Test system and method for navigation chips - Patents.com

Abstract

The present invention discloses a test system and test method for navigation chips, the system includes a test device, a signal source, and at least one test bench group with a decoding test bench and a positioning test bench, which is used for mounting a navigation chip to be tested, the signal source is respectively connected to each decoding test bench by a port, and simultaneously and continuously transmits different simulated satellite signals to the decoding test bench by different ports, the navigation chip to be tested in the decoding test bench receives and decodes the corresponding simulated satellite signal, obtains and stores the decoded data, and transmits it to the test device by the decoding test bench, the test device performs verification and positioning calculation on the decoded data, and obtains first positioning information, and the navigation chip to be tested mounted on the positioning test bench performs positioning calculation according to the stored decoded data, obtains second positioning information, and transmits it to the test device by the positioning test bench for positioning test verification, the system can effectively improve the testing efficiency of the navigation chip.

Description

[Technical field]

[0001] The present invention relates to the field of chip testing, and in particular to a test system and test method for navigation chips. [Background technology]

[0002] The navigation chip is used to receive satellite signals, decode them, calculate its own position, and realize the positioning function. When the navigation chip is shipped, it needs to be tested to evaluate the function and accuracy of the navigation chip, and the test on the navigation chip needs a related simulated signal source. For example, patent CN117630981A proposes a signal simulation source device for verifying and testing the navigation chip of a satellite, which includes a carrier generator, a code generator, a noise generator, an interference generator, a signal generation module, and a register read / write module, and the signal generation module receives the output signals of the carrier generator, the code generator, the noise generator, and the interference generator, and combines with the register setting of the register read / write module to generate a target intermediate frequency signal, and the register read / write module is electrically connected to the CPU subsystem by the APB bus. The simulation source can provide the relevant test signal to the navigation chip.

[0003] For the navigation chip decoding and positioning test, three different simulated satellite signals need to be provided, and the navigation chip receives the three simulated satellite signals, decodes and obtains the satellite position information and ranging code, and calculates the distance of the navigation chip from the simulated satellite according to the ranging code. Furthermore, by calculating the longitude and latitude of the three simulated satellites (the satellite positions are constant), the longitude and latitude where the navigation chip is located can be accurately obtained.

[0004] In the prior art, in testing a large number of navigation chips, multiple navigation chips to be tested are respectively mounted on multiple test benches, and a signal source first generates a first simulated satellite signal and sends it to each navigation chip to be tested, and each navigation chip to be tested decodes the first simulated satellite signal, stores it, and sends it to a test device, and then the signal source generates a second simulated satellite signal and sends it to each navigation chip to be tested, and each navigation chip to be tested decodes the second simulated satellite signal, stores it, and sends it to a test device, and then the signal source generates a third simulated satellite signal and sends it to each navigation chip to be tested, and each navigation chip to be tested decodes the third simulated satellite signal, stores it, and sends it to a test device, and each navigation chip to be tested completes the decoding of the three simulated satellite signals and then moves to the next test bench to perform positioning calculation, and the test device receives the three decoded data and then performs positioning calculation, and in this process, no matter what signal source provides, when switching between the three simulated satellite signals, it requires time to establish the next simulated satellite signal, which reduces the testing efficiency of the navigation chip. In addition, the test device needs to simultaneously perform positioning calculation after receiving a large number of three decoded signals, which increases the amount of calculation, increases the calculation time, and reduces the test efficiency. Summary of the Invention [Problem to be solved by the invention]

[0005] The present invention provides a test system and test method for a navigation chip, which can effectively improve the test efficiency of the navigation chip. [Means for solving the problem]

[0006] A test system for navigation chips includes a test device, a signal source, and at least one test bench group including a decoding test bench and a positioning test bench, which is used for mounting a navigation chip to be tested, the signal source is respectively connected to each decoding test bench by a port, and simultaneously and continuously transmits different simulated satellite signals to the decoding test bench by different ports, the navigation chip to be tested mounted on the decoding test bench receives and decodes the corresponding simulated satellite signal, obtains and stores the decoded data, and transmits it to the test device by the decoding test bench, the test device performs verification and positioning calculation on the decoded data, and obtains first positioning information, the navigation chip to be tested mounted on the positioning test bench performs positioning calculation based on the stored decoded data, obtains second positioning information, and transmits it to the test device by the positioning test bench, so as to perform positioning test verification.

[0007] Further, the system further includes a transport device used for sequentially transporting the navigation chips waiting for testing to the corresponding decoding test bench according to a test order to perform decoding testing, and sequentially transporting the navigation chips waiting for testing that are located at the decoding test bench and have completed the decoding test to the positioning test bench.

[0008] Furthermore, the test device is connected to the signal source and is used to control the signal source to simultaneously and continuously transmit different simulated satellite signals through different ports to a decoding test bench.

[0009] Further, each of the navigation chips to be tested respectively decodes three simulated satellite signals, and the test device verifies the three corresponding decoded data for the same navigation chip to be tested; The testing device and the navigation chip waiting for testing perform positioning calculation according to the decoded data of three simulated satellite signals, and obtain first positioning information and second positioning information respectively.

[0010] Furthermore, the decoding test bench includes a first decoding test bench, a second decoding test bench, and a third decoding test bench, and the signal source includes a first port, a second port, and a third port; a signal source simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits the first simulated satellite signal, the second simulated satellite signal, and a third simulated satellite signal to the first decoding test bench, the second decoding test bench, and the third decoding test bench through a first port, a second port, and a third port, respectively; The transport device transports the navigation chip to be tested to a first decoding test bench, and the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the first decoding test bench to a second decoding test bench, and the navigation chip to be tested receives and decodes the second simulated satellite signal, generates and stores second decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the second decoding test bench to a third decoding test bench, and the navigation chip to be tested receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to a test device; The transportation device transports the navigation chip waiting to be tested in the third decoding test bench to the positioning test bench, and the navigation chip waiting to be tested calculates and obtains second positioning information based on the stored first decoded data, second decoded data and third decoded data, and transmits it to the test device.

[0011] Furthermore, the transport device transports the first navigation chip waiting for testing in the first decoding test bench to the second decoding test bench, and then transports the second navigation chip waiting for testing to the first decoding test bench to decode, transmit, and store the first simulated satellite signal; After the first navigation chip waiting to be tested and the second navigation chip waiting to be tested complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal respectively, the transport device transports the first navigation chip waiting to be tested to a third decoding test bench, transports the second navigation chip waiting to be tested to the second decoding test bench, and transports the third navigation chip waiting to be tested to the first decoding test bench; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmission and storage of the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal, respectively, the transportation device transports the first navigation chip awaiting test to the positioning test bench, transports the second navigation chip awaiting test to the third decoding test bench, transports the third navigation chip awaiting test to the second decoding test bench, and transports the fourth navigation chip awaiting test to the first decoding test bench.

[0012] The test method for the navigation chip is applied to the above system, a signal source simultaneously and continuously transmitting different simulated satellite signals through different ports to a decoding test bench; The navigation chip to be tested receives and decodes the corresponding simulated satellite signal through the decoding test bench, obtains and stores the decoded data, and sends it to the test device; A test device performs verification and positioning calculation on the decoded data to obtain first positioning information; The navigation chip waiting for testing performs positioning calculation according to the stored decoded data, obtains second positioning information, and sends it to the test device by the positioning test bench to perform positioning test verification.

[0013] Furthermore, the system further comprises a conveying device, and the method further comprises: The transport device further includes sequentially transporting the navigation chips awaiting test to corresponding decoding test benches according to a test order to perform decoding tests, and sequentially transporting the navigation chips awaiting test that are located at the decoding test benches and have completed the decoding tests to the positioning test bench.

[0014] Furthermore, the decoding test bench includes a first decoding test bench, a second decoding test bench, and a third decoding test bench, and the signal source includes a first port, a second port, and a third port; a signal source simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits the first simulated satellite signal, the second simulated satellite signal, and a third simulated satellite signal to the first decoding test bench, the second decoding test bench, and the third decoding test bench through a first port, a second port, and a third port, respectively; The transport device sequentially transports the navigation chips to be tested to the corresponding decoding test benches according to a test order to perform a decoding test, and sequentially transports the navigation chips to be tested that are located at the decoding test benches and have completed the decoding test to the positioning test bench. The transport device transports the navigation chip to be tested to a first decoding test bench, and the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the first decoding test bench to a second decoding test bench, and the navigation chip to be tested receives and decodes the second simulated satellite signal, generates and stores second decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the second decoding test bench to a third decoding test bench, and the navigation chip to be tested receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to a test device; The transport device transports the navigation chip awaiting test in the third decoding test bench to the positioning test bench, and the navigation chip awaiting test calculates and obtains second positioning information based on the stored first decoded data, second decoded data and third decoded data, and transmits it to the test device.

[0015] Furthermore, the transport device transports the first navigation chip waiting for testing in the first decoding test bench to the second decoding test bench, and then transports the second navigation chip waiting for testing to the first decoding test bench to decode, transmit, and store the first simulated satellite signal; After the first navigation chip waiting to be tested and the second navigation chip waiting to be tested complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal respectively, the transport device transports the first navigation chip waiting to be tested to a third decoding test bench, transports the second navigation chip waiting to be tested to the second decoding test bench, and transports the third navigation chip waiting to be tested to the first decoding test bench; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmission and storage of the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal, respectively, the transportation device transports the first navigation chip awaiting test to the positioning test bench, transports the second navigation chip awaiting test to the third decoding test bench, transports the third navigation chip awaiting test to the second decoding test bench, and transports the fourth navigation chip awaiting test to the first decoding test bench. Effect of the Invention

[0016] The test system and test method for a navigation chip according to the present invention include at least: (1) It can simultaneously perform decoding and positioning tests for a large number of navigation chips, without the need for the signal source to switch signals, and without adding other devices, which effectively reduces the test time, improves the test efficiency, and effectively reduces production costs; (2) The beneficial effect is that Doppler time delay information is introduced into the designed signal source, providing a more accurate simulated satellite signal for testing, thereby improving test accuracy. [Brief description of the drawings]

[0017] [Figure 1] FIG. 1 is a structural schematic diagram of one embodiment of a test system for a navigation chip according to the present invention; [Diagram 2] FIG. 2 is a structural schematic diagram of one embodiment of a signal source in a test system for a navigation chip according to the present invention; [Diagram 3] FIG. 2 is a structural schematic diagram of another embodiment of a test system for a navigation chip according to the present invention; [Figure 4] 2 is a flow chart of one embodiment of a test method for a navigation chip according to the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0018] In order to make the above technical solution more understandable, the above technical solution will be described in detail below in conjunction with the drawings and specific embodiments in the specification.

[0019] Referring to FIG. 1, in some embodiments, a test system for navigation chips is provided, which includes a test device 1, a signal source 2, and at least one test bench group 3, the test bench group 3 is used for mounting a navigation chip to be tested, which includes a decoding test bench 31 and a positioning test bench 32, the signal source is respectively connected to each decoding test bench 31 by a port, and different ports are used to simultaneously and continuously transmit different simulated satellite signals to the decoding test bench 31, the navigation chip to be tested mounted on the decoding test bench 31 receives and decodes the corresponding simulated satellite signal, obtains and stores the decoded data, and transmits it to the test device by the decoding test bench 31, the test device 1 performs verification and positioning calculation on the decoded data, and obtains first positioning information, the navigation chip to be tested mounted on the positioning test bench 32 performs positioning calculation based on the stored decoded data, obtains second positioning information, and transmits it to the test device 1 by the positioning test bench 32, so as to perform positioning test verification.

[0020] Specifically, the test device 1 can be an ATE (Automatic Test Equipment), and the number of the test bench groups 3 can be determined according to the actual demand and the number of interfaces of the signal source 2 and the test device 1.

[0021] Specifically, referring to FIG. 2, the signal source 2 includes a spread spectrum modulation module 201, an observation data conversion module 202, a spread spectrum code numerically controlled oscillator 203, a carrier wave spread spectrum code numerically controlled oscillator 204, a spread spectrum code generation module 205, a digital baseband filtering module 206, a Doppler modulation module 207, a frequency conversion module 208, a hopping frequency point generation module 209, a frequency hopping output module 210, and a radio frequency output module 211. Wherein, the observation data conversion module 202 receives the observation data required for testing generated by the data simulation system, performs parameter conversion, generates spread spectrum code dynamic observation variables and carrier dynamic observation variables, sends the spread spectrum code dynamic observation variables to the spread spectrum code numerically controlled oscillator 203, controls the spread spectrum code numerically controlled oscillator 203 to generate a spread spectrum code of a corresponding rate and sends it to the spread spectrum modulation module 201, and converts the carrier dynamic observation variables into the carrier spread spectrum code. the carrier frequency hopping information (including the number of hopping frequency points and the hopping speed) generated by the carrier frequency spread code numerically controlled oscillator 204, and the carrier frequency spread code numerically controlled oscillator 204 further receives the carrier frequency hopping information (including the number of hopping frequency points and the hopping speed) generated by the hopping frequency point generation module 209, and generates carrier Doppler information according to the carrier dynamic observation variables and the carrier frequency hopping information, and sends it to the Doppler modulation module 207; the spread spectrum modulation module 201 receives the ranging message data required for testing generated by the data simulation system and the spread spectrum code generated by the spread spectrum code numerically controlled oscillator 203, and uses the spread spectrum code to perform direct sequence spread spectrum modulation on the ranging message data, and generates a spread spectrum modulation signal and sends it to the digital baseband filtering module 206; and the digital baseband filtering module 206 generates a baseband signal according to the spread spectrum modulation signal, performs spurious filtering, and sends it to the Doppler modulation module 207;The Doppler modulation module 207 performs Doppler modulation according to the received carrier Doppler information and the baseband signal, generates a Doppler modulated signal, and sends it to the frequency conversion module 208. The frequency conversion module 208 performs up-conversion and analog-to-digital conversion on the received Doppler modulated signal, generates a required intermediate frequency signal, and sends it to the radio frequency output module 211. The frequency hopping output module 210 receives the carrier frequency hopping information generated by the hopping frequency point generation module 209, generates a frequency hopping signal, and sends it to the radio frequency output module 211. The radio frequency output module 211 performs frequency hopping modulation and up-conversion processing according to the frequency hopping signal and the intermediate frequency signal to generate a radio frequency simulated test signal, i.e., a simulated satellite signal.

[0022] Among them, the simulated satellite signal received by the navigation chip is added with several time-varying time delays, the expression of the ranging message data is C(t), the modulating spread spectrum code is S(t), and the overall time delay τ(t) is the path time delay T d and Doppler time delay τ d That is, τ(t)=T d +τ d Assuming that, the initial phase of the carrier is set to 0, and the time delay τ(t) is added to the generated ranging message data C(t) and the spread spectrum code S(t) in the spread spectrum modulation module 201, and the Doppler information generated by the carrier spread spectrum code numerically controlled oscillator 204 is ω c τ(t), and the baseband signal is divided into two in the Doppler modulation module 207, and each is converted to cos[ω c τ(t)] and sin[ω c τ(t)] and Doppler modulated and sent to the frequency conversion module 208, thereby generating an intermediate frequency signal JPEG0007680807000002.jpg14161, Wherein, D(t) is the intermediate frequency signal generated by the frequency conversion module 208, Pt is the power of the intermediate frequency signal, t represents the current time, C(t-τ(t)) represents the ranging message data with a time delay, S(t-τ(t)) represents the spread spectrum code with a time delay, and ω c indicates the carrier angular frequency.

[0023] The frequency hopping signal output by the frequency hopping output module 210 is expressed as cos(ω h t), in which case the radio frequency synthetic test signal generated by the radio frequency output module 211 is D(t)cos(ω h t).

[0024] The ranging message data includes a ranging code and a navigation message, and the simulated satellite position information and satellite ground distance information can be obtained by decoding the ranging message data.

[0025] In addition, the system in the above embodiment further includes a transport device 4, which is used to sequentially transport the navigation chips waiting for testing to the corresponding decoding test bench 31 according to a test order to perform the decoding test, and sequentially transport the navigation chips waiting for testing located at the decoding test benches and having completed the decoding test to the positioning test bench 32. After the navigation chips have completed the positioning test at the positioning test bench 32, the transport device 4 removes them from the positioning test bench 32.

[0026] Furthermore, the test device 1 is connected to a signal source 2, and is used to control the signal source 2 to simultaneously and continuously transmit different simulated satellite signals through different ports to the decoding test bench; The test-waiting navigation chip decodes the received simulated satellite signals, and the resulting decoded data includes satellite position information and satellite ground distance information.

[0027] Each of the navigation chips to be tested respectively decodes three simulated satellite signals, and the testing device 1 verifies the three corresponding decoded data for the same navigation chip to be tested, that is, verifies whether the decoded data is accurate; The test device 1 and the navigation chip waiting to be tested perform positioning calculations according to the decoded data of the three simulated satellite signals, and obtain first positioning information and second positioning information.

[0028] Specifically, the test device 1 sends a control command to the signal source 2, the signal source 2 generates different simulated satellite signals based on the control command, and sends them to the decoding test bench through different ports; the test device 1 controls the navigation chip in the decoding test bench to be in a decoding state, receives the decoded data of the navigation chip, performs verification and positioning calculation on the decoded data, obtains the verification result and the first positioning information, controls the navigation chip located at the positioning test bench to be in a positioning calculation state, the navigation chip located at the positioning test bench performs positioning calculation based on the decoded data, obtains the second positioning information and sends it to the test device 1, the test device 1 compares the first positioning information with the second positioning information and determines the test result; if all the decoded data and the positioning calculation are not accurate, the navigation chip does not pass the test.

[0029] Referring to FIG. 3, in some embodiments, the decoding test bench 31 includes a first decoding test bench 31a, a second decoding test bench 31b, and a third decoding test bench 31c, and the signal source 2 includes a first port, a second port, and a third port; Among them, the first port, the second port and the third port are used for transmitting the first simulated satellite signal, the second simulated satellite signal and the third simulated satellite signal generated by the signal source to the first decoding test bench, the second decoding test bench and the third decoding test bench, respectively; the first decoding test bench, the second decoding test bench and the third decoding test bench are used for receiving a decoding control signal from a test device, and the navigation chips waiting to be tested placed in the first decoding test bench, the second decoding test bench and the third decoding test bench perform a decoding operation according to the decoding control signal.

[0030] The signal source 2 simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits them to the first decoding test bench 31a, the second decoding test bench 31b, and the third decoding test bench 31c through the first port, the second port, and the third port, respectively. During the testing process, the first simulated satellite signal, the second simulated satellite signal, and the third simulated satellite signal are continuously transmitted to the first decoding test bench 31a, the second decoding test bench 31b, and the third decoding test bench 31c through the first port, the second port, and the third port.

[0031] The transport device 4 transports the navigation chip to be tested to a first decoding test bench, the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits it to the test device 1, the test device 1 verifies and stores the first decoded data of the navigation chip to be tested; After the navigation chip to be tested generates the first decoded data, the transport device 4 transports the navigation chip to be tested in the first decoding test bench 31a to the second decoding test bench 31b, and the navigation chip to be tested receives and decodes the second simulated satellite signal, generates and stores the second decoded data, and transmits it to the test device 1, and the test device 1 verifies and stores the second decoded data of the navigation chip to be tested; The transport device 4 transports the navigation chip waiting to be tested in the second decoding test bench 31b to the third decoding test bench 31c, and the navigation chip waiting to be tested receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to the test device 1; The transportation device 4 transports the navigation chip awaiting test in the third decoding test bench 31c to the positioning test bench 32, and the navigation chip awaiting test calculates and obtains second positioning information based on the stored first decoded data, second decoded data and third decoded data, and transmits it to the test device 1.

[0032] Furthermore, the transport device 4 transports the first navigation chip waiting for testing in the first decoding test bench 31a to the second decoding test bench 31b, and then transports the second navigation chip waiting for testing to the first decoding test bench 31a so as to decode, transmit, and store the first simulated satellite signal; After the first navigation chip awaiting test and the second navigation chip awaiting test complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal, respectively, the transport device 4 transports the first navigation chip awaiting test to the third decoding test bench 31c, transports the second navigation chip awaiting test to the second decoding test bench 31b, and transports the third navigation chip awaiting test to the first decoding test bench 31a; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmission and storage of the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal, respectively, the transportation device 4 transports the first navigation chip awaiting test to the positioning test bench 32, the second navigation chip awaiting test to the third decoding test bench 31c, the third navigation chip awaiting test to the second decoding test bench 31b, and the fourth navigation chip awaiting test to the first decoding test bench 31a, thereby making an inference.

[0033] The first simulated satellite signal, the second simulated satellite signal and the third simulated satellite signal do not need to be switched, but are continuously transmitted by different ports, so there is no signal establishment time, and one test bench group is adopted to test four navigation chips, assuming that the test decoding time of each navigation chip is 100ms and the transmission time is 100ms, the test time of a single navigation chip is 200ms. If the conventional technology is adopted to test four navigation chips, the first simulated satellite signal has an establishment time of 100ms and a test decoding time of 100ms, the second simulated satellite signal has an establishment time of 100ms and a test decoding time of 100ms, the third simulated satellite signal has an establishment time of 100ms and a test decoding time of 100ms, the transmission time is 400ms, the positioning test is 100ms, and the overall test time is 1100ms, that is, the test time of a single navigation chip is 275ms, which increases the test efficiency by 37.5% without increasing the input of other devices.

[0034] Referring to FIG. 4, in some embodiments, a test method for a navigation chip applied to the above system is provided, the method including: A signal source S1 transmits different simulated satellite signals to the decoding test bench simultaneously and continuously through different ports; (S2) the navigation chip waiting for testing receives and decodes the corresponding simulated satellite signal through the decoding test bench, obtains and stores the decoded data, and sends it to the test device; A test device performs verification and positioning calculation on the decoded data to obtain first positioning information (S3); S4, the navigation chip waiting for testing performs positioning calculation according to the stored decoded data, obtains second positioning information, and sends it to the test device by the positioning test bench to perform positioning test verification.

[0035] Wherein, the system further includes a conveying device, and the method further includes: The transport device further includes sequentially transporting the navigation chips awaiting test to the corresponding decoding test benches according to a test order to perform decoding tests, and sequentially transporting the navigation chips awaiting test that are located at the decoding test benches and have completed the decoding tests to the positioning test benches.

[0036] the decoding test bench comprises a first decoding test bench, a second decoding test bench, and a third decoding test bench; the signal source comprises a first port, a second port, and a third port; a signal source simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits the first simulated satellite signal, the second simulated satellite signal, and a third simulated satellite signal to the first decoding test bench, the second decoding test bench, and the third decoding test bench through a first port, a second port, and a third port, respectively; The transport device sequentially transports the navigation chips to be tested to the corresponding decoding test benches according to a test order so as to perform a decoding test, and sequentially transports the navigation chips to be tested that are located at the decoding test benches and have completed the decoding test to the positioning test benches. The transport device transports the navigation chip to be tested to a first decoding test bench, and the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the first decoding test bench to a second decoding test bench, and the navigation chip to be tested receives and decodes the second simulated satellite signal, generates and stores second decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the second decoding test bench to a third decoding test bench, and the navigation chip to be tested receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to a test device; The transport device transports the navigation chip awaiting test in the third decoding test bench to the positioning test bench, and the navigation chip awaiting test calculates and obtains second positioning information based on the stored first decoded data, second decoded data and third decoded data, and transmits it to the test device.

[0037] the transport device transports the first navigation chip waiting for testing in the first decoding test bench to the second decoding test bench, and then transports the second navigation chip waiting for testing to the first decoding test bench to decode, transmit and store the first simulated satellite signal; After the first navigation chip waiting to be tested and the second navigation chip waiting to be tested complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal respectively, the transport device transports the first navigation chip waiting to be tested to a third decoding test bench, transports the second navigation chip waiting to be tested to the second decoding test bench, and transports the third navigation chip waiting to be tested to the first decoding test bench; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmitting and storing the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal, respectively, the transportation device transports the first navigation chip awaiting test to the positioning test bench, transports the second navigation chip awaiting test to the third decoding test bench, transports the first navigation chip awaiting test to the second decoding test bench, and transports the fourth navigation chip awaiting test to the first decoding test bench.

[0038] The specific operating principle is to be referred to in the embodiment of the system and will not be described repeatedly here.

[0039] The test system and method for the navigation chip according to the above embodiment at least includes: (1) It can simultaneously perform decoding and positioning tests for a large number of navigation chips, without the need for the signal source to switch signals, and without adding other devices, which effectively reduces the test time, improves the test efficiency, and effectively reduces production costs; (2) The beneficial effect is that Doppler time delay information is introduced into the designed signal source, providing a more accurate simulated satellite signal for testing, thereby improving test accuracy.

[0040] Although the preferred embodiments of the present invention have been described above, once a person skilled in the art knows the basic creative concept, he or she can make other changes and modifications to these embodiments. Therefore, the appended claims should be interpreted to include the preferred embodiments and all changes and modifications that fall within the scope of the present invention. It is obvious that a person skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and modifications of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and modifications.

Claims

1. The present invention comprises a test device, a signal source, and at least one test bench group, which is equipped with a decoding test bench and a positioning test bench and is used for mounting a navigation chip to be tested, the signal source is respectively connected to each decoding test bench by a port, and transmits different simulated satellite signals to the decoding test bench simultaneously and continuously by different ports, the navigation chip to be tested mounted on the decoding test bench receives and decodes the corresponding simulated satellite signal, obtains and stores the decoded data, and transmits it to the test device by the decoding test bench, the test device performs verification and positioning calculation on the decoded data, and obtains first positioning information, the navigation chip to be tested mounted on the positioning test bench performs positioning calculation according to the stored decoded data, obtains second positioning information, and transmits it to the test device by the positioning test bench, so as to perform positioning test verification; 13. A test system for a navigation chip comprising:

2. Further, a transport device is used for sequentially transporting the navigation chips waiting for testing to the corresponding decoding test benches according to a test order so as to perform a decoding test, and sequentially transporting the navigation chips waiting for testing that are located at the decoding test benches and have completed the decoding test to the positioning test benches.

2. The system of claim 1 .

3. the test device is connected to the signal source and is used to control the signal source to simultaneously and continuously transmit different simulated satellite signals through different ports to a decoding test bench; 2. The system of claim 1 .

4. Each of the navigation chips to be tested decodes three simulated satellite signals, and the test device verifies the three corresponding decoded data for the same navigation chip to be tested; The testing device and the navigation chip waiting for testing perform positioning calculation according to the decoded data of the three simulated satellite signals to obtain first positioning information and second positioning information respectively; 3. The system of claim 2.

5. the decoding test bench comprises a first decoding test bench, a second decoding test bench, and a third decoding test bench; the signal source comprises a first port, a second port, and a third port; a signal source simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits the first simulated satellite signal, the second simulated satellite signal, and a third simulated satellite signal to the first decoding test bench, the second decoding test bench, and the third decoding test bench through a first port, a second port, and a third port, respectively; The transport device transports the navigation chip to be tested to a first decoding test bench, and the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the first decoding test bench to a second decoding test bench, and the navigation chip to be tested receives and decodes the second simulated satellite signal, generates and stores second decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the second decoding test bench to a third decoding test bench, and the navigation chip to be tested receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to a test device; The transport device transports the navigation chip to be tested in the third decoding test bench to the positioning test bench, and the navigation chip to be tested calculates and obtains second positioning information according to the first decoded data, the second decoded data and the third decoded data stored therein, and transmits the second positioning information to the test device.

3. The system of claim 2.

6. the transport device transports the first navigation chip waiting for testing in the first decoding test bench to the second decoding test bench, and then transports the second navigation chip waiting for testing to the first decoding test bench to decode, transmit and store the first simulated satellite signal; After the first navigation chip awaiting test and the second navigation chip awaiting test complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal respectively, the transport device transports the first navigation chip awaiting test to a third decoding test bench, transports the second navigation chip awaiting test to the second decoding test bench, and transports the third navigation chip awaiting test to the first decoding test bench; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmitting and storing the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal respectively, a transport device transports the first navigation chip awaiting test to a positioning test bench, transports the second navigation chip awaiting test to a third decoding test bench, transports the third navigation chip awaiting test to the second decoding test bench, and transports the fourth navigation chip awaiting test to the first decoding test bench.

6. The system of claim 5.

7. The system according to any one of claims 1 to 6, a signal source simultaneously and continuously transmitting different simulated satellite signals through different ports to a decoding test bench; The navigation chip to be tested receives and decodes the corresponding simulated satellite signal through the decoding test bench, obtains and stores the decoded data, and sends it to the test device; a test device performing verification and positioning calculation on the decoded data to obtain first positioning information; The navigation chip waiting for testing performs positioning calculation according to the stored decoded data, obtains second positioning information, and sends the second positioning information to the test device by the positioning test bench to perform positioning test verification.

13. A testing method for a navigation chip comprising:

8. The system further comprises a conveying device; The method comprises: The transport device further includes: sequentially transporting the navigation chips to be tested to the corresponding decoding test benches according to a test order to perform a decoding test; and sequentially transporting the navigation chips to be tested that are located at the decoding test benches and have completed the decoding test to the positioning test benches.

8. The method of claim 7.

9. the decoding test bench comprises a first decoding test bench, a second decoding test bench, and a third decoding test bench; the signal source comprises a first port, a second port, and a third port; a signal source simultaneously generates a first simulated satellite signal, a second simulated satellite signal, and a third simulated satellite signal, and transmits the first simulated satellite signal, the second simulated satellite signal, and a third simulated satellite signal to the first decoding test bench, the second decoding test bench, and the third decoding test bench through a first port, a second port, and a third port, respectively; The transport device sequentially transports the navigation chips to be tested to the corresponding decoding test benches according to a test order to perform a decoding test, and sequentially transports the navigation chips to be tested that are located at the decoding test benches and have completed the decoding test to the positioning test bench. The transport device transports the navigation chip to be tested to a first decoding test bench, and the navigation chip to be tested receives and decodes the first simulated satellite signal, generates and stores first decoded data, and transmits the first decoded data to a test device; The transport device transports the navigation chip waiting for testing in the first decoding test bench to a second decoding test bench, and the navigation chip waiting for testing receives and decodes the second simulated satellite signal, generates and stores second decoded data, and transmits it to a test device; The transport device transports the navigation chip waiting for testing in the second decoding test bench to a third decoding test bench, and the navigation chip waiting for testing receives and decodes the third simulated satellite signal, generates and stores third decoded data, and transmits it to a test device; The transport device transports the navigation chip waiting to be tested in the third decoding test bench to the positioning test bench, and the navigation chip waiting to be tested calculates and obtains second positioning information according to the first decoded data, the second decoded data and the third decoded data stored therein, and transmits the second positioning information to the test device.

9. The method of claim 8.

10. the transport device transports the first navigation chip waiting for testing in the first decoding test bench to the second decoding test bench, and then transports the second navigation chip waiting for testing to the first decoding test bench to decode, transmit and store the first simulated satellite signal; After the first navigation chip awaiting test and the second navigation chip awaiting test complete decoding, transmitting and storing the second simulated satellite signal and the first simulated satellite signal respectively, the transport device transports the first navigation chip awaiting test to a third decoding test bench, transports the second navigation chip awaiting test to the second decoding test bench, and transports the third navigation chip awaiting test to the first decoding test bench; After the first navigation chip awaiting test, the second navigation chip awaiting test and the third navigation chip awaiting test complete decoding, transmitting and storing the third simulated satellite signal, the second simulated satellite signal and the first simulated satellite signal respectively, a transport device transports the first navigation chip awaiting test to a positioning test bench, transports the second navigation chip awaiting test to a third decoding test bench, transports the third navigation chip awaiting test to the second decoding test bench, and transports the fourth navigation chip awaiting test to the first decoding test bench.

10. The method of claim 9.

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