Quality factor estimation method, operation condition change method, model generation method, quality factor estimation device, and operation condition change device
The method accurately estimates quality defect factors by analyzing operational variables' contribution, addressing the inaccuracy of existing models by comparing model accuracy and physical mechanisms to adjust manufacturing conditions effectively.
Patent Information
- Application Number
- JP2024569878
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2023-07-31
- Filing Date
- 2024-07-29
- Publication Date
- 2025-08-05
- Estimated Expiration
- 2044-07-29
AI Technical Summary
Existing methods for predicting quality defects in manufacturing processes using mathematical models often generate localized regions that contradict the physical mechanism of defect occurrence, leading to inaccurate estimation of defect factors.
A quality factor estimation method that involves acquiring quality and operation data, creating quality evaluation data, determining variable importance, and identifying operational variables as major factors through model comparison and probabilistic evaluation to accurately estimate defect causes.
Enables accurate estimation of quality defect factors by identifying operational variables that significantly contribute to defects, allowing for precise adjustment of manufacturing conditions to reduce defect occurrence.
Smart Images

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Abstract
Description
[Technical Field]
[0001] The present disclosure relates to a quality factor estimation method, an operation condition changing method, a model generation method, a quality factor estimation device, and an operation condition changing device. [Background technology]
[0002] In manufacturing processes where operational conditions determine quality, there are known methods for predicting quality from operational conditions. For example, there are methods for predicting quality using a physical model constructed based on knowledge of the mechanisms by which quality defects occur, and methods for predicting quality by applying a multiple regression model or a decision tree model using operational data and quality data. In methods that use models, the operational data of the product is input into the model to calculate a predicted value for quality, and the model can be evaluated by evaluating the predicted value.
[0003] For example, Patent Document 1 discloses a method for modeling an operation variable space, which uses operation data as a basis vector, by dividing it into several local regions based on operation data and quality data. An activity function is calculated from the operation data, which expresses the contribution rate, indicating the degree to which each local relational expression expressing the model affects overall quality, as a function of coordinates in the operation variable space. A mathematical model expressing the relationship between overall operation variables and quality is then derived. If the error of the mathematical model does not satisfy the set convergence criteria, the number of divisions of the operation variable space is increased, and operation variables to be used in the local relational expressions are selected using a stepwise method. The processes of increasing the number of divisions of the operation variable space, constructing local relational expressions, selecting variables, and constructing the activity function are repeated until the convergence criteria are satisfied. [Prior art documents] [Patent documents]
[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2012-27683 Summary of the Invention [Problem to be solved by the invention]
[0005] The method of Patent Document 1 determines the number of divisions based on a convergence test calculated from the model error. The division points that determine the division pattern are determined, for example, by extracting data for one operational variable, dividing the data into multiple groups, determining the values of the operational variables that form the boundaries between each group, and then calculating these values for all operational variables. Specifically, a clustering method or values manually set by an operator are used. However, the method of determining the number of divisions and division points disclosed in Patent Document 1 may generate localized regions in the derived mathematical model that represents the relationship between the overall operational variables and quality, which may contradict the mechanism of occurrence of the quality defect being predicted. Because the operational variables selected within the localized regions may also contradict the physical mechanism of occurrence, even if the mathematical model has high accuracy, there is a problem in that the quality defect factors estimated from the constructed mathematical model do not match the mechanism of occurrence of the quality defect.
[0006] In view of the above circumstances, an object of the present disclosure is to provide a quality factor estimation method, an operating condition changing method, a model generation method, a quality factor estimation device, and an operating condition changing device that can estimate quality defect factors with high accuracy. [Means for solving the problem]
[0007] (1) A quality factor estimation method according to an embodiment of the present disclosure includes: A quality factor estimation method executed by a quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition step of acquiring quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition step of acquiring operation data of the manufacturing process; a quality evaluation data creation step of creating m types of quality evaluation data, each of which is composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality, for each of the m types of quality defects; a variable importance determination step of obtaining m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determining variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; and a defect factor estimation step of identifying the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models.
[0008] (2) As one embodiment of the present disclosure, in (1), The defect factor estimation step inputs the quality evaluation data used in generating one model and the quality evaluation data used in generating another model into one of the m types of models, and if the difference in accuracy rate of the prediction results is greater than a predetermined value, identifies the operational variable that is estimated to be the main cause of the quality defect corresponding to the one model.
[0009] (3) As an embodiment of the present disclosure, in (1) or (2), The defect factor estimation step searches for an operation variable that commonly has a high variable importance in the corresponding model for two or more types of quality defects out of the m types of quality defects, and identifies the operation variable by regarding the searched operation variable as a common factor of the corresponding quality defects.
[0010] (4) As an embodiment of the present disclosure, in any one of (1) to (3), The defect factor estimation step selects, for at least one of the m types of quality defects, a candidate operational variable that is estimated to be a major factor based on the variable importance, and further uses performance data that indicates the relationship between the quality defects and the operational variables to probabilistically evaluate the relationship between the selected candidate variable and the quality defects, thereby identifying the operational variable that is estimated to be a major factor.
[0011] (5) An operating condition changing method according to an embodiment of the present disclosure includes: The method includes an operation condition change instruction step of changing the operation conditions by a change instruction for the operation variables identified by the quality factor estimation method of (3) or (4).
[0012] (6) A model generation method according to an embodiment of the present disclosure includes: A model generation method for generating a model used in any one of the quality factor estimation methods (1) to (4), a step of using the quality evaluation data corresponding to the one quality defect as learning data in which the quality of the product is used as a target variable and operation variables included in the operation data are used as explanatory variables, and generating a model corresponding to the one quality defect by machine learning using the learning data; The m types of models are generated by executing the step of generating the model for each of the m types of quality defects.
[0013] (7) A quality factor estimation device according to an embodiment of the present disclosure, A quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition unit that acquires quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition unit that acquires operation data of the manufacturing process; a quality evaluation data creation unit that creates, for each of the m types of quality defects, m types of quality evaluation data that are composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality; a variable importance determination unit that acquires m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determines variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; and a defect factor estimation unit that identifies the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models.
[0014] (8) As an embodiment of the present disclosure, in (7), The defect factor estimation unit inputs the quality evaluation data used in generating one model and the quality evaluation data used in generating another model into one of the m types of models, and if the difference in the accuracy rate of the prediction results is greater than a predetermined value, identifies the operational variable that is estimated to be the main cause of the quality defect corresponding to the one model.
[0015] (9) As an embodiment of the present disclosure, in (7) or (8), The defect factor estimation unit searches for operation variables that commonly have high variable importance in the corresponding models for two or more types of quality defects out of the m types of quality defects, and identifies the operation variables by regarding the searched operation variables as common factors of the corresponding quality defects.
[0016] (10) As an embodiment of the present disclosure, in any one of (7) to (9), The defect factor estimation unit selects, for at least one of the m types of quality defects, a candidate operational variable that is estimated to be a major factor based on the variable importance, and further uses performance data that indicates the relationship between the quality defects and the operational variables to probabilistically evaluate the relationship between the selected candidate variable and the quality defects, thereby identifying the operational variable that is estimated to be a major factor.
[0017] (11) An operating condition changing device according to an embodiment of the present disclosure includes: The quality factor estimation device (9) or (10) further includes an operational condition change instruction unit that changes the operational conditions by issuing a change command for the operational variables identified by the quality factor estimation device (9) or (10). [Effects of the Invention]
[0018] According to the present disclosure, it is possible to provide a quality factor estimation method, an operating condition changing method, a model generation method, a quality factor estimation device, and an operating condition changing device that can estimate quality defect factors with high accuracy. [Brief explanation of the drawings]
[0019] [Figure 1] FIG. 1 is a block diagram illustrating an example configuration of a quality factor estimation device according to an embodiment of the present disclosure. [Figure 2] FIG. 2 is a diagram illustrating an example of changes in the accuracy rate of prediction. [Figure 3] Figure 3 shows the operational variables of the steelmaking model arranged in order of variable importance. [Figure 4] Figure 4 shows the operational variables of the hot rolling model arranged in order of variable importance. [Figure 5] FIG. 5 is a diagram showing the relationship between the incidence rate of steelmaking defects, the total length of the coils analyzed, and the factors of steelmaking defects and estimated operational variables. DETAILED DESCRIPTION OF THE INVENTION
[0020] Hereinafter, a quality factor estimation method, an operating condition changing method, a model generation method, a quality factor estimation device 10 (see FIG. 1), and an operating condition changing device according to embodiments of the present disclosure will be described with reference to the drawings. The quality factor estimation method and quality factor estimation device 10 according to the present embodiment use a model (mathematical model) generated to predict product quality in a manufacturing process for producing a product. The model is generated (constructed) by the model generation method according to the present embodiment. The quality factor estimation method and quality factor estimation device 10 according to the present embodiment can be used in all processes in which operations determine quality, and by showing the relationship between multiple operating conditions and product quality, they are useful in identifying the causes of product defects.
[0021] FIG. 1 is a block diagram showing an example of the configuration of a quality factor estimation device 10 according to this embodiment. The quality factor estimation device 10 is used in a manufacturing process for manufacturing a product. Furthermore, the processing flow shown by arrows, with each block in FIG. 1 treated as a process, represents a method (quality factor estimation method) for estimating the cause of a quality defect in a product in the manufacturing process according to this embodiment. The quality factor estimation method is executed by the quality factor estimation device 10.
[0022] For example, if the manufacturing process is a steel manufacturing process, the operational data may include a thermocouple temperature in a continuous casting process and a furnace temperature in a hot rolling process. The operational data may be given as a continuous value, a discrete value, or a categorical value. For example, if the manufacturing process is a steel manufacturing process, the quality data may be the type of quality defect and may be given as a categorical value.
[0023] Here, the operation data and the quality data may be associated with one product, or may be associated with each of a plurality of parts in one product. In this embodiment, one product is divided into N regions. Each region is assigned a quality variable a as quality data and an operation variable b = [b1, b2, ..., b p ] data is given. Quality variable a is a label that indicates m types of quality defects or no quality defects (normal quality). m is 2 or more. In other words, there are two or more types. Therefore, a data set corresponding to one product can be obtained by collecting quality data and operational data in each of N areas, and can be expressed as a matrix of N rows and (1 + p) columns. Here, it is not necessary to divide one product into multiple areas as described above; for example, N can be 1. In other words, N is an integer greater than or equal to 1. Furthermore, since there are multiple operational variables b, p is an integer greater than or equal to 2.
[0024] In each of the N regions, the quality variable a corresponds to the operation variable b, and can generally be expressed as a = f(b) using a mapping function f. In this disclosure, poor quality or normal quality (good quality) is predicted by a model (F) that uses the operation variable b as an explanatory variable and the quality variable a as a target variable.
[0025] The model (F) used for prediction generally represents a complex function in the entire space consisting of operational data, and is not a relational expression that is easy for humans to understand. Therefore, in this disclosure, we will use a model (F1, F2, ..., F) that classifies normal quality and quality defects for each of m types of quality defects. m ) is defined. One model (F i ) is used to classify (predict) that one quality defect from normal quality. i ) has a variable importance that indicates the magnitude of the contribution of each element of the operational variable b. Here, when indicating one of m types of quality defects, it may be expressed as quality defect (i). The model corresponding to quality defect (i) is model (F i )
[0026] As shown in FIG. 1 , the quality factor estimation device 10 includes a quality data acquisition unit 100, an operation data acquisition unit 101, a quality evaluation data creation unit 102, a variable importance determination unit 103, and a defect factor estimation unit 104. As in the present embodiment, the quality factor estimation device 10 may include an operation condition change instruction unit 105. The quality factor estimation device 10 may further include a storage unit (storage device) that stores, for example, quality data, operation data, and a model. The storage unit may include any storage device such as a semiconductor storage device, an optical storage device, or a magnetic storage device. The quality factor estimation device 10 may further include a model generation unit that executes a model generation method when generating a model.
[0027] The quality factor estimation apparatus 10 acquires quality data and operation data from the operation data server 60. The operation data server 60 can communicate with the quality factor estimation apparatus 10 via a network and may be implemented, for example, by a computer that manages a manufacturing process. The network is, for example, the Internet. In this embodiment, the display unit 30 displays the model evaluation results and the contributions of explanatory variables output from the quality factor estimation apparatus 10. For example, images such as those shown in FIGS. 2 to 4 (described later) may be displayed on the display unit 30 as the model evaluation results and the contributions of explanatory variables. The quality factor estimation apparatus 10 may be implemented by a computer separate from the operation data server 60. The display unit 30 may be a device through which an operator working in the manufacturing process can obtain information. The display unit 30 may be a display device such as a liquid crystal display (LCD) or an organic electroluminescence panel (OLED). The display unit 30 may also be a touch panel display and may be used as an input unit through which an operator can issue instructions to change operational conditions (described later) based on the displayed information. The display unit 30 may be realized by a display of a terminal device such as a smartphone or a tablet, etc. The terminal device may also be a small computer such as a PC (Personal Computer).
[0028] As described above, the quality factor estimation device 10 can be realized by, for example, a computer. The computer includes, for example, a memory, a hard disk drive (storage device), and a CPU (processing device). The program can be stored in the hard disk drive, and when executed by the CPU, it is read from the hard disk drive to the memory. The quality data acquisition unit 100, the operation data acquisition unit 101, the quality evaluation data creation unit 102, the variable importance determination unit 103, and the defect factor estimation unit 104 may be realized by, for example, a CPU that reads and executes a program. Furthermore, when the quality factor estimation device 10 includes a model generation unit, the model generation unit may be realized by, for example, a CPU that reads and executes a program.
[0029] The quality data acquiring unit 100 executes a process (quality data acquiring step) of acquiring quality data indicating the quality of the product for m types of quality defects. In this embodiment, the quality data acquiring unit 100 receives information from a database (operation data server 60) in which quality data associated with the above-mentioned arbitrary areas is accumulated, and collects the data as one database or tabular data.
[0030] The operation data acquisition unit 101 executes a process of acquiring operation data of the manufacturing process (operation data acquisition step). In this embodiment, the operation data acquisition unit 101 receives information from a database (operation data server 60) in which operation data associated with the above-mentioned arbitrary area is accumulated, and collects the data as one database or tabular data.
[0031] The quality evaluation data creation unit 102 executes a process of creating quality evaluation data for each of the m types of quality defects (quality evaluation data creation step). The quality evaluation data for one quality defect is configured as a group of operation data corresponding to that one quality defect. In this embodiment, the quality evaluation data includes operation data corresponding to quality data indicating that the quality corresponds to that one quality defect and operation data corresponding to quality data indicating that the quality does not correspond to that one quality defect (normal quality). For example, if the quality defect is a defect, the quality evaluation data is configured to include operation data when an area (an area into which the product is divided) that has a defect and is determined to be of poor quality is manufactured, and operation data when an area without a defect and is determined to be of normal quality is manufactured.
[0032] The variable importance determination unit 103 acquires m types of models and executes a process (variable importance determination step) of determining variable importance indicating the magnitude of contribution of the operation variable b for each of the m types of models. In other words, the variable importance determination unit 103 determines variable importance for each quality defect. The m types of models are models for predicting each of the m types of quality defects, and are generated using quality evaluation data with the product quality as the objective variable and the operation variable b included in the operation data as the explanatory variable. The variable importance determination unit 103 may acquire the m types of models by, for example, reading out the m types of models stored in the storage unit. The m types of models are obtained by using m models (F1, F2, ..., F) that classify the target quality defect and normal quality for each of the m types of quality defects. m ) and the quality assessment data (D1, D2, ..., D m ) and variable importance (FI1, FI2, ..., FI m ) has a model (F i ) is the quality evaluation data corresponding to the quality evaluation data (D i ) is sometimes expressed as quality evaluation data (D i ) is the model (F1,F2,…,F m ) and is used to evaluate the model (F i ) is also used as model generation data (training data) to generate the model (F i ) variable importance is calculated as variable importance (FI i ) can be expressed as follows.
[0033] Here, the generation of the model may be performed by a model generation device different from the quality factor estimation device 10, or may be performed by the quality factor estimation device 10. As described above, when the quality factor estimation device 10 generates a model, the quality factor estimation device 10 may further include a model generation unit. For example, the model generation device or the model generation unit generates quality evaluation data (D i ) is used as learning data with product quality as the objective variable and operation variable b included in the operation data as the explanatory variable. The model generation device or model generation unit uses the learning data to generate a model (Fi The model generation device or the model generation unit generates a model (F i ) for each of the m types of quality defects, m types of models (F1, F2, ..., F m ), where the model may be a machine learning model including a deep learning model, a decision tree, etc.
[0034] In addition, variable importance (FI i ) are p operational conditions, i.e., operational variables b=[b1,b2,…,b p ] indicates the degree of influence on the prediction of quality defects (i) (quality judgment). i ) may be calculated using a general-purpose method for calculating important predictive factors that does not depend on the algorithm for creating a numerical model, such as Permutation Importance. i ) may be calculated in other ways. Here, the model (F i ) may be a trained model by machine learning as in this embodiment, but is not limited to this. i ) is a linear regression model, for example, i ) may be calculated from the partial regression coefficients and the values of the explanatory variables. The variable importance determination unit 103 calculates the variable importance for the p operating conditions by any method, and determines the order of magnitude of the variable importance (the magnitude of the influence on the quality judgment) (see FIGS. 3 and 4). Here, the variable importance may be any numerical value that allows for a relative comparison of magnitude, and may be a value in an arbitrary unit.
[0035] The defect factor estimation unit 104 compares the variable importance of the m types of models to identify an operation variable b that is estimated to be a major factor for at least one of the m types of quality defects. i ) for which a specific operating condition among p operating conditions is ranked high in the variable importance, and the model (F iIf a specific operational condition is not ranked highly in the variable importance in any model other than model (F), the specific operational condition can be estimated as a major factor in the quality defect (i). In addition, the defect factor estimation unit 104 may search for an operational variable that is commonly ranked highly in the variable importance of the corresponding model for two or more types of quality defects among the m types of quality defects, and may identify the operational variable b by regarding the searched operational variable as a common factor in the corresponding quality defects. i ) for which a specific operating condition among p operating conditions is ranked high in the variable importance, and the model (F i When a specific operating condition ranks high in variable importance even in models other than m, the specific operating condition can be estimated as a common factor. The defect factor estimation unit 104 can estimate the factors of quality defects with high accuracy by comparing the variable importance of m types of models. Here, the process in which the defect factor estimation unit 104 estimates the factors of quality defects by comparing the variable importance of m types of models is sometimes referred to as a defect factor estimation step.
[0036] Here, the defect factor estimation unit 104 generates a model (F i ) may be evaluated. The evaluation index may be, for example, the accuracy rate (Accuracy) used to evaluate machine learning models. Accuracy is calculated by defining a confusion matrix of good / bad classifications that indicate actual good / bad products and the truth or falsity of predictions made by the model, and using each classification of true positive (TP), false positive (FP), false negative (FN), and true negative (TN). The calculation formula is Accuracy = ((TP + TN) / (TP + TN + FP + FN)).
[0037] The defect factor estimation unit 104 uses the model (F i ), the model (F j The quality assessment data (D j ) to obtain the difference in the evaluation index (ΔR). In this embodiment, the evaluation index is the accuracy rate. The difference in the evaluation index (ΔR) is calculated by inputting the model (F i ) to model (F i The quality assessment data (D i ) is input, the accuracy rate isi ) to another model (F j The quality assessment data (D j ) is input. In other words, the difference in the evaluation index (ΔR) is the accuracy rate when the model (F i ) is the difference in the accuracy rate of the prediction result for quality defect (i) by the model (F). Here, j is an integer between 1 and m, different from i. When the magnitude of the difference in the evaluation index (ΔR) is greater than a predetermined value, the defect factor estimation unit 104 i ) may be specified. The predetermined value is not limited to a specific value, but when the evaluation index is the accuracy rate as in this embodiment, 20% may be used as an example. The larger the absolute value of the difference in the evaluation index (ΔR), the more likely it is that a factor specific to the quality defect (i) is included in the model (F i ) variable importance (FI1, FI2, …, FI m In other words, the smaller the absolute value of the difference in the evaluation index (ΔR), the more likely it is that the common factor between quality defects (i) and quality defects (j) is included in the model (F i ) variable importance (FI1, FI2, …, FI m ), that is, it is considered difficult to identify a factor specific to quality defect (i). The defect factor estimation unit 104 performs such processing using m models (F1, F2, ..., F m ) may be performed for each of
[0038] Furthermore, the defect factor estimation unit 104 may further use performance data indicating the relationship between the m types of quality defects included in the operation data and the operation variable b to identify the operation variable b that is estimated to be the main factor for at least one of the m types of quality defects. The performance data indicating the relationship between the quality defects and the operation variable b may be accumulated, for example, in a database of the operation data server 60, and acquired by the quality factor estimation device 10 as part of the operation data. By using the performance data, the defect factor estimation unit 104 can estimate the quality defect factors with even greater accuracy. Furthermore, the defect factor estimation unit 104 may output the evaluation results of the model and the contribution of the explanatory variables to the display unit 30.
[0039] The method for identifying an operation variable b as a major factor for at least one quality defect (i) among m types of quality defects is performed as follows. First, multiple operation variables are selected as candidate factors based on the variable importance obtained by the defect factor estimation unit 104, which has a factor specific to the quality defect (i) ranked high. The relationship between these operation variables and the quality defect (i) is investigated, and one operation variable that can most likely explain the mechanism by which the quality defect (i) is generated is selected. The criteria for selecting the candidate factors are not limited, but as an example, a predetermined number of operation variables with the highest importance may be selected as candidate factors (candidate variables). The number of selected operation variables may be determined as a ratio, for example, 0.05*p, where p is the number of operation variables. However, one or more variables must be selected. The method for investigating the relationship between the operation variables that are candidate factors and the quality defect (i) is not limited, but as an example, correlation analysis between the probability of occurrence of the quality defect and the operation variables may be used. In other words, a probabilistic evaluation may be performed.
[0040] The quality factor estimation device 10 may further include an operational condition change instruction unit 105. The operational condition change instruction unit 105 outputs an instruction to change the operational variables identified by the defect factor estimation unit 104 as defect factor candidates for the quality defect (i). When the quality factor estimation device 10 includes the operational condition change instruction unit 105, the quality factor estimation device 10 may be referred to as an operational condition change device, focusing on the function of changing the operational conditions by issuing a change instruction to a control device 70 such as a process computer. When the quality factor estimation device 10 is referred to as an operational condition change device, a quality factor estimation method that is executed by the operational condition change device and further includes an operational condition change instruction step of changing the operational conditions by issuing a change instruction may be referred to as an operational condition change method.
[0041] The operational condition change instruction unit 105 outputs a change command when it receives an instruction to change operational conditions from an operator (e.g., an operator). The operational condition change instruction can be input from an input device (such as a keyboard, a pointer such as a mouse, or a touch panel) connected to a terminal device functioning as the display unit 30. In addition to a display for identifying operational variables that are candidate factors for defects, the display unit 30 may also display an input interface for specifying the operational variables to be changed and the method of change. The operator can issue a change command to the control device 70, such as a process computer, by inputting the operational variables to be changed and the method of change into the terminal device while referring to the displayed content. When changing operational variables, the change method may be specified in advance for each operational variable. For example, a table may be created that defines the amount of change per operation for each target quality defect and each operational variable. When an operational variable is specified, the operational condition change instruction unit 105 references the table and outputs a change command. Furthermore, even for a single operational variable, the settings may be stratified according to manufacturing conditions such as the type of manufactured product or the size of the product. In this case, the input interface may be configured so that specific manufacturing conditions can be specified.
[0042] Here, the change of the operational variables by the operational condition change instruction unit 105 may be used only for temporary change of manufacturing conditions (during manufacturing tests). After the manufacturing conditions are determined, the program of the control device 70 such as a process computer may be modified and used in actual operation to determine permanent operational variables.
[0043] (Example) The effects of the present disclosure will be specifically described below based on examples, but the present disclosure is not limited to the contents of the examples.
[0044] An example will be described in which 33 operating conditions related to steelmaking in the steelmaking process, 15 operating conditions related to hot rolling, 5 operating conditions related to cold rolling, and 5 operating conditions related to surface treatment are defined as the operating variables b, and surface defects of automotive exterior panels are used as the quality data to be predicted. The quality data is a categorical variable (categorical value) consisting of four types: "steelmaking defects," "hot rolling defects," "other defects" representing defects other than steelmaking or hot rolling, and "normal" representing no defects. Here, the mechanisms by which steelmaking defects and hot rolling defects occur have been estimated based on past knowledge. The mechanisms by which steelmaking defects and hot rolling defects occur are thought to be different. In this example, two defects are individually identified, which corresponds to the case where the above m types are two.
[0045] The analysis targets a total of 477,236 records of operation data recorded for each meter of 164 coils collected via the process computer (operation data server 60). In the analysis, the collected operation data was standardized so that the mean was 0 and the variance was 1 across the entire range of the data.
[0046] 485 records containing steelmaking defects were extracted, and 485 records were randomly sampled from the 473,178 records containing normal data. The two sets of data were then combined to create steelmaking defect prediction data (one quality evaluation data set). Similarly, 732 records containing hot ductility defects were extracted, and 732 records were randomly sampled from the 473,178 records containing normal data. The two sets of data were then combined to create hot ductility defect prediction data (another quality evaluation data set). The operating conditions (operational variable b) contained in the steelmaking defect prediction data and the hot ductility defect prediction data are common.
[0047] Figure 2 is a diagram showing changes in the accuracy rate of prediction. The accuracy rate of a steelmaking model (one model) generated using steelmaking defect prediction data and the accuracy rate when hot ductility defect prediction data is input into the steelmaking model are shown. Also shown are the accuracy rate of a hot rolling model (another model) generated using hot ductility defect prediction data and the accuracy rate when steelmaking defect prediction data is input into the hot rolling model.
[0048] The accuracy rate of the steelmaking model was 90% when the prediction results were evaluated using data for predicting steelmaking defects, but it was 61% when the prediction results were evaluated using data for predicting hot ductility defects. Because the accuracy rate dropped significantly to 29%, it is thought that the parameters of the steelmaking model are optimized to increase the contribution of explanatory variables that are significantly related only to steelmaking defects to the prediction. Furthermore, the accuracy rate of the hot rolling model was 87% when the prediction results were evaluated using data for predicting hot ductility defects, but it was 73% when the prediction results were evaluated using data for predicting steelmaking defects. While the accuracy rate dropped by 14%, the drop was smaller than that of the steelmaking model.
[0049] A process for estimating the causes of steelmaking defects was performed. Figure 3 shows the variable importance of the steelmaking model. As mentioned above, in the variable importance of the steelmaking model, operational conditions related only to steelmaking defects rank highly in importance. Figure 4 shows the variable importance of the hot rolling model. Operational condition 1, which has the highest variable importance in the steelmaking model, ranks ninth in the hot rolling model. Operational condition 2, which has the second highest variable importance in the steelmaking model, ranks second in the hot rolling model. Furthermore, operational condition 3, which has the third highest variable importance in the steelmaking model, ranks third in the hot rolling model. Because operational conditions 1 to 3 have high variable importance in both the steelmaking model and the hot rolling model, they were estimated to be common factors for steelmaking defects and hot rolling defects, rather than being specific factors for steelmaking defects. Furthermore, operational conditions 4 to 6 were ranked 4th to 6th in variable importance in the steelmaking model, but were highly likely to be factors causing hot ductility defects based on past knowledge (actual data showing the relationship between quality defects and operational variable b), and were therefore excluded from the list of candidates for steelmaking defect factors. Operational conditions 7 and 8, which were ranked 7th and 8th in variable importance in the steelmaking model, were not ranked highly in variable importance in the hot rolling model and were not excluded based on past knowledge, so were determined to be factors particularly related to steelmaking defects. It is also possible to identify factors related to hot ductility defects using a similar method, but in this example, only steelmaking defects were evaluated. Here, operational condition 8 was a specific water volume condition. Because specific water volume is an item that can be experimented with, additional verification was performed.
[0050] Figure 5 shows the frequency distribution according to specific water content in a bar graph, and the relationship with the occurrence rate of steelmaking defects in a line graph. Here, because operational data is recorded for each meter of the coil, the total length of the coil (right vertical axis) is used as the frequency. The occurrence rate of steelmaking defects corresponds to the left vertical axis. It was shown that when the specific water content was 148 L / t, the occurrence rate of steelmaking defects rose sharply to 4%.
[0051] According to past findings, excessive cooling water is sprayed on the edge portions in the width direction of the slab compared to the center portion, which can lead to overcooling. Overcooling can cause slab buckling cracks, which are steelmaking defects. The estimation that the specific water content obtained in this example is particularly related to steelmaking defects was consistent with past findings.
[0052] Based on the analysis results, an experiment was conducted to optimize the cooling pattern in the manufacturing process of automotive outer panels, by reducing the amount of cooling water sprayed on the edge portions in the width direction of the slab and increasing the amount of cooling water sprayed on the center portion in the width direction of the slab. That is, as a manufacturing test, the operational variables were changed by the operational condition change instruction unit 105, and the manufacturing conditions were finally determined. As a result, it was confirmed that overcooling on the edge portions was suppressed and the incidence of steelmaking defects was reduced.
[0053] As described above, the quality factor estimation method, operational condition modification method, model generation method, quality factor estimation device 10, and operational condition modification device according to the present embodiment can estimate quality defect factors with high accuracy by comparing the variable importance of m types of models. Furthermore, the quality factor estimation method, operational condition modification method, model generation method, quality factor estimation device 10, and operational condition modification device according to the present embodiment can present the model evaluation results and the contribution of the explanatory variables to the operator.
[0054] Although the embodiments of the present disclosure have been described based on the drawings and examples, it should be noted that the present disclosure is not limited to the above embodiments, and that those skilled in the art would easily be able to make various modifications or alterations based on the present disclosure. Therefore, it should be noted that these modifications and alterations are included within the scope of the present disclosure. For example, functions included in each component or step can be rearranged so as not to cause logical inconsistencies, and multiple components or steps can be combined or divided into one. The embodiments of the present disclosure can also be realized as a storage medium on which a program executed by a processor included in an apparatus is recorded. It should be understood that these are also included within the scope of the present disclosure. [Explanation of symbols]
[0055] 10 Quality factor estimation device (operation condition change device) 30 Display section 60 Operational Data Server 70 Control Equipment 100 Quality Data Acquisition Department 101 Operational Data Acquisition Unit 102 Quality Evaluation Data Creation Department 103 Variable Importance Determination Unit 104 Defective Cause Estimation Unit 105 Operational Condition Change Instruction Department
Claims
1. A quality factor estimation method executed by a quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition step of acquiring quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition step of acquiring operation data of the manufacturing process; a quality evaluation data creation step of creating m types of quality evaluation data, each of which is composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality, for each of the m types of quality defects; a variable importance determination step of obtaining m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determining variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimating step of identifying the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, The defect factor estimation step inputs the quality evaluation data used in generating one model and the quality evaluation data used in generating another model into one of the m types of models, and, if the magnitude of the difference in accuracy rate of the prediction results is greater than a predetermined value, identifies the operational variable that is estimated to be the main factor of the quality defect corresponding to the one model.
2. A quality factor estimation method executed by a quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition step of acquiring quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition step of acquiring operation data of the manufacturing process; a quality evaluation data creation step of creating m types of quality evaluation data, each of which is composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality, for each of the m types of quality defects; a variable importance determination step of obtaining m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determining variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimating step of identifying the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, The defect factor estimation step is a quality factor estimation method in which, for two or more types of quality defects out of the m types of quality defects, an operation variable that commonly has a high variable importance in a corresponding model is searched for, and the searched operation variable is identified by regarding the operation variable as a common factor of the corresponding quality defects.
3. A quality factor estimation method executed by a quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition step of acquiring quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition step of acquiring operation data of the manufacturing process; a quality evaluation data creation step of creating m types of quality evaluation data, each of which is composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality, for each of the m types of quality defects; a variable importance determination step of obtaining m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determining variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimating step of identifying the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, The defect factor estimation step selects, for at least one type of quality defect out of the m types of quality defects, a candidate operational variable that is estimated to be a major factor based on the variable importance, and further uses performance data that indicates a relationship between the quality defect and the operational variable to probabilistically evaluate a relationship between the selected candidate variable and the quality defect, thereby identifying the operational variable that is estimated to be a major factor.
4. 4. An operational condition changing method, comprising an operational condition change instruction step of changing operational conditions by a change instruction for the operational variables identified by the quality factor estimation method according to claim 2 or 3.
5. A model generation method for generating a model used in the quality factor estimation method according to any one of claims 1 to 3, comprising: the quality evaluation data corresponding to the one quality defect is used as learning data in which the quality of the product is used as a target variable and operation variables included in the operation data are used as explanatory variables, and a model corresponding to the one quality defect is generated by machine learning using the learning data; A model generation method for generating the m types of models by executing a step of generating the model for each of the m types of quality defects.
6. A quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition unit that acquires quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition unit that acquires operation data of the manufacturing process; a quality evaluation data creation unit that creates, for each of the m types of quality defects, m types of quality evaluation data that are composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality; a variable importance determination unit that obtains m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determines variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimation unit that identifies the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, The defect factor estimation unit inputs the quality evaluation data used in generating one model and the quality evaluation data used in generating another model into one of the m types of models, and, when the magnitude of the difference in accuracy rate of the prediction results is greater than a predetermined value, identifies the operational variable that is estimated to be a major factor of the quality defect corresponding to the one model.
7. A quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition unit that acquires quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition unit that acquires operation data of the manufacturing process; a quality evaluation data creation unit that creates, for each of the m types of quality defects, m types of quality evaluation data that are composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality; a variable importance determination unit that obtains m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determines variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimation unit that identifies the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, the defect factor estimation unit searches for an operation variable that commonly has a high variable importance in a corresponding model for two or more types of quality defects out of the m types of quality defects, and identifies the operation variable by regarding the searched operation variable as a common factor of the corresponding quality defects.
8. A quality factor estimation device used in a manufacturing process for manufacturing a product, comprising: a quality data acquisition unit that acquires quality data indicating the quality of the product with respect to normal quality and two or more m types of quality defects; an operation data acquisition unit that acquires operation data of the manufacturing process; a quality evaluation data creation unit that creates, for each of the m types of quality defects, m types of quality evaluation data that are composed of the quality data and the operation data corresponding to the corresponding quality defect and the quality data and the operation data corresponding to the normal quality; a variable importance determination unit that obtains m types of models for predicting each of the m types of quality defects, the m types of models being generated using the quality evaluation data with the product quality as a response variable and operation variables included in the operation data as explanatory variables, and determines variable importance indicating the magnitude of contribution of the operation variables for each of the m types of models; a defect factor estimation unit that identifies the operational variable that is estimated to be a major factor for at least one of the m types of quality defects by comparing the variable importance of the m types of models, the defect factor estimation unit selects, for at least one type of quality defect out of the m types of quality defect, a candidate operational variable that is estimated to be a major factor based on the variable importance, and further uses performance data that indicates a relationship between the quality defect and the operational variable to probabilistically evaluate a relationship between the selected candidate variable and the quality defect, thereby identifying the operational variable that is estimated to be a major factor.
9. 9. An operational condition changing device comprising: an operational condition change instruction unit that changes operational conditions by a change command for the operational variables identified by the quality factor estimation device according to claim 7 or 8.
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