TOF sensor with test transmitter

Abstract

To allow a sensor for monitoring a monitoring region to zip the functional unit of the sensor itself.SOLUTION: The sensor includes: a sender 20 for sending radiation to the inside of a monitoring region to make the radiation reflected by an object in the monitoring region; a test sender 30 for sending a test signal containing radiation; a receiver 40 for receiving the radiation of the sender reflected by the object or for receiving the radiation of the test sender; and an evaluation device 50 for determining a distance value based on the delay of the passage time or the modulation phase between the sent radiation and the received radiation of the sensor. The sensor also includes a memory 60 for storing the expectation value for the expected distance value of the received test signal; and a comparison device 70 for comparing the distance value and the expectation value based on the received test signal and outputting a safety signal based on the comparison.SELECTED DRAWING: Figure 1

Description

Detailed Description of the Invention

[0001] The present invention relates to a sensor that monitors a monitoring area and has a test transmitter for checking itself. Sensors of the cited kind are known from the prior art: EP 2 453 260 by the applicant discloses a sensor in which a second transmitter applies a test signal to the receiver of the sensor, the sensor checking its own condition using the received radiation intensity.

[0002] It is an object of the present invention to provide an improved sensor of the kind cited. This object is achieved on the basis of a sensor of the initially cited kind by a sensor according to claim 1. Advantageous configurations are specified in the further dependent claims.

[0003] The sensor according to the invention is a sensor for monitoring a monitoring area, comprising a transmitter, a test transmitter, a receiver, an evaluation device, a memory and also comprising a comparison device. The units cited are functional units. The devices of the sensor may be separate from one another, integrated into one another or contain one another. The devices, or parts of the devices, may be realized inside or outside the housing of the sensor.

[0004] The transmitter is designed to transmit radiation into the monitoring area, which is reflected by an object in the monitoring area and then partially reflected back to the sensor. The test transmitter is configured to transmit a test signal comprising radiation. The receiver is configured to receive the transmitter radiation reflected by one or more objects in the monitoring area and is also configured to receive the test transmitter radiation. In this case, the transmitter may be designed to precondition or preprocess the received signal in a predetermined manner. The evaluation device is configured to determine the distance value based on a transit time delay or a modulation phase delay between the radiation transmitted by the transmitter or the test transmitter and the radiation received by the receiver. The memory is configured to store an expectation value for the expected distance value of the received test signal. The comparison device is configured to compare the distance value based on the test signal received by the receiver with the expectation value and to output a safety signal based on this comparison.

[0005] The comparator may be configured to output a safety signal if the distance value according to the received test signal differs from the expected value by more than a tolerable difference. The comparison device may be designed to obtain the distance value from the test signal it receives from the evaluation device, or to generate this value based on the output signal of the receiver itself. The test transmitter, memory and / or comparison device may be in the form of an integrated self-test device.

[0006] The sensor may provide the advantage that it can itself check some of its functional units, the sensor may provide the advantage that it can check the correct operation of the receiver and / or the correct operation of the evaluation device.

[0007] The test transmitter is preferably arranged to irradiate the receiver at a constant distance, in other words there are no reflections from moving objects that may change the beam path, this has the advantage that the receiver is always exposed to the same irradiation by the test transmitter and this same irradiation can be more easily compared with the expected value.

[0008] The test transmitter is preferably arranged to irradiate the receiver directly or by constant reflection. The test transmitter is preferably arranged to irradiate the receiver by reflection at one or more surfaces in the housing of the sensor. The test transmitter, receiver and receiver optics are preferably arranged such that the radiation of the test transmitter is reflected by an interface between the receiver optics and the receiver, in particular by an outer lens surface of the receiver optics facing the receiver. The test transmitter and receiver are preferably completely surrounded by the housing and an element blocking this housing.

[0009] The radiation of the transmitter and / or test transmitter is preferably modulated, in particular intensity modulated, in particular at 20 MHz. This has the advantage that the receiver and evaluation device can receive and evaluate the phase delay of the modulation intensity between the transmission by the transmitter and / or test transmitter and the receiver. This principle is also called Time of Flight (TOF).

[0010] The radiation is preferably infrared radiation, so that the radiation is invisible and therefore not unpleasant to people. The sensor preferably comprises a device for synchronization between the transmitter and / or the test transmitter and the receiver, which device is designed to synchronize the modulation, the pattern of modulation and / or the other pattern of radiation of the transmitter and / or the test transmitter with the receiver or to synchronize it / them with a certain time delay. This has the advantage that the phase delay between the transmitted light and the received light can be more easily determined. The other pattern of radiation may be the time of emission start.

[0011] The sensor preferably comprises a device for synchronization between the test transmitter and the receiver, which device is designed to synchronize the modulation, the pattern of modulation and / or another pattern of radiation of the test transmitter with the receiver with a certain time delay different from the synchronization between the transmitter and the receiver. In particular, the time delay of the synchronization between the test transmitter and the receiver can be longer than the time delay between the transmitter and the receiver. This can also easily occur due to other switching times of the assembly of the operating electronics for the test transmitter. In particular, the trigger of the synchronization can arrive at the test transmitter later than the receiver. This simulates a time of flight of radiation from the test transmitter to the receiver that is longer by the time delay. This has the advantage that the expected value is provided with values ​​that are easier to process, in particular corresponding to a surface at an average distance to the monitoring area.

[0012] The receiver is preferably in the form of a receiver matrix having receiver matrix elements for receiving individual image element points, in particular for recording a 3D image, which has the advantage that the monitored area can be monitored in detail.

[0013] The evaluation device is preferably designed to determine values ​​for individual receiver elements, for all receiver elements or in each case for groups of receiver elements, in particular for determining a 3D image, which has the advantage that the monitoring area can be monitored in detail.

[0014] The sensor is preferably designed such that the expected value is determined by one or more receptions of the radiation of the test transmitter, in particular by an evaluation device, in particular corresponds to a function, in particular an averaged, of a value or values ​​of the evaluation device upon reception of one or more test signals by the receiver, which has the advantage that the expected value is easier to define and / or is more accurate.

[0015] The sensor is preferably designed such that the expected value has a minimum and a maximum value or an average value with a difference value (threshold), in particular a single value for some, each or a group of the receiver matrix elements, in particular representing the shape of a surface, in particular the shape of a plane or a section of a space enclosed by two surfaces or planes. This has the advantage that the expected value is of a type that corresponds to the value or image that the evaluation device outputs with the test signal. This has the advantage that the expected value can be more easily compared with the value with the received test signal.

[0016] The sensor is preferably designed to activate the test transmitter instead of the transmitter, which has the advantage that the transmitter does not disturb the receiver when it is receiving the test signal of the test transmitter.

[0017] The sensor is preferably designed to activate the test transmitter with an activation signal. The sensor is preferably designed to activate the test transmitter periodically, in particular every 100 milliseconds, which has the advantage that the sensor always operates correctly or is deactivated according to a safety signal.

[0018] The sensor is preferably designed to monitor the opening area or the surrounding area of ​​a door or gate. Further features of the invention are clearly shown in the drawings.

[0019] Drawing Overview Exemplary embodiments of the invention are depicted in the drawings and are explained in more detail below. Identical reference symbols in the various figures indicate corresponding elements in this case. The figures are as follows: [Brief description of the drawings]

[0020] [Figure 1] 1 shows a three-dimensional view of a sensor according to the invention; [Diagram 2] 2 shows a cross section of the sensor of FIG. 1. [Diagram 3] 3 shows a detail of the cross section of FIG. 2. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0021] [Detailed description of the drawings] FIG. 1 shows a partially cut away three-dimensional view of a sensor 10 according to the invention. The sensor has a housing 11 within which is a circuit board 12. Disposed within the housing are a transmitter 20, a test transmitter 30, a receiver 40, an evaluation device 50, a memory 60, a comparison device 70, and a synchronization device 80.

[0022] The transmitter 20 comprises one or three VCSEL semiconductor lasers 22 on one of the circuit boards 12 which are activated by transmitter electronics 21 (not shown) on the circuit board 12 and emit their radiation through transmitter optics 22 into the monitored space in front of the sensor.

[0023] The transmitter electronics activates the VCSEL semiconductor laser to transmit intensity modulated radiation at a modulation frequency of 20 MHz. The optical wavelength of the VCSEL semiconductor laser is in the infrared.

[0024] The test transmitter 30 comprises an LED 32 on one of the circuit boards 12, which is activated by test transmitter electronics 31 (not shown) on one of the circuit boards 12. The test transmitter electronics activate the LED so that it transmits intensity modulated radiation as a test signal at the same modulation frequency as the transmitter. The optical wavelength of the LED is in the infrared, similar to the optical wavelength of the VCSEL.

[0025] A synchronizer 80 is located on one of the circuit boards 12 and is shown by a symbol only. This synchronizer is designed to output a signal or a signal train to the transmitter or test transmitter and to the receiver in order to synchronize the receiver with the modulation of the transmitter radiation, so that the receiver can determine the phase shift in the radiation between the transmitter and the receiver. As a result of other switching times of the assemblies of the operating electronics, the synchronization signal arrives at the test transmitter later than the receiver by a time delay.

[0026] The receiver 40 comprises a sensor chip 41 on one of the circuit boards 12, which is activated and read by receiver electronics 42 (not shown) and receives the reflected radiation of the transmitter through receiver optics 43 from the monitored space in front of the sensor. The sensor chip 41 is a sensor matrix in which sensor pixels are arranged in a matrix. The sensor pixels are two-tap demodulation pixels. The receiver receives a signal of a synchronizer 80 and synchronizes the sensor pixels with the modulation of the radiation transmitted by the transmitter or test transmitter. In this way, the sensor chip is designed to output for each sensor pixel an output signal which corresponds to the phase difference between the radiation emitted by the transmitter or test transmitter and the radiation received by the receiver.

[0027] The evaluation device 50 is arranged on one of the circuit boards 12 and is shown only by symbols. This evaluation device receives the output signal of the receiver for each sensor pixel and calculates a distance value for each pixel on the basis of this. This distance value corresponds to the distance of the object mapped by the pixel in the monitored space that reflects the radiation of the transmitter back to the receiver. In this way, the evaluation device calculates a 3D map of the monitored space, which represents the distance of the mapped object in divisions of a scale or in millimeters. In the case of irradiation by a test transmitter, the transmitter is stopped and the evaluation device calculates a 3D surface that substantially corresponds to the average distance in the monitored space on the basis of the time delay. This 3D map is the surface detected by the sensor, i.e. the 3D surface. In the case of a sensor matrix, this surface can be the distance values ​​that the evaluation device determines.

[0028] The evaluation device is designed to output a control signal if one of the distance values ​​associated with the sensor pixels falls below a certain threshold value. A memory 60 is located on one of the circuit boards 12 and is shown symbolically only. This memory contains specific distance values. The expected values ​​can be distances, surfaces at specific distances, or 3D maps.

[0029] The comparison device 70 is located on one of the circuit boards 12 and is shown only by reference numerals. This comparison device is designed to compare the distance values ​​measured by the receiver and calculated by the evaluation device with the expected values ​​in the memory during irradiation with a test signal by the test transmitter and to output a safety signal based on this comparison. In particular, the comparison device outputs a safety signal if the evaluation device does not output a 3D map that corresponds to the 3D map of the expected values ​​in the case of the test signal within a certain threshold.

[0030] FIG. 2 shows a cross section of the sensor of FIG. 1 to make it easier to associate the details of FIG. 3 in the region of the test transmitter 30 and receiver 40. FIG. 3 shows a detail of the cross section of FIG. 2, including the beam path 33 of the LED 31 of the test transmitter 30.

[0031] The LED 31 of the test transmitter 30 is located on the same circuit board 12 as the sensor chip 41 of the receiver 40 and in close physical proximity to this sensor chip. The receiver optics 43 of the receiver 40 insulate the housing 11 of the sensor 10 from the outside. The LED 31 of the test transmitter 30 and the sensor chip of the receiver are not physically insulated from each other, but are completely and tightly enclosed by the housing and the receiver optics that insulate the housing.

[0032] The LED 31 of the test transmitter 30 transmits radiation for a test signal, which is reflected towards the sensor chip 41 of the receiver 40 by a surface of the transmitter optics 43 pointing towards the sensor chip 41, as shown in beam path 33. The LED, the transmitter optics and the sensor chip are rigidly coupled to each other, which means that the beam path between the LED and the sensor chip does not change.

[0033] The synchronizer 80 synchronizes the receiver with the test transmitter in the same way as the transmitter, but the synchronization of the test transmitter is always somewhat delayed compared to the transmitter. As a result, the receiver generates an output signal for each sensor pixel that corresponds to a distance that is longer than the length of the beam path between the LED of the test transmitter and the sensor chip, specifically a distance within the central region of the range of the monitoring area. The 3D map generated by the test transmitter is therefore a 3D map that is substantially more remote compared to the real one. As a result, the processing of the distance values ​​by the sensor can be simpler.

[0034] To generate the expected value, the test transmitter transmits a test signal which is received by the receiver and evaluated by the evaluation device. In the process, the 3D map received is approximately equal to a plane with regular intervals and is stored as expected value in the memory as interval values. The expected value can be read from the sensor and averaged with a number of expected values ​​stored externally and generated in this way to generate an average expected value. Sensors of the same type according to the invention are loaded externally with this average expected value, which means that the generation of the expected value in these sensors can cease.

[0035] During operation of the sensor, the transmitter is shut off approximately every 100 milliseconds, and during the transmitter pauses, the test transmitter transmits a test signal of less than 1 millisecond duration. The receiver and evaluation device detect and calculate a 3D map of the substantially more distant locations detected by the receiver, as described above.

[0036] The comparator 70 now accepts a substantially more distant 3D map of the test signal and compares its 3D surface with the interval value of the expected value, where if the 3D surface of the 3D map of the test signal differs from the expected value by more than a predetermined threshold difference for a certain number of sensor pixels, the comparator outputs a safety signal, the effect of which is that the sensor switches to a safe mode, outputs its error status for external identification, and does not output measurements or commands based on the measurements until there is a reset.

[0037] [Reference code list] 10...sensor, 11...housing, 12...circuit board, 20...transmitter, 21...transmitter electronics, 22...VCSEL, 23...transmitter optics, 30...test transmitter, 31...test transmitter electronics, 32...LED, 33...beam path of test signal, 40...receiver, 41...sensor chip, 42...receiver electronics, 43...receiver optics, 50...evaluation device, 60...memory, 70...comparison device, 80...synchronization device.

Claims

1. A sensor for monitoring a monitoring area, comprising: a transmitter (20) for transmitting radiation into the monitored area for reflection off objects in the monitored area; a test transmitter (30) for transmitting a test signal comprising radiation; a receiver (40) for receiving the radiation of the transmitter or the radiation of the test transmitter reflected by the object; an evaluation device (50) for determining a distance value based on a delay in transit time or modulation phase between the transmitted radiation and the received radiation of the sensor; Equipped with moreover, a memory (60) for storing expectations for the distance values ​​expected for the received test signals; a comparison device (70) for comparing a distance value based on the received test signal with the expected value and outputting a safety signal based on this comparison; a device (80) for synchronization between said transmitter and / or said test transmitter and said receiver; Designed to provide The expected value is determined by one or more receptions of radiation from said test transmitter; determined by the evaluation device, corresponds to a value of the evaluation device, a function of a plurality of values, or an average of the plurality of values ​​upon receipt of one or more test signals by the receiver; The synchronization device synchronizes the modulation, the pattern of modulation, and / or another pattern of the radiation of the test transmitter with a particular time delay and forwards a synchronization trigger to the test transmitter later than the receiver by the time delay to simulate a time of flight of the radiation from the test transmitter to the receiver that is longer by the time delay compared to the case without the time delay.

2. 2. The sensor of claim 1, The test transmitter comprises: arranged to irradiate said receiver at a constant distance (33); 4. A sensor arranged for direct radiation of the receiver or for radiation by constant reflection.

3. The sensor according to claim 1 or 2, A sensor, characterised in that the radiation of the transmitter and / or the test transmitter is modulated.

4. The sensor according to any one of claims 1 to 3, A sensor characterized in that the receiver is designed as a receiver matrix having receiver matrix elements for receiving individual image element points and for recording a 3D image.

5. The sensor according to any one of claims 1 to 4, the receiver being in the form of a receiver matrix; A sensor, characterized in that the evaluation device is designed to determine values ​​for individual receiver elements, for all receiver elements or for groups of receiver elements in order to determine a 3D image.

6. The sensor according to any one of claims 1 to 5, The expected value is having a minimum and a maximum value, or an average value with a difference value; A sensor characterized by having a single value for some, each, or groups of receiver matrix elements.

7. The sensor according to any one of claims 1 to 6, A sensor designed to activate the test transmitter with an activation signal on behalf of the transmitter.

8. The sensor according to any one of claims 1 to 7, A sensor characterized in that it is designed to monitor the opening area or surrounding area of ​​a door or gate.

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