Metallic foreign body inspection device and metallic foreign body inspection method
The metallic foreign matter inspection device employs a dry detection method using airflow management and capacitance analysis to accurately identify and classify metallic contaminants, addressing inefficiencies in existing oil-based systems and enhancing inspection accuracy.
Patent Information
- Application Number
- JP2025543951
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-09-08
- Filing Date
- 2024-08-16
- Publication Date
- 2026-02-05
AI Technical Summary
Existing methods for detecting metallic foreign matter in the air of a production line are inefficient and require the use of oils that become contaminated and need frequent replacement, lacking the ability to distinguish different types of metallic contaminants.
A metallic foreign matter inspection device that uses a housing unit with an air inlet, an electrode unit to detect and classify metallic foreign matter based on capacitance changes, and a fan unit to manage airflow, allowing for dry detection and classification of ferrous and non-ferrous metals.
Enables accurate detection and classification of metallic foreign matter without oils, preventing contamination and reducing maintenance, while distinguishing between ferrous and non-ferrous metals for improved inspection efficiency.
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Figure 2026504388000001_ABST
Abstract
Description
[Technical Field]
[0001] [CROSS-REFERENCE TO RELATED APPLICATIONS] This application claims the benefit of priority based on Korean Patent Application No. 10-2023-0119529, filed September 8, 2023, and all contents disclosed in the documents of this Korean patent application are incorporated herein by reference.
[0002] The present invention relates to a metallic foreign matter inspection device and a metallic foreign matter inspection method, and more particularly to a metallic foreign matter inspection device and a metallic foreign matter inspection method for detecting metallic foreign matters contained in the air of a production line and classifying the types of metallic foreign matters. [Background technology]
[0003] With technological development and increasing demand for mobile devices, the demand for secondary batteries as an energy source is rapidly increasing. In particular, secondary batteries are attracting much attention as an energy source for mobile devices such as mobile phones, digital cameras, laptops, and wearable devices, as well as for power devices such as electric bicycles, electric cars, and hybrid electric vehicles.
[0004] These secondary batteries are classified into cylindrical and prismatic batteries, in which an electrode assembly is housed in a cylindrical or prismatic metal can, and pouch-type batteries, in which an electrode assembly is housed in a pouch-type case made of an aluminum laminate sheet, depending on the shape of the battery case. The electrode assembly housed in the battery case is a chargeable and dischargeable power generating element that includes a positive electrode, a negative electrode, and a separator interposed between the positive and negative electrodes. The battery is classified into a jelly-roll type, in which a long sheet-type positive electrode and a negative electrode coated with an active material are wound up with a separator interposed between them, and a stack type, in which multiple positive electrodes and negative electrodes are stacked in sequence with a separator interposed between them.
[0005] Among these, pouch-type batteries, which have a structure in which a stack-type or stack / fold-type electrode assembly is housed in a pouch-type battery case made of an aluminum laminate sheet, are gradually becoming more popular due to their low manufacturing cost, small weight, and easy shape modification.
[0006] In a production line for manufacturing such secondary batteries, metallic foreign matter present in the air increases the defect rate of secondary batteries, and in particular, monitoring is required to selectively detect the types of metallic foreign matter present in the air within the production line to identify the cause of the metallic foreign matter.
[0007] Conventionally, metallic contaminants in the air are detected by suctioning them into the oil using an air pump or other suction means, and then circulating the oil containing the contaminants. However, this method has problems such as the oil becoming contaminated by the contaminants and evaporating over time. In such cases, the oil must be replaced or replenished to a certain level.
[0008] As a result, there is a growing need to develop a metal foreign matter inspection device and method that can detect metal foreign matter contained in the air of a production line in a dry state without internal oil and distinguish the type of metal foreign matter. Summary of the Invention [Problem to be solved by the invention]
[0009] SUMMARY OF THE INVENTION An object of the present invention is to provide a metallic foreign matter inspection device and method for detecting metallic foreign matter contained in the air of a production line and classifying the type of metallic foreign matter.
[0010] The problems to be solved by the present invention are not limited to those described above, and problems not mentioned will be clearly understood by a person having ordinary skill in the art to which the present invention pertains from this specification and the accompanying drawings. [Means for solving the problem]
[0011] A metal foreign matter inspection device according to one embodiment of the present invention includes a housing portion into which air containing metal foreign matter flows; an electrode portion that comes into contact with metal foreign matter contained in the air flowing into the housing portion and acquires information about the metal foreign matter; and a fan portion that blows air in one direction toward the metal foreign matter located on the electrode portion, wherein the housing portion includes an air receiving portion that receives the air containing metal foreign matter and an air inlet portion located at the top of the housing portion, and the electrode portion is located at the bottom of the housing portion, and the fan portion is located on one side of the housing portion.
[0012] The presence or absence of the metallic foreign matter and the size of the metallic foreign matter can be analyzed based on information on the capacitance value according to time acquired from the electrode unit.
[0013] Air containing metallic foreign matter that flows into the air inlet section moves in the direction of gravity in the air receiving section, and the metallic foreign matter that moves in the direction of gravity in the air receiving section accumulates on the electrode section, and the presence or absence of the metallic foreign matter and the size of the metallic foreign matter can be analyzed based on the difference in capacitance value over time as the metallic foreign matter accumulates.
[0014] The fan unit repeats starting and stopping airflow at regular time intervals, and analysis can be performed based on information acquired from the electrode unit when airflow from the fan unit is stopped.
[0015] The housing may further include a metal foreign matter collecting section located at a distance from the fan section along the airflow direction of the fan section and on the opposite side of the side of the housing section on which the fan section is located, and at least some of the metal foreign matters located on the electrode section may move to the metal foreign matter collecting section along the airflow direction of the fan section.
[0016] The device may further include a magnet portion located below the electrode portion, and among the metal foreign objects located on the electrode portion, ferrous metal foreign objects containing iron (Fe) may be fixed onto the electrode portion by the magnetic force of the magnet portion.
[0017] The ferrous metal foreign matter fixed on the electrode portion can be removed by wiping the surface of the electrode portion with a cloth or brush.
[0018] Among the foreign metal particles located on the electrode unit, non-ferrous foreign metal particles that do not contain iron (Fe) can be moved to the foreign metal particle collecting unit by the air blown by the fan unit.
[0019] The non-ferrous metal foreign matter trapped in the metal foreign matter trapping section can be removed by replacing the metal foreign matter trapping section with another metal foreign matter trapping section.
[0020] A metallic foreign body inspection method according to another embodiment of the present invention includes an air inflow step in which air containing metallic foreign bodies is introduced into a housing part; a metallic foreign body information acquisition step in which the metallic foreign bodies contained in the air introduced into the housing part come into contact with an electrode part and information about the metallic foreign bodies is acquired; and a metallic foreign body movement step in which a fan part blows air in one direction toward the metallic foreign bodies located on the electrode part, wherein the housing part includes an air receiving part in which the air containing metallic foreign bodies is received and an air inflow part located at an upper part of the housing part, the electrode part is located at a lower part of the housing part, and the fan part is located at one side of the housing part.
[0021] The method may further include a metallic foreign matter analysis step of analyzing the presence and size of the metallic foreign matter based on information on capacitance values according to time acquired from the electrode unit.
[0022] The metallic foreign matter moves from the air inlet portion along the direction of gravity, and the metallic foreign matter that moves along the direction of gravity accumulates on the electrode portion, and the metallic foreign matter analysis step can analyze the size of the metallic foreign matter based on the difference in capacitance value over time during which the metallic foreign matter accumulates.
[0023] In the metallic foreign body moving step, the fan unit repeatedly starts and stops blowing air at regular time intervals, and the metallic foreign body information acquisition step and the metallic foreign body analysis step can be performed with the fan unit's air blowing stopped.
[0024] The method may further include a magnet portion located below the electrode portion, and among the metal foreign objects located on the electrode portion, ferrous metal foreign objects containing iron (Fe) may be fixed on the electrode portion by the magnetic force of the magnet portion, and the ferrous metal foreign objects may be fixed on the electrode portion after the metal foreign object moving step.
[0025] The method may further include a metal foreign matter collection step in which at least some of the metal foreign matter located on the electrode portion moves along the airflow direction of the fan portion and is collected in a metal foreign matter collection portion, and the metal foreign matter collection portion may be located apart from the fan portion along the airflow direction of the fan portion and on the opposite side of one side of the housing portion where the fan portion is located. [Effects of the Invention]
[0026] The metallic foreign matter detection device and metallic foreign matter detection method according to the embodiments of the present invention can detect metallic foreign matters contained in the air of a production line and classify the type of metallic foreign matter based on metallic foreign matter information acquired when metallic foreign matters contained in air flowing in from an air inlet come into contact with an electrode unit.
[0027] The effects of the present invention are not limited to the effects described above, and effects not mentioned will be clearly understood by those having ordinary skill in the art to which the present invention pertains from this specification and the accompanying drawings. [Brief explanation of the drawings]
[0028] [Figure 1] 1 is a diagram showing a metallic foreign matter inspection device according to an embodiment of the present invention. [Figure 2] 2 is a diagram showing the airflow intensity of the fan unit of FIG. 1 as a function of time. [Figure 3] 2 is a diagram showing metallic foreign matter sequentially accumulated in the metallic foreign matter inspection device of FIG. 1; [Figure 4] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated over time. [Figure 5] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated over time. [Figure 6] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated over time. [Figure 7] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated according to its position; [Figure 8] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated according to its position; [Figure 9] 4 is a diagram showing a change in capacitance value caused by the metal foreign matter of FIG. 3 being sequentially accumulated according to its position; [Figure 10] 4 is a diagram showing that some of the metallic foreign matter in FIG. 3 is moved by the air blown by the fan unit. [Figure 11] 10 is a view showing a metallic foreign matter inspection method according to another embodiment of the present invention; DETAILED DESCRIPTION OF THE INVENTION
[0029] DETAILED DESCRIPTION OF THE INVENTION The present invention may, as those skilled in the art may realize, be embodied in several different forms and should not be construed as limited to the embodiments set forth herein.
[0030] In order to clearly describe the present invention, parts not necessary for the description will be omitted and the same reference numerals will be used throughout the specification to refer to the same or similar components.
[0031] Furthermore, throughout the specification, when a part is said to "comprise" a certain element, this does not mean that it may further include other elements, unless otherwise specified.
[0032] Fig. 1 is a diagram showing a metallic foreign matter inspection device according to an embodiment of the present invention, and Fig. 2 is a diagram showing the airflow intensity of the fan unit of Fig. 1 as a function of time.
[0033] Referring to FIG. 1, a metallic foreign body inspection device 1000 according to one embodiment of the present invention includes a housing unit 100 into which air containing metallic foreign bodies 10 flows; an electrode unit 300 that comes into contact with the metallic foreign bodies 10 contained in the air that flows into the housing unit 100 and acquires information about the metallic foreign bodies 10; and a fan unit 200 that blows air in one direction toward the metallic foreign bodies 10 located on the electrode unit 300.
[0034] More specifically, the housing 100 may include an air receiving portion 110 that receives air containing foreign metal particles 10 and an air inlet portion 150 into which the air containing foreign metal particles 10 is introduced. Here, the housing 100 does not require additional test fluids such as oil or water to flow into the air receiving portion 110. That is, the inside of the air receiving portion 110 of the housing 100 is dry, and only the air containing foreign metal particles 10 that has flowed in through the air inlet portion 150 can flow into the air receiving portion 110.
[0035] As a result, the metallic foreign matter detection device 1000 according to this embodiment has the advantage that there is no need to replace or replenish the test fluid during the testing process because a separate test fluid does not flow inside the air-receiving unit 110. Furthermore, since the test is performed in a dry state inside the air-receiving unit 110, it is possible to prevent a problem in which the test fluid is contaminated by metallic foreign matter 10 contained in the air and the test performance is reduced.
[0036] In the housing 100, the air inlet 150 may be located at the top of the housing 100. For example, as shown in Fig. 1, the top of the housing 100 may be open to the outside, and the air inlet 150 may have a guide structure extending from the top of the housing 100 to the outside. External air introduced through the air inlet 150 located at the top of the housing 100 may move along a first direction (d1) inside the air receiving part 110. For example, the first direction (d1) may refer to the direction of gravity, which may refer to a direction from the top of the housing 100 to the bottom of the housing 100.
[0037] The fan unit 200 may be located on one side of the housing unit 100. More specifically, the fan unit 200 may be located on one side of the air receiving unit 110. Here, the fan unit 200 may blow air in a second direction (d2) from one side to the other side of the air receiving unit 110. Here, the second direction (d2), which is the blowing direction of the fan unit 200, may be a direction from one side to the other side of the air receiving unit 110 based on the bottom surface of the air receiving unit 110, as shown in FIG. 1.
[0038] As a result, in the metallic foreign matter inspection device 1000 according to this embodiment, the air containing the metallic foreign matter 10 flowing inside the air receiving section 110 can move along the direction of airflow from the fan section 200.
[0039] The electrode unit 300 may be located at the bottom of the housing unit 100. More specifically, the electrode unit 300 may be located between the fan unit 200 and the metal foreign matter trapping unit 500 at the bottom of the housing unit 100. For example, the electrode unit 300 may be located on the same vertical line as the air inlet unit 150 as shown in FIG. 1. In other words, the electrode unit 300 may be located at the bottom of the housing unit 100, spaced apart from the air inlet unit 150 in the direction of gravity. However, the location of the electrode unit 300 is not limited to that shown in FIG. 1. Any location within a path along which air flowing in through the air inlet unit 150 flows in the blowing direction of the fan unit 200 may be included in this embodiment.
[0040] As a result, in the metallic foreign matter inspection device 1000 according to this embodiment, metallic foreign matter 10 contained in the air moving along the direction of gravity inside the air receiving section 110 is easily accumulated on the electrode section 300, and inspection of the metallic foreign matter accumulated on the electrode section 300 can be easily carried out.
[0041] The metallic foreign matter inspection device 1000 according to this embodiment may include a metallic foreign matter collection unit 500 located at a distance from the fan unit 200 along the air blowing direction of the fan unit 200. In other words, in the housing unit 100, the metallic foreign matter collection unit 500 may be located on the opposite side of the housing unit 100 from the side on which the fan unit 200 is located. That is, in the housing unit 100, the metallic foreign matter collection unit 500 may be located on the opposite side of the air receiving unit 110 from the side on which the fan unit 200 is located. That is, when the fan unit 200 blows air in the second direction (d2), at least some of the metallic foreign matters 10 located on the electrode unit 300 may move to the metallic foreign matter collection unit 500 along the air blowing direction of the fan unit 200.
[0042] As a result, in the metallic foreign matter inspection device 1000 of this embodiment, metallic foreign matter 10 that is being inspected for metallic foreign matter on the electrode section 300 is collected in the metallic foreign matter collection section 500 along the air flow direction of the fan section 200, preventing excessive accumulation of metallic foreign matter 10 on the electrode section 300 and making it easier to inspect the metallic foreign matter 10 that has accumulated on the electrode section 300.
[0043] The metallic foreign matter inspection device 1000 according to this embodiment may further include a magnet unit 400 located below the electrode unit 300. More specifically, the magnet unit 400 may be located below the electrode unit 300, between the electrode unit 300 and the metallic foreign matter collection unit 500. As an example, the magnet unit 400 may be located on the same vertical line as the electrode unit 300, as shown in FIG. 1 . In other words, the magnet unit 400 is located below the electrode unit 300, spaced apart from the electrode unit 300 in the direction of gravity. However, the location of the magnet unit 400 is not limited to that shown in FIG. 1 . Any location within a path along which metallic foreign matters accumulated on the electrode unit 300 flow in the direction of airflow from the fan unit 200 is included in this embodiment.
[0044] More specifically, the magnet unit 400 can fix ferrous foreign metal objects 10 containing iron (Fe) on the electrode unit 300. In contrast, the magnet unit 400 does not need to fix non-ferrous foreign metal objects 10 containing no iron (Fe) on the electrode unit 300. In other words, non-ferrous foreign metal objects 10 containing no iron (Fe) on the electrode unit 300 can be moved to the foreign metal object collection unit 500 by the air blown by the fan unit 200.
[0045] That is, the magnet unit 400 is made of a magnetic material having a magnetic force sufficient to fix ferrous metal foreign matter containing iron (Fe) onto the electrode unit 300 even when blown by the fan unit 200 .
[0046] As a result, in the metallic foreign matter inspection device 1000 of this embodiment, the metallic foreign matter 10 that is being inspected on the electrode unit 300 is fixed on the electrode unit 300 or captured in the metallic foreign matter capturing unit 500 depending on the type of metallic foreign matter 10 as the fan unit 200 begins to blow air, and the type of metallic foreign matter 10 can be easily detected on the electrode unit 300 based on whether or not the metallic foreign matter 10 contains iron (Fe).
[0047] For example, iron (Fe) foreign metal particles fixed on the electrode unit 300 can be removed by wiping the surface of the electrode unit 300 with a cloth or brush. In addition, non-ferrous foreign metal particles not containing iron (Fe) that are collected in the foreign metal particle collection unit 500 by the air blown by the fan unit 200 can be removed by replacing the foreign metal particle collection unit 500 with another foreign metal particle collection unit.
[0048] As a result, in the metallic foreign matter inspection device 1000 according to this embodiment, ferrous metallic foreign matter accumulated on the electrode unit 300 and non-ferrous metallic foreign matter collected in the metallic foreign matter collection unit 500 can be removed relatively easily in a dry state.
[0049] Referring to FIG. 2, the fan unit 200 may repeatedly start and stop blowing air at regular time intervals. More specifically, the fan unit 200 may start and stop blowing air so that a first time (t1) during which blowing is stopped and a second time (t2) during which blowing is started intersect. Here, the first time (t1) and the second time (t2) may be the same, but the time may be adjusted as needed. Furthermore, the fan unit 200 may have the same blowing strength at each second time (t2) as shown in FIG. 2, but the strength may be adjusted as needed.
[0050] The first time (t1) when the airflow is stopped may be the time when the air flowing in through the air inlet unit 150 moves into the air receiving unit 110 and the time when metallic foreign matter contained in the air accumulates on the electrode unit 300. The first time (t1) when the airflow is stopped may also include the time when information on the metallic foreign matter accumulated on the electrode unit 300 is obtained. That is, the metallic foreign matter inspection device 1000 according to this embodiment may analyze the metallic foreign matter based on the information obtained from the electrode unit 300 at the first time (t1) when the airflow of the fan unit 200 is stopped.
[0051] The second time period (t2) during which the air blowing is performed may be a time period during which some of the foreign metal particles accumulated on the electrode unit 300 are removed. In other words, the second time period (t2) during which the air blowing is performed may be a time period during which the types of foreign metal particles accumulated on the electrode unit 300 are classified. As an example, as will be described later, ferrous foreign metal particles among the foreign metal particles accumulated on the electrode unit 300 may be fixed to the electrode unit 300 for the second time period (t2), and non-ferrous foreign metal particles may be moved to the foreign metal particle collecting unit 500 for the second time period (t2).
[0052] As a result, in the metallic foreign matter inspection device 1000 according to this embodiment, the fan unit 200 does not immediately blow air into the air inlet unit 150, ensuring time for the air flowing into the air inlet unit 150 to sufficiently contact the electrode unit 300. In other words, sufficient time can be ensured to obtain information about the metallic foreign matter 10 on the electrode unit 300, further improving the inspection performance for metallic foreign matter 10 contained in the air.
[0053] In addition, in the metallic foreign matter inspection device 1000 according to this embodiment, the stopping and continuing of the air blowing is repeated at regular intervals, which has the advantage of preventing excessive accumulation of metallic foreign matter 10 on the electrode unit 300 and also enabling the type of metallic foreign matter 10 to be distinguished.
[0054] 1, the metallic foreign substance inspection device 1000 according to this embodiment may include a control unit (not shown) that can control the fan unit 200 and the electrode unit 300. Here, the control unit may include one or more of a central processing unit (CPU), random access memory (RAM), graphic processing unit (GPU), one or more microprocessors, and other electronic components that can process input data according to predetermined logic. For example, the control unit (not shown) may load the metallic foreign substance inspection process of the metallic foreign substance inspection device 1000 into RAM and perform various processes, such as controlling the airflow time, speed, and strength of the fan unit 200 according to the loaded program, and storing and analyzing metallic foreign substance information obtained by the electrode unit 300.
[0055] The analysis of metallic foreign matter through the electrode unit 300 will be described in more detail below.
[0056] FIG. 3 is a diagram showing metallic foreign matter successively accumulated in the metallic foreign matter inspection device of FIG.
[0057] 1 and 3, in the metallic foreign matter inspection device 1000 according to this embodiment, the presence or absence of metallic foreign matter and the size of the metallic foreign matter can be analyzed based on information on capacitance values over time acquired by the electrode unit 300. More specifically, air containing metallic foreign matter 10 introduced into the air inlet unit 150 moves in the direction of gravity in the air receiving unit 110, and the metallic foreign matter 10 moving in the direction of gravity within the air receiving unit 110 accumulates on the electrode unit 300. The presence or absence of metallic foreign matter and the size of the metallic foreign matter can be analyzed based on the difference in capacitance values over time during which the metallic foreign matter 10 accumulates.
[0058] The electrode unit 300 may include at least one capacitance sensor and a signal processing circuit for processing an electrical signal acquired from the capacitance sensor. Here, the capacitance sensor may be a sensor that measures capacitance by applying an AC power source between a positive electrode and a negative electrode.
[0059] For example, the capacitance sensor included in the electrode unit 300 may be a capacitance sensor with a single electrode structure including one positive electrode and one negative electrode, or as another example, the capacitance sensor included in the electrode unit 300 may be a capacitance sensor with a matrix structure including a plurality of positive electrodes and a plurality of negative electrodes.
[0060] Therefore, in the metallic foreign matter detection device 1000 according to this embodiment, if the capacitance sensor included in the electrode unit 300 has a single electrode structure, it is possible to obtain information on the sequential accumulation of capacitance values over time. Also, if the capacitance sensor included in the electrode unit 300 has a matrix structure, it is possible to obtain information on the accumulation of capacitance values according to the position where metallic foreign matters are accumulated on the electrode unit 300.
[0061] For example, as shown in Figure 3, the foreign metal material 10 may include a first foreign metal material 1, a second foreign metal material 2, and a third foreign metal material 3, each having a different size. Here, the relative sizes and order of the first foreign metal material 1, the second foreign metal material 2, and the third foreign metal material 3 are indicated by the diameters and numbers of the circles, as shown in Figure 3. That is, as shown in Figure 3, the foreign metal materials 10 are accumulated on the electrode unit 300 in the order of the first foreign metal material 1, the second foreign metal material 2, and the third foreign metal material 3, with the first foreign metal material 1, the second foreign metal material 2, and the third foreign metal material 3 having relatively larger sizes.
[0062] 4 to 6 are diagrams showing changes in capacitance values that occur as the metal foreign matter shown in Fig. 3 accumulates over time. Here, the electrode unit 300 shown in Figs. 4 to 6 includes a capacitance sensor with a single electrode structure.
[0063] More specifically, as shown in Figures 3 and 4(a), the first foreign metal substance 1 accumulates on the electrode unit 300. At this time, the electrode unit 300 can acquire information on the change in capacitance value as shown in Figure 4(b). In addition, the time when the first foreign metal substance 1 is detected can be described as t=0.
[0064] 3 and 5(a), the second metallic foreign matter 2 is accumulated on the electrode unit 300 where the first metallic foreign matter 1 is accumulated. At this time, the electrode unit 300 can obtain information on the change in capacitance value as shown in FIG. 5(b) from the result of FIG. 4(b). The time when both the first metallic foreign matter 1 and the second metallic foreign matter 2 are detected is t=1 s, which can be explained as the time when one second has elapsed since the first metallic foreign matter 1 was detected. However, this time interval is merely an example, and the change in capacitance value can be obtained at various time intervals as needed.
[0065] Comparing Figure 4(b), in which first metallic foreign matter 1 is detected, with Figure 5(b), in which first metallic foreign matter 1 and second metallic foreign matter 2 are detected, it can be seen that peaks appear at the same position but that the intensity of the peaks has changed. It can also be seen that the capacitance values of the peaks generated by first metallic foreign matter 1 and second metallic foreign matter 2 in Figure 5(b) are larger than the peak generated by first metallic foreign matter 1 in Figure 4(b). Here, by comparing the capacitance values generated at the peaks in Figure 5(b) and Figure 4(b), it is possible to see the difference in relative size between first metallic foreign matter 1 and second metallic foreign matter 2.
[0066] 3 and 6(a), the third metallic foreign matter 3 is accumulated on the electrode unit 300 where the first metallic foreign matter 1 and the second metallic foreign matter 2 are accumulated. At this time, the electrode unit 300 can obtain information on the change in capacitance value as shown in FIG. 6(b) from the result of FIG. 5(b). The time when the first metallic foreign matter 1 to the third metallic foreign matter 3 are all detected is t=2s, which can be explained as the time when one second has elapsed since the first metallic foreign matter 1 and the second metallic foreign matter 2 were detected. However, this time interval is merely an example, and changes in capacitance value can be obtained at various time intervals as needed.
[0067] Comparing FIG. 5(b), in which the first and second metallic foreign objects 1 and 2 are detected, with FIG. 6(b), in which the first through third metallic foreign objects 1 through 3 are detected, it can be seen that the intensity of the peaks increases as the first, second, and third metallic foreign objects 1, 2, and 3 are accumulated. Furthermore, by comparing the capacitance value of the peaks generated by the first and second metallic foreign objects 1 and 2 in FIG. 5(b) with the capacitance value of the peak generated by the third metallic foreign object 3 in FIG. 6(b), it can be seen that the size of the third metallic foreign object 3 is a difference in the relative sizes of the first and second metallic foreign objects 1 and 2.
[0068] As a result, the metallic foreign body inspection device 1000 of this embodiment can determine the presence or absence of metallic foreign bodies 10, the order of entry, and the relative size differences of metallic foreign bodies 10 while the metallic foreign bodies 10 are fixed to the electrode unit 300 by comparing the magnitude and peak positions of the capacitance values accumulated over time in the electrode unit 300, thereby further improving the accuracy of inspection performance for metallic foreign bodies.
[0069] 7 to 9 are diagrams showing changes in capacitance values caused by the sequential accumulation of metallic foreign matter according to position in Fig. 3. Here, the electrode unit 300a in Fig. 7 includes a matrix-structured capacitance sensor, unlike the electrode unit 300 in Figs. 4 to 6.
[0070] The contents are substantially the same as those explained with reference to FIGS. 4 to 6, but only the contents that are different due to the inclusion of electrode section 300a, which is not electrode section 300 in FIGS. 4 to 6, will be described below.
[0071] 3 and 7(a), the first foreign metal substance 1 accumulates on the electrode unit 300a. At this time, the electrode unit 300a can acquire information on the change in capacitance value as shown in Fig. 7(b). In addition, the time when the first foreign metal substance 1 is detected can be described as t=0.
[0072] 3 and 8(a), the second metallic foreign matter 2 accumulates on the electrode unit 300a where the first metallic foreign matter 1 accumulates. At this time, the electrode unit 300a can obtain information on the change in capacitance value as shown in FIG. 8(b) from the result of FIG. 7(b). The time when the first metallic foreign matter 1 and the second metallic foreign matter 2 are detected is t=1 s, which can be explained as the time when one second has elapsed since the first metallic foreign matter 1 was detected. However, this time interval is merely an example, and the change in capacitance value can be obtained at various time intervals as needed.
[0073] Here, when comparing (b) of Figure 7, in which the first foreign metal substance 1 is detected, with (b) of Figure 8, in which the first foreign metal substance 1 and the second foreign metal substance 2 are detected, it can be seen that the peaks occur at different positions, and therefore it can be confirmed that the first foreign metal substance 1 and the second foreign metal substance 2 are accumulated at different positions on the electrode part 300a.
[0074] In addition, since the capacitance value of the peak where the second foreign metal object 2 is located is relatively larger than the capacitance value of the peak where the first foreign metal object 1 is located, it can be determined that the size of the second foreign metal object 2 is larger than the first foreign metal object 1. In other words, the difference in the relative sizes of the foreign metal objects 10 can be determined by comparing the capacitance values sensed by the electrode unit 300a.
[0075] 3 and 9(a), the third metallic foreign matter 3 is accumulated on the electrode unit 300a where the first metallic foreign matter 1 and the second metallic foreign matter 2 are accumulated. At this time, the electrode unit 300a can obtain information on the change in the capacitance value as shown in FIG. 9(b) from the result of FIG. 8(b).
[0076] 8(b), in which the first and second metallic foreign matter 1 and 2 are detected, is compared with FIG. 9(b), in which the first to third metallic foreign matter 1 and 3 are detected, and it can be seen that the intensity of the peak where the first metallic foreign matter 1 is located is stronger. In other words, it can be seen that the third metallic foreign matter 3 and the first metallic foreign matter 1 are accumulated in the same position on the electrode unit 300a.
[0077] Furthermore, by comparing the capacitance value of the peaks generated by the first and second metallic foreign objects 1 and 2 in FIG. 8(b) with the capacitance value of the peak generated by the third metallic foreign object 3 in FIG. 9(b), it can be seen that the size of the third metallic foreign object 3 is larger than that of the first metallic foreign object 1. In addition, by comparing the capacitance value that increases relatively as the third metallic foreign object 3 accumulates in the same position as the first metallic foreign object 1 with the capacitance value of the peak generated by the second metallic foreign object, it is possible to see the difference in relative size between the second metallic foreign object 2 and the third metallic foreign object 3.
[0078] As a result, the metallic foreign body inspection device 1000 of this embodiment can confirm the presence or absence of metallic foreign body 10, its cumulative position, and the difference in relative size of metallic foreign body 10 while metallic foreign body 10 is fixed to electrode section 300a, through a comparison of the magnitude of the capacitance value obtained according to the cumulative position at electrode section 300a and the position of the peak, thereby further improving the accuracy of inspection performance for metallic foreign bodies.
[0079] FIG. 10 is a diagram showing that some of the metallic foreign matter in FIG. 3 is moved by the air blown by the fan unit.
[0080] 10, after an inspection is performed for the presence and size of foreign metal objects on the electrode unit 300 as shown in FIGS. 4 to 6 or the electrode unit 300a as shown in FIGS. 7 to 9, air is blown from the fan unit 200. For example, as shown in FIG. 8, the first foreign metal object 1 and the second foreign metal object 2 can be fixed on the electrode unit 300 even when the fan unit 200 blows air, and the third foreign metal object 3 can be moved to the foreign metal object collecting unit 500. In other words, the first foreign metal object 1 and the second foreign metal object 2 can be determined to be ferrous foreign metal objects containing iron (Fe), and the third foreign metal object 3 can be determined to be a non-ferrous foreign metal object not containing iron (Fe).
[0081] As a result, the metallic foreign body inspection device 1000 of this embodiment has the advantage that, as shown in Figure 8, it is possible to not only determine the presence or absence of metallic foreign body 10, but also distinguish the type of metallic foreign body based on whether or not metallic foreign body 10 is contained, and therefore, it is possible to additionally understand the cause of the occurrence of metallic foreign body 10.
[0082] FIG. 11 is a diagram showing a metallic foreign matter inspection method according to another embodiment of the present invention.
[0083] 1 and 11, a metallic foreign substance inspection method according to another embodiment of the present invention is a method using the above-described metallic foreign substance inspection device 1000, and includes an air inflow step (S100) in which air containing metallic foreign substances is introduced into the housing unit 100; a metallic foreign substance information acquisition step (S200) in which metallic foreign substances 10 contained in the air introduced into the housing unit 100 come into contact with the electrode unit 300 and information on the metallic foreign substances 10 is acquired; a metallic foreign substance analysis step (S300) in which the presence or absence of metallic foreign substances and the size of the metallic foreign substances are analyzed based on information on capacitance values over time acquired by the electrode unit 300; and a metallic foreign substance movement step (S400) in which the fan unit 200 blows air in one direction toward the metallic foreign substances 10 located on the electrode unit 300. Here, the housing part 100 includes an air receiving part 110 in which air containing metal foreign matter 10 is accommodated, and an air inlet part 150 located at the top of the housing part 100, the electrode part 300 is located at the bottom of the housing part 100, and the fan part 200 can be located on one side of the housing part 100.
[0084] As described above in Figures 1 to 10, in the metallic foreign body inspection method according to this embodiment, the metallic foreign body 10 moves from the air inlet section 150 in the direction of gravity, and the metallic foreign body 10 that has moved in the direction of gravity is accumulated on the electrode section 300, and the metallic foreign body analysis step (S300) can analyze the size of the metallic foreign body 10 based on the difference in capacitance value over the time the metallic foreign body 10 is accumulated.
[0085] In the metallic foreign body inspection method according to this embodiment, in the metallic foreign body moving step (S400), the fan unit 200 repeatedly starts and stops blowing air at regular time intervals, and the metallic foreign body information acquisition step (S200) and the metallic foreign body analysis step (S300) can be performed with the fan unit 200 stopping blowing air.
[0086] The metallic foreign matter inspection method according to this embodiment further includes a magnet unit 400 located below the electrode unit 300, and among the metallic foreign matters located on the electrode unit 300, ferrous metallic foreign matters containing iron (Fe) are fixed on the electrode unit 300 by the magnetic force of the magnet unit 400, and the ferrous metallic foreign matters may be fixed on the electrode unit 300 after the metallic foreign matter moving step (S400).
[0087] The metallic foreign matter inspection method according to this embodiment further includes a metallic foreign matter collection step (S500) in which at least a portion of the metallic foreign matter 10 located on the electrode unit 300 moves along the airflow direction of the fan unit 200 and is collected in the metallic foreign matter collection unit 500. The metallic foreign matter collection unit 500 may be located apart from the fan unit 200 along the airflow direction of the fan unit 200 and may be located on the opposite side of the housing unit 100 from the side on which the fan unit 200 is located.
[0088] As a result, the metallic foreign substance inspection method according to this embodiment can compare the magnitude of the capacitance value accumulated over time included in the metallic foreign substance information in the metallic foreign substance analysis step (S300) based on the metallic foreign substance information acquired by the electrode unit 300 in the metallic foreign substance information acquisition step (S200). At this time, the metallic foreign substance information is acquired while the metallic foreign substance 10 is fixed to the electrode unit 300, and the metallic foreign substance analysis step (S300) can more accurately analyze the presence or absence of the metallic foreign substance 10 and the difference in the relative size of the metallic foreign substance 10.
[0089] In addition, in the metallic foreign matter inspection method according to this embodiment, whether or not the metallic foreign matter 10 moves in the airflow direction of the fan unit 200 in the metallic foreign matter movement step (S400) depends on whether or not the metallic foreign matter 10 contains iron, and the type of metallic foreign matter can be determined based on this. In other words, there is an advantage in that the cause of the metallic foreign matter 10 can also be determined based on the type of metallic foreign matter 10 confirmed by the metallic foreign matter inspection device 1000.
[0090] Although the preferred embodiments of the present invention have been described in detail above, the scope of the present invention is not limited to these, and various modifications and improvements made by those skilled in the art using the basic concept of the present invention defined in the following claims also fall within the scope of the present invention.
Claims
1. a housing portion into which air containing metal foreign matter flows; an electrode unit that comes into contact with the metallic foreign matter contained in the air that has flowed into the housing unit and that acquires information about the metallic foreign matter; and a fan unit configured to blow air in one direction toward the metal foreign object located on the electrode unit; the housing includes an air receiving portion that receives air containing the metal foreign matter, and an air inlet portion located at an upper portion of the housing, The electrode unit is located at a lower portion of the housing unit, and the fan unit is located at one side of the housing unit.
2. 2. The metallic foreign matter inspection device of claim 1, wherein the presence or absence of the metallic foreign matter and the size of the metallic foreign matter are analyzed based on information on capacitance values according to time acquired by the electrode unit.
3. The air containing the metal foreign matter that has flowed into the air inlet portion moves in the direction of gravity in the air receiving portion, the metallic foreign matter moving in the direction of gravity within the air receiving portion is accumulated on the electrode portion, 3. The metallic foreign matter inspection device according to claim 2, wherein the presence or absence of the metallic foreign matter and the size of the metallic foreign matter are analyzed based on the difference in capacitance value over time during which the metallic foreign matter is accumulated.
4. The fan unit repeatedly starts and stops blowing air at regular intervals, The metallic foreign matter inspection device according to claim 1, wherein analysis is performed based on information acquired from the electrode unit while the fan unit is stopped from blowing air.
5. the fan unit further includes a metal foreign matter collecting unit located at a distance from the fan unit along the airflow direction of the fan unit and on a side of the housing unit opposite to the side where the fan unit is located, 5. The metallic foreign matter inspection device according to claim 1, wherein at least some of the metallic foreign matter located on the electrode portion moves to the metallic foreign matter collection portion along the airflow direction of the fan portion.
6. The magnet portion is located below the electrode portion.
6. The metallic foreign matter inspection device according to claim 5, wherein ferrous metallic foreign matter containing iron (Fe) among the metallic foreign matter located on the electrode portion is fixed to the electrode portion by the magnetic force of the magnet portion.
7. 7. The metallic foreign matter inspection device according to claim 6, wherein the ferrous metallic foreign matter fixed on the electrode portion is removed with a cloth or brush that wipes the surface of the electrode portion.
8. 7. The metallic foreign matter inspection device according to claim 6, wherein non-ferrous metallic foreign matter that does not contain iron (Fe) among the metallic foreign matter located on the electrode portion is moved to the metallic foreign matter collection portion by the air blown by the fan portion.
9. 9. The metallic foreign matter inspection device according to claim 8, wherein the non-ferrous metallic foreign matter trapped in the metallic foreign matter trapping unit is removed by replacing the metallic foreign matter trapping unit with another metallic foreign matter trapping unit.
10. an air inlet step of injecting air containing metal foreign matter into the housing; a metallic foreign matter information acquisition step in which the metallic foreign matter contained in the air flowing into the housing comes into contact with an electrode unit and information on the metallic foreign matter is acquired; and a metallic foreign object moving step in which a fan unit blows air in one direction toward the metallic foreign object located on the electrode unit, the housing includes an air receiving portion that receives air containing the metal foreign matter, and an air inlet portion located at an upper portion of the housing, The electrode unit is located at a lower portion of the housing unit, and the fan unit is located at one side of the housing unit.
11. The method of claim 10, further comprising a metallic foreign matter analysis step of analyzing the presence or absence of the metallic foreign matter and the size of the metallic foreign matter based on information on capacitance values according to time acquired by the electrode unit.
12. the metallic foreign matter moves from the air inlet portion along the direction of gravity, and the metallic foreign matter that has moved along the direction of gravity is accumulated on the electrode portion, 12. The metallic foreign matter inspection method according to claim 11, wherein the metallic foreign matter analyzing step analyzes the size of the metallic foreign matter based on a difference in capacitance value over time during which the metallic foreign matter is accumulated.
13. In the metallic foreign matter moving step, the fan unit repeatedly starts and stops blowing air at regular time intervals; 12. The metallic foreign matter inspection method according to claim 11, wherein the metallic foreign matter information acquisition step and the metallic foreign matter analysis step are performed in a state where the air blowing by the fan unit is stopped.
14. The method further includes a magnet portion located below the electrode portion, and ferrous metal foreign matter containing iron (Fe) among the metal foreign matter located on the electrode portion is fixed on the electrode portion by a magnetic force of the magnet portion, The metallic foreign matter inspection method according to claim 10, wherein the ferrous metallic foreign matter is fixed on the electrode portion after the metallic foreign matter moving step.
15. The method further includes a metal foreign matter collecting step in which at least some of the metal foreign matters located on the electrode unit move along the airflow direction of the fan unit and are collected in a metal foreign matter collecting unit, 15. The metallic foreign matter inspection method according to claim 10, wherein the metallic foreign matter collection unit is located at a distance from the fan unit along the airflow direction of the fan unit and on a side of the housing unit opposite to the side on which the fan unit is located.