image of the article displayed on the display unit 5a, and a display control unit 6B for enlarging and displaying the inspection image of the article on the display unit 5a at a predetermined magnification ratio using the instruction means 5b.

Description

Technical Field

[0001] The present invention relates to an article inspection apparatus that images an article to be inspected being conveyed and inspects the quality of the article by performing image processing on the inspection image of the article obtained by imaging.

Background Art

[0002] Conventionally, as an article inspection apparatus for inspecting the quality of an article, for example, as disclosed in Patent Documents 1 to 3 below, an X-ray inspection apparatus that inspects an object to be inspected using X-rays is known. In the X-ray inspection apparatuses disclosed in these Patent Documents 1 to 3, various information and cross-sectional waveform images using the inspection image of the object to be inspected are displayed by operating a touch panel.

[0003] Regarding the specific display content by operating the touch panel, in the X-ray inspection apparatus of Patent Document 1, inspection information indicating the inspection state using the inspection image of the object to be inspected is displayed on the inspection state display unit, and at least one of the inspection information displayed on this inspection state display unit is enlarged and largely displayed in the upper region of the inspection image display unit.

[0004] Also, in the X-ray inspection apparatus of Patent Document 2, while displaying the inspection image of the object to be inspected, a projection image by a two-dimensional cross-sectional waveform image in which peak values of density levels in a direction orthogonal to the conveyance direction of the inspection image of the object to be inspected are drawn along the conveyance direction is displayed.

[0005] Furthermore, in the X-ray inspection apparatus of Patent Document 3, the presence or absence of foreign matter contamination in the object to be inspected is determined based on the inspection image of the object to be inspected, and based on this determination result, the inspection result of the object to be inspected during X-ray exposure, a two-dimensional planar image, a cross-sectional waveform image of one line in a direction substantially orthogonal to the conveyance direction of the object to be inspected, and a three-dimensional bird's-eye waveform image of the entire object to be inspected viewed obliquely from above are selectively displayed.

Prior Art Documents

Patent Documents

[0006] [Patent Document 1] Japanese Patent Publication No. 2016-114415 [Patent Document 2] Japanese Patent Publication No. 2016-180712 [Patent Document 3] Japanese Patent Publication No. 2004-028686 [Overview of the project] [Problems that the invention aims to solve]

[0007] However, with conventional item inspection devices, enlarging or reducing the inspection image of an object to a desired size required multiple key operations. For example, this involved using a function key to display the enlarge / reduce mode, selecting enlargement or reduction, and then using the increment / decrement keys to set the desired enlargement / reduction ratio. Moreover, in this enlargement / reduction mode, the enlargement / reduction of the inspection image was performed based on the upper left corner of the display screen. Therefore, the inspection image was not necessarily enlarged or reduced centered on the area desired by the user, and further key operations were required to adjust the display position to the desired area of ​​the inspection image.

[0008] Moreover, with recent technological advancements that have improved inspection accuracy, this type of product inspection device allows for more detailed inspections, but the operation related to settings has also become more complex, so there has been a desire for improved operability.

[0009] Therefore, the present invention has been made in view of the above problems, and aims to provide an article inspection device that can improve operability. [Means for solving the problem]

[0010] To achieve the above objective, the article inspection apparatus described in claim 1 of the present invention is an article inspection apparatus 1 that images a conveyed article as an object to be inspected W, and performs image processing on the inspection image of the article obtained by said imaging to inspect the quality of the article, An image storage unit 4 stores an inspection image of the aforementioned article, A display unit 5a that displays an inspection image of the article stored in the image storage unit, An instruction means 5b for double-tapping to indicate any position in the inspection image of the item displayed on the display unit, The system is characterized by comprising a display control unit 6B that causes the display unit to enlarge and display an inspection image of the article at a predetermined magnification ratio using the instruction means.

[0011] The article inspection apparatus described in claim 2 of the present invention is an article inspection apparatus according to claim 1, The display control unit 6B is characterized by displaying a thumbnail on a part of the display unit 5a.

[0012] The article inspection apparatus described in claim 3 of the present invention is an article inspection apparatus according to claim 1, The projected image generation unit 6Aa generates a projected image pi, which is a two-dimensional cross-sectional waveform image obtained by plotting the maximum density along one of the horizontal and vertical axes in the transport direction A of the inspection image of the aforementioned article along the other axis. The display control unit 6B is characterized by arranging and displaying the projected image created by the projected image generation unit, with the horizontal axis of the transport direction as the other axis, in correspondence with the inspection image of the article.

[0013] The article inspection apparatus described in claim 4 of the present invention is an article inspection apparatus according to claim 3, The projected image pi is characterized by its ability to switch between displaying the waveform of the entire inspection image of the item and displaying the waveform of a magnified section of the inspection image of the item.

[0014] The article inspection device described in claim 5 of the present invention is an article inspection device according to any one of claims 1 to 4, The instruction means 5b is characterized by being composed of a capacitive touch panel located on the display unit 5a.

[0015] The article inspection device described in claim 6 of the present invention is an article inspection device according to any one of claims 1 to 4, The display control unit 6B is characterized in that it returns the enlarged inspection image to the inspection image of the article before enlargement according to the double-tap instruction of the instruction means 5b and causes the display unit 5a to display it.

Advantages of the Invention

[0016] According to the present invention, by instructing the enlargement of the inspection image of the inspected object by double-tapping, the enlargement operation for the display of the inspection image of the inspected object becomes easy. Further, by displaying the overall thumbnail, it is possible to easily grasp the position of which part of the inspection image of the inspected object is enlarged when a part of the inspection image of the inspected object is enlarged. Furthermore, when a part of the inspection image of the inspected object is enlarged and displayed, a projection image linked thereto can be displayed.

Brief Description of the Drawings

[0017] [Figure 1] It is a block diagram showing a schematic configuration of an article inspection apparatus according to the present invention. [Figure 2] It is a diagram showing an example of display of an inspection screen during inspection of an inspected object of an article inspection apparatus according to the present invention. [Figure 3] It is a diagram showing an example of display when a part of the inspection image of the inspected object in the inspection screen of FIG. 2 is enlarged.

Embodiments for Carrying Out the Invention

[0018] Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the attached drawings.

[0019] As shown in FIG. 1, the article inspection apparatus 1 of the present embodiment images the inspected object W to be conveyed (an article to be inspected), performs image processing on the inspection image of the inspected object W obtained by imaging, and inspects the quality (foreign matter, defects, etc.) of the inspected object W. It includes a conveyance unit 2, an imaging unit 3, an image storage unit 4, a display operation unit 5, and a control unit 6, and has a schematic configuration.

[0020] The conveying unit 2 sequentially conveys the object to be inspected W at predetermined intervals relative to the conveying direction A. For example, it is configured by supporting a conveyor (not shown) in a housing (not shown) that can sequentially convey the object to be inspected W in the conveying direction A (rightward in Figure 1) by winding a loop-shaped conveying belt 2a around a plurality of conveying rollers 2b, with the conveying belt 2a running on an upper section 2c. The conveying rollers 2b are rotationally driven by a motor (not shown) and controlled by a control unit 6 to obtain a predetermined conveying speed.

[0021] The imaging unit 3 acquires inspection images of the object W being transported by the transport unit 2, and comprises an X-ray generator 3a positioned at a predetermined height above an inspection space (not shown) in the middle of the transport unit 2, and an X-ray detector 3b positioned inside the transport unit 2 opposite the X-ray generator 3a.

[0022] The X-ray generator 3a generates X-rays of wavelength and intensity corresponding to the tube current and tube voltage using a known X-ray tube, and is configured to irradiate the object to be inspected W or samples (good workpieces, foreign objects, etc. of the object to be inspected W) on the conveyor belt 2a with a fan-beam shape perpendicular to the conveying direction A of the conveying unit 2 through the X-ray window of an enclosure (not shown).

[0023] The tube current and tube voltage of the X-ray tube are preferably adjusted according to the material and size of the object W under inspection (especially the dimensions in the direction of X-ray transmission). For new varieties, the settings are determined or selected by test imaging using the object W under inspection or a sample to obtain appropriate contrast.

[0024] The X-ray detector 3b includes an X-ray line sensor, which contains a scintillator and a photodiode array (not shown). The scintillator converts X-rays into light, and the photodiode array converts this light into an electrical signal to output an X-ray image based on X-ray transmission data. The X-ray detector 3b may also generate and output the X-ray image using a direct conversion type semiconductor element.

[0025] The image storage unit 4 temporarily stores the X-ray image obtained from the X-ray transmission data received from the X-ray detector 3b of the imaging unit 3 as the inspection image of the object W under inspection.

[0026] The display operation unit 5 is operated to switch the power supply, transport unit 2, and imaging unit 3 ON / OFF, and to perform various settings and displays necessary when inspecting the quality of the object W under inspection. It comprises a display unit 5a and an instruction means 5b.

[0027] The display unit 5a displays inspection images of the object under inspection W and inspection results of the object under inspection W stored in the image storage unit 4 on the display screen, and also displays operation buttons on the display screen that are used to perform various settings and display instructions related to the quality inspection of the object under inspection W.

[0028] The instruction means 5b is composed of a multi-touch touch panel, more specifically a capacitive touch panel, which is placed on the display screen of the display unit 5a. By performing a double-tap operation (a quick tapping operation with a fingertip or the like) where the user touches and immediately releases the screen on the touch panel twice in quick succession within a predetermined time, the user can indicate an arbitrary position centered on the part of the inspection image WE of the object to be inspected W, which will be described later, that the user wants to see, as displayed on the display unit 5a.

[0029] Here, Figure 2 shows an example of the display of the inspection screen 11 during the inspection of an object W by the item inspection device 1. Figure 3 shows an example of a magnified view of a portion of the inspection image WE of the object W on the inspection screen 11 in Figure 2.

[0030] The inspection screen 11 in Figures 2 and 3 is divided into six rectangular areas: an inspection status display area E1, a product number display area E2, a common information display area E3, an captured image display area E4, a projected image display area E5, and an inspection information display area E6. An operation button 12 is located at the bottom.

[0031] To explain each area E1 to E6, the inspection status display area E1 indicates whether or not the object W under inspection is being inspected by X-ray irradiation. As shown in Figures 2 and 3, if "Operating" is displayed in the inspection status display area E1, it indicates that the object W under inspection is being inspected by X-ray irradiation. Conversely, if "Stopped" is displayed in the inspection status display area E1, it indicates that the object W under inspection is not being inspected due to the absence of X-ray irradiation.

[0032] The variety number display area E2 sets a number according to the variety of the item W being inspected (for example, meat, fish, processed food, pharmaceuticals) and displays the number corresponding to the set variety (e.g., "1000" in the examples in Figures 2 and 3).

[0033] The common information display area E3 displays common information that is not dependent on the type of item being inspected, such as the current date and time (in the examples in Figures 2 and 3, "2024-xx-xx 13:50") and network connection status, which are specific to the item inspection device 1.

[0034] The image display area E4 displays information about the inspection image (image) WE, which is a grayscale image of the object W under inspection. Specifically, in the inspection image WE of the image display area E4 in Figure 2, the three elliptical portions represent the contents image Wa of the object W under inspection, and the blacked-out portions within the contents image Wa of the left elliptical portion and the blacked-out portions within the contents image Wa of the central elliptical portion each represent the foreign object image Wb. In addition, in the image display area E4 of Figure 2, the area e enclosed by a dotted rectangle based on the position indicated by the instruction means 5a and a predetermined magnification ratio represents the enlarged area of ​​the inspection image WE (the enlarged area of ​​the inspection image WE centered on the location indicated by the user).

[0035] The inspection image WE in the image display area E4 of Figure 3 shows an enlarged image of the inspection image WE in the area e enclosed by the dotted rectangle in the image display area E4 of Figure 2 (an enlarged image of the inspection image WE centered on the area the user wants to see). In addition, a part of the image display area E4 of Figure 3 (the small rectangular area in the lower left of the image display area E4 of Figure 3) shows a thumbnail display tv of the entire inspection image WE in the image display area E4 of Figure 2.

[0036] Although not specifically shown in the diagram, in the image display area E4 of Figure 2, a portion of the inspection image WE can be enlarged and displayed based on a predetermined position (for example, the center of the selected contents image Wa or the vertices of the circumscribed rectangle) by double-tapping the instruction means 5a. In addition, the area e enclosed by the dotted rectangle may be identified (highlighted) with a rectangular line of a predetermined color set in advance to make the enlarged portion easier to understand.

[0037] The projection image display area E5 displays a projection image pi, which is a two-dimensional cross-sectional waveform image plotted along the other axis of the horizontal axis (horizontal axis: axis in the transport direction A) and vertical axis (vertical axis: axis perpendicular to the transport direction A) of the inspection image WE of the object under inspection W. In the projection image display area E5 of Figures 2 and 3, the projection image pi is displayed, which is a two-dimensional cross-sectional waveform image plotted along the horizontal axis (horizontal axis: axis in the transport direction A) of the inspection image WE of the object under inspection W.

[0038] Furthermore, in the projection image display area E5 of Figures 2 and 3, it is also possible to display a projection image pi using a two-dimensional cross-sectional waveform image, where the maximum value of the density (peak value of the density level) on the horizontal axis (horizontal axis: axis in the transport direction A) of the inspection image WE of the object under inspection W is plotted along the vertical axis (vertical axis: axis in the direction perpendicular to the transport direction A).

[0039] Furthermore, the projection image display area E5 can display both the projection image pi of the entire inspection image WE of the object under inspection W, which shows the overall waveform, and the projection image pi of the enlarged section of the inspection image WE of the object under inspection W, which shows a partial waveform, in conjunction with the enlargement operation of the inspection image WE of the object under inspection W. Alternatively, it can be selectively switched between these displays by operating the display operation unit 5 after the enlargement operation of the inspection image WE of the object under inspection W.

[0040] Furthermore, when the inspection image WE of the object under inspection W is enlarged, a projected image pi reflecting only the magnification ratio of the horizontal axis (axis in the transport direction A) of the inspection image WE of the object under inspection W is displayed in the projected image display area E5, corresponding to the enlarged inspection image WE of the object under inspection W. At that time, it is also possible to selectively switch and display in the projected image display area E5 by operating the display operation unit 5, corresponding to the size of the displayed inspection image WE of the object under inspection W, by operating the display operation unit 5, based on the magnification ratio of the horizontal axis (axis in the transport direction A) or the vertical axis (axis perpendicular to the transport direction A) of the inspection image WE of the object under inspection W.

[0041] The inspection information display area E6 displays the latest inspection result for the inspected item W, as well as the total inspection results for the specified variety, as inspection information. Specifically, in the examples in Figures 2 and 3, the following are displayed as inspection information in the inspection information display area E6: production capacity: 60 units / minute, total number of inspected items W: 300 units, total number of OKs out of the total number of inspections: 290 units (96.6%), total number of NGs: 10 units (3.4%), and total number of foreign object NGs: 10 units (3.4%).

[0042] Furthermore, the inspection screen 11 in Figure 2 has the following buttons arranged as operation buttons 12: START button 12a, STOP button 12b, Menu button 12c, Display button 12d, and Settings / Adjustment button 12e.

[0043] The START button 12a is operated to instruct the start of operation of the item inspection device 1 (start of inspection of the item W) when inspecting the quality of the item W to be inspected.

[0044] The STOP button 12b is operated to instruct the inspection device 1 to stop operating (to stop the inspection of the object W) when inspecting the quality of the object W.

[0045] The menu button 12c is used to display a menu screen that allows you to transition to other screens, such as those displaying statistics or a list of varieties of the inspected object W.

[0046] The display button 12d is operated to switch between, for example, the projected image pi of the entire inspection image WE of the object under inspection W, which shows the overall product impact, and the projected image pi of the enlarged section of the inspection image WE of the object under inspection W, which shows a partial product impact; or to switch from the displayed image in the image capture display area E4 to the captured image (acquired image) or the inspection result image.

[0047] The settings / adjustment button 12e is used to access the settings adjustment screen, which allows for settings such as switching the type of object W to be inspected, adjusting inspection parameters such as detection limit values ​​(which can be set to multiple different values ​​depending on the type of object W and the type of foreign object to be detected), adjusting the transport speed and sorting (distribution) timing, and setting the display priority of the displayed content.

[0048] The control unit 6 is a device that comprehensively controls the operation of the item inspection device 1, comprising one or more processors and their peripheral circuits, and includes an inspection processing unit 6A and a display control unit 6B. Specifically, the control unit 6 comprises, for example, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), a DSP (Digital Signal Processor), an LSI (Large Scale Integration), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), etc., and controls the operation of each part of the item inspection device 1 (transport unit 2, imaging unit 3, image storage unit 4, display operation unit 5) and performs various processes based on a program stored in a storage unit (not shown).

[0049] The inspection processing unit 6A processes the inspection image WE of the object W to be inspected, and comprises a projected image generation unit 6Aa, an image processing unit 6Ab, and a determination unit 6Ac.

[0050] The projection image generation unit 6Aa generates a projection image pi using a two-dimensional cross-sectional waveform image obtained by plotting the maximum value of the density (peak value of the density level) on one axis of the horizontal axis (horizontal axis: axis in the transport direction A) and vertical axis (vertical axis: axis in the direction perpendicular to the transport direction A) of the inspection image WE of the object to be inspected along the other axis.

[0051] The image processing unit 6Ab performs image processing on the inspection image WE of the object under inspection W, which is an X-ray image stored in the image storage unit 4, using one of several inspection algorithms to combine feature extraction and filtering for foreign object enhancement. The image processing unit 6Ab also generates a processed image using a 2D image corresponding to a plan view of the object under inspection W, based on the processed inspection image WE (grayscale image) of the object under inspection W.

[0052] The determination unit 6Ac performs quality status determination processing (for example, determination of the presence or absence of foreign matter) of the object W to be inspected based on the image data processed by the image processing unit 6Ab. The processing image processed by the image processing unit 6Ab is compared with a detection limit value set in advance for each inspection algorithm, and the determination unit 6Ac determines whether or not there is foreign matter contamination or defects in the object W to be inspected based on this comparison result. Then, in each inspection algorithm used for inspection, the determination unit 6Ac determines that the object W to be inspected is a defective product when the processed image exceeds the detection limit value.

[0053] The display control unit 6B controls the display of the inspection results of each object W to be inspected on the display unit 5a in the display format shown in Figures 2 and 3, for example, based on the transmission image of each object W to be inspected, the projection image pi generated by the projection image generation unit 6Aa, the processed image output from the image processing unit 6Ab, and the pass / fail judgment result of the judgment unit 6Ac.

[0054] Next, we will explain the operation when the quality of an object W to be inspected is inspected using the item inspection device 1 configured as described above.

[0055] First, when the power to the item inspection device 1 is switched from OFF to ON by operating the display operation unit 5, the transport unit 2 and the imaging unit 3 (X-ray generator 3a, X-ray detector 3b) are switched from OFF to ON. Then, when the START button 12a of the operation buttons 12 on the inspection screen 11 in Figure 2 is pressed, the object to be inspected W is sequentially transported by the transport unit 2 in the transport direction A at predetermined intervals. Then, X-rays are irradiated from the X-ray generator 3a onto the object to be inspected W on the transport belt 2a, and the X-rays that pass through the object to be inspected W are detected by the X-ray detector 3b, and an X-ray image is output based on X-ray transmission data corresponding to the amount of X-rays transmitted.

[0056] Then, the X-ray image obtained from the X-ray transmission data from the X-ray detector 3b is sequentially stored in the image storage unit 4 as the inspection image WE of the object W under inspection. Subsequently, the projection image generation unit 6Aa of the control unit 6 generates a projection image pi using a two-dimensional cross-sectional waveform image, in which the maximum value of the density (peak value of the density level) on one axis of the horizontal axis (horizontal axis: axis in the transport direction A) and vertical axis (vertical axis: axis in the direction perpendicular to the transport direction A) of the inspection image WE of the object W under inspection is plotted along the other axis.

[0057] Furthermore, the image processing unit 6Ab of the control unit 6 performs image processing on the inspection image WE of the object to be inspected, which is an X-ray image stored in the image storage unit 4, combining, for example, feature extraction and filtering for foreign object enhancement. It also generates a processed image of the object to be inspected as a two-dimensional image based on the processed inspection image WE (grayscale image) of the object to be inspected.

[0058] Furthermore, the determination unit 6Ac of the control unit 6 performs a quality state determination process (for example, a determination process for the presence or absence of foreign matter) based on the image data processed by the image processing unit 6Ab.

[0059] Then, the display control unit 6B of the control unit 6 displays the inspection image WE of the object to be inspected W (including the contents image Wa and the foreign object image Wb) on the captured image display area E4 of the inspection screen 11 of the display unit 5a, based on the processed image processed by the image processing unit 6Ab of the control unit 6, for example, as shown in Figure 2.

[0060] Furthermore, the display control unit 6B of the control unit 6 displays the projected image pi corresponding to the inspection image WE of the object under inspection W generated by the projected image generation unit 6Aa of the control unit 6 in the projected image display area E5 of the inspection screen 11 of the display unit 5a, as shown in Figure 2, for example.

[0061] Furthermore, the display control unit 6B of the control unit 6 displays the production capacity, the total number of inspected objects W, the total number of OKs, the total number of NGs, and the total number of foreign object NGs based on the determination result of the determination unit 6Ac of the control unit 6 in the inspection information display area E6 of the inspection screen 11 of the display unit 5a, for example, as shown in Figure 2.

[0062] Here, in the image display area E4 of the inspection screen 11 in Figure 2, when a portion of the inspection image WE of the object under inspection W is to be enlarged, the user indicates the part of the inspection image WE of the object under inspection W that they want to see using the instruction means 5b of the display operation unit 5. As a result, as shown in Figure 3, in the area e enclosed by the dotted rectangle in the image display area E4 of the inspection screen 11, an enlarged image centered on the part of the inspection image WE that the user wants to see is displayed in the image display area E4 of the inspection screen 11, and a thumbnail display tv of the entire inspection image WE in the image display area E4 of Figure 2 is displayed in the lower left area of ​​the image display area E4. At that time, as shown in Figure 3, a projected image pi (a projected image pi corresponding to the enlarged image of the inspection image WE in area e of Figure 2) linked to the enlargement operation of the inspection image WE of the object under inspection W in Figure 2 is displayed in the projected image display area E5.

[0063] Furthermore, after the enlarged image is displayed, double-tapping within the image capture display area E4 will return the display to its normal size before enlargement. The inspection is performed while maintaining the enlarged display until instructed to do so by double-tapping. The magnification ratio for displaying the enlarged image using the instruction means 5b of the display operation unit 5 is stored in a storage unit (not shown) as a parameter beforehand. Alternatively, the magnification ratio may be calculated and stored based on the size of the inspection image of the object under inspection W relative to the image capture display area E4 at the time of instruction. When the next object under inspection W is inspected, the enlarged image of that inspection image WE will be displayed in the image capture display area E4 based on the stored magnification ratio. An example of calculating the magnification ratio is to find the magnification ratio at which the image of the object under inspection W is displayed at its maximum magnification within the image capture display area E4.

[0064] By the way, in the embodiment described above, we explained an example in which the imaging unit 3 is equipped with an X-ray generator 3a and an X-ray detector 3b, and while transporting the object to be inspected W, X-rays are irradiated from the X-ray generator 3a, and the X-rays that have passed through the object to be inspected W are detected by the X-ray detector 3b, and the X-ray image obtained is used as the inspection image WE to inspect the quality of the object to be inspected W. However, the invention is not limited to this, and the imaging unit 3 can be configured in any way that can obtain the inspection image WE of the object to be inspected W.

[0065] Specifically, the imaging unit 3 is equipped with a light emitter and a light receiver, and instead of X-rays as electromagnetic waves, it emits light from the light emitter onto the object to be inspected W, and the light that has passed through or been projected onto the object to be inspected W is detected by the light receiver to inspect the quality of the object to be inspected W. It can also be applied to an object inspection device in which the imaging unit 3 is equipped with a light source and a camera, and the light source and camera are positioned opposite each other with a gap S between the upstream conveyor 4 and the downstream conveyor 5, and the light source is emitted onto the object to be inspected W, and the quality of the object to be inspected is inspected from the image captured by the camera.

[0066] As described above, according to this embodiment, by employing a capacitive touch panel as the instruction means 5b for indicating an arbitrary position in the inspection image WE of the object under inspection W, for example, double-tapping with two fingers becomes possible, and the magnification ratio can be calculated from the distance between the two fingers, thereby improving the operability of the magnification operation for the display of the inspection image WE of the object under inspection W. Furthermore, it becomes possible to give instructions by swiping up, down, left, or right while pressing down on the touch panel with a finger, and it is possible to switch between multiple operation screens in the setting adjustment screen (not shown) called up by the setting / adjustment button 12e shown in Figure 2 by swiping, thereby improving operability.

[0067] Furthermore, by displaying a thumbnail of the entire inspection image WE of the object W being inspected, it is easy to understand which part of the entire inspection image WE is being magnified when a portion of the inspection image WE of the object W being inspected is enlarged.

[0068] Furthermore, when a portion of the inspection image WE of the object being inspected W is displayed in an enlarged view, a corresponding projected image pi can be displayed.

[0069] The best mode of the article inspection apparatus according to the present invention has been described above, but the present invention is not limited by this description and drawings. That is, other modes, examples, and operational techniques based on this mode, as made by those skilled in the art, are all included in the scope of the present invention. [Explanation of Symbols]

[0070] 1. Item inspection device 2. Conveying section 2a Conveyor belt 2b Conveyor roller 2c Upper running section 3. Imaging Unit 3a X-ray generator 3b X-ray detector 4 Image storage unit 5 Display operation section 5a Display section 5b Instruction means 6 Control Unit 6A Inspection Processing Unit 6Aa Projection Image Generation Unit 6Ab Image Processing Unit 6Ac judgment section 6B Display Control Unit 11. Examination screen 12 Operation buttons 12a START button 12b STOP button 12c Menu button 12d Display button 12e Settings / Adjustment Buttons W: Object under inspection WE examination images (imaging images) Wa Contents Wb foreign matter A Conveying direction E1 Inspection status display area E2 Product number display area E3 Common information display area E4 Image display area E5 Projection image display area E6 Examination information display area e-region (expanded region) TV thumbnail display pi projection image

Claims

1. In an article inspection device (1) that images an article being transported as an item to be inspected (W), and performs image processing on the inspection image of the article obtained by said imaging to inspect the quality of the article, An image storage unit (4) that stores an inspection image of the aforementioned article, A display unit (5a) that displays the inspection image of the article stored in the image storage unit, An instruction means (5b) for double-tapping to indicate any position in the inspection image of the article displayed on the display unit, An X-ray inspection apparatus characterized by comprising a display control unit (6B) that causes the display unit to enlarge and display an inspection image of the article at a predetermined magnification ratio using the instruction means.

2. The X-ray inspection apparatus according to claim 1, characterized in that the display control unit (6B) displays a thumbnail on a part of the display unit (5a).

3. The system includes a projection image generation unit (6Aa) that generates a projection image (pi), which is a two-dimensional cross-sectional waveform image obtained by plotting the maximum density along one of the horizontal and vertical axes in the transport direction (A) of the inspection image of the aforementioned article along the other axis. The X-ray inspection apparatus according to claim 1, characterized in that the display control unit (6B) arranges and displays the projected image created by the projected image generation unit with the horizontal axis of the transport direction as the other axis, so that it corresponds to the inspection image of the article.

4. The X-ray inspection apparatus according to claim 3, characterized in that the projected image (pi) can be switched between displaying the waveform of the entire inspection image of the article and displaying the waveform of a magnified section of the inspection image of the article.

5. The X-ray inspection apparatus according to any one of claims 1 to 4, characterized in that the indicating means (5b) is composed of a capacitive touch panel arranged on the display unit (5a).

6. The X-ray inspection apparatus according to any one of claims 1 to 4, characterized in that the display control unit (6B) returns the magnified inspection image to the inspection image of the article before magnification by a double-tap instruction of the instruction means and displays it on the display unit (5a).

Images