Test Indicators

Abstract

To provide a test indicator 100 which enables the range reachable by a probe 210 to be extended by permitting a change to a probe 210 different in length, and a test indicator 100 which displays an accurate measured value in a wide measurement range by permitting an increase in rotation angle of the probe 210.SOLUTION: A computation unit 400 of a test indicator 100 includes: a probe length storage unit 420 for setting and storing the length of a probe 210; and a probe 210 length correction computing unit 400 for altering a conversion ratio by which the detected value by an encoder 340 is converted to a measured value in accordance with the length of the probe 210 to correct the measured value. The computation unit 400 further includes: a rotation angle calculation unit 410 for finding a rotation angle αs [rad] of the probe 210 on the basis of the detected value of the encoder 340; and an arc chord error correction computing unit 400 for correcting the measured value by multiplying a sine value that adopts the rotation angle αs calculated by the rotation angle calculation unit 410 as an argument.SELECTED DRAWING: Figure 3

Description

[Technical field]

[0001] The present invention relates to a test indicator. [Background technology]

[0002] Test indicators (so-called lever-type dial gauges) are known (for example, see Patent Document 1). The test indicator has a probe that is rotatably supported on the main body case. The probe has a contact at its tip. The test indicator magnifies the displacement of the contact by using the principle of leverage. This makes the test indicator a high-precision, high-resolution measuring instrument.

[0003] Test indicators are used to measure minute displacements such as circular runout, total runout, flatness, and parallelism, and for precision comparison inspections such as the machining error of a machined product against a master work (or block gauge). [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Patent Publication No. 2008-309687 Summary of the Invention [Problem to be solved by the invention]

[0005] One thing to keep in mind when using a test indicator is that the probe should not be replaced with one of a different length. Due to the structural feature of magnifying the displacement (rotational displacement) of the contact point rotating around the axis of rotation using the principle of leverage, if the length of the contact point changes, the magnification ratio will change, and the displayed measurement value will be completely different from the displacement of the contact point. Therefore, in case you want to change the length of the contact point depending on the object to be measured or the measurement conditions, you must prepare models with different contact point lengths. When considering a manufacturing site where many objects to be measured (workpieces) are inspected simultaneously in parallel, it is necessary to prepare multiple models each with different probe lengths.

[0006] In addition, the test indicator is a highly convenient measuring instrument that has high accuracy, high resolution, and can be used for simple measurements, but the length of the probe is 15 to 20 mm, and the test indicator cannot measure deep parts of the inner surface of a hole with a depth of, for example, more than 20 mm. This is because a probe longer than 20 mm will bend, resulting in large measurement errors.

[0007] Also, although test indicators can be used to inspect extremely small shapes, they cannot be used for measurements when the measurement range exceeds 2 mm. This is because the probe rotates, and while the arc trajectory of the contact and the vertical displacement of the contact can be considered the same in a small range, as the rotation angle increases, the discrepancy between the length of the arc and the vertical displacement increases. Due to limitations in the probe length and rotation angle, the measurement range of the test indicator is limited to a maximum of 2 mm.

[0008] An object of the present invention is to provide a test indicator which allows the probe to be replaced with one of a different length, which enables the range of the probe to be increased, and which allows the probe to have a large rotation angle, thereby displaying accurate measurement values ​​over a wide measurement range. [Means for solving the problem]

[0009] The test indicator of the present invention comprises: a measuring element having a contact tip at a tip thereof for contacting a surface of the measuring object; a main body case that pivotally supports the probe; an encoder for detecting a rotational displacement of the probe; a calculation unit that converts the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; A test indicator comprising: The calculation unit is a probe length storage unit that sets and stores the length of the probe; a measurement element length correction calculation unit that corrects the measurement value by changing a conversion ratio for converting the detection value by the encoder into the measurement value in accordance with the length of the measurement element. It is characterized by:

[0010] In one embodiment of the present invention, The calculation unit is a rotation angle calculation unit that calculates a rotation angle αs [rad] of the probe based on a detection value by the encoder; an arc-sine error correction calculation unit that corrects the measurement value by multiplying the rotation angle αs calculated by the rotation angle calculation unit by a sine value having the rotation angle αs as an argument. It is preferable.

[0011] In one embodiment of the present invention, The calculation unit is a probe length storage unit that sets and stores the length of the probe; a reference deflection error storage unit that stores, as a reference deflection error δsf, a deflection error of a reference probe actually measured when the reference probe has a predetermined reference length Gs; a deflection calculation unit that calculates an actual deflection error δ by correcting the reference deflection error δ in accordance with the length of the probe; a deflection error correction calculation unit that corrects the measurement value by adding the actual deflection error δcf calculated by the deflection calculation unit. It is preferable.

[0012] In one embodiment of the present invention, The calculation unit is a probe length storage unit that sets and stores the length of the probe; a reference forward deflection error storage unit that stores, as a reference forward deflection error δsf, a deflection error of a reference probe actually measured when the reference probe has a predetermined reference length Gs and rotates in a direction in which the rotation angle of the reference probe increases; an outward deflection calculation unit that calculates an actual outward deflection error δ, which is an actual deflection error, by correcting the reference outward deflection error δ in accordance with the length of the probe; a reference return deflection error storage unit that stores, when a reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe decreases, as a reference return deflection error δsb; a return deflection calculation unit that calculates an actual return deflection error δ, which is an actual deflection error, by correcting the reference return deflection error δ in accordance with the length of the probe; a deflection error correction calculation unit that corrects the measurement value by adding an actual forward deflection error δ calculated by the forward deflection calculation unit when the detection value by the encoder changes in an increasing direction, and corrects the measurement value by adding an actual backward deflection error δ calculated by the backward deflection calculation unit when the detection value by the encoder changes in a decreasing direction. It is preferable.

[0013] The method for controlling a test indicator of the present invention comprises the steps of: A method for controlling a test indicator including a probe having a contact tip at a tip thereof that contacts a surface of a measurement object, and a main body case that pivotally supports the probe, comprising the steps of: a rotation detection step of detecting a rotational displacement amount of the probe by an encoder; a calculation step of converting the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; and a display step of displaying the measured value, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; and a measurement element length correction calculation step of correcting the measurement value by changing a conversion ratio for converting the detection value by the encoder into the measurement value in accordance with the length of the measurement element. It is characterized by:

[0014] In one embodiment of the present invention, The calculation step includes: a rotation angle calculation step of determining a rotation angle αs [rad] of the probe based on a detection value by the encoder; and a sine error correction calculation step of correcting the measurement value by multiplying the rotation angle αs calculated in the rotation angle calculation step by a sine value having the rotation angle αs as an argument. It is preferable.

[0015] In one embodiment of the present invention, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; a reference deflection error storage step of storing, as a reference deflection error δsf, a deflection error actually measured when a reference probe has a predetermined reference length Gs; a deflection calculation step of calculating an actual deflection error δ, which is an actual deflection error, by correcting the reference deflection error δ in accordance with the length of the probe; and a deflection error correction calculation step of correcting the measurement value by adding the actual deflection error δcf calculated in the deflection calculation step. It is preferable.

[0016] In one embodiment of the present invention, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; a reference forward deflection error storage step of storing, when a reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe increases, as a reference forward deflection error δsf; a forward deflection calculation step of calculating an actual forward deflection error δ, which is an actual deflection error, by correcting the reference forward deflection error δ in accordance with the length of the probe; a reference return deflection error storage step of storing, when the reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe decreases, as a reference return deflection error δsb; a return deflection calculation step of calculating an actual return deflection error δ, which is an actual deflection error, by correcting the reference return deflection error δ in accordance with the length of the probe; a deflection error correction calculation step of correcting the measurement value by adding the actual forward deflection error δ calculated in the forward deflection calculation step when the detection value by the encoder changes in an increasing direction, and correcting the measurement value by adding the actual backward deflection error δ calculated in the backward deflection calculation step when the detection value by the encoder changes in a decreasing direction. It is preferable. [Brief description of the drawings]

[0017] [Figure 1] FIG. 2 is an external view of a test indicator. [Diagram 2] FIG. 2 is a perspective view partially showing the internal structure of the test indicator. [Diagram 3] FIG. 2 is a functional block diagram of a control circuit. [Figure 4] 1 is a diagram showing a schematic representation of the displacement Ls of the contact when the probe is rotated. [Diagram 5] 1 is a diagram showing a schematic representation of the displacement Lc of the contact when the probe is rotated. FIG. [Figure 6] 1 is a diagram showing a schematic diagram of the difference between the arc AB and the vertical displacement Lc. [Figure 7] FIG. 4 is a functional block diagram of a deflection correction unit. [Figure 8] FIG. 1 is a diagram showing a schematic example of an error (deflection error δ) caused by deflection of a probe. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0018] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be illustrated and described with reference to the reference numerals given to the various elements in the drawings. (First embodiment) Although the basic structure of the test indicator 100 itself is well known, a brief description will be given below. FIG. 1 is an external view of the test indicator of the present embodiment. Test indicator 100 includes a main case 110, a probe 210 rotatably supported by main case 110, and a display unit 120 that digitally displays the amount of rotational displacement of probe 210.

[0019] The probe 210 is a generally elongated rod-like body that is exposed from an insertion hole 112 formed in the main body case 110 and is journaled by a bearing member 114 provided in a bearing portion 113 of the main body case 110. The probe 210 has a contact 211 at its tip. Display unit 120 is formed in a flat disk shape and is attached to main body case 110. Two switches (input means) 121 are provided on display unit 120. These switches 121 are used to turn the power on and off, switch displays, and also to input various commands and set values.

[0020] In this embodiment, a plurality of replacement probes 220 are prepared and can be replaced with the replacement probes 220. The replacement probes 220 may be made of a different material or have a different shape or size of the contact 221, but here it is assumed that a plurality of probes 220 with different lengths are prepared. Here, the probe 210 attached to the test indicator 100 by default will be referred to as the "reference probe 210." The length of the reference probe 210 will be referred to as the "reference length," and the reference length will be represented as Gs. In this embodiment, the reference length Gs is, for example, 10 mm, but the length Gs of the reference probe 210 given by default depending on the model of the test indicator 100 may differ.

[0021] FIG. 2 is a perspective view partially illustrating the internal structure of test indicator 100. As shown in FIG. Arranged inside main body case 110 are a first arm 310 connected to probe 210 so as to pivotally support the rotation axis of probe 210, a second arm 320 adjacent to first arm 310 on the opposite side of probe 210 and having a sector gear 321 at its end, a pinion 330 meshing with sector gear 321, and an encoder (rotary encoder) 340 capable of detecting the amount of rotation of pinion 330 as an electrical signal.

[0022] Rotary encoder 340 has a rotor (movable body) 341 and a stator (fixed body) 342, and detects the rotation angle of rotor 341. The encoder may be an ABS (absolute) type that detects an absolute angle within one rotation, or an incremental type.

[0023] An operation of transmitting the oscillation of the probe 210 to the encoder 340 will now be briefly described. Assume that the probe 210 is swung in the U direction in FIG. 2. Then, the first arm 310 rotates counterclockwise in FIG. 2 around the first shaft portion 311. At this time, the moving surface (distal moving surface) 312 of the first arm 310 moves downward in FIG. 2, and the downward movement of the distal moving surface 312 pushes the transmission pin (distal transmission pin) 323 of the second arm 320 downward in FIG. 2. Accordingly, the second arm 320 rotates counterclockwise around the second shaft portion 322. Then, as the second arm 320 moves downward, the pinion 330 rotates clockwise via the sector gear 321. The rotation of the pinion 330 is detected by the encoder 340.

[0024] Next, suppose that the probe 210 swings in the direction D. Then, the first arm 310 rotates clockwise in FIG. 2 around the first shaft portion 311. At this time, the moving surface (proximal moving surface) 313 of the first arm 310 moves upward in FIG. 2, and the transmission pin (proximal transmission pin) 324 of the second arm 320 is pushed upward in FIG. 2. Accordingly, the second arm 320 rotates counterclockwise around the second shaft portion 322. Then, as the second arm 320 moves downward, the pinion 330 rotates clockwise via the sector gear 321.

[0025] That is, regardless of the swing direction of the probe 210, the second arm 320 rotates counterclockwise and the pinion 330 rotates clockwise.

[0026] The lever ratio is designed so that the magnification is the same when the probe 210 rotates in the U direction as when the probe 210 rotates in the D direction. Since the fulcrum-to-point of action distance is determined by the relative positional relationship between the first shaft portion 311, the second shaft portion 322, the distal side transmission pin 323, and the proximal side transmission pin 324, these relative positions (relative distance) are determined so that the pinion 330 rotates the same amount in the forward and reverse directions. Since the lever ratio of internal transmission mechanism 300 is fixed, the amount of rotation of probe 210 and the amount of rotation of pinion 330 have a one-to-one relationship if the direction of rotation is ignored, and the amount of rotation of probe 210 can be found by detecting the amount of rotation of pinion 330 with encoder 340 and multiplying it by a predetermined conversion ratio. Then, if the length of probe 210 is determined, the displacement of contactor 211 can be found from the amount of rotation of probe 210.

[0027] Since the second arm 320 rotates counterclockwise in accordance with the displacement (rotational movement) of the probe 210, a biasing means 350 is provided as a return force that applies a biasing force in a direction to rotate the second arm 320 clockwise. The biasing means (e.g., a wire spring) 350 applies a return force that returns the probe 210 to its original position, and also applies a contact force (measurement force) when the contact 211 comes into contact with the object to be measured. When the second arm 320 is returned by the return force, the distal side transmission pin 323 comes into contact with the distal side moving surface 312, and the second arm 320 returns to a position (initial position) where the proximal side transmission pin 324 comes into contact with the proximal side moving surface 312.

[0028] Here, the "outbound journey" and the "return journey" will be explained. When the contactor 211 comes into contact with the object to be measured, the case where the probe 210 rotates against the biasing force (returning force) is defined as the "forward path." In other words, the direction in which the detection value of the encoder 340 increases when the probe 210 rotates (the contactor 211 is displaced) is defined as the "forward path," regardless of whether the probe 211 rotates counterclockwise (U direction) or clockwise (D direction). Conversely, the case where the probe 210 rotates in a direction in which it is pulled back by the biasing force (returning force) is defined as the "return path." In other words, the direction in which the detection value of the encoder 340 decreases when the probe 210 rotates (the contact 211 is displaced) is the "return path," regardless of whether the contact 211 rotates counterclockwise (U direction) or clockwise (D direction).

[0029] When continuously tracing and measuring the unevenness (or waviness) of the surface of the object to be measured, the contactor 211 moves up and down according to the surface shape of the object to be measured. At this time, the displacement direction of the contactor 211 is a repeated "forward path" and "return path." During the "outward movement", it can be expected that a substantially prescribed "measuring force" acts between the contact 211 and the object to be measured. During the "return pass", the measuring force between the contact 211 and the object to be measured is expected to be smaller than the specified "measuring force". Differences in the measuring force cause differences in the force acting between the contact 211 and the object to be measured and in the frictional force within the internal transmission mechanism 300, which causes differences in the measured values ​​(return error) between the "forward path" and the "return path" even when measuring unevenness of the same height. Furthermore, as the length of the probes 210, 220 increases, the deflection of the probes 210, 220 increases, and the return error also increases, which cannot be ignored.

[0030] Next, FIG. 3 is a functional block diagram for explaining the configuration of an internal control circuit. The control circuit is provided on a circuit board or integrated circuit chip arranged in main body case 110 or display unit 120. Arithmetic unit 400 is composed of a CPU (Central Processing Unit), a ROM containing a predetermined control program, and a RAM, and realizes the functions of each functional unit shown in Fig. 3 by executing the predetermined program.

[0031] The calculation unit 400 includes a rotation angle calculation unit 410 , a probe length storage unit 420 , a probe length correction unit 430 , an arc-chord error correction unit 440 , a deflection correction unit 450 , and a measurement value calculation unit 460 .

[0032] Each functional unit will be described in order. Rotation angle calculation unit 410 calculates the rotation angle (α [rad]) of probe 210 from the detection value of encoder 340 (rotation angle calculation process). Because the lever ratio of internal transmission mechanism 300 is fixed, the rotation angle (αm [rad]) of probe 210 is obtained by multiplying the amount of rotation (αp) of pinion 330 detected by encoder 340 by a predetermined conversion ratio (Rr). The rotation angle of probe 210 is expressed as αm [rad].

[0033] αm = Rr × αp

[0034] The probe length storage unit 420 is a memory that stores the length information of the probe 210 . First, at the stage of product shipment, the length (reference length) Gs of the reference probe 210 is set and stored as a default value in the probe length storage unit 420 (probe length storage step). For example, the reference length Gs is set to 10 mm.

[0035] If the gauge head 210 is the default reference gauge head 210, the displacement Ls of the contact tip 211 is calculated as follows. FIG. 4 is a diagram showing a schematic representation of the displacement Ls of the contact 211 when the probe is rotated. The rotation angle αm [rad] of the probe 210 is previously calculated in the rotation angle calculation unit 410. Therefore, if the probe 210 is the default reference probe 210, the displacement Ls of the contact tip 211 is calculated as follows: Ls = Gs [mm] × αm [rad] (=Gs [mm] × Rr × αp [rad]) This can be obtained by:

[0036] In the case of the conventional test indicator 100, the measurement value calculation unit 460 calculates the displacement Ls of the contact 211 by multiplying the rotation angle αm (=Rr×αp [rad]) of the probe 210 obtained by the rotation angle calculation unit 410 by the reference length Gs, and outputs this Ls as a measurement value (displays it on the display unit 120) (display process).

[0037] The test indicator 100 of the present embodiment allows the user to replace the probe 210 during the use of the test indicator 100 . When replacing the probe 210, the user sets the length Gc of the probe 220 to be used in the probe length storage unit 420 (probe length storage step). In this case, the user may directly input the value of the length Gc of the contact point 220. Alternatively, the types of replaceable contact points 220 and their lengths Gc may be set in advance as a selection menu in the contact point length storage unit 420, so that the user can select the type (length Gc) of the contact point from the selection menu when replacing the contact point. For example, the length Gc of the contact point 220 is set to 20 mm, which is twice the reference length Gs.

[0038] The probe length correction unit 430 determines a correction ratio so as to obtain a measurement value (displacement Lc of the contact 221) corresponding to the length Gc of the probe 220 in use. That is, when the probe 220 in use is replaced with the probe 210 having the length Gc, the correction ratio is Gc / Gs. Also, if the probe 210 remains at the default reference length Gs, that is, the current probe length Gc is the reference length Gs (Gc=Gs), the correction ratio is "1."

[0039] FIG. 5 is a diagram that diagrammatically shows the displacement Lc of the contact piece 221 when the probe 220 rotates. If the length of the probe 220 currently in use is Gc, the displacement Lc of the contact 221 is Lc = (Gc / Gs) × Gs [mm] × αm [rad] (=(Gc / Gs)×Gs[mm]×Rr×αp[rad]) This can be obtained by:

[0040] If only the probe length is corrected, the measurement value calculation unit 460 calculates the displacement Lc of the contact 211 by multiplying the rotation angle αm (=Rr × αp [rad]) of the probe 220 by the reference length Gs and the probe length correction ratio (Gc / Gs) (probe length correction calculation process), and outputs this Lc as the measurement value (displays it on the display unit 120).

[0041] Here, the probe length correction section 430 and the measurement value calculation section 460 constitute a probe length correction calculation section (probe length correction calculation step).

[0042] Next, the arc-string error correction unit 440 will be described. The test indicator 100 of this embodiment allows the probe length to be replaced with one that is longer, which alone widens the measurement range, but it also allows the rotation angle of the probes 210, 220 to be larger, aiming to widen the measurement range as much as possible. For example, if the measurement range can be expanded to 2 mm or more, the test indicator 100 can easily inspect the shape of objects that could not be measured before. However, when the rotation angle αm of the probe 210 is small, the arc length of the arc AB and the vertical displacement Lc can be considered to be the same, but when the rotation angle αm of the probe 210 becomes large, the deviation between the two cannot be ignored. Figure 6 is a diagram showing a schematic representation of the difference between the arc AB and the vertical displacement Lc. Therefore, in this embodiment, a function for correcting the arc chord error is implemented.

[0043] The arc chord error correction section 440 uses the probe rotation angle αm [rad] calculated by the rotation angle calculation section 410 to correct the circular arc trajectory of the contact tip 211 to a vertical displacement of the contact tip 211 . The arc-sine error correction unit 440 momentarily calculates the sine value (=Sin(αm)) of the probe rotation angle αm [rad] as a correction coefficient, and supplies it to the measurement value calculation unit 460. The measurement value calculation section 460 uses this sine value (=Sin(αm)) instead of the rotation angle αm [rad] of the probe 210 to obtain the displacement Lc of the contact tip 211 (arc-sine error correction calculation process). Lc = (Gc / Gs) × Gs [mm] × Sin(αm) (=(Gc / Gs)×Gs[mm]×Sin(Rr×αp))

[0044] Here, the arc-chord error correction unit 440 and the measurement value calculation unit 460 constitute an "arc-chord error correction calculation unit (arc-chord error correction calculation step)."

[0045] In this manner, in this embodiment, by performing a correction calculation process (arc-sinus error correction calculation process) using a sine value (=Sin(αm)), it is possible to provide accurate measurement values ​​while allowing the rotation angle αm of the probes 210, 220 to become larger, and the measurement range of the test indicator 100 can be made significantly wider than that of conventional models.

[0046] Next, the deflection correction unit 450 will be described. Since the probes 210 and 220 can be regarded as having a long and thin rod-like shape, when a force (a reaction force of the measuring force) is applied from the measurement object to the contacts 211 and 221, the probes 210 and 220 are deflected. The rotation angle αp of the probes 210 and 220 decreases by the amount of this deflection, so an error occurs in the measurement value (height of the unevenness of the measurement object) by that amount. The error caused by this probe deflection increases as the probes 210 and 220 become longer, and if replacement with a longer probe 220 is permitted, the effect of the deflection error cannot be ignored. Therefore, in this embodiment, a function for correcting the deflection error is provided.

[0047] FIG. 7 is a functional block diagram of the deflection correction unit 450. The deflection correction unit 450 includes a reference forward deflection error storage unit 451 , a forward deflection calculation unit 452 , a reference backward deflection error storage unit 453 , a backward deflection calculation unit 454 , and a rotation direction determination unit 455 .

[0048] The reference forward deflection error storage unit 451 and the reference backward deflection error storage unit 453 are storage units that store the deflection amount actually measured for the reference probe 210. For example, by measuring a known height gauge with a standard probe 210 having a reference length Gs (e.g., 10 mm) attached to the test indicator 100, the error (deflection error δs) between the height gauge and the actual measurement value can be obtained. For example, Fig. 8 is a diagram that shows a schematic example of the error (deflection error δ) due to the deflection of the probe 210.

[0049] As described above, there is a difference in the deflection error between the measurement on the "forward path" and the measurement on the "return path" (return error). Therefore, the deflection error δs obtained when the gauge is measured on the forward path is set as the reference forward path deflection error δsf, and the value of the reference forward path deflection error δsf is set and stored in the reference forward path deflection error storage unit 451 (reference forward path deflection error storage step). The deflection error δs obtained when the gauge is measured on the return path is set as a reference return path deflection error δsb, and the value of the reference return path deflection error δsb is set and stored in the reference return path deflection error storage unit 453 (reference return path deflection error storage step). (For example, by going back and forth on a gentle slope with a known gradient, the actual measurement error between the "outbound" and "return" can be obtained.)

[0050] Next, the calculations performed by the forward deflection calculation unit 452 and the backward deflection calculation unit 454 will be described. The amount of deflection of the probe 210 varies depending on the length of the probe 210 . Since the test indicator 100 of this embodiment allows the probe 210 to be replaced, it is necessary to correct the amount of deflection according to the probe length. Generally speaking, the deflection of a rod is proportional to the load at its tip and to the cube of its length. In the case of test indicator 100, the measuring force applied to the tips of probes 210, 220 of test indicator 100 is inversely proportional to the length of probes 210, 220, and therefore, when only the probe length and measuring force (load) are considered, the amount of deflection of probes 210, 220 of test indicator 100 is proportional to the square of the length of probes 210, 220. In other words, if probe 210 has a reference length Gs and the length of probe 220 after replacement is Gc, then the actual deflection error δc according to probe length Gc of probe 220 is given as follows:

[0051] δc=δs×(Gc / Gs) 2

[0052] However, the probes 210 and 220 are not uniformly thick round rods, but have shape features such as a taper that reduces in diameter toward the tip. Therefore, it cannot be said that the amount of deflection is perfectly proportional to the square of the length. In practice, it is desirable to actually measure the amount of deflection of each probe, obtain the actual measured value of the deflection for each probe, and obtain a correction polynomial that relates the length and the amount of deflection.

[0053] In response to the replacement of the probe 210 with the probe 220 having the length Gc, the forward deflection calculation unit 452 calculates the forward deflection δcf (=δsf×(Gc / Gs)) obtained by converting the reference forward deflection error δsf set and stored in the reference forward deflection error storage unit 451 according to the probe length Gc. 2) is calculated (step of calculating deflection on the way forward) and the result is stored. In response to the replacement of the probe 210 with the probe 220 having the length Gc, the return path deflection calculation unit 454 calculates the return path deflection δcb (=δsb×(Gc / Gs)) obtained by converting the reference return path deflection error δsb set and stored in the reference return path deflection error storage unit 453 according to the probe length Gc. 2 ) is calculated (return deflection calculation process) and stored.

[0054] The rotation direction determination unit 455 determines whether the rotation direction (movement direction) of the probe 210 is the "forward path" or the "return path" and determines whether the forward path deflection δcf or the return path deflection δcb should be used as the deflection correction value. For example, the rotation direction determination unit 455 calculates the derivative (difference per unit time) of the rotation angle of the probes 210, 220 obtained by the rotation angle calculation unit 410, and determines that the rotation direction (movement direction) of the probes 210, 220 is the "forward path" if the derivative (difference per unit time) of the rotation angle of the probes 210, 220 obtained by the rotation angle calculation unit 410 is negative. Conversely, the rotation direction determination unit 455 determines that the rotation direction (movement direction) of the probes 210, 220 is the "return path" if the derivative (difference per unit time) of the rotation angle of the probes 210, 220 obtained by the rotation angle calculation unit 410 is negative. When the differential (difference per unit time) of the rotation angle of the probe 210 is zero, it is regarded as the "forward path."

[0055] The rotation direction determination unit 455 determines the rotation direction (movement direction) of the probes 210, 220 from moment to moment, and outputs the deflection error δc to the measurement value calculation unit 460 by switching between "forward path deflection δcf" and "return path deflection δcb" depending on whether it is an "outward path" or a "return path."

[0056] The measurement value calculation unit 460 determines a corrected measurement value by taking into account the reference length Gs, the probe length correction ratio (Gc / Gs), the sine value of the rotation angle αp, and also the deflection error δc (deflection error correction calculation process).

[0057] Lc=(Gc / Gs)×Gs[mm]×Sin(αm)+δc

[0058] Here, the rotation direction determination unit 455 and the measurement value calculation unit 460 constitute a deflection error correction calculation unit (deflection error correction calculation step).

[0059] As described above, the test indicator 100 of this embodiment allows the probes 210, 220 to be replaced with probes having different lengths. At this time, by performing a correction calculation to compensate for error factors caused by the longer length of the probe, it is possible to maintain sufficiently high accuracy and resolution. In addition, by performing a correction calculation process using a sine value (=Sin(αm)), accurate measurement values ​​can be provided while allowing the rotation angle αm of the probes 210 and 220 to increase. Therefore, for example, for deep parts of the inner surface of a hole having a depth of more than 20 mm, the probe length can be replaced with a longer one exceeding 20 mm, making it possible to obtain a test indicator 100 that can perform shape inspection over an expanded measurement range (e.g., 2 mm or more). Furthermore, since the user can use one test indicator 100 by replacing a plurality of probes 210, 220, the cost of procuring and storing the measuring device can be significantly reduced.

[0060] The present invention is not limited to the above-described embodiment, and can be modified as appropriate without departing from the spirit and scope of the present invention. In the above embodiment, the deflection error correction is performed by distinguishing whether the measurement was made on the "forward pass" or the "return pass" and changing the correction value to be applied in each case. This is considered to be a necessary process when the shape of an object is measured continuously, such as in scanning measurement. On the other hand, when measuring distant measurement points one by one, or when measuring slowly even in the case of scanning measurement, the specified measuring force acts firmly between the contact and the measurement object, so in this case it is considered that there is no need to distinguish between the "forward pass" and the "return pass." In this case, it is always considered to be the "forward pass," and the reference return pass deflection error storage unit 453, the return pass deflection calculation unit 454, and the rotation direction determination unit 455 may be omitted. [Explanation of symbols]

[0061] 100 Test Indicators 110 Main unit case 112 Insertion hole 113 Bearing section 114 Bearing parts 120 Display section 121 Switch (input means) 210, 220 Probe 211, 221 Contacts 300 Internal Transmission Mechanism 310 First Arm 311 First shaft 312 Distal moving surface 313 Proximal moving surface 320 Second Arm 321 Sector Gear 322 Second shaft 323 Distal transmission pin 324 Proximal transmission pin 330 Pinion 340 Encoder 341 Rotor (moving body) 342 Stator (fixed body) 350 Spring 360 Stopper (fixing pin) 400 Arithmetic section 400 Arc string error correction calculation section 410 Rotation angle calculation unit 420 Sensor length memory section 430 Probe length compensation unit 440 Arc chord error correction section 450 Deflection compensation section 451 Reference forward deflection error memory unit 452 Outward deflection calculation section 453 Reference return deflection error memory unit 454 Return deflection calculation section 455 Rotation direction judgement unit 460 Measurement value calculation unit.

Claims

1. a measuring element having a contact tip at a tip thereof for contacting a surface of the measuring object; a main body case that pivotally supports the probe; an encoder for detecting a rotational displacement of the probe; a calculation unit that converts the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; A test indicator comprising: a display unit that displays the measured value, The calculation unit is a probe length storage unit that sets and stores the length of the probe; a measurement element length correction calculation unit that corrects the measurement value by changing a conversion ratio for converting the detection value by the encoder into the measurement value in accordance with the length of the measurement element.

1. A test indicator comprising:

2. a measuring element having a contact tip at a tip thereof for contacting a surface of the measuring object; a main body case that pivotally supports the probe; an encoder for detecting a rotational displacement of the probe; a calculation unit that converts the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; A test indicator comprising: a display unit that displays the measured value, The calculation unit is a probe length storage unit that sets and stores the length of the probe; a reference deflection error storage unit that stores, as a reference deflection error δsf, a deflection error of a reference probe actually measured when the reference probe has a predetermined reference length Gs; a deflection calculation unit that calculates an actual deflection error δ by correcting the reference deflection error δ in accordance with the length of the probe; a deflection error correction calculation unit that corrects the measurement value by adding the actual deflection error δcf calculated by the deflection calculation unit.

1. A test indicator comprising:

3. a measuring element having a contact tip at a tip thereof for contacting a surface of the measuring object; a main body case that pivotally supports the probe; an encoder for detecting a rotational displacement of the probe; a calculation unit that converts the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; A test indicator comprising: a display unit that displays the measured value, The calculation unit is a probe length storage unit that sets and stores the length of the probe; a reference forward deflection error storage unit that stores, as a reference forward deflection error δsf, a deflection error of a reference probe actually measured when the reference probe has a predetermined reference length Gs and rotates in a direction in which the rotation angle of the reference probe increases; a forward deflection calculation unit that calculates an actual forward deflection error δ, which is an actual deflection error, by correcting the reference forward deflection error δ in accordance with the length of the probe; a reference return deflection error storage unit that stores, when a reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe decreases, as a reference return deflection error δsb; a return deflection calculation unit that calculates an actual return deflection error δ, which is an actual deflection error, by correcting the reference return deflection error δ in accordance with the length of the probe; a deflection error correction calculation unit that corrects the measurement value by adding an actual forward deflection error δ calculated by the forward deflection calculation unit when the detection value by the encoder changes in an increasing direction, and corrects the measurement value by adding an actual backward deflection error δ calculated by the backward deflection calculation unit when the detection value by the encoder changes in a decreasing direction.

1. A test indicator comprising:

4. 1. A method for controlling a test indicator comprising: a probe having a contact at a tip thereof that contacts a surface of a measurement object; and a main body case that pivotally supports the probe, the method comprising the steps of: a rotation detection step of detecting a rotational displacement amount of the probe by an encoder; a calculation step of converting the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; and a display step of displaying the measured value, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; and a measurement element length correction calculation step of correcting the measurement value by changing a conversion ratio for converting the detection value by the encoder into the measurement value in accordance with the length of the measurement element.

13. A method for controlling a test indicator comprising:

5. 1. A method for controlling a test indicator comprising: a probe having a contact at a tip thereof that contacts a surface of a measurement object; and a main body case that pivotally supports the probe, the method comprising the steps of: a rotational displacement detection step of detecting a rotational displacement amount of the probe by an encoder; a calculation step of converting the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; and a display step of displaying the measured value, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; a reference deflection error storage step of storing, as a reference deflection error δsf, a deflection error actually measured when a reference probe has a predetermined reference length Gs; a deflection calculation step of calculating an actual deflection error δ, which is an actual deflection error, by correcting the reference deflection error δ in accordance with the length of the probe; and a deflection error correction calculation step of correcting the measurement value by adding the actual deflection error δcf calculated in the deflection calculation step.

13. A method for controlling a test indicator comprising:

6. 1. A method for controlling a test indicator comprising: a probe having a contact at a tip thereof that contacts a surface of a measurement object; and a main body case that pivotally supports the probe, the method comprising the steps of: a rotational displacement detection step of detecting a rotational displacement amount of the probe by an encoder; a calculation step of converting the detection value by the encoder into a displacement amount of the contact to calculate a measurement value; and a display step of displaying the measured value, The calculation step includes: a measuring element length storing step of setting and storing the length of the measuring element; a reference forward deflection error storage step of storing, when a reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe increases, as a reference forward deflection error δsf; a forward deflection calculation step of calculating an actual forward deflection error δ, which is an actual deflection error, by correcting the reference forward deflection error δ in accordance with the length of the probe; a reference return deflection error storage step of storing, when the reference probe has a predetermined reference length Gs, a deflection error of the reference probe actually measured when the reference probe rotates in a direction in which the rotation angle of the reference probe decreases, as a reference return deflection error δsb; a return deflection calculation step of calculating an actual return deflection error δ, which is an actual deflection error, by correcting the reference return deflection error δ in accordance with the length of the probe; a deflection error correction calculation step of correcting the measurement value by adding the actual forward deflection error δ calculated in the forward deflection calculation step when the detection value by the encoder changes in an increasing direction, and correcting the measurement value by adding the actual backward deflection error δ calculated in the backward deflection calculation step when the detection value by the encoder changes in a decreasing direction.

13. A method for controlling a test indicator comprising:

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