Power supply measurement device

Abstract

To provide a power supply measuring device.SOLUTION: A power supply measuring device includes a current sampling circuit, a voltage sampling circuit, an overvoltage detecting circuit, and a comparing circuit. The current sampling circuit is used to sample a current of device under test. The voltage sampling circuit is used to sample voltage of the device under test. The overvoltage detecting circuit is coupled to the current sampling circuit and the voltage sampling circuit, and receives first operation voltage of the current sampling circuit and second operation voltage of the voltage sampling circuit to generate a detection voltage. The comparing circuit is coupled to the overvoltage detecting circuit, and determines whether the detection voltage is within a voltage range. If the detection voltage is outside the voltage range, the comparing circuit generates an abnormal signal.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] FIELD OF THE DISCLOSURE The present disclosure relates to measurement devices, and more particularly to power supply measurement devices. [Background technology]

[0002] Generally, when a source measure unit (SMU) outputs a force voltage (FV), the four-wire sensing path is connected close to the device under test (DUT) independently of the output force voltage path. However, if the sensing path is interrupted due to improper external connection or vibration, the sense voltage (MV) will be invalid, putting the system into an open circuit state and causing damage to the device under test due to overvoltage.

[0003] Furthermore, in conventional technology, the abnormality detection circuit uses the voltage of the voltage sampling circuit as the basis for determining whether or not the device under test is abnormal. However, if the sensing path is interrupted due to a connection error between the sensing path and the outside world or due to vibration or other circumstances, the voltage of the voltage sampling circuit cannot be obtained, and the abnormality detection circuit cannot operate. Summary of the Invention

[0004] This summary is intended to provide a simplified summary of the disclosure so that the reader can have a basic understanding of the disclosure. This summary is not an exhaustive overview of the disclosure, and is not intended to point out important / key parts of embodiments of the disclosure or to limit the scope of the disclosure.

[0005] One technical aspect of the present disclosure relates to a power supply measurement device, comprising: a current sampling circuit for sampling a current in a circuit under test; a voltage sampling circuit for sampling a voltage in the circuit under test; an overvoltage detection circuit coupled to the current sampling circuit and the voltage sampling circuit, acquiring a first operating voltage of the current sampling circuit and a second operating voltage of the voltage sampling circuit to generate a detection voltage; and a comparison circuit coupled to the overvoltage detection circuit, determining whether the detection voltage is within a voltage range, and generating an abnormality signal if the detection voltage is outside the voltage range.

[0006] In one embodiment, the current sampling circuit includes a first input coupled to the positive voltage terminal of the circuit under test.

[0007] In one embodiment, the voltage sampling circuit includes a second input terminal and a third input terminal. The second input terminal is coupled to the first sensing terminal of the circuit under test. The third input terminal is coupled to the second sensing terminal of the circuit under test. The overvoltage detection circuit is coupled to the first input terminal of the current sampling circuit and the third input terminal of the voltage sampling circuit.

[0008] In one embodiment, when the second input terminal of the voltage sampling circuit and the first sensing terminal of the circuit under test are disconnected, the overvoltage detection circuit obtains the first operating voltage of the first input terminal of the current sampling circuit and the second operating voltage of the third input terminal of the voltage sampling circuit to generate a detection voltage.

[0009] In one embodiment, the current sampling circuit further includes a fourth input terminal and a first subtractor, the fourth input terminal being coupled to the positive voltage terminal of the circuit under test via a resistor, and the first subtractor being coupled to the first input terminal and the fourth input terminal.

[0010] In one embodiment, the voltage sampling circuit further includes a second subtractor coupled to the second input and the third input.

[0011] In one embodiment, the over-voltage detection circuit includes a subtractor for comparing the first operating voltage of the current sampling circuit and the second operating voltage of the voltage sampling circuit to generate a detection voltage.

[0012] In one embodiment, the power supply measurement device further includes an output circuit and a control circuit, the output circuit is coupled to the circuit under test, and the control circuit is coupled to the output circuit and is used to control the output circuit to stop outputting a voltage to the circuit under test based on the abnormal signal.

[0013] In one embodiment, the control circuit is further adapted to control the output circuit to output a minimum current based on the abnormal signal.

[0014] In one embodiment, the control circuit records the circuit under test corresponding to the abnormal signal in a database.

[0015] Therefore, according to the technical content of the present disclosure, the power supply measuring device shown in the embodiment of the present disclosure can obtain different operating voltages from the current sampling circuit and the voltage sampling circuit using the overvoltage detection circuit. In this way, even if the voltage sampling circuit and the circuit under test are disconnected, the overvoltage detection circuit of the present disclosure can still accurately obtain the operating voltage to generate a detection voltage, and the comparison circuit can determine whether the measured object is abnormal based on the detection voltage. [Brief explanation of the drawings]

[0016] To make the above and other objects, features, advantages and embodiments of the present disclosure more clear and understandable, the accompanying drawings are described below. [Figure 1] 1 is a schematic diagram illustrating a power supply measurement device and a circuit under test according to an embodiment of the present disclosure. [Figure 2] 1 is an operational schematic diagram illustrating a power supply measuring device and a circuit under test according to an embodiment of the present disclosure. [Figure 3] 1 is an operational schematic diagram illustrating a power supply measuring device and a circuit under test according to an embodiment of the present disclosure. [Figure 4] 1 is a schematic diagram illustrating a power supply measurement device and a circuit under test according to another embodiment of the present disclosure. In accordance with conventional practice, the various features and components in the drawings are not drawn to scale, and the drawing style is intended to best illustrate the specific features and components relevant to the present disclosure. Furthermore, the same or similar reference numerals are used in different drawings to refer to similar components / elements. DETAILED DESCRIPTION OF THE INVENTION

[0017] To more fully and completely describe the present disclosure, the following description of embodiments and specific examples of the present disclosure is illustrative, but is not the only way to implement or apply the specific examples of the present disclosure. The embodiments include features of multiple specific examples and method steps and sequences for constructing and operating these specific examples. However, the same or equivalent functions and sequences of steps may be achieved using other specific examples.

[0018] Unless otherwise defined herein, scientific and technical terms used herein have the same meaning as commonly understood by those skilled in the art. Also, unless conflicting with context, the singular forms of nouns used herein include the plural forms of that noun, and the use of plural forms of nouns also includes the singular form of that noun.

[0019] As used herein, "coupled" may refer to two or more parts being in direct physical or electrical contact with each other, or in indirect physical or electrical contact with each other, and may also refer to two or more parts operating or operative with each other.

[0020] 1 shows a schematic diagram of a power supply measurement device 100 and a circuit under test 200 according to one embodiment of the present disclosure. As shown, the power supply measurement device 100 includes a current sampling circuit 110, a voltage sampling circuit 120, an over-voltage detection circuit 130, and a comparison circuit 140. Structurally, the over-voltage detection circuit 130 is coupled to the current sampling circuit 110 and the voltage sampling circuit 120, and the comparison circuit 140 is coupled to the over-voltage detection circuit 130.

[0021] In operation, the current sampling circuit 110 is used to sample the current of the circuit under test 200. The voltage sampling circuit 120 is used to sample the voltage of the circuit under test 200. The overvoltage detection circuit 130 then obtains the first operating voltage of the current sampling circuit 110 and the second operating voltage of the voltage sampling circuit 120 to generate a detection voltage. The comparison circuit 140 determines whether the detection voltage is within a voltage range. If the detection voltage is outside the voltage range, this indicates that the circuit under test 200 is abnormal, and the comparison circuit 140 generates an abnormality signal S2.

[0022] In one embodiment, the current sampling circuit 110 includes a first input terminal IN1, which is coupled to the circuit under test 200 via the positive voltage terminal P1 of the power supply measuring device 100. In another embodiment, the voltage sampling circuit 120 includes a second input terminal IN2 and a third input terminal IN3. The second input terminal IN2 is coupled to the circuit under test 200 via the first sensing terminal P2 of the power supply measuring device 100. The third input terminal IN3 is coupled to the circuit under test 200 via the second sensing terminal P3 of the power supply measuring device 100. The negative voltage terminal P4 of the power supply measuring device 100 is grounded. The overvoltage detection circuit 130 is coupled to the first input terminal IN1 of the current sampling circuit 110 and the third input terminal IN3 of the voltage sampling circuit 120.

[0023] In one embodiment, the power supply measurement device 100 further includes an output circuit 150 and a control circuit 160. The output circuit 150 is coupled to the circuit under test 200 via a resistor R1 and a positive voltage terminal P1. The control circuit 160 is coupled to the output circuit 150 and is used to control the output circuit 150 to stop outputting voltage to the circuit under test 200 based on the abnormal signal S2. In other words, the control circuit 160 sets the output voltage to 0V by switching to the slowest bandwidth gear and gradually reducing the voltage to 0V. Assuming the slowest bandwidth gear is switched to 0.1V, the control circuit 160 reduces the output voltage from 1V to 0.1V-0.9V, then reduces the output voltage from 0.9V to 0.1V-0.8V, and stops when the output voltage drops to 0V. This gradual decrease prevents damage to components due to momentary overshoot or undershoot caused by a voltage change that is too fast.

[0024] In another embodiment, the power supply measurement device 100 further includes a switch 170. The switch 170 is used to switch between the current sampling circuit 110 and the voltage sampling circuit 120 such that either the current sampling circuit 110 or the voltage sampling circuit 120 is coupled to the control circuit 160.

[0025] For a clearer understanding of the operation of the power supply measuring device 100 of the present disclosure, please refer to FIGS. 2 and 3. These diagrams illustrate the operation of the power supply measuring device 100 and the circuit under test 200 according to one embodiment of the present disclosure. As shown in FIG. 2, assuming that the set voltage S1 is 0.5V, upon receiving the set voltage, the control circuit 160 controls the output circuit 150 to output a current of 10 mA (amperes) to the positive voltage terminal P1. At this time, the voltage sampled by the first input terminal IN1 of the current sampling circuit 110 is −5V, and the voltage across the circuit under test 200 is 1V. After the voltage across the circuit under test 200 is divided by resistors R2 and R3, the voltage sampled by the second input terminal IN2 of the voltage sampling circuit 120 is −5V, and the voltage sampled by the third input terminal IN3 is −5.5V.

[0026] When the power supply measurement device 100 operates normally, the overvoltage detection circuit 130 can correctly acquire the −5V voltage sampled by the first input terminal IN1 of the current sampling circuit 110 and the −5.5V voltage sampled by the third input terminal IN3 of the voltage sampling circuit 120 to generate a detection voltage of 0.5V. The voltage range set by the comparison circuit 140 may be, but is not limited to, between the default voltage Vref1 of 2.5V and the default voltage Vref2 of −2.5V. Because the detection voltage provided by the overvoltage detection circuit 130 is 0.5V, which is within the above voltage range, the comparison circuit 140 determines that the circuit under test 200 is normal and does not generate an abnormality signal S2.

[0027] In other circumstances, if the detection voltage provided by the overvoltage detection circuit 130 is, for example, 3V, since 3V is outside the above voltage range (-2.5V to 2.5V), the comparison circuit 140 determines that the circuit under test 200 is abnormal and generates an abnormality signal S2.

[0028] See FIG. 3. Similarly, assuming that the set voltage S1 is 0.5V, when the control circuit 160 receives the set voltage, it controls the output circuit 150 to output a current of 10 mA (amperes) to the positive voltage terminal P1. The voltage sampled by the first input terminal IN1 of the current sampling circuit 110 is −5V, and the voltage across the circuit under test 200 is 1V. At this time, even if the second input terminal IN2 of the voltage sampling circuit 120 is suddenly disconnected from the circuit under test 200, the voltage sampling circuit 120 can still sample a voltage of −5.5V through its third input terminal IN3.

[0029] Then, the overvoltage detection circuit 130 acquires the −5V voltage sampled by the first input terminal IN1 of the current sampling circuit 110 and the −5.5V voltage sampled by the third input terminal IN3 of the voltage sampling circuit 120 to generate a detection voltage of 0.5V. Then, the comparison circuit 140 subsequently performs a related operation to determine whether to generate an abnormality signal. As can be seen from this, the power supply measuring device 100 of the present disclosure can acquire different operating voltages from the current sampling circuit 110 and the voltage sampling circuit 120 using the overvoltage detection circuit 130. In this way, even if some circuits in the voltage sampling circuit 120 and the circuit under test 200 are shut off, the overvoltage detection circuit 130 of the present disclosure can still accurately acquire the operating voltages to generate a detection voltage, and the comparison circuit 140 can determine whether the circuit under test 200 is abnormal based on the detection voltage.

[0030] In one embodiment, the current sampling circuit 110 further includes a fourth input terminal IN4 and a first subtractor 111. The fourth input terminal IN4 is coupled to the positive voltage terminal P1 of the circuit under test 200 via a resistor R1. The first subtractor 111 is coupled to the first input terminal IN1 and the fourth input terminal IN4. In another embodiment, the resistor R1 may be, but is not limited to, 500 ohms.

[0031] In one embodiment, the voltage sampling circuit 120 further includes a second subtractor 121 coupled to the second input terminal IN2 and the third input terminal IN3. In another embodiment, the comparison circuit 140 includes a comparator 141 for receiving and comparing the detection voltage with the default voltages Vref1 and Vref2.

[0032] In one embodiment, the over-voltage detection circuit 130 includes a subtractor 131 for comparing the first operating voltage of the current sampling circuit 110 and the second operating voltage of the voltage sampling circuit 120 to generate a detection voltage.

[0033] In one embodiment, the control circuit 160 is used to control the output circuit 150 to output the minimum current based on the abnormal signal and to set the switching frequency width to the slowest bandwidth gear to avoid damage to components due to momentary overshoot or undershoot caused by electrical changes that are too fast.

[0034] In one embodiment, the control circuit 160 records the circuits under test 200 corresponding to the abnormal signal in a database (not shown). Note that the present disclosure may measure a large number of circuits under test 200 at once during actual operation. If an abnormal state occurs and some circuits under test 200 generate abnormal signals, the control circuit 160 of the present disclosure can record these circuits under test 200 in a database so that the user can know which circuits under test 200 are abnormal. In another embodiment, the resistance value of the circuits under test 200 may be, but is not limited to, 100 ohms. In one embodiment, the resistance values ​​of resistors R2 and R3 may be, but are not limited to, 10K ohms.

[0035] 1, 2, and 3, the present disclosure is not limited to the structures, operations, and voltages shown in the drawings, which merely exemplify one of the implementation methods of the present disclosure for the purpose of facilitating understanding of the technology of the present disclosure, and the scope of the claims of the present disclosure is based on the scope of the claims of the invention. Modifications and modifications made to the embodiments of the present disclosure by those skilled in the art without departing from the spirit of the present disclosure still fall within the scope of the claims of the present disclosure.

[0036] 4 is a schematic diagram of a power supply measuring device 100A and a circuit under test 200A according to another embodiment of the present disclosure. As shown in the figure, assuming that the set voltage S1 is 0.5V, upon receiving the set voltage, the control circuit 160A controls the output circuit 150A to output a current of 10 mA (amperes) to the positive voltage terminal P1. The voltage sampled by the first input terminal IN1 of the current sampling circuit 110A is −5V, and the voltage across the circuit under test 200A is 1V. Even if the second sensing terminal P3 is suddenly disconnected, the third input terminal IN3 and the circuit under test 200A can still sample the negative terminal voltage via the path of resistor R4 and the negative voltage terminal P4, and the voltage sampling circuit 120A can continue sampling until the voltage reaches −5.5V.

[0037] Then, the overvoltage detection circuit 130A obtains the voltage of −5V sampled by the first input terminal IN1 of the current sampling circuit 110A and the voltage of −5.5V sampled by the third input terminal IN3 of the voltage sampling circuit 120A to generate a detection voltage of 0.5V, and then determines whether to generate an abnormality signal through the related operation of the subsequent comparison circuit 140A.

[0038] In one embodiment, the resistance value of resistor R4 may be, but is not limited to, 100K ohms. Note that the present disclosure is not limited to the structure, operation, and voltage shown in FIG. 4 , which merely exemplifies one implementation method of the present disclosure to facilitate understanding of the technology of the present disclosure. The scope of the claims of the present disclosure is based on the scope of the claims of the invention. Modifications and modifications made to the embodiments of the present disclosure by those skilled in the art without departing from the spirit of the present disclosure still fall within the scope of the claims of the present disclosure.

[0039] As can be seen from the above embodiments of the present disclosure, the following advantages are achieved by adopting the present disclosure: The power supply measurement device shown in the embodiments of the present disclosure can obtain different operating voltages from the current sampling circuit and the voltage sampling circuit using an overvoltage detection circuit. Thus, even if the voltage sampling circuit and the circuit under test are disconnected, the overvoltage detection circuit of the present disclosure can still accurately obtain the operating voltage to generate a detection voltage, and the comparison circuit can determine whether the object under test is abnormal based on the detection voltage.

[0040] Although specific examples of the present disclosure have been disclosed in the above embodiments, they are not intended to limit the present disclosure, and a person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of the present disclosure is determined based on that defined in the appended claims. [Explanation of symbols]

[0041] 100, 100A power supply measuring device 110, 110A current sampling circuit 111, 111A First subtractor 120, 120A voltage sampling circuit 121, 121A Second subtractor 130, 130A Overvoltage detection circuit 131, 131A subtractor 140, 140A comparison circuit 141, 141A Comparator 150, 150A output circuit 160, 160A control circuit 170, 170A switch 200, 200A circuit under test FG reference end GND grounding end IN1 to IN4 input terminals P1 positive voltage terminal P2 First sensing terminal P3 Second sensing terminal P4 negative voltage terminal R1~R4 resistance S1 set voltage S2 abnormal signal Vref1, Vref2 default voltage

Claims

1. A current sampling circuit having a first input terminal coupled to a positive voltage terminal of a circuit under test, for sampling a current output to the positive voltage terminal of the circuit under test and generating a first sampling voltage corresponding to the current; a voltage sampling circuit having a second input terminal and a third input terminal, the second input terminal being coupled to a first sensing terminal of the circuit under test, the third input terminal being coupled to a second sensing terminal of the circuit under test, the voltage sampling circuit sampling a voltage via the third input terminal of the circuit under test to generate a second sampling voltage; an overvoltage detection circuit coupled to the current sampling circuit and the voltage sampling circuit, the overvoltage detection circuit acquiring the first sampling voltage of the current sampling circuit and the second sampling voltage of the voltage sampling circuit to generate a detection voltage; a comparison circuit coupled to the overvoltage detection circuit, the comparison circuit determining whether the detected voltage is within a voltage range and generating an abnormality signal if the detected voltage is outside the voltage range; A power supply measuring device comprising:

2. 2. The power supply measurement device of claim 1, wherein the overvoltage detection circuit is coupled to the first input of the current sampling circuit and the third input of the voltage sampling circuit.

3. 3. The power supply measuring device of claim 2, wherein when the second input terminal of the voltage sampling circuit is disconnected from the circuit under test, the overvoltage detection circuit acquires the first sampling voltage at the first input terminal of the current sampling circuit and the second sampling voltage at the third input terminal of the voltage sampling circuit to generate the detection voltage.

4. The current sampling circuit a fourth input terminal coupled to the circuit under test via the positive voltage terminal; a first subtractor coupled to the first input terminal and the fourth input terminal; The power supply measurement device of claim 3 further comprising:

5. The voltage sampling circuit 5. The power supply measurement device of claim 4, further comprising a second subtractor coupled to the second input and the third input.

6. The overvoltage detection circuit 2. The power supply measurement device of claim 1, further comprising a comparator for comparing the first sampled voltage of the current sampling circuit with the second sampled voltage of the voltage sampling circuit to generate the detected voltage.

7. an output circuit coupled to the circuit under test; a control circuit coupled to the output circuit for controlling the output circuit to stop outputting a voltage to the circuit under test based on the abnormal signal; The power supply measurement device of claim 1 or 6, further comprising:

8. 8. The power supply measuring device according to claim 7, wherein the control circuit is further used to control the output circuit to output a minimum current based on the abnormality signal.

9. 9. The power supply measuring device of claim 8, wherein the control circuit records the abnormal signal in a database.

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