Radiation-Based Thickness Gauges

Abstract

To provide a radiation-based thickness gauge.SOLUTION: A system and method for measuring the thickness of a material layer using electromagnetic radiation are described. The system includes a radiation source configured to direct first radiation towards a first surface of a layer of material having the thickness between the first surface and a second surface opposite the first surface. The first radiation causes the material layer to emit secondary radiation. A filter is positioned between the material layer and a radiation detector and in a beam path of the second radiation in order to attenuate a portion of the second radiation associated with fluorescence of the material to emit third radiation. Then, the radiation detector is configured to detect the third radiation and a controller is configured to provide a measurement corresponding to the thickness of the material layer on the basis of the detected third radiation.SELECTED DRAWING: Figure 1-1

Description

[Technical field]

[0001] (CROSS REFERENCE TO RELATED APPLICATIONS) This application claims the benefit of U.S. Provisional Application No. 62 / 799,001, filed Jan. 30, 2019, the entire contents of which are incorporated herein by reference. FIELD OF THE DISCLOSURE

[0002] The present disclosure relates generally to systems and methods for measuring the thickness of a layer of material using electromagnetic radiation. [Background technology]

[0003] Radiation-based gauges typically operate by directing a beam of electromagnetic radiation at a layer of material and measuring a property of the material layer based on the amount of attenuation of the radiation beam passing through the material layer. The attenuation occurs due to interactions between photons of the radiation beam and particles (e.g., atoms) in the material layer. The total attenuation at photon energies below about 1.022 MeV is the result of a combination of four types of radiation-matter interactions: photoelectron, Compton scattering, pair production, and Thomson or Rayleigh scattering. The accuracy and measurement sensitivity of a radiation-based gauge depends on the properties of these radiation-matter interactions with respect to the material composition. Summary of the Invention [Means for solving the problem]

[0004] In industrial production, radiation-based gauges are typically X-ray thickness gauges that transmit X-ray beams at energy levels below 500 KeV to measure a range of thicknesses for selected material layers. In this energy range, the attenuation of X-rays passing through the material layer is primarily caused by the photoelectric effect. The photoelectric effect refers to the process whereby the energy of a photon in the radiation beam is absorbed by atoms in the material layer, thereby removing that photon from the radiation beam and reducing the total beam intensity (i.e., sometimes referred to as irradiance).

[0005] The photoelectric effect is inherently a nonlinear process and depends on the composition of the material layer. In particular, the electrons of the atoms may be excited to several different discrete photon energies, e.g., higher energy states at the K-edge, depending on the orbital shell properties of the atoms, and then decay and emit lower energy photons. Thus, the photoelectric effect may cause the material layer to emit fluorescent radiation that includes these lower energy photons. This fluorescent radiation may reduce the accuracy or precision of the measurement of the X-ray thickness gauge, which limits the types of material compositions whose thicknesses can be measured.

[0006] In some embodiments, to reduce the amount of this fluorescent radiation, the X-ray thickness gauge can be configured to transmit X-rays having energy levels below the K-edge of many materials (e.g., below 5 keV). However, at these lower energy levels, the attenuation of X-rays through material layers is very high, which severely limits the range of material thicknesses that can be measured.

[0007] In some embodiments, to reduce the sensitivity of the material layer thickness measured by the radiation-based gauge and thereby improve the accuracy of the measured thickness, the radiation-based gauge can be configured to filter at least a portion of the fluorescent radiation emitted by the material layer to prevent it from being detected. This approach overcomes the drawbacks of using low energy radiation sources without losing measurement sensitivity.

[0008] In some embodiments, a system for measuring a thickness of a material layer using electromagnetic radiation includes a radiation source configured to direct a first radiation toward a first surface of the layer of material having a thickness between the first surface and a second surface opposite the first surface, where the first radiation causes the material layer to emit a second radiation, a filter positioned between the material layer and a radiation detector and configured to attenuate a portion of the second radiation associated with fluorescence of the material and emit a third radiation, where the radiation detector is configured to detect the third radiation, and a controller, where the controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation.

[0009] In some embodiments of the system, the filter comprises one or more filter layers configured to filter a range of energy levels associated with the fluorescence of the material layer.

[0010] In some embodiments of the system, the range of energy levels is predetermined based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

[0011] In some embodiments of the system, the filter is configured to filter photons from the second radiation having an energy level below a predetermined threshold.

[0012] In some embodiments of the system, the pre-determined threshold is associated with an elemental composition of the material layer and an orbital shell property associated with each element in the elemental composition.

[0013] In some embodiments of the system, the first radiation comprises x-rays.

[0014] In some embodiments of the system, the first radiation comprises gamma rays.

[0015] In some embodiments of the system, the radiation source and the radiation detector are located on opposite sides of the layer of material.

[0016] In some embodiments of the system, the radiation source and the radiation detector are located on the same side of the material layer.

[0017] In some embodiments of the system, the measurements comprise units of length.

[0018] In some embodiments of the system, the measurements comprise areal density.

[0019] In some embodiments of the system, the first radiation has a predetermined energy level, and to provide the measurement value, the controller is configured to measure an intensity of the third radiation and calculate a measurement value corresponding to a thickness of the material layer based on the measured intensity and a default intensity not associated with the material layer.

[0020] In some embodiments of the system, to provide the measurement value, the controller is configured to apply a logarithmic function to the measured intensities to determine a logarithmic value, apply a polynomial function to the logarithmic value, and calculate the measurement value, where coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and the thickness range of the material layer to be measured.

[0021] In some embodiments of the system, the system includes a display configured to display a measurement corresponding to the thickness of the material layer.

[0022] In some embodiments, a method of measuring a thickness of a material layer using electromagnetic radiation includes directing a first radiation from a radiation source toward a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface, where the first radiation received at the first surface causes the material layer to emit a second radiation, attenuating a portion of the second radiation associated with fluorescence of the material layer and emitting a third radiation, detecting the third radiation at a radiation detector, and providing a measurement corresponding to the thickness of the material layer based on the detected third radiation.

[0023] In some embodiments of the method, a portion of the second radiation is attenuated by a filter comprising one or more filter layers configured to filter a range of energy levels associated with the fluorescence of the material layer.

[0024] In some embodiments of the method, the range of energy levels is predetermined based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

[0025] In some embodiments of the method, a portion of the second radiation is attenuated by a filter configured to filter photons having an energy level below a predetermined threshold from the second radiation.

[0026] In some embodiments of the method, the pre-determined threshold is associated with an elemental composition of the material layer and an orbital shell property associated with each element in the elemental composition.

[0027] In some embodiments of the method, the first radiation comprises X-rays.

[0028] In some embodiments of the method, the first radiation comprises gamma rays.

[0029] In some embodiments of the method, the radiation source and the radiation detector are disposed on opposite sides of the layer of material.

[0030] In some embodiments of the method, the radiation source and the radiation detector are disposed on the same side of the material layer.

[0031] In some embodiments of the method, the measurements comprise units of length.

[0032] In some embodiments of the method, the measurements comprise areal density.

[0033] In some embodiments of the method, the first radiation has a predetermined energy level, and providing the measurement value includes measuring an intensity of the third radiation and calculating a measurement value corresponding to a thickness of the material layer based on the measured intensity and a default intensity not associated with the material layer.

[0034] In some embodiments of the method, providing the measurement value includes applying a logarithmic function to the measured intensity to determine a logarithmic value, and applying a polynomial function to the logarithmic value to calculate the measurement value, where coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and the range of thicknesses of the material layer to be measured.

[0035] In some embodiments of the method, the method includes displaying a measurement corresponding to a thickness of the material layer. The present invention provides, for example, the following: (Item 1) 1. A system for measuring a thickness of a layer of material using electromagnetic radiation, the system comprising: a radiation source configured to direct a first radiation toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation causing the layer of material to emit a second radiation; a filter positioned between the material layer and a radiation detector, the filter configured to attenuate a portion of the second radiation associated with fluorescence of the material and to emit a third radiation, the radiation detector configured to detect the third radiation; and Controller and Equipped with The controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation. (Item 2) Item 10. The system of item 1, wherein the filter comprises one or more filter layers configured to filter a range of energy levels associated with the fluorescence of the material layer. (Item 3) 3. The system of any one of claims 1-2, wherein the range of energy levels is predetermined based on the elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition. (Item 4) 4. The system of any one of claims 1-3, wherein the filter is configured to filter photons from the second radiation having an energy level below a predetermined threshold. (Item 5) 5. The system of claim 4, wherein the predetermined threshold is associated with an elemental composition of the material layer and an orbital shell property associated with each element in the elemental composition. (Item 6) 6. The system of any one of claims 1-5, wherein the first radiation comprises X-rays. (Item 7) 7. The system of any one of claims 1-6, wherein the first radiation comprises gamma radiation. (Item 8) 8. The system of any one of claims 1-7, wherein the radiation source and the radiation detector are disposed on opposite sides of the material layer. (Item 9) 9. The system of any one of claims 1-8, wherein the radiation source and the radiation detector are disposed on the same side of the material layer. (Item 10) 10. The system of any one of claims 1-9, wherein the measurements have units of length. (Item 11) 11. The system of any one of claims 1-10, wherein the measurements comprise areal density. (Item 12) The first radiation comprises a predetermined energy level, and to provide the measurement value, the controller: measuring an intensity of the third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity and a default intensity not associated with a material layer; 12. The system of any one of items 1-11, configured to: (Item 13) To provide the measurements, the controller may: applying a logarithmic function to the measured intensities to determine logarithmic values; applying a polynomial function to the logarithmic values ​​to calculate the measurements; configured to: 13. The system of claim 12, wherein coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and a range of thicknesses of the material layer to be measured. (Item 14) Item 14. The system of any one of items 1-13, further comprising a display configured to display the measured value corresponding to the thickness of the material layer. (Item 15) 1. A method for measuring a thickness of a layer of material using electromagnetic radiation, the method comprising: directing a first radiation from a radiation source toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation received at the first surface causing the layer of material to emit a second radiation; attenuating a portion of the second radiation associated with fluorescence of the material layer and emitting a third radiation; detecting the third radiation at a radiation detector; and providing a measurement corresponding to the thickness of the layer of material based on the detected third radiation; and A method comprising: (Item 16) Item 16. The method of item 15, wherein the portion of the second radiation is attenuated by a filter, the filter comprising one or more filter layers configured to filter a range of energy levels associated with the fluorescence of the material layer. (Item 17) 17. The method of any one of claims 15-16, wherein the range of energy levels is predetermined based on an elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition. (Item 18) 18. The method according to any one of items 15-17, wherein the portion of the second radiation is attenuated by a filter configured to filter photons having an energy level below a predetermined threshold from the second radiation. (Item 19) 20. The method of claim 18, wherein the predetermined threshold is associated with an elemental composition of the material layer and an orbital shell property associated with each element in the elemental composition. (Item 20) 20. The method of any one of items 15-19, wherein the first radiation comprises X-rays. (Item 21) 21. The method of any one of items 15-20, wherein the first radiation comprises gamma radiation. (Item 22) 22. The method of any one of claims 15-21, wherein the radiation source and the radiation detector are disposed on opposite sides of the material layer. (Item 23) 23. The method of any one of claims 15-22, wherein the radiation source and the radiation detector are disposed on the same side of the material layer. (Item 24) 24. The method of any one of items 15-23, wherein the measurements have units of length. (Item 25) 25. The method of any one of claims 15-24, wherein the measurements comprise areal density. (Item 26) The first radiation has a predetermined energy level, and providing the measurement includes: measuring an intensity of the third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity and a default intensity not associated with a material layer; 26. The method according to any one of items 15-25, comprising: (Item 27) Providing the measurements includes: applying a logarithmic function to the measured intensities to determine logarithmic values; applying a polynomial function to the logarithmic values ​​to calculate the measurements; Including, 27. The method of claim 26, wherein coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and the range of thicknesses of the material layer to be measured. (Item 28) 28. The method of any one of claims 15-27, comprising displaying the measurement value corresponding to the thickness of the material layer. [Brief description of the drawings]

[0036] The foregoing summary and the following detailed description will be better understood when read in conjunction with the accompanying drawings, in which: For the purpose of illustrating the disclosure, the drawings show exemplary embodiments of the disclosure, but the disclosure is not limited to the specific methods and instrumentalities disclosed.

[0037] [Figure 1-1] 1A-C illustrate a system for measuring the thickness of a layer of material using electromagnetic radiation, according to some embodiments. [Figure 1-2] 1A-C illustrate a system for measuring the thickness of a layer of material using electromagnetic radiation, according to some embodiments.

[0038] [Diagram 2] FIG. 2 illustrates a graph showing radiation attenuation effects for different types of material compositions, according to some embodiments.

[0039] [Diagram 3] FIG. 3 illustrates a method of measuring the thickness of a layer of material using electromagnetic radiation, according to some embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0040] Embodiments of systems, methods, and devices using a radiation-based gauge to measure the thickness of a layer of material using electromagnetic radiation are described below. In some embodiments, the radiation-based gauge transmits a first radiation toward a material layer disposed between a radiation source of the first radiation and a radiation detector. In some embodiments, the radiation source and the radiation detector can be disposed on the same side of the material layer. In some embodiments, the first radiation can be referred to as a primary radiation, which represents a source radiation. As a result of receiving and interacting with the first radiation, a second radiation (i.e., sometimes referred to as a secondary radiation) can be emitted, the material layer including the unabsorbed portion of the first radiation, and the material layer including the fluorescent radiation. To improve the accuracy of the thickness measurement, the radiation-based gauge includes a filter disposed between the material layer and the radiation detector, the filter configured to filter a preselected energy level (and corresponding wavelength) associated with the fluorescence emitted by the material layer. In some embodiments, the radiation detector can be configured to provide a measurement corresponding to the thickness of the material layer based on the filtered second radiation. For example, a radiation detector may provide measurements in units of length (eg, millimeters or microns) or areal density (eg, grams per square meter).

[0041] 1A-C illustrate systems 100A-C for measuring the thickness of a material layer 116 using electromagnetic radiation, according to some embodiments. As shown in FIG. 1A, the system 100A includes a radiation source system 102A that generates and emits a radiation beam 130C (i.e., sometimes referred to as a primary radiation beam and indicating source radiation) toward a layer of material 116 (i.e., also referred to as a material layer). As shown in FIG. 1A, the material layer 116 has a thickness defined by a first surface 116A and a second surface 116B opposite the first surface 116A. In some embodiments, as shown in FIG. 1A, the material layer 116 is disposed between the radiation source system 102A and a radiation detection system 120A, which is configured to provide a measurement corresponding to the material thickness based on a radiation beam 130D emitted by the material layer 116.

[0042] In some embodiments, the radiation beam 130C can be emitted substantially perpendicular (e.g., within 90 degrees) to the material layer 116. In some embodiments, the radiation beam 130C can be directed at the material layer 116 at a predetermined angle. In some embodiments, the radiation beam 130C can be emitted as ionizing electromagnetic radiation including photons with sufficiently high energy (e.g., kinetic energy) to ionize atoms in the material layer 116. In some embodiments, the radiation beam 130C can include x-rays, gamma rays, radio waves, ultraviolet rays, infrared rays, terahertz rays, etc. In some embodiments, the radiation beam 130C can be emitted as other types of energy beams, such as ultrasound, or as ionizing non-electromagnetic radiation, such as particle-based radiation (e.g., alpha radiation or beta radiation).

[0043] In some embodiments, the material layer 116 can include a sheet or strip of material having a thickness defined by a first surface 116A and a second surface 116B opposite the first surface 116A. In some embodiments, the material sheet or strip can have a substantially uniform thickness. In some embodiments, the material layer 116 can be composed of a single element or multiple elements. For example, the material layer 116 can be composed of aluminum, steel, stainless steel, various alloys including steel, and the like. In some embodiments, the material layer 116 can be composed substantially of a single element by mass or a single alloy by mass. For example, the material layer 116 can include a sheet of aluminum, steel, and the like. In some embodiments, the term "substantially" as used in this disclosure herein can refer to 90% or more. For example, a material that includes substantially aluminum refers to a material that is 90% or more aluminum by mass.

[0044] In some embodiments, the term "layer" as used in the present disclosure herein can include a single layer or multiple layers (i.e., sub-layers). In some embodiments, each layer in the multiple layers can have an associated respective thickness. For example, material layer 116 can include multiple layers, or material layer 116 can include a multi-element composite in various proportions. For example, material layer 116 can be steel in a grade (grades classify the composition and physical properties of steel).

[0045] In some embodiments, the radiation source system 102A includes a user interface 103, a controller 104, a high voltage generator 106, a radiation generator 108, a beam collimator 110, and a beam hardening filter 112. In some embodiments, the radiation source system 102A can include a dust cover 114A made from a material having low attenuation. For example, the dust cover 114A can include a thin layer of a material having a low absorption window, such as polyethylene terephthalate (PET). For example, the thin layer can be less than 1 mm, such as 0.5 to 1 mm.

[0046] In some embodiments, the high voltage generator 106 can be configured to generate a high voltage to enable electromagnetic radiation to be generated by the radiation generator 108. In some embodiments, the high voltage generator 106 can be configured to generate a voltage level (e.g., 50 kV) from a range of voltages (e.g., 5 kV-500 kV) based on the type of material of the layer 116 and the range of thickness to be measured. For example, the high voltage generator 106 can generate a voltage range of 0-500 kV, 5-300 kV, 5-200 kV, 5-100 kV, or 10-50 kV.

[0047] In some embodiments, the radiation generator 108 can be configured to generate the radiation beam 130A based on the high voltage generated by the high voltage generator 106. In some embodiments, the radiation generator 108 can generate the radiation beam 130A having a spectrum of energy based on the voltage level of the high voltage generator 106, where the end point energy of the energy spectrum corresponds to the voltage level. For example, operating the radiation generator 108 at a voltage level of 50 kV can generate the radiation beam 130A having photons with energy levels ranging from a few keV (e.g., 1-2 keV) to 50 keV. In another embodiment, for example, operating the radiation generator 108 at a voltage level of 100 kV can generate the radiation beam 130A having an energy spectrum from a few keV to 100 keV.

[0048] In some embodiments, the radiation beam 130A can be configured to operate within a specific range of energy levels based on the thickness range of the material layer 116 to be measured and the composition of the material layer 116. In some embodiments, as shown in FIG. 1A, the radiation generator 108 can include an X-ray tube configured to generate the radiation beam 130A in the form of X-rays based on the voltage levels generated by the high voltage generator 106. Depending on the anode material and the potential difference between the anode and cathode of the X-ray tube, the radiation generator 108 can emit the radiation beam 130A in the form of a continuum radiation (i.e., bremsstrahlung radiation). In addition, the energy spectrum of the radiation beam 130A can include a fluorescent peak characteristic of the anode material superimposed on the continuum radiation.

[0049] In some embodiments, the collimator 110 can be configured to shape the beam spot, the beam solid angle, or both the beam spot and the beam solid angle of the radiation beam 130C with respect to the material layer 116. For example, the collimator 110 can be configured to filter the stream of radiation beam 130A such that only that traveling parallel to a defined direction is allowed to pass, shown as radiation beam 130B. Other examples of the collimator 110 can include, without limitation, a pinhole collimator, a converging collimator, a cone beam collimator, and the like. In some embodiments, the collimator 110 can include a beam shutter 111 configured to control the operation of the collimator 110 to shape or limit the beam solid angle of the radiation beam 130A generated by the radiation generator 108.

[0050] In some embodiments, the beam-hardening filter 112 can be configured to apply beam hardening to the radiation beam 130B before it is emitted as the radiation beam 130C (i.e., sometimes referred to as the primary radiation). In some embodiments, the beam-hardening filter 112 can include a material configured to selectively attenuate lower energy photons of the radiation beam 130B. In some embodiments, the material of the beam-hardening filter 112 can include various metals, such as aluminum, copper, steel, tungsten, etc., depending on the material composition of the material layer 116 to be measured and the thickness range of the material layer 116 to be measured. In some embodiments, the lower energy photons can include photons having energy levels below 20 keV, below 15 keV, or below 5 keV. In some embodiments, the beam-hardening filter 112 can include a material that acts as a bandpass filter, allowing a certain bandwidth of energy levels of the radiation beam 130B to be emitted as the radiation beam 130C. In some embodiments, positioning a beam hardening filter 112 after the collimator 110 can enable the radiation beam 130C being emitted from the radiation source system 102A to have increased average beam energy (i.e., be “hardened”).

[0051] In some embodiments, the user interface 103 may enable an operator to control the operation of the radiation source system 102A through the controller 104. In some embodiments, the user interface 103 may be provided via a network interface that provides a web-based interface. In some embodiments, the network interface may be configured to access wired and / or wireless networks spanning a wide area network (WAN), such as the Internet, an intranet, a local area network (LAN), a metropolitan area network (MAN), etc. In some embodiments, the network interface may use any of a number of communication standards, protocols, and technologies, including, but not limited to, Global System for Mobile Communications (GSM), Long Term Evolution (LTE), Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Bluetooth, Wireless Fidelity (Wi-Fi) (e.g., IEEE 802.11a, IEEE 802.11b, IEEE 802.11g, and / or IEEE 802.11n), Wi-MAX, Ethernet, etc.

[0052] In some embodiments, the radiation beam 130C emitted by the radiation source system 102A toward the material layer 116 can cause the material layer 116 to emit the radiation beam 130D. As discussed above, attenuation of the radiation beam 130C occurs due to interactions between photons in the radiation beam 130C and atoms in the material layer 116. In some embodiments, the radiation beam 130C can be configured to provide photons having an energy level below 500 keV. Within this energy range, attenuation of the radiation beam 130C can be caused primarily by the photoelectric effect, in which the energy of some photons in the radiation beam 130C is absorbed by atoms in the material layer 116. Thus, the emitted radiation beam 130D can exclude some of the photons in the radiation beam 130C. In addition, due to the orbital shell properties of the elements in the material layer 116, the photoelectric effect can cause the emission of photons with lower energy levels than the incident photons (also known as fluorescence, sometimes referred to as secondary radiation). These lower energy photons have energy levels that depend on the binding energies and orbital shell properties of the elements in material layer 116. Thus, radiation beam 130D includes the unabsorbed portion of radiation beam 130C (i.e., the primary radiation), and radiation beam 130D can also include fluorescent radiation (i.e., the secondary radiation) caused by the photoelectric effect.

[0053] In some embodiments, radiation detection system 120A can be configured to provide a measurement corresponding to a thickness of material layer 116 based on the attenuation of radiation beam 130C passing through material layer 116 and received as radiation beam 130D. In some embodiments, radiation detection system 120A includes an energy filter 122A, a radiation detector 124A, front-end electronics 126, a controller 128, and a display 130. In some embodiments, radiation detection system 120 includes a dust cover 114B having low attenuation. Dust cover 114B corresponds to dust cover 114A and may similarly include, for example, a thin layer of polyethylene terephthalate (PET).

[0054] In some embodiments, the energy filter 122A can include one or more filter layers configured to attenuate a predetermined range of wavelengths corresponding to a range of energy levels associated with fluorescence from the material layer 116. In some embodiments, the energy filter 122A can be configured to filter lower energy photons having energy levels below 50 keV, below 40 keV, below 30 keV, below 20 keV, below 15 keV, below 10 keV, below 9 keV, below 8 keV, below 7 keV, below 6 keV, or below 5 keV.

[0055] The energy filter 122A can be configured to emit the filtered radiation beam 130D as radiation beam 130E. As is well known in the relevant art, the relationship between a photon wavelength and its energy is defined by the Planck-Einstein relationship, i.e., E=(h×c) / λ, where E is the photon energy (eV), h is the Planck constant, c is the speed of light (m / sec), and λ is the wavelength (m). In some embodiments, the range of wavelengths and the corresponding range of energy levels to be filtered can be determined based on the orbital shell properties of different types of elements in the material layer 116. In some embodiments, the range of energy levels can be pre-determined based on a pre-configured energy of the radiation beam 130C and one or more K-edge energy levels associated with the material layer 116. In some embodiments, the energy filter 122A can be constructed from various metals, such as aluminum, copper, steel, tungsten, or combinations thereof, depending on the range of energy levels to be filtered. In some embodiments, the energy filter 122A can include multiple layers, with each layer configured to filter a corresponding range of energy levels.

[0056] In some embodiments, the radiation detector 124A can be configured to detect the radiation beam 130E emitted by the energy filter 122A. In some embodiments, the radiation detector 124A can be configured to generate a signal corresponding to an intensity (i.e., illuminance) metric of the radiation beam 130E. For example, the signal can be a current (e.g., an AC current or a DC current) proportional to the intensity of the radiation beam 130E, a series of current or light pulses whose characteristics correspond to the intensity of the radiation beam 130E, or a sound wave with characteristics corresponding to the intensity of the radiation beam 130E, etc.

[0057] In some embodiments, the radiation detector 124A can include an energy spectrum independent detector configured to generate a signal representative of the total intensity of the radiation beam 130E. For example, the radiation detector 124A can include an ionization chamber that measures the ionization of gas in the ionization chamber caused by the radiation beam 130E. In these embodiments, the ionization chamber can be configured to apply a bias voltage between a cathode and an anode of the ionization chamber to generate an electric field and collect the charged fraction of the ionization at an appropriate polarity electrode (e.g., positive ions are attracted to the cathode and electrons migrate toward the anode).

[0058] In some embodiments, the ionization chamber can be configured to generate a signal (e.g., a current) resulting from ionization caused by the radiation beam 130E, and the generated signal can correspond to the intensity of the radiation beam 130E. In some embodiments, the gas can include argon, xenon, P10, air, etc. In some embodiments, the ionization chamber can be operated in a linear mode, a proportional mode, or a Geiger mode depending on the electric field to be generated and the geometry of the cathode.

[0059] In some embodiments, the radiation detector 124A includes a multi-channel detector (e.g., multi-chamber) and can detect the radiation intensity profile of the radiation beam 130E. In some embodiments, in contrast to a radiation detector that can detect the energy spectrum of the radiation beam 130E, the radiation detector 124A can include an energy spectrum specific radiation detector. Examples of such radiation detectors can include photomultiplier tubes (PMTs), some solid state detectors (e.g., silicon-based), or gas-based detectors, etc. In some embodiments, the radiation detector 124A can generate a signal representative of the total photon energy level of the radiation beam 130E whose measurement is sensitive to any fluorescent energy. Thus, by including the energy filter 122A, any fluorescent energy can be filtered (e.g., absorbed) before being detected and processed by the radiation detector 124A.

[0060] In some embodiments, the radiation detector 124A can include a semiconductor detector that uses a semiconductor to measure the effect of incident charged particles or photons caused by the radiation beam 130E. In some embodiments, the semiconductor detector can include a silicon detector, a germanium detector (e.g., a high purity germanium (HPGe) detector), a diamond detector, a cadmium telluride detector, or a zinc cadmium telluride detector. In some embodiments, the type of radiation detector 124A can be provided depending on the material layer and the thickness range to be measured. For example, a silicon detector may not be able to effectively attenuate radiation with energies above 20 keV (e.g., x-rays and gamma rays), thus limiting the thickness range and material type.

[0061] In some embodiments, the radiation detector 124A can include a scintillation detector. In some embodiments, the scintillation detector includes a scintillation crystal configured to emit light when excited by the ionizing radiation of the radiation beam 130E. In some embodiments, the scintillation crystal can include materials such as sodium iodide, cesium iodide, LSO, lead tungstate, BGO, lanthanum bromide and lanthanum chloride, plastic scintillators, liquid scintillators (linear and benzene ring based), scintillating fibers and fiber bundles, zinc sulfide, and the like. In these embodiments, the radiation detector 124 can include one or more photodetectors (e.g., silicone photodiodes, avalanche photodiodes, photomultiplier tubes, and the like) configured to detect luminescence (i.e., light) emitted by the scintillation crystal.

[0062] In some embodiments, the front-end electronics 126 can be configured to amplify or process signals generated by the radiation detector 124A. For example, the front-end electronics 126 can include amplifiers, digital circuitry, digital signal processing, etc.

[0063] In some embodiments, the controller 128 can be configured to provide a measurement corresponding to a thickness of the material layer 116 based on the radiation beam 130E as detected by the radiation detector 124A. For example, the controller 128 can calculate a thickness measurement (e.g., a unit of length or an areal density) based on a signal representative of the radiation beam 130E, amplified or processed by the front-end electronics 126, as will be further described below. In some embodiments, the controller 128 can be configured to display the calculated measurement on the display 130. In some embodiments, the controller 128 can be configured to calculate the layer thickness continuously or periodically.

[0064] In some embodiments, to determine a measurement value corresponding to a thickness, the controller 128 can select a stored configuration to apply to the signal based on user input, for example, from the user interface 103. In some embodiments, the user input can include a type of material (e.g., elemental composition) of the material layer 116 whose thickness is to be measured, a range of thicknesses to be measured, or a combination thereof. In some embodiments, the radiation detection system 120A can include multiple energy filters, and in response to the user input, the controller 128 can be configured to select a corresponding energy filter 122A for use from the multiple energy filters. In some embodiments, in response to the user input, the controller 128 can be configured to display to the user (on the display 130) the type of energy filter 122A that needs to be inserted into the radiation detection system 120A.

[0065] In some embodiments, the signal is calculated as a total charge Q as detected and collected by the radiation detector 124A from the radiation beam 130E based on the material layer 116 having a thickness t. T The total charge Q can be configured to be proportional to T can be related to the energy spectrum provided by radiation beam 130C (ie, from zero to maximum energy) and related to the charge collected across it.

[0066] In some embodiments, the signal (i.e., s) is Q according to the following relationship: T It can be constructed to be proportional to: s = [Q T -Q0] / [Q max −Q0], where Q0 represents the offset of the system (i.e., without the material layer 116 positioned between the radiation source system 102A and the radiation detection system 120A), and Q maxrepresents the charge of a radiation detector 124 with a material layer 116 having an "infinite" thickness. In some embodiments, the "infinite" thickness is at least 50,000 g / cm 2 , which is large compared to the target range of material thickness to be measured.

[0067] In some embodiments, to calculate a measurement value corresponding to the thickness of the material layer 116, the controller 128 can be configured to apply a logarithmic function to the signal (i.e., s) to generate a logarithmic value (i.e., x). For example, the controller 128 can generate a logarithmic value according to the following function: x=ln(s). In some embodiments, the controller 128 can be configured to apply a polynomial function or an orthogonal function that spans the range of measurements to the logarithmic value to calculate a measurement value corresponding to the thickness of the material layer 116. In some embodiments, the orthogonal function can include orthogonal trigonometric functions, orthogonal polynomials, among other types of orthogonal functions. In some embodiments, the polynomial function can have multiple terms with multiple corresponding coefficients. In some embodiments, the number of terms and corresponding coefficients is predetermined based on experimental values ​​obtained based on the range of thicknesses of the material layer 116 to be measured. For example, the polynomial function can have four terms: t=a0+a1x+a2x 2 +a3x 3 +a4x 4 , where a0, a1, a2, a3, and a4 are predetermined coefficients and x is the logarithmic value (e.g., x=ln(s)).

[0068] 1B-C illustrate systems 100B-C for measuring a thickness of a material layer 116 using electromagnetic radiation, according to some embodiments. In each of the systems 100B-C, the radiation source system 102B-C and the radiation detection system 120B-C can be positioned on the same side of the material layer 116 (e.g., the side of the first surface 116A). In some embodiments, the radiation source system 102B-C and the radiation detection system 120B-C can correspond to the radiation source system 102A and the radiation detection system 120A, respectively, as described above with respect to FIG. 1A. Like the radiation detection system 120A, each of the radiation detection systems 120B-C can include a respective energy filter 122B-C positioned between the material layer 116 and the respective radiation detector 124B-C.

[0069] In some embodiments, radiation detection systems 120B-C operate like radiation detection system 120A and are configured with respective energy filters 122B-C to selectively filter predetermined ranges of energy levels (i.e., wavelengths) corresponding to the fluorescent properties of material layer 116. However, in contrast to radiation detection system 120A, which relies on the photoelectric effect to provide measurements corresponding to the thickness of material layer 116, radiation detection systems 120B-C rely on the Compton effect (i.e., sometimes referred to as Compton scattering or incoherent scattering) caused by radiation source systems 102B-C to provide measurements. Although the radiation detected by radiation detection systems 120B-C is primarily caused by the Compton effect, the detected radiation may also include a portion of radiation caused by the photoelectric effect (e.g., fluorescent radiation), as will be further described below.

[0070] As shown in system 100B, radiation source system 102B can emit radiation beam 132A (i.e., primary radiation) to material layer 116. For example, radiation beam 132A can be emitted at a preconfigured angle or substantially perpendicular to first surface 116A. In some embodiments, Compton scattering occurs when an incident photon in radiation beam 132A is deflected from its original path based on an interaction with an atom (e.g., an electron) in material layer 116 and, as a result, travels on a modified path with less energy. The change in photon energy depends on the angle of scattering and the photon energy. Thus, due to the Compton effect, a portion of radiation beam 132A will be deflected and emitted as backscattered radiation. In some embodiments, radiation beam 132A can emit radiation beam 132B including backscattered radiation and fluorescent radiation to material layer 116, as described above with respect to FIG. 1A. Like energy filter 122A, energy filter 122B can be configured to filter the fluorescent radiation and emit radiation beam 132C representing filtered radiation beam 132B. Radiation detection system 120B can then be configured to provide a measurement corresponding to the thickness of material layer 116 based on the intensity of radiation beam 132C detected by radiation detector 124B.

[0071] In some embodiments, the system 100C can include a reflector 117 disposed on a side of the second surface 116B opposite that of the radiation source system 102C and the radiation detection system 120C. In some embodiments, the reflector 117 can be a solid material such as a metal plate. As shown in FIG. 1C, the radiation source system 102C can be configured to emit a radiation beam 134A to the first surface 116A of the material layer 116. The material layer 116 can be configured to emit a radiation beam 134B including an unabsorbed portion of the radiation beam 134A and fluorescent radiation, each of which is caused by the photoelectric effect described above with respect to FIG. 1A. The reflector 117 can emit a radiation beam 134C representing the backscattering of the radiation beam 134B based on the Compton effect. In addition, the radiation beam 134C can include fluorescent radiation generated by the reflector 117. In some embodiments, material layer 116 can be configured to emit radiation beam 134D that includes a portion of photons from radiation beam 134A due to the Compton effect, a portion of photons from radiation beam 134C due to the photoelectric effect, and fluorescent radiation generated based on interactions of photons from radiation beams 134A and 134C with atoms in material layer 116.

[0072] 2 illustrates a graph 200 showing radiation attenuation effects for different types of material compositions, according to some embodiments. As shown, the graph 200 plots mass-energy attenuation coefficients (cm) on a logarithmic scale for various elemental compositions at different x-ray energy levels 202 (keV), as shown in legend 206. 2 3 plots the atomic composition of the elemental composition (Z / g) 204. For example, legend 206 shows the following elemental composition with the atomic number (i.e., Z) shown for a single element: beryllium (Z=4), aluminum (Z=13), titanium (Z=22), tin (Z=50), tungsten (Z=74), lead (Z=82), copper (Z=29), and BoPET (biaxially oriented polyethylene terephthalate) (e.g., Mylar), a polyester film made from various elements (i.e., C 10As shown in graph 200, the photoelectric effect of BoPET can be taken into account during thickness measurements because BoPET has low attenuation across X-ray energy levels 202 and does not contain a K-edge within the energy spectrum used to measure a range of material thicknesses.

[0073] As discussed above, the K-edge refers to the binding energy of the K-shell electrons in an atom. The photoelectric effect refers to the ejection of electrons or other free carriers when radiation is directed at a material. When a photon has an energy level close to and above the K-edge of an atom, the photon is more likely to be absorbed than a photon with a photon energy just below the K-edge, resulting in photoelectron absorption. For example, as shown in graph 200, the K-edge characteristics of a composition can cause a sudden increase in the photon mass-energy attenuation coefficient that occurs at photon energies just above the K-edge for that composition. For example, the K-edge 212 of titanium is around 5 keV and the K-edge 210 of silicon is around 1.8 keV. As discussed above, at the K-edge energy levels, fluorescent radiation can be generated, which can reduce the accuracy of the thickness gauge system.

[0074] FIG. 3 illustrates a method 300 for measuring the thickness of a material layer using electromagnetic radiation, according to some embodiments. In some embodiments, the method 300 can be performed by a thickness gauge system, such as radiation-based gauge systems 100A-C, as described above with respect to FIGS. 1A-C. In some embodiments, the thickness gauge system includes a material layer positioned between a radiation source and a radiation detector, as shown in FIG. 1A. In some embodiments, the thickness gauge system includes a radiation source and a radiation detector positioned on the same side as the material layer, as shown in FIG. 1B-C.

[0075] In step 302, a thickness gauge system directs a first radiation from a radiation source toward a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface. In some embodiments, the first radiation received at the first surface causes the layer of material to emit a second radiation. In some embodiments, the first radiation can include ionizing electromagnetic radiation, such as x-rays or gamma rays.

[0076] In some embodiments, the second radiation emitted by the material layer includes a portion of the photons from the first radiation and includes fluorescent radiation emitted by the material layer as a result of interactions between photons of the first radiation and atoms of the material layer. In some embodiments, the second radiation emitted by the material layer includes a first portion of the photons from the first radiation and excludes a second portion of the photons absorbed by the material layer due to the photoelectric effect from the first radiation. In some embodiments, the second radiation emitted by the material layer includes a third portion of the photons from the first radiation that are deflected according to the Compton effect. As discussed above, at low energy levels (e.g., below 500 keV), the photoelectric effect contributes the largest effect, out of the major types of radiation-matter interactions, on the attenuation of the first radiation.

[0077] In step 304, the thickness gauge system attenuates a portion of the second radiation associated with the fluorescence of the material layer and emits a third radiation. Thus, the third radiation comprises a filtered second radiation. In some embodiments, the portion of the second radiation is attenuated by a filter positioned between the material layer and the radiation detector, as shown in FIGS. 1A-C.

[0078] In some embodiments, the filter includes one or more filter layers configured to filter a range of energy levels associated with the fluorescence of the material layer, as discussed above with respect to FIG. 1A. In some embodiments, the filter can be comprised of a material configured to filter photons from the second radiation having an energy level below a predetermined threshold. In some embodiments, the predetermined threshold can be at least 5 keV, 6 keV, 7 keV, 8 keV, 9 keV, 10 keV, 15 keV, or 20 keV. In some embodiments, the predetermined threshold can be less than 50 keV, 20 keV, 15 keV, 10 keV, 9 keV, 8 keV, 7 keV, or 6 keV. In some embodiments, the predetermined threshold can be 5-50 keV, 5-20 keV, 5-10 keV, or 6-10 keV.

[0079] In some embodiments, the filter includes multiple filter layers for filtering multiple energy levels, hi some embodiments, the range of energy levels to be filtered is predetermined based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

[0080] In contrast to conventional radiofluorescence analysis, which in some embodiments is used to determine the elemental composition of a material, the thickness gauge system described herein seeks to attenuate and block the fluorescent radiation, reducing the sensitivity of the thickness measurement to the elemental composition and range of material thickness to be measured. By using filters, as described above with respect to Figures 1A-C, the thickness gauge system can be configured to use a radiation detector that is independent of the energy spectrum to provide a measurement corresponding to the thickness of a material layer.

[0081] In step 306, the thickness gauge system detects the third radiation at a radiation detector. In some embodiments, a radiation detector (e.g., radiation detector 124) of the thickness gauge system can be configured to quantify the intensity of the third radiation. In some embodiments, the radiation detector can be configured to generate a signal corresponding to the intensity of the third radiation. For example, the signal can be a current, a pulse train, a sound wave, etc. In some embodiments, the generated signal is configured to be proportional to the intensity. For example, when the first radiation is an x-ray, the radiation detector can be an ionization chamber configured to generate a current whose magnitude is proportional to the intensity.

[0082] In step 308, the thickness gauge system provides a measurement corresponding to the layer thickness based on the detected third radiation. In some embodiments, the measurement provided includes a unit of length corresponding to the layer thickness length. In some embodiments, the measurement provided includes an areal density corresponding to the layer thickness. In particular, one skilled in the art will recognize that the areal density and thickness length may be one of a number of given quantities that are readily derived according to the following relationship: areal density = thickness length x density.

[0083] In some embodiments, a controller (e.g., controller 128) of the thickness gauge system can be configured to calculate a measurement value based on a signal generated by the radiation detector, the signal representing a detected intensity of the detected third radiation. In some embodiments, the controller can be configured to apply a logarithmic function to the measured current of the signal to determine a logarithmic value, and then apply a stored configuration to the logarithmic value to calculate a measurement value corresponding to the thickness. For example, the stored configuration can be a polynomial function applied to the logarithmic value to calculate the measurement value. In some embodiments, the controller can be configured to select a stored configuration from a plurality of stored configurations based on a user input. For example, the user input can define a stored configuration. In some embodiments, the user input can include a type of material to be measured and / or a range of thicknesses to be measured.

[0084] In some embodiments, the coefficients in the polynomial function are predetermined (provided in a stored configuration) based on the elemental composition of the material layer and the range of thicknesses of the material layer to be measured. In some embodiments, the coefficients in the polynomial function are predetermined based on multiple elemental compositions having similar material properties. For example, multiple elemental compositions may have attenuation and fluorescence characteristics that are substantially the same for a range of thicknesses to be measured. In some embodiments, the controller can be configured to display the calculated measurements on a display of the thickness gauge system. For example, the calculated measurements may be displayed as units of length (e.g., millimeters or microns) or areal density (e.g., grams per square meter).

[0085] The foregoing description sets forth exemplary methods, parameters, etc. However, it should be recognized that such description is not intended as a limitation on the scope of the present disclosure, but is instead provided as a description of exemplary embodiments. The exemplary embodiments described above are not intended to be exhaustive or to limit the present disclosure to the precise forms disclosed. Many modifications and variations are possible in light of the above teachings. The embodiments have been chosen and described in order to best explain the principles of the disclosed techniques and their practical application. Others skilled in the art will thereby be able to best utilize the techniques and various embodiments with various modifications as suited to the particular use envisaged.

[0086] Although the present disclosure and examples have been thoroughly described with reference to the accompanying drawings, it should be noted that various changes and modifications will become apparent to those skilled in the art. Such changes and modifications should be understood as being included within the scope of the present disclosure and examples as defined by the claims. In the foregoing description of the present disclosure and embodiments, reference is made to the accompanying drawings, which show, by way of example, specific embodiments that may be practiced. It should be understood that other embodiments and examples may be practiced, and that changes may be made without departing from the scope of the present disclosure.

[0087] Although the above description uses terms such as first, second, etc. to describe various elements, these elements should not be limited by such terms. These terms are used only to distinguish one element from another.

[0088] It should also be understood that, as used in the foregoing description, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context indicates otherwise. It should also be understood that, as used herein, the term "and / or" refers to and encompasses any and all possible combinations of one or more of the associated listed items. It should further be understood that the terms "includes," "including," "comprises," and / or "comprising," as used herein, specify the presence of stated features, integers, steps, operations, elements, components, and / or units, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, units, and / or groups thereof.

[0089] The term "if" may be interpreted to mean "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrase "if it is determined" or "if [a stated condition or event] is detected" may be interpreted to mean "upon determining," or "in response to determining," or "upon detecting [the stated condition or event]," or "in response to detecting [the stated condition or event]."

[0090] In some embodiments, a non-transitory computer-readable storage medium stores one or more programs configured to be executed by one or more processors of a device, the one or more programs including instructions for implementing any of the steps described or claimed herein. The present disclosure also relates to a device for performing the operations herein. The device is specially constructed or configured for the required purpose and may include, for example, an application specific integrated circuit (ASIC), a field programmable gate array (FPGA), a digital signal processor (DSP), or it may include a general purpose computer selectively activated or reconfigured by a computer program stored in the computer.

[0091] Such computer programs may be stored in any type of non-transitory computer readable storage medium, such as a disk, including, but not limited to, a floppy disk, an optical disk, a CD-ROM, a magneto-optical disk, a read-only memory (ROM), a random access memory (RAM), an electrical program read-only memory (EPROM), an electrically erasable program read-only memory (EEPROM), a magnetic or optical card, an application specific integrated circuit (ASIC), a USB flash drive, or any type of medium suitable for storing electronic instructions, each coupled to a computer system bus. Additionally, the devices referenced within this disclosure may include a single processor or may be architectures employing multiple processor designs for increased computing power.

[0092] The methods, devices, and systems described herein are not inherently related to any particular computer or other apparatus. Various general purpose systems may also be used with programs in accordance with the teachings herein, or it may prove convenient to construct more specialized apparatus to perform the required method steps. The required structure for a variety of these systems will be apparent from the description above. This disclosure has not been described with reference to any particular programming language. It will be understood that a variety of programming languages ​​may be used to implement the teachings of the present disclosure as described herein.

[0093] Although the present disclosure and examples have been fully described with reference to the accompanying drawings, it should be noted that various changes and modifications will become apparent to those skilled in the art, and such changes and modifications should be understood as being included within the scope of the present disclosure and examples as defined by the claims.

Claims

1. A system for measuring a thickness of a layer of material using electromagnetic radiation, the system comprising: a radiation source configured to direct a first radiation toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation causing the layer of material to emit a second radiation; a filter positioned between the material layer and a radiation detector, the filter configured to attenuate a portion of the second radiation associated with the fluorescence of the composition of the material layer by filtering a preselected energy level of the second radiation corresponding to the fluorescence of the composition of the material layer and emit a third radiation, the radiation detector configured to detect the third radiation; a controller configured to provide a measurement corresponding to the thickness of the layer of material based on the detected third radiation; and The system comprises:

2. The system described in claim 1, wherein the filter comprises one or more filter layers configured to filter the preselected energy levels, the preselected energy levels being a range of energy levels associated with the fluorescence of the composition of the material layer.

3. The system described in claim 2, wherein the preselected energy level associated with the fluorescence of the composition of the material layer is preselected based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

4. The system of claim 1, wherein the filter is configured to filter photons from the second radiation having an energy level below a predetermined threshold based on the composition of the material layer.

5. The system described in claim 4, wherein the predetermined threshold based on the composition of the material layer is associated with the elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition.

6. The controller provides the measurement value corresponding to the thickness of the material layer based on the detected third radiation and the first radiation, the detected third radiation and the first radiation having default intensities not associated with a material layer, and the controller: measuring an intensity of the detected third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity of the third radiation and the default intensity not associated with a material layer; The system of claim 1 , further configured to:

7. The controller: calculating a logarithm of a ratio between the default intensity of the first radiation and the measured intensity of the detected third radiation; calculating the measurements corresponding to the thickness of the material layer based on a polynomial function of the logarithmic values; The system of claim 6 , further configured to:

8. The system of claim 1, wherein the first radiation comprises X-rays.

9. The system of claim 1, wherein the first radiation comprises gamma rays.

10. The system of claim 1, wherein the measurements have units of length.

11. The system of claim 1, wherein the measurements comprise areal density.

12. The system of claim 1, further comprising a display configured to display the measurement value corresponding to the thickness of the material layer.

13. A method for measuring a thickness of a layer of material using electromagnetic radiation, the method comprising: directing a first radiation from a radiation source toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation received at the first surface causing the layer of material to emit a second radiation; attenuating a portion of the second radiation associated with the fluorescence of the composition of the material layer by attenuating a preselected energy level of the second radiation corresponding to the fluorescence of the composition of the material layer and emitting a third radiation, wherein a filter is configured to attenuate the preselected energy level of the second radiation; detecting the third radiation in a radiation detector; providing a measurement corresponding to the thickness of the layer of material based on the detected third radiation; and A method comprising:

14. The method of claim 13, wherein the portion of the second radiation is attenuated by the filter, the filter having one or more filter layers configured to filter the preselected energy levels, the preselected energy levels being a range of energy levels associated with the fluorescence of the composition of the material layer.

15. The method described in claim 14, wherein the preselected energy level associated with the composition of the material layer is preselected based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

16. The method of claim 13, wherein the portion of the second radiation is attenuated by a filter configured to filter photons from the second radiation having an energy level below a predetermined threshold based on the composition of the material layer.

17. The method described in claim 16, wherein the predetermined threshold based on the composition of the material layer is associated with the elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition.

18. The method of claim 17, further comprising: providing a measurement corresponding to the thickness of the material layer based on the detected third radiation, the measurement comprising: Providing a default strength that is not associated with a material layer; measuring an intensity of the detected third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity of the third radiation and the default intensity not associated with a material layer; The method of claim 13, comprising: Providing a measurement corresponding to the thickness of the material layer based on the detected third radiation, calculating a logarithm of a ratio between the default intensity of the first radiation and the measured intensity of the detected third radiation; calculating the measurements corresponding to the thickness of the material layer based on a polynomial function of the logarithmic values; 20. The method of claim 18, comprising:

20. The method of claim 13, wherein the first radiation comprises X-rays.

21. The method of claim 13, wherein the first radiation comprises gamma rays.

22. The method of claim 13, wherein the measurements have units of length.

23. The method of claim 13, wherein the measurements comprise areal density.

24. The method of claim 13, comprising displaying the measurement value corresponding to the thickness of the material layer.

25. A system for measuring a thickness of a layer of material using electromagnetic radiation, the system comprising: a radiation source configured to direct a first radiation toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation causing the layer of material to emit a second radiation; a filter positioned between the material layer and a radiation detector, the filter configured to attenuate a portion of the second radiation associated with the fluorescence of the composition of the material layer by filtering a preselected energy level of the second radiation associated with the fluorescence of the composition of the material layer and emit a third radiation, the radiation detector configured to detect the third radiation; a controller configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation, the first radiation having a predetermined energy level, and to provide the measurement, the controller further comprising: measuring an intensity of the third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity and a default intensity not associated with a material layer; A system configured to:

26. The system described in claim 25, wherein the filter comprises one or more filter layers configured to filter the preselected energy levels, the preselected energy levels being a range of energy levels associated with the fluorescence of the composition of the material layer.

27. ​​The system described in claim 26, wherein the preselected energy level associated with the fluorescence of the composition of the material layer is preselected based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

28. The system described in claim 25, wherein the filter is configured to filter photons from the second radiation having an energy level below a predetermined threshold based on the composition of the material layer.

29. The system described in claim 28, wherein the predetermined threshold based on the composition of the material layer is associated with the elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition.

30. The controller providing the measurements corresponding to the thickness of the material layer, the controller further comprising: calculating a logarithm of a ratio between the default intensity of the first radiation and the measured intensity of the detected third radiation; calculating the measurements corresponding to the thickness of the material layer based on a polynomial function of the logarithmic values; 26. The system of claim 25, further configured to:

31. The system of claim 25, wherein the first radiation comprises X-rays.

32. The system of claim 25, wherein the first radiation comprises gamma rays.

33. The system described in claim 25, wherein the radiation source and the radiation detector are positioned on opposite sides of the material layer.

34. The system described in claim 25, wherein the radiation source and the radiation detector are positioned on the same side of the material layer.

35. The system of claim 25, wherein the measurements have units of length.

36. The system of claim 25, wherein the measurements comprise areal density.

37. To provide the measurements, the controller comprises: determining a logarithmic value by applying a logarithmic function to the measured intensities; calculating said measurements by applying a polynomial function to said logarithmic values; [0023] The method according to claim 1, further comprising:

26. The system of claim 25, wherein coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and a range of thicknesses of the material layer to be measured.

38. The system of claim 25, further comprising a display configured to display the measurement value corresponding to the thickness of the material layer.

39. A method for measuring a thickness of a layer of material using electromagnetic radiation, the method comprising: directing a first radiation from a radiation source toward a first surface of a layer of material, the layer of material having a thickness between the first surface and a second surface opposite the first surface, the first radiation received at the first surface causing the layer of material to emit a second radiation; attenuating a portion of the second radiation associated with the fluorescence of the composition of the material layer by attenuating a preselected energy level of the second radiation corresponding to the fluorescence of the composition of the material layer and emitting a third radiation, wherein a filter is configured to attenuate the preselected energy level of the second radiation; detecting the third radiation in a radiation detector; providing a measurement corresponding to the thickness of the material layer based on the detected third radiation, the first radiation having a default intensity not associated with material layers, providing the measurement including: measuring an intensity of the third radiation; and calculating the measurement corresponding to the thickness of the material layer based on the measured intensity and a default intensity not associated with a material layer; Including, A method comprising:

40. The method of claim 39, wherein the portion of the second radiation is attenuated by the filter, the filter comprising one or more filter layers configured to filter the preselected energy levels, the preselected energy levels being a range of energy levels associated with the fluorescence of the composition of the material layer.

41. The method described in claim 40, wherein the preselected energy levels are preselected based on the elemental composition of the material layer and the orbital shell properties associated with each element in the elemental composition.

42. The method of claim 39, wherein the portion of the second radiation is attenuated by a filter configured to filter photons from the second radiation having an energy level below a predetermined threshold based on the composition of the material layer.

43. The method described in claim 42, wherein the predetermined threshold based on the composition of the material layer is associated with the elemental composition of the material layer and orbital shell properties associated with each element in the elemental composition. Providing a measurement value corresponding to the thickness of the material layer based on the detected third radiation, calculating a logarithm of a ratio between the default intensity of the first radiation and the measured intensity of the detected third radiation; calculating the measurements corresponding to the thickness of the material layer based on a polynomial function of the logarithmic values; 40. The method of claim 39, comprising:

45. The method of claim 39, wherein the first radiation comprises X-rays.

46. ​​The method of claim 39, wherein the first radiation comprises gamma rays.

47. The method of claim 39, wherein the radiation source and the radiation detector are positioned on opposite sides of the material layer.

48. The method of claim 39, wherein the radiation source and the radiation detector are positioned on the same side of the material layer.

49. The method of claim 39, wherein the measurements have units of length.

50. The method of claim 39, wherein the measurements comprise areal density.

51. Providing the measurements, comprising: determining a logarithmic value by applying a logarithmic function to the measured intensities; calculating said measurements by applying a polynomial function to said logarithmic values; Including, 40. The method of claim 39, wherein coefficients in the polynomial function are predetermined based on the elemental composition of the material layer and the range of thicknesses of the material layer to be measured.

52. The method of claim 39, further comprising displaying the measurement value corresponding to the thickness of the material layer.

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