Seed layer for copper interconnects

Abstract

To provide methods for forming a copper seed layer having improved anti-migration properties.SOLUTION: A method includes forming a first copper layer after forming a barrier layer in a feature, forming a ruthenium layer over the first copper layer in the feature, and forming a second copper layer on the ruthenium layer in the feature. The ruthenium layer substantially locks the copper layer below a prescribed place in the feature, substantially preventing physical migration of the copper layer.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] TECHNICAL FIELD

[0001] Embodiments described herein relate generally to the field of semiconductor device manufacturing, and more specifically to methods of forming seed layers for copper interconnects. [Background technology]

[0002]

[0002] As circuit density increases and transistor dimensions continue to shrink for next generation devices, the resistance and conductivity of wire interconnects begin to dominate device performance with respect to key device performance criteria including power consumption, resistance-capacitance (RC) delay, and reliability. Copper generally exhibits low resistance and high conductivity, making it one of the materials utilized as wire interconnects in advanced USLI and VSLI technologies. In many cases, copper interconnects are formed by depositing a copper seed layer into openings formed on the material surface of a substrate prior to electroplating bulk copper on top of the copper seed layer or prior to reflowing the bulk copper.

[0003] Typically, the copper seed layer carries the current required for the subsequent electroplating process or serves as a wetting layer to promote copper reflow into the opening formed in the material surface of the substrate. Gaps in the copper seed layer coating on the walls or base of the opening lead to undesired voids in the bulk copper material of the interconnect structure. Voids or coating gaps in the bulk copper material can cause electromigration failure of the copper structure, rendering the resulting device useless or poorly performing. Causes of copper seed layer coating gaps include one or both of copper agglomeration or discontinuous deposition. Copper agglomeration occurs when the deposited copper coalesces in some areas into a thick coating by pulling the copper away from the surrounding areas. Discontinuous deposition on the walls of the opening is typically due to the shadow effect inherent in the physical vapor deposition (PVD) process of the copper seed for a given geometry of the opening.

[0004]

[0004] A conductive liner, such as a metal liner, deposited on a copper seed layer fills gaps in the seed layer coating on the walls or base of an opening, thereby reducing voids in the bulk copper material during a subsequent electroplating process. However, a conductive liner deposited between the copper seed layer and the bulk copper layer undesirably creates an interfacial liner / copper layer between the copper seed layer and the bulk copper layer. This interfacial layer undesirably reduces the total copper line width and increases the line resistance of the subsequently formed copper interconnect.

[0005] Therefore, what is needed in the art are improved copper seed layers and methods of forming improved copper seed layers. Summary of the Invention

[0006]

[0006] This disclosure generally describes a method for forming a ruthenium doped copper seed layer.

[0007] In one embodiment, a method of forming an interconnect structure is presented. The method includes placing a patterned substrate having an opening formed in a material layer in a first processing chamber and forming a seed layer on walls of the opening. Forming the seed layer on walls of the opening includes forming a first copper layer, forming a ruthenium layer on the first copper layer, and forming a second copper layer on the ruthenium layer.

[0008] In another embodiment, a method of forming a device includes depositing a first copper layer over a patterned substrate including a material layer having an opening formed therein and a barrier layer disposed over the material layer, depositing a ruthenium layer over the first copper layer, and depositing a second copper layer over the ruthenium layer. In some embodiments, the method further includes depositing the copper layer in the opening using an electrodeposition process, a reflow gap-fill process, or a combination thereof.

[0009]

[0009] In another embodiment, a method for forming a copper interconnect includes placing a patterned substrate having an opening formed in a material layer of the substrate in a process chamber and forming a seed layer on a wall of the opening. Forming a seed layer on a wall of the opening includes depositing a first copper layer on the patterned substrate, depositing a ruthenium layer on the first copper layer, and depositing a second copper layer on the ruthenium layer. Depositing the first copper layer includes sequentially exposing the patterned substrate to a first reactive precursor comprising a copper-containing organometallic and a second reactive precursor comprising hydrogen. Depositing the ruthenium layer includes sequentially exposing the first copper layer to a third reactive precursor comprising a ruthenium-containing organometallic and a fourth reactive precursor comprising hydrogen. Depositing the second copper layer includes sequentially exposing the ruthenium layer to the first reactive precursor and the second reactive precursor.

[0010]

[0010] In some embodiments, the methods described herein further include depositing a copper layer in the opening using an electrodeposition process, a reflow gap-fill process, or a combination thereof.

[0011] In another embodiment, a device includes a substrate characterized by a patterned surface having a plurality of openings formed in a material layer of the substrate, and a seed layer disposed on walls of the openings, where the seed layer includes a first copper layer, a ruthenium layer disposed on the first copper layer, and a second copper layer disposed on the ruthenium layer.

[0012]

[0012] In order that the above-mentioned features of the present disclosure may be understood in detail, a more particular description of the present disclosure briefly summarized above may be obtained by referring to the embodiments, some of which are illustrated in the accompanying drawings. However, it should be noted that the accompanying drawings illustrate only typical embodiments of the present disclosure, since the present disclosure may admit of other equally effective embodiments, and therefore should not be considered as limiting the scope of the present disclosure. [Brief description of the drawings]

[0013] [Figure 1] FIG. 1 is a flow diagram illustrating a method of forming a ruthenium doped copper seed layer, according to one embodiment. [Figure 2A] 1 illustrates elements of the method described in FIG. 1 according to one embodiment. [Figure 2B] 1 illustrates elements of the method described in FIG. 1 according to one embodiment. [Figure 2C] 1 illustrates elements of the method described in FIG. 1 according to one embodiment. [Figure 2D] 1 illustrates elements of the method described in FIG. 1 according to one embodiment. [Figure 2E] 1 illustrates elements of the method described in FIG. 1 according to one embodiment.

[0014]

[0015] To facilitate understanding, wherever possible, like reference numerals have been used to designate like elements common to the figures. It is contemplated that elements and features of one embodiment may be beneficially incorporated in other embodiments without further recitation. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0015]

[0016] Embodiments of the present disclosure generally describe methods for forming copper interconnect structures, and in particular, methods for forming a ruthenium-doped copper seed layer including a plurality of copper layers and at least one ruthenium layer disposed between the copper layers. The methods described herein may be performed in a physical vapor deposition (PVD) processing chamber, a chemical vapor deposition (CVD) processing chamber, an atomic layer deposition (ALD) processing chamber, or a combination thereof. In one embodiment, the PVD, CVD, and ALD processing chambers are, respectively, an ENDURA® PVD processing chamber, a PRODUCER® CVD processing chamber, and an OLYMPIA® ALD processing chamber, all available from Applied Materials, Inc. of Santa Clara, Calif.

[0016]

[0017] The ruthenium doped seed layer formed according to the method described herein allows for continuous seed layer coverage on the walls of the interconnect opening and facilitates liner thickness reduction. As used herein, the ruthenium doped seed layer includes at least one ruthenium layer deposited between a first copper layer and a second copper layer. Typically, the first and second copper layers are deposited using a PVD process, a CVD process, or an ALD process, and the ruthenium layer is deposited using a CVD process or an ALD process. Since copper and ruthenium are generally not miscible with each other, the ruthenium layer effectively pins the copper of the first or second layer at the grain boundaries formed between them, fixing the copper in place, preferably with the ability to prevent copper electromigration. Pinning the copper to the grain boundaries formed between the copper and the ruthenium layer prevents the copper in the copper layer from migrating and forming undesirable copper agglomerates. Additionally, preventing copper electromigration using the methods described herein allows for increased circuit density and improved reliability by preventing circuit density related device failures.

[0017]

[0018] Further advantages of copper agglomeration suppression using the embodiments described herein include the ability to reduce the thickness of a liner layer disposed over a dielectric layer having an opening formed therein. By reducing the thickness of the liner layer, the bulk copper volume of the subsequently formed interconnect can be increased. This increased bulk copper volume is desirable to reduce the line resistance of the opening. Pinning of the copper layer is desirable to eliminate gaps in the coverage of the walls of the opening of the interconnect feature. Eliminating gaps in coverage caused by copper migration is desirable to eliminate or reduce voids that form in the bulk copper material of the copper interconnect during subsequent electrodeposition or reflow / gap-fill processes. Advantageously, the use of ruthenium in the seed layer does not adversely affect the line resistance of the bulk copper layer because ruthenium diffuses into copper more slowly than other dopants such as cobalt or manganese. Additionally, the ruthenium doped seed layer formed according to the described embodiments provides a relatively thin continuous surface that facilitates subsequent copper reflow / gap-fill processes.

[0018]

[0019] Figure 1 is a flow diagram describing a method of forming a ruthenium doped seed layer according to one embodiment, and Figures 2A-2E show elements of the method described in Figure 1.

[0019]

[0020] The method 100 includes, at operation 110, placing a patterned substrate in a process chamber. The patterned substrate 200 is shown in FIG. 2A and includes a substrate 201, a material layer 209 formed on the substrate 201, one or more openings 205 formed in the material layer 209, and a barrier layer 206 disposed thereon, lining the openings 205 in the material layer 209. As used herein, the material layer 209 includes one or more dielectric layers, such as a first dielectric layer 202 and a second dielectric layer 204. Typically, the one or more dielectric layers 202, 204 are formed of a material selected from the group consisting of silicon oxide, SiN, SiOC, SIC, low-k polymers such as polyamides, and combinations thereof.

[0020]

[0021] In some embodiments, the material layer 209 further includes an etch stop layer 203 disposed between the first dielectric layer 202 and the second dielectric layer 204. A barrier layer 206 disposed over the material layer 209 prevents copper atoms from diffusing from a subsequently deposited copper layer into the surrounding dielectric layers 202, 204. Typically, the barrier layer 206 includes one or more of a metal, a metal nitride, a metal alloy, or a combination thereof. In some embodiments, the barrier layer 206 is selected from the group consisting of tantalum, tantalum nitride, tungsten, titanium, titanium tungsten, titanium nitride, tungsten nitride, titanium copper, and combinations thereof. In some embodiments, the barrier layer includes tantalum nitride. The barrier layer 206 is deposited using any suitable method, such as chemical vapor deposition (CVD), physical vapor deposition (PVD), atomic layer deposition (ALD), or a combination thereof.

[0021]

[0022] The method 100 includes, at operation 120, forming a seed layer 207 over the barrier layer 206. Figure 2B illustrates the seed layer 207 disposed on the barrier layer 206 of the patterned substrate 200. Figure 2E is an enlarged view of a portion of Figure 2B.

[0022]

[0023] The method 100 includes, at operation 130, depositing a first copper layer 207a over the barrier layer 206 of the patterned substrate 200. Herein, the first copper layer 207a is deposited using an atomic layer deposition (ALD) process that includes sequentially exposing the patterned substrate 200 to a first reactive precursor that includes a copper-containing organometallic, and then to a second reactive precursor that includes a hydrogen-containing gas to form a copper film. Examples of copper-containing organometallic gases include bis(dimethylamino-2-n-butoxy)copper (Cu(DEAB)2), bis(ethylmethylamino-2-n-butoxy)copper, bis(dimethylamino-2-propoxy)copper (Cu(DMAP)2), bis(dimethylamino-2-n-butoxy)copper (Cu(DMAB)2), bis(dimethylamino-2-ethoxy)copper, bis(ethylmethylamino-2-propoxy)copper (Cu(EMAP)2), bis(diethyl ...DEAB)2), and bis(ethylmethylamino-2-propoxy)copper (Cu(DMAB)2). -Examples of hydrogen-containing precursors include copper(II), ...

[0023]

[0024] In some embodiments, during deposition of the first copper layer 207a, the process chamber is maintained at a pressure between about 1 Torr and about 30 Torr, and the patterned substrate is maintained at a temperature between about 50°C and about 400°C. The flow rates of the first and second reactive precursors are typically between about 3000 sccm and about 9000 sccm for a process chamber configured to process a 300 mm diameter substrate, and are appropriately increased or decreased for substrates of different sizes. In some embodiments, the process chamber is a plasma enhanced process chamber, and an electrode disposed within the process chamber is coupled to a plasma power source. The plasma power source provides between about 100 W and 1000 W, for example about 400 W, at a frequency of 13.56 MHz to initiate and sustain the precursor plasma process. In some embodiments, the first copper layer 207a has a copper purity of greater than 99%. In other embodiments, the first copper layer is deposited using a physical vapor deposition (PVD) process or a chemical vapor deposition (CVD) process. For example, in one embodiment, the first copper layer 207a is deposited using a PVD process, in which the target is a pure copper target or a copper alloy target, such as a Cu-Al target with between about 0.1% and about 3% Al, or a Cu-Mn target with between about 0.1% and about 3% Mn. In this embodiment, the target is coupled to a DC power of between about 20 kW and about 40 kW, and the substrate is coupled to an AC bias power of between about 50 W and about 1500 W. In another embodiment, the first copper layer 207a is deposited using a CVD or PVD process.

[0024]

[0025] The method 100 includes, in operation 140, depositing a ruthenium layer 207b on the first copper layer 207a. Here, the ruthenium layer 207b is deposited in the same process chamber used to deposit the first copper layer 207a. Typically, the process chamber is purged with an inert gas, such as argon, between the deposition of the first copper layer 207a and the deposition of the ruthenium layer. In some embodiments, the ruthenium layer 207b is deposited using an ALD process that includes alternately and sequentially exposing the patterned substrate 200, on which the first copper layer 207a has been deposited, to a third reactive precursor comprising a ruthenium-containing organometallic, and then to a fourth reactive precursor comprising hydrogen, such as hydrogen gas. Examples of ruthenium-containing organometallics include methyl-cyclohexadienyl chloride, ... workman Ruthenium tricarbonylcyclohexadiene workman Examples of suitable ruthenium compounds include ruthenium tricarbonyl, butadiene ruthenium tricarbonyl, dimethylbutadiene ruthenium tricarbonyl, modified dienes with Ru(CO)3, and combinations thereof.

[0025]

[0026] Typically, during deposition of the ruthenium layer 207b, the process chamber is maintained at a pressure between about 1 Torr and about 50 Torr, and the patterned substrate is maintained at a temperature between about 100°C and about 400°C. The flow rates of the third and fourth reactive precursors are between about 3000 sccm and about 9000 sccm for an ALD process chamber configured to process a 300 mm diameter substrate, and are appropriately scaled for substrates of different sizes. In some embodiments, an electrode disposed within the process chamber is coupled to a plasma power source providing between about 100 W and 1000 W, e.g., about 400 W, at a frequency of 13.56 Mhz, to initiate and sustain a plasma treatment of the delivered precursor gases. In some embodiments, the process space is purged with an inert gas, such as argon, during alternating exposure to the third and fourth precursors. In other embodiments, the ruthenium layer 207b is deposited using a CVD process and / or in a different process chamber than that used to form the first copper layer 207a, hi other embodiments, the ruthenium layer 207b is deposited using a PVD process.

[0026]

[0027] The method 100 includes, at operation 150, depositing a second copper layer 207c on the ruthenium layer 207b. In some embodiments, the second copper layer 207c is deposited in the same process chamber used to form the first copper layer 207a at operation 130 and the ruthenium layer 207b at operation 140. In some embodiments, the second copper layer 207c is deposited using the same process used to form the first copper layer 207a at operation 130. Typically, the ALD process chamber is purged with an inert gas, such as argon, between depositing the ruthenium layer 207b and the second copper layer 207c. In other embodiments, the second copper layer 207c is deposited using a PVD or CVD process in a chamber different from the chamber used to form the first copper layer 207a and / or the ruthenium layer 207b. In some embodiments, the processing chambers used to form the barrier layer 206, the copper layers 207a, 207c, and / or the ruthenium layer 207b are connected together under vacuum or under controlled environment by a transfer chamber maintained at sub-atmospheric pressure to prevent surface oxidation of the deposited layers before the next layer is formed.

[0027]

[0028] Herein, the barrier layer 206 has a first thickness T(1) between about 0.5 nm and about 20 nm, e.g., between about 1 nm and about 5 nm, e.g., about 2 nm. The first copper layer 207a has a second thickness T(2) between about 0.5 nm and about 20 nm, e.g., between about 0.5 nm and about 10 nm, e.g., between about 0.5 nm and about 5 nm, e.g., about 4 nm. The ruthenium layer 207b has a third thickness T(3) between about 1 Angstrom (A) and about 20 A, e.g., between about 1 A and about 15 A, e.g., between about 1 A and about 10 A. The second copper layer 207c has a fourth thickness T(4) between about 0.5 nm and about 200 nm, e.g., between about 1 nm and about 20 nm, or between about 1 nm and about 5 nm, e.g., about 2 nm. Typically, the ratio of copper to ruthenium in seed layer 207 is between about 99.9:1 and about 4:1, and the thicknesses T(2), T(3), and T(4) of copper and ruthenium layers 207a, 207b, and 207c, respectively, are adjusted to increase or decrease the concentration of ruthenium in the seed layer.

[0028]

[0029] In some embodiments, forming the seed layer 207 includes sequentially depositing a plurality of first copper layers 207a and ruthenium layers 207b before depositing a second and final copper layer 207c.

[0029]

[0030] Figures 2D and 2E further illustrate the formation of copper interconnects. Figure 2D shows a bulk copper layer 208 that is deposited on the seed layer using an electroplating process or a copper reflow / gap-fill process (e.g., a thermally assisted reflow process). The bulk copper layer 208 is then removed from the surface of the substrate using a bulk film removal process, such as chemical mechanical planarization (CMP), to form a copper interconnect structure, such as the interconnect structure shown in Figure 2D.

[0030]

[0031] Advantages of the methods described herein include reduced copper agglomeration during seed layer formation, reduced minimum seed layer thickness required for continuous coverage, improved reflow fill due to thinner seed layers, and improved line and / or via resistance of copper interconnects formed over the seed layer. In addition to reduced copper agglomeration, advantages of the embodiments described herein further include reduced copper electromigration, which can increase circuit density and improve reliability and / or service life by preventing circuit density related device failures.

[0031]

[0032] While the foregoing is directed to embodiments of the present disclosure, other and further embodiments of the disclosure may be devised without departing from the basic scope thereof, the scope of which is determined by the claims that follow. [Explanation of symbols]

[0032] 100 ways 110 Work 120 Work 130 Work 140 Work 150 Work 200 Patterned Substrates 201 Substrate 202 First dielectric layer 203 Etch stop layer 204 Second dielectric layer 205 Opening 206 Barrier Layer 207 Seed Layer 207a First copper layer 207b Ruthenium layer 207c Second copper layer 208 Bulk copper layer 209 Material layer

Claims

1. 1. A method of forming an interconnect structure, the method comprising: placing a substrate having a patterned surface with openings formed in a layer of material in a first processing chamber; depositing a tantalum nitride layer over the layer of material in the first processing chamber; placing the substrate in a second processing chamber; forming a seed layer on the tantalum nitride layer without removing the substrate from the second processing chamber; forming a seed layer on the tantalum nitride layer; exposing the substrate to alternating, sequential first reactive precursors comprising a copper-containing organometallic and second reactive precursors comprising hydrogen to form a first copper layer; exposing the substrate to alternating sequentially a third reactive precursor comprising a ruthenium-containing organometallic and a fourth reactive precursor comprising hydrogen to form a ruthenium layer on the first copper layer; exposing the substrate alternately and sequentially to the first reactive precursor and the second reactive precursor to form a second copper layer on the ruthenium layer; Including, 13. The method of claim 12, wherein the first and second processing chambers are connected by a transfer chamber, the first copper layer has a first thickness between 0.5 nm and 5 nm, the ruthenium layer has a second thickness between 1 Angstrom and 10 Angstroms, the second copper layer has a third thickness between 1 nm and 20 nm, and the tantalum nitride layer has a fourth thickness between 1 nm and 5 nm.

2. 1. A method of forming an interconnect structure, the method comprising: forming a seed layer on the patterned substrate without removing the patterned substrate from the first processing chamber; depositing a second copper layer over the seed layer; Including, forming the seed layer on the patterned substrate; (a) placing a patterned substrate in the first processing chamber; (b) depositing a first copper layer on the patterned substrate including a material layer having an opening formed therein and a tantalum nitride layer disposed on the material layer, the tantalum nitride layer having a first thickness between 1 nm and 5 nm, and the first copper layer being deposited to a second thickness between 0.5 nm and 20 nm; (c) depositing a ruthenium layer over the first copper layer to a third thickness between 1 Angstrom and 10 Angstroms; (d) repeating (b) and (c); (e) subsequent to (d), depositing a second copper layer; Including, the second copper layer is deposited to a fourth thickness of between 1 nm and 20 nm, and the tantalum nitride layer is deposited in a second processing chamber, the first processing chamber and the second processing chamber being connected by a transfer chamber.

3. The method of claim 2 , wherein the material layer comprises a dielectric layer.

4. 3. The method of claim 2, wherein depositing the first and second copper layers comprises sequentially exposing the patterned substrate to a first reactive precursor comprising a copper-containing organometallic and a second reactive precursor comprising hydrogen.

5. 1. A method of forming an interconnect structure, the method comprising: placing a substrate having a patterned surface with an opening formed in a layer of material and a layer of tantalum nitride deposited over the layer of material in a first processing chamber; forming a seed layer over the tantalum nitride layer; forming a seed layer on the tantalum nitride layer; sequentially forming a plurality of alternating layers of a first copper layer and a ruthenium layer; forming a second copper layer on a ruthenium layer of the plurality of alternating first copper and ruthenium layers; wherein the first copper layer, the ruthenium layer, and the second copper layer are sequentially deposited in the first processing chamber without removing the substrate from the first processing chamber; forming the first copper layer and the second copper layer comprises alternatingly and sequentially exposing the substrate to a first reactive precursor comprising a copper-containing organometallic and a second reactive precursor comprising hydrogen; forming the ruthenium layer comprises alternatingly sequentially exposing the substrate to a third reactive precursor comprising a ruthenium-containing organometallic and a fourth reactive precursor comprising hydrogen; the tantalum nitride layer has a first thickness between 1 nm and 5 nm; one or more of the first copper layers of the plurality of alternating layers of first copper layers and ruthenium layers are deposited to a second thickness of between 0.5 nm and 5 nm; one or more ruthenium layers of the first plurality of alternating copper and ruthenium layers are deposited to a third thickness between 1 Angstrom and 10 Angstroms; The method wherein the second copper layer is deposited to a fourth thickness of between 1 nm and 20 nm.

6. The method of claim 5, further comprising depositing the tantalum nitride layer deposited on the material layer in a second processing chamber before forming the seed layer, wherein the first processing chamber and the second processing chamber are connected by a transfer chamber.

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