Two LED and open port calibration combination

Abstract

A method for calibrating a detection device 110 is disclosed, the method comprising the following steps: I. illuminating at least one detector element (112) via at least one first optical path (128) to obtain at least one first detector signal S1, wherein the first optical path (128) is configured such that light emitted from the at least one light source (124) propagates to the detector element (112) without passing through at least one sample interface (126); II. With no sample applied to the sample interface (126), illuminate the detector element (112) via at least the second optical path (130) without any light, thereby generating at least one open-port detector signal S. 2;open wherein the second optical path (130) is configured such that light emitted from the light source (124) passes through the sample interface (126) at least once and propagates to the detector element (112); and III. First detector signal S1, open port detector signal S 2;open , and determining at least one item of operational calibration information using at least one item of factory calibration information, the item of factory information being a signal that indicates an open port detector signal S 2;open and a predetermined relationship between the reference signal of the second optical path (130).

Description

[Technical Field]

[0001] The present invention relates to a method for calibrating a detection device, a method for determining at least one calibrated optical property of at least one sample, and a detection device. The present invention also relates to a computer program and a computer-readable storage medium for carrying out these methods. Such methods and devices can generally be used for research and / or monitoring purposes in the infrared spectral region, particularly in the near-infrared and mid-infrared spectral regions. However, further applications, such as in the visible spectral region, are also possible. [Background technology]

[0002] Generally, detection devices are known that collect optical information from a sample, such as spectral detection devices that collect information about the spectral composition of light from a sample as it is irradiated, reflected, and / or absorbed with light. To be able to compare spectra from multiple spectral detection devices, the spectral detection devices must be calibrated, for example, using known calibration standards.

[0003] During operation of such detection devices, particularly spectral detection devices such as diffuse reflectance spectral detection devices, transmittance spectral detection devices, and / or hyperspectral detection devices, recalibration of the detection device may be required from time to time to eliminate drift in the optical and / or optoelectronic components. Detection devices may have, among other things, detectors, electronics such as analog front ends for digitizing analog detector signals, and / or power management equipment, which are typically unstable to changes in operating conditions, such as changes in temperature and / or humidity. Similarly, radiation sources, such as infrared radiation sources, may degrade over time and / or use and may also depend on ambient and / or operating conditions. Such drift may be caused by various internal and / or external physical changes, including, but not limited to, degradation of the light source and / or detector, temperature drift of the light source and / or detector, changes in ambient temperature, temperature changes in the device, temperature changes in electronics such as the detector and / or readout circuitry, mechanical expansion and / or contraction of mechanical components such as mechanical housings and / or holders, and mechanical expansion and / or contraction of optical components such as bandpass filters, dispersive elements, e.g., prisms, diffraction gratings, etc. If these drifts are not corrected from time to time by calibration, they can distort the measurement data and results obtained with an uncalibrated detection device will be inconclusive.

[0004] Furthermore, the detector of the detection device may exhibit hysteresis, which can be corrected by using a temperature stabilization unit. For example, the detector of the detection device may be cooled using a thermoelectric cooler to reduce the drift of the detector signal due to changes in operating temperature or changes in the inherent characteristics of the detector, thereby reducing the hysteresis. However, detection devices equipped with such temperature stabilization units are generally bulky, complex, and expensive.

[0005] Therefore, known detection devices typically must be frequently recalibrated using known reference standards to eliminate drift and / or hysteresis effects. Known calibration processes for spectral detection devices may include occasionally calibrating the spectral detection device with known external calibration standards for the wavelength-dependent sensitivity of the detector before measuring a sample. However, the use of known external calibration standards may generally be impractical for handheld devices and may require user involvement during a complex configuration process, resulting in a degraded user experience.

[0006] Furthermore, even individual detectors of the same type may exhibit deviations in terms of characteristics such as temperature coefficient of resistance, responsivity, and / or detectability due to manufacturing tolerances. Therefore, it may not be feasible to use designated "reference" detectors, and specifically, to use signals from these reference detectors to correct and / or calibrate the remaining detectors that measure light coming from the sample. A reference detector may refer to a detector that does not receive radiation from the sample, and therefore, its signal may not depend on the presence or absence of a sample.

[0007] Known calibration processes may require a light-dark calibration. Different types of calibration measurements may be performed, requiring either an external calibration standard, such as a predefined reflectance target, and / or an empty radiation path in front of the detector to ensure that reflected radiation does not reach the detector. Dark calibration can recalibrate "dark current," "dark noise," and / or "dark resistance." A calibration target may not be required to perform a dark calibration. Dark calibration may involve preventing the detector from being illuminated by turning off the light source and / or blocking the light path between the light source and the detector. Light calibration may involve calibrating the wavelength-dependent sensitivity of a photosensitive detector. In particular, for reflectance spectroscopy, calibration can be performed using an external calibration standard with a predefined reflectance spectrum to ensure a known and reproducible calibration signal. The external calibration standard can be placed in the detector's radiation path, similar to a spectral measurement of a sample. However, in such configurations, the user is responsible for positioning the external calibration standard and / or removing any objects within the detection range of the detection device.

[0008] Methods and devices are known that overcome the need for external calibration standards for the calibration process. For example, the calibration process may involve correcting for the responsivity drift of a single component, such as a detector in a sensing device. This can be done in a self-referencing manner, where the detector's environmental sensitivity characteristics are measured and then used to correct the detector's responsivity. However, correcting for the drift of a sensing device can be technically challenging with this approach due to the systematic effects of combining all the components in a single sensing device, as well as environmental dependencies.

[0009] As another example, the calibration process may involve using a built-in reference and measuring the reflection of light from the built-in reference in the absence of a sample, also known as an "open-port measurement." This measurement can be used to calculate fixed coefficients during factory calibration by comparing the open-port measurements with measurements from external calibration standards. Calibration is typically performed under the assumption that the calibration coefficients are constant and stable over time throughout the lifecycle of the detection device. Under this assumption, the reference value can be analytically determined using the open-port measurements. This calibration scheme generally requires open-port measurements before and / or after a sample measurement. Each measurement may generate heat due to active components such as the lamp driver, light source, and analog-to-digital converter. After each measurement, the heat is dissipated back into the detection device, potentially resulting in temperature changes in further components such as the detector. Therefore, it can generally be technically challenging to ensure the same operating conditions for all components of the detection device when performing open-port and sample measurements. This technical challenge may be overcome by performing open-port measurements before and after the sample measurement and linearly fitting the results before and after the measurement to approximate the reference signal. However, this method can introduce additional uncertainty due to the potentially nonlinear thermal response of the detector. Furthermore, a drawback of this calibration scheme may arise due to the fact that mishandling of the detector during field use can disrupt the open-port measurement. For example, disruptions can occur when part of the measurement port is covered with undefined sample. Such disruptions further increase the measurement uncertainty of the calibration coefficient.

[0010] As another example, the calibration process may involve using at least two optical paths, where the first optical path may be independent of the presence or absence of a sample, while the detector signal of the second optical path may depend on the presence or absence of a sample. The signals of the first and second optical paths can be distinguished by either time multiplexing or frequency multiplexing. In the case of frequency multiplexing, both optical paths illuminate the detector simultaneously but with different modulation frequencies. Therefore, in this case, thermal changes affecting components of the detection system, such as the detector, light source, and readout electronics, may be identical. Thermal drift can be compensated for by normalizing the detector signal via the second optical path to the first optical path. In this approach, the open port and reference signal of the second optical path may depend on the signal of the first optical path. Calibration typically assumes that the calibration coefficients are independent of ambient and operating conditions. However, this assumption is generally valid only if the illumination through both optical paths remains constant and / or the drift is identical for both optical paths. To achieve this calibration scheme, two light sources operating at different frequencies for the first and second optical paths may be used. However, manufacturing tolerances of the light source can affect the calibration. Similarly, manufacturing other components of the detection device, such as semiconductor chips, fluorescent coatings of LEDs, filaments of incandescent lamps, and / or other light sources, with low manufacturing tolerances can require high efforts in manufacturing precision. Manufacturing tolerances can generally lead to deviations in the temperature coefficients of the light source's electrical and / or optical properties. Deviations can be minimized by using light sources with similar temperature coefficients, so that deviations are generally not observed with small temperature changes of a few Kelvin. However, as the temperature difference between the factory calibration and the sample measurement becomes larger, for example, a temperature difference of 10 K or more, manufacturing tolerances can become significant. The assumption that the calibration coefficient is constant can generally be inaccurate. Furthermore, aging, which affects both light sources differently, can make the assumption of a constant calibration coefficient inaccurate. Summary of the Invention [Problem to be solved by the invention]

[0011] It is therefore desirable to provide a method and apparatus that at least partially addresses the above-mentioned technical problems and at least substantially avoids the shortcomings of known methods and apparatus. In particular, it is an object of the present invention to provide a method and apparatus that provides user-friendly and accurate calibration of a detection device. [Means for solving the problem]

[0012] This problem is solved by a method for calibrating a detection device, a method for determining at least one calibrated optical property of at least one sample, and a detection device having the features of the independent claims. The problem is further addressed by a computer program and a computer-readable storage medium for carrying out said method. Advantageous embodiments, which may be realized independently or in any combination, are set out in the dependent claims and in the entire specification.

[0013] In a first aspect of the present invention, a method for calibrating a detection device is disclosed.

[0014] The term "detection device" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. Specifically, the term may refer to, but is not limited to, an optical device configured to acquire at least one item of optical information about at least one sample. For example, the detection device may be an optical device configured to determine and / or detect a sample, such as a 3D detector. For example, the detection device may be an optical device configured to acquire at least one item of spectral information about a sample. Specifically, the at least one item of spectral information may refer to at least one optical or optically measurable property determined as a function of wavelength for one or more different wavelengths. More specifically, the optical or optically measurable property, as well as the at least one item of spectral information, may relate to at least one property that characterizes at least one of the transmission, absorption, reflection, and emission of the sample by itself or after illumination with external light. The at least one optical property may be determined for one or more wavelengths. The detection device may in particular form a device capable of recording the signal intensity with respect to a corresponding wavelength or wavelength interval of the spectrum or a division thereof, which may in particular be provided as an electrical signal that can be used for further evaluation.

[0015] The detection device comprises the following components:

[0016] a. at least one detector element configured to generate at least one detector signal in response to illumination of the detector element by incident light; b. at least one light source configured to emit light in at least one optical spectral range; c. at least one sample interface configured to allow light from a light source to illuminate at least one sample, and configured to allow light from the sample to propagate, particularly via at least one wavelength-selective element, to a detector element; d. at least one first optical path, the first optical path being configured for light emitted from the light source to propagate, particularly via a wavelength-selective element, to a detector element without passing through a sample interface; and e. At least one second optical path, wherein the second optical path is configured such that light emitted from the light source propagates to the detector element by passing through the sample interface at least once, particularly via a wavelength-selective element.

[0017] The term "detector element" as used herein is a broad term and is to be given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. The term may refer, without limitation, to any device or combination of devices capable of recording and / or monitoring incident light. The detector element may be responsive to incident light and configured to generate an electrical signal indicative of the intensity of the incident light. For example, the detector element may include at least one photosensitive element having at least one photosensitive region configured to record an optical response by generating at least one output signal dependent on the intensity of the incident light incident on the photosensitive region. The detector element may be sensitive to one or more of the visible spectral range, the ultraviolet spectral range, or the infrared spectral range, particularly the near-infrared spectral range (NIR). The detector element may specifically include at least one optical sensor, such as an optical semiconductor sensor. As an example, specifically when the detector element has sensitivity in the infrared spectral range, e.g., the near-infrared spectral range, the semiconductor sensor may be or may include at least one semiconductor sensor made of at least one material selected from the group consisting of Si, PbS, PbSe, InGaAs, and extended InGaAs. As an example, the detector element may include at least one photodetector, such as at least one CCD or CMOS device. Specifically, the detector element may include at least one detector array made of a plurality of pixelated sensors, each configured to detect at least a portion of the incident light. Alternatively or additionally, the detector element may include a single photosensitive element responsive in a wide spectral range, such as one or more of the visible spectral range, the ultraviolet spectral range, and the infrared spectral range.

[0018] The term "detector signal" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. This term may specifically, but not exclusively, refer to a signal generated by at least one detector, specifically an electrical signal of a detector element, and more specifically, at least one output signal of a photosensitive element. The at least one detector signal may be an analog signal and / or a digital signal. The detector element, specifically the individual photosensitive element, may have an active pixel sensor adapted to amplify the output signal before providing it to an internal or external evaluation unit as a detector signal. For this purpose, the detector element, specifically the photosensitive element, may have one or more signal processing devices, such as one or more filters and / or analog-to-digital converters, for processing and / or preprocessing the electronic signal.

[0019] The term "illumination," as used herein, is a broad term and is given its ordinary and customary meaning to those skilled in the art, without any special or customized meaning. This term can specifically refer, without limitation, to the amount or intensity of light incident on an area, specifically the photosensitive area of ​​a detector element. The term "light," as used herein, is a broad term and is given its ordinary and customary meaning to those skilled in the art, without any special or customized meaning. This term specifically, but without limitation, can refer to the division of electromagnetic radiation typically referred to as the "optical spectral range," including one or more of the visible, ultraviolet, and infrared spectral ranges. The term "ultraviolet spectral range" or "UV" can generally refer to electromagnetic radiation having wavelengths between 1 nm and 380 nm, preferably between 100 nm and 380 nm. The term "visible spectral range" can generally refer to wavelengths between 380 nm and 760 nm. The term "infrared spectral range" or "IR" may generally refer to wavelengths between 760 nm and 1000 μm, with wavelengths between 760 nm and 3 μm sometimes commonly referred to as the "near-infrared spectral range" or "NIR," wavelengths between 3 μm and 15 μm commonly referred to as the "mid-infrared spectral range" or "MidIR," and wavelengths between 15 μm and 1000 μm commonly referred to as the "far-infrared spectral range" or "FIR."

[0020] The detection device may further include at least one wavelength-selective element configured to transmit incident light within at least one selected wavelength range onto the detector element. As used herein, the term "wavelength-selective element" is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. The term may refer to, but is not limited to, any element or combination of elements suitable for one or more of transmitting, reflecting, deflecting, or scattering light in a wavelength-dependent manner. The wavelength-selective element may be specifically configured for wavelength-dependent transmission by spatially separating incident light having different wavelengths. For example, the wavelength-selective element may be configured to separate the incident light into a spectrum of constituent wavelength components and transmit wavelength components within a selected wavelength range onto the detector element. The wavelength-dependent transmission, reflection, deflection, or scattering of the incident light at the wavelength-selective element may result in spatial separation of the incident light. Alternatively or additionally, the wavelength-selective element may be configured for wavelength-dependent transmission by reducing the intensity of light having wavelengths outside the selected wavelength range, such as by using a filter element, particularly a narrow band-pass filter. The wavelength-selective element can be selected from the group consisting of a prism, a diffraction grating, a linear variable filter, an optical filter, particularly a narrow bandpass filter, a patterned filter, a butcher's block filter, a hyperspectral filter, a Fabry-Perot filter, a tunable microelectromechanical (MEMS) filter, particularly a MEMS Fabry-Perot filter, an interferometer, particularly a Michelson interferometer, a tunable MEMS Michelson interferometer, a metamaterial-based diffraction grating, a metamaterial-based filter, an absorption filter, and a filter foil. Alternatively or additionally, the wavelength-selective element can be incorporated into a detector element, such as a detector element sensitive to a specific wavelength range. For example, a detector element sensitive to a specific wavelength range can provide a combination of the detector element and the wavelength-selective element. The detector element may, by way of example, include at least one quantum dot sensor and / or at least one organic photodiode.

[0021] As used herein, the term "selected wavelength range" is a broad term and is given its ordinary and customary meaning to those skilled in the art, and is not intended to be limited to any particular or customized meaning. Specifically, the term can refer, without limitation, to the range of wavelengths of light that are transmitted, reflected, deflected, or scattered by a wavelength-selective element onto a detector element.

[0022] The term "light source" as used herein is a broad term and is to be given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. This term specifically refers, without limitation, to any device configured to emit light in one or more of the optical spectral ranges, i.e., the visible spectral range, the infrared spectral range, and the ultraviolet spectral range. Specifically, the light source may be configured to emit light in the infrared spectral range, e.g., light having a wavelength of 760 nm-100 μm, or more specifically, light in the near-infrared spectral range, e.g., light having a wavelength of 760 nm-3 μm. The light source may also be configured to simultaneously emit light having different wavelengths; for example, the light source may be configured to emit white light. By way of example, the light source may be or may include at least one light-emitting diode (LED). However, other options, such as thermal radiators, e.g., incandescent lamps, thermal infrared radiators, and blackbody radiators, are also feasible. Alternatively or additionally, the light source may include one or more monochromatic light sources, each configured to emit monochromatic light in one or more of the visible, infrared, and ultraviolet spectral ranges.

[0023] The term "sample interface," as used herein, is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. This term may refer, without limitation, to a port of a detection device, specifically a spectrometer device, through which light of an optical spectral range, such as at least one partition of the optical spectral range or the entire optical spectral range, may enter the detection device, specifically for the purpose of spectral detection, and / or exit the detection device, e.g., for the purpose of illuminating at least one sample. By way of example, the sample interface may define an optical surface of the detection device, e.g., a physical or imaginary plane, through which light from a second optical path may travel to reach the sample and / or through which reflected light from the sample may travel to reach a detector, e.g., to generate a second detector signal, as described in further detail below. The sample interface may or may not be constituted by a physical element and / or barrier, such as a transparent element such as a glass window or quartz window. The sample interface may also be the sample surface itself or a flat surface on which the sample can be placed or aligned. By way of example, the sample interface may be or may include at least one element made of at least one transparent material that is at least partially transparent in an optical spectral range, such as at least a portion or the entire optical spectral range. The sample interface may be configured to transmit light in the optical spectral range. The sample interface may be positioned in the optical path of the detection device, specifically the second optical path, so that light emitted from the light source can illuminate a sample positioned in front of the detection device, specifically the sample interface. By way of example, the transparent material may include one or more of glass materials such as silica, soda lime, borosilicate, etc., and / or polymeric materials such as polymethyl methacrylate, polystyrene, etc.

[0024] The term "sample" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art, and should not be limited to any special or customized meaning. This term can specifically refer to any object or element, selected from biological or non-biological objects, that has at least one optical property, the determination of which is preferably of interest to a user when using a detection device. The sample may be suitable for interfacing with a detection device, particularly a sample interface.

[0025] As outlined above, a detection device has at least one first optical path and at least one second optical path. The term "optical path" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. This term may refer to, but is not limited to, the trajectory of light in the detection device. The optical path of light in the detection device may be affected by reflection, refraction, dispersion, and / or absorption in one or more optical elements, such as lenses, prisms, mirrors, and diffraction gratings, that comprise the detection device. The terms "first" and "second," as generally used herein, are used for nomenclature purposes only and do not imply any ranking or numbering.

[0026] The term "first optical path" as used herein is a broad term and is given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. This term may refer to, but is not limited to, an optical path without sample interaction. Specifically, the detector signal obtained through the first optical path may not be affected by the presence and / or absence of a sample in the detection device. For example, a detector signal obtained through the first optical path in which a sample is applied to the detection device may be equal to a detector signal obtained through the first optical path in which no sample is applied to the detection device, assuming certain environmental conditions. In particular, as outlined above, the first optical path is configured such that light emitted from the light source propagates to the detector element, specifically through the wavelength-selective element, without passing through a sample interface, specifically without being reflected by the sample. For example, through the first optical path, light emitted from the light source can pass to the wavelength-selective element and then to the detector element without interacting with the sample. The first optical path may be located entirely within the detection device, such as within the housing of the detection device. The light following the first optical path may be emitted by a light source and directed directly or indirectly, such as by reflection, refraction, and / or dispersion, to a detector element, particularly a wavelength-selective element, and then to the detector element. As an example, the first optical path may comprise a fiber-coupled optical path that conveys light from the light source to the detector element. The detector element may be configured to generate at least one detector signal in response to illumination by incident light via the first optical path.

[0027] The term "second optical path" as used herein is a broad term and is given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. This term may specifically refer to, but is not limited to, an optical path involving sample interaction. Specifically, a detector signal obtained via the second optical path may be affected by the presence and / or absence of a sample in the detection device. For example, a detector signal obtained via the second optical path with a sample applied to the detection device may differ from a detector signal obtained via the second optical path with no sample applied to the detection device, specifically, regardless of certain environmental conditions. In particular, the second optical path is configured to allow light emitted from the light source to propagate to the detector element by passing through the sample interface at least once, specifically via a wavelength-selective element. For example, the second optical path may allow light emitted from the light source to propagate to the sample interface and then to the detector element via the wavelength-selective element. Through the second optical path, the light emitted from the light source may be guided directly or indirectly to the sample interface, for example, by reflection, refraction, and / or dispersion. The second optical path may be located partially outside the detection device, for example, outside the housing of the detection device. Specifically, the light in the second optical path may exit the detection device, particularly the housing of the detection device, and illuminate a sample located outside the detection device at the sample interface. The second optical path may be configured to couple light reflected from the sample back into the detection device. The light reflected at the sample interface may be guided directly or indirectly to a detector element, specifically a wavelength-selective element and subsequent detector elements, for example, by reflection, refraction, and / or dispersion. Reflection at the sample interface may include diffuse reflection. Specifically, the light in the second optical path that illuminates the wavelength-selective element and subsequently the detector element may be diffusely reflected light. The detector element may be configured to generate at least one detector signal in response to illumination by incident light through the second optical path.

[0028] One or more of the first and second optical paths may include at least one built-in reference target. The built-in reference target may completely cover the first optical path for determining the first detector signal, such as by having a first light source in the first optical path, and the second optical path may be only partially covered by the built-in reference target. Thus, a portion of the light from the light source in the second optical path may pass through the sample interface, and another portion of the light may be reflected to the detector element for determining the open-port detector signal. Alternatively or additionally, the built-in reference target may be split into two built-in reference targets in each of the first and second optical paths.

[0029] The present method is a method for calibrating a detection device. As used herein, the term "calibrate," also referred to as "calibration," is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. Specifically, the term may refer to, but is not limited to, at least one of the processes of determining, correcting, adjusting, and compensating for measurement inaccuracies in a detection device. Calibration may include determining at least one item of calibration information. The item of calibration information may include at least one item of information related to the results of the calibration, such as a calibration function, a calibration coefficient, or a calibration matrix. The item of calibration information can be used to convert one or more measurements into one or more calibrated or "true" values. The measurement inaccuracies may result from, by way of example, uncertainty in wavelength determination and / or inherent and / or extrinsic interference with the measurement signal of the detection device. Calibration of the detection device may include at least one of wavelength calibration, stray light calibration, and dark current calibration. Calibration may include at least one two-stage process, where in a first stage, information regarding deviations of a measurement signal of a detection device from a known standard is determined, and in a second stage, this information is used to correct and / or adjust the measurement signal of the detection device to reduce, minimize, and / or eliminate the deviations. Calibration may include applying at least one item of calibration information to, for example, the measurement signal and / or measurement spectrum of the detection device. Calibration of a detection device can improve and / or maintain the accuracy of measurements performed using the calibrated detection device.

[0030] The method includes, by way of example, the following steps, which may be performed in a predetermined order. However, it should be noted that different orders are possible. Furthermore, one, more than one, or all of the method steps may be performed once or repeatedly. Furthermore, two or more method steps may be performed simultaneously or with overlapping timing. The method may include additional method steps not listed.

[0031] The method includes the following steps: I. illuminating a detector element via at least one first optical path and obtaining at least one first detector signal S1; II. With no sample applied to the sample interface, illuminating the detector element via at least one second optical path and generating at least one open-port detector signal S. 2;open obtaining a III. First detector signal S1, open port detector signal S 2;open , and at least one item of factory calibration information to determine at least one item of operational calibration information, the item of factory calibration information being a function of the open port detector signal S 2;open and a predefined relationship between the reference signal of the second optical path.

[0032] The term "illuminating" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. This term may specifically refer to, but is not limited to, at least one of providing, passing, and directing light to a device or element to be illuminated. Specifically, a detector element may be illuminated with light via at least one of a first optical path and a second optical path, and light emitted from a light source of a detection device may be directed onto the detector element. Illuminating may include directly illuminating the detector element, such as directing light emitted from a light source directly onto the detector element without sample interaction, and / or indirectly illuminating the detector element, such as directing light emitted from a light source onto the detector element with intermediate sample interaction. Illuminating the detector element may include light reaching a photosensitive region of the detector element, thereby causing the detector element to generate a detector signal, such as an electronic signal indicative of the illumination of the detector element. Illuminating the detector element may specifically include directing light emitted from the light source to the detector element via at least one of a first optical path and a second optical path.

[0033] The term "first detector signal" as used herein is a broad term and is given its ordinary and customary meaning to those skilled in the art, and is not limited to any special or customized meaning. This term may specifically, but is not limited to, refer to a detector signal obtained by illuminating a detector element through a first optical path. A first detector signal may be a detector signal that does not involve interaction with one or more of the sample interface and the sample. As outlined above, the term "first," even when used in the context of a detector signal, is used for nomenclature purposes, not for the purpose of providing a ranking. Furthermore, because this term is used for nomenclature purposes only, this term does not imply the necessity for the presence of additional elements of a similar type, such as, in this case, additional detector signals. The term "open-port detector signal" as used herein is a broad term and is given its ordinary and customary meaning to those skilled in the art, and is not limited to any special or customized meaning. This term may specifically, but is not limited to, refer to a detector signal obtained by illuminating a detector element through a second optical path without applying a sample to the sample interface.

[0034] The term "item of operational calibration information," as used herein, is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. This term may specifically, but not exclusively, refer to an item of calibration information that is based at least in part on the first and second detector signals of the detection device. The item of operational calibration information may be determined during operation of the detection device, e.g., during a calibration procedure and / or during a measurement procedure. For example, the item of operational calibration information may be determined during operation of the detection device in a calibration procedure and / or during a measurement procedure at the customer site. The item of operational calibration information may include the first detector signal S1, the open port detector signal S2, the second detector signal S3, the third detector signal S4, the third detector signal S5, the fourth detector signal S6, the fifth detector signal S7, the fifth detector signal S8, the fifth detector signal S9, the fifth detector signal S10, the fifth detector signal S11, the fifth detector signal S12, the fifth detector signal S13, the fifth detector signal S14, the fifth detector signal S15, the fifth detector signal S16, the fifth detector signal S17, the fifth detector signal S18, the fifth detector signal S19, the fifth detector signal S19, the fifth detector signal S19, the fifth detector signal S20, the fifth detector signal S21, the fifth detector signal S22, the fifth detector signal S23, the fifth detector signal S24, the fifth detector signal S25, the fifth detector signal S26, the fifth detector signal S27, the fifth detector signal S28, the fifth detector signal S29, the fifth detector signal S29, the fifth detector signal S3 ...9, the fifth 2;open, and may be a function of one or more items of factory calibration information. The items of operational calibration information may depend on changes in operating conditions, such as changes in temperature and / or humidity, and / or degradation of the detection device, such as degradation of the light source and / or detector elements. The items of operational calibration information may be configured to account for drift effects due to changing operating conditions and / or degradation of the detection device, and specifically to provide compensation of the detector signal for such drift effects.

[0035] As used herein, the term "item of factory calibration information" is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. Specifically, but not exclusively, the term may refer to a predefined and / or predetermined item of calibration information determined in at least one factory calibration process. The factory calibration process may, for example, include determining the item of factory calibration information using at least one reference sample, such as at least one sample having known optical properties, e.g., known reflectance and / or absorbance. The factory calibration process may be performed at the manufacturer of the detection device. The factory calibration process may include determining the item of calibration information using multiple detection devices, e.g., determining the item of calibration information for a batch of detection devices. The factory calibration item may be a predetermined item of calibration information. For example, the item of factory calibration information may be determined before step I of the method for calibrating a detection device. The item of factory calibration information may be assumed to be constant over the lifetime of the detection device.

[0036] As outlined above, the factory calibration information items are the open port detector signal S 2;open and the reference signal of the second optical path. For example, the predefined relationship is given by a mathematical function f.

[0037]

number

[0038] where S 2;ref denotes the reference signal of the second optical path.

[0039] The mathematical function f may comprise at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of said functions. For example, the predefined relationship may be given as follows:

[0040]

number

[0041] where a is a constant,

number

[0042] The predefined relationship may be determined prior to step I., specifically in a factory calibration of the detection device that is performed prior to step I. The first relationship is given by the mathematical function g.

[0043]

number

[0044] where S 2;ref denotes the reference signal of the second optical path.

[0045] The mathematical function g may include at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of the aforementioned functions. For example, the first relationship may be given as follows:

[0046]

number

[0047] where b is a constant,

number

[0048] The method for calibrating a detection device may include, in step III, determining a first relationship, specifically determining a coefficient b. Determining the first relationship may involve determining an item of factory calibration information, specifically an open port detector signal S 2;open and the reference signal of the second optical path. For example, by using an item of factory calibration information, specifically a predefined relationship such as exemplarily given in Equation 2, the open port detection signal S 2;open It is possible to determine the first relationship, specifically the coefficient b, using

[0049] The operational calibration information further includes the first detector signal S1 and the open port detector signal S 2;open For example, the second relationship may be given by a mathematical function h.

[0050]

number

[0051] The mathematical function h can include at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of said functions. For example, the second relationship can be given as:

number

number

[0052] The method for calibrating a detection device may include, in step III., determining a second relationship, specifically determining a coefficient c.

[0053] In the method for calibrating a detection device, steps I and II can be performed using at least one multiplexing method selected from the group consisting of a time multiplexing method and a frequency multiplexing method. For example, steps I and II can be performed using a frequency multiplexing method. The detection device may have two light sources, where a first light source disposed in a first optical path is operated at a frequency f1 and a second light source disposed in a second optical path is operated at a frequency f2, where f1 ≠ f2. For example, steps I and II can be performed using a time multiplexing method. The light sources of the detection device may be operated sequentially to sequentially illuminate the first optical path and the second optical path.

[0054] In a further aspect of the present invention, a method for determining at least one calibrated optical property of at least one sample is disclosed. For definitions of terms and possible embodiments, please refer to the description of the method for calibrating a detection device outlined above.

[0055] The term "optical property" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art, and should not be limited to any special or customized meaning. Specifically, the term may refer, but is not limited to, at least one item of sample information describing the sample's interaction with light. The optical property can be determined by determining the sample's interaction with light. The term "calibrated optical property" as used herein is a broad term and should be given its ordinary and customary meaning to those skilled in the art, and should not be limited to any special or customized meaning. Specifically, the term may refer, but is not limited to, an optical property that is transformed using at least one item of operational calibration information. Specifically, the calibrated optical property can correct, adjust, and / or compensate for one or more measurement inaccuracies in a detection device, such as measurement inaccuracies resulting from uncertainties in wavelength determination and / or measurement inaccuracies resulting from intrinsic and / or extrinsic interference with the detection device's measurement signal. As an example, the calibrated optical property may be an optical property of the sample that has been corrected, adjusted, and / or compensated for drift effects of optical components of the detection device, such as drift effects due to temperature and / or humidity changes in the detector element, aging effects of the light source, and / or aging effects of other optical components of the detection device. The calibrated optical property may be the result of a method for determining at least one calibrated optical property of at least one sample, and in particular, the calibration may be performed at least partially simultaneously, e.g., partially overlapping in time, and / or sequentially with respect to the presence of the sample in the detection device. The calibrated optical property of the sample may include one or more of the optical absorbance and optical reflectance of the sample.

[0056] The method comprises, by way of example, the following steps, which may be performed in a given order. However, it should be noted that different orders are possible. Furthermore, one, more than one, or all of the method steps may be performed once or repeatedly. Furthermore, two or more method steps may be performed simultaneously or with overlapping timing. The method may also include additional method steps not listed.

[0057] The method includes the following steps:

[0058] i. providing a detection device according to the present invention, for example according to the detection device embodiments defined with respect to the method of calibrating a detection device outlined above and / or according to other embodiments disclosed in more detail below; ii. providing at least one sample, specifically providing at least one sample to a sample interface; iii. illuminating a detector element via at least one first optical path and obtaining at least one first detector signal S1; iv. illuminating the detector element via at least one second optical path to obtain at least one second detector signal S2; and v. Determining at least one calibrated optical property of the sample using the first detector signal S1, the second detector signal S2, and at least one item of operational calibration information determined by using a method for calibrating a detection device according to the present invention according to any one of the above-mentioned embodiments and / or according to other embodiments disclosed in more detail below.

[0059] The detection device used in the method for determining at least one calibrated optical property of at least one sample may be embodied identically or similarly to the detection device used in the method for calibrating a detection device according to the invention, such as according to any one of the embodiments described above. In fact, one and the same detection device can be used for both methods. However, other embodiments of the detection device provided in step i. are also possible, for example according to any one of the embodiments of the detection device disclosed in more detail below.

[0060] As outlined above, the items of operational calibration information include the first detector signal S1 and the second optical path reference signal S 2;ref For example, the first relationship may be given by the following equation:

[0061]

number

[0062] where b is a constant,

number

[0063] The operational calibration information items include the first detector signal S1 and the open port detector signal S2. 2;open For example, the second relationship is given by:

[0064]

number

[0065] where c is a constant,

number

[0066] For example, the calibrated optical property of a sample is the sample's optical reflectance Rsample In general, the reflectance of a sample can be determined according to:

[0067]

number

[0068] Using Equations 7 and 8, the optical reflectance of the sample can be determined as follows:

[0069]

number

[0070] Furthermore, the method of determining at least one calibrated optical property of at least one sample may include redetermining items of operational calibration information, specifically redetermining one or more items of information of each of the first relationship and the second relationship, more specifically redetermining one or more of factors a and b.

[0071] The detection device may further include at least one monitoring device for monitoring at least one operating condition of the detection device, specifically one or more of the ambient temperature, the temperature of one or more components of the detection device, e.g., the light source and / or detector element, ambient humidity, etc. An item of operational calibration information may be redetermined if the monitored operating condition deviates from a nominal value by more than a predefined threshold. For example, the monitored operating condition is the temperature of the detection device. The item of operational calibration information may be redetermined if the temperature deviates from a temperature value of a previous determination of the item of operational calibration information by more than a predefined threshold, e.g., by more than 10 K. In this case, the nominal value may be the previously determined temperature value. Redetermining the item of operational calibration information may include performing a method for calibrating a detection device according to the present invention, such as according to any one of the embodiments disclosed above and / or any one of the embodiments disclosed in more detail below. Alternatively or additionally, the monitored operating condition is the ambient temperature of the detection device.

[0072] In the method for determining at least one calibrated optical property of at least one sample, steps iii. and iv. can be performed using at least one multiplexing method selected from the group consisting of a time multiplexing method and a frequency multiplexing method. Exemplary embodiments of such multiplexing methods are described with reference to the method for calibrating a detection device. Therefore, for a description of the multiplexing method, please refer to the description of the method for calibrating a detection device.

[0073] In a further aspect of the invention, a detection device is disclosed. For definitions of terms and possible embodiments, please refer to the description of the method for calibrating a detection device outlined above.

[0074] The detection device comprises the following components:

[0075] a. at least one detector element configured to generate at least one detector signal in response to illumination of the detector element by incident light; b. at least one light source configured to emit light in at least one optical spectral range; c. at least one sample interface configured to allow light from a light source to illuminate at least one sample, and configured to allow light from the sample to propagate, particularly via at least one wavelength-selective element, to a detector element; d. at least one first optical path, the first optical path being configured for light emitted from the light source to propagate, particularly via a wavelength-selective element, to the detector element without passing through a sample interface; e. at least one second optical path, the second optical path being configured such that light emitted from the light source propagates to the detector element by passing through the sample interface at least once, particularly via a wavelength-selective element; and f. At least one evaluation unit configured to determine at least one calibrated optical property of at least one sample using the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0076] The term "evaluation unit" as used herein is a broad term and is given its ordinary and customary meaning to those skilled in the art, without being limited to any special or customized meaning. The term may refer specifically, but not exclusively, to any logic circuit configured to perform the basic operations of a computer or system, and / or generally to any device configured to perform calculations or logical operations. The evaluation unit may be comprised of one or more processors. In particular, the evaluation unit may be configured to process the basic instructions that drive the computer or system. As an example, the evaluation unit may include at least one arithmetic logic unit (ALU), at least one floating-point unit (FPU), such as a math coprocessor or numeric coprocessor, multiple registers, specifically registers configured to supply operands to the ALU and store operation results, and memory, such as an L1 cache memory or an L2 cache memory. In particular, the evaluation unit may be a multi-core processor. In particular, the evaluation unit may be or may include a central processing unit (CPU). Additionally or alternatively, the evaluation unit may be or include a microprocessor, and thus, in particular, the elements of the evaluation unit may be included in one single integrated circuit (IC) chip. Additionally or alternatively, the evaluation unit may be or include one or more chips, such as one or more application specific integrated circuits (ASICs) and / or one or more field programmable gate arrays (FPGAs) and / or one or more tensor processing units (TPUs) and / or dedicated machine learning optimization chips.

[0077] The evaluation unit may be configured to determine the calibrated optical property of the sample by executing, for example, by software programming, step v. of the method for determining at least one calibrated optical property of at least one sample according to the present invention. Furthermore, the evaluation unit may be configured to determine at least one item of operational calibration information by using, for example, by software programming, a method for calibrating a detection device according to the present invention according to any one of the embodiments disclosed above and / or any one of the embodiments disclosed in more detail below. Specifically, the evaluation unit may be configured to determine the item of calibration information by executing step III. of the method for calibrating a detection device according to the present invention.

[0078] The detection device may further include at least one wavelength-selective element configured to transmit incident light within at least one selected wavelength range onto the detector element (see the method description above for possible embodiments of the wavelength-selective element).

[0079] The detection device may further include at least one monitoring device for monitoring at least one operating condition of the detection device. As used herein, the term "detection device" is a broad term and should be given its ordinary and customary meaning to those skilled in the art and should not be limited to any special or customized meaning. This term may specifically, but not exclusively, refer to any element or elements configured to detect, measure, or monitor at least one measurement variable or measurement characteristic. Specifically, the monitoring device may be capable of generating at least one measurement signal, such as an electrical signal, that is a qualitative or quantitative indicator of the measurement variable and / or measurement characteristic. For example, the monitoring device may be configured to monitor the ambient temperature of the detection device. For example, the monitoring device may be configured to monitor the ambient humidity of the detection device. For example, the monitoring device may be configured to monitor both the ambient temperature and the ambient humidity of the detection device.

[0080] In a further aspect of the present invention, a computer program for calibrating a detection device is disclosed, which program comprises instructions which, when executed by a computer or a computer network, for example by an evaluation unit of the detection device, cause the computer or the computer network to perform at least step III. of the method for calibrating a detection device according to the present invention according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0081] The computer program may further comprise instructions which, when executed by a computer or a computer network, for example by an evaluation unit of the detection device, cause the computer or the computer network to control the execution of steps I. and II. of the method for calibrating a detection device according to the present invention according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0082] Similarly, a computer-readable storage medium, in particular a non-transitory computer-readable storage medium, is disclosed, which comprises instructions that, when executed by a computer or a computer network, e.g. by an evaluation unit of a detection device, cause the computer or the computer network to perform at least step III. of the method for calibrating a detection device according to the present invention, e.g. according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0083] As used herein, the term "computer-readable storage medium" may specifically refer to a non-transitory data storage means such as a hardware storage medium on which computer-executable instructions are stored. A computer-readable data carrier or storage medium may specifically be or have a storage medium such as a random access memory (RAM) and / or a read-only memory (ROM).

[0084] The computer-readable storage medium may further include instructions that, when executed by a computer or a computer network, for example by an evaluation unit of the sensing device, cause the computer or the computer network to control the execution of steps I. and II. of the method for calibrating a sensing device according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0085] In a further aspect of the present invention, a computer program for determining at least one calibrated optical property of at least one sample is disclosed, which program comprises instructions which, when executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to perform at least step v. of the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0086] The computer program may further comprise instructions that, when the program is executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to control the execution of steps iii. and iv. of the method for determining at least one calibrated optical property of at least one sample according to the present invention according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0087] The computer program may further comprise instructions that, when the program is executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to prompt a user to perform steps i. and ii. of the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0088] Similarly, a computer-readable storage medium, in particular a non-transitory computer-readable storage medium, is disclosed, comprising instructions which, when executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to perform at least step v. of the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0089] The computer-readable storage medium may further comprise instructions which, when executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to control the execution of steps iii. and iv. of the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0090] The computer-readable storage medium may further include instructions that, when executed by a computer or a computer network, for example by an evaluation unit of a detection device, cause the computer or the computer network to prompt a user to perform steps i. and ii. of the method for determining at least one calibrated optical property of at least one sample according to the present invention, according to any one of the embodiments disclosed above and / or according to any one of the embodiments disclosed in more detail below.

[0091] Further disclosed and proposed herein is a computer program comprising computer-executable instructions for performing the method according to the present invention in one or more embodiments encompassed herein when the program is run on a computer or a computer network. In particular, the computer program may be stored on a computer-readable data carrier and / or a computer-readable storage medium.

[0092] Thus, in particular, one, more than one, or even all of the method steps I.-III. and / or one, more than one, or even all of the method steps i.-v. set out above can be performed, controlled and / or assisted by using a computer or a computer network, preferably by using a computer program.

[0093] Further disclosed and proposed herein is a computer program product having program code means for carrying out the method according to the present invention in one or more of the embodiments encompassed herein when the program is run on a computer or a computer network. In particular, the program code means may be stored on a computer-readable data carrier and / or on a computer-readable storage medium.

[0094] Further disclosed and proposed herein is a data carrier having a data structure stored thereon, which is capable of performing a method according to one or more embodiments disclosed herein after being loaded into a computer or computer network, for example into a working memory or main memory of the computer or computer network.

[0095] Further disclosed and proposed herein is a computer program product having program code means stored on a machine-readable carrier for performing a method according to one or more embodiments disclosed herein when the program is executed on a computer or computer network. As used herein, a computer program product refers to a program as a tradeable product. The product can generally be in any form, such as a paper medium, or on a computer-readable data carrier and / or computer-readable storage medium. In particular, the computer program product can be distributed via a data network.

[0096] Finally, disclosed and suggested herein is a modulated data signal containing instructions readable by a computer system or computer network for carrying out a method according to one or more embodiments disclosed herein.

[0097] With reference to computer-implemented aspects of the present invention, one or more of method steps I through III and / or i through v, or all of the method steps, of a method according to one or more embodiments disclosed herein may be performed using a computer or computer network. Thus, generally, any of the method steps involving providing and / or manipulating data can be performed using a computer or computer network. Generally, these method steps can include any of the method steps, except for those that typically require manual intervention, such as certain aspects of providing a sample and / or performing the actual measurement.

[0098] Specifically, the following components are disclosed in this specification:

[0099] a computer or computer network comprising at least one processor, the processor being adapted to perform one or more of the methods according to one of the embodiments described herein, - a computer-loadable data structure adapted to perform one or more of the methods according to one of the embodiments described herein while the data structure is being executed on a computer; a computer program adapted to perform one or more of the methods according to one of the embodiments described herein while the program is running on a computer, a computer program comprising program means for performing one or more of the methods according to one of the embodiments described herein while the computer program is running on a computer or on a computer network, a computer program comprising program means according to the embodiment, the program means being stored on a computer-readable storage medium; - a storage medium having a data structure stored thereon, the data structure being adapted to perform one or more of the methods according to one of the embodiments described herein after being loaded into a main and / or working storage device of a computer or a computer network; and - a computer program product having program code means, which may be stored on a storage medium or is stored on a storage medium for performing one or more of the methods according to one of the embodiments described herein when the program code means is executed on a computer or on a computer network.

[0100] The method, detection device, computer program, and computer-readable storage medium according to the present invention offer numerous advantages over known methods and devices. The method, specifically the method for calibrating a detection device, may incorporate a combination of the above-mentioned calibration schemes, i.e., a combination of an integrated reference target and at least two separate optical paths, achieved, for example, by using two light sources modulated at different frequencies. This solution allows for only one item of calibration information at the factory, e.g., a single, constant calibration coefficient a. This calibration coefficient depends only on the mechanical characteristics of the detection device, such as the housing and / or the integrated reference target, which, being merely passive optical components, do not significantly deteriorate over their lifetime. Therefore, depending on the ambient environment and operating conditions, the user can perform an open-port calibration, which allows for the recalculation of operational items such as coefficient b and coefficient c.

[0101] The detection device may be configured to monitor ambient and / or operating conditions, such as temperature and / or humidity, such as by having a monitoring device, and may optionally be configured to store the monitored ambient and / or operating conditions during user calibration. For example, if the temperature change is less than a predefined threshold, e.g., less than 3 K, specifically less than 2 K, the recalculated items of operating calibration information may be used for further measurements of the sample. The monitoring device may be configured to notify the user if the temperature deviation exceeds a predefined threshold limit, e.g., in the case of a temperature deviation of more than 10 K, and to notify and / or cause a recalibration.

[0102] The method of the present invention, specifically the method for calibrating a detection device, combines the advantages of previously used calibration methods and mitigates their disadvantages. Unlike open-port calibration, the method for calibrating a detection device can use open-port calibration based on only one light source. Therefore, because the operational calibration information depends only on each optical path, environmental effects such as aging and / or temperature dependence can be calibrated. Furthermore, the built-in reference target allows for reliable calibration of the light source over the long term. Furthermore, calibration via the first and second optical paths allows for simultaneous calibration of the detection device response during sample measurement. This potentially mitigates the disadvantages of open-port calibration.

[0103] The proposed solution further avoids the need for a temperature stabilization unit and may also avoid the need for external calibration standards, and with user involvement the detection device can be miniaturized and adapted to mobile devices, e.g., smartphones and handheld devices, making it easier to operate.

[0104] Furthermore, the built-in reference target avoids the drawbacks of external calibration targets defined by the state of the art, specifically, degradation over time due to environmental influences, such as those of external calibration standards used in muddy environments, etc. The built-in reference target may be protected from such environmental influences.

[0105] As used herein, the terms "have," "comprise," "include," or any grammatical variations thereof, are used in a non-exclusive sense. Thus, these terms can refer to a situation in which no further features are present in the entity described in this context other than the features introduced by these terms, as well as a situation in which one or more further features are present. As an example, the expressions "A has B," "A comprises B," and "A includes B" can refer to both a situation in which no other elements are present in A besides B (i.e., a situation in which A consists only of B), and a situation in which one or more further elements are present in entity A besides B, such as element C, elements C and D, or further elements.

[0106] Furthermore, it should be noted that the terms "at least one," "one or more," or similar phrases indicating that a feature or element may be present one or more times are typically used only once when introducing each feature or element. In most cases, the phrase "at least one" or "one or more" will not be repeated when referring to each feature or element, regardless of the fact that each feature or element may be present one or more times.

[0107] Furthermore, as used herein, the terms "preferably," "more preferably," "particularly," "more particularly," "particularly," "more particularly," or similar terms are used in combination with any feature without limiting its substitutability. Thus, features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. The present invention can be practiced using alternative features, as those skilled in the art will recognize. Similarly, features introduced by "in an embodiment of the invention" or similar phrases are intended to be optional features, without any limitation on alternative embodiments of the invention, without any limitation on the scope of the invention, and without any limitation on the possibility of combining the feature so introduced with other optional or non-optional features of the invention.

[0108] In summary, without excluding further possible embodiments, the following embodiments are envisaged:

[0109] Embodiment 1: A method for calibrating a detection device, wherein the detection device includes: a. at least one detector element configured to generate at least one detector signal in response to illumination of the detector element by incident light; b. at least one light source configured to emit light in at least one optical spectral range; c. at least one sample interface configured to allow light from a light source to illuminate at least one sample, and configured to allow light from the sample to propagate, particularly via at least one wavelength-selective element, to a detector element; d. at least one first optical path, the first optical path being configured for light emitted from the light source to propagate, particularly via a wavelength-selective element, to a detector element without passing through a sample interface; and e. At least one second optical path, wherein the second optical path is configured such that light emitted from the light source propagates to the detector element by passing through the sample interface at least once, particularly via a wavelength-selective element. The method for calibrating the detection device includes the following steps. I. illuminating a detector element via at least one first optical path and obtaining at least one first detector signal S1; II. With no sample applied to the sample interface, illuminating the detector element via at least one second optical path and generating at least one open-port detector signal S. 2;open obtaining a III. First detector signal S1, open port detector signal S 2;open , and at least one item of factory calibration information to determine at least one item of operational calibration information, the item of factory calibration information being a signal that is a signal from an open port detector signal S 2;open and a reference signal of the second optical path.

[0110] Embodiment 2: The method according to embodiment 1, wherein the detection device further comprises at least one wavelength-selective element configured to transmit incident light within at least one selected wavelength range onto the detector element.

[0111] Embodiment 3: The method of embodiment 1 or 2, wherein the predefined relationship is given by a mathematical function f.

number

[0112] Embodiment 4: The method of embodiment 3, wherein the mathematical function f comprises at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of said functions.

[0113] Embodiment 5: The method of embodiment 3 or 4, wherein the predefined relationship is given by:

number

number

[0114] Embodiment 6: A method according to any one of embodiments 1 to 5, wherein the predefined relationship is determined prior to step I., specifically in a factory calibration of the detection device performed prior to step I.

[0115] Embodiment 7: A method according to any one of embodiments 1 to 6, wherein the item of operational calibration information includes information about a first relationship between the first detector signal S1 and a reference signal of the second optical path.

[0116] Embodiment 8: The method according to embodiment 7, wherein the first relationship is given by a mathematical function g.

number

[0117] Embodiment 9: The method according to embodiment 8, wherein the mathematical function g comprises at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of said functions.

[0118] Embodiment 10: The method of any one of embodiments 7 to 9, wherein the first relationship is given by:

number

number

[0119] Embodiment 11: In step III., determining a first relationship, specifically determining a coefficient b, and determining the first relationship includes determining an item of factory calibration information, specifically an open port detector signal S 2;open 12. The method according to any one of embodiments 8 to 11, comprising using a predefined relationship between the reference signal of the first optical path and the reference signal of the second optical path.

[0120] Embodiment 12: The items of operational calibration information include the first detector signal S1 and the open port detector signal S 2;open 12. The method of any one of claims 1 to 11, including information about a second relationship between

[0121] Embodiment 13: The method according to embodiment 12, wherein the second relationship is given by a mathematical function h.

number

[0122] Embodiment 14: The method according to embodiment 13, wherein the mathematical function h comprises at least one function selected from the group consisting of a linear function, a polynomial function, in particular a polynomial function of degree n=2 or higher, a power function, an exponential function, a power law, and a sum of two or more of said functions.

[0123] Embodiment 15: The method of any one of embodiments 12 to 14, wherein the second relationship is given by the following equation:

number

number

[0124] Embodiment 16: The method of any one of embodiments 12 to 15, comprising in step III. determining a second relationship, specifically determining a factor c.

[0125] Embodiment 17: The method of any one of embodiments 1 to 16, wherein steps I. and II. are performed using at least one multiplexing method selected from the group consisting of a time multiplexing method and a frequency multiplexing method.

[0126] Embodiment 18: A method for determining at least one calibrated optical property of at least one sample, the method comprising the steps of: i. providing a detection device according to embodiment 1; ii. providing at least one sample, specifically providing at least one sample to a sample interface; iii. illuminating a detector element via at least one first optical path and obtaining at least one first detector signal S1; iv. illuminating the detector element via at least one second optical path to obtain at least one second detector signal S2; and v. Determining at least one calibrated optical property of the sample using the first detector signal S1, the second detector signal S2, and at least one operational calibration information determined using the method for calibrating a detection device described in any of the preceding embodiments.

[0127] Embodiment 19: The method according to embodiment 18, wherein the calibrated optical properties of the sample include one or more of the optical absorbance and optical reflectance of the sample.

[0128] Embodiment 20: The operational calibration information items include the first detector signal S1 and the second optical path reference signal S 2;ref 20. The method according to embodiment 18 or 19, referring to a method for determining at least one calibrated optical property of at least one sample, comprising information on a first relationship between

[0129] Embodiment 21: The method according to embodiment 20, wherein the first relationship is given by:

number

number

[0130] Embodiment 22: The items of operational calibration information include the first detector signal S1 and the open port detector signal S 2;open 22. The method according to any one of embodiments 18 to 21, referring to a method for determining at least one calibrated optical property of at least one sample, the method comprising information about a second relationship between

[0131] Embodiment 23: The method according to embodiment 21, wherein the second relationship is given by:

number

number

[0132] Embodiment 24: The calibrated optical property of the sample is the optical reflectance R of the sample. sample 22. The method according to embodiment 19 or 21, wherein:

number

[0133] Embodiment 25: The method according to any one of embodiments 18 to 24, referring to the method for determining at least one calibrated optical property of at least one sample, wherein steps iii. and iv. are performed using at least one multiplexing method selected from the group consisting of a time multiplexing method and a frequency multiplexing method.

[0134] Embodiment 26: The method according to any one of embodiments 18 to 25, referring to a method for determining at least one calibrated optical property of at least one sample, further comprising redetermining an item of operational calibration information.

[0135] Embodiment 27: A method according to embodiment 26, wherein the detection device further comprises at least one monitoring device for monitoring at least one operating condition of the detection device, in particular for monitoring the ambient temperature of the detection device, and wherein an item of operating information is redetermined if the monitored operating condition deviates from a nominal value by more than a predetermined threshold.

[0136] Embodiment 28: The method described in embodiment 26 or 27, wherein redetermining an item of operational calibration information comprises performing a method for calibrating a detection device described in any one of embodiments 1 to 17 referring to a method for calibrating a detection device.

[0137] Embodiment 29: A detection device comprising the following components: a. at least one detector element configured to generate at least one detector signal in response to illumination of the detector element by incident light; b. at least one light source configured to emit light in at least one optical spectral range; c. at least one sample interface configured to illuminate at least one sample with light from a light source and configured to transmit light from the sample, particularly via at least one wavelength-selective element, to a detector element; d. at least one first optical path configured for light emitted from the light source to propagate, particularly via a wavelength-selective element, to a detector element without passing through a sample interface; e. at least one second optical path, the second optical path being configured such that light emitted from the light source propagates to the detector element by passing through the sample interface at least once, particularly via a wavelength-selective element; and f. At least one evaluation unit configured to determine at least one calibrated optical property of the sample using the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 1 to 18 referring to the method for determining at least one calibrated optical property of at least one sample.

[0138] Embodiment 30: A detection device as described in embodiment 29, further comprising at least one wavelength-selective element configured to transmit incident light within at least one selected wavelength range onto the detector element.

[0139] Embodiment 31: A detection device as described in embodiment 29 or 30, wherein the detection device further comprises at least one monitoring device for monitoring at least one operating state of the detection device, specifically at least one monitoring device for monitoring the ambient temperature of the detection device.

[0140] Embodiment 32: A computer program for calibrating a detection device, comprising instructions that, when the program is executed by a computer or a computer network, cause the computer or the computer network to perform at least step III. of the method for calibrating a detection device according to any one of embodiments 1 to 17 referring to the method for calibrating a detection device.

[0141] Embodiment 33: A computer program according to embodiment 32, further comprising instructions that, when executed by a computer or a computer network, cause the computer or the computer network to control the execution of steps I. and II. of the method for calibrating a detection device according to any one of embodiments 1 to 17 referring to the method for calibrating a detection device.

[0142] Embodiment 34: A computer-readable storage medium, particularly a non-transitory computer-readable storage medium, comprising instructions that, when executed by a computer or a computer network, cause the computer or the computer network to perform at least step III. of the method for calibrating a detection device according to any one of embodiments 1 to 17 referring to the method for calibrating a detection device.

[0143] Embodiment 35: A computer-readable storage medium according to embodiment 34, further comprising instructions that, when executed by a computer or a computer network, cause the computer or the computer network to control the execution of steps I. and II. of the method for calibrating a detection device according to any one of embodiments 1 to 17 referring to the method for calibrating a detection device.

[0144] Embodiment 36: A computer program for determining at least one calibrated optical property of at least one sample, comprising instructions that, when the program is executed by a computer or a computer network, cause the computer or a computer network to perform at least step v. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 referring to the method for determining at least one calibrated optical property of at least one sample.

[0145] Embodiment 37: A computer program according to embodiment 36, further comprising instructions that, when the program is executed by a computer or a computer network, cause the computer or the computer network to control the execution of steps iii. and iv. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 referring to the method for determining at least one calibrated optical property of at least one sample.

[0146] Embodiment 38: A computer program according to embodiment 36 or 37, further comprising instructions that, when the program is executed by a computer or a computer network, prompt the computer or the computer network to prompt a user to perform steps i. and ii. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 referring to the method for determining at least one calibrated optical property of at least one sample.

[0147] Embodiment 39: A computer-readable storage medium, particularly a non-transitory computer-readable storage medium, comprising instructions that, when executed by a computer or computer network, cause a computer or computer network to perform at least step v. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 that refer to a method for determining at least one calibrated optical property of at least one sample.

[0148] Embodiment 40: A computer-readable storage medium according to the previous embodiment, further comprising instructions that, when executed by a computer or a computer network, cause the computer or the computer network to control the execution of steps iii. and iv. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 referring to the method for determining at least one calibrated optical property of at least one sample.

[0149] Embodiment 41: A computer-readable storage medium according to any one of the preceding two embodiments, further comprising instructions that, when executed by a computer or computer network, cause the computer or computer network to prompt a user to perform steps i. and ii. of the method for determining at least one calibrated optical property of at least one sample according to any one of embodiments 18 to 28 referring to the method for determining at least one calibrated optical property of at least one sample. [Brief explanation of the drawings]

[0150] Further optional features and embodiments are disclosed in more detail in the description of the following embodiments, preferably in conjunction with the dependent claims, where each optional feature may be realized in isolation as well as in any possible combination, as understood by a person skilled in the art. The scope of the present invention is not limited by the preferred embodiments. The embodiments are schematically depicted in the figures, where the same reference numerals in these figures refer to the same or functionally equivalent elements. [Figure 1] 1 shows a schematic diagram of different embodiments of a detection device; [Figure 2] 1 shows a schematic diagram of different embodiments of a detection device; [Figure 3] 1 shows a schematic diagram of different embodiments of a detection device; [Figure 4] 1 shows a flow chart of an embodiment of a method for calibrating a detection device. [Figure 5] 1 shows a flowchart of an embodiment of a method for determining at least one calibration optical property of at least one sample. [Example]

[0151] FIG. 1 is a schematic diagram of a first exemplary embodiment of a detection device 110. In the embodiments of FIGS. 1-3, the detection device 110 may specifically be a spectral detection device 111. The detection device 110 includes at least one detector element 112 configured to generate at least one detector signal in response to illumination of the detector element 112 by incident light. Specifically, the detection device 110 may have a plurality of detector elements 112 arranged in a detector array 114. Each of the plurality of detector elements 112 may include at least one photosensitive element 116 having at least one photosensitive region 118 configured to record an optical response in response to illumination of the respective detector element 112.

[0152] The detection device 110 may further include at least one wavelength-selecting element 120 configured to transmit incident light within at least one selected wavelength range onto the detector element 112. For example, the wavelength-selecting element 120 may comprise a filter element 122, such as a linear variable filter or an optical filter, in particular a narrow band-pass filter. However, other wavelength-selecting elements 120, such as a prism or a diffraction grating, are also feasible.

[0153] The detection device 110 has at least one light source 124 configured to emit light in at least one optical spectral range. As exemplarily shown in Figure 1, the detection device 110 may have two light sources 124. The detection device 110 further comprises at least one sample interface 126 configured to allow light from the light source 124 to illuminate at least one sample 127 and to allow light from the sample 127 to propagate through the wavelength-selective element 120 to the detector element 112.

[0154] The detection device 110 comprises at least one first optical path 128 and at least one second optical path 130. The first optical path 128 is configured so that light emitted from the light source 124 propagates through the wavelength-selective element 120 to the detector element 112 without passing through the sample interface 126. The second optical path 130 is configured so that light emitted from the light source 124 propagates through the wavelength-selective element 120 to the detector element 112 by passing through the sample interface 126 at least once.

[0155] As outlined above, the detection device 110 may have two light sources 124. In this example, a first light source 132 may be positioned to illuminate the first optical path 128, and a second light source 134 may be positioned to illuminate the second optical path 130. The detection device 110 may further include at least one reflective element 136 in the first optical path 128. The first light source 132 may be positioned to illuminate the reflective element 136. The reflective element 136 may reflect incident light to the wavelength-selective element 120. The reflective element 136 may include at least one reflective surface 138. The reflective surface 138 may be one or more of a metallic reflective surface and a reflective polymer surface. The reflection at the reflective element 136 may be a specular reflection of light. The reflection at the reflective element 136 may be a broadband reflection, specifically, a uniform reflection for multiple wavelengths within at least one wavelength range. As further seen in FIG. 1, a second light source 134 may be positioned to illuminate the sample interface 126 .

[0156] The detection apparatus 110 further comprises at least one evaluation unit 140. The evaluation unit 140 is configured to determine at least one calibrated optical property of the sample 127 using a method for determining at least one calibrated optical property of the at least one sample 127 according to the present invention, such as according to an exemplary embodiment shown in FIG. 5 and described in further detail below. As shown in FIG. 1, the evaluation unit 140 may be configured to receive and / or retrieve detector signals from the detector elements 112. The evaluation unit 140 may be configured to evaluate the received and / or retrieved detector signals, such as by determining at least one item of operational calibration information and determining the calibrated optical property. Specifically, the evaluation unit 140 may include one or more processors 142, which may be configured, such as by software programming, to perform one or more evaluation operations.

[0157] The detection device 110 may further comprise at least one monitoring device 143 for monitoring at least one operating condition of the detection device 110, in particular for monitoring one or more of the ambient temperature, the temperature of one or more components of the detection device 110, such as the light source 124 and / or the detector element 112, ambient humidity, etc.

[0158] 2, a second exemplary embodiment of the detection device 110 is shown in a schematic diagram. The embodiment of the detection device 110 shown in FIG. 2 broadly corresponds to the embodiment shown in FIG. 1. Therefore, please refer to the description of FIG. 1. However, as can be seen in FIG. 2, the detection device 110 may not have a reflective element 136. The first light source 132 may be positioned to directly illuminate the wavelength-selective element 120. Thus, in this example, the first light source 132 may directly illuminate the detector element 112 without any other optical components being placed in the first optical path 128.

[0159] 3 is a schematic diagram of a third exemplary embodiment of the detection device 110. The embodiment of the detection device 110 shown in FIG. 3 broadly corresponds to the embodiment shown in FIG. 1. Therefore, please refer to the description of FIG. 1. In this exemplary embodiment, the detection device 110 may have only one light source 124. The light source 124 may be arranged to illuminate, in particular, the first light path 128 and the second light path 130.

[0160] 3 , the detection device 110 may further include at least one first optical modulator 144 disposed in the first optical path 128 and configured to modulate light in the first optical path 128, and at least one second optical modulator 146 disposed in the second optical path 130 and configured to modulate light in the second optical path 130. The first optical modulator 144 may be configured to modulate light in the first optical path 128 at a first modulation frequency, and the second optical modulator 146 may be configured to modulate light at a second modulation frequency. The evaluation unit 140 may be configured to distinguish between detector signals obtained by illumination via the first optical path 128 and the second optical path 130 by distinguishing between detector signals associated with the first modulation frequency and the second modulation frequency, respectively. As an example, the first optical modulator 144 and the second optical modulator 146 may be configured with mechanical modulators 148, such as choppers and / or slits. However, other light modulators are also possible, such as acousto-optical modulators, electro-optical modulators, spatial light modulators or liquid crystal light modulators.

[0161] 4 shows a flowchart of one embodiment of a method for calibrating a detection device 110. The detection device 110 calibrated in this method may be embodied according to any one of the embodiments shown in FIGS. 1-3 and / or according to other embodiments disclosed herein. Therefore, for a description of the detection device 110, please refer to the description of FIGS. 1-3.

[0162] The method comprises, by way of example, the following steps, which may be performed in a given order. However, it should be noted that different orders are possible. Furthermore, one, more than one, or all of the method steps may be performed once or repeatedly. Furthermore, two or more method steps may be performed simultaneously or with overlapping times. The method may also include additional method steps not listed.

[0163] The method includes the following steps: I. illuminating a detector element 112 via at least one first optical path 128 (denoted by reference numeral 150) and obtaining at least one first detector signal S1; II. (Indicated by reference numeral 152) With no sample 127 applied to the sample interface 126, illuminating the detector element 112 via at least one second optical path 130 and generating at least one open-port detector signal S 2;open obtaining a III. (indicated by reference numeral 154) first detector signal S1, open port detector signal S 2;open , and at least one item of factory calibration information to determine at least one item of operational calibration information, the item of factory calibration information being a signal that is a signal from an open port detector signal S 2;open and the reference signal of the second optical path 130.

[0164] The predefined relationship is a linear function S 2;ref =a*S 2;open where S 2;ref denotes the reference signal of the second optical path 130, a is a constant,

number

[0165] Additionally, the operational calibration information includes information regarding a first relationship between the first detector signal S1 and a reference signal of the second optical path 130, and a relationship between the first detector signal S1 and the open port detector signal S2. 2;open and information regarding a second relationship between S. In this exemplary embodiment, both the first relationship and the second relationship may be comprised of linear functions, where the first relationship is S 2;ref = b * S1, where b is a constant,

number

number

[0166] 5 shows a flowchart of an embodiment of a method for determining at least one calibrated optical property of at least one sample 127. The detection device 110 used in the method may be embodied according to any one of the embodiments shown in FIGS. 1-3 and / or according to other embodiments disclosed herein. Therefore, for a description of the detection device 110, please refer to the description of FIGS. 1-3.

[0167] The method comprises, by way of example, the following steps, which may be performed in a given order. However, it should be noted that different orders are possible. Furthermore, one, more than one, or all of the method steps may be performed once or repeatedly. Furthermore, two or more method steps may be performed simultaneously or with overlapping timing. The method may also include additional method steps not listed.

[0168] The method includes the following steps: i. providing a detection device 110 according to the present invention (indicated by reference numeral 158) according to any one of the embodiments described in Figures 1 to 3 and / or according to any other embodiment disclosed herein; ii. Providing at least one sample 127 (denoted by reference numeral 160), specifically providing the at least one sample 127 to a sample interface 126; iii. illuminating the detector element 112 via at least one first optical path 128 (denoted by reference numeral 162) to obtain at least one first detector signal S1; iv. illuminating the detector element 112 via at least one second optical path 130 (denoted by reference numeral 164) to obtain at least one second detector signal S2; and v. Determining at least one calibrated optical property of the sample 127 using the first detector signal S1 (indicated by reference numeral 166), the second detector signal S2, and at least one item of operational calibration information determined using a method for calibrating the detection device 110 according to the present invention, such as the embodiment shown in FIG. 4 and / or any other embodiment disclosed herein.

[0169] In this exemplary embodiment, the calibrated optical property of the sample 127 is the optical reflectance R of the sample 127. sample As outlined with respect to the exemplary embodiment of FIG. 4, the items of operational calibration information may be expressed as a linear function, S 2;ref =b*S1 and S 2;open = c*S1, respectively. In this example, the sample 127 light reflectance R sample can be determined in step v. as follows:

[0170]

number

[0171] The method may further include redetermining the item of operational calibration information (indicated by reference numeral 168). Specifically, if the detection device 110 further comprises a monitoring device 143 for monitoring at least one operational state of the detection device 110, the item of operational information may be redetermined if the monitored operational state deviates from a nominal value by more than a predetermined threshold. Redetermining the item of operational calibration information may include performing a method for calibrating the detection device 110 according to the present invention, such as according to the exemplary embodiment shown in FIG. 4 and / or according to any other embodiment disclosed herein. As seen in FIG. 5, the optional step of redetermining the item of calibration information may be performed before step v. Example 1

[0172] In Example 1, a method according to the embodiment shown in Figures 4 and 5 is performed. Factory calibration is performed at 20°C, resulting in a coefficient a = 10, which is assumed to be constant. During operation of the detector at 30°C, the coefficients b and c may need to be recalibrated by the user. In this example, the detector has two light sources, a first LED with a temperature coefficient of -1.1% / K and a second LED with a temperature coefficient of -1.2% / K. Therefore, a signal of 1000 counts at 20°C has S1 = 1000cts * 0.89 = 890cts and S 2;open =1000cts*0.88=880cts. Therefore, the reference signal for the second optical path is:

[0173]

number

[0174] Therefore, the redetermination coefficients b and c are:

number

number

[0175] Measurements of a sample with a reflectance of 60% at 32°C can be performed as follows.

[0176] At 32°C, the responsivity of the detector element decreases by 4% / K, for a total of 48%. Therefore, at 20°C, we can expect a signal of 0.52 times the initial value. Furthermore, the light sources may be drifting with different temperature coefficients of -1.1% / K and -1.2% / K, respectively.

[0177] The signal measured at a given temperature is:

number

number

[0178] Therefore, in this example, the reflectance of the sample can be determined using Equation 11.

number

[0179] 110 Detection device 111 Spectral detector 112 detector element 114 detector array 116 Photosensitive element 118 Photosensitive area 120 Wavelength selection element 122 filter element 124 Light source 126 Sample Interface 127 samples 128 First optical path 130 Second optical path 132 First Light Source 134 Second Light Source 136 Reflective element 138 Reflective surface 140 evaluation units 142 processors 143 Monitoring equipment 144 First Optical Modulator 146 Second Optical Modulator 148 Mechanical Modulator 150 Illuminating the detector element via a first optical path 152 illuminating the detector element via a second optical path in the absence of a sample. 154 determining at least one item of operational calibration information. 156 Factory Calibration Steps 158 Providing a detection device 160 Steps to Provide Samples 162 Illuminating the detector element via a first optical path 164 Illuminating the detector element via a second optical path 166 Determining calibrated optical properties of the sample

Claims

1. A method for calibrating a detection device (110), the detection device (110) comprising the following components: a. at least one detector element (112) configured to generate at least one detector signal in response to illumination of the detector element (112) by incident light; b. at least one light source (124) configured to emit light in at least one optical spectral range; c. at least one sample interface (126) configured to illuminate at least one sample (127) with light from the light source (124) and to transmit light from the sample (127) to the detector element (112); d. at least one first optical path (128), the first optical path (128) configured to transmit light emitted from the light source (124) to the detector element (112) without passing through the sample interface (126); and e. at least one second optical path (130), wherein the second optical path (130) is configured such that light emitted from the light source (124) propagates to the detector element (112) by passing through the sample interface (126) at least once; A detection device (110) characterized in that it comprises: The method for calibrating the detection device (110) comprises the following steps: I. Illuminating the detector element (112) via the at least one first optical path (128) and generating at least one first detector signal S １ obtaining a step of II. With no sample applied to the sample interface (126), illuminating the detector element (112) via the at least one second optical path (130) and generating at least one open-port detector signal S ２；ｏｐｅｎ obtaining a III. The first detector signal S １ , the open port detector signal S ２；ｏｐｅｎ , and at least one item of factory calibration information to determine at least one item of operational calibration information, said item of factory calibration information being ２；ｏｐｅｎ and a reference signal of the second optical path (130), 1. A method for calibrating a detection device (110), comprising:

2. The predefined relationship is the following mathematical function f: [Equation 1] is given by S ２；ｒｅｆ 2. The method of claim 1, wherein: denotes the reference signal of the second optical path (130).

3. The predefined relationship is expressed by the following formula: [Equation 2] where a is a constant, [Equation 3] The method according to claim 2, characterized in that:

4. The item of operational calibration information is the first detector signal S １ and the reference signal of the second optical path (130), the first relationship being determined by the following mathematical function g: [Equation 4] Thus, given by S ２；ｒｅｆ 4. The method according to claim 1, wherein denotes the reference signal of the second optical path (130).

5. The first relationship is expressed by the following formula: [Equation 5] where b is a constant, [Equation 6] The method according to claim 4, characterized in that:

6. 5. The method of claim 4, wherein step III. includes determining the first relationship, and determining the first relationship includes using the item of factory calibration information.

7. The operational calibration information is １ and the open port detector signal S ２；ｏｐｅｎ and the second relationship includes information about a second relationship between the [Equation 7] where c is a constant, [Equation 8] 4. The method according to claim 1, wherein

8. The second relationship is expressed by the following formula: [Equation 9] where c is a constant, [Equation 10] The method according to claim 7, characterized in that:

9. 8. The method of claim 7, wherein step III includes determining the second relationship.

10. 1. A method for determining at least one calibrated optical property of at least one sample (127), the method comprising the steps of: i. providing a detection device (110) according to claim 1; ii. providing at least one sample (127); iii. Illuminating the detector element (112) via at least one first optical path (128) and generating at least one first detector signal S. １ obtaining a step of iv. illuminating the detector element (112) via at least one second optical path (130) and generating at least one second detector signal S ２ obtaining a v. the first detector signal S １ , the second detector signal S ２ and determining at least one calibrated optical property of the sample (127) using at least one operational calibration information determined using the method for calibrating a detection device (110) according to claim 1; A method comprising:

11. The item of operational calibration information is the first detector signal S １ and the reference signal S of the second optical path (130) ２；ｒｅｆ and the first relationship is in accordance with the following formula: [0011] where b is a constant, [0012] and The operational calibration information items include the first detector signal S １ and the open port detector signal S ２；ｏｐｅｎ and the second relationship is represented by the following formula: [0013] where c is a constant, [0014] and The calibrated optical property of the sample (127) is the optical reflectance R of the sample (127). ｓａｍｐｌｅ and the light reflectance R ｓａｍｐｌｅ is the following formula: [Equation 15] 11. The method of claim 10, characterized in that it is given by:

12. 12. The method according to claim 10 or 11, referring to the method for determining at least one calibrated optical property of at least one sample (127), further comprising a step of redetermining the operational calibration information, wherein the detection device (110) further comprises at least one monitoring device (143) for monitoring at least one operational state of the detection device (110), and wherein the item of operational information is redetermined if the monitored operational state deviates from a nominal value by more than a predetermined threshold.

13. 13. The method of claim 12, wherein the step of redetermining the items of operational calibration information comprises performing a method for calibrating the detection device (110) according to claim 1, which refers to a method for calibrating the detection device (110).

14. A detection device (110) comprising the following components: a. at least one detector element (112) configured to generate at least one detector signal in response to illumination of the detector element (112) by incident light; b. at least one light source (124) configured to emit light in at least one optical spectral range; c. at least one sample interface (126) configured to illuminate at least one sample (127) with light from the light source (124) and to transmit light from the sample (127) to the detector element (112); d. at least one first optical path (128), the first optical path (128) configured to transmit light emitted from the light source (124) to the detector element (112) without passing through the sample interface (126); e. at least one second optical path (130), the second optical path (130) configured for light emitted from the light source (124) to propagate to the detector element (112) by passing through the sample interface (126) at least once; and f) at least one evaluation unit (140) configured to determine at least one calibrated optical property of the sample (127) using the method for determining at least one calibrated optical property of the at least one sample (127) according to claim 10, which method refers to the method for determining at least one calibrated optical property of the at least one sample (127); A detection device (110) comprising:

15. 15. The detection device (110) according to claim 14, characterized in that the detection device (110) further comprises at least one monitoring device (143) for monitoring at least one operating condition of the detection device (110).

16. A computer program for calibrating a detection device (110), characterized in that it contains instructions that, when the program is executed by a computer or a computer network, cause the computer or the computer network to perform at least step III. of the method for calibrating a detection device (110) according to claim 1, which refers to the method for calibrating a detection device (110).

17. 11. A computer program for determining at least one calibrated optical property of at least one sample (127), characterized in that the program comprises instructions that, when executed by a computer or a computer network, cause the computer or the computer network to perform at least step v. of the method for determining at least one calibrated optical property of at least one sample (127) according to claim 10, which refers to the method for determining at least one calibrated optical property of at least one sample (127).

Images