Image file management system, method, and X-ray CT apparatus

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By integrating databases and management terminals, the problem of long setting time and inconsistent quality in industrial X-ray CT equipment is solved, and the rapid and automatic output of suitable imaging conditions is achieved to ensure uniform and efficient imaging quality.

JP7656486B2Active Publication Date: 2025-04-03HITACHI HIGH TECH CORP

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Patent Information

Application Number: JP2021086246
Authority / Receiving Office: JP · JP
Patent Type: Patents
Current Assignee / Owner
Filing Date: 2021-05-21
Publication Date: 2025-04-03
Estimated Expiration: 2041-05-21

AI Technical Summary

Technical Problem

In industrial X-ray CT equipment, it takes a lot of time to find imaging conditions suitable for different imaging purposes and test subjects, and the imaging quality is inconsistent due to operators' knowledge differences and the criteria for imaging conditions.

Method used

By integrating the database, accumulating past imaging data and device performance parameter tables, and combining the input imaging target and test object information, a management terminal is provided to manage CT imaging and imaging conditions, and automatically output suitable imaging conditions.

Benefits of technology

It realizes the rapid setting of imaging parameters suitable for a variety of imaging targets and conditions in a short time, reduces the dependence on the operator and ensures the quality of CT imaging after imaging.

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Abstract

To provide an image management system for an industrial X-ray CT device which can derive an imaging condition that is suitable for the purpose of imaging or for a test object, in spite of the fact that there are many types of industrial X-ray CT device differing in X-ray energy, test object size, and image resolution, and in spite of the presence of many parameters of the imaging condition.SOLUTION: A system for integrally managing a CT image group having been photographed by an industrial X-ray CT device and including the purpose of photographing, test object information, and a photographing condition is constructed, and accumulated data is rendered as reference data. Meanwhile, an image performance parameter sheet obtained from the analysis result of a CT image in which a standard test piece has been preliminarily photographed is also regarded as reference data. The purpose of photographing and test piece information that are input data are collated with the reference data and the one whose similarity and suitability are high is derived, thereby making it possible to easily and automatically formulate a photographing condition.SELECTED DRAWING: Figure 3

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Description

[Technical field]

[0001] The present invention relates to an image file management system, and more particularly to an image file management system for an industrial X-ray CT apparatus. [Background technology]

[0002] Industrial X-ray CT equipment can measure the internal state of a test specimen non-destructively without cutting it, and is therefore used for a wide range of applications, including observation of the internal structure of objects, detection of defects and foreign objects, shape measurement, shape comparison, and density evaluation.

[0003] In industrial X-ray CT equipment, the test specimen is placed between the X-ray source and the X-ray detector, placed on a turntable and rotated. The amount of X-rays irradiated from the X-ray source that penetrate the test specimen and attenuate is measured by the detector, and an image of the inside of the test specimen is reconstructed from the distribution of the transmitted X-rays.

[0004] Unlike medical use, the X-ray source is for industrial use, and the test object is often a metal industrial product, so an X-ray energy with a strong penetrating power is required compared to the human body. X-ray tubes can be used up to 800 kV as an X-ray source to generate X-rays, but at energy levels in the MV range, an X-ray source using a linear accelerator is required.

[0005] Detectors include area detectors such as image intensifiers and flat panels, as well as line detectors. Scanning methods include translation-rotation scanning mode (second generation scanning method) and rotation scanning mode (third generation scanning method), and the imaging area, scanning time, and image resolution differ depending on the scanning method. In addition, there are image reconstruction algorithms corresponding to each scanning method.

[0006] To use such an industrial X-ray CT system, it is necessary to understand the characteristics of each component device and set imaging conditions suitable for the imaging purpose and the information on the test object. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2007-178227 A Summary of the Invention [Problem to be solved by the invention]

[0008] As mentioned above, finding the imaging conditions suitable for the different imaging purposes and test objects for each shot often requires repeated trial and error, which takes time. In addition, operators have different knowledge and different criteria for judging the imaging conditions, which can result in variations in image quality.

[0009] Therefore, the present invention aims to provide an image file management system and method, as well as an X-ray CT device, that integrates a database for centrally managing previously captured image data with the performance parameter sheet of the device, and that can easily provide imaging conditions by inputting the imaging purpose and test subject information. [Means for solving the problem]

[0010] In order to achieve the above object, the present invention provides an image file management system having an electron beam accelerator which emits pulsed X-rays at a repetitive cycle, a scanner which drives a test object to be irradiated with the X-rays, a plurality of X-ray sensors which detect the X-rays which have been irradiated to and passed through the test object, a signal processing device which processes an output signal from the X-ray sensor, an image reconstruction device which reconstructs a CT image using the output signal, a slice thickness variable mechanism which changes the cross-sectional thickness direction of the reconstructed CT image, a control device which controls the electron beam accelerator, the scanner, the signal processing device, and the image reconstruction device, a data collection device which converts the output signal into a digital signal and transfers it to the control device, and a management terminal which manages the CT images and imaging conditions stored in the image reconstruction device, the image file management system having an accumulation database which reads input information which is the imaging purpose and test object information from an imaging request source, the CT images and the imaging conditions stored in the image reconstruction device, and manages them in a unified manner, andImage File Management System and a performance parameter sheet obtained from the image analysis results of photographing a standard test piece, and outputs imaging conditions suitable for the input information.

[0011] In order to achieve the above object, the present invention provides an image file management method for a system having an electron beam accelerator that emits pulsed X-rays with a repetitive cycle, a scanner that drives a test object to be irradiated with the X-rays, a plurality of X-ray sensors that detect the X-rays irradiated to and passing through the test object, a signal processing device that processes an output signal from the X-ray sensor, an image reconstruction device that reconstructs a CT image using the output signal, a slice thickness variable mechanism that changes the cross-sectional thickness direction of the reconstructed CT image, a control device that controls the electron beam accelerator, the scanner, the signal processing device, and the image reconstruction device, a data collection device that converts the output signal into a digital signal and transfers it to the control device, and a management terminal that manages the CT images and imaging conditions stored in the image reconstruction device, wherein the management terminal reads input information, which is the imaging purpose and test object information from an imaging request source, and the CT images and the imaging conditions stored in the image reconstruction device, and a storage database that manages them in a unified manner, system and comparing the input information with a performance parameter sheet obtained from the image analysis results of photographing a standard test piece, and outputting imaging conditions suitable for the input information.

[0012] Furthermore, in order to achieve the above object, the present invention provides an X-ray CT device having an electron beam accelerator that emits pulsed X-rays with a repetitive cycle, a scanner that drives a test object to be irradiated with the X-rays, a plurality of X-ray sensors that detect the X-rays irradiated to and passing through the test object, a signal processing device that processes an output signal from the X-ray sensor, an image reconstruction device that reconstructs a CT image using the output signal, a slice thickness variable mechanism that changes the cross-sectional thickness direction of the reconstructed CT image, a control device that controls the electron beam accelerator, the scanner, the signal processing device, and the image reconstruction device, a data collection device that converts the output signal into a digital signal and transfers it to the control device, and a management terminal that manages the CT images and imaging conditions stored in the image reconstruction device, wherein the management terminal reads input information, which is the imaging purpose and test object information from an imaging request source, the CT images and the imaging conditions stored in the image reconstruction device, and compares them with an accumulation database that centrally manages them, and a performance parameter sheet obtained from the image analysis result of taking an image of a standard test piece with the X-ray CT device, and outputs imaging conditions suitable for the input information. Effect of the Invention

[0013] From a wide variety of industrial X-ray CT devices, it is possible to easily set the shooting conditions suitable for the diverse imaging purposes and test objects in a short time and independently of the operator, thereby ensuring the quality of the CT images after imaging. [Brief description of the drawings]

[0014] [Figure 1] 1 is a diagram illustrating a configuration example of an industrial X-ray CT apparatus according to a first embodiment. [Diagram 2] FIG. 2 is a diagram showing a screen of a CT image management system managed on a management terminal. [Diagram 3] 1 is a flowchart of a matching function of the CT image management system. [Figure 4A] FIG. 13 is a diagram showing parameters to be input into a CT image management system. [Figure 4B]FIG. 13 is a diagram showing parameters to be input into a CT image management system. [Diagram 5] This is the accumulated database of the CT image management system. [Figure 6A] FIG. 13 is a diagram showing a performance parameter sheet of the CT image management system. [Figure 6B] FIG. 13 is a diagram showing a performance parameter sheet of the CT image management system. [Figure 6C] FIG. 13 is a diagram showing a performance parameter sheet of the CT image management system. [Figure 7A] 13 is a collation flowchart of the CT image management system when the imaging purpose is internal observation. [Figure 7B] 13 is a comparison flowchart of the CT image management system when the imaging purpose is defect / foreign object detection. [Figure 7C] 13 is a comparison flowchart of the CT image management system when the imaging purpose is shape measurement. [Figure 7D] 13 is a comparison flowchart of the CT image management system when the imaging purpose is shape comparison. [Figure 7E] 13 is a collation flowchart of the CT image management system when the imaging purpose is density evaluation. [Figure 8] FIG. 13 is a diagram showing an example of a comparison result of imaging conditions obtained by the CT image management system. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0015] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments for carrying out the present invention will be described with reference to the drawings. EXAMPLES

[0016] 1 is a diagram showing a configuration of an X-ray CT device according to Example 1. The X-ray CT device 100 of this embodiment is an industrial X-ray CT device having a structure of an X-ray CT device equipped with a plurality of scanning methods mainly including a third generation method.

[0017] The X-ray CT device 100 includes an electron beam accelerator 1 that outputs an X-ray fan beam 2, a scanner 3 which is a turntable on which the test object 10 is placed, a collimator 5 which suppresses the incidence of scattered X-rays on the multiple X-ray sensors 4 in order to improve the S / N ratio of the X-ray sensors 4 which detect the X-rays that have passed through the test object 10, a slice thickness variable mechanism 6 which changes the CT cross-section thickness direction, a signal processing device 7 which converts the output signal of the X-ray sensor 4 into a current-voltage signal and amplifies it, a data collection device 8 which converts an analog signal from the signal processing device 8 into a digital signal and collects digital data, a control device 11 which controls the entire X-ray CT device 100 including the electron beam accelerator 1, the scanner 3, and the signal processing device 8, an image reconstruction device 12 which reconstructs CT images, an image analysis device 21 which performs image analysis of the CT images according to the purpose of shooting, and a management terminal 22 which centrally manages past CT image data.

[0018] The control device 11 is, for example, a personal computer having a main body with a liquid crystal display device, input means such as a keyboard and a mouse, a storage device, a CPU and its peripheral circuits, a memory, etc., and an operator can input imaging conditions. The electron beam accelerator 1 is connected to the control device 11 by a control cable 31, and the generation and stopping of the X-ray fan beam 2 is controlled by the control device 11.

[0019] The scanner 3 has a rotation function for rotating the test object 10 to change the cross-sectional direction for CT imaging, as well as a function for moving the test object 10 up and down to perform cross-sectional imaging at each height of the test object 10. The scanner 3 is connected to the control device 11 by a control cable 32, similar to the electron beam accelerator 1, and the rotation and vertical position of the scanner 3 are adjusted. Rotation angle position information and vertical position information of the scanner 3 are output to the control device 11. The slice thickness variable mechanism 6 is connected to the control device 11 by a control cable 34, and the CT cross-sectional thickness direction is controlled by the control device 11.

[0020] The X-ray sensors 4 are arranged in a row so as to face the generation point of the X-ray fan beam 2. The more X-ray sensors 4 there are, the higher the resolution of the CT image, and 1024 X-ray sensors are installed in this embodiment. In FIG. 1, the X-ray sensors 4 are indicated as 4-1 to 4-1024, and any one of the X-ray sensors is indicated as 4-n. The X-ray sensor 4 detects the X-rays transmitted through the test object 10 every time the X-ray fan beam 2 in a pulsed form is output from the electron beam accelerator 1 at a fixed rotation angle of the scanner 3 in synchronization with the rotation of the scanner 3.

[0021] The output signals from the X-ray sensors 4, which correspond to the amount of X-rays incident on each X-ray sensor 4, are converted from current signals to voltage signals by the signal processing device 7 and then amplified. The voltage signals are output to the data collection device 8 via the signal cable 35, and are converted to digital signals by the data collection device 8. The digital signals are sent to the image reconstruction device 12 via the communication cable 30, the control device 11, and the communication cable 36, and a CT image is reconstructed by the image reconstruction device 12. The image reconstruction device 12 stores an attribute file in which information on the imaging conditions is recorded together with the CT image data.

[0022] In the X-ray CT device 100 using the electron beam accelerator 1, X-rays are usually pulsed X-rays that are generated periodically due to the characteristics of the electron beam accelerator 1. Generally, a strong X-ray pulse (a collection of X-ray photons) with a width of 5 μs is output from the electron beam accelerator 1 at a period of 3.3 ms. In this embodiment, the X-ray pulse is irradiated to the test object 10 3000 times during one rotation of the test object 10 for measurement. That is, the X-ray sensor 4 measures the X-ray amount every 0.12 degrees in the rotation angle of the scanner 3. Since there are 1024 X-ray sensors 4, the amount of data required to reconstruct one slice is 1024×3000 pieces of data.

[0023] The CT image data generated and stored by the image reconstruction device 12 is sent to an image analysis device 21 such as a computer via a communication cable 37, and the CT image is analyzed by the image analysis device 21.

[0024] 2 is a diagram showing an example of a screen of the CT image management system 23 managed on the management terminal 22. The imaging data information 25 (attribute file) stored in the image reconstruction device 12 is read by the management terminal 22 via the communication cable 39, and is displayed as a list on the CT image management system 23. The main menu 24 has a function of displaying images from the accumulated imaging data information 25, a function of converting images to bmp, JPEG, etc., a collation function for deriving imaging conditions for new imaging, etc.

[0025] 3 is a flowchart of the comparison function of the CT image management system 23. For new imaging information, the imaging purpose and imaging specimen information are input as input parameters. The reference data to be compared are an accumulation database based on past imaging data information 25 and a performance parameter sheet obtained by previously imaging a standard test piece and analyzing the CT images. The CT image management system 23 compares the two and outputs the optimization conditions to the control device 11.

[0026] Figure 4A and Figure 4B are lists of input parameters, with the imaging purpose shown on the top and the imaged specimen shown on the bottom. The imaging purpose, which is one of the input parameters, is classified into "internal observation" for visualizing the internal information of the test specimen and observing the internal structure, "defect / foreign body detection" for detecting the shape and size of defects such as blowholes, cracks, and peeling and foreign bodies present inside the test specimen, "shape measurement" for measuring the internal shape such as distance, angle, curvature, and volume on CT images, which is difficult to measure by destructive testing, "shape comparison" for comparing shape differences between CT images or CT data and design data such as CAD data, and "density evaluation" for visualizing the separation of different materials and density changes from the CT images of test specimens made of composite materials.

[0027] The system is subdivided according to purpose. For "internal observation," the system provides the "target range (1mm to 1000mm)" to be observed within the dimensions of the test object, the "target size (0.5mm to 1000mm)," and the "target material (from soft materials such as resin to high-density materials such as iron)." For "defect and foreign object detection," the system provides the "detection range (1mm to 1000mm)," the "detection size (0.5mm to 1000mm)," and the "detection material (from soft materials such as resin to high-density materials such as iron)" to be detected within the dimensions of the test object. For "shape measurement," the system provides the "target range (0.5mm to 1000mm)", "Measurement content (dimensions, angles, curvatures, volume, geometric tolerances)", and "Measurement accuracy (0.01mm to 0.2mm)". For "Shape comparison", the "Comparison target (another CT data or design data such as CAD data)" which is to be compared with the CT data of the test piece, "Comparison accuracy (0.01mm to 0.2mm)", and "External factors (stress, heat, pressure, chemical changes, etc.)". For "Density evaluation", the "Target range (1mm to 1000mm)" to be evaluated within the dimensional size of the test piece, "Target size (0.5mm to 1000mm)", and "Density difference (0.2g / cm 3 From 10g / cm 3 )".

[0028] The other input parameter, the imaged specimen, i.e., test specimen information, is classified into "specimen name (e.g., cylinder head A1)", which indicates the product name or part name (if there is an identifying identification number, it is added), "number (from 1 to several tens of pieces)", which indicates the number of test specimens to be photographed, "shape (width 500 mm, depth 500 mm, height up to 1000 mm)", which indicates the within dimensional size of the test specimen, "material (soft materials such as resin to high-density materials such as iron)", which indicates the material of the material and parts that make up the test specimen, and "mass (1 kg to 100 kg)", which indicates the mass of each test specimen.

[0029] Figure 5 is a list of the accumulation database. The accumulation database collects imaging data information and classifies it into "file name" which is the directory name, "imaging date" which indicates the date when the image was taken, "imaging time" which indicates the start and end time when the image was taken, "imaging conditions" which indicates the conditions at the time of taking the image, "imaging purpose" which indicates the purpose of the image, and "imaged specimen" which indicates information on the test specimen to be photographed.

[0030] "Photographing conditions" are further subdivided into "X-ray energy (1MeV, 6MeV, 9MeV)", "scanning method (3rd generation, 2nd generation, Hi-Brid method)", "image size (1500x1500, etc.)", "pixel size (0.2mm / pixel, 0.3mm / pixel, 0.4mm / pixel)", "slice thickness (0.4mm, 0.5mm, 1.0mm)", "photographing position (0mm to 1000mm)", "photographing interval (0.1mm to 1000mm)", and "number of photographs (1 to 10000)". "Photographing purpose" is classified in the same way as the photographing purpose of the input data, and "photographed specimen" is classified in the same way as the test subject information of the input data.

[0031] Figures 6A, 6B, and 6C are tables showing the performance parameter sheets. As shown in Figure 6A, the performance parameter sheets are classified into "effective spatial resolution," which indicates the minimum interval that can be spatially identified taking into account the amount of noise in the image, "shape extraction error," which indicates the difference between the actual dimensions and the shape extracted from the point cloud extracted from the CT image, "density (contrast) resolution," which indicates the limit density (contrast) at which different materials can be identified taking into account the amount of noise in the image, and "maximum transmission size," which indicates the thickness of a certain material that corresponds to the transmission distance when it is the lower limit of the measurement range of the detector system.

[0032] Specific performance values for "(effective) spatial resolution" are shown in Fig. 6B, and those for "shape extraction error" are shown in Fig. 6C. Using Figs. 6A, 6B, and 6C, it is possible to provide indices for different combinations of X-ray energy, scanning method, slice thickness, and standard test piece (material and size) for each performance. For example, when the X-ray energy is 9 MeV, the scanning method is the third generation method (pixel size is 0.4 mm / pixel), the slice thickness is 1.0 mm, the material of the standard test piece is aluminum, and the size (diameter) of the standard test piece is 200 mm, the "(effective) spatial resolution" is 0.55 mm, the "shape extraction accuracy (error)" is 0.01 mm, and the "density (contrast) resolution" is 0.1 g / cm 3 The maximum transmission size is 960mm.

[0033] 7A is a flowchart for deriving imaging conditions when the imaging purpose is "internal observation." For example, the input parameters for "internal observation" are "target range": height 50 mm to 100 mm, "target size": width 200 mm, depth 200 mm, "target material": iron. The input parameters for imaging specimen information are "specimen name": housing, "quantity": 1, "shape": width 200 mm, depth 200 mm, height 100 mm, "material": iron, and "mass": 15 kg.

[0034] In the case of "internal observation", the necessary conditions are that the target size and target material are within the maximum transmission size of the performance parameter sheet in FIG. 6A. Since branching can be performed from the input parameters based on the performance parameter sheets in FIG. 6A, FIG. 6B, and FIG. 6C, branching occurs when the input parameter: target material density is equal to or greater than iron or equal to aluminum (S701). If it is equal to or greater than iron (YES), and if the input parameter: target size is 200 mm or greater (YES in S702), the X-ray energy is 9 MeV based on the performance parameter sheet: transmission size (S704). If it is less than 200 mm, the X-ray energy is 6 MeV or 1 MeV. In this example, since the target size is 200 mm and the material is iron, the X-ray energy, which is one of the imaging conditions, can be determined to be 9 MeV. The same applies to the case of aluminum or less (S703, S705).

[0035] For the remaining imaging conditions, common conditions such as scanning method, slice thickness, and imaging interval are extracted from the accumulated database based on the same imaging purpose and test object information, and from the most recent data, those that are frequently used or highly evaluated by the imaging requester are selected (S706). After obtaining the above flow (S707), the optimal imaging conditions can be displayed, for example, as an imaging condition comparison result table shown in Fig. 8.

[0036] FIG. 7B is a flowchart for deriving imaging conditions when the imaging purpose is "detection of defects and foreign objects." For example, the input parameters for "detection of defects and foreign objects" are "detection range": height 50 mm to 100 mm, "detection size": 0.4 mm or less, and "target material": iron. The input parameters for the imaging specimen information are "specimen name": casting, "quantity": 1 piece, "shape": width 200 mm, depth 200 mm, height 200 mm, "material": iron, and "mass": 25 kg. For "detection of defects and foreign objects," the necessary conditions are that the detection size and target material are equal to or less than the effective spatial resolution of the performance parameter sheets in FIG. 6A and FIG. 6B. Based on the performance parameter sheets in FIG. 6A and FIG. 6B, branching can be performed from the input parameters, so first, branching occurs when the input parameter: detection size is less than 0.5 mm or 0.5 mm or more (S711). If it is less than 0.5 mm, the scanning method is Hi-Bird method (pixel size 0.2 mm / pixel), slice thickness is 0.5 mm, and shooting interval is 0.5 mm or less from the performance parameter sheet: effective spatial resolution (S712). Next, the input parameter: target material density branches into iron equivalent or more or aluminum equivalent or less (S714). In this example, since the target size is 200 mm wide (YES in S715), the X-ray energy is 9 MeV from the performance parameter sheet: transmission size (S717).

[0037] For the remaining imaging conditions, common conditions for the imaging interval are extracted from the accumulated database based on the same imaging purpose and test piece information, and from the most recent data, those that are frequently used or highly evaluated by the imaging requester are selected (S718).The optimal imaging conditions (S719) obtained through the above flow can be displayed as an imaging condition comparison result table shown in Figure 8.

[0038] Figure 7C is a flowchart for deriving imaging conditions when the imaging purpose is "shape measurement." For example, the input parameters for "shape measurement" are "target range": height 10mm to 20mm, "measurement content": diameter, and "measurement accuracy": 0.01mm. The input parameters for the imaged specimen information are "specimen name": pipe, "quantity": 1, "shape": width 100mm, depth 220mm, height 100mm, "material": iron, and "mass": 15kg.

[0039] In the case of "shape measurement", the necessary condition is that the measurement accuracy must be equal to or less than the shape extraction accuracy in the performance parameter sheets in Figures 6A and 6C. Based on the performance parameter sheets in Figures 6A and 6C, branching can be done from the input parameters, so first, branching occurs based on whether the density of the target material is equivalent to or greater than iron or equivalent to aluminum (S721). If it is equivalent to or greater than iron, input parameters are: target range is 200 mm or greater (YES in S722), and measurement accuracy is less than 0.1 mm (YES in S723). In this example, the target size is 220 mm and the measurement accuracy is 0.01 mm, so the X-ray energy is 9 MeV based on the performance parameter sheet: shape extraction accuracy (S724).

[0040] For the remaining imaging conditions, common conditions such as scanning method, slice thickness, and imaging interval are extracted from the accumulated database based on the same imaging purpose and test object information, and from the most recent data, those that are frequently used or highly evaluated by the imaging requester are selected (S726).The optimal imaging conditions (S727) obtained through the above flow can be displayed as an imaging condition comparison result table shown in Figure 8.

[0041] Figure 7D is a flowchart for deriving imaging conditions when the imaging purpose is "shape comparison." For example, the input parameters for "shape comparison" are "comparison target": CT data, "comparison accuracy": 0.01 mm, and "external factors": before and after thermal cycle test. The input parameters for imaging specimen information are "specimen name": tank, "quantity": 1, "shape": width 300 mm, depth 300 mm, height 1000 mm, "material": iron, and "mass": 30 kg. For "shape measurement," the necessary condition is that the measurement accuracy must be equal to or less than the shape extraction accuracy in the performance parameter sheets in Figures 6A and 6C.

[0042] Based on the performance parameter sheets of FIG. 6A and FIG. 6C, the input parameters can be branched, so first, the input parameters: target material density is equal to or greater than iron or equal to aluminum (S731). If it is equal to or greater than iron, the input parameters: target range is 200 mm or greater (YES in S732), and the comparison accuracy is less than 0.1 mm (YES in S733). In this example, the target size is 300 mm and the comparison accuracy is 0.01 mm, so the X-ray energy is 9 MeV from the performance parameter sheet: shape extraction accuracy (S734). For the remaining imaging conditions, common conditions such as scanning method, slice thickness, and imaging interval are extracted from the accumulated database based on the same imaging purpose and test object information, and the most recent data is selected as those that are frequently used or highly evaluated by the imaging requester (S736). By obtaining the above flow, the optimal imaging conditions (S737) can be displayed as an imaging condition comparison result table shown in FIG. 8.

[0043] 7E is a flowchart for deriving imaging conditions when the imaging purpose is "density evaluation." For example, the input parameters for "density evaluation" are "target range": height 100 mm to 200 mm, "target size": diameter 100 mm, "density difference": 0.2 g / cm 3 The input parameters for the imaged specimen information are: "Specimen name": motor, "Quantity": 1, "Shape": diameter 150 mm, height 300 mm, "Material": iron, "Weight": 30 kg. For "density evaluation," the necessary condition is that the density difference is equal to or less than the density resolution in the performance parameter sheet in Figure 6A.

[0044] Based on the performance parameter sheet in Fig. 6A, branching can be performed from the input parameters, so first, branching is performed based on the input parameter: whether the target size is 10 mm or more or less than 10 mm (S741). If it is 10 mm or more, the input parameter: density difference is 0.1 g / cm 3 In this case (YES in S742), if the density of the target material is equivalent to or greater than that of iron (YES in S743), in this example, the target size is 100 mm in diameter and the density difference is 0.2 g / cm 3 Therefore, the X-ray energy is set to 9 MeV based on the density resolution and maximum penetration size in the performance parameter sheet (S745). For the remaining imaging conditions, common conditions such as scanning method, slice thickness, and imaging intervals are extracted from the accumulated database based on the same imaging purpose and test object information, and from the most recent data, those that are frequently used or highly evaluated by the imaging requester are selected (S747). After obtaining the above flow, the optimal imaging conditions (S748) can be displayed as an imaging condition comparison result table, as shown in Figure 8. According to the CT image management system of this embodiment, imaging conditions suitable for the imaging purpose and test subject information from the imaging requester can be easily derived, and these imaging conditions are sent to the control device 11 via the communication cable 39 and automatically entered, and a CT image is acquired by the X-ray CT device 100, thereby reducing errors in inputting conditions by the operator and achieving high quality of the resulting CT images and image analysis results. EXAMPLES

[0045] In this embodiment, as shown in Fig. 4B, "design data (CAD data)" is added to the test object information input in the CT image management system 23 in the embodiment 1. Only the functions that have been changed from the embodiment 1 are shown below.

[0046] The image management system 23 provides a method for placing the test specimen 10 suitable for the imaging purpose on the turntable, taking into consideration the maximum transmission path and the direction that is easy to place on the turntable surface, based on the "design data (CAD data)" of the imaging specimen in the input parameters of Figure 4B.

[0047] According to the CT image management system of this embodiment, imaging conditions and a test subject installation method suitable for the imaging purpose and test subject information from the imaging requester can be easily derived, thereby shortening the imaging preparation and imaging time.

[0048] The present invention is not limited to the above-described embodiment and modifications, and further includes various modifications. For example, the above-described embodiment and modifications have been described in detail to clearly explain the present invention, and the present invention is not necessarily limited to those having all of the configurations described. [Explanation of symbols]

[0049] 1 Electron beam accelerator 3. Scanner 4 X-ray sensor 6 Slice thickness variable mechanism 10 Test subject 11 Control device 12 Image reconstruction device 21 Image analysis equipment 22 Management terminal 23 CT Image Management System 24 Main Menu 25 Imaging data information 100 X-ray CT device

Claims

1. an image file management system comprising: an electron beam accelerator which emits pulsed X-rays at a repetitive cycle; a scanner which drives a test object onto which the X-rays are irradiated; a plurality of X-ray sensors which detect the X-rays which are irradiated onto and pass through the test object; a signal processing device which processes an output signal from the X-ray sensor; an image reconstruction device which reconstructs a CT image using the output signal; a slice thickness variable mechanism which changes a cross-sectional thickness direction of the reconstructed CT image; a control device which controls the electron beam accelerator, the scanner, the signal processing device, and the image reconstruction device; a data collection device which converts the output signal into a digital signal and transfers it to the control device; Read input information, which is the imaging purpose and test subject information from the imaging requester, the CT images stored in the image reconstruction device, and the imaging conditions, compare them with a centrally managed accumulation database and a performance parameter sheet obtained from the image analysis results of photographing a standard test piece in the image file management system, and output imaging conditions suitable for the input information.