DEFECT POSITION INFORMATION PROCESSING APPARATUS, DEFECT POSITION INFORMATION PROCESSING METHOD, AND DEFECT POSITION INFORMATION PROCESSING PROGRAM
Patent Information
- Application Number
- JP2024166720
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2024-09-25
- Publication Date
- 2025-03-07
- Estimated Expiration
- 2044-09-25
Smart Images
Figure 0007642144000001_ABST
Abstract
Description
[Technical field]
[0001] The present invention relates to a defect position information processing device, a defect position information processing method, and a defect position information processing program. [Background technology]
[0002] As described in Non-Patent Document 1, when a defect is detected in a structure constituting a hydroelectric power generation facility, an estimation method is known for estimating the degree of deterioration of the structure based on the detected defect. In this estimation method, the degree of deterioration is estimated based on the position of the defect in a flat plate cross section, which is the cross section of the flat plate-shaped structure. [Prior art documents] [Non-patent literature]
[0003] [Non-Patent Document 1] "Current status of hydroelectric power generation equipment and deterioration diagnosis technology - main parts of hydroelectric turbines and hydroelectric generators", IEEJ Technical Report No. 2 (No. 308), IEEJ, September 1989, pp. 1-69 Summary of the Invention [Problem to be solved by the invention]
[0004] However, when a structure has a shape different from that of a flat plate, the processing load for calculating the stress generated in the cross section of the structure based on the structure defect position, which is the position of a defect in the cross section of the structure, becomes excessive.
[0005] For this reason, in the above estimation method, if the structure has a shape different from that of a flat plate, the structure cross section must be modeled (in other words, converted) into a flat plate cross section, which is the cross section of a flat plate, and the structure defect positions must be converted into flat plate defect positions, which are the positions of defects in the flat plate cross section that correspond to the structure defect positions, in order to estimate the deterioration level of the structure.
[0006] However, when the structure has a complex shape, such as a tubular or airfoil shape, there is a problem in that the processing load for converting the structure defect position into the plate defect position tends to become excessive.
[0007] One object of the present invention is to convert a structure defect position into a plate defect position with high accuracy while suppressing the processing load. [Means for solving the problem]
[0008] In one aspect, the defect position information processing device includes: a surface edge group information receiving unit that receives surface edge group information representing a surface edge group that is a group of edges that approximates a surface line that passes through a surface of a structure in a structure cross section that is a cross section of the structure; a reference edge group information receiving unit that receives reference edge group information representing a reference edge group that is a group of edges constituting a reference line passing through the inside of the structure in a cross section of the structure; a plate defect position information acquisition unit that acquires plate defect position information that represents a plate defect position that is the position of a defect in a cross section of the structure, based on structure defect position information that represents a structure defect position that is the position of a defect in a cross section of the structure, the received surface edge group information, and the received reference edge group information, when the cross section of the structure is modeled as a cross section of a flat plate that is a cross section of a flat plate; Equipped with.
[0009] In another aspect, a defect position information processing method includes: receiving surface edge group information representing a surface edge group which is an edge group approximating a surface line passing through a surface of a structure in a structure cross section which is a cross section of the structure; receiving reference edge group information representing a reference edge group which is a group of edges constituting a reference line passing through the inside of the structure in a cross section of the structure; acquiring plate defect position information representing a plate defect position, which is the position of a defect in a cross section of the structure, based on structure defect position information representing a structure defect position, which is the position of a defect in a cross section of the structure, the received surface edge group information, and the received reference edge group information, when the cross section of the structure is modeled as a cross section of a flat plate, which is a cross section of a flat plate; This includes:
[0010] In another aspect, the defect position information processing program comprises: receiving surface edge group information representing a surface edge group which is an edge group approximating a surface line passing through a surface of a structure in a structure cross section which is a cross section of the structure; receiving reference edge group information representing a reference edge group which is a group of edges constituting a reference line passing through the inside of the structure in a cross section of the structure; acquiring plate defect position information representing a plate defect position, which is the position of a defect in a cross section of the structure, based on structure defect position information representing a structure defect position, which is the position of a defect in a cross section of the structure, the received surface edge group information, and the received reference edge group information, when the cross section of the structure is modeled as a cross section of a flat plate, which is a cross section of a flat plate; The method causes a computer to execute a process including the steps of: Effect of the Invention
[0011] The structure defect position can be converted to the plate defect position with high accuracy while suppressing the processing load. [Brief description of the drawings]
[0012] [Figure 1] 1 is a block diagram showing a configuration of a defect position information processing device according to a first embodiment. [Diagram 2] 1 is a block diagram showing functions of a defect position information processing device according to a first embodiment. [Diagram 3] FIG. 13 is a diagram illustrating an example of a structure defect image in a case where the structure is solid. [Figure 4] 13 is a diagram illustrating an example of a structure defect image in a case where the structure is hollow. FIG. [Diagram 5] 13 is a diagram showing an example of a surface edge group, a reference edge group, and a defect represented by structure defect information in a case where the structure is solid. FIG. [Figure 6] 13 is a diagram showing an example of a defect represented by a group of surface edges, a group of reference edges, and structure defect information in a case where the structure is hollow. FIG. [Figure 7] FIG. 13 illustrates an example of a modeled plate defect when the structure is solid. [Figure 8] FIG. 13 is a diagram illustrating an example of a modeled plate defect when the structure is hollow. [Figure 9] 4 is a flowchart showing a defect position information processing executed by the defect position information processing apparatus of the first embodiment. [Figure 10] 4 is a flowchart showing a flat plate defect position information acquisition process executed by the defect position information processing apparatus of the first embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0013] Hereinafter, embodiments of a defect position information processing device, a defect position information processing method, and a defect position information processing program according to the present invention will be described with reference to FIGS.
[0014] First Embodiment (overview) The defect position information processing device of the first embodiment includes a surface edge group information receiving unit, a reference edge group information receiving unit, and a flat plate defect position information acquiring unit.
[0015] The surface edge group information receiving unit receives surface edge group information representing a surface edge group which is a group of edges approximating surface lines passing through the surface of a structure in a structure cross section which is a cross section of the structure. The reference edge group information receiving unit receives reference edge group information representing a reference edge group, which is a group of edges that constitute a reference line that passes through the inside of a structure in a cross section of the structure.
[0016] The flat plate defect position information acquisition unit acquires flat plate defect position information representing a flat plate defect position, which is the position of a defect in a structure cross section, which corresponds to the structure defect position, when the structure cross section is modeled as a flat plate cross section, based on structure defect position information representing a structure defect position, which is the position of a defect in a structure cross section, the received surface edge group information, and the received reference edge group information.
[0017] According to this, the distance between the structure defect position and the surface edge can be calculated based on the structure defect position information and the surface edge group information. This makes it possible to calculate the distance between the structure defect position and the surface line with high accuracy while suppressing the processing load. Also, the position of the structure defect position relative to the reference edge can be identified based on the structure defect position information and the reference edge group information. This makes it possible to identify the position of the structure defect position relative to the reference line with high accuracy while suppressing the processing load.
[0018] As a result, even if the cross section of a structure has a complex shape, for example, it is possible to convert the structure defect position into a plate defect position with high accuracy while suppressing the processing load. Next, the defect position information processing device of the first embodiment will be described in more detail.
[0019] (composition) 1, the defect position information processing device 10 includes a processing device 11, a storage device 12, an input device 13, and an output device 14, which are connected to each other via a bus BU. The defect position information processing device 10 may be represented as an information processing device or a computer. For example, the defect position information processing device 10 is a personal computer, a smartphone, a mobile phone, a tablet terminal, or a server device. The defect position information processing device 10 may also be composed of a plurality of devices connected to each other so as to be able to communicate with each other.
[0020] The processing device 11 executes a defect position information processing program stored in the storage device 12 to control the storage device 12, the input device 13, and the output device 14. In this way, the processing device 11 realizes the functions described below.
[0021] In this example, the processing device 11 is a central processing unit (CPU). Note that the processing device 11 may include a micro processing unit (MPU), a graphics processing unit (GPU), or a digital signal processor (DSP) instead of or in addition to the CPU.
[0022] In this example, the storage device 12 includes a volatile memory and a non-volatile memory. For example, the storage device 12 includes at least one of a random access memory (RAM), a read only memory (ROM), a semiconductor memory, an organic memory, a hard disk drive (HDD), and a solid state drive (SSD).
[0023] The input device 13 inputs information from outside the defect position information processing device 10. In this example, the input device 13 includes a keyboard and a mouse. The input device 13 may also include a microphone.
[0024] The output device 14 outputs information to the outside of the defect position information processing device 10. In this example, the output device 14 includes a display. The output device 14 may also include a speaker. The defect position information processing device 10 may be provided with a touch panel display that constitutes both the input device 13 and the output device 14.
[0025] (function) As shown in Figure 2, the functions of the defect position information processing device 10 include a structure defect image display unit 101, a surface edge group information receiving unit 102, a reference edge group information receiving unit 103, a reference length information receiving unit 104, a structure defect information receiving unit 105, a flat plate defect position information acquisition unit 106, and a deterioration degree estimation unit 107.
[0026] The structure defect image display unit 101 displays a structure defect image via the output device 14. The structure defect image is an image that represents a structure cross section, which is a cross section of the structure, and a defect in the structure cross section. In this example, at least a portion of the surface of the structure is curved. In this example, the structure constitutes a hydroelectric power generation facility. For example, the structure is a stay vane or a runner vane that constitutes a water turbine.
[0027] In this example, the structure defect image is generated by detecting defects using a technique called three-dimensional ultrasonic inspection described in Patent Document 1. Note that the structure defect image may be generated using a technique different from three-dimensional ultrasonic inspection. [Patent Document 1] Patent No. 5085115
[0028] In this example, the structure defect image display unit 101 may store the structure defect image in advance. The structure defect image display unit 101 may acquire (for example, receive) the structure defect image from an external device.
[0029] Fig. 3 shows an example of a structure defect image when the structure is solid, in which dashed line SL represents a surface line passing through the surface of the structure in the structure cross section, and dotted line DF represents a defect in the structure cross section.
[0030] Fig. 4 shows an example of a structure defect image when the structure is hollow. In Fig. 4, dashed line SL1 represents an outer surface line that is a surface line that passes through the outer surface of the structure in the structure cross section, dashed line SL2 represents an inner surface line that is a surface line that passes through the inner surface of the structure in the structure cross section, and dotted line DF represents a defect in the structure cross section. Therefore, when the structure is hollow, the surface line includes the outer surface line SL1 and the inner surface line SL2.
[0031] The surface edge group information receiving unit 102 receives surface edge group information. The surface edge group information is information representing a surface edge group, which is a group of edges approximating a surface line passing through the surface of a structure in a cross section of the structure. In this example, the surface edge group information receiving unit 102 receives surface edge group information input by a user of the defect position information processing device 10 via the input device 13. Each surface edge that constitutes the surface edge group is a line segment having a start point and an end point. In this example, the surface edge group information includes information that indicates the positions of the start point and the end point of each surface edge that constitutes the surface edge group.
[0032] Fig. 5 shows an example of a surface edge group when the structure is solid. In Fig. 5, solid arrows SS represent surface edges that make up the surface edge group approximating the surface line SL. When the structure is solid, the start point of any surface edge SS that makes up the surface edge group coincides with the end point of another surface edge SS that makes up the surface edge group. In other words, when the structure is solid, the surface edge group forms a closed curve.
[0033] Fig. 6 shows an example of a surface edge group when a structure is hollow. In Fig. 6, solid arrows SS1 represent outer surface edges constituting an outer surface edge group that is a surface edge group that approximates an outer surface line SL1. In Fig. 6, solid arrows SS2 represent inner surface edges constituting an inner surface edge group that is a surface edge group that approximates an inner surface line SL2.
[0034] When a structure is hollow, the start point of any outer surface edge SS1 constituting the group of outer surface edges coincides with the end point of another outer surface edge SS1 constituting the group of outer surface edges. In other words, when a structure is hollow, the group of outer surface edges forms a closed curve. Similarly, when a structure is hollow, the start point of any inner surface edge SS2 constituting the group of inner surface edges coincides with the end point of another inner surface edge SS2 constituting the group of inner surface edges. In other words, when a structure is hollow, the group of inner surface edges forms a closed curve.
[0035] The reference edge group information receiving unit 103 receives reference edge group information. The reference edge group information is information representing a reference edge group, which is a group of edges that constitute a reference line that passes through the inside of a structure in a cross section of the structure. In this example, the reference edge group information receiving unit 103 receives reference edge group information input by a user of the defect position information processing device 10 via the input device 13.
[0036] Each of the reference edges constituting the reference edge group is a line segment having a start point and an end point. In this example, the reference edge group information includes information indicating the positions of the start point and the end point of each of the reference edges constituting the reference edge group.
[0037] Fig. 5 shows an example of a reference edge group when the structure is solid. In Fig. 5, dashed arrows RS show reference edges that constitute the reference edge group. When the structure is solid, a start point SP of the reference edge group has one position on the surface edge group, and an end point EP of the reference edge group has another position on the surface edge group.
[0038] In other words, the reference edge group connects two different positions among the surface edge group. Except for the start point SP and end point EP of the reference edge group, the start point of any reference edge RS constituting the reference edge group coincides with the end point of another reference edge RS constituting the reference edge group. In other words, if the structure is solid, the reference edge group forms an open curve. In this example, the end point EP of the reference edge group is located to the right of the start point SP of the reference edge group.
[0039] FIG. 6 shows an example of a reference edge group when the structure is hollow. In FIG. 6, dashed arrows RS represent the reference edges that make up the reference edge group. When the structure is hollow, the starting point of any reference edge RS that makes up the reference edge group coincides with the end point of another reference edge RS that makes up the reference edge group. In other words, when the structure is hollow, the reference edge group forms a closed curve. In this example, when the structure is hollow, the reference edge group is a closed curve that passes between the outer surface line SL1 and the inner surface line SL2. In this example, when the interior of the group of reference sides is the center of the rotation direction, the end point of each reference side RS is located at a position further in the clockwise direction than the start point of the reference side RS.
[0040] The reference length information receiving unit 104 receives reference length information. The reference length information is information representing the ratio between the length of the surface edge group represented by the surface edge group information received by the surface edge group information receiving unit 102 and the actual length of the surface edge group in the structure cross section, or the ratio between the length of the reference edge group represented by the reference edge group information received by the reference edge group information receiving unit 103 and the actual length of the reference edge group in the structure cross section.
[0041] In this example, the reference length information includes information representing the positions of the start point and the end point of the reference line, which is a line segment, and information representing the actual length of the reference line in the structure cross section. In this example, the reference length information receiving unit 104 receives the reference length information input by the user of the defect position information processing device 10 via the input device 13.
[0042] The functions of the defect position information processing device 10 do not have to include the reference length information receiving unit 104. In this case, the defect position information processing device 10 may store the reference length information in advance. In this case, the defect position information processing device 10 may input the reference length information by acquiring (e.g., receiving) reference length information generated by an external device. In this case, the defect position information processing device 10 may estimate the reference length information based on a structure defect image.
[0043] The structure defect information receiving unit 105 receives at least one piece of structure defect information. The structure defect information is information that represents a defect in a cross section of a structure. In this example, the structure defect information includes structure defect position information and structure defect shape information.
[0044] The structure defect position information is information representing a structure defect position, which is the position of a defect in a cross section of the structure. In this example, the structure defect position is the position of the center of gravity of the defect in the cross section of the structure. The structure defect shape information is information representing a structure defect shape, which is the shape of the defect in the cross section of the structure. In this example, the structure defect shape is rectangular. In this example, the structure defect shape information includes information representing the length of the sides extending in the left-right direction of the structure defect shape, and information representing the length of the sides extending in the up-down direction of the structure defect shape. Note that the structure defect shape may be a shape other than a rectangle (for example, a circle or an ellipse).
[0045] The structure defect information does not have to include structure defect shape information. In this case, the structure defect shape may be determined in advance. In this example, the structure defect information receiving unit 105 receives structure defect information input by a user of the defect position information processing device 10 via the input device 13 .
[0046] Fig. 5 shows an example of a defect represented by structure defect information when the structure is solid. In Fig. 5, a dotted rectangle SD represents a defect represented by the structure defect information. Similarly, Fig. 6 shows an example of a defect represented by the structure defect information when the structure is hollow. In Fig. 6, a dotted rectangle SD represents a defect represented by the structure defect information.
[0047] The functions of the defect position information processing device 10 do not have to include the structure defect information receiving unit 105. In this case, the defect position information processing device 10 may store structure defect information in advance. Also, in this case, the defect position information processing device 10 may input structure defect information by acquiring (for example, receiving) structure defect information generated by an external device. Also, in this case, the defect position information processing device 10 may estimate structure defect information based on a structure defect image.
[0048] The flat plate defect position information acquisition unit 106 executes flat plate defect position information acquisition processing. The flat plate defect position information acquisition processing is processing for acquiring flat plate defect position information based on the structure defect information accepted by the structure defect information acceptance unit 105, the surface edge group information accepted by the surface edge group information acceptance unit 102, the reference edge group information accepted by the reference edge group information acceptance unit 103, and the reference length information accepted by the reference length information acceptance unit 104.
[0049] The plate defect position information is information that represents the plate defect position, which is the position of a defect in the plate cross section that corresponds to the structure defect position, when the structure cross section is modeled (in other words, converted) into a plate cross section, which is the cross section of a plate.
[0050] The process of acquiring information on the position of defects on a flat plate will now be described. First, based on the surface edge group information received by the surface edge group information receiving unit 102 and the reference length information received by the reference length information receiving unit 104, the flat plate defect position information acquisition unit 106 calculates a surface edge group length, which is the actual length of the surface edge group represented by the surface edge group information in the structure cross section, and a surface edge group area, which is the actual area of the area formed by the surface edge group in the structure cross section.
[0051] Furthermore, the flat plate defect position information acquisition unit 106 determines the length of each side of the flat plate cross section (in other words, the side length) based on Formula 1 so that the flat plate has a perimeter that matches the calculated surface side group length and an area that matches the calculated surface side group area.
number
[0052] In the formula 1, L represents the surface side group length, S represents the surface side group area, a represents the thickness of the flat plate (in other words, the length in the thickness direction of the flat plate), and b represents the width of the flat plate (in other words, the length in the direction perpendicular to the thickness direction of the flat plate). In this example, the width b of the flat plate is greater than the thickness a of the flat plate.
[0053] When the structure is solid, the surface edge group area S is calculated based on Equation 2.
number
[0054] In formula 2, x i,s represents the x-coordinate of the start point of the i-th surface edge (in other words, its position on the X-axis), and y i,s represents the y-coordinate (in other words, its position on the Y-axis) of the start point of the i-th surface edge, and x i,e represents the x coordinate of the end point of the i-th surface edge, and y i,e represents the y coordinate of the end point of the i-th surface edge, N represents the number of surface edges that make up the surface edge group, and i represents an integer from 1 to N.
[0055] When the structure is solid, the surface edge group length L is calculated based on Equation 3.
number
[0056] When the structure is hollow, the surface edge group area S is calculated based on Equation 4.
number
[0057] In formula 4, x OS,i,s represents the x coordinate of the start point of the i-th outer surface edge, and y OS,i,srepresents the y coordinate of the start point of the i-th outer surface edge, and x OS,i,e represents the x coordinate of the end point of the i-th outer surface edge, and y OS,i,e represents the y coordinate of the end point of the i-th outer surface edge, N represents the number of outer surface edges that make up the outer surface edge group, and i represents an integer from 1 to N. Furthermore, in Formula 4, x IS,j,s represents the x coordinate of the start point of the j-th inner surface edge, and y IS,j,s represents the y coordinate of the start point of the jth inner surface edge, and x IS,j,e represents the x coordinate of the end point of the j-th inner surface edge, and y IS,j,e represents the y coordinate of the end point of the j-th inner surface edge, M represents the number of inner surface edges that make up the inner surface edge group, and j represents an integer from 1 to M.
[0058] When the structure is hollow, the surface edge group length L is calculated based on Equation 5.
number
[0059] In Formula 5, D represents the sum of the minimum distance between the start point SP of the reference edge group and an outer surface edge and the minimum distance between the start point SP of the reference edge group and an inner surface edge. Note that D may represent the distance between the intersection point of a straight line passing through the start point SP of the reference edge group and the outer surface edge group, and the intersection point of the straight line and the inner surface edge group. In this example, the minimum distance between the start point SP of the reference edge group and an outer surface edge, and the minimum distance between the start point SP of the reference edge group and an inner surface edge may be calculated according to a method similar to that for calculating the distance per surface edge to the structure defect position, which will be described later.
[0060] The flat plate defect position information acquisition unit 106 calculates the distance per surface edge for each piece of structure defect information received by the structure defect information receiving unit 105, and identifies the surface edge for which the calculated distance per surface edge is the smallest as the surface edge with the shortest distance. The distance per surface edge is the distance between the structure defect position represented by the structure defect information and each surface edge constituting the surface edge group.
[0061] In this example, the distance per surface edge is the distance between the structure defect position and the surface edge when there is an intersection between a straight line that passes through the structure defect position and is perpendicular to the surface edge and the surface edge (in other words, a straight line that passes through a point on the surface edge between the start point of the surface edge and the end point of the surface edge and is perpendicular to the surface edge passes through the structure defect position).
[0062] In addition, in this example, the distance per surface edge is the minimum (in other words, the smaller distance) of the distance between the structure defect position and the start point of the surface edge and the distance between the structure defect position and the end point of the surface edge when there is no intersection between the surface edge and a straight line that passes through the structure defect position and is perpendicular to the surface edge (in other words, a straight line that passes through a point on the extension of the surface edge and is perpendicular to the surface edge passes through the structure defect position).
[0063] The plate defect position information acquisition unit 106 calculates the distance per reference edge for each piece of structure defect information received by the structure defect information receiving unit 105, and identifies the reference edge for which the calculated distance per reference edge is the smallest as the shortest distance reference edge. The distance per reference edge is the distance between the structure defect position represented by the structure defect information and each reference edge constituting the reference edge group.
[0064] In this example, the distance per reference edge is the distance between the structure defect position and the reference edge when there is an intersection between the reference edge and a straight line that passes through the structure defect position and is perpendicular to the reference edge (in other words, a straight line between the starting point of the reference edge and the end point of the reference edge, that passes through a point on the reference edge and is perpendicular to the reference edge, passes through the structure defect position).
[0065] In addition, in this example, the distance per reference edge is the minimum (in other words, the smaller distance) of the distance between the structure defect position and the start point of the reference edge and the distance between the structure defect position and the end point of the reference edge when there is no intersection between the reference edge and a straight line that passes through the structure defect position and is perpendicular to the reference edge (in other words, a straight line that passes through a point on the extension of the reference edge and is perpendicular to the reference edge passes through the structure defect position).
[0066] The flat plate defect position information acquisition unit 106 determines the flat plate defect position for each piece of structure defect information accepted by the structure defect information accepting unit 105 based on the identified shortest distance surface edge, the distance for each surface edge calculated for the shortest distance surface edge, the identified shortest distance reference edge, and the distance for each reference edge calculated for the shortest distance reference edge.
[0067] The determination of the plate defect position will now be described. In this example, the plate defect position has an x coordinate and a y coordinate. In this example, as shown in Figures 7 and 8, the coordinates on the plate cross section have the origin located at the lower left corner of the plate cross section, the positive direction of the X axis corresponds to the rightward direction, and the positive direction of the Y axis corresponds to the upward direction.
[0068] The plate defect position information acquisition unit 106 determines the x coordinate of the plate defect position based on Equation 6.
number
[0069] In formula 6, x PD represents the x-coordinate of the flat plate defect position, g represents the length along the reference edge group from the starting point SP of the reference edge group to the minimum distance position, which is the position on the shortest distance reference edge that has the smallest distance from the structure defect position, and G represents the length of the reference edge group (in other words, the total length of the reference edge group).
[0070] In this example, the minimum distance position is the position of an intersection between a straight line that passes through the structure defect position and is perpendicular to the shortest distance reference side and the shortest distance reference side (in other words, if a straight line that passes through a point on the shortest distance reference side between the start point of the shortest distance reference side and the end point of the shortest distance reference side and is perpendicular to the shortest distance reference side passes through the structure defect position).
[0071] In addition, in this example, when there is no intersection between a straight line that passes through the structure defect position and is perpendicular to the shortest distance reference side and the shortest distance reference side (in other words, a straight line that passes through a point on the extension of the shortest distance reference side and is perpendicular to the shortest distance reference side passes through the structure defect position), the minimum distance position is the position of the point closest to the structure defect position between the start point of the shortest distance reference side and the end point of the shortest distance reference side.
[0072] In this way, the flat plate defect position information acquisition unit 106 determines the flat plate defect position so that the ratio of the length along the reference edge group from one end (in this example, the starting point SP) of the reference edge group to the length of the reference edge group of the minimum distance position, which is the position on the reference edge group in the structure cross section that has the smallest distance from the structure defect position, matches the ratio of the distance from one end of the flat plate in the extension direction (in this example, the X-axis direction) of the flat plate defect position corresponding to the structure defect position in the plate cross section, which is a direction perpendicular to the thickness direction of the flat plate (in this example, the Y-axis direction), to the length of the flat plate in the extension direction.
[0073] The plate defect position information acquisition unit 106 determines whether the structure defect position is located on the right side or the left side of the reference side group. In this example, the plate defect position information acquisition unit 106 determines that the structure defect position is located on the left side of the reference side group when the cross product of the first vector and the second vector expressed by Equation 7 has a positive value, and determines that the structure defect position is located on the right side of the reference side group when the cross product has a negative value. The first vector is a vector that runs from the start point of the shortest distance reference side to the end point of the shortest distance reference side. The second vector is a vector that runs from the start point of the shortest distance reference side to the structure defect position. In this example, the coordinates in the cross section of the structure are such that the positive direction of the X-axis corresponds to the rightward direction, and the positive direction of the Y-axis corresponds to the upward direction.
number
[0074] In Formula 7, x s represents the x-coordinate of the start point of the shortest distance reference side, and ys represents the y coordinate of the start point of the shortest distance reference side, and x e represents the x-coordinate of the end point of the shortest distance reference side, and y e represents the y coordinate of the end point of the shortest distance reference side, and x p represents the x-coordinate of the structure defect position, and y p represents the y coordinate of the structure defect position.
[0075] When it is determined that the structure defect position is located on the left side of the reference side group, the plate defect position information acquisition unit 106 determines the y coordinate of the plate defect position based on Equation 8.
number
[0076] In Formula 8, y PD represents the y coordinate of the plate defect position, a represents the thickness of the plate (in other words, the length of the plate in the thickness direction), and d represents the distance per surface edge calculated with respect to the shortest surface edge.
[0077] Furthermore, when it is determined that the structure defect position is located on the right side of the reference side group, the plate defect position information acquisition unit 106 determines the y coordinate of the plate defect position based on Equation 9.
number
[0078] In this way, the flat plate defect position information acquisition unit 106 determines the flat plate defect position so that the distance between the flat plate defect position corresponding to the structure defect position in the flat plate cross section and the surface perpendicular to the thickness direction of the flat plate matches the minimum distance between the structure defect position in the structure cross section and the surface edge.
[0079] In this manner, the flat plate defect position information acquisition unit 106 determines the flat plate defect positions. As a result, the flat plate defect position information acquisition unit 106 acquires flat plate defect position information for each piece of structure defect information accepted by the structure defect information acceptance unit 105. In this manner, the flat substrate defect position information acquisition unit 106 executes the flat substrate defect position information acquisition process.
[0080] The deterioration level estimation unit 107 estimates the deterioration level, which is the degree to which the structure has deteriorated, based on the plate defect position information acquired by the plate defect position information acquisition unit 106 .
[0081] In this example, the deterioration level estimation unit 107 models the plate defect based on the plate defect position information acquired by the plate defect position information acquisition unit 106. In this example, the plate defect is modeled by converting the plate defect into a semi-elliptical surface defect or a buried elliptical defect according to the method described in Non-Patent Document 1. In this example, the length of a side extending in the left-right direction of the structure defect shape represented by the structure defect information accepted by the structure defect information acceptance unit 105 is used as the crack length, and the length of a side extending in the up-down direction of the structure defect shape is used as the crack depth.
[0082] For example, if the structure is solid, the flat plate defect is transformed into a semi-elliptical surface defect PD1 and a buried elliptical defect PD2, as shown in FIG. Also, for example, when the structure is hollow, as shown in FIG. 8, the flat plate defect is transformed into semi-elliptical surface defects PD1 and PD2 and a buried elliptical defect PD3.
[0083] In this example, the deterioration level estimation unit 107 calculates stress intensity factors based on the semi-elliptical surface defect and the buried elliptical defect after modeling in accordance with the method described in non-patent document 1, and performs crack propagation calculations based on the calculated stress intensity factors, thereby estimating the deterioration level of the structure.
[0084] The degradation level estimating unit 107 may estimate the degradation level according to the method described in Non-Patent Document 2 instead of Non-Patent Document 1. [Non-Patent Document 2] "Standards for Nuclear Power Plant Equipment Maintenance Standards" by The Japan Society of Mechanical Engineers, 2010 Supplement, The Japan Society of Mechanical Engineers, May 2011
[0085] (operation) Next, the operation of the defect position information processing device 10 will be described with reference to FIGS. The defect position information processing device 10 executes the defect position information processing shown in FIG. Specifically, the defect position information processing device 10 displays a structure defect image via the output device 14 (step S101).
[0086] Next, the defect position information processing device 10 waits until it receives the surface edge group information (determines "No" in step S102). Next, the user of the defect position information processing device 10 inputs the surface edge group information via the input device 13. As a result, the defect position information processing device 10 receives the input surface edge group information, determines "Yes" in step S102, and proceeds to step S103.
[0087] Next, the defect position information processing device 10 waits until it receives reference edge group information (determines "No" in step S103). Next, the user of the defect position information processing device 10 inputs the reference edge group information via the input device 13. As a result, the defect position information processing device 10 receives the input reference edge group information, determines "Yes" in step S103, and proceeds to step S104.
[0088] Next, the defect position information processing device 10 waits until it receives the reference length information (determines "No" in step S104). Next, the user of the defect position information processing device 10 inputs the reference length information via the input device 13. As a result, the defect position information processing device 10 receives the input reference length information, determines "Yes" in step S104, and proceeds to step S105.
[0089] Next, the defect position information processing device 10 waits until it receives structure defect information (determines "No" in step S105). Next, a user of the defect position information processing device 10 inputs structure defect information via the input device 13. As a result, the defect position information processing device 10 receives the input structure defect information, determines "Yes" in step S105, and proceeds to step S106. In this example, multiple pieces of structure defect information are input, and the defect position information processing device 10 receives multiple pieces of structure defect information. Note that the defect position information processing device 10 may receive a single piece of structure defect information. The processes in steps S102 to S105 may be executed in an order different from that shown in FIG.
[0090] Next, the defect position information processing apparatus 10 starts executing the process shown in FIG. 10 to execute the flat plate defect position information acquisition process (step S106). The defect position information processing device 10 calculates the surface edge group length and the surface edge group area based on the surface edge group information received in step S102 of FIG. 9, the reference length information received in step S104 of FIG. 9, and formulas 2 to 5 (step S201).
[0091] Next, the defect position information processing device 10 determines the length of each side of the plate cross section (in other words, the side length) based on Equation 1 so that the plate has a perimeter that matches the surface side group length calculated in step S201 and an area that matches the surface side group area calculated in step S201 (step S202).
[0092] Next, the defect position information processing apparatus 10 executes a loop process (steps S203 to S209) in which each piece of structure defect information received in step S105 of FIG. 9 is used as a processing target one by one in order.
[0093] In the loop process, first, the defect position information processing device 10 calculates the distance per surface edge, which is the distance between each surface edge constituting the surface edge group and the structure defect position represented by the structure defect information to be processed (step S204). Next, the defect position information processing device 10 specifies the surface edge with the smallest calculated distance per surface edge as the shortest distance surface edge (step S205).
[0094] Next, the defect position information processing device 10 calculates the distance per reference side, which is the distance between each reference side constituting the reference side group and the structure defect position represented by the structure defect information to be processed (step S206). Next, the defect position information processing device 10 specifies the reference side for which the calculated distance per reference side is the smallest as the shortest distance reference side (step S207).
[0095] Next, the defect position information processing apparatus 10 determines the x coordinate of the position of the plate defect based on the reference side with the shortest distance specified in step S207, the side length determined in step S202, and Equation 6.
[0096] Furthermore, the defect position information processing apparatus 10 judges, based on Equation 7, whether the structure defect position represented by the structure defect information to be processed is located on the right side or the left side with respect to the reference side group.
[0097] When the defect position information processing device 10 determines that the structure defect position is located on the left side of the reference edge group, it determines the y coordinate of the flat plate defect position based on the distance for each surface edge calculated in step S204 relative to the shortest distance surface edge identified in step S205, the edge length determined in step S202, and formula 8.
[0098] On the other hand, if the defect position information processing device 10 determines that the structure defect position is located on the right side of the reference edge group, it determines the y coordinate of the flat plate defect position based on the distance for each surface edge calculated in step S204 relative to the shortest distance surface edge identified in step S205 and equation 9.
[0099] In this manner, the defect position information processing apparatus 10 determines the flat plate defect position, and thereby obtains flat plate defect position information representing the determined flat plate defect position (step S208).
[0100] Then, after executing the above-mentioned loop processing (steps S203 to S209) for all of the structure defect information received in step S105 of FIG. 9, the defect position information processing device 10 terminates the execution of the processing shown in FIG. 10 and proceeds to step S107 of FIG. 9.
[0101] Next, the defect position information processing device 10 models the plate defect based on the plate defect position information acquired in step S106 (step S107). Next, the defect position information processing device 10 calculates stress intensity factors based on the modeled semi-elliptical surface defect and buried elliptical defect, and performs a crack growth calculation based on the calculated stress intensity factors to estimate the deterioration degree of the structure (step S108). As a result, the defect position information processing device 10 ends the execution of the defect position information processing shown in FIG.
[0102] As described above, the defect position information processing apparatus 10 of the first embodiment includes the surface edge group information receiving unit 102, the reference edge group information receiving unit 103, and the plate defect position information acquiring unit .
[0103] The surface edge group information receiving unit 102 receives surface edge group information representing a surface edge group which is a group of edges approximating surface lines passing through the surface of a structure in a structure cross section which is a cross section of the structure. The reference side group information receiving unit 103 receives reference side group information representing a reference side group, which is a group of sides constituting a reference line passing through the inside of a structure in a cross section of the structure.
[0104] The flat plate defect position information acquisition unit 106 acquires flat plate defect position information representing a flat plate defect position, which is the position of a defect in a structure cross section, which corresponds to the structure defect position, when the structure cross section is modeled as a flat plate cross section, based on structure defect position information representing a structure defect position, which is the position of a defect in a structure cross section, the received surface edge group information, and the received reference edge group information.
[0105] According to this, the distance between the structure defect position and the surface edge can be calculated based on the structure defect position information and the surface edge group information. This makes it possible to calculate the distance between the structure defect position and the surface line with high accuracy while suppressing the processing load. Also, the position of the structure defect position relative to the reference edge can be identified based on the structure defect position information and the reference edge group information. This makes it possible to identify the position of the structure defect position relative to the reference line with high accuracy while suppressing the processing load.
[0106] As a result, even if the cross section of a structure has a complex shape, for example, it is possible to convert the structure defect position into a plate defect position with high accuracy while suppressing the processing load.
[0107] Furthermore, in the defect position information processing device 10 of the first embodiment, the flat plate defect position information acquisition unit 106 acquires flat plate defect position information representing a flat plate defect position so that the distance between a flat plate defect position corresponding to a structure defect position in the flat plate cross section and the surface perpendicular to the thickness direction of the flat plate matches the minimum distance between the structure defect position in the structure cross section and the surface edge.
[0108] However, the correlation between the distance between the surface of a structure and a defect and the deterioration level of the structure is relatively strong. In contrast, the defect position information processing device 10 can reflect the distance between the structure defect position and the surface line in the distance between the plate defect position and the surface of the plate with high accuracy. As a result, the structure defect position can be converted to the plate defect position with high accuracy.
[0109] Furthermore, in the defect position information processing device 10 of the first embodiment, the flat plate defect position information acquisition unit 106 determines the length of each side of the flat plate cross section so that it has a perimeter that matches the surface edge group length, which is the length of the surface edge group, and an area that matches the surface edge group area, which is the area of the region formed by the surface edge group.
[0110] According to this, the cross section of the structure can be appropriately converted into the cross section of the plate, and as a result, the position of the defect in the structure can be converted into the position of the defect in the plate with high accuracy.
[0111] Furthermore, in the defect position information processing device 10 of the first embodiment, the flat plate defect position information acquisition unit 106 acquires flat plate defect position information representing the flat plate defect position so that the ratio of the length along the reference edge group from one end (in this example, the starting point SP) of the reference edge group to the length of the reference edge group of the minimum distance position, which is the position on the reference edge group in the structure cross section that has the smallest distance from the structure defect position, matches the ratio of the distance from one end of the flat plate in the extension direction, which is the direction perpendicular to the thickness direction of the flat plate, of the flat plate defect position corresponding to the structure defect position in the flat plate cross section to the length of the flat plate in the extension direction.
[0112] According to this, the position of the structure defect position in the direction along the reference line can be reflected with high accuracy in the position of the plate defect position in the extension direction, and as a result, the structure defect position can be converted to the plate defect position with high accuracy.
[0113] Furthermore, in the defect position information processing device 10 of the first embodiment, when the structure is solid, the reference line connects two different positions among the group of surface edges. When the structure is hollow, the surface lines include an outer surface line that passes through the outer surface of the structure in the structure cross section and an inner surface line that passes through the inner surface of the structure in the structure cross section, and the reference line is a closed curve that passes between the outer surface line and the inner surface line.
[0114] Furthermore, the defect position information processing apparatus 10 of the first embodiment includes a deterioration level estimation unit 107 that estimates the deterioration level, which is the degree to which the structure has deteriorated, based on the acquired plate defect position information.
[0115] This makes it possible to estimate the degree of deterioration of a structure with high accuracy.
[0116] The present invention is not limited to the above-described embodiment. For example, various modifications that can be understood by a person skilled in the art may be made to the above-described embodiment without departing from the spirit of the present invention. [Explanation of symbols]
[0117] 10 Defect position information processing device 11 Processing equipment 12 Storage device 13 Input Devices 14 Output Devices 101 Structure defect image display unit 102 Surface edge group information reception unit 103 Reference edge group information reception unit 104 Reference length information reception unit 105 Structural Defect Information Reception Department 106 Plate defect position information acquisition unit 107 Deterioration degree estimation section BU Bus
Claims
1. a surface edge group information receiving unit that receives surface edge group information representing a surface edge group that is a group of edges that approximates a surface line that passes through a surface of a structure in a structure cross section that is a cross section of the structure; a reference edge group information receiving unit that receives reference edge group information representing a reference edge group that is a group of edges constituting a reference line passing through an interior of the structure in the structure cross section; a plate defect position information acquisition unit that acquires plate defect position information that represents a plate defect position that is a position of a defect in the structure cross section, the accepted surface edge group information, and the accepted reference edge group information, when the structure cross section is modeled into a plate cross section that is a cross section of a plate; Equipped with a defect position information processing device that acquires the flat plate defect position information so that the minimum value of the distance between the structure defect position in the structure cross section and the surface edge corresponds to the distance between the flat plate defect position corresponding to the structure defect position in the flat plate cross section and the surface perpendicular to the thickness direction of the flat plate, and so that the ratio of the length along the reference edge group from one end of the reference edge group of a minimum distance position, which is a position on the reference edge group in the structure cross section that has the smallest distance from the structure defect position, to the length of the reference edge group corresponds to the ratio of the distance from one end of the flat plate in the extension direction, which is a direction perpendicular to the thickness direction of the flat plate, of the flat plate defect position in the structure cross section, to the length of the flat plate in the extension direction.
2. 2. The defect position information processing device according to claim 1, The flat plate defect position information acquisition unit determines the length of each side of the flat plate cross section so that it has a perimeter that matches the surface edge group length, which is the length of the surface edge group, and an area that matches the surface edge group area, which is the area of the region formed by the surface edge group.
3. 3. The defect position information processing device according to claim 1, When the structure is solid, the reference line connects two different positions of the group of surface edges; A defect position information processing device, wherein when the structure is hollow, the surface line includes an outer surface line passing through the outer surface of the structure in the structure cross-section and an inner surface line passing through the inner surface of the structure in the structure cross-section, and the reference line is a closed curve passing between the outer surface line and the inner surface line.
4. 3. The defect position information processing device according to claim 1, a defect position information processing device comprising a deterioration level estimation unit that estimates a deterioration level, which is the degree to which the structure is deteriorated, based on the acquired plate defect position information.
5. receiving surface edge group information representing a surface edge group which is a group of edges approximating a surface line passing through a surface of the structure in a structure cross section which is a cross section of the structure; receiving reference edge group information representing a reference edge group which is a group of edges constituting a reference line passing through the inside of the structure in the structure cross section; acquiring plate defect position information representing a plate defect position, which is the position of a defect in the structure cross section, based on structure defect position information representing a structure defect position, which is the position of a defect in the structure cross section, the received surface edge group information, and the received reference edge group information, when the structure cross section is modeled into a plate cross section, which is a cross section of a plate; Including, a defect position information processing method in which the flat plate defect position information is acquired so that the distance between the flat plate defect position corresponding to the structure defect position in the flat plate cross section and the surface perpendicular to the thickness direction of the flat plate matches the minimum value of the distance between the structure defect position and the surface edge in the structure cross section, and so that the ratio of the length along the reference edge group from one end of the reference edge group of a minimum distance position, which is a position on the reference edge group in the structure cross section that has the smallest distance from the structure defect position, to the length of the reference edge group matches the ratio of the distance from one end of the flat plate in the extension direction, which is a direction perpendicular to the thickness direction of the flat plate, of the flat plate defect position corresponding to the structure defect position in the flat plate cross section, to the length of the flat plate in the extension direction.
6. receiving surface edge group information representing a surface edge group which is a group of edges approximating a surface line passing through a surface of the structure in a structure cross section which is a cross section of the structure; receiving reference edge group information representing a reference edge group which is a group of edges constituting a reference line passing through the inside of the structure in the structure cross section; acquiring plate defect position information representing a plate defect position, which is the position of a defect in the structure cross section, based on structure defect position information representing a structure defect position, which is the position of a defect in the structure cross section, the received surface edge group information, and the received reference edge group information, when the structure cross section is modeled into a plate cross section, which is a cross section of a plate; causing a computer to execute a process including: a defect position information processing program for acquiring the flat plate defect position information such that the minimum value of the distance between the structure defect position in the structure cross section and the surface edge corresponds to the distance between the flat plate defect position corresponding to the structure defect position in the flat plate cross section and the surface perpendicular to the thickness direction of the flat plate, and such that the ratio of the length along the reference edge group from one end of the reference edge group of a minimum distance position, which is a position on the reference edge group in the structure cross section that has the smallest distance from the structure defect position, to the length of the reference edge group, corresponds to the ratio of the distance from one end of the flat plate in the extension direction, which is a direction perpendicular to the thickness direction of the flat plate, of the flat plate defect position in the structure cross section, to the length of the flat plate in the extension direction.
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