Sampling Device

Abstract

To provide a sampling device for adsorption sampling.SOLUTION: The sampling device includes a sample container, an adsorbent sample probe, and an actuator. The sample container is arranged to contain a liquid to be sampled. The sample probe has a probe section containing an adsorbent material configured to be inserted into the sample container. The probe section includes an adsorbent material arranged to capture samples from the sample container. The actuator is configured to separately connect and operate both the sample container and the sample probe. The sample probe is removably connected to the actuator, and thereby the actuator can be connected to and disconnected from the sample probe during use, and the sample probe connected to the actuator can be selectively replaced with another sample probe.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to sampling devices, in particular devices for the automatic sampling and analysis of liquid and gas samples. [Background technology]

[0002] Sampling and analytical techniques are commonly used in the analysis of liquids to identify components therein. Examples include contaminants in drinking water, identification of fragrance allergens in cosmetics, or flavor profiling of beverages. The analysis of low levels of organic compounds in aqueous matrices presents significant challenges for performing rapid, sensitive, and automated analysis. Analysis of such samples is usually performed after extraction and concentration steps, often involving liquid-liquid extraction (LLE) or solid phase extraction (SPE).

[0003] Solid phase extraction can be achieved using, for example, polydimethylsiloxane (PDMS). PDMS extraction is based on adsorption, whereas equilibration techniques are based on partitioning the analyte between the silicone and aqueous phases of the analyte. An adsorbent material is placed in the liquid sample, which absorbs the compounds of interest contained in the liquid sample. The amount of analyte extracted is proportional to the concentration of the analyte in the sample, resulting in equilibrium. The amount of analyte extracted also depends on the size of the analyte material, i.e., the maximum absorption volume. Extraction into PDMS can be estimated based on the octanol-water partition (KO / W) of the analyte. The ratio of PDMS to the sample, known as the phase ratio, is a key factor in analyte recovery. Extraction efficiency depends on the mass of the solid phase.

[0004] Polydimethylsiloxane (PDMS) can be used in Solid Phase Micro Extraction (SPME), a well-known solid phase extraction sampling technique, for extracting organic compounds from a sample. Solid Phase Micro Extraction (SPME) involves the use of fibers coated with a thin layer of an adsorbent material, such as polydimethylsiloxane (PDMS), which forms the extraction phase. The adsorbent material may be a solid phase adsorbent selected for extracting various types of analytes from a variety of sample media, including both liquid and gas phases. Solid Phase Micro Extraction (SPME) has proven to be widely used because it is easily automated.

[0005] The size of the sorbent-coated fibers allows them to be accommodated within the body of a needle used to puncture a sample vessel. Once the needle is inserted into the vessel, the fibers extend out of the needle and are introduced into the sample matrix. The needle is then removed and the sample retained on the fibers is subsequently desorbed for analysis by gas chromatograph (GC).

[0006] The need to fit within the needle limits solid phase microextraction (SPME) to a very thin layer of polydimethylsiloxane (PDMS) (approximately 7-100 cm). The total volume of compound recovered is therefore limited, typically on the order of 0.5 CL with a K / W value less than 1000 (log K O / W 3). A drawback of solid phase microextraction (SPME) is therefore the limited amount of sorbent that can be loaded onto the fiber.

[0007] Solid phase extraction techniques are commonly used to sample mixtures of compounds that may undergo a change in composition due to the loss of one or more components. Such mixtures must be sealed prior to analysis so that measurements of the composition accurately reflect the original material. A septum or seal, usually comprising a polymeric film, caps and seals the sample vessel. This seal is intended to be penetrable by the sample probe, but is malleable enough to reseal the hole created when the sample probe is removed.

[0008] To address the small volume limitations of solid-phase microextraction (SPME) sampling, large volume sorptive extraction samplers have been developed. One such large volume sampler includes a metal probe with a sleeve of polydimethylsiloxane (PDMS) material disposed around the probe. However, while solid-phase microextraction (SPME) typically uses a relatively thin needle, the dimensions of the metal probe required to support the amount of polydimethylsiloxane (PDMS) required for large volume sampling present significant problems in terms of penetration and resealing of the container seal, which has thus far limited the degree of automation with which large volume sampling can be performed.

[0009] Thus, sampling of larger volumes is limited to non-automated methods in which a probe in the form of a rod or bar coated with an extraction medium is added directly to the sample. The container is then manually sealed. After extraction, the seal is manually removed and the probe is manually retrieved for further analysis. In addition to being time-consuming and labor-intensive, this method runs the risk of contaminating the atmosphere, the sample, and / or adjacent samples during the process of removing the seal, removing the probe, and resealing the container. Summary of the Invention [Problem to be solved by the invention]

[0010] It is therefore desirable to provide an improved sampling apparatus and / or method that addresses the above-mentioned problems and / or provides an overall improvement. [Means for solving the problem]

[0011] According to the present invention there is provided a sampling device and a sampling method, as set out in the accompanying claims.

[0012] According to an embodiment of the present invention, there is provided a sampling apparatus for sorptive sampling comprising a sample vessel, a sample probe, and an actuator. The sample vessel is arranged to contain a liquid to be sampled. The sample probe has a probe section arranged to be inserted into the sample vessel, the probe section including a sorptive material arranged to capture an analyte from the sample vessel. The actuator is arranged to separately connect and operate both the sample vessel and the sample probe. The sample probe is removably connectable to the actuator, whereby the actuator can be connected and disconnected from the sample probe during use, and the sample probe connected to the actuator can be selectively replaced with another sample probe. The actuator is any device suitable for moving the sample probe on multiple axes, such as a robotic arm movable in x, y, and z axes, and which may include one or more linear actuators. In an alternative embodiment, the sample probe may be a non-sucking sample probe otherwise arranged to sample from the vessel.

[0013] In a typical arrangement in the prior art, the actuator for automatic sampling will contain either a dedicated headspace tool for headspace analysis or a dedicated sample probe tool. In the case of a sample probe, the probe is connected to the sample probe tool before the automatic sampling process, which is then connected to the robotic arm. The sampling process is then carried out. If another sampling using a different sample probe is required, the sample probe must be removed from the sample probe tool by the operator and a replacement must be reconnected to the sample probe and then to the actuator. Similarly, if another sampling process is required, for example headspace sampling, the headspace tool must be replaced with the sample probe tool. The need to manually remove the sample probe limits the sampling process, since the robotic arm must hold the same sample probe throughout the entire sampling operation. When sampling multiple vessels, the actuator must remain with the sample probe for the entire sampling period required for each vessel.

[0014] By providing a sample probe that can be removably connected to the actuator, the actuator can take a sample probe, move the probe to a sample vessel, and then once deposited in the vessel, the actuator can remove the sample probe and take another probe to sample another vessel. Removing the probe frees up actuator operation time to allow multiple simultaneous samples and reduce the overall time to perform the samples. Additionally, the ability to simultaneously connect to the sample vessel and probe allows the sample vessel and sample probe to be lifted by the sample vessel when the sample probe is inserted into the sample vessel, rather than being lifted directly by the sample probe. This advantageously eliminates the need for a rigid and complex seal on the vessel that can grip the probe and seal against the probe, as would be necessary if the vessel and probe were lifted by the probe.

[0015] The actuator may comprise a robotic arm. The actuator is preferably a three-axis robotic arm, providing maximum flexibility for moving the sample probe.

[0016] The actuator may include a releasable connector, and the sample probe may include a corresponding connector portion configured to be releasably held by the releasable connector. The releasable connector may be a releasable gripper, such as, but not limited to, a spring-loaded catch, such as a ball-catch, and the sample probe may include a connector portion configured to be releasably engaged by the gripper. The term "releasable connector" may refer to a standard spring-loaded gripping mechanism of a three-axis actuator, but may also refer to any connection element that can grip, clamp, or mechanically connect to another element in an automatically releasable manner.

[0017] The releasable connector may be a connector provided directly on the robotic arm or may be a separate connector actuated by the robotic arm. The releasable connector may be a gripping tool having a movable gripping element that opens and closes to selectively release or grip the sample probe, the gripping element being actuated by the robotic arm. When such a gripping tool is used, the term "actuator" is intended to refer to both the robotic arm and the gripping tool associated with and connected to the robotic arm, the robotic arm being connected to the sample probe via the gripping tool.

[0018] The sampling device may further comprise a sample probe adapter. When the sample probe adapter is connected to an actuator such that the actuator can connect and operate both the sample probe and the sample vessel, the sample probe adapter has a first connector configured to releasably connect to the actuator and a second connector configured to releasably connect to the sample vessel. The adapter is thus an intermediate component that adapts a standard actuator, and is an adapter that "configures" the actuator to connect and operate both the sample vessel and the sample probe separately. The adapter allows the sample probe to be inserted into the sample vessel and to move the vessel and the probe together. Furthermore, the sample probe and the sample vessel can be moved separately.

[0019] The sample probe adapter may include a connector for connecting the actuator to the sample probe.

[0020] The sample vessel preferably includes a metallic cap, and the second connector of the sample probe adapter includes a magnetic element configured to magnetically secure the metallic cap of the sample vessel for vessel movement, thereby eliminating the need for any complex mechanical connection mechanism.

[0021] The actuators preferably include first and second vertical actuators, the first connector of the sample probe adapter being arranged to connect to the first vertical actuator, and the sample probe including a connection element configured to connect to the second vertical actuator.

[0022] The sample probe adapter is configured such that when coupled to the first vertical actuator, the second vertical actuator is capable of moving vertically relative to the sample probe adapter. The second vertical actuator includes a release mechanism positioned to release the sample probe from the second vertical actuator. The sample probe adapter includes a stop element configured to engage the release mechanism when the second vertical actuator moves relative to the sample probe adapter to operate the release mechanism to release the sample probe.

[0023] The sample vessel preferably includes a sampling axis along which the sample probe is inserted into the sample vessel. The sample probe adapter includes a sampling axis that is aligned with the sampling axis of the sample vessel when the sample vessel connects to the second connector of the sample probe adapter. The first connector of the sample probe adapter is spaced from the sampling axis such that the second vertical actuator is axially aligned with the sampling axis when the first connector is connected to the first vertical actuator. The second vertical actuator is used to connect to and manipulate the sample probe, thereby aligning the second actuator with the sampling axis to ensure that the sample probe is axially aligned with the sampling axis of the vessel for insertion.

[0024] The body of the sample probe adapter may be configured such that when the first connector of the sample probe adapter is connected to the first vertical actuator, the body of the sample probe adapter is clear of the sampling axis and the sample probe is actuated vertically along the sampling axis without interfering with the body of the sample probe adapter. The body is configured such that while the probe adapter is connected to the vessel, free access is provided to the top of the vessel. This may be in the form of a breakaway section, recess, aperture, or any other configuration that ensures that the sampling axis is unobstructed on the sample vessel when connected to the sample probe adapter.

[0025] The sample probe adaptor and actuator may be arranged such that when the first connector is connected to the first vertical actuator and the second connector is secured to a sample vessel, the second vertical actuator can independently vertically actuate the sample probe on the sample vessel. In this manner, the sample vessel may be held stationary by the probe adaptor while the second vertical actuator inserts or retracts the sample probe from the sample vessel.

[0026] Preferably, the sample probe adapter includes an aperture extending along the sampling axis therethrough. A stop element is disposed at least partially around a periphery of the aperture on the upper surface of the adapter and engages the release mechanism when the second vertical actuator moves downward through the aperture to a released position. Preferably, when the sample probe adapter is connected to the first actuator, at least a portion of the release mechanism is displaced radially outward of the aperture. The second actuator operates through a first range of vertical motion, where the release mechanism remains vertically displaced above the stop element and is movable below a lower limit of the first range of motion to the released position. At least a portion of the release mechanism displaced radially outward of the aperture in the released position engages the stop element.

[0027] The second actuator may include a lower portion that extends through the aperture of the adapter during use. At least a portion of the release mechanism is spaced radially outward of the lower portion. The lower portion operates through a first range of vertical motion during sampling over which the release mechanism remains vertically spaced over the stop element. The lower portion also extends to a released position below the first range of motion, where the release mechanism is positioned to engage a stop element surrounding the aperture, where the lower portion extends through the aperture to the released position.

[0028] The stop element may comprise an upstanding wall having an upper surface arranged to engage a release mechanism extending around at least a portion of the aperture. The release mechanism may be a vertically slidable mechanism, such as a slidable collar that laterally releases the catch when actuated upwardly against the catch, or may be a ball-bearing catch or similar device.

[0029] Preferably, the sampling device also includes an alignment element that engages the sample probe when the sample probe is received in the sample vessel and the probe is vertically aligned and engaged by a second vertical actuator. The sample probe is supported in the vessel by a flexible septum. In use, even if the sample probe is inserted into the vessel in a perfect vertical orientation, over time it may begin to tilt away from the vertical axis, especially during stirring. If the sample probe is not aligned in the vertical axis, it is difficult for an actuator operating in the vertical axis to regain the sample probe.

[0030] The alignment elements may include first and second alignment elements movable in opposite horizontal directions to move to engage opposite sides of the sample probe, the alignment elements being movable between an aligned position in which the alignment elements engage the sample probe to hold it in a substantially vertical orientation and a released position in which the sample probe and sample vessel are raised in a vertical orientation.

[0031] Preferably, each alignment element includes a guide section arranged to receive a portion of the sample probe, which guide section is aligned in the alignment position to hold the sample probe in a vertical orientation. The alignment elements may comprise horizontally oriented alignment plates, each having a main aperture with a diameter larger than the diameter of the sample vessel, and guide channels extending into the plate from a periphery of the main aperture. The main apertures are aligned in the release position to define a channel through which the sample vessel can move vertically unhindered. In the alignment position, the guide channels are aligned and cooperate to define a substantially circular aperture corresponding to the diameter of the shaft of the sample probe, the circular aperture being aligned concentrically with the vertical axis of the probe.

[0032] The sampling device may further comprise a latching mechanism to hold the sample probe in a fixed vertical position and vertically constrain it, for example when the sample probe is inserted into the oven. Preferably the latching device comprises a single or pair of latch plates, each including a guiding section arranged to receive a portion of the sample probe, the guiding plates being aligned in a latched position to vertically lock the sample probe in place. Preferably the guiding sections are arranged to engage connector channels of a sample probe head to which the actuator is attached. Preferably the latch plates are a plurality of horizontally arranged alignment plates, each plate having a main aperture with a diameter larger than the diameter of the sample vessel. The guiding channels extend into the plates from a periphery of the main aperture. The main apertures are aligned in a release position to define a channel through which the sample vessel can move vertically unhindered. In the locked position, the guide channels are aligned and cooperate to define a substantially circular aperture corresponding to the diameter of the connector channel of the sample probe head, thereby vertically aligning the plate.

[0033] The sample probe adapter may include a gripping mechanism configured to grip the sample probe. The gripping portion provides a releasable connection between the actuator and the sample probe. To enable the gripping mechanism to be operated by a second vertical actuator, the gripping mechanism includes a connection element configured to connect to the second vertical actuator. In particular, the gripping mechanism opens and closes to grip and release the sample probe upon operation of the second vertical actuator connected to the gripping mechanism. The gripping mechanism serves as a connector of the actuator and connects the actuator to the sample probe. Preferably, the actuator is a robotic arm, and the gripping mechanism advantageously releasably connects the robotic arm to the sample without the sample probe directly connecting to the robotic arm. Thus, wear on the connector of the robotic arm due to successively connecting and releasing the sample probe is avoided.

[0034] The at least one magnet of the sample probe adapter may be provided in a gripping mechanism. Preferably, the gripping mechanism comprises at least two movable gripping elements in the form of opposing fingers. The at least one magnet is provided on a distal end face of at least one gripping element. The distal end is the end facing a sample vessel in use. Preferably, at least one magnet is provided on the distal end of each gripping element.

[0035] In another aspect of the invention, there is provided a cleaning device for use in a sampling system as described above. The cleaning device is a cleaning station comprising a chamber configured to receive at least a portion of an elongated, adsorbent sample probe, one or more liquid inlets configured to direct a flow of cleaning liquid into the chamber to clean the sample probe, and one or more air inlets arranged to direct a flow of air into the chamber to dry the sample probe. The cleaning station allows for automated cleaning of the sample probe to remove debris or other contaminants prior to desorption without interfering with the automated sampling process by removing the sample probe from the actuator and manually cleaning it.

[0036] Preferably, the chamber includes an opening into which the sample probe is inserted, and at least one fluid inlet is positioned proximate the opening for directing wash fluid into the probe.

[0037] The at least one liquid inlet may be arranged to direct a flow of cleaning liquid longitudinally inwardly towards the inner end of the chamber, thereby ensuring that the cleaning liquid is contained within the chamber during use.

[0038] Preferably, the chamber includes a longitudinal axis along which the sample probe extends when received within the chamber. The cleaning device includes a plurality of liquid inlets arranged in an annular array coaxial with the longitudinal axis of the chamber, whereby a flow of liquid from each liquid inlet is directed radially inward. Thus, a curtain of cleaning solution may be generated providing 360° cleaning around the probe.

[0039] The chamber may further include a plurality of air inlets arranged in an annular array coaxial with a longitudinal axis of the chamber, whereby an air flow from each air inlet is directed radially inwardly, the air inlets allowing the probe to be dried after the cleaning step to ensure that no liquid remains on the sample probe when the sample probe is transferred to the probe oven.

[0040] The air inlets may be arranged in a common annular array longitudinally aligned with the liquid inlets, resulting in a compact arrangement where all air and water connections share the same location, allowing for cleaning on entry and drying on exit at points near the opening.

[0041] The liquid inlet and / or air inlet may include nozzles located at their inner ends to create jets of liquid and / or air that are directed into the chamber.

[0042] Preferably the air inlets are arranged to create a radially directed curtain of air.

[0043] The cleaning device may further include a controller arranged to supply cleaning fluid to the liquid inlet to initiate a cleaning cycle and thereafter supply compressed air to the air inlet to initiate a drying cycle.

[0044] The chamber may further comprise a drain disposed at an inner end of the chamber and directed downwardly from the liquid inlet for draining the cleaning liquid therefrom.

[0045] In another aspect of the invention, a sample vessel is provided comprising a liquid vessel having an opening at one end and a sealing member at least partially covering and closing the opening, and a plug element configured to extend through an aperture formed in the sealing member. The plug element includes a tip having a locking section of a first diameter and a sealing section located along the plug element towards a proximal end having a smaller diameter than the locking tip that seals the aperture formed in the sealing element during use, while the larger diameter locking tip prevents retraction of the plug. Preferably, the plug element includes a cap section having a metal portion that can be secured by a magnetic connector of a probe adapter, allowing the plug element and sealed vessel to be moved by an actuator. The sealing element may be a septum and include a pre-formed aperture for receiving a sample probe and / or a sealing plug element. Alternatively, the septum may be configured to be pierced by the sample probe as it enters, and the plug element to seal the hole made by the probe.

[0046] In another aspect of the invention, an oven for heating an elongated sample probe and a sample taken by the sample probe is provided. The oven comprises a heated chamber and an opening to the heated chamber, the opening having a diameter configured to receive the elongated sample probe and a sealing element located adjacent the opening to seal around the sealing portion of the sample probe and create a seal between the oven chamber and the external atmosphere. An oven adapter is further provided, the oven adapter comprising a body having a sealing portion with the same shape and size as the sealing portion of the sample probe, thereby sealing within the oven opening in the same manner as the probe. The adapter includes an inner channel for connecting to the oven chamber. A sealing element is provided to close the channel, formed of a material that can be pierced by a syringe while remaining sealed. Preferably, the sealing element is a septum formed of a resilient, flexible material such as silicone. Without such an adapter, the inlet would have to be manually configured depending on the sampling method.

[0047] The sampling assembly may include one or more locking elements arranged to hold the sample probe in place in the sample oven and / or in the sample vessel when the sample vessel is located in the agitator. The locking elements are arranged to engage the sample probe when the sample probe is inserted into the sample oven and / or sample vessel and prevent vertical movement of the sample probe. This allows the sample probe to be disengaged by the robotic arm and left in the sample oven or sample vessel. In the case of an oven, this allows the sample probe to be left in place without risk of bursting due to chamber pressure. In the case of an agitator, it prevents the sample probe from topping while the vessel is being agitated. Preferably, the locking element is a latching device arranged to engage horizontally to prevent vertical movement of the sample probe. By locking the sample probe vertically, the latching device allows the robotic arm to disengage the sample probe to perform other functions.

[0048] According to another aspect of the invention, there is provided an automated sampling system comprising a sample vessel containing a liquid to be sampled, a sample probe configured to be inserted into the sample vessel and having a probe section including an adsorbent material arranged to obtain an analyte from the sample vessel, and an actuator configured to separately connect to and operate both the sample vessel and the sample probe. The system further comprises an oven for heating a sample collected in the probe, a focusing cold trap for receiving the sample from the oven, and means for releasing the sample from the cold trap and directing at least a portion of the sample to an analyzer. An autosampler is provided arranged to receive at least a portion of the released sample. The autosampler includes a plurality of collection tubes for receiving and storing at least a portion of the released sample.

[0049] Preferably, the autosampler also includes a release oven for desorbing the re-collected sample for another analysis. The re-collected sample may be returned in a reverse direction to the cold trap from where it may be sent to one or more of an analyzer, a same collection of the same autosampler, a different tube of the same autosampler, and / or a tube of another autosampler. Fluid connections are provided linking the autosampler to the cold trap, the cold trap to the analyzer, and the cold trap back to the sampling oven.

[0050] The original sampling oven may be used to release samples from liquid samplers such as sample probes, headspace syringes, and / or liquid syringes. Each of these samples may be recollected in separate collection tubes in the autosampler for storage or reanalysis, and / or may be stacked in the same collection tube for simultaneous analysis.

[0051] The sample probe may be removably connectable to the actuator, such that the actuator may be connected and disconnected from the sample probe during use, and the sample probe connected to the actuator may be selectively replaced with another sample probe.

[0052] In another embodiment of the invention, the sample probe includes a portion at its distal end of a first diameter that is at least partially received in a liquid sample during use, and a section of a larger second diameter located toward the proximal end. The sample vessel includes a sealing member that closes and seals the vessel having an aperture of a diameter larger than the first diameter of the sample probe and smaller than the larger diameter of the sample probe, whereby the first probe section is freely received through the aperture while the second section engages and seals with the aperture. The sealing member may include a first resilient membrane and a second membrane formed of polytetrafluoroethylene (PTFE) that initially closes the opening. The polytetrafluoroethylene (PTFE) membrane layer may be separate from the sealing member or bonded to the sealing member.

[0053] In another aspect of the invention, an adsorption sampling device is provided that includes a sample vessel for receiving a sample. The sample vessel has an opening and a sealing assembly for closing and sealing the opening, the sealing assembly including a first sealing membrane and a second flexible sealing element. A sample probe is also provided that includes an elongated body including an adsorbent material and is configured to be inserted into the sample vessel. The elongated body has a lower section including an adsorbent material and an upper section having a larger diameter than the lower section. The flexible sealing element includes a preformed aperture for receiving the sample probe. The preformed aperture has a diameter less than a diameter of the upper section of the sample probe, the first sealing membrane is arranged to close and seal the vessel prior to sampling and is pierced by the sample probe upon insertion into the vessel. The second flexible membrane is arranged to close and seal the vessel when the sample probe is inserted into the vessel, whereby the larger diameter upper section is received within the aperture. The preformed aperture allows the lower section of the probe, containing the adsorbent material, to be easily inserted through the closure assembly into the container without excessive frictional contact, preventing damage to the adsorbent material that may occur if the probe pierces a flexible closure element (septum) that does not have such a preformed aperture. Once engaged, the interference fit between the upper section of the probe and the aperture seals the container. However, prior to insertion of the probe, the aperture does not allow the flexible septum to seal the container. Thus, a sealing membrane is positioned to seal the container prior to insertion of the probe, and the membrane is positioned to be pierced upon insertion.

[0054] Preferably, the first sealing membrane is a thin film, such as a polytetrafluoroethylene (PTFE) membrane. Preferably, the first sealing membrane is a disk-shaped membrane corresponding to the size of the opening. Preferably, the second sealing element is formed by a flexible and resilient material, such as silicone. Preferably, the second sealing element is substantially ring-shaped. The first sealing membrane is positioned over the opening of the container, between the container and the second flexible sealing element. The polytetrafluoroethylene (PTFE) seal is thus sandwiched between the container and the septum. When the polytetrafluoroethylene (PTFE) membrane is pierced, it bends away from the septum and into the container, not interfering with the seal between the probe and the septum.

[0055] A cap may also be provided that is arranged to secure the closure assembly onto the container. The closure assembly is secured between the cap and the container, the cap including an opening having a diameter larger than the aperture of the second flexible sealing element. In this manner, the cap does not impede the insertion of a probe through the opening in the cap. However, since the opening is spaced radially outward from the aperture in the septum, the opening exposes an area of ​​the septum that can be used for syringe-based sampling, such as headspace sampling or liquid sampling.

[0056] The diameter of the aperture in the second sealing element is preferably larger than the diameter of the lower section of the sample probe, thereby ensuring that the lower section passes smoothly through the aperture while the upper section engages the seal.

[0057] The sample probe may include a radially tapered section disposed axially between the lower and upper sections. The tapered section tapers from a diameter in the lower section to a larger diameter in the upper section. As the probe is inserted through the aperture and expands the aperture, the tapered section has a wedge function that provides a smooth transition between the lower and upper sections.

[0058] The invention will now be described, by way of example only, with reference to the following illustrative figures. [Brief description of the drawings]

[0059] [Figure 1] FIG. 1 illustrates an automated sampling system according to an embodiment of the present invention. [Diagram 2] FIG. 2 illustrates a sample probe according to an embodiment of the present invention. [Diagram 3] FIG. 2 is an exploded view of a sample vessel and a probe according to one embodiment of the present invention. [Figure 4] FIG. 4 shows the assembled arrangement of FIG. 3 with the probe inserted. [Diagram 5] FIG. 1 illustrates a container with a sealing plug in place, according to an embodiment of the present invention. [Figure 6] FIG. 13 shows a sealing arrangement for a container according to another embodiment of the present invention. [Figure 7] FIG. 2 is a top view of a sample probe cleaning device according to an embodiment of the present invention. [Figure 8] FIG. 8 is a cross-sectional view taken along line AA in FIG. [Figure 9] FIG. 2 illustrates a probe adapter according to an embodiment of the present invention. [Figure 10] FIG. 10 is a bottom view of the probe adapter of FIG. [Figure 11] FIG. 1 illustrates an oven adaptor according to an embodiment of the present invention. [Figure 12] FIG. 12 shows the oven adapter of FIG. 11 in use, inserted into an oven. [Figure 13] FIG. 1 illustrates an autosampler assembly according to an embodiment of the present invention. [Figure 14] 1 is a cross-sectional view of a latch arrangement according to an embodiment of the present invention; [Figure 15] FIG. 15 is a top view of the arrangement of FIG. [Figure 16] FIG. 1 illustrates a sample probe adapter including a gripping mechanism according to an embodiment of the present invention. [Figure 17]FIG. 17 is another view of the sample probe adapter of Figure 16. [Figure 18] FIG. 17 shows the sample probe adapter of Figure 16 connected to a sample vessel. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0060] With reference to Figure 1, an apparatus 1 for sampling and analyzing collected liquid samples is provided. The collected liquid samples are contained in sample containers 2. A number of sample containers 2 are held in a sample tray 4. Each sample container 2 holds a volume of liquid, referred to as the "bulk liquid", and a volume of gas above the bulk liquid, referred to as the "headspace". In the embodiment of Figure 1, the apparatus 1 is capable of adsorptive sampling and liquid sampling of the bulk liquid sample, as well as adsorptive sampling of the headspace.

[0061] The apparatus includes a standard x, y, z three axis linear actuator with a robotic arm movable in the x, y directions along rails 8. A plurality of adsorption sample probes 10 are held in a probe carrier 12. The apparatus 1 further includes a washing and drying station 14, and an oven 16 connected to a cold trap and a gas chromatograph (GC). A probe adapter 18 is provided, connected to the robotic arm, by which the robotic arm can capture the probe 10 as described further below. The probe adapter 18 functions to configure a standard robotic arm, typically used for syringe analysis, to be able to capture the sample probe 10. The probe adapter 18 is also configured to enable the robotic arm to capture a sample container 2. Thus, the probe adapter 18 allows the sample container 2 and the probe 10 to be carried simultaneously or separately.

[0062] During automated adsorption sampling of a liquid sample held in a sample container 2, an initial pre-sampling step is first performed by the device 1, in which the sample container 2 and the sample probe 10 carrying the adsorbent are prepared. The subsequent pre-sampling steps are not exhaustive and are not limited to be performed in the described sequence. First, a sample container 2 is selected from a number of sample containers 2 stored in a sample container tray 4. This selection is determined by the controller under the operation of the control software as to which sample container 2 is to be analyzed. The robotic arm 6 is then operated to capture the selected sample container 2 from the sample container tray 4. Having captured the probe adapter 18, the robotic arm 6 lifts the sample container 2 from the sample tray 4 and moves it to an incubation agitator 22 arranged to heat and / or agitate the container 2 as dictated by the specific requirements of the sample contained in the container 2. This incubation / agitation step is performed to achieve equilibration of the sample before sampling.

[0063] Prior to sampling, the sample probe 10 is thermally preconditioned by heating to ensure cleanliness of the probe 10. Thermal preconditioning may be accomplished using an oven 16 or using a dedicated probe conditioning unit (not shown). Once preconditioned, the probe 10 is either used immediately or stored in a probe carrier 12. The probe carrier 12 includes channels configured to receive the probe tips with adsorbent material, and these channels are sealed to maintain the integrity of the probe 10 while it is stored therein.

[0064] A preconditioned adsorption sample probe 10 is selected from a plurality of probes 10 stored in a probe carrier 12, and the selected probe 10 is captured by the robotic arm 6 using a captured probe adapter 18. Once held by the robotic arm 6, the sample probe 10 is ready to begin sampling.

[0065] During the sampling stage, the sampling process and parameters depend on the sample to be obtained. Sorption sampling may involve sampling the bulk liquid contained in the sample vessel 2, or the headspace present above the bulk liquid in the vessel 2. Variables in the sampling process include the positioning of the probe 10 within the vessel 2, the required sampling period, and the agitation rate, each of which can be defined by the user within the system, with each of the elements controlled by a common controller and user interface.

[0066] During the pre-sampling phase, a sample probe 10 selected and engaged by the robotic arm 6 is moved by the robotic arm 6 to the x,y location of the selected sample vessel 2. The sample vessel 2 may be moved to and positioned on the incubation agitator during the pre-sampling phase. The probe's robotic arm 6 then extends the probe 10 downward on the z-axis to introduce it into the sample vessel 2, as described in more detail below.

[0067] For liquid sampling, the sample probe 10 is inserted into the sample vessel 2, whereby the sorbent material at the tip of the sample probe 10 is introduced into the liquid sample. Once the probe 10 is fully inserted and the tip is sealed within the sample vessel 2, the sample probe 10 is disengaged and released by the robotic arm 6, leaving the sample in the vessel 2 for the required sampling period. The robotic arm 6 is then free to perform another task, such as manipulating another sample vessel 2 and sample probe 10. The ability to disengage the sample probe 10 allows multiple, simultaneous, overlapping samples to be prepared and performed by a single robotic arm 6. This also allows the sampling time for each sample vessel 2 to be set separately, with each vessel 2 having a different sampling period than the other sample vessels 2, if desired. The insertion and extraction times, as well as the duration, of the sample probe 10 can be controlled to optimize use of the robotic arm 6.

[0068] The sample probe 10 can remain in the sample vessel 2 for a period predetermined by the user and / or by the processor controlling the device depending on the requirements of the sample. The sampling period can be specified for each sample vessel 2 and can vary from sample to sample, if necessary, depending on the contents of the sample vessel 2 and the information required from the sample. During the sampling period, compounds contained in the sample are captured by the adsorbent material present in the probe 10. During sampling, the sample vessel 2 can be stirred and / or incubated.

[0069] The robotic arm 6 is operated to remove the sample probe 10 from the sample vessel 2 once the sampling period has ended. Before removing the sample probe 10 from the sample vessel 2, the probe 10 and vessel 2 are removed from the stirrer by the robotic arm 6 via engagement of the arm 6 with the vessel 2. Preferably, the probe adapter 18 is configured to magnetically connect to the cap of the vessel 2, allowing the vessel 2 and the probe 10 to be lifted by the robotic arm 6. The vessel 2 and the probe 10 are moved from the stirrer 22 to the sample tray 4. The sample probe 10 is then removed from the vessel 2 by the robotic arm 6. The vessel 2 is released by the robotic arm 6 and remains in the sample tray 4. The vessel 2 can then be capped by a plug element or a sealing cap to seal the vessel 2. This may be performed while the probe 10 is held by the robotic arm 6 or after the probe 10 is placed in an oven.

[0070] During the pre-desorption step between sampling and desorption of the sample in the sample oven 16, the sample probe 10 removed from the sample container 2 is moved by the robotic arm 6 to a washing station 14 to remove any residual liquid or debris that may be present on the sample probe 10. When the sample probe 10 is inserted into the liquid sample and removed from the sample container 2, droplets of liquid and / or a surface film may remain on the probe 10. To achieve a stable and accurate analysis of the sample, it is important to remove excess liquid from the sample probe 10 to ensure that only compounds absorbed by the sorbent material are desorbed and analyzed. It has also been observed that certain liquids present on the surface of the sample probe 10, especially contained substances such as sugar, will burn and emit smoke at the high temperatures of the oven 16.

[0071] The washing station 14 provides a jet of washing fluid. The washing fluid may be filtered water, or a washing solution or optionally a solvent, at a user-defined flow rate, dilution and duration that is directed onto the sample probe 10. The washing station 14 further includes a number of air jets. After the washing phase, the air jets are activated to direct a jet of air onto the sample probe 10 to dry the probe. The jets are arranged to create a film of air, and during the drying phase, the sample probe 10 is slowly removed from the washing station 14, pulling the end of the sample probe 10 through the film of air to optimize drying efficiency. The washing station 14 is described in more detail below.

[0072] The cleaned and dried sample probe 10 is moved by the robotic arm 6 to the oven 16. The sample probe 10 is lowered on the z-axis into a sealed entry port of the oven 16. The oven 16 includes a sliding latch mechanism arranged to slide to a locked position once the probe 10 is inserted into the entry port of the oven 16. The latch engages the probe 10 and locks it into place within the oven by constraining it vertically on the z-axis to prevent it from being removed from the oven 16. With the latch constraining the sample probe 10 and locking it into place, the robotic arm 6 can release the sample probe 10 without fear of the sample probe 10 being expelled from the oven 16 by pressure generated within the oven 16. Furthermore, once the robotic arm 6 has released the probe 10, another task can be performed.

[0073] Once the sample probe 10 is inserted and locked into the oven 16, an automatic leak test is performed to ensure the integrity of the sample. The sorbent material of the sample probe 10 is then heated in the oven 16, and the compounds captured by the sorbent material from the sample container 2 are transferred in a flow of inert carrier gas to a focusing trap, commonly referred to as a cold trap. The sample is then quickly released from the focusing trap, and at least a portion of the released sample is transferred to a gas chromatograph (GC) for analysis. A portion of the released sample may be transferred to an adsorption tube. In this example, the cold trap acts as a buffer, holding the sample while the adsorption tube is positioned to collect the sample. Collecting the sample on the adsorption tube allows the sample to be stored for another reanalysis. If the sampling procedure requires one or more reanalysis steps, the sample on the adsorption tube may also be reanalyzed immediately after the original analysis. The system utilizes the adsorption tube as an "autosampler" and includes a tube magazine or carousel, and an oven. The magazine of the autosampler includes multiple adsorption tubes. After release from the focusing trap, the sample may be split and a portion of the released sample may be delivered by the autosampler to a selected sorbent tube from the magazine. The sorbent tube may be empty of any sample or may hold a previous sample obtained during the sampling procedure. For example, the sorbent tube may hold a headspace sample, which is then captured by the sorbent sample, resulting in a more complete analysis of the sample compounds. The sorbent tube holding that sample may then be replaced with another tube from the magazine, or the autosampler sorbent tube oven may be used to re-release the stored sample to a gas chromatograph (GC) for a second analysis.

[0074] Combining an autosampler with an automatic probe sampler allows for rapid sample analysis with the option of repeated analysis and the possibility to concentrate multiple samples onto a single sorbent tube and / or store samples. These facilities do not currently exist for an automatic probe sampling system.

[0075] After releasing the sample into the cold trap, the oven 16 is isolated from the carrier gas. The oven 16 is then cooled and once cooled, the robotic arm 6 is reattached to the probe 10 and the latching mechanism disengages. The sample probe 10 is then removed from the oven 16 and placed back into the probe storage container 12 for reuse. After removing the sample probe 10, a lid is closed on the oven 16 to prevent the ingress of debris.

[0076] During the above-described process of analyzing a single sample, when the robotic arm 6 is disengaged from the sample probe 10, the robotic arm 6 can be operated to perform one or more separate pre-sampling, sampling, pre-detachment, and desorption operations for multiple separate sample container probes. The controller can be programmed to operate these multiple simultaneous operations in the most efficient manner to maximize throughput for optimal productivity.

[0077] Referring to FIG. 2, the sample probe 10 includes a stem section 20 and a tip section 22. The stem section 20 comprises the main body of the probe 10. The cylindrical stem section 20 includes a connector portion 26 at its upper end 24 having a larger diameter than the main shaft of the stem section 20. The connector portion 26 includes a circumferentially extending beveled engagement channel 28 of smaller diameter. The engagement channel 28 is configured to receive a corresponding latching element of a z-axis actuator of the robotic arm 6. The latching element may be a spring-loaded ball catch or any other suitable element configured to extend into and engage the channel 28 to hold the probe 10 vertically. The z-axis actuator further includes a release mechanism that slides vertically to release the spring-loaded ball catch.

[0078] The stem 20 includes a locking section 31. The locking section 31 has a larger diameter than the main body of the stem 20 and includes upper 34 and lower 36 radially extending shoulder sections with a channel 38 formed therebetween. The channel 38 is arranged to receive a latch plate or similar locking element. The latch plate is arranged such that the lower surface of the latch plate is preferably aligned with the lower shoulder 36 such that the latch plate is vertically aligned with the channel 38 when the probe 10 is received at a given location where the probe 10 needs to be vertically locked. The probe 10 may be received through an aperture in the latch plate. The latch plate is horizontally slidable to a locked position where at least a portion of the plate is received within at least a portion of the channel 38. When the latch plate is received in the channel 38, the lower shoulder 36 engages the latch plate to prevent vertical removal of the probe 10.

[0079] The stem has a recessed section 30 with concentric rings that are printed, laser marked, etc. to provide a bar code or other probe identifier. Section 30 is recessed to minimize wear on the bar code or other identifier. The bar code or other identifier is located within the probe adapter 18, either as a bar code reader 122 or as a separate module (not shown).

[0080] The upper stem section 20 includes an internal channel having female threads at a base end. The lower stem section 22 includes a corresponding threaded portion to engage with the threaded section of the upper stem section 20, connecting the lower stem section 22 to the upper stem section 20. The upper end 44 of the lower stem section 22 has a diameter that matches the diameter of the upper stem section 20. The diameter of the lower stem section 22 decreases at a tapered section 46 along the length of the tapered section 46 to a lower end section 48 that is of a smaller diameter. At its distal end, the lower stem section 22 includes a pointed piercing tip 50 to aid in the insertion of the probe through an aperture in a septum of a sample vessel.

[0081] The lower stem section 22 contains a sorbent material. In the arrangement of FIG. 2, the sorbent material is provided in a pair of longitudinally aligned and diametrically opposed grooved sorbent channels 52. The pair of sorbent channels 52 extend longitudinally and are recessed radially inwardly into the body of the lower stem section 22. The pair of sorbent channels 52 are of equal length and have a first lower end spaced longitudinally centrally from a tapered pointed tip 50. The upper end of each channel 2 is spaced longitudinally downward from the tapered section 46. The sorbent channels 52 contain a sorbent material 54 suitable for performing sorbent sampling. Preferably, the sorbent material 54 is polydimethylsiloxane (PDMS), although other materials may be used, as detailed in the claims. The dimensions of each channel 52, including length, depth, and width, are selected to define a volume of the sorbent material 54 that it contains.

[0082] As shown in FIG. 3, the sample vessel 2 includes a cylindrical hollow glass body 58 defining a storage container, and a neck 60 having a rim 62 at its opening. The rim 62 includes an outwardly flared rib 64 having a lower edge 66 spaced from an upper shoulder 68 of the body section 58. A silicone disk 70 having a diameter corresponding to the diameter of the rim 62 seats on top of the rim 62 to provide a septum for the container. The septum 70 includes a central aperture 72 having a diameter configured to allow the lower section 48 of the probe 10 to pass therethrough. The diameter of the aperture 72 is equal to or greater than the diameter of the lower section of the tip 22, but less than the diameter of the upper section. A polytetrafluoroethylene (PTFE) membrane 71 is positioned below the silicone septum 70 and seats on the rim 62 between the rim 62 and the septum 70. The disk-shaped polytetrafluoroethylene (PTFE) membrane 71 is bonded to the silicone septum to optimize the seal between the two components. The PTFE membrane does not contain an aperture and seals the container 2 to prevent gas from escaping through the aperture 72 in the septum. When the probe 10 is inserted through the aperture 72, the probe 10 pierces the PTFE seal. As shown in FIG. 4, the PTFE seal 71 bends inwardly when pierced by the lower end of the tip section 22 of the probe 10.

[0083] The container 2 further includes a metal cap 74 having an annular top surface 76 with an opening aperture larger than the maximum diameter of the probe 10, such that the probe 10 can be inserted through the aperture in the cap 74 without engaging the edge of the opening in the top surface 76. The cap 74 further includes a sidewall 78 that is open at its lower edge. The diameter of the cap 74 is substantially equal to the diameter of the rib 66, such that the cap 74 can be inserted over the rib 66. The lower end of the sidewall 78 is then crimped onto the lower edge 66 of the rib 64, fixing the cap 74 in place on the rim 62. The septum 70 and polytetrafluoroethylene (PTFE) seal 71 are held in place between the cap 74 and the rim 62. The opening aperture in the cap 74 is larger than the aperture 72 in the septum seal. Aperture 72 is thus spaced radially inward of the opening aperture of cap 74, exposing a section of the septum seal between the inner periphery of the opening and aperture 72. This exposed annular section of the septum allows the septum to be pierced by a syringe to remove a headspace sample or the like from container 2 prior to adsorption sampling. The septum 70 can be resealed upon withdrawal of the syringe needle, and the container seal is maintained because the exposed polytetrafluoroethylene (PTFE) membrane 71 in the aperture remains intact.

[0084] The small diameter of the lower section 48 of the tip section facilitates initial insertion of the probe 10 through the aperture 72 of the septum 70. The diameter of the lower section 48 is selected so that it slides relatively easily and with limited friction through the opening in the septum during use. The diameter of the aperture 72 may be selected to provide a slight sealing fit with the lower section 48 or such that the periphery of the aperture is spaced from the lower section 48 to prevent the lower section 48 from rubbing against the septum 70. As the probe 10 is further inserted, the tapered section 46 reaches the septum 70. The expanding diameter of the tapered section 46 transitions into the larger diameter section 44. The diameter of the aperture 72 is selected to be less than the diameter of the upper section 44, providing a close tolerance or preferably an interference. In this manner, when the upper section is received in the aperture 72, a clear seal is provided with the septum 70.

[0085] This sealing engagement between the top section 44 and the septum 70 seals the vessel 2 in a very simple manner, without requiring more complicated arrangements of additional seals on the sample vessel and / or on the probe 10 .

[0086] Prior to insertion of the probe 10, the vessel 2 is sealed by a polytetrafluoroethylene (PTFE) membrane 71. To obtain a sample from the vessel 2, the probe 10 is inserted through a preformed aperture 72 in the septum 70. The tip 50 pierces the PTFE membrane and the probe 10 is inserted through the septum 70 and the PTFE membrane 71 into the vessel 2. Figure 4 shows the configuration in which the probe 10 has been inserted into the sample vessel 2 such that the lower section 48 and tapered section 46 of the tip section 22 are fully inserted through the opening 72 in the septum 70. The opening is widened to the larger diameter of the upper section 44 of the tip section 22. In this condition, the opening 72 is widened by the larger diameter of the top section 44 of the tip section 22, and the engagement between the inner edge of the opening 72 and the outer surface of the top section 44 creates a liquid and gas tight seal, as well as providing a very tight interference fit so that the sample vessel 22 can be lifted by the probe 10 as required. Furthermore, the aperture 70 engages the outer surface of the tip section 22 such that the septum 70 acts to remove a significant amount of liquid from the tip section 22 as the probe 10 is withdrawn from the sample vessel 2.

[0087] When the probe 10 is withdrawn from the sample container 2, the aperture 72 remains open. Accordingly, as shown in FIG. 5, a stop 80 is provided to close and seal the aperture 72. The stop 80 includes a disk-shaped cap portion 82 and a plug section 84 extending from a lower surface of the cap section 82. The plug section 84 is substantially cylindrical and centrally located and configured to be inserted through the aperture 72 of the septum 70. The plug 84 includes a lower section 86 of larger diameter, and an upper portion 88 of the plug section 84 is of smaller diameter compared to a distal end which is larger than the unexpanded free diameter of the aperture 72. The plug 84 is inserted through the aperture 72 and once fully inserted, the cap section 82 seats against the upper surface 76 of the cap 74 of the sample container 2. Once the larger diameter section 86 of the plug 84 has fully passed through the aperture 72, the larger diameter acts as a jaw to maintain the plug 84 within the aperture and prevent it from backing out. Because the top section 88 has a larger diameter than the aperture 72, the top section 88 seals the aperture 72 in the same sealing manner as the probe 10. The sealing cap 82 is formed of metal so that it can be magnetically lifted by the probe adapter 18 of the robotic arm 6 in the same manner as the cap 74 of the sealed vessel 2.

[0088] As an alternative to the stopper 80, FIG. 6 shows a sealing cap 118. The sealing cap 118 can be applied to a sample vessel to seal the vessel after sampling. The cap 118 comprises a stem 120 and a head section 126 that corresponds to the shape of the stem 22 and head 26 of the probe 10. The cap 118 is configured to fit over the top of the sample vessel 2. An O-ring 128 or similar seal may be provided around the inner edge of the cap 118, which seals against the outer surface of the cap 78 and the top of the vessel 2. The sealing cap 118 is pressed onto the sample vessel 2 using a robotic arm, creating a seal between the inner diameter 118 and the outer diameter of the vessel cap 78. The shape of the stem 120 and head section 126 allows the stem 120 to be connected to the robotic arm and lifted to move the vessel 2.

[0089] 7 is a top view of the washing / drying station 14. The cap section 87 of the washing / drying station 14 includes a plurality of inlet apertures. A first set 90 of the inlet apertures are connected by a plurality of fluid conduits to a supply of cleaning fluid as described above. A second set 92 of the inlet apertures are connected to a source of compressed air. An open aperture 94 is centrally located in the cap 87 for receiving the probe 10.

[0090] A cross-sectional view along line AA is shown in FIG. 8. The liquid and air inlet ports 90, 92 are formed in an annular beveled surface extending downwardly from the top surface of the cap section 87 and are arranged in an annular array. The inlets 90, 92 are angled downwardly and penetrate the body of the cap section 87 substantially perpendicular to the annular beveled surface. The wider outer ends of the channels 90, 92 define connection ports that connect with connectors for securing liquid and air conduits. At their inner ends, the channels taper inwardly to a reduced diameter outlet section 98 that extends into an inner chamber 100 defined within the body 102 of the washing station 14. Nozzles may be provided at the inner ends of the inlets 98. The nozzles are configured to provide the required flow and jet characteristics of liquid or air into the chamber 100.

[0091] In the first stage of the cleaning program, cleaning liquid, either heated, cooled or at room temperature, is provided to the liquid inlet 90 and pumped through the inlet channel 98. A spray created by the liquid flow enters the chamber 100 and is directed to the tip section 22 of the probe 10. The timing of the liquid spray can be selectively varied and may be user defined. For example, spraying may be initiated once the sample probe 10 is fully inserted into the chamber 100. Alternatively, spraying may be initiated during or before the probe 10 is first introduced into the chamber, so that the probe 10 is sprayed directly along its length as it is inserted into the chamber 100. The downward angle of the liquid inlet 90 means that the jet is directed downwards into the tip section 22. This limits any bounce or upward spray through the inlet 94 without the seal, which is further limited by the tight fit between the probe 10 and the inlet opening 94. The lack of a seal prevents possible contamination of the clean probe 10 by contact with the seal. The sealant may mask contamination as the probe 10 is retracted from the chamber 100. The annular arrangement of multiple liquid inlets 90 around the cap means that liquid is sprayed all around the tip section 22. Liquid flowing off the tip section 22 flows downward to an outlet 108 through which it exits the chamber 100.

[0092] The controller is configured to execute a cleaning cycle for a predetermined period of time. Once the cleaning cycle is completed, a drying cycle is initiated. This may be initiated immediately or after a time interval provided to allow the bulk of the liquid to drain out of the tip section 22. Compressed air is pumped into the chamber through the air inlet 92, and annularly arranged air jets create a curtain of air that circles around the periphery of the tip section 22. Similar to the liquid inlet 90, the air inlet 92 is angled downwardly toward the base of the chamber 100. The air curtain is concentrated in the area of ​​the air inlet 92, but some drying occurs below the area of ​​the air inlet 92 due to the circulation of air created within the chamber 100. Once the air curtain is created by the air inlet 92, the probe 10 may be vertically retracted from the chamber 10. As the probe 10 retracts upward, the tip section 22 is pulled through the air curtain, resulting in drying along its entire length. To improve drying efficiency, the air supplied to inlet 92 may be heated or cooled before entering chamber 100. The wash / dry station 14 may also be used to take a sample from the probe 10 by passing a solvent through the probe. The liquid sample may be collected as it exits the base of chamber 100.

[0093] To allow the robotic arm to manipulate the sample probe 10, a probe adapter 18 is provided that is adapted to the sample probe 10 for use with the robotic arm, as shown in FIG. 9. The probe adapter or transport assembly 18 is also designed to transport the sample vessel 2 and / or both the sample vessel 2 and the probe 10 simultaneously. The probe adapter 18 includes a body 110 with a first pickup connector 112 extending upwardly from the body 110. The pickup connector 112 has a head 114 that is of the same configuration as the head 26 of the stem 20 of the probe 10. The adapter's pickup connector 112 is captured and connected by a fixed mechanical latch of the robotic arm 6.

[0094] A first one of the z-axis actuators of the robotic arm 6 is laterally separated from the second z-axis actuator by a distance D. An aperture 116 is formed in the body 110, the circular aperture 116 having a central axis separated by a distance D from the longitudinal axis of the adapter's pickup connector 112, thereby becoming coaxial with the second z-axis actuator when the probe adapter 18 is connected to the fixed latch mechanism of the first z-axis actuator. A hollow cylindrical wall 118 extends around the periphery of the aperture 116 upstanding from the upper surface of the probe adapter 18. The wall 118 is semi-annular with a gap and includes an upper surface 119. In use, when the second z-axis actuator moves downward through the aperture 116 to the release depth, a sliding collar of the release mechanism engages the upper surface 119 to release the spring-loaded latch and allow removal of the sample probe 10. Without the stop surface provided by this element of the probe adapter 18, it would be impossible for the standard z-axis actuator of the robotic arm 6 to release the sample probe 10, as is necessary for automated sampling of multiple samples.

[0095] 10, a cylindrical wall 123 extends downwardly from the underside of the body 110. A magnet or magnets 121 are provided at the lower edge of the wall 123. The diameter of the aperture 116 is selected to allow the probe 10 to extend unimpeded up through the aperture 116 and to be larger than the diameter of the probe 10. The probe adapter 18 also includes a barcode reader 122 positioned to read a recessed barcode section provided on the stem 20 of the probe 10. This allows each probe 10 to be tracked throughout the sample and analytical process.

[0096] In addition to the first probe 10 attached to the robotic arm 6 through the main aperture 116, an identical second probe can be connected to the robotic arm along a second axis 124 using a second z-axis actuator. This allows the robotic arm 6 to move to both sample probes 10 as well as to the sample vessel 2 at any one time.

[0097] In use, the probe adapter 18 is selected and picked up by the robotic arm 6 and a first z-axis actuator of the robotic arm lifts the probe adapter 18 by the pick-up connector 112. Preferably the diameter of the annular wall 123 is substantially equal to the diameter of the lid of the sample vessel. However, it may be of any suitable configuration such that at least a portion of the magnet section 121 can seat and engage the lid of the sample vessel 2 when the aperture 116 is aligned concentrically with the sample vessel 2. The probe adapter 18 may pick up the sample vessel 2 by positioning the underside of the wall 123 in contact with the cap 74 of the sample vessel 2, whereby the magnet section 121 is magnetically secured to the metallic cap of the sample vessel 2. This may be done with or without a sample probe 10 positioned on the sample vessel 2. The probe adapter 18 may be moved to pick up the probe 10 by aligning the aperture 116 concentrically with the axis of the probe 10. The stem 20 of the probe 10 can extend through the aperture 116 and then the z-axis actuator of the robotic arm 6 can capture the probe 10 by connecting to the head 26 of the stem 20. The probe 10 can be actuated in the z-axis through the aperture 116.

[0098] The probe adapter 18 may also capture the probe 10 and the sample vessel 2 when the probe 10 is inserted into the sample vessel 2 for sampling. In this arrangement, the probe adapter 18 may be lowered over the probe 10 until the magnet section 121 engages the cap of the sample vessel 2 through which the probe 10 extends. The probe 10 is then simultaneously engaged by the z-axis actuator, the probe adapter 18 is lifted by the z-axis actuator, and the sample vessel 2 is lifted directly by the cap of the sample vessel 2, rather than by the probe 10. However, it should be noted that the seal between the probe 10 and the sample vessel 2 is such that the sample vessel 2 may be lifted directly by the probe 10 as it is lifted by the z-axis actuator without weakening the seal between the lid.

[0099] The robotic arm 6 may be controlled and operated to select and pick up a probe adapter 18 from an adapter exchange station. The adapter exchange station houses the probe adapter 18 and a headspace syringe tool, as described in more detail below. The probe adapter 18 serves as an adapter configured to enable a standard robotic arm 6, typically used for syringe analysis, to pick up a sample probe 10. The probe adapter 18 is also configured to enable the robotic arm to pick up a sample vessel 2.

[0100] The advantage of using a mechanism similar to that used to capture and manipulate the syringe adapter is evident in that a series of operations utilizing the syringe and probe 10 can be performed automatically in sequence on a single sample or on a series of samples, increasing sample throughput and analytical flexibility. As an example, a syringe may be provided to enable headspace sampling. The needle of the headspace syringe is configured to be inserted through a septum sealing a sample container to obtain a sample of headspace gas. The headspace syringe is configured to be engaged and manipulated by the same robotic arm used to manipulate the probe 10.

[0101] In an alternative embodiment, as shown in FIG. 16, the adapter 318 includes a gripping tool 320 configured to grip the sample probe 310. The gripping tool 320 includes opposing fingers 322 movable between closed and open configurations to grip and release the sample probe 310. The gripping tool 320 includes gripping fingers 321 having tips 323 configured to firmly grip the head of the sample probe 310, thereby linearly securing the probe to the gripping tool 320. The probe adapter 318 includes a pickup connector 312 extending from the body 310. The pickup connector 312 actuates the probe adapter 318, which is configured to be captured and connected by a fixed mechanical latch of a robotic arm to lift and move the probe adapter 312. The probe adapter 318 further includes a second connector 324 projecting upwardly from the body 310 for operative connection with the gripping tool 320. The second connector 324 includes a connection head 326 of the same configuration as the connection head of the pickup connector 312 arranged to be connected by a robot.

[0102] The probe adapter 318 further includes a third connector 325. The third connector 325 includes a connection head 329 having the same configuration as the connection head of the pickup connector 312 arranged to be connected by a robot.

[0103] When connected by the robot, linear actuation of the third connector 325 by the robot rotates the gripping tool 320 about the vertical axis of the second connector 224. This rotation rotates the sample probe 310 which in turn positions the sample probe 310 in any orientation. This mechanism is used for automated reading of bar codes fitted to the body of the sample probe 310 or on the sample container 2.

[0104] When connected by the robot, linear actuation of the second connector 324 by the robot opens and closes the gripping tool 320. During a probe sampling cycle, the probe adapter 318 of the gripping tool is captured by the robot. The robot connects to the first connector 312 and the second connector 324. The robot may then pick up and release the sample probe and container as many times as the sample cycle requires by actuating the gripping tool 320 without disconnecting it from the probe adapter 318. The advantage of this arrangement is that it protects the robot's connector from wear, since it only needs to connect to the probe adapter once during a sampling cycle. In contrast, in the previous embodiment, the robot connects directly to the sample probe 10 and therefore has to connect and disconnect all of the probes 10 during a sampling cycle. It is significantly easier and cheaper to replace the tips of the gripping fingers due to wear, compared to replacing the robot's connector.

[0105] Each of the tips 323 of the gripping fingers 321 includes a channel 327 configured to receive a larger diameter section 328 of the head of the sample probe 310. As shown in Figure 17, the opposing distal ends 330 of the tips 323 each include a curved, cut-out section 332 that corresponds to the outer surface of the smaller diameter section 334 of the head of the probe 310. The axial end face 336 of the tip 323, which faces a sample vessel during use, includes an embedded magnet 338.

[0106] The magnet 338 is positioned to engage the cap 74 of the sample vessel 2. As shown in FIG. 18, the gripping tool 320 is moved into engagement with the cap 74. The magnet 338 located on the distal end face 336 of the finger tips 323 engages and magnetically connects with the metallic cap 74. Once magnetically secured, the gripping tool 320 can pick up the sample vessel 2. This allows the gripping tool to selectively capture either the sample vessel or the sample probe, allowing both to be robotically manipulated without the need to exchange probe adapters.

[0107] To facilitate the combined analysis of the sample liquid and headspace, the oven must be capable of accepting both the sample probe 10 and a headspace sampling syringe needle. The inlet aperture of the oven, configured for use with the adsorption sample probe 10, is not suitable for use with a syringe needle. A thin needle cannot create a seal in the relatively large inlet channel required for the sample probe 10. Therefore, an oven adapter 150 is provided, as shown in FIG. 11. The oven adapter 150 is positioned and secured within the inlet adapter of the oven 16. The oven adapter 150 has a contour corresponding to the shape of the top of the sample probe 10, and is secured and seals within the opening of the oven 16 in the same manner as the sample probe 10. The oven syringe adapter 150 has a central channel 152 in open communication with the heated chamber of the oven 16 and configured to accept a syringe needle 154. When the needle is inserted into the channel, a sealing arrangement is provided to maintain a seal between the outside atmosphere and the heated chamber of the oven. In the arrangement of Figure 11, the gas sealing arrangement between the syringe and the oven comprises a septum 156 held between the adapter body 158 and the top 160.

[0108] The adapter 150 is shown in FIG. 12 and fits into the opening of the oven 16. The adapter 150 fits and seals into the inlet in the same manner as the sample probe 10. The oven adapter 150 is held in place in the oven 16 by the same lid latch mechanism 161 as described above to hold the same probe 10 in the oven 16. The needle 154 passes through a septum 156 in the adapter assembly 150 which creates a seal between the syringe needle 156 and the interior of the oven 16. The sample is expelled from the syringe and enters the liner 162 of the oven 16 and is then scavenged by the carrier gas to the cold trap and then transferred to the gas chromatograph (GC) as described above.

[0109] The shape of the adapter head allows the adapter to be manipulated by the robotic arm 6 to automatically reconfigure the oven 16 for use in both syringe-based sampling and solid phase analysis during the same analysis without user intervention. It is envisioned that the same principles can be employed to configure sample inlets for operation with other sample extraction devices.

[0110] Similar to the probe sampling, another headspace sample may be applied to the focusing / cold trap and / or a second sorbent trap for storage and repeated analysis. Once the required sample is in the cold trap, the oven 16 is switched off from the carrier gas and the focusing trap is heated in a flow of carrier gas directed to the gas chromatograph (GC) column for analysis and / or a second sorbent trap for storage and repeated analysis. Once the sample collected in the cold trap is delivered to the gas chromatograph (GC) column or if another headspace sample is not required, the oven 16 is cooled. Once cooled, the robotic arm 6 engages the oven adapter 150 and the latch 161 is disengaged and the oven adapter 150 is removed to allow insertion of the required sample probe 10.

[0111] FIG. 13 illustrates a multiple tube sampling assembly 170 in which one or more of the samples detached from the sample probe 10 or obtained from a headspace sample may be collected into a recollection tube 172 filled with a sorbent for storage purposes. The recollection tubes 172 are loaded into a sample tube tray 174 configured to hold multiple recollection tubes 172. The sample tube tray 174 is inserted into a tray housing 176 capable of holding multiple sample tube trays 174. The recollection sample tube tray 174 is moved via an actuator to the current recollection sample tube 172 in a position that seals the nozzle 178 via a cap. A valve arrangement directs a portion or the entire sample from the oven 16 directly or via a cold trap to the tube 172 where analytes within the sample are selectively adsorbed to the sorbent material contained within the sample.

[0112] A desorption oven 180 heats the collection tube 172 so that the recollected sample may be re-desorbed back into the same or an alternative focusing device for reanalysis or another collection. In the same manner, it can be seen that samples collected in separate tubes in the embodiment can be analyzed and recollected.

[0113] Preferably, the sampling device also includes an alignment element that engages the sample probe when the sample probe is received in the sample vessel and aligned vertically so that it can be connected by a second vertical actuator. The sample probe is supported in the vessel by a flexible septum. In use, even if the sample probe is inserted into the vessel in a perfectly vertical orientation, over time it may begin to tilt away from the vertical axis, especially during stirring. If the sample probe is not aligned in the vertical axis, it is difficult for an actuator operating in the vertical axis to regain the sample probe.

[0114] The alignment elements may include first and second alignment elements movable in horizontal opposite directions to move to engage opposite sides of the sample probe, the alignment elements being movable between an aligned position in which the alignment elements engage the sample probe to hold it in a substantially vertical orientation and a released position in which the sample probe and sample vessel are raised vertically.

[0115] As shown in FIG. 14, an alignment mechanism 200 is provided for vertically aligning the sample probe 10 when it is received in the sample vessel 2, for example during stirring. The alignment mechanism 200 includes an upper alignment plate 202 arranged horizontally and a lower alignment plate 204 arranged parallel to the upper plate 202. The upper plate 202 includes an aperture 206 and the lower plate includes an aperture 208, both of which have a larger diameter than the sample vessel 2. The plates 202 and 204 are actuated to be movable in opposite horizontal directions. As shown in FIG. 15, the apertures 206 formed in the upper plate are substantially circular. Each aperture 206 includes a guide channel 210 extending therefrom. The upper plate 202 is horizontally movable on a longitudinal axis C. The guide channel 210 has a diameter substantially equal to the diameter of the stem of the probe 210 and extends from the aperture 210 in a common longitudinal direction corresponding to the longitudinal axis of movement C. The aperture 212 of the lower plate 206 is aligned with the aperture 210 of the upper plate 202 and is fully aligned with the aperture 210 in the first release position. The guide channel 214 of the aperture 212 extends in the opposite longitudinal direction to the guide channel 210. In the aligned position of FIG. 15, the guide channels 210 and 214 are aligned to define a circular aperture for receiving the sample probe 10. In the aligned position, the aperture 218 defined by the guide channels 210 and 214 is centered with the sampling axis of the sample container 2. Thus, the sample probe 10 is held at its lower and upper ends in the sampling axis of the sample vessel 2 by the apertures 218 in the alignment plates 202 and 204. In the released position, the primary apertures 202 and 204 align to define a channel through which the sample vessel can move vertically unhindered, thereby allowing the actuator 6 to lift the sample vessel 2 and sample probe 10 vertically through the alignment plates 202 and 204.

[0116] A sampling apparatus for adsorption sampling includes a sample vessel for containing a liquid to be sampled, a sample probe configured to be inserted into the sample vessel and having a probe section including an adsorbent material arranged to capture an analyte from the sample vessel, and an actuator configured to separately connect to and operate the sample vessel and the sample probe, the sample probe being removably connectable to the actuator such that the actuator can selectively and automatically connect and disconnect from the sample probe during use.

[0117] In the sampling device, the actuator is a three-axis robotic arm.

[0118] In the sampling device, the actuator includes a releasable connector and the sample probe includes a connector portion configured to be releasably retained by the releasable connector.

[0119] The sampling apparatus further comprises a sample probe adapter having a first connector configured to releasably connect to the actuator when the sample probe adapter is connected to the actuator such that the actuator can connect to and operate both the sample probe and the sample vessel, and a second connector configured to releasably connect to the sample vessel.

[0120] In the sampling device, the sample vessel includes a cap having a metallic element, and the second connector of the sample probe adapter comprises at least one magnet that is positioned to be magnetically secured to the metallic element of the sample vessel cap.

[0121] In the sampling apparatus, the actuators include first and second vertical actuators, and a first connector of the sample probe adapter is positioned to connect to the first vertical actuator.

[0122] In the sampling device, the sample probe includes a connection element configured to connect to a second vertical actuator.

[0123] In the sampling apparatus, the sample probe adapter is configured such that, when coupled to a first vertical actuator, a second vertical actuator is capable of vertical movement relative to the sample probe adapter.

[0124] In the sampling apparatus, the second vertical actuator includes a release mechanism arranged to release the sample probe from the second vertical actuator, and the sample probe adapter includes a stop element configured to engage with the release mechanism when the second vertical actuator moves downwardly relative to the sample probe adapter to operate the release mechanism such that the release mechanism releases the sample probe.

[0125] In the sampling apparatus, the sample probe adapter includes an aperture and extends along the sampling axis through the aperture, a stop element is disposed at least partially around a periphery of the aperture on an upper surface of the sample probe adapter, and a second vertical actuator engages with the release mechanism as it moves downwardly through the aperture to a released position.

[0126] In the sampling device, when the sample probe adapter is connected to a first actuator, at least a portion of the release mechanism is spaced radially outward of the aperture and the second actuator operates through a first range of vertical motion, in which the release mechanism remains vertically spaced above the stop element and is movable below a lower limit of the first range of motion to a released position in which at least a portion of the release mechanism spaced radially outward of the aperture engages the stop element.

[0127] In the sampling device, the stop element comprises an upstanding wall extending around at least a portion of the aperture, the wall having an upper surface arranged to engage the release mechanism.

[0128] In the sampling apparatus, the sample probe adapter includes a gripping mechanism configured to grip the sample probe to provide a releasable connection between the actuator and the sample probe, and the gripping mechanism includes a connection element configured to connect to a second vertical actuator to render the gripping mechanism operable by the second vertical actuator.

[0129] In the sampling device, at least one magnet of the sample probe adapter is provided in a gripping mechanism.

[0130] In the sampling device, the gripping mechanism includes movable gripping elements and at least one magnet is provided at a distal end of at least one of the gripping elements.

[0131] In the sampling apparatus, the sample vessel includes a sampling axis along which the sample probe is inserted into the sample vessel, the sample probe adapter includes a sampling axis that is aligned with the sampling axis of the sample vessel when the sample vessel connects to the second connector of the sample probe adapter, and the first connector of the sample probe adapter is spaced from the sampling axis such that the second vertical actuator is axially aligned with the sampling axis when the first connector is connected to the first vertical actuator.

[0132] In the sampling apparatus, the body of the sample probe adapter is configured such that when the first connector of the sample probe adapter is connected to the first vertical actuator, the body of the sample probe adapter is moved away from the sampling axis such that the sample probe can be actuated vertically along the sampling axis without interfering with the body of the sample probe adapter.

[0133] In the sampling device, the sample probe adapter and actuator are arranged such that when the first connector is connected to the first vertical actuator and the second connector is secured to the sample vessel, the second vertical actuator can independently vertically actuate the sample probe on the sample vessel.

[0134] A cleaning device for use in an automated sampling system comprises a chamber configured to receive at least a portion of an elongated, adsorbent sample probe, one or more liquid inlets configured to direct a flow of cleaning fluid into the chamber to wash the sample probe, and one or more air inlets positioned to direct a flow of air into the chamber to dry the sample probe.

[0135] In the washing device, the chamber includes an opening into which the sample probe is inserted and at least one fluid inlet is located adjacent to the opening.

[0136] In the cleaning device, at least one liquid inlet is positioned to direct a flow of cleaning liquid longitudinally inwardly towards the inner end of the chamber.

[0137] In the cleaning device, the chamber includes a longitudinal axis along which the sample probe extends when received within the chamber, and the cleaning device includes a plurality of liquid inlets arranged in an annular array coaxial with the longitudinal axis of the chamber, whereby a flow of liquid from each of the liquid inlets is directed radially inward.

[0138] In the cleaning device, the chamber includes a longitudinal axis along which the sample probe extends when received within the chamber, and the cleaning device includes a plurality of air inlets arranged in an annular array coaxial with the longitudinal axis of the chamber, whereby a flow of air from each of the air inlets is directed radially inward.

[0139] In the cleaning device, a plurality of air inlets are longitudinally aligned with a plurality of liquid inlets and arranged in a common annular array.

[0140] In the cleaning device, the liquid inlet and / or air inlet include nozzles located at their inner ends to create jets of liquid and / or air that are directed into the chamber.

[0141] In the cleaning device, the air inlets are arranged to create a radially directed curtain of air.

[0142] The cleaning device further includes a controller arranged to supply cleaning fluid to the liquid inlet to initiate a cleaning cycle and, following the cleaning cycle, to supply compressed air to the air inlet to initiate a drying cycle.

[0143] In the cleaning device, the chamber further comprises a drain disposed at an inner end of the chamber for removing cleaning fluid from the chamber.

[0144] The sorptive sampling device comprises a sample vessel for containing a sample having an opening and a sealing assembly including a first sealing membrane and a second flexible sealing element covering and sealing the opening; and a sample probe having an elongated body including a sorptive material and configured for insertion into the sample vessel, the elongated body having a lower section including the sorptive material and an upper section having a larger diameter than the lower section, the flexible sealing element including a preformed aperture for receiving the sample probe, the preformed aperture having a diameter less than a diameter of the upper section of the sample probe, the first sealing membrane is arranged to close and seal the vessel prior to sampling and is pierced by the sample probe upon insertion into the vessel, and the second flexible membrane is arranged to close and seal the vessel when the sample probe is inserted into the vessel, whereby the larger diameter upper section is received within the aperture.

[0145] In the sorptive sampling device, a first sealing membrane is positioned over the opening of the container, between the container and a second flexible sealing element.

[0146] The adsorption sampling device further includes a cap arranged to secure the sealing assembly onto the container, the sealing assembly being secured between the cap and the container, the cap including an opening having a larger diameter than the aperture of the second flexible sealing element.

[0147] In the sorptive sampling device, the diameter of the opening in the second sealing element is larger than the diameter of the lower section of the sample probe.

[0148] In sorptive sampling devices, the sample probe includes an axially disposed radially tapered section between the lower and upper sections, tapering from a larger diameter in the lower section to a larger diameter in the upper section.

[0149] The sorptive sampling device further comprises a sealing plug configured to block and seal the aperture of the second sealing element to allow sealing of the container after sampling and removal of the sample probe.

[0150] In the adsorptive sampling device, the second sealing element is bonded to the first sealing membrane.

Claims

1. A sampling device for adsorption sampling, comprising: a sample vessel containing the liquid to be sampled; a sample probe configured to be inserted into the sample vessel and having a probe section including an adsorbent material positioned to capture an analyte from the sample vessel; a robotic arm having first and second actuators; a sample probe adapter having a first connector configured to releasably connect to the first actuator and a second connector configured to releasably connect to the sample vessel; Including, a robotic arm configured to connect to and manipulate the sample vessel and the sample probe independently of one another via the sample probe adapter and the second actuator, and the sample probe adapter and the second actuator configured such that when the sample probe is received within the sample vessel, the robotic arm can simultaneously connect to the sample vessel and the sample probe via the sample probe adapter and the second actuator to manipulate both the sample probe and the sample vessel.

2. The sampling device of claim 1 , wherein the robotic arm is a three-axis robotic arm.

3. 3. A sampling device according to claim 1 or 2, wherein the second actuator includes a releasable connector, and the sample probe comprises a connector portion configured to be releasably retained by the releasable connector.

4. 4. A sampling device as claimed in claim 1, wherein the second connector of the sample probe adapter comprises at least one magnet for connecting to the sample vessel.

5. 5. A sampling device according to claim 1, wherein the first and second actuators are vertical actuators.

6. 6. The sampling apparatus of claim 1, wherein the sample vessel includes a first sampling axis along which the sample probe is inserted into the sample vessel, and the sample probe adapter includes a second sampling axis that is aligned with the first sampling axis of the sample vessel when the sample vessel connects to the second connector of the sample probe adapter, and the sample probe adapter is configured to allow vertical movement of the second actuator relative to the sample probe adapter along the first sampling axis when the sample probe adapter is connected to the first actuator.

7. 7. The sampling apparatus of claim 6, wherein the sample probe adapter and the second actuator are configured such that the second actuator extends through the sample probe adapter along the first sampling axis to connect to the sample probe.

8. The sampling apparatus of claim 7 , wherein the sample probe adapter includes an aperture extending along the first sampling axis, and the second actuator extends through the first sampling axis.

9. 9. The sampling apparatus of claim 8, wherein the second actuator includes a release mechanism arranged to release the sample probe from the second actuator, and the sample probe adapter includes a stop element configured to engage with the release mechanism when the second actuator moves downwardly through the sample probe adapter to a release position to operate the release mechanism such that the release mechanism releases the sample probe.

10. 10. The sampling device of claim 9, wherein the stop element is positioned around the periphery of the aperture on the upper surface of the sample probe adapter and is positioned to engage with the release mechanism when the second actuator moves downward through the aperture to the release position.

11. 11. The sampling device of claim 10, wherein when the sample probe adapter is connected to the first actuator, at least a portion of the release mechanism is released radially outward of the aperture, and when the second actuator moves to the release position, at least a portion of the release mechanism released radially outward of the aperture engages with the stop element.

12. A sampling device as claimed in any one of claims 9 to 11, wherein the stop element comprises an upstanding wall extending around at least a portion of the aperture, the upstanding wall having an upper surface arranged to engage the release mechanism.

13. 13. A sampling apparatus as claimed in any one of claims 6 to 12, wherein the first and second actuators are spaced apart from each other and the first connector of the sample probe adapter is spaced apart from the first sampling axis by a distance corresponding to the spacing between the first and second actuators such that the second actuator is axially aligned with the first sampling axis when the first connector is connected to the first actuator.

14. 14. The sampling apparatus of claim 13, wherein the body of the sample probe adapter is configured such that when the first connector of the sample probe adapter is connected to the first actuator, the body of the sample probe adapter is moved away from the first sampling axis such that the sample probe can be actuated vertically along the first sampling axis without interference with the body of the sample probe adapter.

15. 15. The sampling device of claim 14, wherein the sample probe adapter and the second actuator are positioned such that when the first connector is connected to the first actuator, the second connector is secured to the sample vessel, and the sample probe is received within the sample vessel, the second actuator can vertically actuate the sample probe independent of the sample vessel.

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