Method and system for detecting inclusions in float glass based on spectral reflectance analysis - Patents.com

Abstract

To provide a method and / or system for detecting and / or identifying inclusions (e.g., nickel sulfide based inclusions / defects) in glass such as soda-lime-silica based float glass.SOLUTION: In certain example instances, during and / or after a glass-making process, following the stage in a float process where a glass sheet is formed and floated on a molten material (e.g., tin bath) and cooled or allowed to cool, e.g., via an annealing lehr, energy such as infrared (IR) energy is directed at the resulting glass and reflectance at various wavelengths is analyzed to detect inclusions.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] Exemplary embodiments of the present invention relate to methods and / or systems for detecting inclusions and / or other defects (e.g., micro-inclusions such as nickel sulfide based inclusions / defects, chromium based inclusions / defects, iron based inclusions / defects, metal Si based inclusions / defects, etc.) in soda-lime-silica based glass, such as float glass. In certain exemplary embodiments of the present invention, energy (e.g., infrared (IR) and / or visible) may be directed toward the glass from at least one light source, different wavelengths of energy reflected from the at least one light source are analyzed and compared, and inclusions can be detected based on detected spectral reflectance at the various wavelengths. The system may use broad spectral signals across a range of wavelengths, and the multispectral image based inclusion / defect detection system can identify and / or distinguish between different types of inclusions / defects by capturing, analyzing, and differentiating between their corresponding spectral reflectance curves. [Background technology]

[0002] The manufacturing process of float glass is known in the art. See, for example, U.S. Patent Nos. 3,954,432, 3,083,551, 3,220,816, 7,743,630, 8,677,782, 9,016,094 and 5,214,008, all of whose disclosures are incorporated herein by reference in their entirety. Generally speaking, in a float glass manufacturing line, batch materials are heated in a furnace or melter to form a glass melt. The glass melt is poured onto a bath of molten material, such as tin (tin bath), and then cooled continuously to form a float glass ribbon. The float glass ribbon is then delivered to an annealing lehr for further processing, and may then be cut to form a solid glass article, such as a flat glass sheet. In the case of float glass, the glass batch often contains soda, lime, and silica to form a soda-lime-silica based flat glass.

[0003] Float glass is widely used for windows in commercial and residential buildings, glass furniture, shower doors, and automobile windshields. For many products, float glass must be heat strengthened (heated to at least 580°C, followed by rapid cooling) to ensure safety in case of breakage. Impurities from raw materials, sulfur from additive(s), and / or contaminants from the float process sometimes and unpredictably form unwanted chemical compounds (e.g., inclusions) during glass formation, which are undesirable defects in the glass. For example, nickel naturally combines with sulfur to form nickel sulfide inclusions or inclusions based on nickel sulfide (of any suitable stoichiometry, such as NiS).

[0004] Although typically harmless in annealed glass (e.g., made via a float process without any additional heat treatment such as heat tempering), NiS inclusions are known to cause spontaneous breakage of heat strengthened glass. Furthermore, NiS inclusions / defects in heat strengthened glass have caused catastrophic glass breakage over time in installed products. Thus, rejecting defective annealed glass serves at least two purposes: a) increasing production yields during the costly heat tempering and soaking steps, and b) minimizing catastrophic glass breakage of glass in installed products.

[0005] Nickel sulfide exists in different phases at different temperatures. For example, two specific phases of known NiS are the alpha and beta phases. At temperatures below 715°F (379°C), nickel sulfide is relatively stable in the beta phase form. Above this temperature, nickel sulfide is stable in the alpha phase. Therefore, if the glass is produced in a furnace, any NiS inclusions will likely be in the alpha phase. In a typical annealed glass, the slow cooling process provided by an annealing lehr allows sufficient time for NiS to transform into its beta phase as the glass cools. However, the fast cooling process used in both heat strengthened and tempered glass often does not allow enough time (a relatively slow process) to complete the phase transformation. Thus, the NiS inclusions are trapped in the glass in its high temperature alpha phase. However, once the glass cools above the phase change temperature, the NiS inclusions attempt to re-enter the low energy beta phase. For trapped inclusions, this process can take anywhere from months to years. This may have no effect on the glass, except that when NiS changes from the α to β phase, it increases in volume, such as by 2-4%. This expansion may also create localized tensile stresses that may lead to glass breakage.

[0006] Similarly, nickel sulfide is a compound that is available in a variety of forms. The most common forms of nickel sulfide are Ni7S6, NiS, and NiS 1.03 , Ni3S2, and Ni3S2+Ni. When viewed under an electron microscope, Ni7S6, NiS, and NiS 1.03 are yellow gold in color and have a textured surface similar to that of a golf ball. These three types are non-magnetic and have been found to cause breakage in tempered glass. Other types of inclusions (defects) also occur in glass.

[0007] Various methods have been used for in-line detection of NiS inclusions and other microscopic defects of similar size scales (e.g., 40-150 micrometer sized defects). U.S. Patent No. 7,511,807, incorporated herein by reference, for example, discusses light scattering by directing light into the glass to detect inclusions. Thus, conventional techniques for detecting inclusions have been inefficient and sometimes ineffective.

[0008] Conventional glass defect inspection solutions use 2D or 3D machine vision technology in the visible wavelength range. Conventional machine vision systems detect and classify inclusion defects by image shape and intensity. Inclusions such as NiS, metallic Si, and even air bubbles may appear as the same type of defect due to their similar shapes and intensities. Conventional machine vision systems are not designed or capable of accurately detecting NiS inclusions and cannot reasonably distinguish NiS inclusions from other types of inclusions.

[0009] In view of the above, it should be apparent that a need exists in the art for improved glass manufacturing and glass quality control methods, including improved methods and / or apparatus for detecting inclusions in soda-lime-silica based glass and / or other types of glass. Summary of the Invention

[0010] Methods and / or systems are provided for detecting inclusions (e.g., nickel sulfide based inclusions / defects) in glass, such as soda-lime-silica based glass. The in-line systems and / or methods discussed herein can be used to detect inclusions / defects in glass, such as, for example, float glass. For example, the methods and / or systems can be used to detect nickel sulfide inclusions and / or other micro defects having a size of about 30-300 μm, more preferably about 40-200 μm, and / or to distinguish such nickel sulfide based inclusions from both inclusion-free glass and other inclusions.

[0011] In certain exemplary embodiments, the soda-lime-silica based glass includes a base glass portion including, in weight percent, 67-75% SiO2, 10-20% Na2O, 5-15% CaO, 0-7% Al2O3, 0-7% MgO, and 0-7% KO. Optionally, the colorant portion of the glass may further include one or more colorants, such as iron, selenium, cobalt, erbium, and the like.

[0012] Exemplary embodiments of the present invention relate to methods and / or systems for detecting inclusions and / or other defects (e.g., micro-inclusions such as nickel sulfide based inclusions / defects, chromium based inclusions / defects, iron based inclusions / defects, metal Si based inclusions / defects, etc.) in soda-lime-silica based glass, such as float glass. In certain exemplary embodiments of the present invention, energy (e.g., infrared (IR) and / or visible) may be directed toward the glass from at least one light source, different wavelengths of energy reflected from the at least one light source are analyzed and compared, and inclusions can be detected based on the detected spectral reflectance at the different wavelengths. The system can use broad spectral signals across a range of wavelengths (e.g., 500-2,500 nm, or 800-2,000 nm, or 900-1,700 nm, or 950-1,250 nm, or specific wavelengths within any of these ranges), and the multispectral image based inclusion / defect detection system can identify and / or distinguish between different types of inclusions / defects by capturing, analyzing, and differentiating between their corresponding spectral reflectance curves. For example, nickel sulfide inclusions / defects affect a given wavelength range (e.g., 950-1250 nm, and / or specific wavelengths within that range) differently than inclusion-free glass and differently than other types of inclusions, such as chromium-based inclusions / defects and iron-based inclusions / defects. Thus, for example, nickel sulfide based inclusions can be detected and identified based at least on an analysis of the reflectance at different wavelengths due to such nickel sulfide based inclusions, and float glass itself that is free of inclusions and other types of inclusions / defects can be distinguished from nickel sulfide based inclusions as they have different effects on reflectance at those wavelengths.

[0013] This detection system may be implemented during and / or after the glass manufacturing process, such as after the stage of the float process where the glass sheet is formed and floated on a molten material (e.g., a tin bath) and cooled, or at least partially cooled, such as after an annealing lehr. Energy from at least one light source may be directed at the resulting glass, and inclusions can be detected based on analyzing and / or comparing reflected energy as a function of wavelength (λ).

[0014] In an exemplary embodiment of the invention, a method of detecting inclusions in glass is provided, the glass comprising a base glass composition including, by weight, 67-75% SiO2, 5-15% CaO, 0-7% Al2O3, and 0-7% KO, the method including directing energy from at least one light source toward the glass and determining the presence or absence of inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths. The at least one light source may emit energy including infrared (IR) energy toward the glass, and determining the presence or absence of inclusions in the glass may be based at least on an analysis of reflectance values ​​from the glass at different IR wavelengths.

[0015] In an exemplary embodiment of the present invention, a method of detecting inclusions in glass is provided, the method including directing energy from at least one light source toward the glass and determining the presence or absence of inclusions in the glass based on at least an analysis of reflectance and / or brightness values ​​from the glass at various wavelengths. The at least one light source may emit energy including infrared (IR) energy toward the glass, and determining the presence or absence of inclusions in the glass may be based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths. Determining the presence or absence of inclusions in the glass may be based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths within a range of 800-2,000 nm and / or within a range of 900-1,700 nm. The light source may be optionally positioned at least below the glass, and an imaging camera receiving IR from the glass may be positioned above the glass such that the glass may be positioned between the light source and the camera. [Brief description of the drawings]

[0016] [Figure 1] FIG. 1 is a diagram of a system for detecting inclusions in float glass, according to an exemplary embodiment of the present invention. [Diagram 2] 1 is a graph of reflectance versus wavelength (nm) showing that glass with no inclusions and glass with different inclusions, such as nickel sulfide-based inclusions, chromium-based inclusions, iron-based inclusions, and silicon metal-based inclusions, have different spectral reflectance characteristics as a function of wavelength over a range of wavelengths. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0017] Methods and / or systems are provided for detecting inclusions in glasses, such as soda-lime-silica-based glass 1. For example, the methods and / or systems can be used to detect nickel sulfide inclusions and / or other micro defects having a size of about 30-300 μm, more preferably about 40-200 μm, and / or to distinguish such nickel sulfide-based inclusions from both inclusion-free glass and other types of inclusions of the same or different size. In certain exemplary embodiments, soda-lime-silica-based glass 1 includes a base glass portion including, in weight percent, 67-75% SiO2, 10-20% Na2O, 5-15% CaO, 0-7% Al2O3, 0-7% MgO, and 0-7% K2O. Optionally, the colorant portion of the glass may further include one or more colorants, such as iron, selenium, cobalt, erbium, etc. Alternatively, glass 1 may be a different type of glass, such as a borosilicate glass, an aluminosilicate glass, etc.

[0018] An example soda-lime-silica based glass 1 according to a specific example embodiment of the present invention, which may be made via a float process or other suitable process on a weight percentage basis, includes the following base components: Table 1: Exemplary base glasses [Table 1]

[0019] Other trace ingredients may also be included in the base glass, including various refining agents such as Glauber's salt and water of crystallization. In certain embodiments, for example, glass 1 described herein may be made from batch raw materials silica sand, soda ash, dolomite, limestone, with Glauber's salt (SO3) as a refining agent. Reducing and oxidizing agent(s) may also be used in certain cases. In certain cases, soda-lime-silica-based glass 1 described herein may include about 10-15 wt. % Na2O and about 6-12 wt. % CaO. In addition to the base glass materials described above, the glass batch and / or final glass 1 may also include a colorant portion including a suitable amount of material(s) such as iron, erbium, cobalt, selenium, etc., to provide coloring and / or absorption to the glass in a desired manner. In certain exemplary embodiments of the present invention, the total amount of iron in the glass may be about 0.05-1.2%, more preferably about 0.3-0.8%. For certain clear, highly transparent glasses, the total iron may be about 0.005-0.025%. The total amount of iron present in the glass, and therefore in the colorant portion thereof, is expressed herein in terms of Fe2O3, in accordance with standard practice. However, this does not imply that all of the iron is actually in the form of Fe2O3. Similarly, the amount of iron in the ferrous state is reported herein as FeO, even though not all of the ferrous state iron in the glass may be in the form of FeO.

[0020] When making glass via the float process, for example, glass batch raw materials (e.g., silica sand, soda ash, dolomite, limestone, colorant(s), etc.) are fed into a furnace or melter and heated in the furnace or melter to form a glass melt. The glass melt is poured onto a bath of molten material, such as tin (tin bath), where the glass is formed and is continuously cooled to form a float glass ribbon. The float glass ribbon advances to an annealing lehr for slow cooling. Optionally, the lateral edge(s) of the glass sheet may be trimmed in the hot state prior to entering the annealing lehr. The glass sheet typically arrives at the beginning of the annealing lehr at a temperature of at least about 540°C, more preferably at least about 580°C, with a possible range of about 540 (or 580) to 800°C. During annealing, the temperature of the glass sheet strip is slowly cooled from the annealing point (e.g., about 538-560°C) to a strain point of about 495-560°C, sometimes referred to as the annealing range. These temperature ranges are preferred for annealing, but different temperatures may be used in certain cases. The continuous glass sheet may be supported by either rollers or gas during annealing. After annealing, the continuous glass sheet is moved for further processing, such as one or more of cutting, additional cooling, coating, etc.

[0021] As explained above, impurities from raw materials, sulfur from the additive(s), and / or contaminants from the float process can sometimes and unpredictably form unwanted chemical compounds (e.g., inclusions) during glass formation that are undesirable defects in the glass. For example, nickel naturally combines with sulfur to form nickel sulfide inclusions or nickel sulfide-based inclusions (of any suitable stoichiometry, such as NiS).

[0022] In reflectance spectroscopy, the fundamental characteristics involved herein are spectral reflectance and brightness (or simply referred to as "spectral reflectance"). Spectral reflectance and brightness (or "spectral reflectance") are the ratio of reflected energy to incident energy as a function of wavelength. Spectral reflectance varies with wavelength for different types of materials. The wavelength-specific reflectance of a material may be due, for example, to the spectral absorption of certain chemical elements or ions, the ionic charges of certain elements, and / or the arrangement of chemical bonds between elements. For example, soda-lime-silica-based glass with no inclusions, nickel sulfide-based inclusions, chromium-based inclusions, iron-based inclusions, and metal Si-based inclusions each have different respective spectral reflectance curves such as those shown in FIG. 2 over a particular wavelength range. As another example provided for understanding purposes, kaolinite and montmorillonite are clay minerals commonly found in soils, and the strong absorption band around 1.4 μm in both spectra is due to hydroxide ions (OH-1) along with a weaker 1.9 μm band in kaolinite, and the stronger 1.9 μm band in montmorillonite is due to bound water molecules in this hydrous clay.

[0023] In an exemplary embodiment of the present invention, the spectral curves stored in memory 60 for different types of materials and / or absorption bands (location and intensity) are used by processor 50 to detect and distinguish between different materials (e.g., nickel sulfide-based inclusions, chromium-based inclusions, etc.), thereby enabling detection and identification of inclusions in glass 1, such as soda-lime-silica-based glass. In certain exemplary embodiments of the present invention, multispectral imaging techniques can use a wide range of spectral signals (e.g., from visible to IR, or only in the IR), and the multispectral imaging based defect detection system identifies different types of inclusion defects in glass 1 by capturing the difference (or value, or value difference) of the spectral reflectance curves and analyzing the difference against stored curves (or values), for example, for different materials. In certain exemplary embodiments, multispectral imaging techniques with augmented artificial intelligence (AI) can be used against stored curves of different types of materials (e.g., different types of inclusions) that are learned over time.

[0024] FIG. 1 illustrates an exemplary system for detecting inclusions / defects in glass, such as soda-lime-silica based glass 1 moving in direction D on roller 3. Energy from at least one energy / light source LS1 and / or LS2 (e.g., shortwave IR, IR, visible, and / or any combination thereof) is directed at glass 1. Light from light sources LS1 and / or LS2 may or may not be focused at glass 1, such as focused at the top and / or bottom surface of the glass. In certain exemplary embodiments, only energy / light sources above glass 1 may be used, such as that shown by LS1 in FIG. 1. However, in certain exemplary embodiments (e.g., those that yielded the spectral curves of FIG. 2), only energy / light sources below glass 1 may be used, such as that shown by LS2 in FIG. 1. The glass and any inclusions therein reflect this energy (from LS1 and / or LS2) as a function of wavelength toward bandpass filter 40, as illustrated in FIG. 1. As described herein, each material has different reflective properties. For example, the multispectral image may capture reflectance from the glass 1 across three to seven spectral bands through a bandpass filter 40. Inclusions in the glass may then be detected by the processor 50 by comparing the received reflectance spectrum from the glass 1 to pre-determined spectral curves and / or values ​​for various materials (e.g., types of glass with and without inclusions as discussed herein) in the memory 60. In certain exemplary embodiments, the multispectral imaging system includes a selected bandpass filter 40 to enable the processor to find / identify / determine the spectral reflectance ("fingerprint") of NiS or any other inclusion across a suitable wavelength range, e.g., 900-1700 nm. NiS inclusions have been found to have a distinctly different spectral reflectance curve compared to other metal inclusions, and are shown in FIG. 2.Other metal inclusions (such as Si-Ball) and NiS inclusions have been found to have similar intensities in the visible range, but very different reflectance values ​​in the near-IR (NIR) range, which is why the range including 900-1700 nm has been found to be particularly advantageous in an exemplary embodiment of the present invention. For example, in an exemplary embodiment of the present invention, the processor 50 can identify the different respective spectral reflectances of NiS and other metal inclusions by an extended measurement technique using a cooled SWIR InGaAs area scan camera (e.g., a 40 kHz InGaAs scan camera), an IR illumination source (e.g., LS1 and / or LS2), and a specific OD4 filter (which may or may not be integral to the camera) from 950 nm to 1250 nm with a 50 nm bandpass step. Such a camera, including an imaging device for receiving IR from the glass, may or may not include elements 40-70 shown in FIG. 1. Results such as the identification and location of the detected inclusions may be stored in memory 60 and / or displayed on a display 70 for viewing by an operator.

[0025] FIG. 2 shows the spectral reflectance characteristics in the wavelength range of 950-1250 nm for glasses with nickel sulfide-based inclusions, chromium-based inclusions, iron-based inclusions, silicon-based inclusions, and no inclusions. To obtain the spectral curves of the various inclusions and glasses in FIG. 2, an IR light source was placed under the glass as shown by LS2 in FIG. 1. For example, FIG. 2 shows that at 1000 nm, silicon-based inclusions have a reflectance of about 0.18, chromium-based inclusions have a reflectance of about 0.29, iron-based inclusions have a reflectance of about 0.33, nickel sulfide-based inclusions have a reflectance of about 0.42, and the glass without inclusions has a reflectance of nearly 1.0. As another example, Figure 2 shows that at 1050 nm, silicon-based inclusions have a reflectance of about 0.08, chromium-based inclusions have a reflectance of about 0.46, iron-based inclusions have a reflectance of about 0.32, nickel sulfide-based inclusions have a reflectance of about 0.38, and the inclusion-free glass has a reflectance of approximately 1.0. As another example, Figure 2 shows that at 1150 nm, silicon-based inclusions have a reflectance of about 0.58, chromium-based inclusions have a reflectance of about 0.06, iron-based inclusions have a reflectance of about 0.30, nickel sulfide-based inclusions have a reflectance of about 0.38, and the inclusion-free glass has a reflectance of about 1.0. As another example, Figure 2 shows that at 1200 nm, silicon-based inclusions have a reflectance of about 0.58, chromium-based inclusions have a reflectance of about 0.68, iron-based inclusions have a reflectance of about 0.32, nickel sulfide-based inclusions have a reflectance of about 0.58, and the inclusion-free glass has a reflectance of about 1.0. The respective spectral reflectance curves shown in Figure 2 for the various types of materials in the glass can be obtained by sampling at any suitable rate, such as, for example, but not limited to, every 50 nm and / or an integration time of 200 ms. To detect and identify inclusions, such as nickel sulfide inclusions, processor 50 compares the reflectance data received from glass 1 with such data stored in memory 60, and such curves and / or values ​​can be stored in memory 60 so that different types of inclusions can be distinguished from one another.For example, it can be seen from FIG. 2 that processor 50 can detect each of silicon-based inclusions, chromium-based inclusions, iron-based inclusions, and nickel sulfide-based inclusions in glass 1 and can distinguish between the different types of inclusions based on the stored and received spectral reflectance data.

[0026] Thus, exemplary embodiments of the present invention include methods and / or systems for detecting inclusions and / or other defects (e.g., micro-inclusions such as nickel sulfide based inclusions / defects, chromium based inclusions / defects, iron based inclusions / defects, metal Si based inclusions / defects, etc.) in soda-lime-silica based glass, such as float glass. In certain exemplary embodiments of the present invention, energy (e.g., infrared (IR) and / or visible) may be directed toward the glass from at least one light source, different wavelengths of energy (e.g., refracted and / or scattered light) reflected from the at least one light source are analyzed and compared, and inclusions can be detected based on the detected reflectance at the different wavelengths. The system can use broad spectral signals across a range of wavelengths (e.g., 500-2,500 nm, or 800-2,000 nm, or 900-1,700 nm, or 950-1,250 nm, or specific wavelengths within any of these ranges), and the multispectral image based inclusion / defect detection system can identify and / or distinguish between different types of inclusions / defects by capturing, analyzing, and differentiating between their corresponding spectral reflectance curves. For example, nickel sulfide inclusions / defects affect a given wavelength range (e.g., 950-1250 nm, and / or specific wavelengths within that range) differently than inclusion-free glass and differently than other types of inclusions, such as chromium-based inclusions / defects and iron-based inclusions / defects. Thus, for example, nickel sulfide based inclusions can be detected and identified based at least on an analysis of the reflectance at different wavelengths due to such nickel sulfide based inclusions, and float glass itself that is free of inclusions and other types of inclusions / defects can be distinguished from nickel sulfide based inclusions as they have different effects on reflectance at those wavelengths.

[0027] In an exemplary embodiment of the invention, the system shown in FIG. 1 may be provided during and / or after the stage of the float process where the glass sheet is formed and floated on a molten material (e.g., a tin bath) and cooled or at least partially cooled, such as after the annealing lehr. The system shown in FIG. 1 for detecting inclusions, such as (any stoichiometric) nickel sulfide-based inclusions in the glass 1, may be placed on the float line after the annealing lehr, and before or after the glass cutting station, in certain exemplary embodiments of the invention. If inclusion(s) are found in the glass, that portion of the glass is discarded and / or does not undergo thermal tempering. Alternatively, the inclusion detection system shown in FIG. 1 may instead be placed separate from the float line, such as a station between the float line and the tempering furnace, or a station immediately prior to the tempering furnace in the tempering facility, to detect inclusions and discard the glass with the inclusions prior to thermal tempering. Such inclusion detection processes may also be utilized during or after the manufacture of other types of glasses, such as borosilicate glasses, aluminosilicate glasses, etc. (as opposed to during or immediately after the float process to produce soda-lime-silica based glasses).

[0028] Glasses made in this manner, after passing through a detection station with no detected inclusions, are useful in, for example, but not limited to, architectural and / or vehicle glazing applications, solar cell applications, furniture glazing applications, and / or display glazing applications.

[0029] In an exemplary embodiment of the invention, a method of detecting inclusions in glass is provided, the glass comprising a base glass composition including, by weight, 67-75% SiO2, 5-15% CaO, 0-7% Al2O3, and 0-7% KO, the method comprising directing energy from at least one light source towards the glass and determining the presence or absence of inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths.

[0030] In the method of the immediately preceding paragraph, at least one light source may emit energy including infrared (IR) energy toward the glass, and determining the presence or absence of inclusions in such glass may be based on at least an analysis of reflectance values ​​from the glass at different IR wavelengths.

[0031] In the method of either of the preceding two paragraphs, determining the presence or absence of inclusions in such glass may be based on at least an analysis of reflectance values ​​from the glass at different IR wavelengths within the range of 800 to 2,000 nm, optionally within the range of 900 to 1,700 nm, and optionally within the range of 950 to 1,250 nm.

[0032] In the method of any of the previous three paragraphs, at least one bandpass filter may be provided between the glass and a camera for receiving reflected energy from the glass.

[0033] In the method of any of the preceding four paragraphs, the inclusion may be or include nickel sulfide.

[0034] The method of any of the preceding five paragraphs may further include identifying and distinguishing between different inclusions of different materials in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths.

[0035] The method of any of the preceding six paragraphs may further include identifying and distinguishing between nickel sulfide-based inclusions and Cr-based inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths.

[0036] The method of any of the preceding seven paragraphs may further include identifying and distinguishing between nickel sulfide-based inclusions and iron-based inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths.

[0037] The method of any of the preceding eight paragraphs may further include passing or failing the glass based at least on whether inclusions are detected.

[0038] In the method of any of the preceding nine paragraphs, the light source may be located on and / or within the float line, or after the annealing lehr of the float line.

[0039] In an exemplary embodiment of the present invention, a method of detecting inclusions in glass is provided, the method including directing energy from at least one light source toward the glass and determining the presence or absence of inclusions in the glass based at least on an analysis of reflectance and / or brightness values ​​from the glass at various wavelengths.

[0040] In the method of the immediately preceding paragraph, at least one light source may emit energy including infrared (IR) energy toward the glass, and determining the presence or absence of inclusions in such glass may be based on at least an analysis of reflectance and / or luminance values ​​from the glass at various IR wavelengths.

[0041] In the method of either of the preceding two paragraphs, determining the presence or absence of inclusions in such glass may be based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths in the range of 800 to 2,000 nm.

[0042] In the method of any of the preceding three paragraphs, determining the presence or absence of inclusions in such glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths within the range of 900 to 1,700 nm.

[0043] In the method of any of the previous four paragraphs, the light source may be positioned at least below the glass, and the camera receiving IR from the glass may be positioned above the glass such that the glass may be positioned between the light source and the camera.

[0044] Many other features, modifications, and improvements will become apparent to those skilled in the art in view of the above disclosure, and such features, modifications, and improvements are therefore considered to be a part of this invention, the scope of which should be determined by the following claims.

[0045] 1. A method for detecting inclusions in glass, said glass comprising a base glass composition comprising: [Table 2] The method further comprising: directing energy from at least one light source toward the glass; and determining the presence or absence of inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths. 2. The method of claim 1, wherein the at least one light source emits energy including infrared (IR) energy toward the glass, and the determining the presence or absence of inclusions in the glass is based on at least an analysis of reflectance values ​​from the glass at different IR wavelengths. 3. The method of claim 1 or 2, wherein said determining the presence or absence of inclusions in said glass is based on at least an analysis of reflectance values ​​from said glass at different IR wavelengths in the range of 800 to 2,000 nm. 4. The method of any of 1 to 3, wherein said determining the presence or absence of inclusions in said glass is based on at least an analysis of reflectance values ​​from said glass at different IR wavelengths in the range of 900 to 1,700 nm. 5. The method of any of 1 to 4, wherein said determining the presence or absence of inclusions in said glass is based on at least an analysis of reflectance values ​​from said glass at different IR wavelengths in the range of 950 to 1,250 nm. 6. The method of any one of 1 to 5, wherein at least one bandpass filter is provided between the glass and a camera for receiving reflected energy from the glass. 7. The method according to any one of 1 to 6, wherein the inclusions include nickel sulfide. 8. The method of any of 1-7, further comprising identifying and distinguishing between different inclusions of different materials in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths. 9. The method of any of 1-8, further comprising identifying and distinguishing between nickel sulfide-based inclusions and Cr-based inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths. 10. The method of any of 1-9, further comprising identifying and distinguishing between nickel sulfide-based inclusions and iron-based inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different wavelengths. 11. The method of any one of 1 to 10, further comprising determining whether the glass is pass or fail based on at least whether inclusions are detected. 12. The method of any one of 1 to 11, wherein the light source is located on and / or within the float line and disposed after the annealing kiln of the float line. 13. A method for detecting inclusions in glass, said method comprising: directing energy from at least one light source toward the glass; and determining the presence or absence of inclusions in the glass based at least on an analysis of reflectance values ​​from the glass at different infrared (IR) wavelengths. 14. The method of claim 13, wherein said determining the presence or absence of inclusions in said glass is based on at least an analysis of reflectance values ​​from said glass at different IR wavelengths in the range of 800 to 2,000 nm. 15. The method of any of 13-14, further comprising identifying and distinguishing between different inclusions of different materials in the glass based at least on an analysis of reflectance values ​​from the glass at different IR wavelengths. 16. A system for detecting inclusions in glass, said glass comprising a base glass composition comprising: [Table 3] The system further comprises: at least one light source for directing energy towards the glass; and a processor configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance values ​​and / or radiance values ​​from the glass at different wavelengths. 17. The system of claim 16, wherein the at least one light source is configured to emit energy including infrared (IR) energy toward the glass, and the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance values ​​and / or luminance values ​​from the glass at different IR wavelengths. 18. The system of any of 16 to 17, wherein the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance values ​​and / or radiance values ​​from the glass at different IR wavelengths within a range of 800 to 2,000 nm. 19. The system of any of 16 to 18, wherein the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance values ​​and / or radiance values ​​from the glass at different IR wavelengths within a range of 900 to 1,700 nm. 20. A system as described in any of 16 to 19, wherein at least one bandpass filter is provided between the glass and a camera for receiving reflected energy from the glass. 21. The system described in any one of 16 to 20, wherein the inclusions include nickel sulfide. 22. The system of any of 16-21, wherein the processor is further configured to identify and distinguish different inclusions of different materials in the glass based on at least an analysis of spectral reflectance values ​​and / or luminance values ​​from the glass at different wavelengths. 23. A method for detecting inclusions in glass, said method comprising: directing energy from at least one light source toward the glass; and determining the presence or absence of inclusions in the glass based on at least an analysis of reflectance and / or brightness values ​​from the glass at various wavelengths. 24. The method of claim 23, wherein the at least one light source emits energy including infrared (IR) energy toward the glass, and the determining the presence or absence of inclusions in the glass is based on at least an analysis of reflectance and / or luminance values ​​from the glass at different IR wavelengths. 25. The method of any of claims 23 to 24, wherein the determining the presence or absence of inclusions in the glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths in the range of 800 to 2,000 nm. 26. The method of any of claims 23 to 25, wherein the determining the presence or absence of inclusions in the glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths in the range of 900 to 1,700 nm. 27. A method according to any one of claims 23 to 26, wherein the light source is positioned below the glass and a camera that receives IR from the glass is positioned above the glass such that the glass is positioned between the light source and the camera.

Claims

1. 1. A system for detecting inclusions in glass, the glass being a soda-lime-silica glass, The system further comprises: at least one light source for directing energy towards the glass; and a processor configured to identify and distinguish different inclusions in the glass based on at least an analysis of spectral reflectance and / or radiance values ​​from the glass at different wavelengths by capturing and analyzing corresponding spectral reflectance curves; The system, wherein the different inclusions include nickel sulfide-based inclusions and other types of inclusions.

2. 10. The system of claim 1, wherein the at least one light source is configured to emit energy including infrared (IR) energy toward the glass, and the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance and / or luminance values ​​from the glass at different IR wavelengths.

3. 3. The system of claim 1, wherein the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance and / or luminance values ​​from the glass at different IR wavelengths in the range of 800 to 2,000 nm.

4. 4. The system of claim 1, wherein the processor is configured to determine the presence or absence of inclusions in the glass based on at least an analysis of spectral reflectance and / or luminance values ​​from the glass at different IR wavelengths in the range of 900 to 1,700 nm.

5. A system according to any one of claims 1 to 4, wherein at least one band pass filter is provided between the glass and a camera for receiving reflected energy from the glass.

6. 6. The system of claim 1, wherein the processor is further configured to identify and distinguish between different inclusions of different materials in the glass based on at least an analysis of spectral reflectance and / or radiance values ​​from the glass at different wavelengths.

7. 1. A method for detecting inclusions in glass, the method comprising: directing energy from at least one light source towards the glass, the glass being a soda-lime-silica based glass; and identifying and distinguishing between different inclusions in the glass based on at least an analysis of reflectance and / or luminance values ​​from the glass at different wavelengths by capturing and analyzing corresponding spectral reflectance curves; The method, wherein the different inclusions include nickel sulfide-based inclusions and other types of inclusions.

8. 8. The method of claim 7, wherein the at least one light source emits energy including infrared (IR) energy toward the glass, and identifying and distinguishing different inclusions in the glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at different IR wavelengths.

9. 9. The method according to any one of claims 7 to 8, wherein identifying and distinguishing between different inclusions in the glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths in the range of 800 to 2,000 nm.

10. 10. The method of any one of claims 7 to 9, wherein identifying and distinguishing between different inclusions in the glass is based on at least an analysis of reflectance and / or brightness values ​​from the glass at various IR wavelengths in the range of 900 to 1,700 nm.

11. 11. The method according to any one of claims 7 to 10, wherein the light source is positioned below the glass and a camera receiving IR from the glass is positioned above the glass such that the glass is positioned between the light source and the camera.

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