Test support device, test support method, and test support program

Abstract

The purpose of the present disclosure is to provide a test assistance device that makes it possible to reduce test design man-hours and test execution man-hours in software development. A test assistance device according to the present disclosure comprises: an impact degree-containing change impacted portion creation unit that creates impact degree-containing change impacted portion information indicating a relationship between a design element and a design element impact degree; a test viewpoint matrix creation unit that creates a test viewpoint matrix indicating a correspondence relationship between the design element and a test viewpoint; an impact degree-containing test viewpoint matrix creation unit that creates an impact degree-containing test viewpoint matrix indicating a relationship between a design element-test viewpoint pair and a design element-test viewpoint pair impact degree; a test case priority degree creation unit that calculates a test case priority degree that is the priority degree of a test case; and a display control unit that performs control to display the impact degree-containing test viewpoint matrix and / or the test case priority degree.

Description

[Technical field]

[0001] The present disclosure relates to a test support device, a test support method, and a test support program for supporting testing in software development. [Background technology]

[0002] In recent years, the number of test cases has increased as software has become larger, and it is difficult for developers to perform regression testing of all test cases when software is repeatedly modified. It is also difficult for developers to manually extract test cases that need to be modified due to changes in specifications.

[0003] In order to make it easier to identify the purpose and viewpoint from which a test case was designed, a method has been proposed to classify test cases by a concept called "test viewpoint." There is also a technology that utilizes a "test viewpoint matrix," a matrix table showing software functions on the vertical axis and test viewpoints on the horizontal axis, during test design.

[0004] Conventionally, there have been proposed techniques for narrowing down test cases to be executed or test cases to be modified based on difference information when software specifications are changed (see, for example, Patent Documents 1, 2 and 3). [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Patent No. 6865942 [Patent Document 2] JP 2020-154563 A [Patent Document 3] JP 2016-212633 A Summary of the Invention [Problem to be solved by the invention]

[0006] In the conventional technology, test cases directly associated with the specification to be changed are extracted, and therefore test cases associated with specifications indirectly affected by the specification to be changed cannot be extracted. An example of an indirectly affected specification is a specification related to another function whose behavior may change as a result of the timing of software execution being changed by changing a specification.

[0007] In addition, when using a technique for extracting test cases using a keyword search based on the changes, there is a possibility that a large number of test cases with low relevance will be extracted, or that necessary test cases will not be extracted due to variations in notation.

[0008] Furthermore, in the conventional technology, extraction or prioritization is performed on a test case basis, making it difficult for a developer to visually check the validity of a large number of extracted test cases.

[0009] The present disclosure has been made to solve such problems, and aims to provide a test support device, a test support method, and a test support program that can reduce the test design labor and test implementation labor in software development. [Means for solving the problem]

[0010] In order to solve the above problems, a test support device according to the present disclosure is a test support device that supports testing performed when changing software specifications, and includes a change-affected location creation unit that calculates a design element influence indicating the influence of a change specification included in the change specification information on a design element based on specification information, source code, traceability information, and change specification information, and creates change-affected location information with influence indicating the relationship between the design element and the design element influence, a test viewpoint matrix creation unit that extracts whether or not there is a correspondence between the design element and the test viewpoint based on the specification information, the change specification information, and a test viewpoint database, and creates a test viewpoint matrix indicating the correspondence relationship between the design element and the test viewpoint, and a change-affected location information with influence created by the change-affected location creation unit and a test viewpoint matrix created by the test viewpoint matrix creation unit. The present invention is provided with an influence-attached test viewpoint matrix creation unit that calculates a design element test viewpoint pair influence indicating the influence of the change specification on a design element test viewpoint pair, which is a pair of a design element and a test viewpoint, based on the risk of the change specification, and creates a test viewpoint matrix with influence indicating the relationship between the design element test viewpoint pair and the design element test viewpoint pair influence; a test case priority creation unit that calculates a test case priority, which is the priority of a test case, based on test information indicating the correspondence between the design element test viewpoint pair and the test viewpoint matrix with influence created by the influence-attached test viewpoint matrix creation unit; and a display control unit that controls the display of at least one of the test viewpoint matrix with influence created by the influence-attached test viewpoint matrix creation unit and the test case priority calculated by the test case priority creation unit. Effect of the Invention

[0011] According to the present disclosure, it is possible to reduce the man-hours for test design and test implementation in software development.

[0012] The objects, features, aspects, and advantages of the present disclosure will become more apparent from the following detailed description and the accompanying drawings. [Brief description of the drawings]

[0013] [Figure 1] 1 is a block diagram showing an example of a configuration of a test support device according to a first embodiment. [Diagram 2] 3 is a diagram for explaining the operation of the test support device according to the first embodiment. FIG. [Diagram 3] FIG. 4 is a diagram showing an example of specification information according to the first embodiment. [Figure 4] FIG. 2 is a diagram showing an example of traceability information according to the first embodiment. [Diagram 5] FIG. 4 is a diagram showing an example of changed specification information according to the first embodiment. [Figure 6] FIG. 11 is a diagram showing an example of change affected part information with impact degree according to the first embodiment. [Figure 7] FIG. 4 is a diagram showing an example of a test viewpoint database according to the first embodiment. [Figure 8] FIG. 2 is a diagram showing an example of a test viewpoint matrix according to the first embodiment. [Figure 9] FIG. 13 is a diagram showing an example of a test viewpoint matrix with influence degrees according to the first embodiment. [Figure 10] FIG. 4 is a diagram showing an example of test information according to the first embodiment. [Figure 11] FIG. 11 is a diagram showing an example of test case priority information according to the first embodiment. [Figure 12] 1 is a diagram illustrating an example of a configuration of a test support device according to a first embodiment. [Figure 13] FIG. 11 is a block diagram showing an example of the configuration of a test support device according to a second embodiment. [Figure 14] FIG. 11 is a diagram for explaining the operation of the test support device according to the second embodiment. [Figure 15] FIG. 13 is a diagram showing an example of an adjusted influence-added test viewpoint matrix according to the second embodiment. [Figure 16] FIG. 11 is a block diagram showing an example of the configuration of a test support device according to a third embodiment. [Figure 17] FIG. 11 is a diagram for explaining the operation of the test support device according to the third embodiment. [Figure 18]FIG. 13 is a diagram showing an example of a consistency determination result according to the third embodiment. [Figure 19] FIG. 13 is a diagram showing an example of revised specification test information according to the third embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0014] <Embodiment 1> <Configuration> FIG. 1 is a block diagram showing an example of the configuration of a test support device 10 according to the first embodiment.

[0015] The test support device 10 is realized by a computer. The test support device 10 includes each piece of hardware: a processor 11, a memory 12, a storage 13, and a communication interface 14. The processor 11 is connected to other hardware via signal lines and controls the connected hardware.

[0016] The processor 11 is an integrated circuit (IC) that performs processing. Specific examples of the processor 11 include a central processing unit (CPU), a digital signal processor (DSP), and a graphics processing unit (GPU).

[0017] The memory 12 is a storage device that temporarily stores data. Specific examples of the memory 12 include a static random access memory (SRAM) and a dynamic random access memory (DRAM).

[0018] The storage 13 is a storage device that stores data. A specific example of the storage 13 is a hard disk drive (HDD). The storage 13 may be a portable storage medium such as a secure digital (SD, registered trademark) memory card, a compact flash (CF, registered trademark), a NAND flash, a flexible disk, an optical disk, a compact disk, a Blu-ray (registered trademark) disk, or a digital versatile disk (DVD).

[0019] The communication interface 14 is an interface for communicating with an external device. Specific examples of the communication interface 14 include ports such as Ethernet (registered trademark), USB (Universal Serial Bus), and HDMI (High-Definition Multimedia Interface, registered trademark).

[0020] The test support device 10 includes, as functional components, a change-affected-section with influence creating section 21, a test perspective matrix creating section 22, a test perspective matrix creating section 23, a test case priority creating section 24, and a display control section 25. Each function of the change-affected-section with influence creating section 21, the test perspective matrix creating section 22, the test perspective matrix creating section 23, the test case priority creating section 24, and the display control section 25 is realized by software.

[0021] The storage 13 stores programs for implementing the functions of a change-affected-location-with-influence creation unit 21, a test perspective matrix creation unit 22, a test perspective matrix creation unit 23, a test case priority creation unit 24, and a display control unit 25. These programs are loaded into the memory 12 by the processor 11 and executed by the processor 11. In this way, the functions of the change-affected-location-with-influence creation unit 21, the test perspective matrix creation unit 22, the test perspective matrix creation unit 23, the test case priority creation unit 24, and the display control unit 25 are implemented.

[0022] 1 shows a case where the test support device 10 includes one processor 11. However, the test support device 10 may include multiple processors that replace the processor 11. These multiple processors share the execution of programs that realize the functions of the change-affected-section with impact level creation unit 21, the test viewpoint matrix creation unit 22, the test viewpoint matrix with impact level creation unit 23, the test case priority level creation unit 24, and the display control unit 25. Each processor is an IC that performs processing, similar to the processor 11.

[0023] <Operation> The operation of the test support device 10 according to the first embodiment will be described with reference to FIG.

[0024] The operation of the test support device 10 according to the embodiment 1 corresponds to the test support method according to the embodiment 1. Moreover, the operation of the test support device 10 according to the embodiment 1 corresponds to the processing of the test support program according to the embodiment 1.

[0025] <Processing of the change affected part with impact degree creation unit 21> The change affected part with impact degree creation unit 21 accepts input of specification information 31, source code 32, traceability information 33, and change specification information 34 via the communication interface 14, and writes them into the memory 12. Then, the change affected part with impact degree creation unit 21 processes the specification information 31, source code 32, traceability information 33, and change specification information 34, and creates change affected part information with impact degree 35.

[0026] The specification information 31 is, for example, a specification such as a requirements specification and a software design document, or a part of the description written in the specification. The specification information 31 is, for example, a list of the titles of each requirement and function and a description of their details. Fig. 3 is a diagram showing the specification information 31 used as a specific example in the first embodiment. In the requirement shown in Fig. 3, for example, the second line describes the details of a requirement titled "Requirement I".

[0027] The traceability information 33 is, for example, a list of which design elements (requirements, functions, functions, etc.) correspond to which design elements of adjacent higher-level specifications or lower-level specifications. The term "adjacent specifications" refers to each design element output from an adjacent design process when, for example, a requirement design process, a function design process, a function design process, and a test design process execute a sequence using the deliverables of the previous process as inputs. For example, in the previous example, the adjacent lower-level specification of a requirement is a function, and the adjacent higher-level specification of a function is a requirement. The term "correspondence of design elements" means that two or more design elements are related to each other. For example, when a function is designed to achieve a requirement, it can be said that the requirement and the function correspond to each other. FIG. 4 is a diagram showing the traceability information 33 used as a specific example in the first embodiment. In the requirement shown in FIG. 4, for example, the second and third lines indicate that the requirement I is achieved by the function A and the function B. The traceability information 33 may be created manually or automatically using a tool or script.

[0028] The change specification information 34 is, for example, a change specification created for change development, or a part of the description written in the change specification. The change specification information 34 is, for example, a list of the title of each change specification and a description of its details. FIG. 5 is a diagram showing the change specification information 34 used as a specific example in the first embodiment. In FIG. 5, for example, the second line shows the details of the change specification with the title "change α" and that the change target is function B. The change target is a design element that is the target of change in the change specification among the design elements described in the related specification information 31. In addition to the function, the change target may include a requirement or a function, or may include both a requirement and a function. The change target may include multiple design elements. When there is no change target in the related specification information 31, such as when creating a new function in change development, it may be left blank.

[0029] The change affected area information with impact 35 is, for example, a list of the impact (hereinafter referred to as "design element impact") of each design element in the specification information 31 from the change specification described in the change specification information 34. The design element impact is the degree of impact on each design element when the content of the change target is changed according to the change specification. The impact means, for example, the possibility that the specification of each design element needs to be changed, or the possibility that the operation of the target software related to each design element will be changed. FIG. 6 is a diagram showing the change affected area information with impact 35 used as a specific example in the first embodiment, and is a list showing the design element impact regarding the change α. In FIG. 6, for example, the second line shows that the design element impact of the change α is the highest, "0". Also, for example, the third line shows that the requirement I is affected by the change α with a design element impact of "2". In FIG. 6, the smaller the design element impact value, the greater the impact, and the impact of the function B, which is the change target of the change α, is the highest, and the impact of the requirement II and the fourth function is the lowest.

[0030] The process of the change affected part with impact degree creation unit 21 will be described below with reference to FIGS.

[0031] First, the change affected part with impact creating section 21 creates a list of design elements based on the specification information 31, and enters it in the third row and after of the first column of the table of change affected part with impact information 35 shown in FIG.

[0032] Next, the change affected part with impact degree creation section 21 creates a list of change specifications based on the change specification information 34, and enters it in the second row of the first column of the table of change affected part information with impact degree 35 shown in FIG.

[0033] Next, the change affected part with impact creation unit 21 calculates the design element impact of each change specification on each design element, based on the source code 32 and the traceability information 33. The design element impact calculation uses information on the dependency relationships between functions in the source code 32 and distance information included in the traceability information 33.

[0034] Specifically, the change affected part with impact creation unit 21 calculates the degree of association between each design element (hereinafter referred to as the "inter-design element association degree") based on the traceability information 33. For example, since the change α is a change specification that changes function B, the inter-design element association degree between the change α and function B is set to "1". Furthermore, since function B is directly associated with requirement I, the inter-design element association degree between function B and requirement I is set to "1". The inter-design element association degree between the change α and requirement I is set to "2" by adding the inter-design element association degree between the change α and function B and the inter-design element association degree between function B and requirement I. The change affected part with impact creation unit 21 enters the inter-design element association degree from the change α to each design element calculated in this manner as the design element influence in the second column of the table of the change affected part information with impact 35 shown in FIG. 6. If there is a design element whose relationship cannot be traced back to change α, then “--”, which means no impact, may be entered, as in the eighth row of the table of change-affected-area information 35 with impact level shown in FIG. 6.

[0035] The change-affected-area-with-impact-degree creating unit 21 may use information on the source code 32 when calculating the design element impact. For example, the change-affected-area-with-impact-degree creating unit 21 calculates the dependency strength between each function in the source code 32 using a static analysis technique or the like. For example, if there is a dependency relationship between the third function and the fifth function, such as a function call, the degree of design element association between the third function and the fifth function is set to "1" or the inverse of the dependency strength or the like. As a result, the degree of design element association between the change α and the fifth function is "3" by adding "2", which is the degree of design element association between the change α and the third function, and "1", which is the degree of design element association between the third function and the fifth function. When the change affected part with impact degree creation unit 21 calculates the degree of association between design elements based on the dependency strength between each function in the source code 32, the degree of association between the design elements may be added by tracing the path of the dependency relationship between the functions so as to trace the path between the design elements and add the degree of association between the design elements based on the distance information on the traceability between the design elements included in the traceability information 33. For example, if there is a dependency relationship between the third function and the sixth function and a dependency relationship between the sixth function and the fourth function, the degree of association between the third function and the fourth function is "2", which is the sum of the degree of association between the third function and the sixth function and the degree of association between the sixth function and the fourth function.

[0036] In the case where the path of the traceability information 33 is looped, multiple paths between each item may occur. For example, when the third function and the sixth function have a dependency relationship, and the sixth function and the fourth function have a dependency relationship, and the degree of inter-design element association between the third function and the fourth function is "2", the path from the change α to the function C may be a path (path β) that follows the function B, the requirement I, the function A, and the second function, or a path (path γ) that follows the function B, the third function, the sixth function, and the fourth function. In this case, when calculating the degree of inter-design element association between the change α and the function C, the change affected part creation unit 21 with influence degree may set the smaller value of the degree of inter-design element association between the change α and the function C on the path β and the degree of inter-design element association between the change α and the function C on the path γ as the design element influence degree.

[0037] The change affected part with impact creation unit 21 may further input the test viewpoint database 36, determine whether or not the description of the design element, the function comment, the description of the test viewpoint, or the description of the test case contains a weakness keyword of the product or function in which the software is to be incorporated, and adjust the value of the impact (hereinafter referred to as "functional test viewpoint pair impact (design element test viewpoint pair impact)") in the test viewpoint matrix with impact 38 (see FIG. 9). Specifically, for example, if "interrupt timing" is set as a weakness keyword and the description of the test viewpoint b in the test viewpoint database 36 contains the keyword "interrupt timing", the change affected part with impact creation unit 21 subtracts an arbitrary value from the value of the functional test viewpoint pair impact for the test viewpoint b in the test viewpoint matrix with impact 38.

[0038] The change affected part with impact degree creating section 21 writes the created change affected part with impact degree information 35 into the memory 12.

[0039] <Processing of the test viewpoint matrix creation unit 22> The test viewpoint matrix creation unit 22 receives input of the specification information 31 , the changed specification information 34 , and the test viewpoint database 36 via the communication interface 14 , and writes them into the memory 12 .

[0040] Next, the test viewpoint matrix creation unit 22 creates a test viewpoint matrix 37 based on the specification information 31, the changed specification information 34, and the test viewpoint database 36.

[0041] The test viewpoint database 36 is a list of the titles of test viewpoints and descriptions of their details. Fig. 7 is a diagram showing the test viewpoint database 36 used as a specific example in the first embodiment. In Fig. 7, for example, the second line describes details of a test viewpoint titled "test viewpoint a". A test viewpoint is a classification of the purpose of performing a test or the object to be confirmed in a test, and is, for example, functional requirements such as "communication data" and "screen display", or non-functional requirements such as "efficiency", "reliability", and "maintainability".

[0042] Test viewpoint matrix 37 is a list of relationships between design elements and test viewpoints. Fig. 8 is a diagram showing test viewpoint matrix 37 used as a specific example in the first embodiment. In Fig. 8, for example, the second line indicates that function A corresponds to test viewpoint a and test viewpoint b. That a function corresponds to a test viewpoint indicates, for example, that a design description related to the corresponding test viewpoint is described in the specification, or that the implementation of a test related to the corresponding test viewpoint is recommended.

[0043] The process of the test viewpoint matrix creation unit 22 will be described below with reference to FIGS.

[0044] First, the test viewpoint matrix creation unit 22 creates a list of design elements based on the specification information 31, and describes them in the second row and after of the first column of the table of the test viewpoint matrix 37 shown in Fig. 8. At this time, the design elements may be limited to any granularity. In the example of Fig. 8, they are described by being limited to functions. In the following, it is assumed that the items described in the first column of the table of the test viewpoint matrix 37 shown in Fig. 8 are limited to functions, but functions may be replaced with other granularities.

[0045] Next, the test viewpoint matrix creating unit 22 creates a list of change specifications based on the change specification information 34, and writes it at the end of the first column of the table of the test viewpoint matrix 37 shown in FIG.

[0046] Next, the test viewpoint matrix creation unit 22 creates a list of test viewpoints based on the test viewpoint database 36, and writes it in the first row, second column and after of the table of the test viewpoint matrix 37 shown in FIG.

[0047] Next, the test viewpoint matrix creation unit 22 extracts whether or not there is a correspondence between each design element and a test viewpoint based on the title and description of each design element in the specification information 31 and the title and description of the change specification in the change specification information 34. When there is a correspondence between a design element and a test viewpoint, the test viewpoint matrix creation unit 22 writes "○" in a cell in the test viewpoint matrix 37 where the design element and the test viewpoint intersect. When there is no correspondence between a design element and a test viewpoint, the test viewpoint matrix creation unit 22 writes "-" in a cell in the test viewpoint matrix 37 where the design element and the test viewpoint intersect. To extract whether or not there is a correspondence between the design elements and the test viewpoint, a method such as a keyword search is used for the title and description. The extraction of whether or not there is a correspondence between the design elements and the test viewpoint may be performed manually by an operator.

[0048] The test viewpoint matrix creating unit 22 writes the created test viewpoint matrix 37 into the memory 12 .

[0049] <Processing of the impact test viewpoint matrix creation unit 23> The impact-attached test viewpoint matrix creation unit 23 creates an impact-attached test viewpoint matrix 38 based on the impact-attached change affected area information 35 created by the impact-attached change affected area creation unit 21 and the test viewpoint matrix 37 created by the test viewpoint matrix creation unit 22.

[0050] The test viewpoint matrix 38 with impact is a list in which the "○" shown in the cells in the test viewpoint matrix 37 is replaced with a numerical value of the functional test viewpoint pair impact. The functional test viewpoint pair impact is a degree indicating the degree to which a functional test viewpoint pair (design element test viewpoint pair), which is a combination of a certain function and a certain test viewpoint, is affected by an arbitrary change specification. FIG. 9 is a diagram showing the test viewpoint matrix 38 with impact used as a specific example in the first embodiment. In FIG. 9, for example, the second row indicates that the combination of function A and test viewpoint a receives a functional test viewpoint pair impact of "3" from change α, and the combination of function A and test viewpoint b receives a functional test viewpoint pair impact of "3" from change α.

[0051] The process of the influence level-added test viewpoint matrix creating unit 23 will be described below with reference to FIGS.

[0052] First, the influence-added test viewpoint matrix creating unit 23 copies the contents of the test viewpoint matrix 37 to the influence-added test viewpoint matrix 38 .

[0053] Next, based on the change affected area information with impact 35, the design element impact of each design element listed in the first column of the test viewpoint matrix with impact 38 shown in Fig. 9 is entered as a functional test viewpoint pair impact in the cell marked with "○" in the corresponding row. For example, the design element impact of function A is "3" in the change affected area information with impact 35 shown in Fig. 6, and the columns with the cell value of "○" for the second row corresponding to function A in the test viewpoint matrix with impact 38 shown in Fig. 8 are the second and third columns, so a functional test viewpoint pair impact of "3" is entered in the second and third columns of the second row of the test viewpoint matrix with impact 38 shown in Fig. 9.

[0054] In this case, if the design element influence of a certain design element is greater than an arbitrary design element threshold, if it is considered that the corresponding design element is hardly affected by the change, the functional test viewpoint pair influence may not be entered in the row of the corresponding design element in the influence-attached test viewpoint matrix 38. The design element threshold is a threshold for determining the significance of the design element influence. For example, when the design element threshold is set to a design element influence of "3" or less, the design element influence of function C in the influence-attached change affected part information 35 shown in FIG. 6 is "5", which is greater than the design element threshold. Therefore, the influence-attached test viewpoint matrix creation unit 23 does not enter the functional test viewpoint pair influence for the fourth row corresponding to function C in the influence-attached test viewpoint matrix 38 shown in FIG. 9, and leaves it as "○".

[0055] The influence level-added test viewpoint matrix creating unit 23 writes the created influence level-added test viewpoint matrix 38 into the memory 12.

[0056] <Processing of the test case priority generation unit 24> The test case priority creation unit 24 receives input of test information 39 via the communication interface 14 and writes it to the memory 12. The test case priority creation unit 24 creates test case priority information 40 based on the test information 39 and the impact-attached test viewpoint matrix 38 created by the impact-attached test viewpoint matrix creation unit 23.

[0057] The test information 39 describes the correspondence between design elements, test viewpoints, and test cases, and is, for example, a list of functions, test viewpoints, test case titles, and test case descriptions. A test case indicates prerequisites, a series of procedures, expected results, and the like, regarding a test performed to confirm the operation or performance of a certain function from a certain test viewpoint. FIG. 10 is a diagram showing the test information 39 used as a specific example in the first embodiment. In FIG. 10, for example, the second line describes details of a test case titled "First Test Case" as a test case corresponding to a combination of function A and test viewpoint a.

[0058] Test case priority information 40 is a list of test case titles and their priorities (hereinafter referred to as "test case priorities"). Test case priority is a degree indicating which test case should be given priority for test implementation or test design when the contents of the change target are changed according to the change specifications. FIG. 11 is a diagram showing test case priority information 40 used as a specific example in the first embodiment. In FIG. 11, for example, the second line indicates that the test case priority of the first test case is "3", and the sixth line indicates that the test case priority of the fifth test case is "1". From this, it can be seen that the first test case should be given priority over the fifth test case.

[0059] The process of the test case priority generation unit 24 will be described below with reference to FIGS.

[0060] First, the test case priority generation unit 24 generates a list of test cases based on the test information 39, and writes the list in the second row and after of the first column of the table of the test case priority information 40 shown in FIG.

[0061] Next, the test case priority creation unit 24 extracts the corresponding function and test viewpoint of each test case based on the test information 39, and enters the function test viewpoint pair influence of the corresponding cell in the impact-attached test viewpoint matrix 38 as the test case priority in the second column of the table of the test case priority information 40 shown in FIG. 11. For example, the first test case in the second row of the table of the test case priority information 40 shown in FIG. 11 corresponds to the function A and the test viewpoint a according to the second row of the test information 39 shown in FIG. 10. According to the second column of the second row of the table of the impact-attached test viewpoint matrix 38 shown in FIG. 9, the function test viewpoint pair influence between the function A and the test viewpoint a is "3". Therefore, the test case priority creation unit 24 enters the test case priority "3" in the second column of the second row of the table of the test case priority information 40 shown in FIG. 11. The test case priority creation unit 24 may rearrange the test cases according to the magnitude of the value of the test case priority.

[0062] The test case priority generation unit 24 writes the generated test case priority information 40 into the memory 12 .

[0063] <Processing of the display control unit 25> The display control unit 25 controls the display of either the impact-attached test viewpoint matrix 38 created by the impact-attached test viewpoint matrix creation unit 23 or the test case priority information 40 created by the test case priority creation unit 24, or both, on a display device (not shown) via the communication interface 14.

[0064] The display control unit 25 may cause at least one of the test information 39, the change affected part information with impact degree 35, and the test viewpoint matrix 37, which are intermediate deliverables, to be displayed on the display device via the communication interface .

[0065] <Effects> As described above, the test support apparatus 10 according to the first embodiment determines the priority order of test execution and test design for each test case involved in testing when changing software specifications.

[0066] According to the first embodiment, the test designer can determine whether or not to modify or create new test cases in order of likelihood of being affected by the change, thereby reducing the man-hours required for test design. Also, the tester can narrow down the test cases to those most likely to be affected by the change and then perform the tests, thereby reducing the man-hours required for test implementation. Furthermore, the test designer and tester can check the priority of test cases at the granularity of the test perspective, thereby making it easier to check the validity of the priority of test cases.

[0067] <Variation 1> In the first embodiment, a case has been described in which the functions of the change affected area creation unit 21 with impact levels, the test viewpoint matrix creation unit 22, the test viewpoint matrix creation unit 23 with impact levels, the test case priority creation unit 24, and the display control unit 25 provided in the test support device 10 are realized by software.

[0068] In the first modification, a case will be described in which the functions of the change-affected-section-with-influence creation unit 21, the test viewpoint matrix creation unit 22, the test viewpoint matrix creation unit 23, the test case priority creation unit 24, and the display control unit 25 are realized by hardware. The following describes the differences between the first modification and the first embodiment.

[0069] The configuration of the test support device 10 according to the first modification will be described below with reference to FIG.

[0070] When the functions of the change-affected-location-with-influence creation unit 21, the test perspective matrix creation unit 22, the test perspective matrix creation unit 23, the test case priority creation unit 24, and the display control unit 25 are realized by hardware, the test support device 10 includes a processing circuit 15 instead of the processor 11, the memory 12, and the storage 13. The processing circuit 15 is a dedicated electronic circuit that realizes the functions of the change-affected-location-with-influence creation unit 21, the test perspective matrix creation unit 22, the test perspective matrix creation unit 23, the test case priority creation unit 24, the display control unit 25, the memory 12, and the storage 13.

[0071] The processing circuit 15 may be a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, a logic IC, a GA (Gate Array), an ASIC (Application Specific Integrated Circuit), or an FPGA (Field-Programmable Gate Array).

[0072] The functions of the change-affected area with impact creation unit 21, the test perspective matrix creation unit 22, the test perspective matrix creation unit 23, the test case priority creation unit 24, and the display control unit 25 may be realized by one processing circuit 15, or the functions of the change-affected area with impact creation unit 21, the test perspective matrix creation unit 22, the test perspective matrix creation unit 23, the test case priority creation unit 24, and the display control unit 25 may be realized by distributing them among multiple processing circuits 15.

[0073] <Variation 2> In the first variant example, the case has been described in which the functions of the change-affected area creation unit with impact levels 21, the test viewpoint matrix creation unit 22, the test viewpoint matrix creation unit with impact levels 23, the test case priority creation unit 24, and the display control unit 25 are realized by hardware, but some of the functions may be realized by hardware and other functions may be realized by software.

[0074] In other words, as a second variant example, among the change-affected area creation unit 21 with impact levels, the test viewpoint matrix creation unit 22, the test viewpoint matrix creation unit 23 with impact levels, the test case priority creation unit 24, and the display control unit 25, some of the functions may be realized by hardware, and other functions may be realized by software.

[0075] The processor 11, memory 12, storage 13, and processing circuitry 15 are collectively referred to as "processing circuitry." That is, the functions of each functional component are realized by the processing circuitry.

[0076] <Embodiment 2> The second embodiment differs from the first embodiment in that the values ​​of the design element influence degrees or the functional test viewpoint pair influence degrees are adjusted. In the second embodiment, this difference will be explained, and explanations of the same points will be omitted.

[0077] <Configuration> The configuration of a test support device 16 according to the second embodiment will be described with reference to FIG.

[0078] 1 in that the processor 17 of the test support device 16 includes an influence adjustment unit 26. The influence adjustment unit 26 is realized by software, like the other functional components. Also, the influence adjustment unit 26 may be realized in part or in whole by hardware, like the other functional components.

[0079] <Operation> The operation of the test support device 16 according to the second embodiment will be described with reference to FIG.

[0080] The operation of the test support device 16 according to the second embodiment corresponds to the test support method according to the second embodiment. The operation of the test support device 10 according to the second embodiment corresponds to the processing of the test support program according to the second embodiment.

[0081] <Processing of the influence degree adjustment unit 26> The influence adjustment unit 26 accepts an instruction from the operator to change the design element influence value or the functional test viewpoint pair influence value of the influence-attached test viewpoint matrix 38 created by the influence-attached test viewpoint matrix creation unit 23, and changes the value to create an adjusted influence-attached test viewpoint matrix 41.

[0082] The adjusted impact-added test viewpoint matrix 41 is a list in which the values ​​of the functional test viewpoint pair impacts in the impact-added test viewpoint matrix 38 are changed according to a change instruction from an operator. Fig. 15 is a diagram showing the adjusted impact-added test viewpoint matrix 41 used as a specific example in the second embodiment.

[0083] The test case priority generation unit 24 generates the test case priority information 40 based on the adjusted test viewpoint matrix with influence 41, not on the test viewpoint matrix with influence 38.

[0084] The process of the influence degree adjustment unit 26 will be described below with reference to FIGS.

[0085] First, the influence degree adjustment unit 26 causes the display device to display the test viewpoint matrix 38 with influence degrees via the communication interface 14 .

[0086] Next, the impact adjustment unit 26 copies the contents of the impact-added test viewpoint matrix 38 to the adjusted impact-added test viewpoint matrix 41. The impact adjustment unit 26 accepts an instruction to change the value of the functional test viewpoint pair impact from the operator via the communication interface 14, and changes the corresponding value in the adjusted impact-added test viewpoint matrix 41. Specifically, for example, the operator sends an instruction such as "Decrease the functional test viewpoint pair impact between function A and test viewpoint b by 1" via the communication interface 14. The impact adjustment unit 26 changes the value of the cell in the second row and third column corresponding to the functional test viewpoint pair impact between function A and test viewpoint b in the table of the adjusted impact-added test viewpoint matrix 41 shown in FIG. 15 from "3" to "2."

[0087] The impact adjustment unit 26 may display the change-affected part information with impact 35 on the display device via the communication interface 14, accept an instruction from the worker to change the value of the design element impact, and change the value of the design element impact in the change-affected part information with impact 35. In this case, the impact adjustment unit 26 recalculates the value of the functional test viewpoint pair impact based on the changed design element impact value, and creates an adjusted test viewpoint matrix with impact 41.

[0088] The impact adjustment unit 26 may also receive a test viewpoint priority from the operator via the communication interface 14 and change the value of the functional test viewpoint pair impact in the adjusted impact-added test viewpoint matrix 41. The test viewpoint priority is a priority value given to a specified test viewpoint. Specifically, for example, the operator sends an instruction such as "the test viewpoint priority of the test viewpoint b is 1" via the communication interface 14. The impact adjustment unit 26 changes the value of the cell in the second row and third column corresponding to the test viewpoint b in the table of the adjusted impact-added test viewpoint matrix 41 shown in FIG. 15 to "2" by subtracting 1 from "3". Similarly, the impact adjustment unit 26 changes the value of the cell in the third row and third column corresponding to the test viewpoint b in the table of the adjusted impact-added test viewpoint matrix 41 shown in FIG. 15 to "0" by subtracting 1 from "1". The change of the value of the functional test viewpoint pair impact using the test viewpoint priority may be performed by arithmetic operations such as subtraction and division, or other calculation methods. In this manner, the impact adjustment unit 26 weights the functional test viewpoint pair impacts based on the test viewpoint priority levels to create an adjusted impact-added test viewpoint matrix 41.

[0089] The influence adjustment unit 26 may also receive design element priorities from the worker via the communication interface 14 and change the values ​​of the function test viewpoint pair influences in the adjusted influence-added test viewpoint matrix 41. The design element priorities are priority values ​​given to a designated design element. Specifically, for example, the worker sends an instruction such as "the design element priority of function B is 1" via the communication interface 14. The influence adjustment unit 26 changes the value of the cell in the third row and second column corresponding to function B in the table of the adjusted influence-added test viewpoint matrix 41 shown in FIG. 15 to "0" by subtracting 1 from "1". Similarly, the influence adjustment unit 26 changes the value of the cell in the third row and third column corresponding to function B in the table of the adjusted influence-added test viewpoint matrix 41 shown in FIG. 15 to "0" by subtracting 1 from "1". Similarly, the influence adjustment unit 26 changes the value of the cell in the third row and fourth column corresponding to function B in the table of the adjusted influence-added test viewpoint matrix 41 shown in FIG. 15 to "0" by subtracting 1 from "1". The value of the functional test viewpoint pair influence degree using the design element priority may be changed by the four arithmetic operations such as subtraction and division, or by other calculation methods.

[0090] Next, the influence adjustment unit 26 writes the adjusted influence-added test viewpoint matrix 41 into the memory 12 .

[0091] <Effects> As described above, the test support device 16 according to the second embodiment reflects the results of the operator's arbitrary adjustment of the values ​​of the design element influence levels or the functional test viewpoint pair influence levels in the priority order of test implementation and test design for each test case.

[0092] According to the second embodiment, the test designer can determine the necessity of changing or creating new test cases related to weak points with priority, and the man-hours for test design can be reduced. Also, the tester can narrow down the test cases related to weak points and perform the test, and the man-hours for test implementation can be reduced. A weak point is, for example, a function or test viewpoint where a defect has occurred in the past, or a function or test viewpoint where a defect is likely to occur.

[0093] <Embodiment 3> The third embodiment differs from the first embodiment in that the consistency of the impact-added test viewpoint matrix is ​​determined. In the third embodiment, this difference will be described, and a description of the same points will be omitted.

[0094] <Configuration> The configuration of a test support device 18 according to the third embodiment will be described with reference to FIG.

[0095] 1 in that the processor 19 includes a consistency determination unit 27. The consistency determination unit 27 is realized by software, like the other functional components. Also, the consistency determination unit 27 may be realized in part or in whole by hardware, like the other functional components.

[0096] <Operation> The operation of the test support device 18 according to the third embodiment will be described with reference to FIG.

[0097] The operation of the test support device 18 according to the embodiment 3 corresponds to the test support method according to the embodiment 3. Moreover, the operation of the test support device 18 according to the embodiment 3 corresponds to the processing of the test support program according to the embodiment 3.

[0098] <Processing of the consistency determination unit 27> The consistency judgment unit 27 checks whether there are any inconsistencies between the contents of the impact-attached test viewpoint matrix 38 created by the impact-attached test viewpoint matrix creation unit 23, the test information 39, and the revised specification test information 43, judges the consistency, detects any inconsistencies as a consistency violation, and creates a consistency judgment result 42.

[0099] The consistency judgment result 42 is a list of the locations and contents of the consistency violation. Fig. 18 is a diagram showing the consistency judgment result 42 used as a specific example in the third embodiment. For example, the second line shows that the change α does not correspond to the test viewpoint c as a consistency violation of the change α.

[0100] Revised specification test information 43 is test information on revised specification information obtained by merging changed specification information into specification information. Merging changed specification information is a process of reflecting changed specification information created separately from the pre-change specification information into the pre-change specification information after the completion of change development. Fig. 19 is a diagram showing revised specification test information 43 used as a specific example in the third embodiment, and for example, the 12th line shows that the 11th test case, which was designed as a test case for change α in the test information 39 shown in Fig. 10, has been arranged as the 11th test case for function B.

[0101] The display control unit 25 controls the display of the consistency determination result 42 created by the consistency determination unit 27 on the display device via the communication interface 14 .

[0102] The process of the consistency determination unit 27 will be described below with reference to FIGS.

[0103] First, the consistency determining unit 27 extracts a list of test perspectives that correspond to the change specification based on the impact-added test perspective matrix 38. Specifically, in the example of Fig. 9, the consistency determining unit 27 extracts test perspectives a and b as test perspectives that correspond to the change α.

[0104] Next, the consistency determination unit 27 extracts a list of design elements that are affected by the change specification based on the impact-attached test viewpoint matrix 38. At this time, the design elements whose corresponding design element impact value is greater than the design element threshold value, or the functional test viewpoint pairs whose corresponding functional test viewpoint pair impact value is greater than the functional test viewpoint pair threshold value may be excluded from the extraction. The functional test viewpoint pair threshold value is a threshold value for determining the significance of the functional test viewpoint pair impact value. Specifically, in the example of FIG. 9, the consistency determination unit 27 extracts function A and function B, which have the functional test viewpoint pair impact value recorded thereon, as design elements that are affected by the change α. Note that the design element impact value of function C is greater than the design element threshold value "3", so the functional test viewpoint pair impact value is not recorded thereon. Therefore, the consistency determination unit 27 does not include function C in the functions to be extracted.

[0105] Next, the consistency determination unit 27 extracts a list of test perspectives corresponding to the design elements affected by the change specification based on the impact-added test perspective matrix 38. Specifically, in the example of Fig. 9, the consistency determination unit 27 extracts test perspectives a, b, and c as test perspectives corresponding to the previously extracted function A and function B.

[0106] Next, the consistency determination unit 27 compares the list of test perspectives corresponding to the change specification with the list of test perspectives corresponding to the design elements affected by the change specification, based on the test perspective matrix with impact degree 38. Specifically, in the example of Fig. 9, the consistency determination unit 27 compares the list of test perspectives a and b, which are test perspectives corresponding to the change specification, with the list of test perspectives a, b, and c, which are test perspectives corresponding to functions A and B, and detects that test perspective c is not included only on the side of the test perspectives corresponding to the change specification.

[0107] Next, the consistency determining unit 27 writes in the consistency determination result 42 that the test viewpoint c does not correspond as a consistency violation of the change α.

[0108] Furthermore, the consistency determination unit 27 extracts a list of function-test viewpoint pairs corresponding to the change specification and each design element based on the impact-attached test viewpoint matrix 38. At this time, the consistency determination unit 27 may exclude functional test viewpoint pairs whose functional test viewpoint pair impact degree is greater than the functional test viewpoint pair threshold. Specifically, in the example of FIG. 9, when the functional test viewpoint pair threshold is "2", the consistency determination unit 27 extracts the pair of function B and test viewpoint a, the pair of function B and test viewpoint b, the pair of function B and test viewpoint b, the pair of change α and test viewpoint a, and the pair of change α and test viewpoint b as functional test viewpoint pairs corresponding to the change specification and each design element.

[0109] Next, the consistency judging unit 27 checks whether there is a test case corresponding to the previously extracted functional test viewpoint pair based on the test information 39. Specifically, in the example of Fig. 9, the consistency judging unit 27 detects that there is no test case corresponding to the pair of change α and test viewpoint b.

[0110] Next, the consistency judging unit 27 writes in the consistency judgment result 42 that there is no test case corresponding to the pair of the change α and the test viewpoint b, as a consistency violation of the change α.

[0111] Furthermore, the consistency determination unit 27 compares the test information 39 with the revised specification test information 43, and extracts how the test cases related to the changed specifications are reflected in the specification information. The identity between the test cases in the test information 39 and the test cases in the revised specification test information 43 is determined based on whether the names of the test cases match or the similarity of the descriptions of the test cases. Specifically, in the example of Fig. 19, the consistency determination unit 27 extracts that the 11th test case has been organized as a test case paired with function B and test viewpoint c, and that the 12th test case has been organized as a test case paired with function C and test viewpoint a.

[0112] Next, the consistency determination unit 27 extracts a list of design elements that are affected by the change specification based on the impact-attached test viewpoint matrix 38. At this time, the consistency determination unit 27 may limit the design elements to those having functional test viewpoint pairs whose functional test viewpoint pair impact levels are equal to or less than the functional test viewpoint pair threshold. Specifically, in the example of Fig. 9, when the functional test viewpoint pair threshold is "4", the consistency determination unit 27 detects function A and function B as design elements that are affected by the change specification.

[0113] Next, the consistency determination unit 27 determines whether or not the function newly associated with the organized test case is included in the list of design elements affected by the change specification extracted earlier. Specifically, in the example of Fig. 19, it is detected that the 12th test case corresponds to a function that is not included in the list of design elements affected by the change specification.

[0114] Next, the consistency determining unit 27 writes in the consistency determination result 42 that the 12th test case corresponds to the function C that is not included in the list of design elements affected by the change specification, as a consistency violation of the 12th test case.

[0115] Furthermore, the consistency determining unit 27 extracts a list of test perspectives to which the change specification corresponds, based on the impact-added test perspective matrix 38. Specifically, in the example of Fig. 9, the consistency determining unit 27 extracts test perspective a and test perspective b as test perspectives to which the change specification corresponds.

[0116] Next, the consistency determination unit 27 determines whether the test viewpoint newly associated with the organized test case is included in the list of test viewpoints corresponding to the previously extracted change specification. Specifically, in the example of Fig. 19, it is detected that the 11th test case corresponds to a test viewpoint not included in the list of test viewpoints corresponding to the change specification.

[0117] Next, the consistency judging unit 27 writes in the consistency judgment result 42 that the change specification corresponds to the test viewpoint c that is not included in the list of corresponding test viewpoints, as a consistency violation of the 11th test case.

[0118] Next, the consistency determination unit 27 writes the consistency determination result 42 into the memory 12 .

[0119] <Effects> As described above, the test support device 18 according to the third embodiment detects a consistency violation related to the change specification.

[0120] According to the third embodiment, the specification designer can find out the possibility of specification omissions in the change specifications in the change development, and the possibility of specification omissions in the pre-change specifications to which the change development is applied. The test designer can find out the possibility of test case design omissions. In addition, the test designer can find out the possibility of mistakes in redesigning test cases when merging the change specifications with the pre-change specifications.

[0121] Within the scope of the present disclosure, the embodiments can be freely combined, and each embodiment can be modified or omitted as appropriate.

[0122] Although the present disclosure has been described in detail, the above description is illustrative in all respects and is not restrictive. It is understood that countless variations not illustrated can be envisioned. [Explanation of symbols]

[0123] 10 test support device, 11 processor, 12 memory, 13 storage, 14 communication interface, 15 processing circuit, 16 test support device, 17 processor, 18 test support device, 19 processor, 21 change affected area creation unit with impact, 22 test viewpoint matrix creation unit, 23 test viewpoint matrix with impact, 24 test case priority creation unit, 25 display control unit, 26 impact adjustment unit, 27 consistency judgment unit, 31 specification information, 32 source code, 33 traceability information, 34 change specification information, 35 change affected area information with impact, 36 test viewpoint database, 37 test viewpoint matrix, 38 test viewpoint matrix with impact, 39 test information, 40 test case priority information, 41 adjusted test viewpoint matrix with impact, 42 consistency judgment result, 43 revised specification test information.

Claims

1. A test support device that supports testing performed when changing software specifications, comprising: a change affected part creation unit with influence degree that calculates a design element influence degree indicating the influence degree of the change specification included in the change specification information on a design element based on specification information, source code, traceability information, and change specification information, and creates change affected part information with influence degree indicating the relationship between the design element and the design element influence degree; a test viewpoint matrix creation unit that extracts the presence or absence of correspondence between the design elements and the test viewpoints based on the specification information, the changed specification information, and a test viewpoint database, and creates a test viewpoint matrix indicating the correspondence relationship between the design elements and the test viewpoints; a test viewpoint matrix creation unit with influence that calculates a design element test viewpoint pair influence indicating the influence of the change specification on a design element test viewpoint pair that is a pair of the design element and the test viewpoint, based on the change affected part information with influence created by the change affected part information with influence created by the change affected part information with influence created by the change viewpoint matrix creation unit and the test viewpoint matrix created by the test viewpoint matrix creation unit, and creates a test viewpoint matrix with influence indicating the relationship between the design element test viewpoint pair and the design element test viewpoint pair influence; a test case priority generation unit that calculates a test case priority, which is a priority of the test case, based on test information indicating a correspondence relationship between the design element test viewpoint pair and the test case and the test viewpoint matrix with influence level generated by the test viewpoint matrix generation unit; a display control unit that controls displaying at least one of the impact-attached test viewpoint matrix created by the impact-attached test viewpoint matrix creating unit and the test case priority calculated by the test case priority creating unit; A test support device comprising:

2. 2. The test support device according to claim 1, wherein the change affected portion with impact degree creation unit calculates the design element impact degree based on a dependency strength between the design elements in the source code.

3. 3. The test support device according to claim 1, wherein the change-affected-location-with-impact-degree generating unit calculates the design element influence degree based on distance information regarding traceability between the design elements included in the traceability information.

4. 4. The test support device according to claim 1, wherein the change affected area with impact creation unit determines whether or not at least keywords included in the specification information and the test viewpoint database are predetermined keywords, and adjusts the design element test viewpoint pair impact in the impact-based test viewpoint matrix based on the determination result.

5. 5. The test support device according to claim 1, further comprising an influence adjustment unit that receives an instruction to change the design element test viewpoint pair influence in the influence-added test viewpoint matrix, and adjusts the design element test viewpoint pair influence in accordance with the change instruction to create an adjusted influence-added test viewpoint matrix.

6. 6. The test support device according to claim 5, wherein the impact adjustment unit receives an instruction to change the design element impact included in the change affected area information with impact, adjusts the design element impact in accordance with the change instruction, recalculates the design element test viewpoint pair impact based on the adjusted design element impact, and creates the adjusted test viewpoint matrix with impact.

7. 6. The test support device according to claim 5, wherein the impact adjustment unit receives a test viewpoint priority which is a priority of the test viewpoint, and weights the design element test viewpoint pair impact based on the test viewpoint priority to create the adjusted impact-added test viewpoint matrix.

8. 6. The test support device according to claim 5, wherein the influence adjustment unit receives design element priority levels which are priorities of the design elements, and weights the design element test viewpoint pair influence levels based on the design element priority levels to create the adjusted influence-added test viewpoint matrix.

9. 5. The test support device according to claim 1, further comprising a consistency determination unit that compares a list of test perspectives corresponding to the design elements affected by the change specification with a list of test perspectives corresponding to the change specification based on the impact-added test perspective matrix, and determines a point where there is a difference between the two as a consistency violation.

10. 10. The test support device according to claim 9, wherein the consistency determination unit determines that the consistency is violated when the test case corresponding to the design element test viewpoint pair does not exist based on the impact-added test viewpoint matrix and the test information.

11. 11. The test support device according to claim 9, wherein the consistency determination unit determines that the consistency is violated when a test case designed to test the change specification corresponds to a design element other than a design element affected by the change specification, based on revised specification test information, which is test information regarding revised specification information obtained by merging the change specification information into the specification information.

12. 12. A test support device as claimed in claim 9, wherein the consistency determination unit determines that the consistency is violated when a test case designed to test the change specification corresponds to a test perspective other than the test perspective to which the change specification corresponds, based on revised specification test information, which is test information regarding revised specification information obtained by merging the change specification information into the specification information.

13. A test support method for supporting a test performed when changing a software specification, comprising: Calculating a design element influence level indicating the influence level of the change specification included in the change specification information on a design element based on the specification information, the source code, the traceability information, and the change specification information, and creating change-affected part information with influence level indicating the relationship between the design element and the design element influence level; extracting whether or not there is a correspondence between the design elements and the test viewpoints based on the specification information, the changed specification information, and a test viewpoint database, and creating a test viewpoint matrix indicating the correspondence relationship between the design elements and the test viewpoints; Calculate a design element test viewpoint pair influence indicating the influence of the change specification on a design element test viewpoint pair, which is a pair of the design element and the test viewpoint, based on the created change affected part information with influence and the created test viewpoint matrix, and create a test viewpoint matrix with influence indicating the relationship between the design element test viewpoint pair and the design element test viewpoint pair influence; Calculating a test case priority level, which is a priority level of the test case, based on test information indicating a correspondence relationship between the design element test viewpoint pair and the test case and the created test viewpoint matrix with the impact degree; A test support method, comprising: controlling display of at least one of the created test viewpoint matrix with impact levels and the calculated test case priority levels.

14. A test support program for causing a computer to function as a test support device for supporting a test performed when changing software specifications, comprising: A step of calculating a design element influence level indicating the influence level of the change specification included in the change specification information on a design element based on specification information, source code, traceability information, and change specification information, and creating change affected part information with influence level indicating the relationship between the design element and the design element influence level; extracting whether or not there is a correspondence between the design elements and the test viewpoints based on the specification information, the changed specification information, and a test viewpoint database, and creating a test viewpoint matrix indicating the correspondence between the design elements and the test viewpoints; a step of calculating a design element test viewpoint pair influence indicating the influence of the change specification on a design element test viewpoint pair, which is a pair of the design element and the test viewpoint, based on the created change affected part information with influence and the created test viewpoint matrix, and creating a test viewpoint matrix with influence indicating the relationship between the design element test viewpoint pair and the design element test viewpoint pair influence; A step of calculating a test case priority level, which is a priority level of the test case, based on test information indicating a correspondence relationship between the design element test viewpoint pair and the test case and the created test viewpoint matrix with impact levels; A procedure for controlling display of at least one of the created impact-added test viewpoint matrix and the calculated test case priority level; A test support program that causes the computer to execute the above steps.

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